Test adapter for dfn2510 chip
By designing a test adapter for the DFN2510 chip and utilizing the wiring layer connection of the PCB board and 2P pins, the problem of inconvenient troubleshooting in the testing of the DFN2510 chip was solved, enabling fast and accurate anomaly location and Cont testing, and simplifying the operation process.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHANGHAI TRS MICROELECTRONICS CO LTD
- Filing Date
- 2025-05-13
- Publication Date
- 2026-05-29
AI Technical Summary
In the existing technology, it is inconvenient to troubleshoot abnormal situations when testing the DFN2510 chip, and it is impossible to directly test for Cont abnormalities, making the operation inconvenient.
Design a test adapter for the DFN2510 chip, including a PCB board, terminals, a DB25 connector, 2P pins, and a test connection cable group. The terminals and DB25 connector are connected through a wiring layer, and the 2P pins are used to short-circuit to form a test circuit, simplifying troubleshooting and Cont testing.
It enables rapid and accurate troubleshooting of abnormal situations, simplifies Cont anomaly testing operations, avoids the risks associated with traditional manual soldering, and improves testing efficiency and convenience.
Smart Images
Figure CN224305091U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of semiconductor packaging technology, and in particular to a test adapter for DFN2510 chips. Background Technology
[0002] When testing the DFN2510 chip, a DB25 interface is typically used. In use, the DB25 interface is plugged into the corresponding DFN2510 chip, and the DB25 interface is connected to the test box via a test cable. The DFN2510 chip's various functions are then tested through the test box via the DB25 interface.
[0003] Due to the small size and compact internal wiring of the DB25 connector, the manual soldering of the DB25 connector and test cables can lead to issues such as cold solder joints, open circuits, short circuits, and detachment. Troubleshooting requires opening the protective cover of the DB25 connector to check the soldering, wiring sequence, and connection of the test cables. Because of the small gaps within the DB25 connector, it is difficult to spot abnormalities. After troubleshooting, the protective cover must be reinstalled, which is inconvenient. For Cont anomalies, the DB25 connector cannot be used directly for testing; the protective cover must be opened, and a dedicated jumper wire must be used to short-circuit the terminals of the DB25 connector before performing the Cont anomaly test, which is also inconvenient.
[0004] Therefore, there is a need to provide a test adapter for the DFN2510 chip, which can solve the problems of inconvenience in troubleshooting abnormal situations and inability to directly test Cont abnormalities when testing the DFN2510 chip using the DB25 interface in the existing technology. Summary of the Invention
[0005] The purpose of this utility model is to provide a test adapter for the DFN2510 chip, which can solve the problems of inconvenience in troubleshooting abnormal situations and inability to directly test Cont abnormalities when testing the DFN2510 chip using the DB25 interface in the prior art.
[0006] This utility model is implemented as follows:
[0007] A test adapter for a DFN2510 chip includes a PCB board, terminals, a DB25 connector, 2P pins, and a test connection cable assembly. The DB25 connector and two terminals are respectively arranged on the PCB board, and the terminals of the terminals are connected to the terminals of the DB25 connector through a wiring layer on the PCB board. Several 2P pins are respectively arranged on the PCB board, and the 2P pins are connected to the terminals of the terminals and the terminals of the DB25 connector through a wiring layer on the PCB board. One end of the test connection cable assembly is plugged into the terminals of the two terminals, and the other end of the test connection cable assembly is plugged into a test box. The DB25 connector is matched and plugged into the DFN2510 chip.
[0008] Each of the aforementioned terminals is a 1*8P spring-loaded terminal, meaning the terminal includes four sets of terminals, each set including an F pin and an S pin; one end of the test connection wire is plugged into the F pin and S pin of the terminal.
[0009] The DB25 connector includes eight F pins and eight S pins, so that the eight S pins of the two terminals are respectively connected to the eight S pins of the DB25 connector through the wiring layer on the PCB board.
[0010] There are eight 2P pins. Each 2P pin includes two test pins. One of the test pins of each 2P pin is connected to the F pin of one set of terminals in the terminal block and the F pin of one set of terminals in the DB25 connector through the wiring layer on the PCB board. When the two test pins are shorted, the two test pins, F pin, F pin, S pin and S pin form a test circuit.
[0011] The two terminals are respectively arranged at both ends of one side of the PCB board, and the eight 2P pins are respectively located next to the eight sets of terminals of the two terminals. The DB25 connector is arranged on the other side of the PCB board.
[0012] Compared with the prior art, this utility model has the following advantages:
[0013] 1. Because this utility model has a PCB board with a wiring layer, the design of the wiring layer enables the DB25 connector to be reliably and orderly connected to the test connection line group through the wiring terminals. Compared with the traditional method of manually soldering the DB25 connector and the test connection line, this utility model can greatly avoid the risks of short circuit, open circuit, incorrect wiring, desoldering, and poor soldering.
[0014] 2. Because this utility model is equipped with wiring terminals, DB25 connectors and 2P pins, and through the corresponding connection of the eight F pins, eight S pins and eight sets of 2P pins of the wiring terminals and the eight F pins and eight S pins of the DB25 connector, it can more quickly and accurately check, locate and replace abnormal test connection wires during anomaly troubleshooting. Compared with the traditional method of opening the DB25 connector protective cover and troubleshooting within a small gap, the anomaly troubleshooting operation of this utility model is more convenient, faster and more accurate.
[0015] 3. Because this utility model has a 2P pin, when the two test pins of the 2P pin are shorted, the test circuit formed by the two test pins, F pin, F terminal, S pin and S terminal is conductive, which can be directly used for troubleshooting Cont anomalies. Compared with the traditional method of opening the DB25 connector protective cover and shorting the F and S pins of the DB25 connector with a special jumper wire, this utility model directly shorts the two exposed 2P pins, making the Cont anomaly troubleshooting operation more convenient and faster. Attached Figure Description
[0016] Figure 1 This is a front view of the test adapter for the DFN2510 chip of this utility model;
[0017] Figure 2 This is a side view of the connection of the test adapter for the DFN2510 chip of this utility model.
[0018] In the diagram, 1 is the PCB board, 11 is the wiring layer, 2 is the terminal block, 3 is the DB25 connector, 4 is the 2P pin, 5 is the test connection wire group, 6 is the test box, and 7 is the DFN2510 chip. Detailed Implementation
[0019] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.
[0020] Please see the appendix Figure 1 and attached Figure 2 A test adapter for a DFN2510 chip includes a PCB board 1, terminals 2, a DB25 connector 3, 2P pins 4, and a test connection cable assembly 5. The DB25 connector 3 and two terminals 2 are respectively arranged on the PCB board 1, and the terminals of the terminals 2 are connected to the terminals of the DB25 connector 3 through a wiring layer 11 on the PCB board 1. Several 2P pins 4 are respectively arranged on the PCB board 1, and the 2P pins 4 are connected to the terminals of the terminals 2 and the terminals of the DB25 connector 3 through the wiring layer 11 on the PCB board 1. One end of the test connection cable assembly 5 is plugged into the terminals of the two terminals 2, and the other end of the test connection cable assembly 5 is plugged into a test box 6. The DB25 connector 3 is matched and plugged into the DFN2510 chip 7.
[0021] With the PCB board 1 having a wiring layer 11, the DB25 connector 3 and the terminals 2 are soldered onto the wiring layer 11, ensuring accurate and reliable connection of the wiring between the terminals 2, DB25 connector 3, and 2P pins 4. After the test connection cable group 5 is plugged into the terminals 2, compared with the traditional manual soldering between the DB25 connector terminals and the test connection cable, this utility model can greatly avoid abnormalities such as open circuits, short circuits, wiring errors, cold solder joints, and desoldering in the test connection cable.
[0022] Test box 6 uses a standard DFN2510 chip 7 dedicated test box, and test connection cable group 5 uses standard connection wires. The connection between test connection cable group 5 and test box 6 and the connection between DB25 connector 3 and DFN2510 chip 7 are connected in a standard manner, which will not be described in detail here.
[0023] Please see the appendix Figure 1 Each of the aforementioned terminals 2 is a 1*8P spring-loaded terminal, that is, the terminal 2 includes four sets of terminals, each set of terminals including an F pin (force pin) and an S pin (sense pin); one end of the test connection wire group 5 is plugged into the F pin and S pin of the terminal 2.
[0024] The spring-loaded terminal blocks facilitate testing the connection between the 5-pin connector and the F and S pins, and are easy to install and remove.
[0025] Please see the appendix Figure 1 The DB25 connector 3 includes eight F pins and eight S pins, so that the eight S pins of the two terminals 2 are respectively connected to the eight S pins of the DB25 connector 3 one by one through the wiring layer 11 on the PCB board 1.
[0026] The eight F pins, eight S pins, eight F feet, and eight S feet can all be soldered to their respective positions on the wiring layer 11. The structure is simple and ensures a reliable connection between the DB25 connector 3 and the terminal block 2.
[0027] Please see the appendix Figure 1 The 2P pin 4 is provided in eight parts. Each 2P pin 4 includes two test pins. One of the test pins of each 2P pin 4 is connected to the F pin of a set of terminals in the terminal block 2 and the F pin of a set of terminals in the DB25 connector 3 through the wiring layer 11 on the PCB board 1. When the two test pins are shorted, the two test pins, the F pin, the F pin, the S pin and the S pin form a test circuit.
[0028] With the two exposed 2P pins 4, which are independent of the DB25 connector 3, it is easy to short-circuit the two test pins of the 2P pin 4 to make the test circuit conductive. It can then be used directly for testing Cont abnormalities without having to open the protective cover of the DB25 connector 3 and short-circuit the terminals of the DB25 connector 3 with a special jumper wire. The operation is simpler and more convenient.
[0029] Please see the appendix Figure 1 The two terminals 2 are respectively arranged at both ends of one side of the PCB board 1, and the eight 2P pins 4 are respectively located on the sides of the eight sets of terminals of the two terminals 2. The DB25 connector 3 is arranged on the other side of the PCB board 1.
[0030] Preferably, the PCB board 1 can be a rectangular board, or the shape and size of the PCB board 1 can be adjusted according to the actual situation to facilitate the arrangement of two wiring terminals 2, DB25 connectors 3 and eight 2P pins 4, so as to make the structure simple and orderly.
[0031] Preferably, the PCB board 1 has a length and width of approximately 6.2cm*5.4cm, which is similar to the size of the DFN2510 chip 7.
[0032] Please see the appendix Figure 1 and attached Figure 2 The method of making and using this utility model is as follows:
[0033] In EDA software, draw the PCB schematic according to the pin positions of DFN2510 chip 7 and the connection sequence of DB25. Make PCB board 1 according to the schematic. Set up routing layer 11 on PCB board 1 so that after the two terminals 2 and DB25 connector 3 are soldered to PCB board 1, a reliable connection can be achieved through routing layer 11.
[0034] Specifically, the two terminals 2 include eight F pins (1F to 8F) and eight S pins (1S to 8S). The DB25 connector 3 also includes eight F pins (1F to 8F) and eight S pins (1S to 8S). The S pin 1S of the terminal 2 and the S pin 1S of the DB25 connector 3 are connected through the wiring layer 11. The F pin 1F of the terminal 2 is connected through the wiring layer 11 to one of the test pins of a 2P pin 4 next to it. This test pin is also connected through the wiring layer 11 to the F pin 1F of the DB25 connector 3.
[0035] Similarly, the eight F pins from 1F to 8F and the eight S pins from 1S to 8S, the eight F pins from 1F to 8F and the eight S pins from 1S to 8S, as well as the eight 2P pins 4, are soldered onto the PCB board 1 through the wiring layer 11.
[0036] When performing various functional tests on the DFN2510 chip 7, terminal 2 serves as the terminal and is connected to the test box 6 via test connection cable group 5. DB25 connector 3 serves as the interface of the DFN2510 chip 7 under test and is matched and plugged into the DFN2510 chip 7. Through 2P pin 4 as a relay, the DFN2510 chip 7 can be tested through the test box 6, which also facilitates the checking of Cont abnormalities.
[0037] When troubleshooting abnormalities in test connection cable group 5, since the eight F pins from 1F to 8F and the eight S pins from 1S to 8S, the eight F pins from 1F to 8F and the eight S pins from 1S to 8S, as well as the eight 2P connectors 4 are connected respectively, it is possible to check, locate and replace abnormal test connection cables more quickly and accurately, making the operation faster and simpler.
[0038] For Cont anomaly testing: Each pin test requires power supply at pin F and measurement at pin S. A connection must be established between pins F and S to ensure minimum external impedance. The Cont test confirms that pins F and S are connected at the pin. Shorting the two test pins creates a conductive test circuit consisting of the two test pins, pin F, pin F, pin S, and pin S. This circuit can be directly used for Cont anomaly checking. Compared to the traditional method of opening the protective cover of DB25 connector 3 and using a dedicated jumper wire to connect pins F and S, this invention directly shorts the two test pins, making the operation more convenient and simpler.
[0039] The above are merely preferred embodiments of the present utility model and are not intended to limit the scope of protection of the present utility model. Therefore, any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the scope of protection of the present utility model.
Claims
1. A test adapter for a DFN2510 chip, characterized in that: The test connection includes a PCB board (1), terminals (2), DB25 connectors (3), 2P pins (4), and a test connection cable assembly (5). The DB25 connector (3) and two terminals (2) are respectively arranged on the PCB board (1). The terminals of the terminals (2) and the terminals of the DB25 connectors (3) are connected through the wiring layer (11) on the PCB board (1). Several 2P pins (4) are respectively arranged on the PCB board (1). The 2P pins (4) are connected to the terminals of the terminals (2) and the terminals of the DB25 connectors (3) through the wiring layer (11) on the PCB board (1). One end of the test connection cable assembly (5) is plugged into the terminals of the two terminals (2), and the other end of the test connection cable assembly (5) is plugged into the test box (6). The DB25 connector (3) is matched and plugged into the DFN2510 chip (7).
2. The test adapter for the DFN2510 chip according to claim 1, characterized in that: Each of the aforementioned terminals (2) is a 1*8P spring-loaded terminal, that is, the terminal (2) includes four sets of terminals, each set of terminals includes an F pin and an S pin; one end of the test connection wire group (5) is plugged into the F pin and S pin of the terminal (2).
3. The test adapter for the DFN2510 chip according to claim 2, characterized in that: The DB25 connector (3) includes eight F pins and eight S pins, so that the eight S pins of the two terminals (2) are respectively connected to the eight S pins of the DB25 connector (3) through the wiring layer (11) on the PCB board (1).
4. The test adapter for the DFN2510 chip according to claim 3, characterized in that: There are eight 2P pins (4). Each 2P pin (4) includes two test pins. One of the test pins of each 2P pin (4) is connected to the F pin of a set of terminals in the terminal block (2) and the F pin of a set of terminals in the DB25 connector (3) through the wiring layer (11) on the PCB board (1). When the two test pins are shorted, the two test pins, F pin, F pin, S pin and S pin form a test circuit.
5. The test adapter for the DFN2510 chip according to claim 4, characterized in that: The two terminals (2) are respectively arranged at both ends of one side of the PCB board (1), and the eight 2P pins (4) are respectively located on the side of the eight sets of terminals of the two terminals (2). The DB25 connector (3) is arranged on the other side of the PCB board (1).