Shock-resistant SJ MOSFET devices
By thickening the gate oxide layer and adding interconnect holes to optimize the structure of the SJ MOSFET device, the problem of weak shock resistance caused by the thin gate oxide layer is solved, and the reliability and on-resistance performance of the device are improved.
CN224306190UActive Publication Date: 2026-05-29HEFEI SIPU SEMICON TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- HEFEI SIPU SEMICON TECH CO LTD
- Filing Date
- 2025-07-29
- Publication Date
- 2026-05-29
AI Technical Summary
Technical Problem
Existing SJ MOSFET devices have weak shock resistance due to their thin gate oxide layer, which reduces the reliability of the devices.
Method used
By increasing the thickness of the gate bottom oxide layer to 2 to 4.5 times and setting multiple connection holes between the gate trenches, the gate trench structure is optimized to reduce junction capacitance and on-resistance, thereby improving the device's shock resistance and reliability.
Benefits of technology
The thickened gate bottom oxide layer improves the device's shock resistance, reduces junction capacitance, and the via configuration reduces on-resistance and improves current distribution uniformity, thereby enhancing device reliability.
✦ Generated by Eureka AI based on patent content.
Smart Images

Figure CN224306190U_ABST
Abstract
The utility model discloses an anti-impact SJ MOSFET device, include: epitaxial layer, epitaxial layer longitudinal is equipped with at least two first conductive type column and at least one second conductive type column, and first conductive type column and second conductive type column interval arrangement, at least two grid grooves, grid groove is located respectively on epitaxial layer and is located on first conductive type column upper portion correspondingly, and the bottom of grid groove is equipped with grid bottom oxide layer, and the sidewall of grid groove is equipped with grid side oxide layer, and the thickness of grid bottom oxide layer is greater than the thickness of grid side oxide layer, the utility model discloses an anti-impact SJ MOSFET device can reduce junction capacitance, promotes the anti-impact ability of device, and then promotes the reliability of device.
Need to check novelty before this filing date? Find Prior Art