A jet plate microscope stage

Abstract

The application provides a spinneret microscope stage, and belongs to the technical field of medical devices. The spinneret microscope stage comprises a base and a microscope arranged above the base. A transparent rotating stage is arranged above the base. A spinneret is fixed to the rotating stage. An adjustable positioning element for fixing the spinneret is arranged on the transparent rotating stage. A bottom light source plate is arranged below the transparent rotating stage. The diameter of the light emitting surface of the bottom light source plate is greater than the maximum outer diameter of the spinneret. An infrared light source is integrated in the light path of the microscope. The infrared rays emitted by the infrared light source are coaxial with the focusing point of the objective lens of the microscope. In the application, the infrared light source is introduced into the light path of the microscope through a beam splitter, so that the infrared light spot is strictly coincident with the center of the microscopic field of view. When operating, the target micropore is accurately positioned through the infrared light spot, and the positioning error of the traditional XY axis moving stage is avoided. The application integrates a miniaturized detection device with accurate positioning, rotation stability and reusability, so as to realize full-coverage and efficient microscopy of the micropores of the spinneret.

Description

Technical Field

[0001] This invention relates to the field of medical device technology, specifically to a spinneret microscopic examination table. Background Technology

[0002] In the field of chemical fiber production, the spinneret is the core component of spinning equipment, and the cleanliness of its micropores directly affects the spinning quality. Traditionally, after cleaning the spinneret, residual impurities need to be inspected pore by pore using a microscope. However, existing technology has significant drawbacks: 1. Low positioning efficiency: Spinnerets typically contain thousands of micropores (0.1-0.3mm in diameter). Manually operating the microscope requires repeated movement of the spinneret for positioning, easily leading to missed or repeated inspections; 2. Detection blind spots: Conventional microscopes lack pore location marking functions, making it difficult for operators to accurately track inspected pores; 3. Uneven light transmission: Fixed bottom light sources cannot cover the edge areas of the spinneret, resulting in blurred images of the edge pores and affecting the accuracy of impurity detection.

[0003] Currently, the industry is trying to use coordinate moving stages to assist in positioning, but the following problems still exist: the moving stage needs to be manually adjusted to adjust the XY axis coordinates, which is cumbersome and the positioning accuracy is affected by human factors; during rotational detection, the spinneret is not fixed firmly, resulting in eccentric displacement, which requires repeated calibration; and the functionality is limited: the modified equipment is difficult to be compatible with other microscopic inspection tasks, resulting in low utilization. Summary of the Invention

[0004] Purpose of the invention: The purpose of this invention is to address the shortcomings of existing technologies by providing a spinneret microscopic inspection stage that integrates a miniaturized inspection device with precise positioning, stable rotation, and reusability, so as to achieve full-coverage and efficient microscopic inspection of the spinneret micropores.

[0005] Technical Solution: The present invention discloses a spinneret microscopy stage, comprising a base and a microscope mounted on the base. A transparent rotating stage is positioned above the base, and the spinneret is fixed to the rotating stage. Rotation replaces translation to achieve full coverage of the spinneret, eliminating duplicate / missed areas. Adjustable positioning components for fixing the spinneret are provided on the transparent rotating stage. A bottom light source plate is positioned below the transparent rotating stage, with the diameter of the light-emitting surface of the bottom light source plate being larger than the maximum outer diameter of the spinneret. An infrared light source is integrated into the optical path of the microscope, and the infrared rays emitted by the infrared light source are coaxially aligned with the focus point of the microscope's objective lens. The infrared light source is introduced into the microscope's optical path via a beam splitter, ensuring that the infrared light spot is strictly aligned with the center of the microscopic field of view. During operation, the target micro-hole is precisely located using the infrared light spot, avoiding the positioning errors of traditional XY-axis moving stages.

[0006] Furthermore, the adjustable positioning element includes at least three components distributed circumferentially along the outer edge of the spinneret, and the height of the adjustable positioning element is adjustable.

[0007] Furthermore, the adjustable positioning component is an L-shaped jaw with a spring-locking structure, and the jaw is lined with a silicone anti-slip layer. The jaws are evenly distributed at 120° to form a stable support surface, and the spring locking mechanism can accommodate spinnerets with a diameter of φ50-200mm. The silicone anti-slip layer prevents rotational slippage; the elastic deformation can compensate for the thickness tolerance of the spinneret.

[0008] Furthermore, the infrared light source has an emission wavelength range of 800–1000 nm, and the spot diameter of the infrared light source is smaller than the micro-aperture diameter of the spinneret. The selected wavelength can avoid visible light interference, forming a high-contrast spot on the metal surface. By compressing the spot through the aperture stop, it can be ensured that only a single aperture is illuminated.

[0009] Furthermore, the infrared rays and the diagonal of the microscope form a collinear optical axis, with a deviation angle of ≤0.5°.

[0010] Furthermore, the transparent rotary table is made of tempered glass, and its surface is equipped with annular angle scales, which enable quantitative management of the testing progress.

[0011] Furthermore, the bottom light source plate is a ring-shaped LED array, and the illuminance of the bottom light source plate is continuously adjustable within a range of 1000–5000 lux. The LEDs are arranged in a ring at a 60° angle to eliminate shadows on the sidewalls of the micro-holes, allowing reflected light from the hole walls to avoid the objective lens and obtain a clear image of the bottom of the hole.

[0012] Beneficial effects: Compared with the prior art, the advantages of the present invention are as follows:

[0013] (1) The coordinated operation of rotation detection and infrared light source in this invention can realize a coordinate detection path, ensuring no detection or missed detection;

[0014] (2) In this invention, the image detection accuracy can be improved by the coordinated work of the infrared rays emitted by the bottom light source plate and the infrared light source and the focus point of the microscope objective lens being coaxially aligned. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of the present invention;

[0016] Figure 2 This is a schematic diagram of the transparent rotating platform in this invention. Detailed Implementation

[0017] The technical solution of the present invention will be described in detail below with reference to the accompanying drawings, but the scope of protection of the present invention is not limited to the embodiments described.

[0018] like Figure 1The spinneret microscopy stage shown includes a base 9 and a microscope 1 mounted on the base. Its features include: a transparent rotating stage 6 mounted on the base 9 via a positioning post 10, rotating around the positioning post; the transparent rotating stage 6 is made of tempered glass, and its surface has annular angle markings. Adjustable positioning elements 8 for fixing the spinneret 5 are provided on the transparent rotating stage 6. Four adjustable positioning elements 8 are distributed circumferentially along the outer edge of the spinneret 5. Each adjustable positioning element 8 is an L-shaped claw with a spring-locking structure, and the claw is lined with a silicone anti-slip layer. A bottom light source plate 7 is located below the transparent rotating stage 6. The diameter of the light-emitting surface of the bottom light source plate 7 is larger than the maximum outer diameter of the spinneret 5. An infrared light source 2 is integrated into the optical path of the microscope 1. The infrared rays 4 emitted by the infrared light source 2 are coaxially aligned with the focus point of the objective lens of the microscope 1. The infrared rays 4 and the diagonal 3 of the microscope form a collinear optical axis, with a deviation angle ≤0.5°.

[0019] In this embodiment, the infrared light source 2 emits wavelengths in the range of 900 nm, and the spot diameter of the infrared light source 2 is smaller than the micro-aperture diameter of the spinneret 5. The bottom light source plate 7 is a ring-shaped LED array, and the illuminance of the bottom light source plate 7 is continuously adjustable in the range of 1000–5000 lux.

[0020] The working method of this embodiment is as follows:

[0021] S1. Place the spinneret 5 on the transparent rotating table 6, and adjust the positioning component 8 to make the center of the spinneret coincide with the axis of the rotating table;

[0022] S2. Turn on the infrared light source 2 and move the rotating stage to cover the target micropore with infrared rays 4.

[0023] S3. Observe the micro-holes located by infrared light spot through a microscope, and simultaneously turn on the bottom light source plate 7 to perform light transmission detection;

[0024] S4. Rotate the transparent turntable 6 to the next uninspected area, and repeat S2-S3 until the entire board is inspected.

[0025] As described above, although the invention has been shown and described with reference to specific preferred embodiments, it should not be construed as limiting the invention itself. Various changes in form and detail may be made without departing from the spirit and scope of the invention as defined in the appended claims.

Claims

1. A spinneret microscopy stage, comprising a base (9) and a microscope (1) disposed above the base, characterized in that: A transparent rotating stage (6) is provided above the base (9). An adjustable positioning component (8) for fixing the spinneret (5) is provided on the transparent rotating stage (6). A bottom light source plate (7) is provided below the transparent rotating stage (6). The diameter of the light-emitting surface of the bottom light source plate (7) is larger than the maximum outer diameter of the spinneret (5). An infrared light source (2) is integrated in the optical path of the microscope (1). The infrared rays (4) emitted by the infrared light source (2) are coaxially coincident with the focus point of the objective lens of the microscope (1).

2. The spinneret microscopic examination table according to claim 1, characterized in that: The adjustable positioning element (8) includes at least three, which are distributed circumferentially along the outer edge of the spinneret (5), and the height of the adjustable positioning element (8) is adjustable.

3. The spinneret microscopic examination table according to claim 1, characterized in that: The adjustable positioning component (8) is an L-shaped claw with a spring locking structure, and the claw is lined with a silicone anti-slip layer.

4. The spinneret microscopic examination table according to claim 1, characterized in that: The infrared light source (2) emits wavelengths in the range of 800 to 1000 nm, and the spot diameter of the infrared light source (2) is smaller than the micropore diameter of the spinneret (5).

5. The spinneret microscopic examination table according to claim 1, characterized in that: The infrared rays (4) and the diagonal of the microscope (3) form a collinear optical axis, and the deviation angle of the collinear optical axis is ≤0.5°.

6. The spinneret microscopic examination table according to claim 1, characterized in that: The transparent rotating platform (6) is made of tempered glass, and the surface of the transparent rotating platform (6) is provided with annular angle scale.

7. The spinneret microscopic examination table according to claim 1, characterized in that: The bottom light source plate (7) is a ring-shaped LED array, and the illuminance of the bottom light source plate (7) is continuously adjustable in the range of 1000 to 5000 lux.

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