A chip testing and sorting device

Abstract

The utility model discloses a kind of chip test sorting device, it is related to mechanical field, and this kind of chip test sorting device includes test machine, and the top surface of test machine is fixed with test socket, and test socket is used to place chip to be tested, and its inboard has needle foot contacted with chip pin;This kind of chip test sorting device is equipped with adjusting plate by sorting tray both ends sliding, free expansion changes blanking path length, so that aggregate container flexible adaptation factory layout, solve the space limitation of fixed slide. End enclose is always vertical upward when tray is inclined, form physical intercepting cavity, force chip to slide along its inner cavity, completely avoid the chip splashing problem caused by inertia of traditional slide. Aggregate container only needs to be placed in the just below enclose, without pre-judging position, operation simplification efficiency is multiplied.

Description

Technical Field

[0001] This utility model relates to the field of machinery, and in particular to a chip testing and sorting device. Background Technology

[0002] During the power-on testing of chips, a sorting structure is used to separate defective and good chips for unloading. This separation and unloading often involves guiding the chips via a fixed, inclined slide, causing them to slide along a predetermined path into the collection equipment. This fixed sorting slide structure has the following drawbacks:

[0003] 1. Rigid layout: The aggregate container must be strictly matched with the slide outlet position, which cannot adapt to the needs of plant space adjustment;

[0004] 2. Uncontrolled landing point: After the chip slides out, it continues to move forward due to inertial impact. It is necessary to repeatedly predict the landing point and adjust the collection container. Due to the error in prediction, the chip may splash out of the container, which increases the debugging complexity. Utility Model Content

[0005] To overcome the shortcomings of existing technologies, the purpose of this utility model is to provide a chip testing and sorting device that solves the problems of poor adaptability of the slide structure for chip sorting and complex debugging in existing technologies.

[0006] To address the problems in the existing technology, the technical solution of this utility model is as follows:

[0007] A chip testing and sorting device includes a testing machine base, wherein a testing socket is fixed on the top surface of the testing machine base, and further includes:

[0008] The transfer mechanism is fixed to the top of the test machine. The transfer mechanism is equipped with two suction cups arranged side by side along the first horizontal direction, and drives the two suction cups to perform synchronous lifting and lowering movements and translational movements along the first horizontal direction.

[0009] The sorting mechanism includes a rotating component and a sorting tray disposed on one side of the test machine. The output end of the rotating component is fixedly connected to the sorting tray and is used to drive the sorting tray to rotate and tilt around an axis along the first horizontal direction. The length direction of the sorting tray is set along a second horizontal direction perpendicular to the first horizontal direction.

[0010] Adjustment plates are symmetrically slidably fitted on the outer walls of both ends of the sorting tray to extend the chip feeding path length and are positioned on the sorting tray by positioning components;

[0011] The end guard is rotatably mounted on the adjustment plate. When the sorting tray rotates and tilts, the end guard always remains vertically upward. Its guard part is always directly facing the end of the adjustment plate to physically intercept the sliding chip, so that the chip eventually enters the vertical inner cavity of the end guard and slides down.

[0012] Optionally, the transfer mechanism includes a lead screw linear module fixed on the top surface of the testing machine. The driving direction of the lead screw linear module is set along the first horizontal direction. An electric push rod is fixed to the moving end of the lead screw linear module. The electric push rod is arranged longitudinally. A horizontal plate is fixed to the extended end of the electric push rod. Both suction cups are fixed to the horizontal plate.

[0013] Optionally, the length direction of the horizontal plate is the same as the length direction of the lead screw linear module, and the two suction cups are located at both ends of the horizontal plate along the first horizontal direction.

[0014] Optionally, the rotating assembly includes a support frame fixed to one side of the testing machine adjacent to the sorting tray. The end of the support frame away from the testing machine is rotatably connected to a rotating shaft via a bearing. The axis of the rotating shaft is set along the first horizontal direction. A motor is fixed to one end of the support frame near the rotating shaft. The end of the rotating shaft near the motor passes through the support frame and is fixed to the output end of the motor. The bottom surface of the sorting tray is fixed to the end of the rotating shaft away from the motor, and the rotating shaft is located in the middle of the bottom surface of the sorting tray.

[0015] Optionally, raised slide bars are fixed on the two opposite inner walls of the adjusting plate. The length direction of the raised slide bars is the same as the length direction of the adjusting plate. Grooves are provided on the two opposite outer walls of the sorting tray in the width direction. The raised slide bars are slidably inserted into the grooves.

[0016] Optionally, the positioning component includes a threaded sleeve fixed to one end of the adjustment plate near the sorting tray, with a bolt threaded inside the sleeve, the bolt abutting against the outer wall of the sorting tray.

[0017] Optionally, the end enclosure consists of a guide ring and an enclosure portion formed on the top of the guide ring on the side opposite to the sorting tray. The enclosure portion is rotatably connected to the outer wall of the end of the adjusting plate by a shaft pin. The enclosure portion surrounds and wraps around the end of the adjusting plate. The top surface of the guide ring is inclined on the side opposite to the enclosure portion. Balance blocks are symmetrically fixed on the outer wall of the guide ring on the side opposite to the enclosure portion. An elastic silicone layer is attached to the inner wall of the enclosure portion.

[0018] Compared with the prior art, the advantages of this utility model are as follows:

[0019] 1. This utility model overcomes spatial limitations by setting an adjustment plate. The adjustment plate can freely extend and retract to change the length of the material drop path, allowing the collection container to flexibly adapt to the factory layout and solving the problem of rigid equipment layout caused by fixed slides. The end baffle eliminates inertial splashing. The end baffle always stands vertically upward when the tray is tilted, forming a physical interception cavity that forces the chip to slide down along its vertical inner cavity. This completely avoids the problem of chips splashing out of the container due to inertial impact in traditional slides. When arranging the collection container, there is no need to predict its placement based on experience. It can be directly connected to the bottom of the end baffle, simplifying the operation.

[0020] 2. This utility model effectively protects the chip and prevents it from being damaged by attaching an elastic silicone layer to the inner wall of the enclosure. When the chip slides down, the impact kinetic energy is absorbed. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the overall structure of this utility model.

[0022] Figure 2 This utility model Figure 1 Enlarged diagram of point A.

[0023] Figure 3 This is a schematic diagram showing the position of the raised slider of this utility model.

[0024] Figure 4 This is a schematic diagram of the bolt structure of this utility model.

[0025] Figure 5 This is a schematic diagram of the end enclosure structure of this utility model.

[0026] Reference numerals: 1. Test machine; 2. Test socket; 3. Lead screw linear module; 4. Electric push rod; 5. Horizontal plate; 6. Suction cup; 7. Support frame; 8. Rotary shaft; 9. Motor; 10. Sorting tray; 11. Adjusting plate; 12. Raised slide bar; 13. Groove; 14. Threaded sleeve; 15. Bolt; 16. End guard; 17. Guide ring; 18. Guard section; 19. Balance block; 20. Elastic silicone layer. Detailed Implementation

[0027] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0028] Please see Figures 1 to 5 This embodiment provides a chip testing and sorting device, including a testing machine 1. A test socket 2 is fixed on the top surface of the testing machine 1. The test socket 2 is used to prevent the chip to be tested from being exposed. Its inner side has pins that contact the chip pins. This is disclosed in many patents and belongs to existing mature technology, so it will not be described in detail here.

[0029] A lead screw linear module 3 is fixed on the top surface of the testing machine 1. The driving direction of the lead screw linear module 3 is set along the first horizontal direction. An electric push rod 4 is fixed to the moving end of the lead screw linear module 3. The electric push rod 4 is set longitudinally. A horizontal plate 5 is fixed to the extended end of the electric push rod 4. The length direction of the horizontal plate 5 is the same as the length direction of the lead screw linear module 3. A suction cup 6 is fixed at each end of the horizontal plate 5 along the first horizontal direction. The air outlet of the suction cup 6 can be connected to an air pump through a hose. During operation, the air pump works to draw suction, so that the end of the suction cup 6 has a strong suction force, which enables the suction cup 6 to adsorb the chip.

[0030] Driven by a linear screw module 3, the moving end of the linear screw module 3 drives an electric push rod 4 and two suction cups 6 to move in the first horizontal direction. The extension or retraction of the electric push rod 4 causes the suction cups 6 to rise and fall. One suction cup 6 is used to pick up chips at the pick-up station on one side of the test machine 1. After it moves to directly above the test socket 2, the electric push rod 4 inserts the chip into the test socket 2 for power-on testing to check the chip's quality. The other suction cup 6 is used to pick up the tested chip from above the test socket 2 and move it to the unloading station on the other side of the test machine 1 for unloading. The two suction cups 6 load and unload simultaneously, greatly improving testing efficiency and realizing assembly line operation.

[0031] A support frame 7 is fixed on one side of the testing machine 1. The end of the support frame 7 facing away from the testing machine 1 is rotatably connected to a rotating shaft 8 via a bearing. The axis of the rotating shaft 8 is set along the first horizontal direction. A motor 9 is fixed at the end of the support frame 7 near the rotating shaft 8. The end of the rotating shaft 8 near the motor 9 passes through the support frame 7 and is fixed to the output end of the motor 9. A sorting tray 10 is fixed at the end of the rotating shaft 8 facing away from the motor 9. The rotating shaft 8 is located in the middle of the bottom surface of the sorting tray 10. By controlling the rotation of the motor 9, the rotating shaft 8 is driven to rotate, which can drive the sorting tray 10 to rotate and tilt around an axis (the axis of the rotating shaft 8) along the first horizontal direction. The length direction of the sorting tray 10 is set along a second horizontal direction perpendicular to the first horizontal direction.

[0032] The sorting tray 10 is located at the unloading station, and the side of the test machine 1 away from the sorting tray 10 is the picking station. The suction cup 6 picks up the chip and moves it to the unloading station. The chip is located directly above the center of the sorting tray 10. During the transfer process, the motor 9 has already controlled the sorting tray 10 to tilt according to the test structure. Then the suction cup 6 releases the chip, and the chip slides down along the inner side of the sorting tray 10.

[0033] It should be emphasized that motor 9 is a worm gear reducer motor, which has a self-locking effect, that is, after power is cut off, the sorting tray 10 will remain at the adjusted angle and will not change.

[0034] Adjustment plates 11 are slidably fitted on the outer walls at both ends of the sorting tray 10. The adjustment plates 11 can extend the chip feeding path length. Protruding slides 12 are fixed on the two opposite inner walls of the adjustment plates 11. The length direction of the protruding slides 12 is the same as the length direction of the adjustment plates 11. Grooves 13 are opened on the two opposite outer walls of the sorting tray 10 in the width direction. The protruding slides 12 are slidably inserted into the grooves 13. The sliding connection between the sorting tray 10 and the adjustment plates 11 is realized by using the protruding slides 12 and the grooves 13.

[0035] A threaded sleeve 14 is fixed to one end of the adjusting plate 11 near the sorting tray 10. A bolt 15 is connected to the threaded sleeve 14. The bolt 15 abuts against the outer wall of the sorting tray 10. During the actual installation of the equipment, the extension length of the adjusting plate 11 is adjusted according to the needs of the plant environment. This is specifically adjusted according to the position of the receiving container for receiving chips to ensure that the end of the adjusting plate 11 is directly facing the inner cavity of the receiving container. After the adjustment is completed, the bolt 15 is rotated so that the end of the bolt 15 abuts against the outer wall of the sorting tray 10 to complete the fixation.

[0036] An end guard 16 is rotatably mounted on the end of the adjusting plate 11. The end guard 16 consists of a guide ring 17 and a guard portion 18 formed on the top of the guide ring 17 on the side away from the sorting tray 10. The guard portion 18 is rotatably connected to the outer wall of the end of the adjusting plate 11 by a shaft pin. The guard portion 18 surrounds the adjusting plate 11 at the end. The top surface of the guide ring 17 is inclined on the side away from the guard portion 18. A balance block 19 is symmetrically fixed on the outer wall of the guide ring 17 on the side away from the guard portion 18. The balance block 19 ensures that the entire end guard 16 is always balanced with the shaft pin axis as the center, that is, the end guard 16 can always remain vertically upward.

[0037] When the sorting tray 10 rotates and tilts, the end barrier 16 always remains vertically upward, and its barrier part 18 always faces the end of the adjustment plate 11 to physically intercept the falling chip, so that the chip eventually enters the vertical inner cavity of the end barrier 16 and falls downward.

[0038] The inner wall of the enclosure 18 is attached with an elastic silicone layer 20, which can effectively cushion the chip when it slides and impacts the enclosure 18, thus preventing the chip from being damaged.

[0039] After adjusting the adjusting plate 11, ensure that the sorting tray 10 is in an inclined feeding posture. Then, when installing the collection container, ensure that the opening of the collection container is directly below the end enclosure 16. There is no need to repeatedly verify the actual position of the collection container. After the sorting tray 10 is tilted, the chips will not slide out of the collection container, but will slide vertically down the inner wall of the end enclosure 16 into the collection container.

[0040] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A chip testing and sorting device, comprising a testing platform (1), wherein a testing socket (2) is fixed on the top surface of the testing platform (1), characterized in that, Also includes: The transfer mechanism is fixed to the top of the test machine (1). The transfer mechanism is provided with two suction cups (6) arranged side by side along the first horizontal direction, and drives the two suction cups (6) to perform lifting and lowering movements and translational movements along the first horizontal direction simultaneously. The sorting mechanism includes a rotating component and a sorting tray (10) disposed on one side of the test machine (1). The output end of the rotating component is fixedly connected to the sorting tray (10) for driving the sorting tray (10) to rotate and tilt around an axis along the first horizontal direction. The length direction of the sorting tray (10) is set along a second horizontal direction perpendicular to the first horizontal direction. Adjustment plate (11) is symmetrically slidably sleeved on the outer wall of both ends of sorting tray (10) to extend the chip dropping path length and is positioned on sorting tray (10) by positioning component; The end guard (16) is rotatably mounted on the adjustment plate (11). When the sorting tray (10) is rotated and tilted, the end guard (16) always remains vertically upward. Its guard part (18) is always facing the end of the adjustment plate (11) to physically intercept the falling chip, so that the chip enters the vertical inner cavity of the end guard (16) and falls downward.

2. The chip testing and sorting device according to claim 1, characterized in that, The transfer mechanism includes a lead screw linear module (3) fixed on the top surface of the test machine (1). The driving direction of the lead screw linear module (3) is set along the first horizontal direction. An electric push rod (4) is fixed at the moving end of the lead screw linear module (3). The electric push rod (4) is set in a longitudinal direction. A horizontal plate (5) is fixed at the extended end of the electric push rod (4). Two suction cups (6) are fixed on the horizontal plate (5).

3. The chip testing and sorting device according to claim 2, characterized in that, The length direction of the horizontal plate (5) is the same as that of the lead screw linear module (3), and the two suction cups (6) are located at both ends of the horizontal plate (5) along the first horizontal direction.

4. The chip testing and sorting device according to claim 1, characterized in that, The rotating assembly includes a support frame (7) fixed on the side of the test machine (1) adjacent to the sorting tray (10). The end of the support frame (7) away from the test machine (1) is rotatably connected to a rotating shaft (8) via a bearing. The axis of the rotating shaft (8) is set along the first horizontal direction. A motor (9) is fixed to the end of the support frame (7) near the rotating shaft (8). The end of the rotating shaft (8) near the motor (9) passes through the support frame (7) and is fixed to the output end of the motor (9). The bottom surface of the sorting tray (10) is fixed to the end of the rotating shaft (8) away from the motor (9), and the rotating shaft (8) is located in the middle of the bottom surface of the sorting tray (10).

5. The chip testing and sorting device according to claim 1, characterized in that, The two inner walls of the adjusting plate (11) are fixed with raised slide bars (12), the length direction of the raised slide bars (12) is the same as the length direction of the adjusting plate (11), and the two outer walls of the sorting tray (10) in the width direction are provided with grooves (13), and the raised slide bars (12) are slidably inserted into the grooves (13).

6. The chip testing and sorting device according to claim 5, characterized in that, The positioning component includes a threaded sleeve (14) fixed to one end of the adjustment plate (11) near the sorting tray (10), and a bolt (15) is threadedly connected to the threaded sleeve (14), with the bolt (15) abutting against the outer wall of the sorting tray (10).

7. The chip testing and sorting device according to claim 1, characterized in that, The end enclosure (16) consists of a guide ring (17) and an enclosure part (18) formed on the top of the guide ring (17) away from the sorting tray (10). The enclosure part (18) is rotatably connected to the outer wall of the end of the adjusting plate (11) by a shaft pin. The enclosure part (18) surrounds the adjusting plate (11) at the end. The top surface of the guide ring (17) away from the enclosure part (18) is inclined. The outer wall of the guide ring (17) away from the enclosure part (18) is symmetrically fixed with a balance block (19). The inner wall of the enclosure part (18) is attached with an elastic silicone layer (20).

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