A rapid temperature change test device

By setting up uniform components inside the variable temperature test chamber and optimizing the heat exchange path using angle adjustment and rotation structures, the problem of uneven testing caused by fixed placement of items was solved, resulting in a more uniform temperature distribution and more accurate test results.

CN224328080UActive Publication Date: 2026-06-05GUIZHOU ARTEK TESTING TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
GUIZHOU ARTEK TESTING TECH CO LTD
Filing Date
2025-04-28
Publication Date
2026-06-05

AI Technical Summary

Technical Problem

In existing rapid temperature change testing devices, the fixed placement of items leads to uneven testing in certain areas, affecting the test results.

Method used

The variable temperature test chamber employs uniform components, including an angle adjustment structure and a rotation structure. Through the cooperation of a cross rod, a moving sleeve, a hinge rod, a cross hinge plate, an electric push rod, a rectangular connecting plate, a placement tray, and a motor, the position of the object can be adjusted and rotated, optimizing the heat exchange path and ensuring uniform temperature changes.

Benefits of technology

It achieves efficient contact between the surface of the object and the airflow inside the test chamber, avoids localized long-term heating or cooling, ensures that all surfaces undergo uniform temperature changes, reduces the influence of temperature gradients, and improves the accuracy of test results.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a kind of quick temperature change test devices, it is related to temperature change test device technical field.The quick temperature change test device, including temperature change experiment box box and uniform component, uniform component is located in temperature change experiment box box, uniform component includes angle adjusting structure and rotating structure, angle adjusting structure is located in the top of rotating structure, rotating structure includes rectangular connecting plate, placing tray and motor, the number of rectangular connecting plate is four groups and is annular array distribution.The quick temperature change test device, can be adjusted according to the position of the article to be detected, optimize the heat exchange path between article and environment, can also rotate article in temperature change environment, by rotating, it can avoid that a part of article is long-term in heating or cooling area, to realize more uniform temperature distribution, effectively reduce the influence of temperature gradient on test result, ensure that all surfaces of article can uniformly experience temperature change.
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