A circuit board testing device
By designing an automated circuit board testing device, which utilizes a combination of lifting components and probes, automated circuit board testing has been achieved. This solves the problems of low testing efficiency and high labor intensity, improves testing efficiency, and reduces the risk of equipment damage.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHANGHAI WEISHU TECH CO LTD
- Filing Date
- 2025-03-18
- Publication Date
- 2026-06-05
Smart Images

Figure CN224328204U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of circuit board testing technology, and in particular to a circuit board testing device. Background Technology
[0002] After circuit boards are manufactured, performance testing is essential. Currently, workers typically clamp the circuit boards in place using fixtures and then manually perform performance tests using handheld probes. This significantly reduces testing efficiency and increases the workload for workers, thus necessitating the design of a circuit board testing device. Utility Model Content
[0003] This utility model specifically provides a circuit board testing device.
[0004] The circuit board testing device provided by this utility model includes a base (301), a lifting assembly, and a testing assembly equipped with probes; the testing assembly is movably connected above the base (301) of the base (301) through the lifting assembly.
[0005] Preferably, the test assembly includes a first base plate (102); the lifting assembly includes two first cantilever arms (201) and a first rotating shaft (203); first baffles (207) are fixed on both sides of the top of the base (301); one end of each of the two first baffles (207) is provided with a first shaft hole; both ends of the first cantilever arms (201) are provided with second shaft holes; one end of each of the two first cantilever arms (201) is hinged to both sides of the first base plate (102); the other end of each of the two first cantilever arms (201) is sleeved on the first rotating shaft (203) and fixed to the first rotating shaft (203).
[0006] Preferably, the lifting assembly further includes two sets of second cantilever arms (206); the two sets of second cantilever arms (206) are symmetrically arranged on both sides of the first substrate (102); the two ends of the second cantilever arms (206) are respectively hinged to the first substrate (102) and the first baffle (207).
[0007] Preferably, the lifting assembly further includes two first lifting rods, two connecting shafts (208), and two first transmission blocks (202); one end of the first transmission block (202) is fixed to the first rotating shaft (203), and the other end is fixed to one end of the connecting shaft (208); the other end of the connecting shaft (208) is hinged to the actuating end (204) of the first lifting rod; the fixed end (205) of the first lifting rod is hinged to the base (301).
[0008] Preferably, the test assembly further includes a test carrier plate (105), multiple springs (107), and two screw rods (104); the test carrier plate (105) is disposed below the first substrate (102); multiple sets of springs (107) are evenly disposed between the first substrate (102) and the test carrier plate (105), and the two ends of the springs (107) are respectively fixed to the test carrier plate (105) and the first substrate (102); the test carrier plate (105) is provided with two sets of first through holes; the screw rod (104) includes a rod body and a cap body; the size of the cap body is larger than that of the rod body; the first through hole is a stepped hole; the rod body passes through the first through hole and is fixed to the first substrate (102); the cap body abuts against the first through hole.
[0009] Preferably, the base (301) is fixed with a plurality of positioning posts (302); the test carrier plate (105) is provided with positioning holes (106) whose positions and numbers match those of the positioning posts (302).
[0010] Preferably, the test assembly further includes a circuit board (103); the circuit board (103) is fixed on top of the first substrate (102); the probe and the circuit board (103) are electrically connected.
[0011] Preferably, the test assembly further includes a protective plate (101); the protective plate (101) is mounted above the circuit board (103).
[0012] Preferably, the test assembly further includes a handle (1004); the handle (1004) is fixed to the front end of the first substrate (102).
[0013] The circuit board testing device provided by this invention eliminates the need for operators to hold probes to test the test areas of the circuit board, thereby greatly improving the testing efficiency of the circuit board. Attached Figure Description
[0014] Figure 1 A first-view structural schematic diagram of the first embodiment of the circuit board testing device provided by this utility model;
[0015] Figure 2 A schematic diagram of the second embodiment of the circuit board testing device provided by this utility model;
[0016] Figure 3 A second-view structural schematic diagram of the first embodiment of the circuit board testing device provided by this utility model;
[0017] Figure 4 for Figure 1 A partially enlarged structural diagram;
[0018] Figure 5 This is a first-view structural diagram of the test component provided in an embodiment of the present utility model;
[0019] Figure 6 This is a partially enlarged structural diagram of the test component provided in an embodiment of the present invention. Detailed Implementation
[0020] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.
[0021] like Figures 1-6 As shown, the circuit board testing device provided in this embodiment includes a base 301, a lifting assembly, and a testing assembly equipped with probes (not shown in the figure). The testing assembly is movably connected above the base 301 via the lifting assembly. Those skilled in the art will understand that the circuit board to be tested is first placed on the base 301. After the testing assembly is placed on the base 301, the probes on the testing assembly will contact the testing area on the circuit board to test its performance. This eliminates the need for an operator to hold the probes while testing the circuit board, thus greatly improving the testing efficiency.
[0022] Furthermore, the testing assembly includes a first substrate 102; the lifting assembly includes two first cantilever arms 201 and a first rotating shaft 203; first baffles 207 are fixed to both sides of the top of the base 301; each of the two first baffles 207 has a first shaft hole at one end; each of the two first cantilever arms 201 has a second shaft hole at both ends; one end of each of the two first cantilever arms 201 is hinged to both sides of the first substrate 102; the other end of each of the two first cantilever arms 201 is sleeved on the first rotating shaft 203 and fixed to the first rotating shaft 203. Those skilled in the art will understand that the two sets of first cantilever arms 201 enable the first substrate 102 to reciprocate above the base 301.
[0023] Furthermore, the lifting assembly also includes two sets of second cantilever arms 206; the two sets of second cantilever arms 206 are symmetrically arranged on both sides of the first substrate 102; the two ends of the second cantilever arms 206 are respectively hinged to the first substrate 102 and the first baffle 207. Those skilled in the art will understand that the second cantilever arms 206 can ensure that the first substrate 102 maintains a horizontal state and its stability during the reciprocating motion.
[0024] Furthermore, the lifting assembly also includes two first lifting rods, two connecting shafts 208, and two first transmission blocks 202; one end of the first transmission block 202 is fixed to the first rotating shaft 203, and the other end is fixed to one end of the connecting shaft 208; the other end of the connecting shaft 208 is hinged to the actuating end 204 of the first lifting rod; the fixed end 205 of the first lifting rod is hinged to the base 301. Those skilled in the art will understand that the first lifting rods can slow down the running speed of the first substrate 102, thus preventing damage to the circuit board or probe due to excessive pressure when the first substrate 102 contacts the circuit board.
[0025] Furthermore, the testing assembly also includes a test carrier plate 105, multiple springs 107, and two routers 104. The test carrier plate 105 is disposed below the first substrate 102. Multiple sets of springs 107 are evenly disposed between the first substrate 102 and the test carrier plate 105, with both ends of each spring 107 fixed to the test carrier plate 105 and the first substrate 102, respectively. The test carrier plate 105 has two sets of first through holes. The routers 104 include a rod and a cap. The cap is larger than the rod. The first through holes are stepped holes. The rod passes through the first through holes and is fixed to the first substrate 102. The cap abuts against the first through hole. Those skilled in the art will understand that the routers 104 limit the maximum distance between the test carrier plate 105 and the first substrate 102, and the springs 107 prevent the test carrier plate 105 from excessively pressing against the first substrate 102, thereby reducing damage to the circuit board or probes.
[0026] Furthermore, the base 301 is fixed with a plurality of positioning posts 302; the test carrier plate 105 is provided with positioning holes 106, the position and number of which match the positioning posts 302. Those skilled in the art will understand that the positioning posts 302 can, on the one hand, confine the circuit board to a specific area, and on the other hand, improve the accuracy of the test carrier plate 105.
[0027] Furthermore, the test assembly also includes a circuit board 103; the circuit board 103 is fixed to the top of the first substrate 102; the probe and the circuit board 103 are electrically connected.
[0028] Furthermore, the test assembly also includes a protective plate 101; the protective plate 101 is mounted above the circuit board 103.
[0029] Furthermore, the test component also includes a handle 1004; the handle 1004 is fixed to the front end of the first substrate 102.
[0030] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and not to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.
Claims
1. A circuit board testing device, characterized in that, The device includes a base (301), a lifting assembly, and a test assembly with probes. The test assembly is movably connected above the base (301) via the lifting assembly. The test assembly includes a first base plate (102). The lifting assembly includes two first cantilever arms (201) and a first rotating shaft (203). First baffles (207) are fixed to both sides of the top of the base (301). One end of each of the two first baffles (207) is provided with a first shaft hole. Both ends of the first cantilever arms (201) are provided with second shaft holes. One end of each of the two first cantilever arms (201) is hinged to both sides of the first base plate (102). The other end of each of the two first cantilever arms (201) is sleeved on the first rotating shaft (203) and fixed to the first rotating shaft (203).
2. The circuit board testing device as described in claim 1, characterized in that, The lifting assembly also includes two sets of second cantilever arms (206); the two sets of second cantilever arms (206) are symmetrically arranged on both sides of the first base plate (102); the two ends of the second cantilever arms (206) are respectively hinged to the first base plate (102) and the first baffle (207).
3. The circuit board testing device as described in claim 2, characterized in that, The lifting assembly also includes two first lifting rods, two connecting shafts (208) and two first transmission blocks (202); one end of the first transmission block (202) is fixed to the first rotating shaft (203), and the other end is fixed to one end of the connecting shaft (208); the other end of the connecting shaft (208) is hinged to the execution end (204) of the first lifting rod; the fixed end (205) of the first lifting rod is hinged to the base (301).
4. The circuit board testing apparatus as described in claim 3, characterized in that, The test assembly further includes a test carrier plate (105), multiple springs (107), and two screw rods (104); the test carrier plate (105) is disposed below the first substrate (102); multiple sets of springs (107) are evenly disposed between the first substrate (102) and the test carrier plate (105), and the two ends of the springs (107) are respectively fixed to the test carrier plate (105) and the first substrate (102); the test carrier plate (105) is provided with two sets of first through holes; the screw rod (104) includes a rod body and a cap body; the size of the cap body is larger than that of the rod body; the first through hole is a stepped hole; the rod body passes through the first through hole and is fixed to the first substrate (102); the cap body abuts against the first through hole.
5. The circuit board testing apparatus as described in claim 4, characterized in that, The base (301) is fixed with a plurality of positioning posts (302); the test plate (105) is provided with positioning holes (106) whose positions and numbers match those of the positioning posts (302).
6. The circuit board testing apparatus as described in claim 5, characterized in that, The test assembly also includes a circuit board (103); the circuit board (103) is fixed on top of the first substrate (102); the probe and the circuit board (103) are electrically connected.
7. The circuit board testing apparatus as described in claim 6, characterized in that, The test assembly also includes a protective plate (101); the protective plate (101) is mounted on top of the circuit board (103).
8. The circuit board testing apparatus as described in claim 7, characterized in that, The test assembly also includes a handle (1004); the handle (1004) is fixed to the front end of the first substrate (102).