Adjustable probe holder for radio frequency circuit board testing

By introducing an adjustable base and buffer clamping mechanism into RF circuit board testing, the problems of cumbersome manual probe position adjustment and lack of buffering are solved, achieving efficient and accurate testing results.

CN224341583UActive Publication Date: 2026-06-09SICHUAN HAIMAO COMM TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SICHUAN HAIMAO COMM TECH CO LTD
Filing Date
2025-07-09
Publication Date
2026-06-09

AI Technical Summary

Technical Problem

Existing RF circuit board testing requires manual adjustment of probe positions, which is cumbersome and lacks buffering during testing, leading to probe wear and affecting accuracy.

Method used

An adjustable base and a multi-stage drive mechanism, combined with a buffer spring clamping mechanism, enable automatic adjustment and buffer protection of the probe.

Benefits of technology

It improves testing efficiency and accuracy, reduces probe wear, simplifies the operation process, and enhances the stability and reliability of testing.

✦ Generated by Eureka AI based on patent content.

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  • Figure CN224341583U_ABST
    Figure CN224341583U_ABST
Patent Text Reader

Abstract

The utility model discloses a kind of adjustable probe bases for radio frequency circuit board test, belong to radio frequency circuit board test field.A kind of adjustable probe base for radio frequency circuit board test, including adjusting base and test device being installed on adjusting base, adjusting base includes first drive mechanism, second drive mechanism being installed on first drive mechanism and third drive mechanism being installed on second drive mechanism, third drive mechanism includes second support, second screw is installed on the side surface of second support, the top end of second screw is connected with the output end of first motor, second screw is installed with second sliding block, the side surface of second sliding block is fixedly installed with the clamping mechanism for clamping test device;The utility model is adjusted base by being set, by three drive mechanisms among them, test device can be driven to move, test radio frequency circuit board by test device, it is simple and convenient to operate, can effectively improve test efficiency and accuracy when testing.
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Description

Technical Field

[0001] This utility model relates to the field of radio frequency circuit board testing technology, and in particular to an adjustable probe holder for radio frequency circuit board testing. Background Technology

[0002] The adjustable probe holder for RF circuit board testing is a specialized device that integrates precision mechanical positioning, RF signal tuning, and pressure control. It is mainly used for signal testing, impedance matching, and performance verification of high-frequency circuit boards.

[0003] A search revealed Chinese patent application number 202222145279.5, which discloses a probe holder comprising a probe holder body, a clamp, a pressing mechanism, and a clamping mechanism. The clamping mechanism includes a locking plate, a handle, a connecting plate, a mounting groove, a second spring, a pull rod, a sliding plate, and a slot. The clamp is fixedly mounted on the front end of the probe holder body, and a slot is provided within the clamp. Two locking plates are provided at the front end of the clamp, and a connecting plate is fixedly mounted on each of the two locking plates on their opposite sides. Two mounting grooves are provided above and below the slot within the clamp, and a sliding plate is slidably connected to each pair of mounting grooves. A pull rod is fixedly mounted on each of the two sliding plates on their opposite sides, and each pull rod extends out of the clamp and is fixedly mounted on a corresponding connecting plate on its opposite side. A second spring is sleeved on each of the two pull rods. This probe holder, through its clamping mechanism, allows for quick installation and removal of the probe from the clamp, saving installation and replacement time.

[0004] Although the aforementioned patent allows for quick installation and removal of the probe from the chuck via a clamping mechanism, saving installation and replacement time, it requires manual adjustment of the probe position during testing, which is cumbersome. Furthermore, the lack of buffering when the probe contacts the test point during testing can easily cause wear and tear on the probe, affecting the accuracy of the test.

[0005] Therefore, there is an urgent need for adjustable probe holders for RF circuit board testing to solve the above problems. Utility Model Content

[0006] The purpose of this invention is to solve the problems in the prior art where the position of the probe needs to be manually adjusted during testing, which is cumbersome and lacks buffering when in contact with the test point, easily causing probe wear and affecting the accuracy of the test. Therefore, an adjustable probe holder for testing radio frequency circuit boards is proposed.

[0007] To achieve the above objectives, the present invention adopts the following technical solution:

[0008] An adjustable probe holder for testing radio frequency circuit boards includes an adjustable base and a testing device mounted on the adjustable base. The adjustable base includes a first driving mechanism, a second driving mechanism mounted on the first driving mechanism, and a third driving mechanism mounted on the second driving mechanism. The third driving mechanism includes a second bracket, a second screw mounted on the side of the second bracket, the top end of the second screw being connected to the output end of a first motor, a second slider mounted on the second screw, and a clamping mechanism for holding the testing device fixedly mounted on the side of the second slider. The clamping mechanism includes a fixing plate fixedly connected to the second slider, a first clamping block connected to the side of the fixing plate via a buffer spring, a second clamping block provided on the outer side of the first clamping block, and the second clamping block and the first clamping block being connected by multiple fastening screws. The testing device is clamped between the first clamping block and the second clamping block.

[0009] As a preferred technical solution of this application, the first driving mechanism includes two end plates, a third screw and a third motor connected to one end of the third screw are provided between the two end plates, and a first slider is installed on the third motor.

[0010] As a preferred technical solution of this application, the second driving mechanism includes a first bracket fixedly connected to the top of the first slider, a first screw is mounted on the top of the first bracket, and one end of the first screw is connected to the output end of the second motor.

[0011] As a preferred technical solution of this application, the first driving mechanism is provided with a carrier plate connected to the top of the end plate above it, and a base plate connected to the bottom of the end plate below it. Adjustable foot pads are installed at the four bottom corners of the base plate.

[0012] As a preferred technical solution of this application, side plates are installed on both the left and right sides of the end plate.

[0013] As a preferred technical solution of this application, the outer side of the testing device is fitted with a protective sleeve.

[0014] As a preferred technical solution of this application, the top of the carrier plate is provided with an anti-slip pad, and the upper part of the carrier plate is symmetrically provided with sliding grooves. A sliding rod is installed inside the sliding groove, and a clamping seat is slidably installed on the sliding rod. A clamping plate is installed on the side of the clamping seat facing the anti-slip pad.

[0015] As a preferred technical solution of this application, a plurality of anti-slip rubber strips are uniformly installed on the side of the clamping plate that contacts the radio frequency circuit board.

[0016] Compared with the prior art, this utility model provides an adjustable probe holder for testing radio frequency circuit boards, which has the following advantages:

[0017] 1. This adjustable probe holder for testing RF circuit boards, through its adjustable base and three drive mechanisms, can move the testing device to perform tests on the RF circuit boards. The operation is simple and convenient, effectively improving testing efficiency and accuracy. It solves the problem of the cumbersome operation of manually adjusting the probe position during testing in existing technologies.

[0018] 2. This adjustable probe holder for RF circuit board testing uses a buffer spring connected to the fixing plate and the first clamping block. When the testing device contacts the test point, the buffer spring provides cushioning, effectively reducing the impact on the test point and minimizing wear. Furthermore, the buffer spring is installed between the fixing plate and the first clamping block, ensuring its use is not affected when changing to different testing devices. This makes installation more convenient and solves the problem in existing technologies where the lack of cushioning during contact with the test point leads to probe wear and affects test accuracy. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0020] Figure 2 This is a schematic diagram of the adjusting base structure of this utility model;

[0021] Figure 3 This utility model Figure 2 A schematic diagram of the structure of part A;

[0022] Figure 4 This is a schematic diagram of the clamping mechanism of this utility model;

[0023] Figure 5 This is a schematic diagram of the carrier plate structure of this utility model.

[0024] In the picture:

[0025] 1. Base plate; 2. Side plate; 3. First bracket; 4. First screw; 5. Second bracket; 6. First motor; 7. Second motor; 8. Second screw; 9. Testing device; 10. Carrier plate; 11. Clamping plate; 12. Third motor; 13. End plate; 14. Adjustable foot pad; 15. Third screw; 16. First slider; 17. Second slider; 18. Fastening screw; 19. First clamping block; 20. Buffer spring; 21. Fixing plate; 22. Test probe; 23. Grounding probe; 24. Second clamping block; 25. Slide groove; 26. Slide rod; 27. Clamping seat; 28. Screw; 29. ​​Anti-slip pad. Detailed Implementation

[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present utility model without creative effort are within the protection scope of the present utility model. Example

[0027] Reference Figures 1-5 An adjustable probe holder for testing radio frequency circuit boards includes an adjustment base and a test device 9 mounted on the adjustment base. The adjustment base includes a first drive mechanism, a second drive mechanism mounted on the first drive mechanism, and a third drive mechanism mounted on the second drive mechanism. The three-dimensional position of the test device 9 can be quickly adjusted through the three drive mechanisms, and the test device 9 can be quickly driven to connect with the test points on the radio frequency circuit board during testing, which is beneficial to improving testing efficiency.

[0028] The first drive mechanism includes two end plates 13, a third screw 15 and a third motor 12 connected to one end of the third screw 15 are provided between the two end plates 13, and a first slider 16 is installed on the third motor 12. The third screw 15 is rotated by the third motor 12, which drives the first slider 16 to slide. The first drive mechanism drives the second drive mechanism to move.

[0029] The second drive mechanism includes a first bracket 3 fixedly connected to the top of the first slider 16, a first screw 4 mounted on the top of the first bracket 3, one end of the first screw 4 being connected to the output end of the second motor 7, and the third drive mechanism being moved by the second motor 7.

[0030] The third drive mechanism includes a second bracket 5 connected to the first screw 4. A second screw 8 is mounted on the side of the second bracket 5. The top end of the second screw 8 is connected to the output end of the first motor 6. A second slider 17 is mounted on the second screw 8. A clamping mechanism for clamping the test device 9 is fixedly mounted on the side of the second slider 17. The test device 9 is clamped by the clamping mechanism. The clamping mechanism can adapt to various test devices 9 and is convenient for clamping during use.

[0031] The first drive mechanism is provided with a carrier plate 10 connected to the top of the end plate 13 above it, and a base plate 1 connected to the bottom of the end plate 13 below it. Adjustable foot pads 14 are installed at the four corners of the bottom of the base plate 1 to support the adjustable base. Side plates 2 are installed on the left and right sides of the end plate 13.

[0032] Reference Figure 2 , Figure 3 and Figure 4Furthermore, the clamping mechanism includes a fixing plate 21 fixedly connected to the second slider 17. A first clamping block 19 is connected to the side of the fixing plate 21 via a buffer spring 20. A second clamping block 24 is provided on the outside of the first clamping block 19. The second clamping block 24 and the first clamping block 19 are connected by multiple fastening screws 18. The testing device 9 is clamped between the first clamping block 19 and the second clamping block 24. During clamping, the second clamping block 24 is moved closer to the first clamping block 19 by rotating the fastening screws 18 to clamp the testing device 9. A protective sleeve is fitted on the outside of the testing device 9 to prevent damage to the outer surface of the testing device 9 during clamping. By setting the buffer spring 20, the impact can be reduced after the test probe 22 and the grounding probe 23 contact the test point during descent, thereby improving the service life of the probe and preventing wear from affecting the accuracy of the test.

[0033] Reference Figure 1 and Figure 5 Furthermore, the top of the carrier board 10 is provided with an anti-slip pad 29, which is used to place the RF circuit board during testing. The carrier board 10 has symmetrically opened grooves 25 on its upper part. A slide rod 26 is installed inside the groove 25. A clamping seat 27 is slidably installed on the slide rod 26. A clamping plate 11 is installed on the side of the clamping seat 27 facing the anti-slip pad 29. Multiple anti-slip rubber strips are evenly installed on the side of the clamping plate 11 that contacts the RF circuit board, which improves the stability during clamping and reduces damage to the circuit board during clamping. Multiple screws 28 are provided on the clamping seat 27. After the RF circuit board is clamped by the sliding clamping plate 11, it is fixed by tightening the screws 28.

[0034] Specifically, when using this adjustable probe holder for RF circuit board testing: place the circuit board to be tested onto the anti-slip pad 29, then slide the clamping plate 11 to clamp both ends of the circuit board through the two clamping plates 11, and then fix the clamping plate 11 with screws 28. After completion, the test device 9 is moved by the drive mechanism, and the circuit board is tested by the test device 9.

[0035] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. An adjustable probe holder for testing radio frequency circuit boards, comprising an adjustment base and a testing device (9) mounted on the adjustment base, characterized in that, The adjustment base includes a first drive mechanism, a second drive mechanism mounted on the first drive mechanism, and a third drive mechanism mounted on the second drive mechanism. The third drive mechanism includes a second bracket (5). A second screw (8) is mounted on the side of the second bracket (5). The top end of the second screw (8) is connected to the output end of the first motor (6). A second slider (17) is mounted on the second screw (8). A clamping mechanism for clamping the test device (9) is fixedly mounted on the side of the second slider (17). The clamping mechanism includes a fixing plate (21) fixedly connected to the second slider (17). A first clamping block (19) is connected to the side of the fixing plate (21) through a buffer spring (20). A second clamping block (24) is provided on the outside of the first clamping block (19). The second clamping block (24) and the first clamping block (19) are connected by multiple fastening screws (18). The test device (9) is clamped between the first clamping block (19) and the second clamping block (24).

2. The adjustable probe holder for testing radio frequency circuit boards according to claim 1, characterized in that, The first driving mechanism includes two end plates (13), a third screw (15) is provided between the two end plates (13), and a third motor (12) is connected to one end of the third screw (15). A first slider (16) is installed on the third motor (12).

3. The adjustable probe holder for testing radio frequency circuit boards according to claim 2, characterized in that, The second drive mechanism includes a first bracket (3) fixedly connected to the top of the first slider (16), a first screw (4) is mounted on the top of the first bracket (3), and one end of the first screw (4) is connected to the output end of the second motor (7).

4. The adjustable probe holder for testing radio frequency circuit boards according to claim 2, characterized in that, The first drive mechanism is provided with a carrier plate (10) connected to the top of the end plate (13) above it, and a base plate (1) connected to the bottom of the end plate (13) below it. Adjustable foot pads (14) are installed at the four bottom corners of the base plate (1).

5. An adjustable probe holder for testing radio frequency circuit boards according to claim 2, characterized in that, Side plates (2) are installed on both the left and right sides of the end plate (13).

6. The adjustable probe holder for testing radio frequency circuit boards according to claim 1, characterized in that, The outer side of the test device (9) is fitted with a protective sleeve.

7. An adjustable probe holder for testing radio frequency circuit boards according to claim 4, characterized in that, The top of the carrier plate (10) is provided with an anti-slip pad (29), and the upper part of the carrier plate (10) is symmetrically provided with a sliding groove (25). A sliding rod (26) is installed inside the sliding groove (25), and a clamping seat (27) is slidably installed on the sliding rod (26). A clamping plate (11) is installed on the side of the clamping seat (27) facing the anti-slip pad (29).

8. An adjustable probe holder for testing radio frequency circuit boards according to claim 7, characterized in that, Multiple anti-slip rubber strips are evenly installed on the side of the clamping plate (11) that contacts the radio frequency circuit board.