A glass component surface shape testing auxiliary device

By designing an auxiliary device for testing the surface shape of glass components, and utilizing a combination of support frame and fixing plate, the problem of fixing the surface of optical components parallel to the emitting surface of laser interferometer was solved, thereby improving the convenience and accuracy of optical component surface shape testing.

CN224425393UActive Publication Date: 2026-06-30UNITED OPTICAL TECH (BEIJING) CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
UNITED OPTICAL TECH (BEIJING) CO LTD
Filing Date
2025-08-14
Publication Date
2026-06-30

AI Technical Summary

Technical Problem

Existing technologies make it difficult to fix the surface of optical components, such as microcrystalline glass, parallel to the emitting surface of a laser interferometer, which makes laser interferometry measurement difficult and unable to complete accurate surface shape detection.

Method used

An auxiliary device for testing the surface shape of glass components was designed, including a fixed plate and a support frame. The support frame consists of two sets of support columns and connecting rods. By adjusting the height difference of the support columns and the sliding connection of the connecting rods, the tilt angle of the fixed plate can be adjusted to adapt to the test surface with different tilt angles.

Benefits of technology

It improves the convenience and accuracy of optical component surface shape inspection, and can adjust heterogeneous inspection surfaces to a horizontal or vertical state to adapt to inspection surfaces with different tilt angles, thereby improving the stability and accuracy of inspection results.

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Abstract

This application relates to the field of optical component assembly technology, specifically to an auxiliary device for testing the surface shape of glass components. The auxiliary device includes a fixing plate for fixing a target microcrystal and a support frame for supporting the fixing plate. The support frame includes two sets of support columns and multiple connecting rods connecting each support column. The fixing plate is fixedly connected to the connecting rods. The two sets of support columns have a height difference, each set including a higher set of support columns and a lower set. Each set of support columns includes two support columns of equal height. The bottoms of the four support columns are fixed on the same plane, and the shortest line connecting any support column to its two adjacent support columns on the same plane is perpendicular to each other. Using the solution provided in this application, heterogeneous target products can be assisted in completing surface shape detection, improving the efficiency and accuracy of surface shape detection.
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Description

Technical Field

[0001] This application relates to the field of optical component assembly technology, specifically to an auxiliary device for testing the surface shape of glass components. Background Technology

[0002] Optical component surface shape detection technologies include contour scanning, Shack-Hartmann detection, phase deflection, and laser interferometry. Laser interferometry is the most commonly used method. Its working principle is as follows: a laser beam is first used to illuminate the surface of the object. After the laser beam is reflected from the surface of the object, it is received by the detector. The detector can calculate the shape of the object surface based on the positional relationship between the reflected laser beam and the emitted laser beam.

[0003] Specifically, when measuring the surface shape of a target product using laser interferometry, a plane mirror needs to be fixed with a fixture so that the surface to be measured is parallel to the laser emitting surface. In practical applications, the surface of the target product is usually irregular. Due to structural limitations, it is difficult to use the fixtures provided with the laser interferometer to fix the surface to be measured in a position parallel to the laser emitting surface. This is especially true for ultra-precision components such as optical elements (e.g., microcrystalline glass), most of their surfaces cannot directly contact other devices, thus making it impossible to complete surface shape data acquisition. If it is still desired to use the laser interferometer measurement method to accurately measure the surface shape of optical elements, an auxiliary fixture is needed to fix the optical product under test so that its surface meets the measurement requirements. Utility Model Content

[0004] The purpose of this application is to provide a glass element surface shape testing auxiliary device to assist heterogeneous target products in completing surface shape detection, thereby improving the efficiency and accuracy of surface shape detection.

[0005] To achieve the above objectives, this application provides an auxiliary device for testing the surface shape of glass components. The auxiliary device includes a fixing plate for fixing a target microcrystal and a support frame for supporting the fixing plate. The support frame includes two sets of support columns and multiple connecting rods connecting each support column. The fixing plate is fixedly connected to the connecting rods. The two sets of support columns have a height difference, each set including a high set of support columns and a low set of support columns. Each set of support columns includes two support columns of equal height. The bottoms of the four support columns are fixed on the same plane, and the shortest line connecting any support column to its two adjacent support columns on the plane is perpendicular to each other. The angle between the surface of the fixing plate and the plane is a1. When the target microcrystal is fixed on the fixing plate, the angle between the measured surface of the target microcrystal and the surface of the fixing plate is a2. a1 and a2 satisfy the following relationship: a1 = a2 or a1 + a2 = 90°.

[0006] In this embodiment of the application, the glass element surface testing auxiliary device further includes a base plate, and the bottoms of the four support columns are fixed on the same panel of the base plate.

[0007] In this embodiment of the application, the support frame further includes a fixing bolt, one end of which is fixedly connected to the fixing plate, and the other end of which is adapted to a pre-set connection hole on the target microcrystal. The axial direction of the fixing bolt is perpendicular to the surface of the fixing plate.

[0008] In this embodiment, the support frame further includes a protective plate, which is detachably connected to the fixing plate via a lead screw. The surface of the protective plate is parallel to the surface of the fixing plate, and the target microcrystal is fixed between the protective plate and the fixing plate.

[0009] In this embodiment, the high-group support columns include a first support column and a second support column of equal height, and the low-group support columns include a third support column and a fourth support column of equal height; the multiple connecting rods include a first connecting rod and a second connecting rod; one end of the first connecting rod is rotatably connected to the top of the third support column, and the other end of the first connecting rod is slidably connected to the first support column, and the other end of the first connecting rod can slide along the length direction of the first support column; the second connecting rod is rotatably connected to the top of the fourth support column, and the other end of the second connecting rod is slidably connected to the second support column, and the other end of the second connecting rod can slide along the length direction of the second support column, wherein the first connecting rod and the second connecting rod always remain parallel; the support frame also includes a sliding groove, the sliding groove being adapted to the bottom of the first support column or the second support column, and the first support column or the second support column being slidably connected to the sliding groove.

[0010] In this embodiment, the support frame further includes a fastening bolt, which is used to restrict the bottom of the first support column or the second support column from sliding along the groove.

[0011] In this embodiment of the application, the fastening bolt includes a lead screw and a nut. The bottom of the first support column or the second support column is provided with a through hole adapted to the lead screw. The length direction of the through hole is perpendicular to the length direction of the slide groove. Along the length direction of the slide groove, slots adapted to the lead screw are respectively provided on the two side walls of the slide groove. The diameter of the nut is larger than the width of the slot.

[0012] In this embodiment, the first support column and the second support column are made of industrial aluminum profiles.

[0013] The solution provided in this application has at least the following beneficial effects:

[0014] The surface profile testing auxiliary device provided in this application includes a fixing plate for fixing a target microcrystal and a support frame for supporting the fixing plate. The support frame allows the fixing plate to be stably held in an inclined state to accommodate the tilt angle of the detection surface on the target microcrystal. This allows the heterogeneous detection surface on the target microcrystal to be adjusted to a horizontal or vertical state, effectively improving the convenience of surface profile testing and the accuracy of the test results. Furthermore, the tilt angle of the fixing plate can be adjusted by changing the distance between the two sets of support columns to accommodate heterogeneous detection surfaces with different tilt angles.

[0015] Other features and advantages of the embodiments of this application will be described in detail in the following detailed description section. Attached Figure Description

[0016] The accompanying drawings are provided to further illustrate the embodiments of this application and form part of the specification. They are used together with the following detailed description to explain the embodiments of this application, but do not constitute a limitation on the embodiments of this application. In the drawings:

[0017] Figure 1 This illustration schematically shows a structural diagram of the glass element surface shape testing auxiliary device from a first-view perspective in an embodiment of this application;

[0018] Figure 2 This schematic diagram illustrates the structure of the glass element surface profile testing auxiliary device for mounting the target microcrystal in an embodiment of this application.

[0019] Figure 3 for Figure 2 Enlarged view of point A in the middle;

[0020] Figure 4 for Figure 2 Enlarged view of point B in the middle;

[0021] Figure 5 for Figure 2 Enlarged view of point C in the middle;

[0022] Figure 6 The schematic diagram illustrates the structure of the glass element surface shape testing auxiliary device from a second perspective in an embodiment of this application.

[0023] Explanation of reference numerals in the attached figures:

[0024] 1. Fixing plate; 2. Support frame; 21. First support column; 22. Second support column; 23. Third support column; 24. Fourth support column; 25. First connecting rod; 26. Second connecting rod; 3. Base plate; 4. Fixing bolt; 5. Guard plate; 6. Slide groove; 61. Slot hole; 7. Fastening bolt; 8. Support column; 100. Target microcrystal; 101. Surface to be measured. Detailed Implementation

[0025] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only for illustration and explanation of the embodiments of this application and are not intended to limit the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0026] It should be noted that if the embodiments of this application involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicators will also change accordingly.

[0027] Furthermore, if the embodiments of this application involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, features defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the technical solutions of various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. If the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed in this application.

[0028] Example 1

[0029] To achieve the above objectives, such as Figure 1 and Figure 2 As shown, this application provides an auxiliary device for testing the surface shape of glass components. The auxiliary device includes a fixing plate 1 for fixing the target microcrystal 100 and a support frame 2 for supporting the fixing plate 1. The support frame 2 includes two sets of support columns and multiple connecting rods connecting each support column. The fixing plate 1 is fixedly connected to the connecting rods. The two sets of support columns have a height difference (there is a height difference between support columns in different groups). The two support groups include a high group of support columns and a low group of support columns. Each group of support columns includes two support columns of equal height. There are a total of four support columns in the two groups. The bottoms of the four support columns are fixed on the same plane, and the shortest line connecting any support column to its two adjacent support columns on the plane is perpendicular to each other (i.e., the four support columns are located at the four vertices of a rectangle). Specifically, the positional relationship between the fixing plate 1, the microcrystal test surface 101, and the plane connecting the bottoms of the support columns is as follows:

[0030] like Figure 2 , Figure 4 and Figure 5 As shown, in this embodiment, the base plate 3 replaces the plane, and the angle between the surface of the fixing plate 1 and the plane is a1. When the target microcrystal 100 is fixed on the fixing plate 1, the angle between the measured surface 101 of the target microcrystal 100 and the surface of the fixing plate 1 is a2. Both a1 and a2 are acute angles, and a1 and a2 satisfy the following relationship: a1 = a2 or a1 + a2 = 90°, that is, when the plane (the surface of the base plate 3) is horizontal, the measured surface 101 of the target microcrystal 100 is horizontal or vertical.

[0031] In this embodiment, to facilitate the connection and disassembly between the fixing plate 1 and the target microcrystal 100, the support frame 2 further includes a fixing bolt 4. One end of the fixing bolt 4 is fixedly connected to the fixing plate 1, and the other end of the fixing bolt 4 is adapted to a pre-set connection hole on the target microcrystal 100. The axis of the fixing bolt 4 is perpendicular to the surface of the fixing plate 1. In use, simply align the connection hole on the target microcrystal 100 with the fixing bolt 4 and insert the fixing bolt 4 into the connection hole. Furthermore, to prevent the included angle α1 from being too large (excessive tilt), the target microcrystal 100 will slide out of the fixing bolt 4. In this embodiment, the support frame 2 also includes a protective plate 5. The protective plate 5 is detachably connected to the fixing plate 1 via a screw rod. The surface of the protective plate 5 is parallel to the surface of the fixing plate 1, and the target microcrystal 100 is fixed between the protective plate 5 and the fixing plate 1.

[0032] Furthermore, in this embodiment, the glass element surface testing auxiliary device also includes a support column 8. There are multiple support columns 8, which are evenly distributed on the fixing plate 1. Their axial direction is perpendicular to the plate surface of the fixing plate 1, and their position is adapted to the contactable part reserved on the microcrystal. The support column 8 can push the target microcrystal 100 away from the fixing plate 1, so as to avoid direct contact between the fixing plate 1 and other parts of the target microcrystal 100.

[0033] Example 2

[0034] Furthermore, to adapt to the measured surface 101 with different slopes, such as Figure 2 and Figure 6 As shown, in this embodiment, the high-group support columns include a first support column 21 and a second support column 22 of equal height, and the low-group support columns include a third support column 23 and a fourth support column 24 of equal height; the multiple connecting rods include a first connecting rod 25, a second connecting rod 26, and multiple transverse connecting rods connecting the first connecting rod 25 and the second connecting rod 26. The multiple transverse connecting rods are parallel to each other and together with the first connecting rod 25 and the second connecting rod 26, they support the fixing plate 1.

[0035] One end of the first connecting rod 25 is rotatably connected to the top of the third support column 23, and the other end of the first connecting rod 25 is slidably connected to the first support column 21. The other end of the first connecting rod 25 can slide along the length direction of the first support column 21. When the end of the first connecting rod 25 can slide along the length direction of the first support column 21, the bottom of the corresponding first support column 21 also needs to slide synchronously on the plane (on the surface of the base plate 3), and its sliding direction on the plane is consistent with the mapping (length) direction of the first connecting rod 25 on the plane. The second connecting rod 26 is rotatably connected to the top of the fourth support column 24, and the other end of the second connecting rod 26 is slidably connected to the second support column 22. The other end of the second connecting rod 26 can slide along the length direction of the second support column 22. When the end of the second connecting rod 26 slides along the length direction of the second support column 22, the bottom of the corresponding second support column 22 also needs to slide synchronously on the plane (on the surface of the base plate 3), and its sliding direction on the plane is consistent with the mapping (length) direction of the second connecting rod 26 on the plane.

[0036] To facilitate the sliding of the first support column 21 or the second support column 22 on the base plate 3, the support frame 2 further includes a sliding groove 6. The sliding groove 6 is fixedly mounted on the base plate 3, and its length direction is parallel to the mapping (length) direction of the first connecting rod 25 or the second connecting rod 26 on the surface of the base plate 3. The sliding groove 6 is adapted to the bottom of the first support column 21 or the second support column 22, and the first support column 21 or the second support column 22 is slidably connected to the sliding groove 6. The first connecting rod 25 and the second connecting rod 26 always remain parallel, that is, the first connecting rod 25 and the second connecting rod 26 move synchronously, and the first support column 21 and the second support column 22 slide synchronously. The first support column 21 and the second support column 22 can be made of industrial aluminum profiles, and the grooves inherent in the industrial aluminum profiles can be used as sliding grooves, which can reduce the difficulty and cost of processing.

[0037] like Figure 2 and Figure 3As shown, in order to allow the first support column 21 and the second support column 22 to stop at any position in the slide groove 6 to adapt to different slopes of the measured surface 101, the following limiting scheme is adopted in this embodiment: The support frame 2 also includes a fastening bolt 7, which is used to restrict the bottom of the first support column 21 or the second support column 22 from sliding along the slide groove 6. The fastening bolt 7 includes a lead screw and a nut. The bottom of the first support column 21 or the second support column 22 is provided with a through hole adapted to the lead screw. The length direction of the through hole is perpendicular to the length direction of the slide groove 6. Along the length direction of the slide groove 6, slots 61 adapted to the lead screw are respectively opened on the two side walls of the slide groove 6. The diameter of the nut is larger than the width of the slot 61. In use, let one end of the lead screw pass through the slot 61 on one side of the slide groove 6, the through hole at the bottom of the first support column 21 or the second support column 22 (near) and the slot 61 on the other side of the slide groove 6 in sequence, and then tighten nuts on both ends of the lead screw until the nuts abut against the outer walls of both sides of the slide groove 6.

[0038] Since the first connecting rod 25 and the second connecting rod 26 are fixed between the high group support column and the low group support column, as long as the distance between the high group support column and the low group support column remains unchanged, and the base plate 3 is horizontally located below each support column, the first connecting rod 25 and the second connecting rod 26 can remain stable due to gravity and the distance between the high group support column and the low group support column. That is, when the base plate 3 is horizontally located below each support column, it is only necessary to use the fastening bolt 7 to fix the first support column 21 and the second support column 22. If the state of the base plate 3 is not considered, and it is necessary to ensure the stability of the connection between the first connecting rod 25 and the second connecting rod 26, it is necessary to configure limiting components to fix the first connecting rod 25 to the first support column 21 and the second connecting rod 26 to the second support column 22. The structure of the limiting component can refer to the structure of the fastening bolt 7 (the structure of the first support column 21 and the second support column 22 needs to be modified accordingly) or other existing limiting structures, which will not be elaborated here. It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0039] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A glass element face shape test auxiliary device characterized by, The glass element surface shape testing auxiliary device includes a fixing plate (1) for fixing the target microcrystal (100) and a support frame (2) for supporting the fixing plate (1); the support frame (2) includes two sets of support columns and multiple connecting rods connecting each support column, and the fixing plate (1) is fixedly connected to the connecting rods. Among them, the two sets of support columns have a height difference. The two sets of support columns include a high set of support columns and a low set of support columns. Each set of support columns includes two support columns of equal height. The bottoms of the four support columns are fixed on the same plane, and the shortest line connecting any support column and its two adjacent support columns on the plane is perpendicular to each other. The angle between the surface of the fixing plate (1) and the plane is a1. When the target microcrystal (100) is fixed on the fixing plate (1), the angle between the measured surface (101) of the target microcrystal (100) and the surface of the fixing plate (1) is a2. Among them, a1 and a2 satisfy the following relationship: a1 = a2 or a1 + a2 = 90°.

2. The glass element face-type test fixture of claim 1, wherein, The glass element surface testing auxiliary device also includes a base plate (3), and the bottoms of the four support columns are fixed on the same panel of the base plate (3).

3. The glass element face-type testing fixture of claim 1, wherein, The support frame (2) also includes a fixing bolt (4), one end of which is fixedly connected to the fixing plate (1), and the other end of which is adapted to a pre-set connection hole on the target microcrystal (100). The axial direction of the fixing bolt (4) is perpendicular to the surface of the fixing plate (1).

4. The glass element face-type test fixture of claim 1, wherein, The support frame (2) also includes a guard plate (5), which is detachably connected to the fixing plate (1) by a screw. The surface of the guard plate (5) is parallel to the surface of the fixing plate (1), and the target microcrystal (100) is fixed between the guard plate (5) and the fixing plate (1).

5. The glass element face-type test fixture of claim 1, wherein, The high-group support columns include a first support column (21) and a second support column (22) of equal height; the low-group support columns include a third support column (23) and a fourth support column (24) of equal height; the multiple connecting rods include a first connecting rod (25) and a second connecting rod (26). One end of the first connecting rod (25) is rotatably connected to the top of the third support column (23), and the other end of the first connecting rod (25) is slidably connected to the first support column (21). The other end of the first connecting rod (25) can slide along the length direction of the first support column (21). The second connecting rod (26) is rotatably connected to the top of the fourth support column (24), and the other end of the second connecting rod (26) is slidably connected to the second support column (22). The other end of the second connecting rod (26) can slide along the length direction of the second support column (22); wherein, the first connecting rod (25) and the second connecting rod (26) always remain parallel. The support frame (2) further includes a sliding groove (6), which is adapted to the bottom of the first support column (21) or the second support column (22), and the first support column (21) or the second support column (22) is slidably connected to the sliding groove (6).

6. The glass element face-type test fixture of claim 5, wherein, The support frame (2) also includes a fastening bolt (7) for restricting the bottom of the first support column (21) or the second support column (22) from sliding along the groove (6).

7. The glass element face-type test fixture of claim 6, wherein, The fastening bolt (7) includes a lead screw and a nut. The bottom of the first support column (21) or the second support column (22) is provided with a through hole adapted to the lead screw. The length direction of the through hole is perpendicular to the length direction of the slide groove (6). Along the length direction of the slide groove (6), slots (61) adapted to the lead screw are respectively provided on the two side walls of the slide groove (6). The diameter of the nut is greater than the width of the slot (61).

8. The glass element face-type test fixture of claim 5, wherein, The first support column (21) and the second support column (22) are made of industrial aluminum profiles.