Integrated rdt chip automatic detection detector

Abstract

The utility model relates to a kind of integrated RDT chip automatic detection detection instrument, including cabinet, the cabinet front end left side hinged connection sealed cabinet door, the power socket is evenly equipped in the rear side of the cabinet interior, the left and right sides of the cabinet inner wall are equipped with carrier plate sliding slot, the carrier plate sliding slot is equipped with slide rail inside, the slide rail sliding connection drawer type test carrier plate, with the advantages that accurate temperature control is realized, it is convenient to maintain and repair, and equipment utilization is improved.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to an integrated RDT chip automatic testing instrument. Background Technology

[0002] RDT testing, also known as reliability demonstration testing, is an experiment used to determine and evaluate the reliability level of a product. Current solid-state drive (SSD) chip RDT testing mainly involves an operator placing the SSD chip to be tested into a designated test area, then securing it with clips within the test area. A certain high temperature is then set in the sealed test area, and finally, a test program is injected into the SSD chip in this sealed, high-temperature environment, and the test is performed. After repeating the test multiple times, ensuring 100% complete data storage guarantees the SSD chip's quality meets standards. While current SSD chip RDT testing is relatively comprehensive...

[0003] Patent application number CN202323603705.6 is a Chinese utility model patent, disclosing an energy-saving RDT high and low temperature aging tester. This energy-saving RDT high and low temperature aging tester includes a tester with a base on its lower surface. A pick-up box is positioned between the base and the tester. A circular hole is located at the center of the inner bottom wall of the tester. This energy-saving RDT high and low temperature aging tester, through the cooperation of a transmission mechanism and a clamping assembly, can realize the transmission of the testing equipment. When the test product needs to be picked up, hot or cold air is transmitted through the circular hole to the space between the tester and the base by rotating the pick-up box outwards. However, the gas is blocked by a baffle to prevent isolation from the outside air and rapid loss of internal temperature, thus achieving energy saving and improving testing accuracy. However, this device has the following problems: First, the device cannot achieve uniform heat distribution, which can easily cause temperature differences and misreading during continuous testing; second, the device is inconvenient to maintain and operate. Utility Model Content

[0004] The purpose of this invention is to address the shortcomings of existing technologies by incorporating a copper heat-spreading strip within a drawer-type test carrier plate. This heat-spreading strip contains an electric heating element and a high-thermal-conductivity silicone grease block at its upper end. Furthermore, the copper heat-spreading strip is positioned in a way that corresponds to the test base strip, thus solving the technical problem of the device's inability to achieve uniform heat distribution and the resulting temperature differences leading to misreading during continuous testing. The invention also addresses the technical issues of inconvenience in maintenance and operation by using a drawer-type test carrier plate that slides to the cabinet via a slide rail within a slot, and a power strip that is pluggable to the power socket.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] An integrated RDT chip automatic testing instrument includes a cabinet. The front left side of the cabinet is hinged to a sealed cabinet door. Power sockets are evenly arranged on the rear side of the cabinet interior. Carrier plate sliding grooves are provided on both the left and right sides of the cabinet interior wall. Slide rails are provided inside the carrier plate sliding grooves, and drawer-type test carrier plates are slidably connected to the slide rails.

[0007] As a preferred embodiment, the sealed cabinet door is provided with a sealing strip around its rear perimeter, and an explosion-proof observation glass is provided at the center of the sealed cabinet door.

[0008] As a preferred embodiment, the drawer-type test carrier includes a device housing, with copper heat spreaders uniformly embedded in the lower part of the device housing, test base strips uniformly provided on the upper part of the device housing, test bases uniformly provided on the upper part of the test base strips, and a power socket provided at the rear end of the device housing. The test bases and the copper heat spreaders are electrically connected to the power socket.

[0009] As a preferred embodiment, the power strip is electrically connected to the power socket in a plug-in manner.

[0010] As a preferred embodiment, the copper heat spreader corresponds to the position of the test base strip, the copper heat spreader strip is provided with an electric heating element inside, and a high thermal conductivity silicone grease block is provided at the upper end of the copper heat spreader strip, the high thermal conductivity silicone grease block is located at the lower end of the test base strip.

[0011] As another preferred option, the left and right ends of the device housing can be inserted into the slide groove of the carrier plate for fixation.

[0012] The beneficial effects of this utility model are:

[0013] (1) In this utility model, a copper heat spreader is provided in the drawer-type test carrier, and an electric heating element is provided inside the copper heat spreader. A high thermal conductivity silicone grease is provided at the top. At the same time, the structure of the copper heat spreader and the test socket strip are corresponding to each other, which can accurately control the working temperature of the chip on the test socket and ensure the accuracy of the chip test results. When the test is started, the power supply board obtains power from the power socket of the cabinet and drives the electric heating element inside the copper heat spreader to generate heat. The heat is quickly diffused to the entire surface of the heat spreader through the high thermal conductivity of copper. At the same time, the high thermal conductivity silicone grease serves as an interface material to fill the gap between the copper heat spreader and the test socket strip, reduce thermal resistance, and ensure that the heat is evenly transferred to the chip on the test socket, thereby keeping the chip on the test socket at a suitable working temperature and achieving precise temperature control.

[0014] (2) In this utility model, the drawer-type test plate is pulled out or pushed into the slide groove along the slide rail. The linear guidance of the slide rail ensures smooth movement. When the drawer-type test plate is fully inserted, the power socket automatically aligns with the power socket on the back of the cabinet and is plugged in to form an electrical path, which facilitates the quick disassembly and replacement of the test plate. At the same time, the left and right ends of the equipment shell can be precisely locked into the slide groove of the plate to ensure the stability of the drawer-type test plate after insertion and the reliability of the electrical connection.

[0015] (3) In this utility model, the electrical connection between the copper heat dissipation strip and the test base strip is centrally managed through the plug-in board, which simplifies the wiring. In the batch inspection process, multiple carrier boards can be used interchangeably, which improves the equipment utilization rate.

[0016] In summary, this device offers advantages such as precise temperature control, ease of maintenance and repair, and improved equipment utilization, especially in the field of chip testing technology. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the overall structure of this utility model.

[0019] Figure 2 This is a schematic diagram of the internal structure of the cabinet, the power socket, and the position of the carrier plate slide groove in this utility model.

[0020] Figure 3 This is a schematic diagram of the drawer-type test plate structure in this utility model.

[0021] Figure 4 This is a schematic diagram of the copper heat spreader structure in this utility model, and a schematic diagram showing the corresponding positions of the copper heat spreader and the test seat bar.

[0022] Figure 5 This is a cross-sectional schematic diagram of the drawer-type test plate in this utility model. Detailed Implementation

[0023] The technical solutions in the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings.

[0024] Example 1

[0025] like Figures 1 to 5As shown, this utility model provides an integrated RDT chip automatic testing instrument, including a cabinet 1. A sealed cabinet door 2 is hinged to the left front of the cabinet 1. Power sockets 3 are evenly distributed on the rear side of the cabinet 1, providing power access points for the electrical equipment inside the cabinet 1. Their even distribution facilitates simultaneous power connection to multiple drawer-type test plates 4. Each power socket 3 contains conductive metal plates connected to an external power source, ensuring a reliable electrical connection when the power plate 42 is inserted. The power socket 3 also has a protective structure to prevent dust and debris from entering and affecting the stability of the electrical connection. Carrier plate sliding grooves 12 are provided on both the left and right sides of the inner wall of the cabinet 1. The slide rail 12 is equipped with a slide rail inside, which slidably connects to the drawer-type test slide plate 4. The slide rail 12 provides a track and support for the installation and sliding of the drawer-type test slide plate 4. The slide rail inside the slide rail 12 adopts a linear guide design, which can provide precise linear guidance for the drawer-type test slide plate 4, ensuring that it is smooth and does not wobble or deviate during the sliding process. The surface of the slide rail is specially treated to have a low coefficient of friction, which allows the drawer-type test slide plate 4 to be easily pulled out or pushed in along the slide rail. At the same time, buffer devices are provided at both ends of the slide rail. When the drawer-type test slide plate 4 reaches the limit position of the slide rail, the buffer devices can reduce the impact force and protect the equipment from damage.

[0026] Furthermore, a sealing strip is provided around the rear perimeter of the sealed cabinet door 2. The sealing strip is made of elastic materials such as rubber. When the sealed cabinet door 2 is closed, the sealing strip will fit tightly against the front end of the cabinet 1, forming a sealed environment and effectively preventing the entry of dust and moisture. An explosion-proof observation glass 21 is provided at the center of the sealed cabinet door 2. The explosion-proof observation glass 21 has high strength and good transparency. During equipment operation, operators can observe the internal conditions of the cabinet 1 through the explosion-proof observation glass 21, such as the working status of the drawer-type test carrier board 4 and the chip testing status. At the same time, the explosion-proof observation glass 21 can withstand a certain amount of pressure and impact. Even if an accident occurs inside the cabinet 1, it can prevent the glass from breaking and causing injury to the operators. The sealed cabinet door 2 protects the equipment inside the cabinet 1 from damage caused by external factors such as dust and moisture.

[0027] Furthermore, the drawer-type test carrier 4 includes a device housing 41, which serves as the main structure of the drawer-type test carrier 4 and protects the internal components. A copper heat spreader strip 43 is uniformly embedded in the lower part of the device housing 41. The copper heat spreader strip 43 is made of high-purity copper, which has excellent thermal conductivity and can quickly transfer heat away. Test socket strips 44 are uniformly arranged on the upper part of the device housing 41, and test sockets are uniformly arranged on the upper part of the test socket strips 44. The test sockets are used to place the chip to be tested. The test sockets and the chip are electrically connected through pins or contacts to perform various performance tests on the chip. A power socket 42 is provided at the rear end of the device housing 41. The test sockets 44 and the copper heat spreader strip 43... The power strip 42 is electrically connected. When the power strip 42 obtains power from the power socket 3, it simultaneously supplies power to the test socket 44 and the copper heat spreader 43. The power strip 42 is a key component for obtaining power to the drawer-type test carrier 4. Its design matches the power socket 3. The power strip 42 has conductive pins, which are connected to the test socket 44 and the copper heat spreader 43 by wires. When the drawer-type test carrier 4 is pushed into the carrier slide groove 12 along the slide rail until it is fully inserted, the conductive pins of the power strip 42 will accurately insert into the conductive metal piece of the power socket 3, forming an electrical path. This plug-and-play electrical connection method not only facilitates quick disassembly and replacement of the test carrier, but also ensures good electrical contact performance after multiple plugging and unplugging.

[0028] Furthermore, the power strip 42 is electrically connected to the power socket 3 via a plug-in connection.

[0029] Furthermore, the copper heat spreader 43 corresponds to the position of the test socket 44. The copper heat spreader 43 is equipped with an electric heating element, which is generally a resistance wire. When current passes through the resistance wire, the resistance wire generates heat. A high thermal conductivity silicone grease block 431 is provided at the upper end of the copper heat spreader 43. The high thermal conductivity silicone grease block 431 is located at the lower end of the test socket 44. The high thermal conductivity silicone grease block 431 is a material with high thermal conductivity. It fills the gap between the copper heat spreader 43 and the test socket 44, so that heat can be transferred more efficiently from the copper heat spreader 43 to the chip on the test socket 44.

[0030] Furthermore, the left and right ends of the device housing 41 can be inserted into the carrier plate slide groove 12 for fixation, ensuring the stability of the drawer-type test carrier plate 4 after insertion and the reliability of the electrical connection.

[0031] Working Process: First, the chip under test is placed sequentially in the test socket on the upper end of the test socket 44. The chip pins are electrically connected to the test socket. Next, the drawer-type test carrier 4 is pushed in along the carrier slide groove 12 on the inner wall of the cabinet. The linear guide rail design of the slide rail ensures smooth operation without shaking. The left and right ends of the device housing 41 are precisely engaged in the slide groove. Then, when the carrier is fully inserted, the conductive pins of its rear power socket 42 are connected to the metal plate of the power socket 3 of the cabinet 1, forming an electrical path to power the test socket 44 and the copper heat spreader 43. The current is then delivered through the power socket 42 to the heating element inside the copper heat spreader 43, generating uniform heat. The heat is then transferred to the test socket 44 through the high thermal conductivity silicone grease block 431 at the upper end of the heat spreader. The test socket 44 applies an electrical signal to the chip to perform performance testing. The test data is transmitted to an external analysis system in real time.

[0032] In the description of this utility model, it should be understood that the terms "front and back", "left and right", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or component referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the utility model.

[0033] Of course, those skilled in the art should understand that the term "a" should be understood as "at least one" or "one or more". That is, in one embodiment, the number of an element can be one, while in another embodiment, the number of the element can be multiple. The term "a" should not be understood as a limitation on the quantity.

[0034] The above description is merely a preferred embodiment of this utility model, but the scope of protection of this utility model is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art under the technical guidance of this utility model should be included within the scope of protection of this utility model. Therefore, the scope of protection of this utility model should be determined by the scope of the claims.

Claims

1. An integrated RDT chip automatic inspection and testing instrument, characterized in that: Includes a cabinet (1), the front left side of the cabinet (1) is hinged to a sealed cabinet door (2), the cabinet (1) is evenly provided with power sockets (3) on the rear side inside, the cabinet (1) is provided with a carrier plate slide groove (12) on both the left and right sides of the inner wall of the cabinet (1), the carrier plate slide groove (12) is provided with a slide rail inside, and the slide rail is slidably connected to a drawer-type test carrier plate (4).

2. The integrated RDT chip automatic inspection and testing instrument according to claim 1, characterized in that, The sealed cabinet door (2) is provided with a sealing strip around the rear side, and the sealed cabinet door (2) is provided with an explosion-proof observation glass (21) at the center.

3. The integrated RDT chip automatic inspection and testing instrument according to claim 1, characterized in that, The drawer-type test carrier plate (4) includes a device housing (41), a copper heat spreader strip (43) is uniformly embedded in the lower end of the device housing (41), a test seat strip (44) is uniformly provided on the upper end of the device housing (41), a test seat is uniformly provided on the upper end of the test seat strip (44), and a power socket (42) is provided at the rear end of the device housing (41). The test seat strip (44) and the copper heat spreader strip (43) are electrically connected to the power socket (42).

4. The integrated RDT chip automatic replacement testing instrument according to claim 3, characterized in that, The power strip (42) is electrically connected to the power socket (3) via a plug-in connection.

5. The integrated RDT chip automatic inspection and testing instrument according to claim 3, characterized in that, The copper heat spreader (43) is located in a position corresponding to the test base strip (44). The copper heat spreader (43) is equipped with an electric heating element inside, and a high thermal conductivity silicone grease block (431) is provided at the upper end of the copper heat spreader (43). The high thermal conductivity silicone grease block (431) is located at the lower end of the test base strip (44).

6. The integrated RDT chip automatic inspection and testing instrument according to claim 3, characterized in that, The left and right ends of the device housing (41) can be inserted into the carrier plate groove (12) for fixation.

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