A circuit and testing apparatus for testing a bound multiplexing output driving chip
By designing a drive voltage detection circuit and using a detection circuit structure composed of diodes and resistors, the high and low level voltages of the multi-output drive chip can be directly detected, solving the problems of complex and costly detection circuits in the existing technology, and realizing efficient and accurate anomaly detection.
CN224553420UActive Publication Date: 2026-07-24SHANDONG LANBEISITE EDUCATIONAL EQUIP GRP +1
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHANDONG LANBEISITE EDUCATIONAL EQUIP GRP
- Filing Date
- 2025-06-30
- Publication Date
- 2026-07-24
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Figure CN224553420U_ABST
Abstract
The utility model discloses a kind of circuit and test equipment for testing binding multi-channel output driving chip, comprising: main controller, and driving voltage detection circuit and voltage conversion circuit connected with main controller respectively;External power supply is connected with voltage conversion circuit, voltage conversion circuit is connected with multi-channel output driving chip, for providing driving power supply voltage for multi-channel output driving chip;Every output of multi-channel output driving chip is connected to driving voltage detection circuit.The utility model realizes the abnormal detection of each driving output pin of multi-channel output driving chip according to voltage condition, does not need to use analog switch chip, also does not need to adopt current filling mode, circuit structure is simple and reliable, low in cost, can improve detection efficiency simultaneously.
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