A detector for detecting the life of a neon lamp

Abstract

The utility model discloses a detection appearance for neon lamp life detection relates to lamps and lanterns detection technical field, including detection box, the top of detection box is installed with the turnover cover, is installed with the adhesive tape between turnover cover and detection box outer wall, is installed with the fixed frame and baffle on turnover cover, is installed with the pivot in the fixed frame, the pivot is fixed at the both ends of turnover cover, and the fixed frame and baffle divide turnover cover into single test station, and the fixed frame inner wall and baffle two -sided side wall on both sides of test station are installed with high -voltage power supply unit. The utility model discloses through being installed with intelligent detection module, has realized the function of automatic detection neon lamp life, accurately judges invalid time, avoided manual misjudgment, and the life determination error is greatly reduced, and the reliability of life detection is improved, and manual operation is not needed, and the operation and maintenance cost is reduced.

Description

Technical Field

[0001] This utility model relates to the field of lighting testing technology, specifically a testing instrument for testing the lifespan of a neon lamp. Background Technology

[0002] Neon lamps are widely used for status indication in electrical equipment due to their simple structure, low cost, and high voltage resistance. Their lifespan is affected by factors such as operating voltage, ambient temperature, and switching frequency, and their reliability needs to be evaluated through lifespan testing. Existing detection methods are mostly manual visual inspection, which is inefficient, highly subjective, and cannot record the failure time in real time. The failure mode of neon lamps is mainly glow extinguishing or brightness decay, but the decay process is nonlinear, making it difficult for manual detection to capture the brightness decay process and making it impossible to achieve multi-channel synchronous monitoring and data analysis. Summary of the Invention

[0003] The purpose of this invention is to provide a detector for neon lamp life testing, so as to solve the technical problem of low efficiency in neon lamp life testing mentioned in the background art.

[0004] To achieve the above objectives, this utility model provides the following technical solution: a neon lamp life testing instrument, comprising a testing box, a flip-top cover plate installed on the top of the testing box, an adhesive strip installed between the flip-top cover plate and the outer wall of the testing box, a fixing frame and a partition plate installed on the flip-top cover plate, a rotating shaft installed inside the fixing frame, the rotating shaft being fixed to both ends of the flip-top cover plate, the fixing frame and the partition plate dividing the flip-top cover plate into individual testing stations, and high-voltage power supply units installed on the inner walls of the fixing frame and the two side walls of the partition plate on both sides of the testing station; A baffle is installed on the middle vertical inner wall of the detection box below the flip cover. An isolation plate matching the partition on the flip cover is installed on the baffle. A photoelectric sensing unit is installed in the independent space formed by the isolation plate and the baffle.

[0005] Preferably, an intelligent detection module and a power supply are installed in the cavity formed by the bottom of the detection box and the baffle. The power supply is installed on the lower inner wall of the detection box and is connected to the intelligent detection module and the high-voltage power supply unit through a power cord. A power interface is opened on the outer side wall of the detection box and is connected to the power supply.

[0006] Preferably, the photoelectric sensing unit is connected to the intelligent detection module via a signal line passing through the baffle. The intelligent detection module includes an MCU microcontroller, a data processing unit, a data output unit, and a storage unit. The components are connected by signals. The MCU microcontroller collects the photoelectric signal voltage value in real time. The data processing unit compares the brightness signal with the failure threshold in real time, automatically determines the failure, and records the time-brightness curve. The data output unit automatically generates an average time between failures report and a Weibull distribution curve based on the measured data. The storage unit stores the lifetime data locally and supports export via USB and Wi-Fi.

[0007] Preferably, one end of the rotating shaft passes through the fixing frame and the side wall of the test box, and extends out of the test box. A knob is installed on the extended part of the rotating shaft. A cable tray is opened inside the end of the rotating shaft away from the knob. A cable tray opening is opened on the surface of the rotating shaft. The power cord is connected to the power supply and the high-voltage power supply unit through the cable tray, the cable tray opening and the channel in the inner wall of the test box, so as to meet the requirement of the tester to apply the rated voltage to the neon lamp for a long time.

[0008] Preferably, the photoelectric sensing unit has a replaceable filter to adapt to the detection requirements of neon lamps of various luminous colors.

[0009] Preferably, the high-voltage power supply unit has a built-in telescopic spring electrode to adapt to the detection specifications of different types of neon lamps. The high-voltage power supply unit supports AC and DC switching as well as PWM frequency modulation. While providing adjustable power to the test neon lamp, the high-voltage power supply unit can also fix the neon lamp under test.

[0010] Preferably, a heater is provided on the upper inner wall of the testing box, and an observation window and a display screen are opened on the front outer wall of the testing box. The display screen displays the status and testing time of each testing station in real time, and the observation window facilitates observation of the testing status of the neon lamp inside the testing box.

[0011] Compared with the prior art, the beneficial effects of this utility model are: 1. This utility model, by installing an intelligent detection module, realizes the function of automatically detecting the lifespan of the neon lamp, accurately determines the failure time, avoids human misjudgment, greatly reduces the error in lifespan judgment, improves the reliability of lifespan detection, requires no manual supervision, and reduces operation and maintenance costs; 2. This utility model, by installing multiple testing stations, realizes the function of multi-channel synchronous testing of neon lamp life, batch testing of neon lamp life, greatly improving testing efficiency and shortening the product reliability verification cycle. Attached Figure Description

[0012] Figure 1 This is a front view structural diagram of the present utility model; Figure 2 This is a schematic diagram of the front part of the structure of this utility model; Figure 3 This is a schematic diagram of the intelligent control module structure of this utility model; Figure 4 This is a schematic diagram of the rotating shaft structure of this utility model.

[0013] In the diagram: 1. Testing box; 2. Flip-top cover; 3. Testing station; 4. Fixture; 5. Rotating shaft; 6. Partition; 7. High-voltage power supply unit; 8. Knob; 9. Intelligent testing module; 10. Display screen; 11. Photoelectric sensing unit; 12. Power supply; 13. Baffle; 14. Isolation plate; 15. MCU microcontroller; 16. Data processing unit; 17. Data output unit; 18. Storage unit; 19. Conduit; 20. Cable routing port; 21. Observation window; 22. Power interface; 23. Power cord; 24. Adhesive strip. Detailed Implementation

[0014] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0015] In the description of this utility model, it should be noted that the terms "upper," "lower," "inner," "outer," "front end," "rear end," "both ends," "one end," and "the other end," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. In addition, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0016] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installed," "equipped with," "connected," etc., should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0017] Example 1: Please refer to Figure 1 , Figure 2 , Figure 3 and Figure 4A neon lamp life testing instrument includes a testing box 1. A flip cover 2 is installed on the top of the testing box 1. An adhesive strip 24 is installed between the flip cover 2 and the outer wall of the testing box 1. A fixing frame 4 and a partition 6 are installed on the flip cover 2. A rotating shaft 5 is installed inside the fixing frame 4 and fixed to both ends of the flip cover 2. The fixing frame 4 and the partition 6 divide the flip cover 2 into individual testing stations 3. High-voltage power supply units 7 are installed on the inner walls of the fixing frame 4 and the two side walls of the partition 6 on both sides of the testing station 3. A baffle 13 is installed on the middle vertical inner wall of the detection box 1 below the flip cover 2. An isolation plate 14 matching the partition 6 on the flip cover 2 is installed on the baffle 13. A photoelectric sensing unit 11 is installed in the independent space formed by the isolation plate 14 and the baffle 13.

[0018] The intelligent detection module 9 includes an MCU microcontroller 15, a data processing unit 16, a data output unit 17, and a storage unit 18. The components are connected by signals. The MCU microcontroller 15 collects the photoelectric signal voltage value in real time. The data processing unit 16 compares the brightness signal with the failure threshold in real time, automatically determines the failure, and records the time-brightness curve. The data output unit 17 automatically generates an average time between failures report and a Weibull distribution curve based on the measured data. The storage unit 18 stores the lifetime data locally and supports export via USB and Wi-Fi. One end of the rotating shaft 5 passes through the fixing frame 4 and the side wall of the test box 1, and extends out of the test box 1. A knob 8 is installed on the extended part of the rotating shaft 5. A cable tray 19 is opened in the end of the rotating shaft 5 away from the knob 8. A cable outlet 20 is opened on the surface of the rotating shaft 5. The power cord 23 is connected to the power supply 12 and the high-voltage power supply unit 7 through the cable tray 19, the cable outlet 20 and the inner wall channel of the test box 1. The high-voltage power supply unit 7 has a built-in telescopic spring electrode to adapt to the detection specifications of different neon lamps. The high-voltage power supply unit 7 supports AC and DC switching as well as PWM frequency modulation. While providing adjustable power to the test neon lamp, the high-voltage power supply unit 7 can also fix the neon lamp under test. A heater is provided on the upper inner wall of the test chamber 1, and a display screen 10 is provided on the front outer wall of the test chamber 1. The display screen 10 displays the status and test duration of each test station 3 in real time. Furthermore, in response to the batch testing requirements of the production line, the testing box 1 is made of 1.5 mm cold-rolled steel plate welded together, with internal dimensions of 600×400×300 mm. The edge of the flip cover 2 connected to the box body is inlaid with high-temperature resistant silicone strips 24 to ensure sealing. A detachable partition 6 is installed parallel on the flip cover 2 to divide multiple independent testing stations 3. The high-voltage power supply unit 7 on both sides of each testing station 3 has a built-in telescopic spring electrode with a stroke of 0-15 mm, which can be adapted to neon lamp tubes with a diameter of 3-10 mm. The power cord 23 is connected to the high-voltage power supply unit 7 and the bottom power supply 12 through the cable tray 19 inside the rotating shaft 5 and the channel inside the testing box 1. The high-voltage power supply unit 7 uses a programmable high-voltage module with an input of 220V AC and an output of 0-250V DC / AC adjustable, supporting PWM frequency modulation of 0.1-5 Hz to simulate switching action. The baffle 13 divides the interior of the box into upper and lower sections: the upper section is equipped with a neon lamp, and the lower section integrates a detection system. The isolation plate 14 and the baffle 13 form multiple independent optical cavities. Each cavity has a GL5528 type photoresistor photoelectric sensing unit 11 embedded at the top. The peak response of 580nm matches the neon lamp and covers the visible light sensitive band. The signal is connected to the MCU microcontroller 15 of the intelligent detection module 9 via a signal line. The brightness voltage is sampled at a frequency of 100 Hz. The data processing unit 16 sets the failure threshold to 35% of the initial brightness. When the sampling value is lower than the threshold for 10 consecutive times, the failure judgment is triggered and the cumulative time is recorded. During operation, the worker opens the flip cover 2 and inserts multiple neon lamps. After locking the rotating shaft 5 with the knob 8, the flip cover 2 is closed. The parameters are set to DC 180V and the switching frequency to 1 Hz. During the test, the display screen 10 displays the status of each station in real time, such as "Station 03 - has been running for 142 hours". After the test is completed, the data output unit 17 automatically generates an MTBF report and exports it via USB.

[0019] Example 2: Please refer to Figure 1 , Figure 2 and Figure 3 A neon lamp life testing instrument includes a testing box 1. A flip cover 2 is installed on the top of the testing box 1. An adhesive strip 24 is installed between the flip cover 2 and the outer wall of the testing box 1. A fixing frame 4 and a partition 6 are installed on the flip cover 2. A rotating shaft 5 is installed inside the fixing frame 4 and fixed to both ends of the flip cover 2. The fixing frame 4 and the partition 6 divide the flip cover 2 into individual testing stations 3. High-voltage power supply units 7 are installed on the inner walls of the fixing frame 4 and the two side walls of the partition 6 on both sides of the testing station 3. A baffle 13 is installed on the middle vertical inner wall of the detection box 1 below the flip cover 2. An isolation plate 14 matching the partition 6 on the flip cover 2 is installed on the baffle 13. A photoelectric sensing unit 11 is installed in the independent space formed by the isolation plate 14 and the baffle 13.

[0020] The intelligent detection module 9 includes an MCU microcontroller 15, a data processing unit 16, a data output unit 17, and a storage unit 18. The components are connected by signals. The MCU microcontroller 15 collects photoelectric signal voltage values ​​in real time. The data processing unit 16 compares the brightness signal with the failure threshold in real time, automatically determines the failure, and records the time-brightness curve. The data output unit 17 automatically generates an average time between failures report and a Weibull distribution curve based on the measured data. The storage unit 18 stores the lifetime data locally and supports export via USB and Wi-Fi. The photoelectric sensing unit 11 has a replaceable filter to adapt to the detection requirements of neon lamps with different emission colors; The high-voltage power supply unit 7 has a built-in telescopic spring electrode to adapt to the detection specifications of different neon lamps. The high-voltage power supply unit 7 supports AC and DC switching as well as PWM frequency modulation. While providing adjustable power to the test neon lamp, the high-voltage power supply unit 7 can also fix the neon lamp under test. Furthermore, for the reliability verification of neon lamps, a high-temperature accelerated neon lamp life test is adopted. A ceramic heating element with a power of 1.2 kW is added to the inner wall of the test chamber 1. The temperature control range of the intelligent detection module 9 is 40-85℃. The double-layer tempered glass observation window 21 on the front of the test chamber 1 is resistant to 200℃. The internal baffle 13 and the isolation plate 14 are both made of nickel-plated aluminum alloy to prevent high-temperature oxidation. The high-voltage power supply unit 7 has been upgraded to a high-temperature resistant type with insulation class H. The built-in electrode spring has been replaced with Inconel 718 alloy, supporting AC 220 V fluctuation input. The photoelectric sensing unit 11 is equipped with a detachable filter, with a standard configuration of 589 nm orange-red band and an optional 470 nm blue light filter. A thermoelectric cooler (TEC) has been added to suppress temperature drift. The MCU microcontroller 15 synchronously collects temperature and brightness data and calculates the acceleration factor through the Arrhenius model. The neon lamp is tested at 85℃ for 100 hours, which is equivalent to 2000 hours of operation at 25℃. During operation, 32 NE-2 neon lamps are installed in the workstation, and the parameters are set as AC 120 V, temperature 85℃, and switching frequency 2Hz. After the heater is started, the temperature inside the chamber stabilizes to the target value within 10 minutes. In addition to threshold determination, the data processing unit 16 also records the brightness decay rate per thousand hours, such as "Workstation 07 - 1500 hours decay 22%". After the test, the storage unit 18 uploads the Weibull distribution curve to the server via Wi-Fi, which greatly shortens the reliability verification cycle.

[0021] Example 3: Please refer to Figure 1 and Figure 2A neon lamp life testing instrument includes a testing box 1. A flip cover 2 is installed on the top of the testing box 1. An adhesive strip 24 is installed between the flip cover 2 and the outer wall of the testing box 1. A fixing frame 4 and a partition 6 are installed on the flip cover 2. A rotating shaft 5 is installed inside the fixing frame 4 and fixed to both ends of the flip cover 2. The fixing frame 4 and the partition 6 divide the flip cover 2 into individual testing stations 3. High-voltage power supply units 7 are installed on the inner walls of the fixing frame 4 and the two side walls of the partition 6 on both sides of the testing station 3. A baffle 13 is installed on the middle vertical inner wall of the detection box 1 below the flip cover 2. An isolation plate 14 matching the partition 6 on the flip cover 2 is installed on the baffle 13. A photoelectric sensing unit 11 is installed in the independent space formed by the isolation plate 14 and the baffle 13.

[0022] The intelligent detection module 9 includes an MCU microcontroller 15, a data processing unit 16, a data output unit 17, and a storage unit 18. The components are connected by signals. The data processing unit 16 compares the brightness signal with the failure threshold in real time, automatically determines the failure, and records the time-brightness curve. The data output unit 17 automatically generates an average time between failures report and a Weibull distribution curve based on the measured data. The storage unit 18 stores the lifetime data locally and supports export via USB and Wi-Fi. Furthermore, the lightweight and portable design features a carbon fiber composite material for the testing box 1, resulting in a total weight of only 4.5 kg and a size reduced to 400×300×250 mm. The flip cover 2 integrates four testing stations 3, and the rotating shaft 5 is innovatively designed with a quick-release structure: pressing the knob 8 separates the cover for easy replacement of neon lamps in the field. The high-voltage power supply unit 7 has a built-in supercapacitor bank with an instantaneous discharge current of up to 2 A, supporting 2 hours of operation without an external power supply and enabling the testing of 50 neon lamps on a single charge. The photoelectric sensing unit 11 uses a Hamamatsu S1227 high signal-to-noise ratio silicon photodiode, combined with an adjustable gain operational amplifier circuit, with a minimum detection brightness of 0.1 cd / m². The display screen 10 installed on the front of the detection box 1 directly displays the time-brightness curve and the remaining power. The storage unit 18 supports remote transmission. Typical application scenario: Power inspection personnel carry the equipment to the substation, open the cover, insert the neon lamp of the fault indicator into test station 3, set the DC 90 V continuous test mode, and within 10 seconds the screen displays "Station 02 - brightness decayed to 18% of the initial value, failure determined", and the data is synchronously uploaded to the cloud to generate a diagnostic report.

[0023] Working principle: The operator first connects the power interface 22 on the side wall of the test box 1, initializes the system parameters through the front display screen 10, and sets the target temperature of the heater if accelerated aging test is required. Then, the high voltage power supply mode, AC or DC, is selected and the pulse width modulation frequency is set. After the preparation is completed, the flip cover 2 on the top of the test box 1 is flipped upward to expose the multiple test stations 3. The neon lamps to be tested are inserted one by one into the independent test stations 3 divided by the fixing frame 4 and the partition 6. Ensure that the electrodes at both ends of the lamp tube are accurately connected to the telescopic spring contacts in the high voltage power supply unit 7. According to the color of the neon lamp, the corresponding wavelength replaceable filter is installed for each photoelectric sensing unit 11. The system automatically collects the initial brightness value and sets the failure threshold. Rotating the knob 8 drives the rotating shaft 5 to lock. The seal is achieved by the rubber strip 24. At this time, the power line 23 hidden in the wiring tube 19 inside the rotating shaft 5 is connected to the power supply 12 to form a closed loop. After the test officially starts, the high-voltage power supply unit 7 applies a preset voltage to the neon lamp, and the neon lamp enters the working state and emits light. The light shines directly into the photoelectric sensing unit 11 above the baffle 13 in the independent optical path cavity formed by the isolation plate 14. The photosensitive element converts the real-time brightness into a voltage signal, which is transmitted to the intelligent detection module 9 through the signal line passing through the baffle 13. The MCU microcontroller 15 collects the photoelectric signal voltage value at a frequency of once per second. The data processing unit 16 continuously compares the current brightness with the failure threshold: if the sampling value is lower than the threshold for 5 consecutive times, the system determines that the neon lamp of the test station 3 is faulty; if the brightness is normal, the test time is continuously accumulated and the running status is refreshed to the display screen 10. Each test station 3 operates independently without interfering with each other, and the display screen 10 displays the status in zones. When a failure is detected at a certain workstation, the system automatically cuts off the high-voltage power supply to that channel within 0.5 seconds. A prompt appears on the display screen 10, and the storage unit 18 simultaneously records the complete time-brightness curve data of the neon lamp. If other workstations are still under testing, the system only shuts off the power to the failed workstation, while the others continue to run. When all tests are completed or manual termination is required, the operator opens the flip cover 2 to remove the neon lamp. After the test is terminated, the data output unit 17 automatically analyzes the data of the entire batch: calculates the mean time between failures, plots the Weibull life distribution curve, and generates a PDF report containing attenuation rate statistics. The final data can be exported via USB interface or uploaded to the cloud server via Wi-Fi. Routine maintenance requires regular cleaning of the lens of the photoelectric sensing unit 11 to prevent dust accumulation from affecting accuracy, and checking the elasticity of the spring electrodes of the high-voltage power supply unit 7 to avoid poor contact.

[0024] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. A testing instrument for neon lamp life testing, characterized in that: The test box (1) is equipped with a flip cover (2) on the top of the test box (1). A rubber strip (24) is installed between the flip cover (2) and the outer wall of the test box (1). A fixing frame (4) and a partition (6) are installed on the flip cover (2). A rotating shaft (5) is installed inside the fixing frame (4). The rotating shaft (5) is fixed at both ends of the flip cover (2). The fixing frame (4) and the partition (6) divide the flip cover (2) into individual test stations (3). A high-voltage power supply unit (7) is installed on the inner wall of the fixing frame (4) and the two side walls of the partition (6) on both sides of the test station (3). A baffle (13) is installed on the vertical inner wall of the detection box (1) below the flip cover (2). An isolation plate (14) matching the partition (6) on the flip cover (2) is installed on the baffle (13). A photoelectric sensing unit (11) is installed in the independent space formed by the isolation plate (14) and the baffle (13).

2. The neon lamp life testing instrument according to claim 1, characterized in that: The bottom of the test box (1) and the cavity formed by the baffle (13) are equipped with an intelligent test module (9) and a power supply (12). The power supply (12) is installed on the lower inner wall of the test box (1). The power supply (12) is connected to the intelligent test module (9) and the high-voltage power supply unit (7) through the power line (23). A power interface (22) is opened on the outer side wall of the test box (1). The power interface (22) is connected to the power supply (12).

3. The neon lamp life testing instrument according to claim 1, characterized in that: The photoelectric sensing unit (11) is connected to the intelligent detection module (9) through a signal line passing through the baffle (13). The intelligent detection module (9) includes an MCU microcontroller (15), a data processing unit (16), a data output unit (17), and a storage unit (18). The components are connected by signals. The MCU microcontroller (15) collects the photoelectric signal voltage value in real time. The data processing unit (16) compares the brightness signal with the failure threshold in real time, automatically determines the failure, and records the time-brightness curve. The data output unit (17) automatically generates the mean time between failures report and Weibull distribution curve based on the measured data. The storage unit (18) stores the lifetime data locally and supports export via USB and Wi-Fi.

4. The neon lamp life testing instrument according to claim 1, characterized in that: One end of the rotating shaft (5) passes through the fixed frame (4) and the side wall of the test box (1) and extends out of the test box (1). A knob (8) is installed on the extended part of the rotating shaft (5). A cable tray (19) is opened in the end of the rotating shaft (5) away from the knob (8). A cable outlet (20) is opened on the surface of the rotating shaft (5). The power cord (23) is connected to the power supply (12) and the high-voltage power supply unit (7) through the cable tray (19), the cable outlet (20) and the inner wall channel of the test box (1) to meet the requirement of the tester to apply the rated voltage to the neon lamp for a long time.

5. The neon lamp life testing instrument according to claim 1, characterized in that: The photoelectric sensing unit (11) has a replaceable filter to adapt to the detection requirements of neon lamps of various luminous colors.

6. The neon lamp life testing instrument according to claim 1, characterized in that: The high-voltage power supply unit (7) has a built-in telescopic spring electrode to adapt to the detection specifications of different types of neon lamps. The high-voltage power supply unit (7) supports AC and DC switching as well as PWM frequency modulation. While providing adjustable power to the test neon lamp, the high-voltage power supply unit (7) can also fix the neon lamp under test.

7. The neon lamp life testing instrument according to claim 1, characterized in that: The upper inner wall of the test box (1) is equipped with a heater. The front outer wall of the test box (1) has an observation window (21) and a display screen (10). The display screen (10) displays the status and test duration of each test station (3) in real time. The observation window (21) facilitates observation of the test status of the neon lamp inside the test box (1).

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