A testing device and testing system of a charging device

CN224624691UActive Publication Date: 2026-08-11XIAN LINCHR NEW ENERGY TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-09-05
Publication Date
2026-08-11

AI Technical Summary

Technical Problem

[0004]然而,现有技术因缺乏多台设备并行测试能力,造成设备冗余、资源利用率低下;且其测试数据与产线系统之间缺乏协同共享机制,导致数据追溯困难,使得现有方案难以满足规模化生产对高效、精准以及可追溯的需求

Benefits of technology

本申请提供的充电设备的测试装置及测试系统,该测试装置可由第一控制器、至少一个第二控制器、第一测试板、至少一个第二测试板、第一控制导引板、至少一个第二控制导引板、第一枪座、至少一个第二枪座;第一控制器、至少一个第二控制器均连接工控机,工控机通过多控制器分别控制多充电设备的测试链路,提高规模化生产的产能需求,解决传统单台测试系统仅依赖一个控制器,单次只能测试1台充电设备,产线产能提升需复制整套设备,导致成本高、占空间的问题。同时,工控机通过多控制器的独立测试通道指令,实现多充电设备的测试链路的物理与逻辑双重隔离,提升测试精度与可靠性。第一控制器连接第一测试板和第一控制导引板,第一测试板和第一控制导引板均第一枪座,第一枪座用于连接第一充电设备,以对第一充电设备进行测试;每个第二控制器连接一个第二测试板,每个第二测试板连接一个第二控制导引板,至少一个第二控制导引板连接至少一个第二枪座,至少一个第二枪座用于连接至少一个第二充电设备,以对至少一个第二充电设备进行充电测试;第一测试板还分别与至少一个第二控制导引板的信号互锁连接,可隔离弱信号之间的串扰,满足国标对控制导引信号的测试要求,提高测试精度;第一控制导引板还分别与至少一个第二控制导引板的强电互锁连接,以对第一枪座和至少一个第二枪座中任一枪座进行互锁,避免多枪座同时工作导致的高压串流,提高测试安全。由此,本申请通过独立测试链路保障并行效率,和双重互锁机制保障隔离精度与安全的协同设计,既突破了传统单通道测试的效率瓶颈,又解决了多链路测试的信号干扰与安全风险,同时具备灵活扩展性,为充电设备的规模化、高质量测试提供了硬件基础。此外,通过更换枪座接口和调整测试板参数,同一测试装置可测试不同功率、不同类型(如单相或三相)的充电设备,无需为每种充电设备定制对应的测试装置,提升测试装置的复用率。

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Abstract

This application provides a testing apparatus and system for charging equipment, relating to the field of charging equipment testing. The testing apparatus includes: a first controller, at least one second controller, a first test board, at least one second test board, a first control guide board, at least one second control guide board, a first gun holder, and at least one second gun holder; the first controller is connected to the first test board and the first control guide board, and both the first test board and the first control guide board are connected to the first gun holder; each second controller is connected to one second test board, each second test board is connected to one second control guide board, and each second control guide board is connected to one second gun holder; the first test board is also interlocked with each second control guide board, and the first control guide board is also interlocked with each second control guide board. This enables parallel and / or serial testing of charging equipment, improving testing efficiency, and allowing for collaborative sharing of test data with the production line system.
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Description

Technical Field

[0001] This application relates to the field of charging equipment testing, and more specifically, to a testing apparatus and system for charging equipment. Background Technology

[0002] With the explosive growth of the global new energy vehicle industry, charging equipment, as a core energy supply facility, directly impacts user experience and electricity safety in terms of safety, functionality, and metering accuracy. Driven by both policy and market forces, charging equipment production capacity is rapidly expanding. Large-scale production places higher demands on the efficiency, automation level, and data traceability of the testing process. How to ensure testing quality while adapting to mass production has become a core technical challenge for the industry.

[0003] In existing technologies, charging equipment testing mainly adopts the traditional single-unit exclusive mode. This means that a set of testing equipment is connected to one device at a time to sequentially complete functional tests such as CP signal detection, leakage current simulation, metering calibration, and phase sequence verification to verify whether the performance of a single device meets the standards. This mode, through a step-by-step testing process, has achieved core function verification in the early small-scale production stage and has become the mainstream solution.

[0004] However, existing technologies lack the ability to perform parallel testing on multiple devices, resulting in equipment redundancy and low resource utilization. Furthermore, the lack of a collaborative sharing mechanism between test data and the production line system makes data traceability difficult, making it difficult for existing solutions to meet the demands of large-scale production for efficiency, accuracy, and traceability. Utility Model Content

[0005] The purpose of this application is to provide a testing device and system for charging equipment, so as to realize parallel and / or serial testing of the equipment to be charged, improve testing efficiency, and share test data with the production line system.

[0006] To achieve the above objectives, the technical solutions adopted in the embodiments of this application are as follows: In a first aspect, embodiments of this application provide a testing device for a charging device, the testing device comprising: an industrial computer, a first controller, at least one second controller, a first test board, at least one second test board, a first control guide board, at least one second control guide board, a first gun holder, and at least one second gun holder; The first controller is connected to the first test board and the first control guide board. Both the first test board and the first control guide board are the first gun holders. The first gun holders are used to connect to the first charging device to test the first charging device. Each second controller is connected to a second test board, each second test board is connected to a second control guide board, at least one second control guide board is connected to at least one second gun holder, and at least one second gun holder is used to connect at least one second charging device to perform a charging test on the at least one second charging device; The first test board is also interlocked with at least one of the second control guide boards, and the first control guide board is also interlocked with at least one of the second control guide boards to interlock any one of the first gun mount and at least one of the second gun mounts.

[0007] Optionally, the first input interface of the first control guide board and the first input interface of the first test board are both connected to the first gun holder; At least one second input interface of the first control guide plate is connected to at least one first interlock output interface of the second control guide plate, and each first interlock input interface of the second control guide plate is connected to a second gun mount. The first interlock output interface of the second control plate is also connected to the first input interface of the second control plate. At least one output interface of the first test board is connected to at least one second interlock input interface of the second control guide board.

[0008] Optionally, the testing apparatus further includes: at least one metering unit; The second interlock output interface of each of the second control guide boards is connected to one of the metering units, and at least one of the metering units is connected to an industrial control computer.

[0009] Optionally, the first control guide plate includes: a first contactor group, the first contactor group being connected to a first input interface of the first control guide plate, for controlling the on / off state of the test path of the first gun holder.

[0010] Optionally, the second control guide plate includes: a first interlock relay group, a second contactor group, and a second interlock relay group. The first interlock relay group is connected between the first interlock input interface and the first interlock output interface of the second control guide plate. The second contactor group is connected to the first input interface of the second control guide plate. The second interlock relay group is connected between the second interlock input interface and the second interlock output interface of the second control guide plate.

[0011] Optionally, the second interlock relay group includes: a test channel interlock relay and a metering interlock relay; The second interlock input interface of the second control guide plate includes: a channel interlock input interface and a metering interlock input interface; the second interlock output interface of the second control guide plate includes: a channel interlock output interface and a metering interlock output interface. The test channel interlock relay is connected between the channel interlock input interface and the channel interlock output interface on the second control guide board, and the metering interlock relay is connected between the metering interlock input interface and the metering interlock output interface on the second control guide board. The channel interlock input interface is connected to the metering interlock input interface, and both the channel interlock output interface and the metering interlock output interface are connected to the metering unit.

[0012] Optionally, the testing device further includes: at least one IoT module, each of the second controllers is also connected to one of the IoT modules, and each of the IoT modules is also connected to a control terminal of the second control guide board.

[0013] Optionally, the first control guide plate includes at least one second contactor group, wherein the at least one second contactor group is respectively connected to a first interlock output interface of at least one second control guide plate.

[0014] Optionally, the testing device further includes: a fault simulation board, wherein a first fault simulation unit is provided on the fault simulation board, the first fault simulation unit is connected to the first gun holder, and the fault simulation board is also connected to an industrial control computer. The second control guide plate is provided with a second fault simulation unit, which is connected to a second gun mount.

[0015] Secondly, embodiments of this application provide a testing system for charging equipment, the testing system comprising at least: at least one device to be charged, an industrial control computer, and a testing device for the charging equipment described in any of the first aspects above; The testing device of the charging equipment is electrically connected to the at least one device to be charged; the at least one device to be charged is also communicatively connected to the industrial control computer; the industrial control computer is connected to the testing device of the charging equipment.

[0016] Technical effects: The testing apparatus and system for charging equipment provided in this application include a first controller, at least one second controller, a first test board, at least one second test board, a first control guide board, at least one second control guide board, a first gun holder, and at least one second gun holder. The first controller and at least one second controller are both connected to an industrial control computer. The industrial control computer controls the testing links of multiple charging devices through multiple controllers, improving the capacity requirements for large-scale production and solving the problem that traditional single-unit testing systems rely on only one controller, can only test one charging device at a time, and require replicating the entire system to increase production capacity, resulting in high costs and space consumption. Simultaneously, the industrial control computer achieves physical and logical dual isolation of the testing links of multiple charging devices through independent test channel commands from multiple controllers, improving testing accuracy and reliability. The first controller connects to the first test board and the first control guide board. Both the first test board and the first control guide board are first gun holders. The first gun holders are used to connect to the first charging device for testing the first charging device. Each second controller connects to a second test board, and each second test board connects to a second control guide board. At least one second control guide board connects to at least one second gun holder. The at least one second gun holder is used to connect to at least one second charging device for charging testing the at least one second charging device. The first test board is also signal-interlocked with at least one second control guide board to isolate crosstalk between weak signals, meet the national standard requirements for control guide signals, and improve test accuracy. The first control guide board is also high-voltage-interlocked with at least one second control guide board to interlock any gun holder between the first gun holder and at least one second gun holder, avoiding high-voltage crosstalk caused by multiple gun holders working simultaneously and improving test safety. Therefore, this application achieves parallel efficiency through an independent test link and isolation accuracy and safety through a dual interlocking mechanism. This collaborative design not only overcomes the efficiency bottleneck of traditional single-channel testing but also solves the signal interference and safety risks of multi-link testing. Furthermore, it offers flexible scalability, providing a hardware foundation for large-scale, high-quality testing of charging equipment. In addition, by changing the gun socket interface and adjusting the test board parameters, the same testing device can test charging equipment of different power and types (such as single-phase or three-phase), eliminating the need to customize a corresponding testing device for each type of charging equipment and improving the reusability of the testing device. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments of this application will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1A schematic diagram of the structure of a testing device for a charging device provided in an embodiment of this application. Figure 1 ; Figure 2 A schematic diagram of the structure of a testing device for a charging device provided in an embodiment of this application. Figure 2 ; Figure 3 A schematic diagram of the structure of a testing device for a charging device provided in an embodiment of this application. Figure 3 ; Figure 4 This is a schematic diagram of the structure of a testing system for a charging device provided in an embodiment of this application. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0020] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0021] In the description of this application, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the utility model product is in use. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. In addition, the terms "first," "second," and "third," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0022] Furthermore, terms such as "horizontal," "vertical," and "sag" do not imply that components must be absolutely horizontal or suspended, but rather that they can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal relative to "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0023] In the description of this application, it should also be noted that, unless otherwise expressly specified and limited, the terms "set up," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0024] The following detailed description of some embodiments of this application is provided in conjunction with the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0025] To better understand the solutions provided in the embodiments of this application, the testing device and testing system for charging equipment provided in the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0026] Figure 1 A schematic diagram of the structure of a testing device for a charging device provided in an embodiment of this application. Figure 1 .like Figure 1 As shown, the testing device 100 of the charging equipment includes: a first controller 110, at least one second controller 120, a first test board TEST1, at least one second test board TEST2, a first control guide board PA1, at least one second control guide board PA2, a first gun holder 130, and at least one second gun holder 140.

[0027] The first controller 110 and at least one second controller 120 are both connected to an industrial control computer to upload test data from the first controller 110 and at least one second controller 120, and to receive test commands issued by the industrial control computer.

[0028] The first controller 110 connects to the first test board TEST1 and the first control guide board PA1 to issue control commands to them. Both the first test board TEST1 and the first control guide board PA1 are connected to the first charging port 130, which is used to connect to the first charging device for testing. Thus, the first controller 110, the first test board TEST1, the first control guide board PA1, and the first charging port 130 form an independent first test link for testing the first charging device.

[0029] Each second controller 120 is connected to a second test board TEST2 and a second control guide board PA2 to issue control commands to each second control guide board PA2 and each second test board TEST2. Specifically, one second controller 120 corresponds to one second test board TEST2 and one second control guide board PA2. Each second controller 120 independently controls its corresponding second test board TEST2 and second control guide board PA2.

[0030] The industrial control computer is used to run the host computer, run monitoring software, and store data. It is the central brain of the testing system and undertakes three core functions: overall control, data management, and process scheduling.

[0031] It should be noted that the industrial control computer can be used to store test data uploaded by the first controller and at least one second controller for subsequent traceability or sharing with other pre-set production line MES (Manufacturing Execution System) systems. In existing technologies, test data is mostly stored on a single controller or local instrument, making it impossible to link with the production line MES system. Traceability requires manual aggregation, which is inefficient and prone to errors. In the charging equipment testing system 200 of this application, test data from multiple controllers are uploaded to the industrial control computer. The industrial control computer is used to connect to the production line MES system through a pre-set standardized interface, achieving precise binding of test data, equipment information, and production work orders. When a quality problem occurs in a charging device, its test records can be quickly traced through the industrial control computer 210, improving traceability time and production line quality control efficiency.

[0032] Each second test board TEST2 is connected to a second control guide board PA2. At least one second control guide board PA2 is connected to at least one second charging gun socket 140. At least one second charging gun socket 140 is used to connect at least one second charging device to perform charging tests on at least one second charging device. Thus, the second controller 120, the second test board TEST2, the second control guide board PA2, and the second charging gun socket 140 form an independent second test link for testing the second charging device.

[0033] Whether it is the first test link or multiple second test links, they are all connected in series with the controller → test board → control guide board → gun holder, forming a physically independent test channel, and each test channel contains complete test functions.

[0034] The first test board TEST1 is also interlocked with at least one second control guide board PA2, forming a test signal level interlock. When a first gun holder 130 is tested, the output signal of one first test board TEST1 triggers the corresponding second control guide board PA2 to disconnect, avoiding shared resource conflicts.

[0035] The first control guide board PA1 is also interlocked with at least one second control guide board PA2, forming a high-voltage circuit-level interlock to interlock any one of the first gun holder 130 and at least one second gun holder 140, thereby achieving exclusive access of the first control guide board PA1 and at least one second control guide board PA2. That is, only one gun holder is allowed to access the test system at any given time, avoiding multiple gun holders competing for shared test resources, such as multimeters, energy meters, or high-voltage power supplies, and preventing test data distortion caused by signal superposition. Therefore, this application can connect at least two charging devices simultaneously, achieving time-sharing parallelism through the interlocking mechanism. For example, when the first charging device tests low-voltage signals, at least one second charging device can simultaneously test the physical interface, with interlocking isolation only during the high-voltage phase, improving testing efficiency and meeting the batch testing needs of the production line.

[0036] It should be noted that the spatial layout of the dual interlocking mechanism is that the interlocking lines are integrated into the back panel inside the test device 100 to avoid messy external wiring, and are physically isolated from the main test lines, such as the interlocking lines going to the upper layer and the main test lines going to the lower layer.

[0037] The first controller 110 and at least one second controller 120 can be selected according to the actual situation. For example, both the first controller 110 and at least one second controller 120 can be selected as PLCs (Programmable Logic Controllers). It should be noted that the first controller 110 and the second controller 120 can be set to the same controller or different controllers; no restrictions are placed here.

[0038] Both the first control guide board PA1 and the second control guide board PA2 are PCB boards. The first control guide board PA1 can be understood as the original control guide board; the second control guide board PA2 can be understood as the extended control guide board, which is also the core board of this application.

[0039] It should be noted that when adding a third gun holder, only a second controller 120, a second test board TEST2, and a second control guide board PA2 need to be added, and connected to the reserved interlock interfaces of the first test board TEST1 and the first control guide board PA1. There is no need to reconstruct the overall structure of the testing device. Furthermore, each test link is independent; when a gun holder fails, such as a short circuit in the second gun holder 140, only the corresponding second test link is affected, while the first test link continues to function normally, shortening troubleshooting time and improving testing efficiency. The same applies to other newly added gun holders, which will not be elaborated upon here.

[0040] The testing device for charging equipment provided in this application comprises a first controller, at least one second controller, a first test board, at least one second test board, a first control guide board, at least one second control guide board, a first gun holder, and at least one second gun holder. The first controller and at least one second controller are both connected to an industrial control computer. The industrial control computer controls the testing links of multiple charging devices through multiple controllers, improving the capacity requirements for large-scale production and solving the problem that traditional single-unit testing systems rely on only one controller, can only test one charging device at a time, and require replicating the entire system to increase production capacity, resulting in high costs and space consumption. Simultaneously, the industrial control computer achieves physical and logical dual isolation of the testing links of multiple charging devices through independent test channel commands from multiple controllers, improving testing accuracy and reliability. The first controller connects to the first test board and the first control guide board. Both the first test board and the first control guide board are first gun holders. The first gun holders are used to connect to the first charging device for testing the first charging device. Each second controller connects to a second test board, and each second test board connects to a second control guide board. At least one second control guide board connects to at least one second gun holder. The at least one second gun holder is used to connect to at least one second charging device for charging testing the at least one second charging device. The first test board is also signal-interlocked with at least one second control guide board to isolate crosstalk between weak signals, meet the national standard requirements for control guide signals, and improve test accuracy. The first control guide board is also high-voltage-interlocked with at least one second control guide board to interlock any gun holder between the first gun holder and at least one second gun holder, avoiding high-voltage crosstalk caused by multiple gun holders working simultaneously and improving test safety. Therefore, this application achieves parallel efficiency through an independent test link and isolation accuracy and safety through a dual interlocking mechanism. This collaborative design not only overcomes the efficiency bottleneck of traditional single-channel testing but also solves the signal interference and safety risks of multi-link testing. Furthermore, it offers flexible scalability, providing a hardware foundation for large-scale, high-quality testing of charging equipment. In addition, by changing the gun socket interface and adjusting the test board parameters, the same testing device can test charging equipment of different power and types (such as single-phase or three-phase), eliminating the need to customize a corresponding testing device for each type of charging equipment and improving the reusability of the testing device.

[0041] Optionally, Figure 2 A schematic diagram of the structure of a testing device for a charging device provided in an embodiment of this application. Figure 2 .like Figure 2As shown, the first input interfaces (J9 and J10) of the first control guide board PA1 and the first input interfaces (J1 and J2) of the first test board TEST1 are both connected to the first charging gun socket 130 to achieve dual-channel simultaneous acquisition of signals from the first charging device, ensuring consistency between the control logic and the test data. For example, the first control guide board PA1 is used to acquire the control guidance signals of the first charging device for CP / CC logic verification; the first test board TEST1 is used to acquire the test signals of the first charging device for accurate measurement.

[0042] At least one second input interface (J11 and J12) of the first control guide board PA1 is connected to the first interlock output interface (J14A) of at least one second control guide board PA2. The first interlock input interface (J14) of each second control guide board PA2 is connected to a second gun holder 140 to collect the status of a second gun holder 140 in real time and process it to generate an interlock status signal. The first interlock output interface (J14A) of the second control guide board PA2 is also connected to the first input interface (J15 and J16) of the second control guide board PA2 to realize the signal self-locking of the second control guide board PA2 for the corresponding second gun holder 140, ensuring the stability of the status. In this way, an interlock signal chain is constructed between a second gun holder 140, a second control guide board PA2, and the first control board PA1.

[0043] At least one output interface (J5) of the first test board TEST1 is connected to at least one second interlock input interface (J17A and J18A) of the second control guide board PA2 to achieve exclusive control of shared test resources (such as multimeters) and avoid data chaos caused by multiple test channels occupying shared test resources at the same time.

[0044] The testing apparatus for charging equipment provided in this application connects the first input interface of the first control guide board and the first input interface of the first test board to the first gun socket. This dual-interface connection to the first gun socket reduces signal acquisition delay, ensures consistency between the timestamp of control judgment and test data, and meets the high-precision requirements of national standards for control guidance signals. At least one second input interface of the first control guide board is connected to at least one first interlock output interface of the second control guide board. Each first interlock input interface of the second control guide board is connected to a second gun socket, and the first interlock output interface of the second control board is also connected to the first input interface of the second control board. At least one output interface of the first test board is connected to at least one second interlock input interface of the second control board. This allows the interlock signal of the second control guide board to be sent to the first control guide board and also fed back to itself, forming a closed loop of transmission, reception, and self-locking, thereby improving the reliability and testing efficiency of the testing apparatus. Therefore, this application solves the problems of signal asynchrony and interlock failure in traditional designs by using a three-layer logic of synchronous acquisition to ensure data consistency, bidirectional interlock to ensure reliable isolation, and resource reuse to ensure optimal efficiency. It also supports flexible expansion through standardized interfaces, providing key technical support for the large-scale application of testing devices for charging equipment.

[0045] Optionally, continue to refer to Figure 2 The testing device 100 also includes at least one measuring unit 150.

[0046] Each second control guide board PA2 has a second interlock output interface (J17 and J18) connected to a metering unit 150 to enable the second control guide board PA2 to perform metering tests on the second charging equipment; at least one metering unit 150 is communicatively connected to an industrial control computer to upload metering data from at least one metering unit 150 to the industrial control computer for processing, analysis and storage, thereby realizing centralized traceability of metering data and production line collaboration.

[0047] It should be noted that the metering unit 150 is activated only when the corresponding test channel requires metering testing, and remains in a dormant state during non-metering phases, reducing the energy consumption of the testing device. Additionally, it should be noted that if the number of test channels increases from 2 to 4 or more, only 2 additional metering units 150 need to be added and connected to the second interlock output interface of the corresponding second control guide board PA2, without needing to reconstruct the overall signal link, thus reducing expansion costs.

[0048] The testing device for charging equipment provided in this application can be composed of at least one metering unit; the second interlock output interface of each second control guide plate is connected to one metering unit, and at least one metering unit is connected to an industrial control computer. Therefore, the independent binding of one metering unit 150 per test channel in this application can avoid signal cross-interference, ensure the accuracy and uniqueness of metering data, and improve the utilization efficiency and flexible control of the metering unit.

[0049] Optionally, continue to refer to Figure 2 The first control guide plate PA1 includes: a first contactor group 101.

[0050] The first contactor group 101 typically contains multiple independent contactors, which can be selectively activated according to the needs of different test items. For example, the first contactor group 101 may consist of... Figure 2 The first control guide plate PA1 consists of the first gun 2.74K contactor and the first gun 1.3K contactor.

[0051] The first contactor group 101 is connected to the first input interface (J9 and J10) of the first control guide plate PA1, and the first input interface (J9 and J10) of the first control guide plate PA1 is connected to the first gun holder 130 for controlling the on / off of the test path of the first gun holder 130.

[0052] The first controller 110 is used to control the contactors in the first contactor group 101 to engage.

[0053] The testing apparatus for charging equipment provided in this application includes a first control guide plate composed of a first contactor group. The first contactor group is connected to the first input interface of the first control guide plate, so as to control the on / off state of the test path of the first gun holder as needed, thereby achieving physical isolation of the test link and meeting the high-precision testing requirements. The off state of the first contactor group can form a safety isolation, avoiding safety risks.

[0054] Optionally, continue to refer to Figure 2 The second control guide plate PA2 includes: a first interlock relay group 102, a second contactor group 103, and a second interlock relay group 104.

[0055] The first interlock relay group 102 is connected between the first interlock input interface (J14) and the first interlock output interface (J14A) of the second control guide board PA2. The first interlock input interface (J14) is directly connected to the second gun holder 140. The second contactor group 103 is connected to the first input interface (J15 and J16) of the second control guide board PA2, and the first input interface (J15 and J16) of the second control guide board PA2 is connected to the first interlock output interface (J14A) to achieve local state self-locking. Therefore, the first interlock output interface (J14A) is divided into two paths: one path connects to the second input interface (J11 and J12) of the first control guide board PA1 to form an interlocked state between the first control guide board PA1 and the second control guide board PA2; the other path connects to the first input interface (J15 and J16) of the second control guide board PA2 itself to achieve local state self-locking.

[0056] The second interlock relay group 104 is connected between the second interlock input interface (J17A and J18A) and the second interlock output interface (J17 and J18) of the second control guide board PA2. The second interlock output interface (J17 and J18) is connected to a metering unit 150. The second interlock input interface (J17A and J18A) is respectively connected to at least one output interface (J5) of the first test board TEST1 and at least one output interface (J7) of the second test board TEST2. The second interlock relay group 104 is used to control exclusive access to shared test resources (such as multimeters).

[0057] The first interlocking relay group 102, the second contactor group 103, and the second interlocking relay group 104 each include at least one independent contactor, which can be selectively activated according to the needs of different test items. For example, the second contactor group 103 can be... Figure 2 The second control guide plate PA2 consists of the second gun 2.74K contactor and the second gun 1.3K contactor; the second interlock relay group 104 can be composed of... Figure 2 The second control guide plate PA2 consists of test channel interlock relays and metering interlock relays.

[0058] The first interlocking relay group 102 is used to ensure the synchronization of the interlocking channel status, such as the first test channel knowing in real time whether the second test channel is available; the second contactor group 103 is used to realize flexible switching of the path, such as the second test channel can independently complete CP / CC testing, high voltage load testing and other projects without waiting for the first test channel; the second interlocking relay group 104 is used to ensure time-sharing reuse of resources, such as the metering unit 150 seamlessly switching between the two test channels, reducing the switching time.

[0059] It should be noted that the first interlocking relay group 102, the second contactor group 103, and the second interlocking relay group 104 are all controlled by the first controller 120 to switch on and off.

[0060] The testing apparatus for charging equipment provided in this application comprises a second control guide board consisting of a first interlocking relay group, a second contactor group, and a second interlocking relay group. The first interlocking relay group is connected between the first interlocking input interface and the first interlocking output interface of the second control guide board to ensure parallel testing connection of at least one second gun holder and the first gun holder. The second contactor group is connected to the first input interface of the second control guide board to ensure that the second control guide board can independently perform testing connection for a corresponding second gun holder. The second interlocking relay group is connected between the second interlocking input interface and the second interlocking output interface of the second control guide board to ensure exclusive access to shared test resources (such as a multimeter) and ensure the accuracy of measurement data. Therefore, the hierarchical design of the first interlocking relay group, the second contactor group, and the second interlocking relay group in this application enables the second test channel to complete testing independently while also efficiently cooperating with the first test channel. This solves the problems of signal confusion, safety risks, and resource conflicts in traditional multi-channel testing, and improves testing efficiency through high-efficiency parallel processing, providing key technical support for the testing needs of large-scale production of charging equipment.

[0061] Optionally, continue to refer to Figure 2 The second interlock relay group 104 includes: a test channel interlock relay and a metering interlock relay.

[0062] The second interlock input interfaces (J17A and J18A) of the second control guide board PA2 include: a channel interlock input interface (J17A) and a metering interlock input interface (J18A); the second interlock output interfaces (J17 and J18) of the second control guide board PA2 include: a channel interlock output interface (J17) and a metering interlock output interface (J18).

[0063] The test channel interlock relay is connected between the channel interlock input interface (J17A) and the channel interlock output interface (J17) on the second control guide plate PA2. It is used to control the interlock status of the second test channel, i.e., the test link from the gun holder to the test board. It is an execution component for channel-level isolation. The metering interlock relay is connected between the metering interlock input interface (J18A) and the metering interlock output interface (J18) on the second control guide plate PA2. It is used to control the connection status between the second test channel and the metering unit 150. It is an execution component for metering resource-level isolation. The channel interlock input interface (J17A) is connected to the metering interlock input interface (J18A), and both the channel interlock output interface (J17) and the metering interlock output interface (J18) are connected to the metering unit 150.

[0064] The channel interlock input interface (J17A) receives channel occupancy signals from either the first test board (TEST1) or the first test board (TEST2). When the first test channel is under test, the test channel interlock relay is connected to the first test board (TEST1); when the second test channel is under test, the test channel interlock relay is connected to the second test board (TEST2). The metering interlock input interface (J18A) is directly connected to the channel interlock input interface (J17A), meaning both receive the same interlock signal. For example, the channel occupancy signal of the first test board (TEST1) is simultaneously input to both interfaces. Therefore, the interlock signal of the first test board (TEST1) is connected via a hardwired connection from the channel interlock input interface (J17A) to the metering interlock input interface (J18A), synchronously triggering the test channel interlock relay and the metering interlock relay. This achieves coordinated operation of channel isolation and metering isolation, ensuring consistency between the channel interlock input and metering interlock input signals and enhancing the reliability of signal isolation.

[0065] The channel interlock output interface (J17) controls the connection between the output terminal of the test channel interlock relay and the metering unit 150 to measure the current signal; the metering interlock output interface (J18) controls the connection between the output terminal of the metering interlock relay and the metering unit 150 to measure the voltage signal. In other words, both output interfaces are connected to the metering unit 150, meaning that the connection of the metering unit 150 can simultaneously satisfy the conduction of both the test channel interlock relay and the metering interlock relay. Only when both are engaged can the electrical signal of the second test channel be transmitted to the metering unit 150 to obtain the resistance value of the second test channel. In another possible implementation, the connection of the metering unit 150 can satisfy either the conduction of the test channel interlock relay or the metering interlock relay to collect a single current or voltage signal.

[0066] The testing apparatus for charging equipment provided in this application includes a second interlock relay group composed of test channel interlock relays and metering interlock relays. The second interlock input interface of the second control guide board includes a channel interlock input interface and a metering interlock input interface, and the second interlock output interface of the second control guide board includes a channel interlock output interface and a metering interlock output interface. The test channel interlock relays are connected between the channel interlock input interface and the channel interlock output interface on the second control guide board, and the metering interlock relays are connected between the metering interlock input interface and the metering interlock output interface on the second control guide board. The channel interlock input interface is connected to the metering interlock input interface, and both the channel interlock output interface and the metering interlock output interface are connected to the metering unit. Therefore, the second interlock relay group of this application represents a refined upgrade to resource isolation and safety protection in multi-channel testing. It improves resource utilization through layered control, enhances isolation reliability through signal linkage, and reduces operation and maintenance costs.

[0067] Optionally, continue to refer to Figure 2 The testing device 100 also includes at least one Internet of Things module 160.

[0068] Each second controller 120 is also communicatively connected to an IoT module 160, so that the second controller 120 can instruct the IoT module 160 to control the second control guide board PA2; each IoT module 160 is also connected to a control terminal of the second control guide board PA2. Each IoT module 160 is also connected to an industrial control computer to upload test data or receive test commands issued by the industrial control computer.

[0069] Among them, the IoT module 160 can be selected according to the actual situation. For example, the IoT module 160 can be the ZQWL intelligent IoT module.

[0070] The charging equipment testing device provided in this application may further consist of at least one IoT module, with each second controller connected to an IoT module, and each IoT module connected to a control terminal of a second control guide board. Thus, this application uses IoT modules to control different types of second control guide boards, enhancing protocol compatibility and supporting expansion with multiple types of second control guide boards. Simultaneously, the IoT modules improve operational efficiency by uploading real-time test data.

[0071] Optionally, continue to refer to Figure 2 The first control guide plate PA1 includes at least one second contactor group 105.

[0072] In this configuration, at least one second contactor group 105 is connected to the first interlock output interface of at least one second control guide plate PA2 to establish an interlock connection between the first gun holder 130 and at least one second gun holder 140, thereby achieving cross-channel bidirectional interlocking and improving isolation response speed.

[0073] The second contactor group 105 is a cross-channel interlocked contactor group, which typically contains multiple independent contactors that can be selectively activated according to the needs of different test items. For example, the second contactor group 105 can be composed of... Figure 2 The first control guide plate PA1 consists of the second gun 2.74K contactor and the second gun 1.3K contactor.

[0074] It should be noted that if a third control guide board is added to the test device 100, only a second contactor group 105 needs to be added to the first control guide board PA1 and connected to the first interlock output interface of the third control guide board. No modification to the core control logic is required. The interlock signals of each channel are transmitted independently and do not interfere with each other, avoiding the impact of a failure of one channel on the entire test system. It supports multi-channel expansion and adapts to large-scale test requirements.

[0075] The testing apparatus for charging equipment provided in this application includes a first control guide plate composed of at least one second contactor group, with each second contactor group connected to a first interlock output interface of at least one second control guide plate. Thus, the at least one second contactor group and cross-channel interlock connection design of the first control guide plate in this application, by replacing software relay with direct hardware-level response, improves interlock speed and reliability while simplifying system complexity and supporting flexible expansion.

[0076] exist Figure 1 On this basis, Figure 3 A schematic diagram of the structure of a testing device for a charging device provided in an embodiment of this application. Figure 3 .like Figure 3 As shown, the test device 100 also includes a fault simulation board.

[0077] The fault simulation board is equipped with a first fault simulation unit 106, which is connected to the first charging gun holder 130. The fault simulation board is connected to an industrial control computer to simulate complex fault scenarios of the first charging equipment under the command and control of the industrial control computer. The complex fault scenarios can be selected according to the actual situation, such as: electrical faults: abnormal CC resistance, CP voltage drift, PE line breakage or loose connection, L / N phase line short circuit, etc.; timing faults: abnormal CP signal pulse width, charging handshake signal delay, etc.; compound faults: simultaneously simulating multiple fault superposition scenarios such as CC short circuit and PE line breakage.

[0078] The second control guide plate PA2 is equipped with a second fault simulation unit 107, which is connected to a second charging gun holder 140. Under the scheduling of the second controller 120, the unit simulates basic fault scenarios of the second charging device through the Internet of Things module 160. The basic fault scenarios can be selected according to the actual situation, such as: simple electrical faults: CP line breakage, CC resistor open circuit, L line overcurrent, etc.; interface faults: abnormal mechanical lock signal of the charging gun holder, temperature sensor failure, etc.

[0079] The first fault simulation unit 106 is a separate board from the first control guide board PA1, which can cover complex and high-priority faults with richer hardware resources. The second fault simulation unit 107 is integrated into the second control guide board PA2, which can focus on basic and high-frequency faults and is implemented using the existing hardware of the second control guide board PA2 (such as relays) without the need for additional resources. This improves testing efficiency.

[0080] The testing apparatus for charging equipment provided in this application can also be composed of a fault simulation board. The fault simulation board has a first fault simulation unit connected to a first charging gun socket and is also connected to an industrial control computer. A second control guide board has a second fault simulation unit connected to a second charging gun socket. Therefore, the first fault simulation unit is only connected to the first charging gun socket, and the second fault simulation unit is only connected to the corresponding second charging gun socket. The hardware links are completely independent, providing a basis for parallel fault testing and avoiding mutual interference. At the same time, it simplifies the fault testing process and reduces operational complexity.

[0081] Figure 4 This is a schematic diagram of the structure of a testing system for a charging device provided in an embodiment of this application. Figure 4 As shown, the test system 200 includes at least: at least one device to be charged 210, an industrial control computer 220, and a test device 100 for the charging device.

[0082] The charging equipment testing device 100 is electrically connected to at least one device 210 to be charged, ensuring that at least one device 210 can enter normal working condition. At least one device 210 is also communicatively connected to an industrial control computer 220, which in turn is communicatively connected to the charging equipment testing device 100 to upload test data from at least one device 210. This data is then shared between the industrial control computer and the production line's MES (Manufacturing Execution System), meeting production line testing requirements and improving testing efficiency.

[0083] The device to be charged mentioned in this application can be a DC charging device or an AC charging device, without limitation. The AC charging device can be a single-phase, three-phase, or multi-phase AC charging pile.

[0084] The testing device 100 for charging equipment is a test execution carrier used to provide test conditions to the device to be charged 210, collect test data, and judge test results.

[0085] It should be noted that if the test system 200 contains multiple devices 210 to be charged, such as two AC charging devices, then each device 210 to be charged corresponds to an independent test channel of the test device.

[0086] For example, the first device to be charged → the first charging gun socket → the first test link (first controller, first test board and first control guide board); the second device to be charged → the second charging gun socket → the second test link (second controller, second test board and second control guide board); each link is electrically connected by interlocking, such as the hard-wired interlock between the first control guide board and the second control guide board to achieve isolation, so as to avoid signal crosstalk or resource conflicts when testing multiple charging devices.

[0087] The charging equipment testing system provided in this application comprises at least one device to be charged, an industrial control computer, and a testing device for the charging equipment. The testing device is electrically connected to at least one device to be charged, and the at least one device to be charged is also communicatively connected to the industrial control computer. The industrial control computer is connected to the testing device for the charging equipment to achieve a closed-loop test of the device to be charged throughout the entire process. Therefore, the testing system of this application supports parallel testing of multiple devices to be charged, significantly improving testing efficiency, ensuring testing safety, enhancing testing compatibility and flexibility, and adapting to various types of devices to be charged.

[0088] The above description is merely an embodiment of this application and is not intended to limit the scope of protection of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of protection of this application.

Claims

1. A testing device for a charging apparatus, characterized by, The testing device includes: a first controller, at least one second controller, a first test board, at least one second test board, a first control guide board, at least one second control guide board, a first gun holder, and at least one second gun holder; The first controller is connected to the first test board and the first control guide board. Both the first test board and the first control guide board are the first gun holders. The first gun holders are used to connect to the first charging device to test the first charging device. Each second controller is connected to a second test board, each second test board is connected to a second control guide board, at least one second control guide board is connected to at least one second gun holder, and at least one second gun holder is used to connect at least one second charging device to perform a charging test on the at least one second charging device; The first test board is also interlocked with at least one of the second control guide boards, and the first control guide board is also interlocked with at least one of the second control guide boards to interlock any one of the first gun mount and at least one of the second gun mounts.

2. The testing apparatus for charging equipment according to claim 1, characterized in that, The first input interface of the first control guide plate and the first input interface of the first test plate are both connected to the first gun mount; At least one second input interface of the first control guide plate is connected to at least one first interlock output interface of the second control guide plate, and each first interlock input interface of the second control guide plate is connected to a second gun mount. The first interlock output interface of the second control plate is also connected to the first input interface of the second control plate. At least one output interface of the first test board is connected to at least one second interlock input interface of the second control guide board.

3. The testing apparatus for charging equipment according to claim 1, characterized in that, The testing device further includes: at least one metering unit; The second interlock output interface of each of the second control guide boards is connected to one of the metering units, and at least one of the metering units is connected to an industrial control computer.

4. The testing apparatus for charging equipment according to claim 2, characterized in that, The first control guide plate includes a first contactor group, which is connected to a first input interface of the first control guide plate and is used to control the on / off state of the test path of the first gun holder.

5. The testing apparatus for charging equipment according to claim 3, characterized in that, The second control guide plate includes: a first interlock relay group, a second contactor group, and a second interlock relay group. The first interlock relay group is connected between the first interlock input interface and the first interlock output interface of the second control guide plate. The second contactor group is connected to the first input interface of the second control guide plate. The second interlock relay group is connected between the second interlock input interface and the second interlock output interface of the second control guide plate.

6. The testing apparatus for charging equipment according to claim 5, characterized in that, The second interlock relay group includes: a test channel interlock relay and a metering interlock relay; The second interlock input interface of the second control guide plate includes: a channel interlock input interface and a metering interlock input interface; the second interlock output interface of the second control guide plate includes: a channel interlock output interface and a metering interlock output interface. The test channel interlock relay is connected between the channel interlock input interface and the channel interlock output interface on the second control guide board, and the metering interlock relay is connected between the metering interlock input interface and the metering interlock output interface on the second control guide board. The channel interlock input interface is connected to the metering interlock input interface, and both the channel interlock output interface and the metering interlock output interface are connected to the metering unit.

7. The testing apparatus for charging equipment according to claim 1, characterized in that, The testing device further includes: at least one IoT module, each of the second controllers is also connected to one of the IoT modules, and each of the IoT modules is also connected to a control terminal of the second control guide board.

8. The testing apparatus for charging equipment according to claim 2, characterized in that, The first control guide plate includes at least one second contactor group, and the at least one second contactor group is respectively connected to the first interlock output interface of at least one second control guide plate.

9. The testing apparatus for charging equipment according to claim 1, characterized in that, The testing device further includes: a fault simulation board, on which a first fault simulation unit is provided, the first fault simulation unit is connected to the first gun base, and the fault simulation board is also connected to an industrial control computer. The second control guide plate is provided with a second fault simulation unit, which is connected to a second gun mount.

10. A testing system for a charging device, characterized in that, The testing system includes at least: at least one device to be charged, an industrial control computer, and a testing device for the charging device as described in any one of claims 1 to 9; The testing device of the charging equipment is electrically connected to the at least one device to be charged; the at least one device to be charged is also communicatively connected to the industrial control computer; the industrial control computer is connected to the testing device of the charging equipment.