Test device and test system
By introducing a combination of an adapter board and an ammeter into the testing device, the current value of the chip particles can be detected in real time, solving the problem of missed chip particle screening in the prior art and improving testing efficiency and accuracy.
Patent Information
- Application Number
- CN202521769245.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-19
- Publication Date
- 2026-08-25
- Estimated Expiration
- 2035-08-19
AI Technical Summary
The existing loading program test cannot effectively screen out defective products with large power surges caused by faulty chip bodies or poor wire bonding packaging, resulting in the problem of missed chip screening.
By introducing an adapter plate into the testing device and connecting it to the test carrier plate, the computer is used to perform loading program testing, and the current value of the particle under test is detected in real time by an ammeter. A preset threshold is set to activate the alarm device, capture transient electrophoresis, and determine whether there are any hidden dangers in the particles.
This improves the efficiency of screening potentially hazardous chip particles, reduces missed screenings, and ensures the stability and accuracy of testing.
Smart Images
Figure CN224682359U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of chips, and more particularly to a testing device and a testing system. Background Technology
[0002] Currently, chip testing is often limited to loader testing, which refers to the process of importing test programs into a test system to verify chip functionality, electrical parameters, and detect chip-related defects.
[0003] However, current loading program tests do not have the function of screening for defective chips with large power surges caused by defects in the chip itself or poor wire bonding packaging. Therefore, there is often a problem of missing potential chip chips during the testing process.
[0004] Therefore, how to improve the problem of missed screening of test particles and increase the efficiency of test particle detection has become an urgent problem to be solved in this field. Utility Model Content
[0005] This application discloses a testing device and a testing system, the purpose of which is to improve the problem of missed screening of test particles and increase the efficiency of testing particle detection.
[0006] This application discloses a testing device, including: a test carrier plate, a test socket, an adapter plate, and an ammeter. The test socket is mounted on the test carrier plate and is used to mount the particle to be tested. The adapter plate is connected to the test carrier plate and is used to connect to a computer. The ammeter is connected to the adapter plate. The ammeter is used to detect the current value passing through the particle to be tested.
[0007] Optionally, the ammeter includes a control module and an alarm device, the control module being communicatively connected to the alarm device; the control module has a built-in preset threshold, and when the current of the particle under test exceeds the preset threshold, the control module controls the alarm device to activate; wherein, the preset threshold ranges from 15 mA to 30 mA.
[0008] Optionally, the adapter board includes a board body, with a first interface and a second interface respectively provided on opposite sides of the board body. The first interface is connected to a computer via a data cable, and the second interface is plugged into the output interface of the test carrier board. The first interface includes a USB interface, and the second interface includes a SATA interface. The board body is also provided with a third interface, which is connected to the ammeter via a signal line.
[0009] Optionally, the test holder includes a test housing, and a test plate is disposed inside the test housing. The particle to be tested is connected to the test contacts on the test carrier plate through the test plate.
[0010] Optionally, the test board is provided with a plurality of test probes, each of the test probes corresponding to each contact of the particle to be tested; the plurality of contacts of the particle to be tested are connected to the test contacts on the test board through the plurality of test probes.
[0011] Optionally, the test holder further includes a cover plate, which is rotatably connected to the test housing and fastens onto the test housing to press the test particles firmly onto the test plate.
[0012] Optionally, the testing device further includes a housing and a base plate. The base plate is connected to the bottom of the housing and extends relative to the housing to form an extension. The test carrier plate and the adapter plate are both mounted on the base plate. The housing has an internal cavity, the adapter plate is located within the cavity, and the test carrier plate is located on the extension. An opening is provided on the side wall of the housing between the adapter plate and the test carrier plate, and the adapter plate is inserted into the test carrier plate through the opening.
[0013] Optionally, the top of the housing is provided with a first housing, the first housing having a first cavity for accommodating the ammeter, the first housing having a first opening on the side facing the extension, the ammeter including a display screen, the display screen corresponding to the position of the first opening, for displaying the current value passing through the particle to be tested.
[0014] Optionally, the adapter plate is provided with a control switch, which is used to control the signal on / off of the adapter plate; the top of the housing is provided with an opening corresponding to the position of the control switch, and the width of the opening is greater than or equal to the width of the control switch.
[0015] This application also discloses a testing system, including a computer, and the testing system further includes the aforementioned testing device, which is connected to the computer via a data cable.
[0016] This application improves upon traditional testing devices. Firstly, it connects an adapter board to a test carrier board, allowing access to a computer. When the particle to be tested is mounted on the test socket on the test carrier board, the computer can perform a loading test on the particle. Secondly, since the current flowing through the particle passes through the adapter board during testing, an ammeter is connected to the adapter board. The ammeter can detect the current value flowing through the particle in real time, thus capturing the transient electrophoresis of the particle and determining whether it has potential defects. In other words, this application combines loading test and current detection to test particles with potential defects, thereby improving the problem of missed particle screening and increasing the efficiency of particle detection. Attached Figure Description
[0017] The accompanying drawings are provided to further illustrate the embodiments of this application and form part of the specification. They serve to demonstrate implementation methods of this application and, together with the textual description, explain the principles of this application. Obviously, the drawings described below are merely some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without any creative effort. In the drawings:
[0018] Figure 1 This is a schematic diagram of the first embodiment of the test device of this application;
[0019] Figure 2 This is a schematic diagram of a second embodiment of the testing device of this application;
[0020] Figure 3 This is a schematic diagram of the third embodiment of the test device of this application;
[0021] Figure 4 This is a schematic diagram of the fourth embodiment of the test device of this application;
[0022] Figure 5 This is a schematic diagram of an embodiment of the test system of this application.
[0023] Among them, 10 is the testing system; 100 is the testing device; 110 is the testing carrier board; 120 is the testing base; 121 is the testing housing; 122 is the testing board; 123 is the testing probe; 124 is the cover plate; 130 is the adapter board; 131 is the board body; 132 is the first interface; 133 is the USB interface; 134 is the second interface; 135 is the SATA interface; 136 is the third interface; 140 is the control switch; 150 is the ammeter; 151 is the control module; 152 is the alarm device; 153 is the display screen; 160 is the housing; 161 is the cavity; 162 is the first housing; 163 is the first cavity; 164 is the first opening; 165 is the opening; 166 is the opening; 170 is the base plate; 171 is the extension; 200 is the computer; and 300 is the particle to be tested. Detailed Implementation
[0024] The present application will now be described in detail with reference to the accompanying drawings and optional embodiments. It should be noted that, without conflict, the various embodiments or technical features described below can be arbitrarily combined to form new embodiments.
[0025] Figure 1 This is a schematic diagram of the first embodiment of the test device of this application, as shown below. Figure 1 As shown in the figure, this application discloses a testing device 100, including: a test carrier plate 110, a test socket 120, an adapter plate 130, and an ammeter 150. The test socket 120 is mounted on the test carrier plate 110 and is used to mount the particle 300 to be tested. The adapter plate 130 is connected to the test carrier plate 110 and is used to connect to a computer 200. The ammeter 150 is connected to the adapter plate 130. The ammeter 150 is used to detect the current value passing through the particle 300 to be tested.
[0026] This application improves upon the traditional testing device 100. Firstly, it connects the adapter board 130 to the test carrier board 110, allowing access to a computer 200. When the particle to be tested 300 is mounted on the test socket 120 on the test carrier board 110, the computer 200 can perform a loading program test on the particle to be tested 300. Secondly, since the current passing through the particle to be tested 300 passes through the adapter board 130 during testing, an ammeter 150 is connected to the adapter board 130. The ammeter 150 can detect the current value passing through the particle to be tested 300 in real time, thus capturing the transient electrophoresis of the particle to be tested 300 and determining whether there are any potential problems. In other words, this application utilizes the combined auxiliary methods of loading program testing and current detection to test particles 300 with potential problems, thereby improving the problem of missed particle screening and increasing the efficiency of particle detection.
[0027] Specifically, the ammeter 150 includes a control module 151 and an alarm device 152. The control module 151 is communicatively connected to the alarm device 152. The control module 151 has a built-in preset threshold. When the current of the particle 300 under test is greater than the preset threshold, the control module 151 controls the alarm device 152 to start. The preset threshold ranges from 15 mA to 30 mA.
[0028] In this embodiment, an ammeter 150 is connected to an adapter board 130 to detect the current value passing through the particle 300 under test in real time. The ammeter 150 has a built-in control module 151. When the detected current value of the particle 300 under test exceeds its preset threshold, for example, when the actual detected current passing through the particle 300 under test exceeds 30 mA, the control module 151 controls the alarm device 152 to sound an alarm, reminding the tester that the particle 300 under test currently being tested has potential quality problems. This makes it easier for the tester to screen out the particles 300 under test with potential quality problems.
[0029] It should be noted that, under normal circumstances, the current passing through the test particle 300 is 30 mA or less. Generally, when it is in the range of 15 mA to 30 mA, the test particle 300 can be judged as normal. If it exceeds 30 mA, it is judged as abnormal.
[0030] Furthermore, the adapter board 130 includes a board body 131. A first interface 132 and a second interface 134 are respectively provided on opposite sides of the board body 131. The first interface 132 is connected to the computer 200 via a data cable, and the second interface 134 is plugged into the output interface of the test carrier board 110. The first interface 132 includes a USB interface 133, and the second interface 134 includes a SATA interface 135. A third interface 136 is also provided on the board body 131. The third interface 136 is connected to the ammeter 150 via a signal line.
[0031] In this embodiment, the interface of the adapter board 130 is designed. Since the external interface of the computer 200 is generally a USB interface 133, the first interface 132 on the adapter board 130 that connects to the computer 200 is set as a USB interface 133. This way, the adapter board 130 only needs to be connected to the USB interface 133 outside the computer 200 via a data cable. This eliminates the need to open the computer 200's host to connect other types of interfaces, making the connection more convenient.
[0032] In addition, since the output interface on the test carrier board 110 is generally a SATA interface 135, setting the second interface 134 on the adapter board 130 that connects to the test carrier board 110 to a SATA interface 135 is beneficial for quick connection between the connection board and the test carrier board 110, or for plugging and unplugging the test carrier board 110 when needed.
[0033] A third interface 136 is provided on the adapter board 130. The ammeter 150 is connected to the third interface 136 through a signal line to realize the signal conduction between the ammeter 150 and the adapter board 130, and to realize the normal detection function of the ammeter 150.
[0034] Furthermore, the test holder 120 includes a test housing 121, and a test plate 122 is disposed inside the test housing 121. The particle 300 to be tested is connected to the test contacts on the test carrier plate 110 through the test plate 122.
[0035] When the particle to be tested 300 needs to be tested, the particle to be tested 300 is placed on the test plate 122 inside the test housing 121, so that the particle to be tested 300 is connected to the test contacts on the test carrier plate 110 through the test plate 122, so that the particle to be tested 300 can be tested normally on the test carrier plate 110.
[0036] Specifically, the test board 122 is provided with multiple test probes 123, each test probe 123 corresponding to each contact of the particle 300 to be tested; the multiple contacts of the particle 300 to be tested are connected to the test contacts on the test carrier board 110 through the multiple test probes 123.
[0037] After the particle to be tested 300 is placed on the test board 122, multiple contacts of the particle to be tested 300 come into contact with multiple test probes 123 of the test board 122 one by one. Then, the multiple test probes 123 are connected to the test contacts on the test carrier board 110 to realize the conduction between the particle to be tested 300 and the test carrier board 110. This forms a signal path, allowing the particle to be tested 300 to be tested to be tested normally on the test carrier board 110.
[0038] Figure 2 This is a schematic diagram of a second embodiment of the testing device of this application, as shown below. Figure 2 As shown, Figure 2 The illustrated embodiment is based on Figure 1 As an improvement, the test holder 120 also includes a cover plate 124, which is rotatably connected to the test housing 121. The cover plate 124 is fastened to the test housing 121 to press the particle 300 to be tested onto the test plate 122.
[0039] The difference between this embodiment and the previous embodiment is that a cover plate 124 is also installed on the test housing 121 of the test base 120. The cover plate 124 is rotatably connected to the test housing 121, for example, by a pivot connection, so that the cover plate 124 can be opened or closed above the test housing 121.
[0040] When the particle 300 to be tested needs to be tested, it can be placed on the test plate 122 inside the test housing 121. After aligning the contacts of the particle 300 with the test probes 123 on the test plate 122, the cover plate 124 is rotated and fastened on top of the particle 300. On the one hand, the cover plate 124 presses the particle 300 onto the test plate 122, ensuring that the contacts of the particle 300 are in full contact with the test probes 123 on the test plate 122, reducing the likelihood of poor contact or intermittent contact. This ensures a stable connection between the contacts of the particle 300 and the test contacts on the test carrier plate 110 through the test probes 123, guaranteeing the stability of the test. On the other hand, the cover plate 124 fastening on the test housing 121 can, to some extent, prevent moisture and dust from the external environment from entering the test housing 121 and corroding the particle 300 inside, ensuring the normal use of the particle 300.
[0041] Figure 3 This is a schematic diagram of the third embodiment of the test device of this application, as shown below. Figure 3 As shown, the testing device 100 also includes a housing 160 and a base plate 170. The base plate 170 is connected to the bottom of the housing 160 and extends relative to the housing 160 to form an extension 171. The test carrier plate 110 and the adapter plate 130 are both mounted on the base plate 170. The housing 160 has a cavity 161 inside, the adapter plate 130 is located in the cavity 161, and the test carrier plate 110 is located on the extension 171. An opening 166 is provided on the side wall of the housing 160 between the adapter plate 130 and the test carrier plate 110, and the adapter plate 130 is inserted into the test carrier plate 110 through the opening 166.
[0042] The difference between this embodiment and the previous embodiment is that in this embodiment, both the test carrier plate 110 and the adapter plate 130 are supported by the base plate 170. The base plate 170 effectively supports the test carrier plate 110 and the adapter plate 130, thereby improving the structural stability of the test carrier plate 110 and the adapter plate 130.
[0043] A housing 160 is provided above the adapter board 130, so that the test carrier board 110 and the test socket 120 are exposed outside the housing 160. In this way, the adapter board 130 can be protected by the housing 160, which can prevent external moisture and dust from entering the housing 160 to a certain extent and causing corrosion to the electronic components on the adapter board 130, thus helping to extend the service life of the adapter board 130.
[0044] The test carrier plate 110 and the test base 120 are mounted on the extension 171 and exposed outside the housing 160, which makes it convenient for testers to directly install the test particle 300 onto the test base 120 from outside the housing 160, thus improving test efficiency.
[0045] Since the test carrier plate 110 and the adapter plate 130 are connected through the opening 166 on the housing 160, when it is necessary to test test particles on other platforms or to replace the test carrier plate 110, the test carrier plate 110 can be directly removed and replaced with a test carrier plate 110 of the appropriate specifications and plugged into the adapter plate 130 for testing. This helps to improve the adaptability of the testing device 100 to test test particles on different platforms.
[0046] Furthermore, a first housing 162 is provided on the top of the housing 160. The first housing 162 has a first cavity 163 for accommodating the ammeter 150. A first opening 164 is provided on the side of the first housing 162 facing the extension 171. The ammeter 150 includes a display screen 153, which corresponds to the position of the first opening 164 and is used to display the current value passing through the particle 300 to be tested.
[0047] By embedding the ammeter 150 into the first housing 162, the first housing 162 protects the ammeter 150, preventing it from being damaged by external forces during handling or transport of the testing device 100. This protects the ammeter 150 and extends its service life. At the same time, the display screen 153 on the ammeter 150 allows real-time observation of the current passing through the particle 300 under test, making it more intuitive and convenient to determine whether there are any potential problems with the particle 300 under test, thus improving testing efficiency.
[0048] Figure 4 This is a schematic diagram of the fourth embodiment of the test device of this application, as shown below. Figure 4 As shown, a control switch 140 is provided on the adapter plate 130. The control switch 140 is used to control the signal on / off of the adapter plate 130. An opening 165 is provided on the top of the housing 160 corresponding to the position of the control switch 140. The width of the opening 165 is greater than or equal to the width of the control switch 140.
[0049] In this embodiment, an independent control switch 140 is provided on the adapter board 130. The signal on / off of the adapter board 130 is controlled by the control switch 140, so that the test device 100 can be opened or closed according to the actual situation.
[0050] For example, when continuous testing of the test particle 300 is not required, the adapter plate 130 can be turned off by the control switch 140 after the test is completed, thereby shutting down the test device 100. When the next test is to be conducted, the test particle 300 is installed on the test device 100, and then the control switch 140 is turned on to allow the test device 100 to perform normal testing. This can effectively reduce energy consumption and improve safety during the testing process.
[0051] By providing an opening 165 on the housing 160 corresponding to the position of the control switch 140, the tester can access the control switch 140 through the opening 165 to open or close the control switch 140, making the operation simple and convenient.
[0052] Figure 5 This is a schematic diagram of one embodiment of the testing system of this application, as shown below. Figure 5 As shown in the illustration, this application also discloses a testing system 10, including a computer 200. The testing system 10 further includes the aforementioned testing device 100, which is connected to the computer 200 via a data cable. When the particle 300 to be tested is installed on the testing device 100, the computer 200 can perform a loading program test on the particle, which can, to a certain extent, screen out test particles with quality problems.
[0053] Traditional testing systems 10 can only perform loading tests on test particles and do not have the function of screening for defective products caused by defects in the particle itself or poor wire bonding and packaging, resulting in large power surges.
[0054] Based on the above problems, this application improves the testing device 100 in the traditional testing system 10. On the one hand, the adapter board 130 is connected to the test carrier board 110, and the computer 200 can be connected through the adapter board 130. When the particle to be tested 300 is installed on the test socket 120 on the test carrier board 110, the computer 200 can be used to load the program test on the particle to be tested 300. On the other hand, since the current passing through the particle to be tested 300 will pass through the adapter board 130 when the particle to be tested 300 is tested, the ammeter 150 is connected to the adapter board 130. The ammeter 150 can monitor the current value passing through the particle to be tested 300 in real time. In this way, the transient electrophoresis of the particle to be tested 300 can be captured, thereby determining whether there are any hidden dangers in the particle to be tested 300. That is, this application uses the combination of loading program test and current detection to test the particle to be tested 300 with hidden dangers, thereby improving the problem of missed screening of test particles and improving the efficiency of test particle detection.
[0055] It should be noted that the inventive concept of this application can form many embodiments, but due to the limited space of the application documents, they cannot all be listed. Therefore, without conflict, the embodiments described above or the technical features can be arbitrarily combined to form new embodiments. After the embodiments or technical features are combined, the original technical effect will be enhanced.
[0056] The above description, in conjunction with specific optional embodiments, provides a further detailed explanation of this application and should not be construed as limiting the specific implementation of this application to these descriptions. For those skilled in the art, various simple deductions or substitutions can be made without departing from the concept of this application, and all such modifications or substitutions should be considered within the scope of protection of this application.
Claims
1. A testing device, characterized in that, include: Test carrier board, A test holder, which is mounted on the test carrier plate, is used to mount the particles to be tested. An adapter board, which is connected to the test carrier board, is used to connect to a computer; An ammeter, which is connected to the adapter plate; The ammeter is used to detect the current value passing through the particle to be tested.
2. The testing apparatus according to claim 1, characterized in that, The ammeter includes a control module and an alarm device, and the control module is communicatively connected to the alarm device. The control module has a built-in preset threshold. When the current of the particle under test exceeds the preset threshold, the control module controls the alarm device to start. The preset threshold ranges from 15 mA to 30 mA.
3. The testing apparatus according to claim 2, characterized in that, The adapter board includes a board body, and a first interface and a second interface are respectively provided on opposite sides of the board body. The first interface is connected to a computer via a data cable, and the second interface is plugged into the output interface of the test carrier board. The first interface includes a USB interface, and the second interface includes a SATA interface. The board is also provided with a third interface, which is connected to the ammeter via a signal line.
4. The testing apparatus according to claim 3, characterized in that, The test holder includes a test housing, and a test plate is disposed inside the test housing. The particle to be tested is connected to the test contacts on the test carrier plate through the test plate.
5. The testing apparatus according to claim 4, characterized in that, The test board is provided with multiple test probes, and each test probe corresponds to each contact point of the particle to be tested. Multiple contacts of the particle to be tested are connected to test contacts on the test carrier through multiple test probes.
6. The testing apparatus according to claim 5, characterized in that, The test holder also includes a cover plate, which is rotatably connected to the test housing. The cover plate is fastened to the test housing to press the particle to be tested onto the test plate.
7. The testing apparatus according to claim 6, characterized in that, The testing device further includes a housing and a base plate. The base plate is connected to the bottom of the housing and extends relative to the housing to form an extension. The test carrier plate and the adapter plate are both mounted on the base plate. The housing has an internal cavity, the adapter plate is located in the cavity, and the test carrier plate is located on the extension. An opening is provided on the side wall of the housing between the adapter plate and the test carrier plate, and the adapter plate is inserted into the test carrier plate through the opening.
8. The testing apparatus according to claim 7, characterized in that, The top of the housing is provided with a first housing, the first housing having a first cavity for accommodating the ammeter. The first housing has a first opening on the side facing the extension. The ammeter includes a display screen, the display screen being positioned corresponding to the first opening, for displaying the current value passing through the particle to be tested.
9. The testing apparatus according to claim 8, characterized in that, The adapter board is equipped with a control switch, which is used to control the signal on / off of the adapter board; An opening is provided on the top of the housing corresponding to the position of the control switch, and the width of the opening is greater than or equal to the width of the control switch.
10. A testing system, comprising a computer, characterized in that, The testing system further includes a testing device as described in any one of claims 1 to 9, the testing device being connected to the computer via a data cable.