An automated test LIBS system
CN224695734UActive Publication Date: 2026-08-28VELA OPTOELECTRONICS SUZHOU CO LTD
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Patent Information
- Application Number
- CN202521838899.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-28
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2035-08-28
AI Technical Summary
Technical Problem
第一种是通过整体移动激光器和聚焦透镜来实现不同区域点的检测，但相对地，整体移动检测系统，由于整体体积重量比较大，会存在响应慢、部件易损坏的问题；
Benefits of technology
[0008]本实用新型的有益效果是，对材料不均匀的待测合金进行检测时，激光器输出的激光光束由反射光学元件组进行多次反射，然后经聚焦透镜聚焦于待测合金上以产生等离子体信号，进而可实现合金检测，而通过移动单元带动所述反射光学元件组、聚焦透镜一并往复位移，可实现自动测试待测合金的不同区域的检测点，不仅能够缩小整体体积，并可保证接收到的激光信号不变，且可大大增加移动距离，有效提高了测试结果稳定性，具有较好的使用价值。
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Abstract
The utility model provides a kind of automatic test LIBS system, it can solve the problem of poor test stability caused by uneven alloy sample material to be measured, improve test result accuracy;Including: reflective optical element group, set on the output light path of laser, for the laser beam of output reflection forms reflected light beam;Focusing lens, set on the reflected light path of reflective optical element group, for focusing reflected light beam on alloy to be measured to produce plasma signal;Moving unit, for driving reflective optical element group, focusing lens reciprocating displacement together, and along moving direction, focusing light beam is focused on the detection point of different area of alloy to be measured;Signal analysis unit, for collecting plasma signal, and analyzing plasma signal to determine the characteristic spectrum on the detection point of different area of alloy to be measured;Data processing unit is connected with signal analysis unit, for reading characteristic spectrum, determines the component result of alloy to be measured.
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