IC visual inspection equipment
CN309122851SActive Publication Date: 2025-02-18YOUWEI IMAGE TECH (SUZHOU) CO LTD
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Patent Information
- Application Number
- CN202430329092.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-31
- Publication Date
- 2025-02-18
- Estimated Expiration
- 2039-05-31
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Figure 000006_ABST
Abstract
1. The name of the product of this design: IC visual inspection equipment. 2. The purpose of this design product: used for appearance inspection and packaging of encapsulated IC chips. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1. 5. The bottom surface of this design product is a part that is not easily visible or cannot be seen when in use, so the top view is omitted.
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