Integrated Circuit Test ATE Platform
CN309269869SActive Publication Date: 2025-05-02BEIJING IECUBE TECH CO LTD
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Patent Information
- Application Number
- CN202430623240.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-29
- Publication Date
- 2025-05-02
- Estimated Expiration
- 2039-09-29
Smart Images
Figure 000001_ABST
Abstract
1. The name of this design product: integrated circuit test ATE platform. 2. Purpose of the product of this design: Equipment used for testing and training of digital and analog integrated circuit chips. 3. The design key point of this appearance design product lies in the combination of shape and pattern. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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