Aging test chamber
CN309454946SActive Publication Date: 2025-08-22SKY CHIP INTERCONNECTION TECH CO LTD
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Patent Information
- Application Number
- CN202430796462.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-16
- Publication Date
- 2025-08-22
- Estimated Expiration
- 2039-12-16
Smart Images
Figure 000001_ABST
Abstract
1. The name of this design product: Aging test chamber. 2. Purpose of this design product: This design product is used for high-temperature dynamic aging testing of integrated circuit devices. 3. The key point of the design of this product lies in its shape. 4. The picture or photo that best illustrates the design points: Stereoscopic drawing 1.
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