Aging test board card

CN309552874SActive Publication Date: 2025-10-21CHANGMAI SEMICONDUCTOR (CHENGDU) CO LTD
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Patent Information

Application Number
CN202430832472.8
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2024-12-27
Publication Date
2025-10-21
Estimated Expiration
2039-12-27

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Abstract

1. The name of the design product: the connection board card for aging test. 2. The use of the design product: for placing the semiconductor device and connecting with the aging test machine when the semiconductor device is tested. 3. The design points of the design product: in shape. 4. The picture or photo showing the design points: the perspective view 1.
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