Microscopic three-dimensional measuring profilometer
CN309611006SActive Publication Date: 2025-11-18SHENZHEN HUAHAN WEIYE TECH
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- CN202530132255.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-18
- Publication Date
- 2025-11-18
- Estimated Expiration
- 2040-03-18
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: microscopic three-dimensional measurement topography instrument. 2. The use of the design product: for three-dimensional topography reconstruction, reverse engineering, detecting the flatness, height difference and other geometric tolerance of objects. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
Need to check novelty before this filing date? Find Prior Art