Graphical user interface for semiconductor device inspection for electronic devices inspects portions of a block area on a semiconductor device
CN309849737SActive Publication Date: 2026-03-17HAMAMATSU PHOTONICS KK
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-08
- Publication Date
- 2026-03-17
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Figure 000001_ABST
Abstract
1. Name of the designed product: Graphical user interface for checking a block area on a semiconductor device for checking a semiconductor device. 2. Use of the designed product: The product is used for an electronic device. 3. Design points of the designed product: The graphical user interface. 4. Picture or photo best indicating the design points: Front view. 5. Use of the graphical user interface: The graphical user interface of the present design is used for human-computer interaction, and when a plurality of block areas composed of a plurality of chips are formed on a semiconductor device, it is used for checking each block area in the semiconductor device inspection. 6. Human-computer interaction mode of the graphical user interface: In the interface of the front view, the interface sequentially jumps from the front view according to the order of the interface change state diagram 1 and the interface change state diagram 2 through the operation of clicking, touching, or voice command, etc. 7. Other circumstances needing to be explained Other explanations: The part shown by the solid line in the view is the appearance design claimed to be protected, and the dotted line shows the boundary between the part claimed to be protected and the part not claimed to be protected.
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