Graphical user interface for semiconductor device inspection of electronic devices determines a portion of a chip area on a semiconductor device

CN309849738SActive Publication Date: 2026-03-17HAMAMATSU PHOTONICS KK
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2025-01-08
Publication Date
2026-03-17

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Abstract

1. Name of the designed product: the part of the graphic user interface for checking the semiconductor device of the electronic device determines the chip area on the semiconductor device. 2. Use of the designed product: the product is used for an electronic device. 3. Design points of the designed product: the graphic user interface. 4. Picture or photo that best shows the design points: front view. 5. Use of the graphic user interface: the graphic user interface of the present design is used for human-computer interaction, and for determining the chip area periodically formed on the semiconductor device in the semiconductor device inspection. 6. Human-computer interaction mode of the graphic user interface: in the interface of the front view, through the operation of clicking, touching or voice instruction, etc., the interface jumps in turn according to the order of interface change state diagram 1, interface change state diagram 2 and interface change state diagram 3 from the front view. 7. Other circumstances that need to be explained: the part shown by the solid line in the view is the appearance design claimed to be protected, and the dotted line shows the boundary line between the part claimed to be protected and the part not claimed to be protected.
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