Photo-thermal deflection spectrometer
CN309898869SActive Publication Date: 2026-04-07HUNAN NASHENG ELECTRONIC TECH CO LTD +1
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-22
- Publication Date
- 2026-04-07
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Figure 000017_ABST
Abstract
1. The name of the design product: photothermal deflection spectrometer. 2. The use of the design product: used for weak sub-band absorption signals of semiconductor thin films, analyzing the physical and chemical properties of semiconductor materials, and applied to optical characterization and performance evaluation of functional layers of devices such as perovskite solar cells, organic solar cells, organic light-emitting diodes (OLED), quantum dot light-emitting diodes (QLED), transistors, and liquid crystal displays (LCD). 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: combined state diagram. 5. Other components that need to be explained: the design is a component product design, and the number of components included is 2. Component 1 is a spectrometer cabinet, and component 2 is a test box. Components 1 and 2 are used in combination.
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