High resolution microwave whole field deformation and vibration displacement measuring instrument
CN309906972SActive Publication Date: 2026-04-10SHANGHAI MAIWEI TECHNOLOGY CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- SHANGHAI MAIWEI TECHNOLOGY CO LTD
- Filing Date
- 2025-10-10
- Publication Date
- 2026-04-10
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Figure 000003_ABST
Abstract
1. The name of the design product: high-resolution microwave full-field deformation and vibration displacement measuring instrument. 2. The use of the design product: applied to the monitoring of vibration, displacement and deformation of aerospace, large bridges, buildings and structural parts. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
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