Electronic tensile testing machine
CN309925367SActive Publication Date: 2026-04-17LABTHINK INSTR
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- LABTHINK INSTR
- Filing Date
- 2025-07-17
- Publication Date
- 2026-04-17
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Figure 000007_ABST
Abstract
1. Name of the product in this design: Electronic tensile testing machine. 2. Purpose of this design: For tensile performance testing of thin film samples. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.
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