Electron transport test module

CN309941910SActive Publication Date: 2026-04-24HEFEI WEIFU SEMICONDUCTOR TECHNOLOGY CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
HEFEI WEIFU SEMICONDUCTOR TECHNOLOGY CO LTD
Filing Date
2025-07-24
Publication Date
2026-04-24

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Abstract

1. Name of the product in this design: Electromigration Test Module. 2. Purpose of this design: To form an electron migration tester to test the electron migration of chips. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.
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