Test device
CN309997999SActive Publication Date: 2026-05-26CHENGDU SILAN SEMICON MFG +1
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- CHENGDU SILAN SEMICON MFG
- Filing Date
- 2025-10-22
- Publication Date
- 2026-05-26
Smart Images
Figure 000007_ABST
Abstract
1. Name of the product in this design: Testing Device. 2. Purpose of this design: For testing power modules. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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