Power device reactive aging test device

CN310017573SActive Publication Date: 2026-06-05CHONGQING YUNTONG CAR CORE ELECTRONIC TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
CHONGQING YUNTONG CAR CORE ELECTRONIC TECH CO LTD
Filing Date
2025-09-25
Publication Date
2026-06-05

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Abstract

1. The name of the design product: power device no-load aging test device. 2. The use of the design product: for power semiconductor device aging test and other purposes. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: reference Figure 6 in use.
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