highly accelerated life testing machine (double deck)
CN310051917SActive Publication Date: 2026-06-26KUNSHAN NEW JINHONG INTELLIGENT EQUIP TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- KUNSHAN NEW JINHONG INTELLIGENT EQUIP TECH CO LTD
- Filing Date
- 2026-02-05
- Publication Date
- 2026-06-26
Smart Images
Figure 000007_ABST
Abstract
1. Name of the design product: high-accelerated life testing machine (double layer). 2. Use of the design product: the equipment for applying high temperature, high humidity, high pressure and other environmental conditions to electronic components, integrated circuits and other products to conduct reliability tests. 3. Design points of the design product: in shape. 4. Picture or photo that best indicates the design points: perspective view.
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