test device

Abstract

Device for testing a component (1), wherein the component (1) has at least one electrical contact pin (4), and wherein the contact pin (4) has a cross-section having a nominal dimension (x, y), with a movable probe head (6) such that the probe head (6) can be brought into contact with the contact pin (4), wherein a test contact pin (8) for electrical contact with the contact pin (4) is arranged on the probe head (6), characterized in that the probe head (6) has a receptacle (7) for the contact pin (4), that the test contact pin (8) is arranged in the receptacle (7), and that the receptacle (7) has a cross-section which includes the nominal dimension (x, y) for the contact pin (4) as well as the predefinable maximum tolerance dimension (dx, dy) for the nominal dimension (x, y).

Description

[0001] The invention relates to a device for testing a component according to the preamble of claim 1.

[0002] Such a test device is used in particular for testing a connector housing with contact pins in the form of pins.

[0003] Components with at least one electrical contact pin are used for connection to an electrical voltage. The contact pin has a cross-section that must meet a predetermined nominal dimension to ensure a good electrical connection. To test the functionality of the electrical contact pin, a device with a movable probe is used, allowing the probe to be brought into contact with the contact pin. A test probe is attached to the probe for electrical contact with the contact pin, thus performing the electrical functional test of the component. However, this test does not verify the correctness of the nominal dimension of the contact pin. Therefore, it is necessary to expand the functionality of the component testing device.

[0004] The invention is based on the objective of further developing the device for testing the component in such a way that its range of functions is expanded. In particular, the device for testing the component should be capable of verifying the nominal dimension for the cross-section of the contact pin.

[0005] This problem is solved in a generic device for testing a component by the characterizing features of claim 1.

[0006] In the device according to the invention for testing a component, hereinafter also referred to as the test device, the test head has a receptacle for the contact pin, wherein the test contact pin is arranged in the receptacle. The receptacle has a cross-section that includes the nominal dimension for the contact pin as well as the predefinable maximum tolerance or the predefinable maximum tolerance dimension for the nominal dimension. The receptacle is thus designed in the manner of a wobble circle, so that when the test head moves towards the component, the contact pin can only be inserted into the receptacle if its dimension is correct, i.e., if its dimension lies within the tolerance range. Consequently, the correctness of the dimension for the contact pin can be determined in a simple manner. Further embodiments of the invention are the subject of the dependent claims.

[0007] In a further embodiment, a drive can be provided to move the probe head in a feed direction, for example, the Z-direction. With the aid of the drive, the probe head can thus be automatically brought into contact with the component under test and / or the fixture can be placed onto the contact pin. Advantageously, a sensor can be provided to detect when the probe head is in contact with the component under test. When the probe head is in contact with the component, its movement in the feed direction can then be switched off. This measure provides protection against damage to the probe head, acting as a kind of "crash protection." Furthermore, the probe head can be mounted to float in a plane perpendicular to the feed direction, for example, in the X and / or Y direction. This allows the fixture to be easily aligned onto the contact pin, particularly automatically and / or autonomously.A bearing arrangement can be provided for the floating mounting of the probe head, wherein the bearing arrangement can have a dovetail guide.

[0008] For easy detection of misaligned contact pins, it can be advantageous for the probe to be made of electrically conductive material, particularly metal. If the contact pin is bent, for example, it will not fit into the receptacle and will instead rest against the probe. When a voltage is applied to the contact pin, an electric current flows through the electrically conductive probe. This current can then be used to detect the misalignment or bending of the contact pin.

[0009] The test head can be interchangeable on the device. This allows for quick and easy adaptation of the device to the component being tested. To facilitate simple verification of the contact pin length, the test contact pin can be elastically mounted in its holder; for example, it can be designed as a spring-loaded test contact pin. This allows the test contact pin to be pressed against the contact pin for electrical contact with a restoring force.

[0010] In some cases, the contact pin may have a substantially rectangular, particularly square, cross-section. For the purpose of easily verifying compliance with the tolerances specified for this cross-section, the receptacle may, in turn, have a circular cross-section, wherein, preferably, the diameter of the circular cross-section of the receptacle corresponds approximately to the diameter of the circumference around the rectangular cross-section of the contact pin corresponding to the nominal dimension, plus the specified tolerance dimension. In particular, the diameter of the circular cross-section of the receptacle may be the size of the diagonal of the rectangular cross-section plus the specified tolerance dimension.

[0011] In addition to the invention, a method for testing a component is described, wherein the component has at least one electrical contact pin, and the contact pin has a cross-section possessing a nominal dimension. In this method, a movable probe is brought into contact with the contact pin, wherein a test contact pin for electrical contact with the contact pin is arranged on the probe. The probe has a receptacle, the receptacle having a cross-section possessing the nominal dimension for the contact pin plus a predetermined tolerance or a predetermined tolerance dimension. The probe is first moved towards the contact pin, whereby it is checked whether the contact pin can be inserted into the receptacle. If the contact pin is defective, it cannot be inserted into the receptacle; rather, the contact pin then rests against the probe.This allows the testing device to generate a corresponding error message, and the component in question, where the contact pin is faulty, can be rejected as scrap.

[0012] If the contact pin is in good working order, it is positioned in the receptacle on the probe head. After the contact pin has been correctly inserted into the receptacle, the probe head is moved towards a predetermined stopping point. During this movement, it is checked whether the contact pin has already made electrical contact with the test contact pin before reaching the stopping point. If so, the contact pin is too long, triggering a corresponding error message from the test device, and the component in question can be rejected as scrap.

[0013] If the contact pin check for excessive length is successful, the probe's movement stops at the predefined stopping point. The probe then verifies whether the contact pin makes electrical contact with the test contact pin upon reaching the stopping point. If so, the contact pin is the correct length. If not, the contact pin is too short, triggering a corresponding error message from the test device, and the component in question can be rejected.

[0014] If the contact pin check for shortness is successful, and the contact pin is now correctly oriented at the probe's holding point, the component's function is tested. If the function test reveals a malfunction, the test device can generate a corresponding error message, and the component can be rejected. Otherwise, the component is considered satisfactory and can be used as intended.

[0015] In summary, it can therefore be stated that the test device according to the invention advantageously enables simultaneous testing of the contact pin on the component with regard to the alignment of the contact pin and / or the length of the contact pin and / or the electrical function of the contact pin.

[0016] The following can be stated regarding a particularly preferred embodiment of the invention.

[0017] A test device for a connector with contact pins has been created. The test device features an electrical contacting unit in the form of an electrical contacting head with integrated control of the pin position x and y, where a predefined maximum deviation dx and dy is permissible in the form of a wobble circuit, as well as the pin height z, where a predefined maximum deviation dz is permissible. The test device includes a controlled drive unit for the contacting head, which is floatingly mounted in the X / Y direction and quick-changeable, and which is equipped with receptacles corresponding to an electrically conductive contact mask with crash protection, as well as with electrical switching contact pins or test contact pins.

[0018] The testing of the connector with pins with regard to wobble circle and / or pin height control is carried out in several steps. Step 1: First, the contact head moves onto the pins of the component being tested. The contact head is made of electrically conductive material, such as steel. If the pin is misaligned, bent, or otherwise damaged, and therefore not within the wobble circle, it will not enter the socket. Instead, the pin will be in contact with the contact head, making the faulty pin identifiable by the fact that it does not fit within the wobble circle. Step 2: The contact head's receptacle contains a spring-loaded switching contact pin. If the pin fits into the receptacle, a check is performed to see if the pin makes premature contact with the switching contact pin. If this occurs, the pin is too long. Step 3: If the pin does not make contact with the switch contact pin at all, then the pin is too short. Step 4: If the pin makes contact with the switch contact pin in time, the pin is working correctly. The respective electrical voltage is then applied to the pins via the switch contact pins, and the component is then checked for proper function.

[0019] The advantages achieved with the invention consist particularly in the fact that several tests for the component are integrated into a single test device. In particular, no additional station for the wobble test is necessary. Rather, this is advantageously integrated into the contacting unit for the electrical functional test of the component.

[0020] An embodiment of the invention with various further developments and configurations is shown in the drawings and is described in more detail below. The drawings show... Fig. 1 a component to be tested with a connector having electrical contact pins, Fig. 2. the cross-section of the contact pin with permissible tolerances in a schematic manner, Fig. 3 a test device with a contact head for the plug made of Fig. 1 and Fig. 4a to 4d the contact head during the respective steps for testing the contact pin.

[0021] In Fig. Figure 1 shows a schematic representation of an electrically testable component 1. Component 1 has a housing 2 to which a connector with a connector housing 3 is attached. The connector housing contains electrical contact pins 4 for the electrical connection of component 1. During the manufacturing process, the correct electrical function of component 1 must be checked to reject any defective components 1. Furthermore, the contact pins 4 must also be checked for correctness. In particular, the cross-section of the contact pin 4 has a certain nominal dimension x and y for its side lengths, as shown in Figure 1. Fig. Figure 2 shows that specified tolerances dx and dy in the X and Y directions are permissible as maximum deviations for the side lengths.

[0022] A device for testing component 1, hereinafter referred to as test device 5, is in Fig. 3 to be seen in more detail. The test device 5 has a movable probe 6. This allows the probe 6 to be brought into contact with the contact pin 4. The probe 6 has a receptacle 7 for the contact pin 4. A test contact pin 8 is attached to the probe 6 (see Fig. 4a) The test contact pin 8 is arranged for electrical contact with the contact pin 4, specifically, the test contact pin 8 is arranged in the receptacle 7. The test contact pin 8 is elastically mounted in the receptacle 7, for example, by being provided with a spring. This allows the test contact pin 8 to be applied to the contact pin 4 with a restoring force for electrical contact.

[0023] For the movement of the probe in a feed direction, which is in particular the Z-direction perpendicular to the X and Y directions (see Fig. 4a) In this case, a drive 9 is provided. This allows the probe head 6 to be brought into contact with the component 1 under test and / or the receptacle 7 on the probe head 6 to be placed onto the contact pin 4. The test device 5 has a sensor (not shown) that detects when the probe head 6 is in contact with the component 1 under test, so that when the probe head 6 is in contact with the component 1, further movement of the probe head 6 in the feed direction can be switched off. This creates a safety device 12 in the form of a "crash safety device" for the probe head 6.

[0024] The receptacle 7 has a cross-section that defines the nominal dimension x and y for the contact pin 4 as well as the additionally predefinable maximum tolerance dimension dx and dy for the nominal dimension x and y in the manner of a wobble circle 13 (see Fig. 2) comprises. The contact pin 4 generally has a substantially rectangular, in particular square, cross-section with side lengths x, y. Advantageously, the receptacle 7 then has a circular cross-section, as shown in Fig. Figure 2 is shown in more detail. The diameter of the circular cross-section of the receptacle 7, or of the wobble circle 13, corresponds approximately to the diameter of the circumcircle 10 around the rectangular cross-section of the contact pin 4 corresponding to the nominal dimensions x, y, plus the specified tolerance dimension dx, dy. In particular, the diameter d of the wobble circle 13 has the size of the diagonal 11 of the rectangular cross-section of the contact pin 4 plus the specified tolerance dimension, i.e., for example, the maximum of dx and dy. Alternatively, the diameter d of the wobble circle 13 can also be, for example, the size where SQRT (Square Root) means the square root of the expression in parentheses.

[0025] Furthermore, the probe head 6 is mounted in a floating position in a plane perpendicular to the Z-direction of feed, specifically in a plane extending in the X and Y directions, by means of a bearing arrangement 14. To achieve this floating mounting, the bearing arrangement 14 features a dovetail guide. This allows the receptacle 7 to automatically align itself with the contact pin 4 when the probe head 6 is placed against the component 1. The probe head 6 is made of electrically conductive material, specifically metal, such as steel. If the contact pin 4 is not correctly aligned, it cannot be inserted into the receptacle 7 and therefore rests against the probe head 6. If an electrical voltage is applied to the contact pin 4, an electric current will flow through the probe head 6, indicating the incorrect alignment of the contact pin 4. For example, this can detect bending of the contact pin 4.Finally, the probe head 6 is designed to be interchangeable by means of a mounting arrangement 15, so that quick adaptation to the component 1 to be tested is possible.

[0026] The procedure steps for testing component 1, in which the movable probe 6 is brought into contact with the contact pin 4 and the test contact pin 8 electrically contacts the contact pin 4, are described below based on the Fig. 4a to 4d are explained in more detail.

[0027] In a first step 1, according to Fig. 4a The probe head 6, which has the receptacle 7, moves towards the contact pin 4 in the feed direction Z. The receptacle 7 has a cross-section with the nominal dimensions x, y for the contact pin 4 plus a predetermined tolerance dimension dx, dy. In this first step, it is checked whether the contact pin 4 can be inserted into the receptacle 7. If this is the case, the test continues with the second step.

[0028] If the contact pin 4 cannot be inserted into the receptacle 7, this will be detected in the first step. In this case, according to Fig. 4a The probe head 6, made of electrically conductive material, is not in contact with the contact pin 4, as the contact pin 4 does not fit within the wobble circle 13 on the receptacle 7. If an electrical voltage is applied to the contact pin 4, an electric current flows through the probe head 6, and its detection results in an error message. Therefore, the corresponding component 1 is defective.

[0029] After correctly inserting the contact pin 4 into the receptacle 7 on the probe head 6, the probe head 6 is then moved in the Z direction to a predetermined stopping point. In a second step 2, it is now checked whether the contact pin 4 has already made electrical contact with the spring-loaded test contact pin 8 located in the receptacle 7 before reaching the stopping point. In this case, the Fig. As shown in more detail in 4b, the contact pin 4 is too long, so that component 1 is again defective.

[0030] If this is not the case, the probe head 6 is moved further, with the movement of the probe head 6 ending at the predetermined stopping point. Upon reaching the stopping point, a third step 3 checks whether the contact pin 4 is electrically contacting the test contact pin 8. If this is not the case, the contact pin 4 is too short, as shown in Fig. 4c is shown in more detail, which means that component 1 is also defective.

[0031] During the testing according to steps 2 and 3, a predefinable tolerance dimension dz for the length of the contact pin 4 in the Z-direction can also be provided. This tolerance dimension dz can, for example, be adjustable by the spring force of the spring used to exert the elastic force on the test contact pin 8.

[0032] If the length of contact pin 4 is correct, then contact pin 4 is electrically contacted at the holding point with the test contact pin 8, as shown in Fig. This is shown in more detail in section 4d. In the following fourth step, step 4, the functional test of component 1 is carried out. If a fault is detected during the functional test, component 1 is scrap. Otherwise, after successful completion of step 4, component 1 is OK and can then be used for its intended purpose.

[0033] In summary, it can be stated that by carrying out steps 1 to 4, a simultaneous test of component 1 is performed on the alignment of the contact pin 4 and / or on the length of the contact pin 4 and / or on the electrical function of the contact pin 4.

[0034] The invention is not limited to the described and illustrated embodiment. Rather, it also encompasses all technically advanced developments within the scope of the invention defined by the claims. Thus, the test device 5 can not only be used for testing components 1 with a contact pin 4, but can also be used for testing the alignment of other elongated parts that fit within a wobble circle 13 with tolerances. Reference symbol list 1 component 2 cases 3 connector housings 4 contact pins 5 Test device 6 probe 7 Recording (of probe head) 8 test contact pin 9 Drive 10 Circumference (of contact pin) 11 Diagonals (from contact pin) 12 Safety device 13. Tumbling circle 14 Storage arrangement 15 Mounting arrangement

Claims

Device for testing a component (1), wherein the component (1) has at least one electrical contact pin (4), and wherein the contact pin (4) has a cross-section having a nominal dimension (x, y), with a movable probe head (6) such that the probe head (6) can be brought into contact with the contact pin (4), wherein a test contact pin (8) for electrical contact with the contact pin (4) is arranged on the probe head (6), characterized in that the probe head (6) has a receptacle (7) for the contact pin (4), that the test contact pin (8) is arranged in the receptacle (7), and that the receptacle (7) has a cross-section which includes the nominal dimension (x, y) for the contact pin (4) as well as the predefinable maximum tolerance dimension (dx, dy) for the nominal dimension (x, y). Device for testing a component (1) according to claim 1, characterized in that a drive (9) is provided for the movement of the probe head (6) in a feed direction (Z), such that the probe head (6) can be brought into contact with the component (1) to be tested and / or the receptacle (7) can be placed on the contact pin (4), and that preferably a sensor is provided that detects the contact of the probe head (6) with the component (1) to be tested, such that when the probe head (6) is in contact with the component (1) its movement in the feed direction (Z) can be switched off. Device for testing a component (1) according to claim 1 or 2, characterized in that the test head (6) is mounted floating in a plane (X, Y) perpendicular to the feed direction (Z), such that the receptacle (7) can be aligned, in particular automatically, to the contact pin (4). Device for testing a component (1) according to claim 1, 2 or 3, characterized in that a bearing arrangement (14) is provided for floating support of the test head (6), wherein in particular the bearing arrangement (14) has a dovetail guide. Device for testing a component (1) according to one of claims 1 to 4, characterized in that the test head (6) consists of electrically conductive material, in particular metal. Device for testing a component (1) according to one of claims 1 to 5, characterized in that the test head (6) is designed to be interchangeable for adaptation to the component (1) to be tested. Device for testing a component (1) according to one of claims 1 to 6, characterized in that the test contact pin (8) is elastically mounted in the receptacle (7), in particular such that the test contact pin (8) can be applied to the contact pin (4) for electrical contacting with a restoring force. Device for testing a component (1) according to one of claims 1 to 7, characterized in that the contact pin (4) has a substantially rectangular, in particular square, cross-section, that preferably the receptacle (7) has a circular cross-section, and that further preferably the diameter of the circular cross-section of the receptacle (7) corresponds approximately to the diameter of the circumcircle (10) around the rectangular cross-section of the contact pin (4) corresponding to the nominal dimension (x, y) plus the predetermined tolerance dimension (dx, dy), in particular that the diameter has the size of the diagonal (11) of the rectangular cross-section plus the predetermined tolerance dimension (dx, dy).

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