An integrated circuit test socket

The convenient clamping and disassembly/maintenance mechanisms solve the problem of inconvenient operation when fixing integrated circuit boards of different specifications in existing integrated circuit test sockets, achieving efficient fixing and simplified maintenance processes, and improving testing efficiency.

CN224328205UActive Publication Date: 2026-06-05CHENGDU JIATAI ELECTRONICS CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
CHENGDU JIATAI ELECTRONICS CO LTD
Filing Date
2025-04-25
Publication Date
2026-06-05

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  • Figure CN224328205U_ABST
    Figure CN224328205U_ABST
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Abstract

The utility model belongs to integrated circuit test technical field especially for a kind of integrated circuit test seat, including base and probe pin, the top of base is fixedly provided with pneumatic cylinder, the output shaft of pneumatic cylinder is fixedly connected with the test seat for being used to test integrated circuit board, the test seat is provided with the convenient clamping mechanism for being used to clamping and fixing integrated circuit board, the top of base is fixedly connected with portal frame, the bottom of probe pin is fixedly connected with mounting plate.The utility model structure design is reasonable, through convenient clamping mechanism, two sliders can be adjusted first, so that two clamping plates abut at the two sides of integrated circuit board, then slightly rotate threaded rod, different specifications and sizes integrated circuit board can be clamped firmly, so that the fixing of integrated circuit board is more convenient and efficient, improve the efficiency of test, and it is beneficial to the disassembly and assembly of probe pin, and it is beneficial to the maintenance work in later period.
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Description

Technical Field

[0001] This utility model relates to the field of integrated circuit testing technology, and in particular to an integrated circuit test socket. Background Technology

[0002] An integrated circuit is a miniature electronic device or component. Using certain processes, transistors, resistors, capacitors, inductors, and other components required for a circuit, along with interconnected wiring, are fabricated on one or several small pieces of semiconductor wafers or dielectric substrates. These are then packaged in a casing to form a miniature structure with the required circuit function. All components are structurally integrated into a whole, representing a significant step forward in the miniaturization, low power consumption, intelligence, and high reliability of electronic components.

[0003] A search revealed a Chinese patent number CN218885986U for an integrated circuit test stand, which relates to the field of integrated circuit testing technology. The stand includes an operating platform with a lifting groove at its top. The lifting groove has a lifting mechanism inside, and a base is fixedly connected to the bottom of the lifting groove. The top of the base has sliding grooves near both sides.

[0004] However, the integrated circuit test fixture mentioned above uses a rotating threaded rod to move the clamping plate to clamp the integrated circuit board. But due to the different sizes of integrated circuit boards, when the distance between the two clamping plates is large and a smaller integrated circuit board needs to be fixed, or when the distance between the two clamping plates is small and a larger integrated circuit board needs to be fixed, it is necessary for personnel to rotate the threaded rod many times to fix the integrated circuit board, which makes the operation cumbersome and inconvenient, affecting the efficiency of testing. Therefore, we propose an integrated circuit test fixture to solve the above problems. Utility Model Content

[0005] The purpose of this invention is to address the aforementioned shortcomings by providing an integrated circuit test socket.

[0006] To achieve the above objectives, the present invention adopts the following technical solution:

[0007] An integrated circuit test socket includes a base and probe feet. A cylinder is fixedly mounted on the top of the base, and a test socket for testing an integrated circuit board is fixedly connected to the output shaft of the cylinder. The test socket is provided with a convenient clamping mechanism for clamping and fixing the integrated circuit board. A gantry frame is fixedly connected to the top of the base, and a mounting plate is fixedly connected to the bottom of the probe feet. A disassembly and maintenance mechanism is provided between the mounting plate and the gantry frame.

[0008] As a preferred embodiment of this utility model, the convenient clamping mechanism includes two sliding grooves formed on the top of the test seat. Lower racks are fixedly connected to the inner walls on both sides of the sliding grooves. A slider is slidably sleeved in the sliding groove. A support plate is fixedly connected to the top of the slider. A threaded rod is threadedly connected to one side of the support plate. A clamping plate is fixedly connected to one end of the threaded rod. A rubber pad is fixedly connected to one side of the clamping plate.

[0009] In a preferred embodiment of this utility model, ear plates are fixedly connected to the inner walls of both sides of the slider, and compression springs are fixedly connected to the bottom of the ear plates. The lower ends of the two compression springs are fixedly connected to the same upper rack, which meshes with the lower rack. A vertical plate is fixedly connected to the top of the upper rack, and a cylinder is fixedly connected to the front side of the vertical plate. A rotating rod is slidably sleeved on the outer side of the cylinder. An installation opening is provided on one side of the slider, and the rotating rod is rotatably connected to the inner walls of the front and rear sides of the installation opening.

[0010] As a preferred embodiment of this invention, the front side of the rotating rod is provided with an elongated hole, and the cylinder is slidably sleeved in the elongated hole.

[0011] As a preferred embodiment of this invention, the outer side of the rotating rod is fitted with an anti-slip sleeve.

[0012] As a preferred embodiment of this utility model, the disassembly and maintenance mechanism includes two positioning plates fixedly connected to the top of the gantry frame, and two screws rotatably disposed on the top of the gantry frame. The top of the mounting plate has two positioning holes, and the two positioning plates are respectively movably inserted into the corresponding positioning holes. The top of the positioning plate has a clearance groove, and the screws are movably placed in the clearance groove. A fixing plate is slidably sleeved on the outside of the screws, and the fixing plate movably abuts against the positioning plate and the mounting plate. A fastening nut is threaded on the outside of the screws, and the fastening nut movably abuts against one side of the fixing plate.

[0013] As a preferred embodiment of this utility model, the top of the gantry frame is fixedly connected to four stabilizing plates, and the two screws are respectively rotatably arranged between the corresponding two stabilizing plates.

[0014] In a preferred embodiment of this invention, two telescopic rods are fixedly connected between the base and the test seat, and the cylinder is located between the two telescopic rods.

[0015] In this utility model, an integrated circuit test stand is provided. The integrated circuit board is placed on top of the test stand. Regardless of the size of the integrated circuit board, pressing down on the rotating rod causes the cylinder and vertical plate to move upwards. The vertical plate then moves the upper rack upwards and compresses the compression spring. At this point, the upper and lower racks are not engaged, thus not fixing the sliders. The two sliders can then be directly pushed inwards, causing the two rubber pads to abut against the sides of the integrated circuit board. After this contact, releasing the rotating rod causes the upper rack to move downwards under the spring force and firmly abut against the lower rack, thus fixing the sliders. Slightly rotating the threaded rod causes the clamping plate to move inwards, allowing for the clamping and fixing of integrated circuit boards of different sizes. This makes fixing the integrated circuit board more convenient and efficient, improving testing efficiency. Finally, a cylinder moves the test stand upwards, bringing the position of the integrated circuit board to be tested into contact with the probe pins, allowing for the detection of the position on the integrated circuit board to be tested.

[0016] In this utility model, an integrated circuit test socket is provided. When the probe pins need maintenance, the fastening nut is loosened, and the fixing plate is moved inward so as not to obstruct the screw from turning out of the clearance groove. Thus, the mounting plate is not fixed, and the mounting plate and probe pins can be removed from the two positioning plates for maintenance. After maintenance, the mounting plate is inserted into the outside of the two positioning plates. Through the positioning plate and the positioning port, the probe pins can be positioned and installed. Finally, the screw is turned into the clearance groove, and the fastening nut is tightened. The fastening nut causes the fixing plate to move outward and abut against the inside of the positioning plate and the top of the mounting plate, thereby locking the mounting plate and probe pins.

[0017] This utility model has a reasonable structural design. Through a convenient clamping mechanism, the two sliders can be adjusted first so that the two clamping plates abut against the two sides of the integrated circuit board. Then, by slightly rotating the threaded rod, integrated circuit boards of different sizes can be firmly clamped, making the fixing of integrated circuit boards more convenient and efficient, improving the efficiency of testing, and facilitating the disassembly and assembly of probe pins, which is beneficial for later maintenance. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of an integrated circuit test socket proposed in this utility model;

[0019] Figure 2 This is a partial cross-sectional view of a test socket for an integrated circuit test socket proposed in this utility model;

[0020] Figure 3 for Figure 2 A schematic diagram of the structure of part A;

[0021] Figure 4This is a partial cross-sectional view of the gantry and mounting plate of an integrated circuit test socket proposed in this utility model;

[0022] Figure 5 for Figure 4 A schematic diagram of the structure of part B.

[0023] In the diagram: 1. Base; 2. Cylinder; 3. Test seat; 4. Gantry; 5. Probe foot; 6. Mounting plate; 7. Convenient clamping mechanism; 8. Disassembly and maintenance mechanism; 701. Slide groove; 702. Slider; 703. Lower rack; 704. Support plate; 705. Clamping plate; 706. Rubber pad; 707. Rotating rod; 708. Threaded rod; 709. Cylinder; 710. Ear plate; 711. Compression spring; 712. Upper rack; 713. Vertical plate; 714. Mounting port; 81. Positioning plate; 82. Positioning port; 83. Fastening nut; 84. Fixing plate; 85. Clearance groove; 86. Screw; 87. Stabilizing plate. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0025] Reference Figures 1-5 An integrated circuit test socket includes a base 1 and probe pins 5. A cylinder 2 is fixedly mounted on the top of the base 1. A test socket 3 for testing integrated circuit boards is fixedly connected to the output shaft of the cylinder 2. A convenient clamping mechanism 7 for clamping and fixing integrated circuit boards is provided on the test socket 3. A gantry frame 4 is fixedly connected to the top of the base 1. A mounting plate 6 is fixedly connected to the bottom of the probe pins 5. A disassembly and maintenance mechanism 8 is provided between the mounting plate 6 and the gantry frame 4.

[0026] Furthermore, refer to Figures 1-3The convenient clamping mechanism 7 includes two slide grooves 701 formed on the top of the test base 3. Lower racks 703 are fixedly connected to the inner walls of both sides of the slide grooves 701. A slider 702 is slidably sleeved within the slide grooves 701. A support plate 704 is fixedly connected to the top of the slider 702. A threaded rod 708 is threadedly connected to one side of the support plate 704. A clamping plate 705 is fixedly connected to one end of the threaded rod 708. A rubber pad 706 is fixedly connected to one side of the clamping plate 705. Ears are fixedly connected to the inner walls of both sides of the slider 702. Plate 710, ear plate 710 is fixedly connected to the bottom of compression spring 711, the lower ends of the two compression springs 711 are fixedly connected to the same upper rack 712, the upper rack 712 meshes with the lower rack 703, the top of the upper rack 712 is fixedly connected to the vertical plate 713, the front side of the vertical plate 713 is fixedly connected to the cylinder 709, the outer side of the cylinder 709 is slidably fitted with a rotating rod 707, the side of the slider 702 is provided with an installation port 714, the rotating rod 707 is rotatably connected to the front and rear inner walls of the installation port 714.

[0027] Using the above method: During fixing, place the integrated circuit board on top of the test base 3. Regardless of the size of the integrated circuit board, press down on the rotating rod 707. This causes the rotating rod 707 to move the cylinder 709 and the vertical plate 713 upwards. The vertical plate 713 then moves the upper rack 712 upwards and compresses the compression spring 711. At this time, the upper and lower racks are not engaged, thus not fixing the slider 702. The two sliders 702 can then be directly pushed inwards, causing the two rubber pads 706 to abut against the sides of the integrated circuit board. After contact, release the rotating rod. At 707, under the elastic force of the compression spring 711, the upper rack 712 moves down and firmly abuts against the lower rack 703, thereby fixing the slider 702. By slightly rotating the threaded rod 708, it drives the clamping plate 705 to move inward, which can clamp and fix integrated circuit boards of different sizes, making the fixing of integrated circuit boards more convenient and efficient, and improving the efficiency of testing. Then, the cylinder 2 drives the test seat 3 to move upward, so that the position of the integrated circuit board to be tested contacts the probe pin 5, and the position of the integrated circuit board to be tested can be detected.

[0028] Furthermore, an elongated hole is provided on the front side of the rotating rod 707, and the cylinder 709 is slidably fitted into the elongated hole, which facilitates the sliding of the cylinder 709 within the rotating rod 707.

[0029] Furthermore, the outer fixed sleeve of the rotating rod 707 is provided with an anti-slip sleeve to facilitate personnel to press down the rotating rod 707.

[0030] Furthermore, refer to Figure 1 , Figure 4 and Figure 5The disassembly and maintenance mechanism 8 includes two positioning plates 81 fixedly connected to the top of the gantry frame 4, and two screws 86 rotatably set on the top of the gantry frame 4. The top of the mounting plate 6 has two positioning holes 82, and the two positioning plates 81 are respectively movably inserted into the corresponding positioning holes 82. The top of the positioning plate 81 has a clearance groove 85, and the screws 86 are movably placed in the clearance groove 85. The outer side of the screws 86 is slidably fitted with a fixing plate 84, and the fixing plate 84 is movably abutted between the positioning plate 81 and the mounting plate 6. The outer side of the screws 86 is threaded with a fastening nut 83, and the fastening nut 83 is movably abutted against one side of the fixing plate 84.

[0031] Using the above method: When maintenance is required on the probe foot 5, loosen the fastening nut 83 and move the fixing plate 84 inward so that it does not obstruct the screw 86 from turning out of the clearance groove 85, thus not fixing the mounting plate 6. At this time, the mounting plate 6 and the probe foot 5 can be removed from the two positioning plates 81 for maintenance. After maintenance, insert the mounting plate 6 into the outside of the two positioning plates 81. Through the setting of the positioning plate 81 and the positioning port 82, the probe foot 5 can be positioned and installed. Finally, rotate the screw 86 into the clearance groove 85 and tighten the fastening nut 83, so that the fastening nut 83 drives the fixing plate 84 to move outward and abut against the inside of the positioning plate 81 and the top of the mounting plate 6, thereby locking the mounting plate 6 and the probe foot 5.

[0032] Furthermore, four stabilizing plates 87 are fixedly connected to the top of the gantry frame 4, and two screws 86 are rotatably set between the corresponding two stabilizing plates 87, which facilitates the rotatable connection of the screws 86 to the top of the gantry frame 4.

[0033] Furthermore, two telescopic rods are fixedly connected between the base 1 and the test seat 3, and the cylinder 2 is located between the two telescopic rods to facilitate the guidance of the test seat 3 and make its lifting and lowering more stable.

[0034] In this invention, during fixing, the integrated circuit board is placed on top of the test base 3. Regardless of the size of the integrated circuit board, the rotating rod 707 can be pressed down, causing the rotating rod 707 to move the cylinder 709 and the vertical plate 713 upwards. The vertical plate 713 moves the upper rack 712 upwards and compresses the compression spring 711. At this time, the upper and lower racks do not engage, and the slider 702 is not fixed. At this time, the two sliders 702 can be directly pushed inwards, causing the two rubber pads 706 to abut against the sides of the integrated circuit board. After abutting, the rotating rod 707 is released. Under the elastic force of the compression spring 711, the upper rack 712 moves downwards and firmly abuts against the lower rack 703, thereby fixing the slider 702. Slightly rotating the threaded rod 708 causes the clamping plate 705 to move inwards, thus clamping and fixing integrated circuit boards of different sizes, making the fixing of integrated circuit boards more convenient. The system is efficient and improves testing efficiency. Then, the cylinder 2 drives the test seat 3 to move upward, so that the position to be tested on the integrated circuit board contacts the probe pin 5, and the position to be tested on the integrated circuit board can be detected. When the probe pin 5 needs to be maintained, loosen the fastening nut 83 and push the fixing plate 84 inward so that it does not obstruct the screw 86 from turning out of the relief groove 85, and thus do not fix the mounting plate 6. At this time, the mounting plate 6 and the probe pin 5 can be removed from the two positioning plates 81 for maintenance. After maintenance, the mounting plate 6 is inserted into the outside of the two positioning plates 81. Through the setting of the positioning plate 81 and the positioning port 82, the probe pin 5 can be positioned and installed. Finally, the screw 86 is rotated into the relief groove 85 and the fastening nut 83 is tightened, so that the fastening nut 83 drives the fixing plate 84 to move outward and abut against the inside of the positioning plate 81 and the top of the mounting plate 6, thereby locking the mounting plate 6 and the probe pin 5.

Claims

1. An integrated circuit test socket, characterized in that, The device includes a base (1) and probe feet (5). A cylinder (2) is fixedly installed on the top of the base (1). A test seat (3) for testing integrated circuit boards is fixedly connected to the output shaft of the cylinder (2). A convenient clamping mechanism (7) for clamping and fixing integrated circuit boards is provided on the test seat (3). A gantry frame (4) is fixedly connected to the top of the base (1). A mounting plate (6) is fixedly connected to the bottom of the probe feet (5). A disassembly and maintenance mechanism (8) is provided between the mounting plate (6) and the gantry frame (4).

2. The integrated circuit test socket according to claim 1, characterized in that, The convenient clamping mechanism (7) includes two slide grooves (701) opened on the top of the test seat (3). Lower racks (703) are fixedly connected to the inner walls on both sides of the slide grooves (701). A slider (702) is slidably sleeved in the slide grooves (701). A support plate (704) is fixedly connected to the top of the slider (702). A threaded rod (708) is threadedly connected to one side of the support plate (704). A clamping plate (705) is fixedly connected to one end of the threaded rod (708). A rubber pad (706) is fixedly connected to one side of the clamping plate (705).

3. An integrated circuit test socket according to claim 2, characterized in that, The slider (702) has ear plates (710) fixedly connected to both inner walls. The bottom of the ear plates (710) is fixedly connected to a compression spring (711). The lower ends of the two compression springs (711) are fixedly connected to the same upper rack (712). The upper rack (712) meshes with the lower rack (703). The top of the upper rack (712) is fixedly connected to a vertical plate (713). The front side of the vertical plate (713) is fixedly connected to a cylinder (709). A rotating rod (707) is slidably sleeved on the outer side of the cylinder (709). The slider (702) has an installation port (714) on one side. The rotating rod (707) is rotatably connected to the front and rear inner walls of the installation port (714).

4. An integrated circuit test socket according to claim 3, characterized in that, The rotating rod (707) has an elongated hole on its front side, and the cylinder (709) is slidably fitted inside the elongated hole.

5. An integrated circuit test socket according to claim 3, characterized in that, The outer side of the rotating rod (707) is fitted with an anti-slip sleeve.

6. An integrated circuit test socket according to claim 1, characterized in that, The disassembly and maintenance mechanism (8) includes two positioning plates (81) fixedly connected to the top of the gantry frame (4) and two screws (86) rotatably disposed on the top of the gantry frame (4). The top of the mounting plate (6) has two positioning holes (82). The two positioning plates (81) are respectively movably inserted into the corresponding positioning holes (82). The top of the positioning plate (81) has a relief groove (85). The screws (86) are movably placed in the relief groove (85). The outer side of the screws (86) is slidably fitted with a fixing plate (84). The fixing plate (84) is movably abutted between the positioning plate (81) and the mounting plate (6). The outer side of the screws (86) is threaded with a fastening nut (83). The fastening nut (83) is movably abutted against one side of the fixing plate (84).

7. An integrated circuit test socket according to claim 6, characterized in that, The top of the gantry (4) is fixedly connected to four stabilizing plates (87), and two screws (86) are respectively rotatably set between the corresponding two stabilizing plates (87).

8. An integrated circuit test socket according to claim 1, characterized in that, Two telescopic rods are fixedly connected between the base (1) and the test seat (3), and the cylinder (2) is located between the two telescopic rods.