Test pin device

Abstract

The invention relates to a test pin (10) for electrically contacting a contact partner (20), in particular a planar surface (21) of a contact partner, comprising: a substantially sleeve-shaped main body (1); a contact head (3), which is disposed on a contact side (2a) of the main body (1), said contact side being proximate to the contact partner (20), and which has at least two partial segments (5a, 5b, 5c, 5d) extending axially from a base (4) of the contact head (3); wherein the partial segments (5a, 5b, 5c, 5d) each have at least one preferably rigid cutting element (6a, 6b, 6c, 6d) for cutting into and / or scratching open a surface of the contact partner (21), the cutting element extending from an end face of the partial segment in question, and the contact head (3) is designed for radial spreading or coming together of the cutting elements (6a, 6b, 6c, 6d) when a force (F) acting on the test pin (10) in the axial direction, in particular a compressive force, is applied.

Description

[0001] Test pin device

[0002] The present invention relates to a test pin for detachably contacting a contact partner, in particular for surface contacting of an energy storage device.

[0003] Test probes or test probe devices with a contact head are well known in the art and are used in test fields or other testing contexts to check the functionality of a test partner, for example, an electronic assembly with a suitable socket section. The test probe device is placed on the contact partner to be tested as a plug or contacts it. Test signals are then applied to the contact partner via a suitable contact. A plurality of such test probes can also be provided in a common mounting device for connection to corresponding contact partners of a test object.

[0004] For example, WO 2012 / 136562, a generic test pin, comprises a sleeve-shaped housing, a sleeve-shaped contact element movably guided therein, and a pin-shaped element cooperating therewith, wherein the latter and the contact element are axially preloaded in a first, uncompressed non-contact position by separate spring elements in the housing. Upon insertion of the contact element into a socket section to be contacted or tested, an axial force acts on the test pin through a stop collar-like surrounding the contact element, whereby the contact element is transferred into a second, spring-loaded contact position, wherein the pin-shaped element is pressed against an inner contact surface of the contact element, resulting in a radial expansion of the contact head for contacting or contacting the socket section by means of a circumferential surface of the test pin.Test devices designed for contacting an energy storage device, in particular a battery, are also known. In this case, contact can be made, in particular, to a flat surface of the energy storage device, particularly at a pole. DE 20 2018 104 812 U1, for example, discloses a contact module for electrically contacting a component, comprising a carrier having a contact side assigned to the component and a connection side facing away from the contact side, with at least two electrically conductive contact elements arranged therein, in particular in the form of a spring contact pin with a resilient contact head. A second contact pin can be arranged obliquely to a contacting direction, such that the respective contact head is displaced laterally along the respective contact point of the component, so that the surface of the contact point is scratched, thereby establishing a secure electrical contact.However, this can result in an undesirable transverse force being introduced or a lateral displacement of the entire test module, which can cause undesirable transverse forces to act on the fixture suspension or fastening.

[0005] Based on the known prior art, the present invention aims to provide an improved test pin for contacting an energy storage device, which on the one hand enables a high contact quality during the testing process and at the same time enables simple constructive implementation and ease of maintenance.

[0006] This object is achieved by a device and a test pin according to the independent claim. The dependent claims describe advantageous developments of the present invention. All combinations of at least two of the features disclosed in the claims, the description, and / or the figures fall within the scope of the invention.The invention relates to a test pin for electrically contacting a contact partner, in particular a flat surface of a contact partner, comprising a substantially sleeve-shaped base body, a contact head arranged on a contact side of the base body facing the contact partner, with at least two partial segments extending axially from a base of the contact head, wherein the partial segments each have at least one preferably rigid cutting element extending from the end face thereof for cutting into and / or scratching a surface of the contact partner, and wherein the contact head is designed for radially widening and / or narrowing the cutting elements upon application of a force acting on the test pin in the axial direction, in particular a compression force.

[0007] The present invention enables simple contacting of a surface, in particular at the pole of an energy storage device for charging and / or testing purposes. The cutting elements provided on the end face enable cutting of the passive surface of the contact partner, for example an oxide surface of aluminum. This achieves a very low contact resistance, which minimizes the heating temperature, particularly when transmitting high currents. The cutting elements, which are preferably rigidly provided on the sub-segments, enable very precise force application for cutting the surface. The radial widening and / or narrowing of the at least two cutting elements on the contact partner provides radial spreading and / or radial contraction of the individual cutting elements, which enables stable and simple contacting.In particular, this also enables a reduction in the axial contact force of the respective contact element and thus in the mechanical load on the energy storage device. A force acting on the test pin in the axial direction, in particular a compression force, occurs in particular when the test pin and the contact partner to be contacted are moved relative to one another, for example by a test device arranged on the back of the test pin for holding the pin. When the test pin or the contact head makes contact with the contact partner, an axial or compression force acts on the test pin and in particular also on the contact head. Contact can be made, for example, by axial movement of the test pin on the contact partner that is held securely or immobile, or vice versa, i.e. an axial movement of the contact partner on the contact pin that is held securely.

[0008] In a preferred embodiment, the axially extending sub-segments of the contact head and / or the cutting elements arranged thereon are preferably evenly distributed around a central axis of the contact head. This allows the applied axial force to be distributed particularly evenly among the sub-segments, minimizing, in particular, the undesirable introduction of transverse forces onto the test pin during the expansion and / or contraction of the cutting elements.

[0009] Further preferably, the axially extending partial segments of the contact head and / or the cutting elements arranged thereon are arranged radially outwardly relative to a central axis of the contact head and preferably offset by the same radial distance from the central axis.

[0010] The sub-segments are further preferably formed by at least one or more preferably slot-like material recesses on a side of the contact head facing the contact partner, each of which runs parallel to a central axis of the contact head. The material recesses extend from the side of the contact head facing the contact partner, preferably over the same length, to the base of the contact head. Preferably, at least one, in particular slot-like, material recess is provided, so that the contact head comprises at least two sub-segments extending axially and preferably parallel to one another. In a further preferred embodiment, the contact head comprises two material recesses arranged perpendicular to one another, which intersect in the central axis of the contact head. As a result, the contact head has four sub-segments extending preferably parallel to one another.

[0011] The contact head further preferably has a central bore which runs coaxially to a central axis of the test pin or the contact head. The central bore can be designed for the passage and / or mounting of a sensor element such as a temperature sensor. The sensor element or a sensor head of the sensor element can preferably extend close to the cutting elements or be arranged set back from them within the contact head. Alternatively or additionally, the bore can be designed for the passage of an inner conductor for additional or expanded contacting of the contact partner. Alternatively or additionally, the bore can also be designed as a cooling channel for guiding cooling fluid, in particular cooled air, to the contact partner or a contact point between the contact head and contact partner.

[0012] In a further preferred embodiment, the contact head is mounted axially movably at least partially within the sleeve-shaped base body and subjected to a preload force by a spring element. The base body preferably has a central, preferably substantially hollow-cylindrical, guide section in which the spring element is arranged and at least a portion of the contact head, in particular a proximal base of the contact head, is mounted axially movably.

[0013] The contact head is preferably arranged axially movable in the base body such that, in a first extended non-contact position, it is preloaded by the spring element against a stop element, in particular a ring shoulder, and in a second contact position, it is arranged or can be arranged at least partially compressed into the base body against the preload force of the spring element. The first non-contact position corresponds to the initial state of the test probe, in which no contact is made with a contact partner.

[0014] In a preferred embodiment, the test pin comprises a pin element which is preferably immovably mounted in the base body and which is designed for position-dependent interaction with the contact head in such a way that when the contact head is deflected in the contact position of the test pin, the pin element engages in a central opening section and in doing so preferably uniformly radially widens the sub-segments of the contact head or the cutting elements arranged thereon. The pin element and the opening section interacting therewith are preferably arranged concentrically to the central axis of the test pin or of the contact head. The opening section is arranged on a side of the base of the contact head facing the contact partner or in a section of the contact head assigned to the sub-segments. The opening section can be a tapered opening orA through-bore into which a distal section of the pin element engages, thereby radially expanding the sub-segments of the contact head. The pin element preferably comprises a shaft with a constant outer diameter and an at least partially tapered distal section. The pin element is preferably arranged immovably in a central guide section of the sleeve-like base body. The spring element is preferably arranged surrounding the pin element. The spring element can be arranged or preloaded between a first circumferentially arranged shoulder of a proximal section of the pin element and a shoulder arranged at the end of the base of the contact head.

[0015] In a preferred embodiment, the test pin comprises only one spring element, which is further preferably arranged in a guide section of the sleeve-like base body.

[0016] In a further preferred embodiment, the pin element comprises a contoured section with a preferably reduced outer diameter on its outer circumferential surface, located downstream of a distal section in the axial direction of movement. This contoured section is designed for position-dependent interaction with the contact head, such that upon further compression of the contact head beyond the distal section, the contoured section engages the central opening section and thereby radially narrows the sub-segments of the contact head, preferably uniformly and toward their home position in the non-contact position of the contact head.

[0017] The opening section of the contact head comprises a tapered section and radially expanded sections, preferably associated with this on both sides in the direction of movement. The contact head is designed for sequential interaction with the pin element such that upon contact with a contact partner and the resulting deflection of the contact head, there is initially a preferably uniform radial expansion and then, upon further deflection, a preferably uniform radial narrowing of the sub-segments or the cutting elements arranged thereon. The sequential radial expansion and subsequent radial narrowing of the sub-segments or the cutting elements arranged thereon enables particularly effective contact with the contact partner.

[0018] In a preferred alternative embodiment, the contact head is designed for position-dependent interaction with a distal opening and / or with an inner circumferential surface of a preferably hollow-cylindrical guide element arranged on the base body, such that when the contact head is deflected in a contact position of the test pin, the opening and / or the inner circumferential surface preferably uniformly radially narrows the sub-segments of the contact head or the cutting elements arranged thereon. The preferably hollow-cylindrical guide element can be mounted for axial movement on the base body and / or on the contact head by means of a second spring element, which is preferably designed as an exponential spring. The second spring element can be preloaded between a rear annular shoulder of the base body and a proximal end face of the guide element.The guide element can also be preloaded in the non-contact position against a provided ring shoulder of the base body.

[0019] By designing the second spring element as an exponential spring or as a spring having an exponential spring force during compression, the contact pressure applied to the contact partner can initially be increased so that the cutting elements can penetrate into the surface to be contacted, preferably vertically, before a radial force acts on the cutting elements, whereby the surface is cut and / or scratched by the cutting elements.

[0020] In a further alternative embodiment, the contact head can be formed integrally on the contact side of the base body. In this case, sub-segments and the associated cutting elements are arranged such that an axial contact force on the test pin leads to a preferably uniform widening or narrowing of the cutting elements. The cutting elements preferably have a cutting edge or edge guide that runs at an angle relative to the surface to be contacted. The cutting edge or cutting edge is arranged radially in an axial plan view, so that an axial contact pressure of the respective cutting element leads to a radial bending or widening of the respective cutting element relative to a central axis of the contact head.

[0021] The respective cutting elements of the contact head are designed to at least partially cut into and / or scratch a preferably planar and / or passive surface of the contact partner. The respective cutting element comprises, in an axial plan view, a cutting edge or cutting edge guide running radially outwards. Alternatively or additionally, the cutting elements can have other cutting edge profiles, in particular also a cutting edge or cutting edge guide that is circumferentially tangential in an axial plan view. This means that the cutting edge or the cutting edge profile is essentially linear and, in an axial plan view of the contact head, is arranged tangentially to a circle concentric with the central axis or is arranged perpendicular to a predefined radius. The individual cutting edges of the respective cutting elements of the contact head are preferably tangential to the same circle orarranged at the same radial distance from the central axis.

[0022] Each sub-segment of the contact head can also have a plurality of cutting elements. These can each have a similar design or different designs. Details, advantageous effects, and details of the present invention are explained below with reference to the purely schematic, exemplary drawings.

[0023] Showing:

[0024] Fig.1 a: a test pin according to the invention according to a first preferred embodiment in side view;

[0025] Fig. 1 b-1 d: the test pin of Fig. 1 a in sectional view and in different positions;

[0026] Fig. 2a: a test pin according to the invention according to a further development of the preceding embodiment in a side sectional view;

[0027] Fig. 2b: the test pin according to Fig. 2a in a contact position;

[0028] Fig. 3a-3e: different views of the test pin according to a second preferred embodiment in a lateral sectional view;

[0029] Fig. 4a, 4b: a test pin according to the invention according to a further development of the previous embodiment in different views;

[0030] Fig. 5a-5e: different views of the test pin according to a third preferred embodiment;

[0031] Fig. 6a-6b: different views of another preferred contact head configuration; Fig. 7a-7b: different views of another preferred contact head configuration;

[0032] Fig. 8a-8b: different views of further preferred contact head designs; and

[0033] Fig. 9a-9b: another preferred contact head design;

[0034] Fig. 1a-1d show a first preferred embodiment of a test pin 10 according to the invention for electrical contacting, in particular, a flat surface 21 of a contact partner 20, for example a pole of an energy storage device.

[0035] The test pin has a substantially sleeve-shaped base body 1, with a contact side 2a facing the contact partner 20 and an opposite connection side 2b facing away from the contact partner. Furthermore, the test pin comprises a contact head 3 arranged on the contact side, having a base 4 on the rear side or facing away from the contact partner 20 and sub-segments 5a, 5b extending therefrom toward the contact partner 20.

[0036] The contact head 3 is guided and supported by the base 4 for axial movement at least partially within a central guide section 17 of the test pin. The guide section 17 has a spring element 11, which preloads the contact head 3 in the non-contact position of the test pin 10 shown in Fig. 1a and 1b. The spring element 11 can represent the only spring element of the test pin 10 and is arranged between a rear stop in the guide section 17 and an opposite

[0037] REVISED SHEET (RULE 91) ISA / EP lying face of the contact head 3 facing away from the contact partner 20. The spring element 11 presses the base 4 of the contact head 3 against a stop 12 provided on the contact side 2a.

[0038] The contact head 3 comprises at least two sub-segments 5a, 5b extending axially from the base 4 of the contact head, each having a cutting element 6a, 6b extending from the end face thereof and preferably rigid, i.e., immovably arranged relative to the sub-segments 5a, 5b. The cutting element 6a, 6b is preferably formed integrally, i.e., in one piece, with the associated sub-segment 5a, 5b. The cutting elements 6a, 6b are designed to cut and / or scratch a surface 21 of the contact partner 20, in particular a so-called passive surface, which is created by oxidation.

[0039] The contact head is designed for radial expansion and / or narrowing of the cutting elements under the application of a force F acting on the test pin 10 in the axial direction. In this case, the at least two sub-segments 5a, 5b and the cutting elements 6a, 6b arranged thereon are expanded or spread radially outwards or narrowed radially inwards in an axial plan view of the test pin. Radial is understood here to mean that the respective expansion or narrowing of the individual elements occurs in an axial plan view in the radial direction starting from a central center axis of the contact head. Due to the radial expansion or narrowing of the cutting elements, they can move from a first contacting position on the contact partner along its surface or essentially parallel to its surface and in doing so cut into it or scratch it. Fig. 1b shows a sectional view in the first extended non-contact position.The test pin has a central axial bore 8 arranged in the contact head 3, which extends through the entire contact head 3. A pin element 13, which is preferably immovably mounted in the base body 1, engages at least partially into this bore in the non-contact position. The pin element 3 is preferably made of solid material. Alternatively, the pin element 3 itself can also have a through-bore in which sensors or other components, such as an inner conductor 9 (see Fig. 1d), can be arranged or guided. Further alternatively, such a through-bore can also provide a cooling channel for guiding cooling fluid, in particular cool air.

[0040] The pin element 13 is designed for position-dependent interaction with the contact head 3. In particular, when the contact head 3 is deflected into the base body 1, a distal section 13a of the pin element 13 engages a central opening section 14 of the bore 8. This can, in particular, represent a taper of the bore 8, more preferably a taper that is continuous in the direction of movement of the pin element 13 during deflection. When the pin element 13 engages the opening section 14, the sub-segments 5a, 5b of the contact head 3 are thus spread apart, as shown in Fig. 1c.

[0041] When contact is made with a contact partner 20 by the test pin 10, the sub-segments 5a, 5b with the cutting elements 6a, 6b arranged on the end face are initially placed on the contact surface. Then, with increasing contact force F, the interaction between the pin element 13 and the opening section 14 causes a simultaneous transverse or radial movement of the individual cutting elements 6a, 6b parallel to the surface 21 on the contact partner 20 under continuously applied axial contact pressure (see Fig. 1 c). When the contact pressure is released or when the test pin 10 moves in the opposite direction to the contact pressure, the spring force of the spring element 11 returns the contact element to the non-contact position shown in Fig. 1 a, 1 b.

[0042] Fig. 2a, 2b shows the previously described test pin with a modified version of the pin element 13 and the opening section 14. These are now designed such that when the test pin 10 is transferred from a non-contact position to a contact position, a sequential spreading and narrowing of the sub-segments 5a, 5b on the surface 21 of the contact partner 20 occurs. In this case, the pin element 13 is contoured and, in particular, has a contoured section 13b with a reduced outer diameter located downstream of the distal section 13a in the axial direction of movement. When the contact head 3 is deflected, the distal section 13 is first inserted into the opening section 14 with the reduced diameter of the through-bore 8, whereby the previously described widening of the sub-segments occurs.Upon further compression, the contoured section 13b interacts with the opening section 14, whereby the reduced outer diameter causes the partial segments 5a, 5b to close or narrow again.

[0043] 3a to 3e show a further preferred embodiment of the test pin 10, which, instead of the pin element 13, has a hollow cylindrical guide element 14 that is axially movably mounted on the base body 1 and / or on the contact head 3. The exemplary embodiment shown has a plurality of sub-segments 5a, ... , 5n, each of which has a cutting element 6a, ... , 6n. The sub-segments 5a, ... , 5n are circumferentially enclosed or held by the guide element 14. The guide element 14 is preloaded in the direction of the non-contact position by a second spring element 1, starting from the base body, wherein the guide element 14 is tensioned against a stop 15a provided on the base body 1. The individual sub-segments 5a, ... , 5n are, analogous to the previous embodiment, each axially extending elements that extend from a common base 4 of the contact head 3.

[0044] The contact head 3 is designed for position-dependent interaction with a distal opening 14a and / or with an inner circumferential surface 14b of the hollow cylindrical guide element 14, such that when the contact head is deflected, the opening 14a and / or the inner circumferential surface 14b preferably uniformly radially narrows the sub-segments 5a, ..., 5n of the contact head 3. The individual sub-segments 5a, ..., 5n can each have an outer or circumferential surface 18 that widens toward the contact partner and is mounted in a corresponding inner circumferential surface 14b that preferably widens at least partially conically outward.

[0045] Figs. 3d and 3e show two slightly modified embodiments for a possible contact head 3, which differ in the number of sub-segments 5a, ..., 5n with cutting elements 6a, ..., 6n. In particular, the embodiment according to Fig. 3e has two sub-elements that do not have a cutting element between the respective sub-elements with a cutting element.

[0046] The axially extending sub-segments 5a, ..., 5n of the contact head 3 and / or the cutting elements 6a, ..., 6n arranged thereon are arranged radially outwardly relative to a central axis M of the contact head 3 and preferably offset by the same radial distance H from the central axis M (see also Fig. 3c). The sub-segments 5a, ..., 5n are arranged with a uniform circumferential distribution. The cutting elements 6a, ...6n assigned to the respective sub-segments are also preferably arranged with a uniform circumferential distribution. The respective cutting elements 6a, ...6n form a preferably substantially annular contact surface of the respective cutting elements on the surface 21 to be contacted. The annular contact surface is continuously reduced in diameter by the radial narrowing of the cutting elements 6a, ...6n according to the invention.

[0047] Fig. 4a, 4b shows a modified test pin according to the previous embodiment, in which the hollow cylindrical guide element 14 has a smaller longitudinal extension and, in particular, is arranged to surround only a distal end portion 19 of the contact head 3. Analogous to the previously described embodiment, the sub-segments 5a, 5b, 5c, 5d guided therein also have an outer or peripheral surface 18 that widens toward the contact partner and is mounted in a corresponding and preferably at least partially conically widening inner peripheral surface 14b.

[0048] The sub-segments 5a, 5b, 5c, 5d are formed by two slot-like material recesses 7a, 7b on a side of the contact head 3 facing the contact partner 20, which are each arranged parallel to a central axis M of the contact head 3 and intersecting vertically therein. The sub-segments 5a, 5b, 5c, 5d are each circular sector-shaped in plan view with a central bore 8.

[0049] The second spring element 15 is preferably designed as an exponential spring, which is mounted for axial movement on the base body 1 and / or on the contact head 3. In particular, the spring element is preloaded between a rear annular shoulder 22a of the base body and a proximal annular shoulder 22b of the guide element 14. By designing the second spring element as an exponential spring, the contact pressure applied to the contact partner is initially increased upon contact with the contact partner, so that the cutting elements can penetrate the surface to be contacted before a radial force acts on the cutting elements, causing the surface to be cut and / or scratched.

[0050] Fig. 5a-5e show a further preferred embodiment in which the contact head 3 is integrally formed on the contact side 2a of the base body 1 or is rigidly or immovably connected thereto. The sub-segments 5a, ..., 5n and the associated cutting elements 6a, ..., 6b are arranged such that an axial contact force on the test pin 10 leads to a preferably uniform expansion of the cutting elements. The sub-segments are formed by preferably substantially triangular material recesses in a sleeve-shaped outer surface of the contact head 3.

[0051] The cutting elements preferably have a cutting edge 23 that runs at an angle relative to the surface to be contacted. The cutting edge profile 23 is preferably arranged substantially radially in an axial plan view, so that an axial contact pressure of the respective cutting element leads to a radial bending or expansion of the respective cutting element relative to a central axis M of the contact head 3.

[0052] A temperature sensor 24 can be provided in a central bore 8 of the base body 1, which can be arranged in a stop sleeve 25 surrounding it. Fig. 5e shows an embodiment without the temperature sensor 24 arranged therein. Alternatively or additionally, an inner conductor for voltage measurement, for example, can be accommodated in the bore 8 as a sensor element. The inner conductor can, for example, be a spring-loaded contact pin known per se. Additionally or alternatively, the bore 8 can provide a cooling channel, by means of which, in particular, cooled air can be transported as a cooling fluid to a contact point between the contact head and the contact partner.

[0053] Fig. 6a shows various designs of a contact head 3, comprising four circular segment-like sub-segments 5a, 5b, 5c, 5d extending axially from a base 4, wherein the respective base 4, 4', 4" in the figure shown can be designed differently in length and / or design. A longer axial design of the base 4 can lead to improved signal or current transmission.

[0054] As shown in Fig. 6b, the sub-segments 5a, 5b, 5c, 5d can each have two or more cutting elements 6a, 6a', 6a", which are formed or arranged, for example, circumferentially tangential to an annular support surface of the cutting elements on a surface of the contact partner 20. The cutting elements arranged in this way lead to scratching or scraping of the surface to be contacted when spread apart in an annular manner.

[0055] Figs. 7a and 7b show further possible embodiments for the respective contact head 3 of the test pin. The respective cutting elements 6a,..., 6n can be designed, for example, as groove-shaped elements 26, as shown in Fig. 7b. Alternatively, the cutting elements 6a,..., 6n can also be point-shaped or pyramid-shaped, as shown in the two right-hand illustrations in Figs. 7a and b. Such point-shaped or pyramid-shaped elements can be arranged only on a peripheral region of the end face 28 of the contact head 3, or can be arranged uniformly over the entire end face.

[0056] Fig. 8a, 8b and 9a, 9b show further possible embodiments of the contact head 3 according to the invention, each having radial (Fig. 8b right; Fig. 9b) or tangential (Fig. 8b left) or perpendicular to the radial alignment running cutting edges 23 of the respective cutting elements 6a, 6b, 6c, 6d.

[0057] List of reference symbols

[0058] I Basic body

[0059] 2a Contact page

[0060] 2b Connection side

[0061] 3 Contact head

[0062] 4 Basic contact head

[0063] 5a,... , 5n subsegments

[0064] 6a,... , 6n cutting element

[0065] 7a, 7b Material recess

[0066] 8 central hole

[0067] 9 Sensor element / inner conductor

[0068] 10 test pin

[0069] II Spring element

[0070] 12 Stop element

[0071] 13 Pin element

[0072] 13a distal section

[0073] 13b contoured section

[0074] 14 Guide element

[0075] 14a distal opening

[0076] 14b inner peripheral surface

[0077] 15 second spring element

[0078] 15a Stop guide element

[0079] 16a,b radial, tangential cutting edge

[0080] 17 central guide section base body

[0081] 18 Exterior area

[0082] 19 End section contact head

[0083] 20 contact partners

[0084] 21 Surface contact partner

[0085] 22a Ring heel base body

[0086] 22b Ring shoulder guide element 23 Cutting edge

[0087] 24 Temperature sensor / inner conductor

[0088] 25 stop sleeve

[0089] 26 groove-shaped formation 27 point-shaped formation

[0090] 28 Front face of contact head

[0091] M center axis r1 radial distance F axial force / compression force

Claims

Patent claims 1. Test pin (10) for electrically contacting a contact partner (20), in particular a flat surface (21) of a contact partner, comprising a substantially sleeve-shaped base body (1), a contact head (3) arranged on a contact side (2a) of the base body (1) facing the contact partner (20), with at least two partial segments (5a, 5b, 5c, 5d) extending axially from a base (4) of the contact head (3), characterized in that the partial segments (5a, 5b, 5c, 5d) each have at least one preferably rigid cutting element (6a, 6b, 6c, 6d) extending from the end face thereof for cutting into and / or scratching a surface (21) of the contact partner (20), and in that the contact head (3) is configured for radially widening and / or narrowing the cutting elements (6a, 6b, 6c, 6d) is formed by applying a force (F) acting on the test pin (10) in the axial direction.

2. Test pin according to claim 1, characterized in that the axially extending partial segments (5a, 5b, 5c, 5d) of the contact head and / or the cutting elements (6a, 6b, 6c, 6d) arranged thereon are arranged, preferably uniformly distributed around the circumference, around a central axis (M) of the contact head (3).

3. Test pin according to claim 1 or 2, characterized in that the axially extending partial segments (5a, 5b, 5c, 5d) of the contact head (3) and / or the cutting elements (6a, 6b, 6c, 6d) arranged thereon are arranged radially outwards relative to a central axis (M) of the contact head (3) and preferably by the respective are arranged offset at the same radial distance (H ) from the central axis (M). Test pin according to one of the preceding claims, characterized in that the partial segments (5a, 5b, 5c, 5d) are formed by at least one or more preferably slot-like material recesses (7a, 7b) on a side of the contact head (3) facing the contact partner (20), which each run parallel to a central axis (M) of the contact head (3). Test pin according to one of the preceding claims, characterized in that the contact head (3) has a central bore (8) which runs coaxially to a central axis (M) of the test pin (10) and in which a sensor element (9), in particular a temperature sensor, or an inner conductor for contacting the contact partner (20) is received, and / or in which a cooling channel for guiding cooling fluid, in particular cooled air, is provided.Test pin according to one of the preceding claims, characterized in that the contact head (3) is mounted at least partially axially movable within the sleeve-shaped base body (1) and is subjected to a prestressing force by a spring element (11). Test pin according to one of the preceding claims, characterized in that the contact head (3) is arranged axially movable in the base body (1) in such a way that, in a first extended non-contact position, it is prestressed by the spring element (11) against a stop element (12), in particular an annular shoulder, and in a second contact position, it is arranged so as to be at least partially spring-loaded into the base body (1) against the prestressing force of the spring element (11). Test pin according to one of the preceding claims, characterized in that the base body (1) has a pin element (13) which is preferably immovably mounted therein and which is designed for position-dependent interaction with the contact head (3) in such a way that when the contact head (3) is deflected in a contact position of the test pin (10), the pin element (13) engages in a central opening section (14) and in the process preferably uniformly radially widens the sub-segments (5a, 5b, 5c, 5d) of the contact head (3).Test pin according to claim 8, characterized in that the pin element (13) has, on its outer circumferential surface and downstream of a distal section (13a) in the axial direction of movement, a contoured section (13b) with a preferably reduced outer diameter, which is designed for position-dependent interaction with the contact head (3) such that, upon further spring compression of the contact head (3) after the distal section (13a), the contoured section (13b) engages in the central opening section (14) and, in the process, preferably uniformly narrows the partial segments (5a, 5b, 5c, 5d) of the contact head (3) radially. Test pin according to claim 8 or 9, characterized in that the sleeve-like base body (1) has a central guide section (17) in which the pin element (13) and, surrounding it, the preferably single spring element (11) of the test pin (10) are arranged to extend axially. Test pin according to one of claims 1 to 7, characterized in that the contact head (3) is designed for position-dependent interaction with a distal opening (14a) and / or with an inner circumferential surface (14b) of a preferably hollow-cylindrical guide element (14) arranged on the base body (1), such that when the contact head (3) is deflected in a contact position of the test pin (10), the opening (14a) and / or the inner circumferential surface (14b) preferably uniformly radially narrows the sub-segments (5a, 5b, 5c, 5d) of the contact head (3). Test pin according to claim 11, characterized in that the preferably hollow-cylindrical guide element (14) is mounted for axial movement on the base body (1) and / or on the contact head (3) by means of a second spring element (15), which is preferably designed as an exponential spring.Test pin according to one of claims 1 to 5, characterized in that the contact head (3) is formed integrally on the contact side (2a) of the base body (1). Test pin according to one of the preceding claims, characterized in that the cutting elements (6a, 6b, 6c, 6d) of the contact head (3) are designed to at least partially cut into and / or scratch a preferably planar and / or passive surface (21) of the contact partner (20). Test pin according to one of the preceding claims, characterized in that the cutting elements (6a, 6b, 6c, 6d) have a cutting edge (16a) extending radially outwards in an axial plan view and / or a cutting edge (16b) arranged tangentially on the circumferential side. Test pin according to one of the preceding claims, characterized in that each sub-segment (5a, 5b, 5c, 5d) of the contact head (3) has a plurality of cutting elements.

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