Devices and methods for aligning survey measurements

GB2632263APending Publication Date: 2025-02-053D TECH LTD

Patent Information

Application Number
GB2023011646
Authority / Receiving Office
GB · GB
Patent Type
Applications
Current Assignee / Owner
Filing Date
2023-07-28
Publication Date
2025-02-05

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Abstract

A method of initialising axes for a local coordinate system, wherein a first and second axis pass through first and second survey positions (of a survey measuring device) respectively. The survey measuring device includes motion sensors. The axes may be orthogonal and locally level. The origin of the local coordinate system is determined to be the point at which the first and second axes intersect. After the first and second axes are determined, the measuring device may be moved to a further location to take one or more survey measurements, for example to measure a feature of the built or natural environments. The further location is determined relative to the first and second axes. The survey measurements are thereby positioned in the local coordinate system. The first and second axes may each be coincident with orthogonal elements of a feature, such as walls of building.
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Citation Information

Patent Citations

  • Tilt analysis system, tilt analysis method, storage medium storing tilt analysis program, and survey target device

    US20220155068A1

Cited By

  • Devices and methods for aligning survey measurements

    GB2704596A