Distance information acquisition device, and distance information acquisition method

Abstract

To provide a distance information acquisition device that can acquire more precise distance information by reducing an impact of noise.SOLUTION: A distance information acquisition device has: a light reception unit that has a photoelectronic conversion unit, and detects pulse light emitted from a light emitting unit and reflected by an object present in a measurement object area; and a signal processing unit that acquires information on a distance to the object on the basis of information detected by the light reception unit. The light reception unit has a counting unit that counts the number of pieces of pulse light reflected by the object and incident to the light reception unit, and the counting unit is configured to: count the number of pieces of pulse light in each of a plurality of determined distance ranges according to a time until the pulse light is detected by the light reception unit since the pulse light is emitted from the light emitting unit; and output one bit signal representing the detection of the pulse light when a count value of the pulse light is more than or equal to a prescribed value being 2 or more.SELECTED DRAWING: Figure 4

Description

[Technical field]

[0001] The present invention relates to a distance information acquisition device and a distance information acquisition method. [Background technology]

[0002] One known distance measurement method for measuring the distance to an object using light is the time of flight (TOF) method. The TOF method measures the distance to an object based on the time from when light is emitted toward the object to when the light reflected by the object is detected. Patent Document 1 describes a distance measurement device that applies the TOF method to a photon detection sensor using a SPAD (Single Photon Avalanche Diode) element to measure the distance to an object.

[0003] In the distance measurement method described in Patent Document 1, a short-pulse laser beam that is repeatedly emitted at a predetermined frequency is irradiated toward an object, and the irradiation of the laser beam and the detection by the SPAD sensor are synchronized to detect the reflected light from the object. That is, a specific exposure period (hereinafter referred to as a gating period) is set in the SPAD sensor in association with the emission timing of the laser beam, and photon detection is performed during the exposure period. Then, the gating period is shifted sequentially to obtain signals corresponding to each of the multiple gating periods. The results are recorded in a histogram memory, and the distance to the object is calculated from the histogram peak. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] US Patent Application Publication No. 2017 / 0052065 Summary of the Invention [Problem to be solved by the invention]

[0005] However, in the method described in Patent Document 1, if disturbance light is incident or noise occurs in the SPAD sensor during each gating period, this noise is added directly to the histogram as the original signal, which can reduce the distance measurement accuracy.

[0006] An object of the present invention is to provide a distance information acquisition device and a distance information acquisition method that can reduce the influence of noise and acquire more accurate distance information. [Means for solving the problem]

[0007] According to one disclosure of the present specification, there is provided a distance information acquisition device having a photoelectric conversion unit, a light receiving unit that detects the pulsed light emitted from a light emitting unit and reflected by an object in the measurement target area, and a signal processing unit that acquires information regarding the distance to the object based on the information detected by the light receiving unit, wherein the light receiving unit has a counting unit that counts the number of pulsed lights reflected by the object and incident on the light receiving unit, the counting unit counts the number of pulsed lights in each of a plurality of distance ranges determined according to the time from when the pulsed light is emitted from the light emitting unit to when it is detected by the light receiving unit, and is configured to output a 1-bit signal indicating that the pulsed light has been detected when the count value of the pulsed light is equal to or greater than a predetermined value of 2 or more.

[0008] Furthermore, according to another disclosure of the present specification, there is provided a photoelectric conversion device comprising: a photoelectric conversion unit having a photoelectric conversion element and outputting a pulse signal in response to incidence of a photon; and a counting unit which counts the number of the pulse signals output from the photoelectric conversion unit, wherein the counting unit is configured to output a 1-bit signal indicating that the pulse signal has been received when the count value of the pulse signal is equal to or greater than a predetermined value which is equal to or greater than 2.

[0009] Furthermore, according to yet another disclosure of the present specification, there is provided a distance information acquisition method for acquiring distance information regarding an object based on the timing of detecting light irradiated onto the object, the distance information acquisition method comprising: irradiating a measurement target area with pulsed light; detecting the pulsed light reflected by the object in the measurement target area; counting the number of pulsed lights in each of a plurality of distance ranges determined according to the time from when the pulsed light is emitted to when it is detected; outputting a one-bit signal indicating that the pulsed light has been detected when the count value of the pulsed light is equal to or greater than a predetermined value of two or more; accumulating the values ​​of the multiple one-bit signals for each corresponding distance range to calculate a multi-bit signal; and determining the distance range with the largest value of the multi-bit signal as the distance measurement result for the object. Effect of the Invention

[0010] According to the present invention, in a distance information acquisition device and a distance information acquisition method for measuring the distance to an object using light, it is possible to reduce the influence of noise and acquire more accurate distance information. [Brief description of the drawings]

[0011] [Figure 1] 1 is a block diagram showing a schematic configuration of a distance information acquisition device according to a first embodiment of the present invention. [Diagram 2] 1 is an equivalent circuit diagram showing an example of the configuration of a pixel in a distance information acquisition device according to a first embodiment of the present invention. [Diagram 3] 3A to 3C are diagrams illustrating a basic operation of a photoelectric conversion element in the distance information acquisition device according to the first embodiment of the present invention. [Figure 4] 3A and 3B are diagrams illustrating an example of the configuration and operation of a counter in the distance information acquisition device according to the first embodiment of the present invention. [Diagram 5] 3 is a diagram showing an example of a configuration of a distance measurement frame in the distance information acquisition method according to the first embodiment of the present invention. FIG. [Figure 6] 1 is a diagram illustrating an overview of a distance information acquisition method in a distance information acquisition device according to a first embodiment of the present invention. FIG. [Figure 7]FIG. 2 is a flow diagram showing a distance information acquisition method according to the first embodiment of the present invention. [Figure 8] FIG. 11 is a diagram (part 1) showing an example of histogram information indicating the frequency for each measurement target distance range. [Figure 9] FIG. 2 is a diagram (part 2) showing an example of histogram information indicating the frequency for each measurement target distance range. [Figure 10] 13 is a diagram showing an example of a configuration of a distance measurement frame in a distance information acquisition method according to a second embodiment of the present invention. FIG. [Figure 11] FIG. 11 is a diagram showing an example of the configuration of a moving body according to a third embodiment of the present invention. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0012] [First embodiment] A distance information acquisition device and a distance information acquisition method according to a first embodiment of the present invention will be described with reference to Figs. 1 to 9. Fig. 1 is a block diagram showing a schematic configuration of the distance information acquisition device according to this embodiment. Fig. 2 is an equivalent circuit diagram showing an example of the configuration of a pixel in the distance information acquisition device according to this embodiment. Fig. 3 is a diagram explaining the basic operation of a photoelectric conversion element in the distance information acquisition device according to this embodiment. Fig. 4 is a diagram explaining an example of the configuration and operation of a counter in the distance information acquisition device according to this embodiment. Fig. 5 is a diagram showing an example of the configuration of a ranging frame in the distance information acquisition method according to this embodiment. Fig. 6 is a diagram explaining an overview of the method for acquiring distance information in the distance information acquisition device according to this embodiment. Fig. 7 is a flow diagram showing the distance information acquisition method according to this embodiment. Figs. 8 and 9 are diagrams showing examples of histogram information showing the frequency for each measurement target distance range.

[0013] First, a schematic configuration of the distance information acquisition device according to this embodiment will be described with reference to Fig. 1. As shown in Fig. 1, the distance information acquisition device 100 according to this embodiment includes a light source device 10, a light detection device 20, and an arithmetic processing device 70. The light source device 10 includes a pulsed light source 12 and a light source control unit 14. The light detection device 20 includes a light receiving unit 30, a gate signal generation unit 40, a signal processing unit 50, and a control unit 60. The signal processing unit 50 includes a microframe acquisition unit 52, a microframe addition unit 54, and a subframe output unit 56. The arithmetic processing device 70 includes a subframe storage unit 72 and a distance image generation unit 74.

[0014] The pulsed light source 12 is connected to the light source control unit 14. The light receiving unit 30 is connected to the microframe acquisition unit 52 and the gate signal generation unit 40. The microframe acquisition unit 52 is connected to the microframe adder unit 54. The microframe adder unit 54 is connected to the subframe output unit 56. The control unit 60 is connected to the light source control unit 14, the gate signal generation unit 40 and the signal processing unit 50. The subframe storage unit 72 is connected to the subframe output unit 56. The distance image generation unit 74 is connected to the subframe storage unit 72.

[0015] The pulse light source 12 is a light source (light emitting unit) for irradiating a measurement target area with pulse light (irradiation light 16). The light source control unit 14 is a control circuit for controlling the light emission timing of the pulse light source 12. The light source control unit 14 may be a direct modulation type that modulates the irradiation light 16 by controlling a current supplied to a light emitting element of the pulse light source 12, or may be an external modulation type that modulates light emitted from the light emitting element by an optical chopper or a modulation element to produce the irradiation light 16. In the former case, an element capable of high-speed modulation, such as an LED (Light Emitting Diode) or an LD (Laser Diode), can be applied as the light emitting element constituting the pulse light source 12. The light emitting element may be a VCSEL (Vertical Cavity Surface Emitting Laser) or a surface light emitting element in which the VCSEL is arranged in an array.

[0016] The light receiving unit 30 has one or more light receiving elements (not shown) and serves to detect light from the measurement target area. The light detected by the light receiving unit 30 includes light (reflected light 18) reflected by the object 110 in the measurement target area out of the irradiation light 16 emitted from the light source device 10. The light receiving elements constituting the light receiving unit 30 are configured to output a signal according to the amount of light incident during a predetermined detection period (exposure period) according to a control signal from the outside (gate signal generating unit 40). The light receiving element is not particularly limited as long as it can selectively execute a light detection period and a stop period according to a control signal from the outside and can output a signal according to the amount of light detected during each detection period after the detection period. Examples of light receiving elements that can have such a function include a CMOS (Complementary Metal-Oxide-Semiconductor) sensor and a SPAD (Single Photon Avalanche Diode) sensor. If the light receiving unit 30 is configured by a photoelectric conversion device in which pixel circuits including light receiving elements are arranged two-dimensionally, a two-dimensional distance image can be obtained. In the following explanation, the light receiving unit 30 is assumed to be an image sensor using a SPAD.

[0017] The gate signal generating unit 40 is a control circuit that outputs a control signal that controls the drive timing of the light receiving unit 30. Specifically, the gate signal generating unit 40 generates a control signal for controlling the light receiving unit 30 to output a signal according to the amount of light incident on the light receiving element during a predetermined exposure period in response to a control signal from the control unit 60, and outputs the generated control signal to the light receiving unit 30. In this specification, the control signal supplied from the gate signal generating unit 40 to the light receiving unit 30 in order to control the exposure period in the light receiving unit 30 is referred to as a gate signal.

[0018] The control unit 60 is also connected to the light source device 10, and is configured to control the exposure period of the light receiving unit 30 in synchronization with the light emission control timing of the light source device 10. This enables imaging in which the time difference between the time when light is emitted from the pulse light source 12 and the time when light is received by the light receiving unit 30 is controlled. In this embodiment, the gate signal generation unit 40 drives the light receiving unit 30 with a global gate. The global gate drive is a driving method in which imaging is performed simultaneously in the same exposure period for all pixels of the light receiving unit 30, based on the emission time of the pulse light from the pulse light source 12. In the global gate drive of this embodiment, imaging is performed repeatedly while sequentially shifting the collective exposure timing of all pixels.

[0019] The signal processing unit 50 has a role of performing predetermined signal processing on the signal output from the light receiving unit 30 and acquiring information on the distance to the object 110. The arithmetic processing device 70 has a role of generating a distance image based on the signal output from the light detection device 20. The arithmetic processing device 70 may be a computer including a processor operating as a distance image generating unit 74 and a memory operating as a subframe storage unit 72. The specific configurations and operations of the signal processing unit 50 and the arithmetic processing device 70 will be described later.

[0020] The distance information acquisition device 100 of this embodiment is a device that outputs a distance image by two-dimensionally measuring the distance to a plurality of points of an object 110 that exists within a predetermined distance measurement range. The distance information acquisition device 100 measures the time difference between when light emitted from the light source device 10 is reflected by the object 110 and when it is received by the light detection device 20. Then, the distance information acquisition device 100 calculates the distance from the distance information acquisition device to the object 110 from the measured time difference. Such a distance measurement method is called a TOF method.

[0021] Next, a configuration example of the light receiving unit 30 in the distance information acquisition device according to the present embodiment will be described with reference to Figures 2 to 4. Note that, although the light receiving unit 30 will be described here using a SPAD image sensor as an example, the sensor constituting the light receiving unit 30 is not limited to a SPAD image sensor.

[0022] The light receiving section 30 has a plurality of pixels 32 arranged two-dimensionally to form a plurality of rows and a plurality of columns. Each pixel 32 may be composed of a photoelectric conversion element PD, a quenching element 34, a waveform shaping circuit LC1, a gating circuit LC2, a counter 36, and a pixel output circuit 38, as shown in Fig. 2, for example. The photoelectric conversion element PD, the quenching element 34, and the waveform shaping circuit LC1 function as a photoelectric conversion section that outputs a pulse signal in response to the incidence of light.

[0023] The photoelectric conversion element PD may be an avalanche photodiode (hereinafter, referred to as "APD"). The anode of the APD constituting the photoelectric conversion element PD is connected to a node to which a voltage VL is supplied. The cathode of the APD constituting the photoelectric conversion element PD is connected to one terminal of the quench element 34. The other terminal of the quench element 34 is connected to a node to which a voltage VH higher than the voltage VL is supplied. The voltages VL and VH are set so that a reverse bias voltage sufficient for the APD to perform an avalanche multiplication operation is applied. In one example, a negative high voltage is applied as the voltage VL, and a positive voltage approximately equal to the power supply voltage is applied as the voltage VH. For example, the voltage VL is -30V, and the voltage VH is 1V.

[0024] The photoelectric conversion element PD may be constituted by an APD as described above. By supplying the APD with a reverse bias voltage sufficient for avalanche multiplication, the charge generated by the incidence of light on the APD undergoes avalanche multiplication, generating an avalanche current. There are two operation modes when the APD is supplied with a reverse bias voltage: Geiger mode and linear mode. The Geiger mode is an operation mode in which the voltage applied between the anode and cathode is a reverse bias voltage greater than the breakdown voltage of the APD. The linear mode is an operation mode in which the voltage applied between the anode and cathode is a reverse bias voltage close to or less than the breakdown voltage of the APD. An APD operated in the Geiger mode is called a SPAD. The APD constituting the photoelectric conversion element PD may be operated in either the linear mode or the Geiger mode.

[0025] The quench element 34 has a function of converting a change in avalanche current generated in the photoelectric conversion element PD into a voltage signal. The quench element 34 also functions as a load circuit (quench circuit) during signal multiplication by avalanche multiplication, and has a function of reducing the voltage applied to the photoelectric conversion element PD to suppress avalanche multiplication. The operation of the quench element 34 to suppress avalanche multiplication is called a quench operation. The quench element 34 also has a function of returning the voltage supplied to the photoelectric conversion element PD to the voltage VH by flowing a current equivalent to the voltage drop caused by the quench operation. The operation of the quench element 34 to return the voltage supplied to the photoelectric conversion element PD to the voltage VH is called a recharge operation. The quench element 34 can be configured of a resistor element, a MOS transistor, or the like.

[0026] The waveform shaping circuit LC1 has an input node connected to the connection node between the photoelectric conversion element PD and the quench element 34, and an output node. The waveform shaping circuit LC1 functions as a waveform shaping unit that converts the analog signal supplied from the photoelectric conversion element PD into a pulse signal. The waveform shaping circuit LC1 can be configured with logic circuits including a NOT circuit (inverter circuit), a NOR circuit, a NAND circuit, etc.

[0027] The gating circuit LC2 has two input nodes and an output node. One of the input nodes of the gating circuit LC2 is connected to the output node of the waveform shaping circuit LC1. The other input node of the gating circuit LC2 is supplied with a gate signal PGATE from the gate signal generating unit 40. The output node of the gating circuit LC2 is connected to the counter 36. The gating circuit LC2 is configured to output the output signal of the waveform shaping circuit LC1 to the counter 36 when the gate signal PGATE is at a high level. The gating circuit LC2 can be configured by a two-input AND circuit, for example, as shown in FIG. 2.

[0028] The counter 36 has a function as a counting unit that counts the number of pulsed lights reflected by the object 110 and incident on the light receiving unit 30. The counter 36 has an input node to which an output signal of the gating circuit LC2 is input, an input node to which a reset signal PRES for resetting the counter 36 is input, an input node to which a clock signal CLK is input, and an output node. The counter 36 counts the number of pulses superimposed on the signal output from the gating circuit LC2 and has a function of a 1-bit memory that holds a 1-bit signal according to the counting result. Specifically, the counter 36 holds a value of 0 when the number of pulses input after resetting is less than a predetermined value of 2 or more, and holds a value of 1 when the number of pulses input after resetting is equal to or greater than a predetermined value of 2 or more. In this embodiment, the 1-bit signal of value 1 is used as a criterion for determining that pulsed light has been detected. The output node of the counter 36 is connected to an output line DOUT via a pixel output circuit 38.

[0029] The pixel output circuit 38 has a function of switching the electrical connection state (connected or disconnected) between the counter 36 and the output line DOUT. The pixel output circuit 38 switches the connection state between the counter 36 and the output line DOUT in response to a control signal PSEL from the gate signal generating unit 40 or the control unit 60. The pixel output circuit 38 may include a buffer circuit for outputting a signal.

[0030] At least some of the functions of the microframe acquisition section 52, the microframe addition section 54, and the subframe output section 56 may be provided in each of the multiple pixels 32 that make up the light receiving section 30.

[0031] Next, the basic operation of the photoelectric conversion unit of pixel 32 will be described with reference to Fig. 3. Fig. 3(a) is an equivalent circuit diagram of the photoelectric conversion unit, Fig. 3(b) shows the waveform of a signal at the input node (node ​​A) of waveform shaping circuit LC1, and Fig. 3(c) shows the waveform of a signal at the output node (node ​​B) of waveform shaping circuit LC1.

[0032] At time t0, a reverse bias voltage with a potential difference equivalent to (VH-VL) is applied to the photoelectric conversion element PD. A reverse bias voltage sufficient to cause avalanche multiplication is applied between the anode and cathode of the APD that constitutes the photoelectric conversion element PD, but in a state in which no photons are incident on the photoelectric conversion element PD, there are no carriers that serve as the seeds of avalanche multiplication. Therefore, avalanche multiplication does not occur in the photoelectric conversion element PD, and no current flows through the photoelectric conversion element PD.

[0033] At the next time t1, a photon is incident on the photoelectric conversion element PD. When a photon is incident on the photoelectric conversion element PD, electron-hole pairs are generated by photoelectric conversion, and avalanche multiplication occurs with these carriers as seeds, causing an avalanche multiplication current to flow through the photoelectric conversion element PD. This avalanche multiplication current flows through the quench element 34, causing a voltage drop across the quench element 34, and the voltage at node A begins to drop. When the amount of voltage drop at node A becomes large and the avalanche multiplication stops at time t3, the voltage level at node A no longer drops.

[0034] When the avalanche multiplication in the photoelectric conversion element PD stops, a current that compensates for the voltage drop flows from the node to which the voltage VL is supplied to the node A via the photoelectric conversion element PD, and the voltage of the node A gradually increases. After that, at time t5, the node A is stabilized to the original voltage level.

[0035] The waveform shaping circuit LC1 binarizes the signal input from node A according to a predetermined judgment threshold and outputs it from node B. Specifically, the waveform shaping circuit LC1 outputs a low-level signal from node B when the voltage level of node A exceeds the judgment threshold, and outputs a high-level signal from node B when the voltage level of node A is equal to or lower than the judgment threshold. For example, as shown in FIG. 3(b), assume that the voltage of node A is equal to or lower than the judgment threshold during the period from time t2 to time t4. In this case, as shown in FIG. 3(c), the signal level at node B is low during the period from time t0 to time t2 and the period from time t4 to time t5, and is high during the period from time t2 to time t4.

[0036] In this way, the analog signal input from node A is shaped into a digital signal by the waveform shaping circuit LC1. The pulse signal output from the waveform shaping circuit LC1 in response to a photon being incident on the photoelectric conversion element PD is the photon detection pulse signal.

[0037] Next, a configuration example and operation of the counter 36 will be described with reference to Fig. 4. Fig. 4(a) is an equivalent circuit diagram of the counter 36, and Fig. 4(b) is a timing chart showing the operation of the counter 36.

[0038] The counter 36 may be configured by a sequential circuit including flip-flops FF1, FF2, and FF3 and a logic circuit LC3, as shown in FIG. 4(a), for example. The flip-flops FF1 and FF3 may be RS flip-flops, and the flip-flop FF2 may be a D flip-flop. The RS flip-flop has two input nodes (S terminal and R terminal) and two output nodes (Q terminal and Qb terminal). The D flip-flop has two input nodes (D terminal and CK terminal) and two output nodes (Q terminal and Qb terminal). The logic circuit LC3 may be a two-input AND circuit.

[0039] The S terminal of the flip-flop FF1 is connected to the output node of the gating circuit LC2. The S terminal of the flip-flop FF1 receives the signal C_IN, which is the output signal of the gating circuit LC2, and the R terminal of the flip-flop FF1 receives the reset signal PRES. The Q terminal of the flip-flop FF1 is connected to the D terminal of the flip-flop FF2. The D terminal of the flip-flop FF2 receives the output signal Q of the flip-flop FF1, and the CK terminal of the flip-flop FF2 receives the clock signal CLK. One input node of the logic circuit LC3 is connected to the output node of the gating circuit LC2, and the other input node of the logic circuit LC3 is connected to the Q terminal of the flip-flop FF2. The signal C_IN and the output signal Q of the flip-flop FF2 are input to the logic circuit LC3. The output node of the logic circuit LC3 is connected to the S terminal of the flip-flop FF3. The output signal of the logic circuit LC3 is input to the S terminal of the flip-flop FF3, and the reset signal PRES is input to the R terminal of the flip-flop FF3. The signal output from the Q terminal of the flip-flop FF3 is the signal C_OUT, which is the output signal of the counter 36.

[0040] In a reset state in response to the reset signal PRES, the output signals Q of the flip-flops FF1, FF2, and FF3 are all assumed to be 0. In this state, as shown in FIG 4(b), it is assumed that the signal C_IN transitions to a high level at times t1, t3, t5, and t7, and the clock signal CLK transitions to a high level at times t2, t4, t6, and t8.

[0041] When the signal C_IN goes high at time t1, flip-flop FF1 receives a high-level input to its S terminal and enters a set state, causing its output signal Q to go high. The high-level signal C_IN is also input to one input node of logic circuit LC3, but the other input node of logic circuit LC3 is at a low level due to the output signal Q of flip-flop FF2, and the S terminal of flip-flop FF3 is at a low level. As a result, the output signal Q of flip-flop FF3, i.e., the signal C_OUT, is at a low level (value 0).

[0042] When the clock signal CLK goes high at time t2, the output signal Q of the flip-flop FF2 goes high in response to a high-level input to terminal D. At this time, the signal C_IN is at a low level, and the signal C_OUT remains at a low level.

[0043] When the signal C_IN goes high at time t3, the output of the logic circuit LC3 goes high in response to the high-level signal C_IN and the high-level output signal Q. As a result, the flip-flop FF3 receives a high-level input to its S terminal and goes to a set state, and the output signal Q goes high. That is, the signal C_OUT transitions from a low level (value 0) to a high level (value 1).

[0044] After that, even if the signal C_IN and the clock signal CLK transition to a high level during the period from time t4 to t8, the states of the flip-flops FF1, FF2, and FF3 do not change, and therefore the signal level of the signal C_OUT does not change.

[0045] That is, counter 36 in Fig. 4(a) constitutes a 1-bit counter whose value is 0 when the number of pulses superimposed on signal C_IN and input is less than 2, and whose value is 1 when the number of pulses superimposed on signal C_IN and input is 2 or more. Note that in the configuration example in Fig. 4(a), the threshold value for the number of pulses at which the level of signal C_OUT transitions is set to 2, but the threshold value can be set to any value equal to or greater than 2. The threshold value of counter 36 can be changed, for example, by increasing the number of stages of the flip-flop.

[0046] After the count value of the counter 36 transitions to 1, the state of the counter 36 does not change. Therefore, the output signal Q of the flip-flop FF3 or its inverted signal Qb may be fed back to the quench element 34 to control the photoelectric conversion element PD so that the avalanche multiplication operation does not occur after the count value transitions to 1. With this configuration, power consumption can be reduced.

[0047] The counter 36 can be configured using an N-ary counter circuit, in addition to the sequential circuit shown in Fig. 4. Here, N is the threshold value of the number of pulses at which the level of the signal C_OUT transitions. By setting the input of the N-ary counter to the signal C_IN and the second digit value of the N-ary counter to the signal C_OUT, when the number of input pulses reaches N, a carry occurs and the second digit value becomes 1. Thereafter, by keeping the second digit value at 1, it is possible to realize the same operation as the sequential circuit of Fig. 4.

[0048] Next, the configurations of the ranging frames, subframes, and microframes used to generate a distance image in the distance information acquisition device 100 of this embodiment will be described with reference to Fig. 5. In the upper part of Fig. 5, the acquisition periods of the ranging frames corresponding to the distance image, the subframes used to generate the ranging frames, and the microframes used to generate the subframes are diagrammatically shown by arranging blocks horizontally. The horizontal direction in Fig. 5 indicates the passage of time, and one block indicates the acquisition period of one ranging frame, subframe, or microframe.

[0049] The ranging frame F1 corresponds to one distance image. That is, the ranging frame F1 has information corresponding to the distance to the object 110, calculated from the time difference between when light is emitted and when it is received, for each of the pixels 32 constituting the light receiving section 30. In this embodiment, it is assumed that the distance image is acquired as a video, and one ranging frame F1 is repeatedly acquired every time one ranging frame period T1 elapses. FIG. 5 shows a first ranging frame and the subsequent second ranging frame out of the multiple consecutive ranging frames F1.

[0050] One ranging frame F1 is generated from multiple subframes F2. One ranging frame period T1 includes multiple subframe periods T2. Acquisition of one subframe F2 is repeated every time one subframe period T2 elapses. The subframe F2 is composed of a multi-bit signal corresponding to the amount of light detected during the subframe period T2. Note that the number of subframes F2 constituting one ranging frame F1 is not particularly limited.

[0051] One subframe F2 is generated from multiple microframes F3. One subframe period T2 includes multiple microframe periods T3. One microframe F3 is repeatedly acquired every time one microframe period T3 elapses. The microframe F3 is composed of a 1-bit signal indicating the presence or absence of incident light to the photoelectric conversion element in the microframe period T3. One subframe F2 of a multi-bit signal is generated by adding and combining multiple microframes of 1-bit signals. As a result, one subframe F2 can include a multi-bit signal corresponding to the number of microframes in which incident light is detected within the subframe period T2. The number of microframes F3 constituting one subframe F2 is not particularly limited.

[0052] The lower part of Fig. 5 shows an outline of the operation of the distance information acquisition device 100 in the microframe F3. The light emission control signal is a control signal output from the light source control unit 14 to the pulsed light source 12, and a high-level period indicates that the pulsed light source 12 is emitting light. The gate signal PGATE is a control signal output from the gate signal generation unit 40 to each pixel 32 of the light receiving unit 30, and a high-level period indicates that the pixel 32 is capable of detecting light.

[0053] The light emission control signal is controlled so as to periodically go to high level at a constant cycle T during the microframe period T3. The pulsed light source 12 is in a state of outputting irradiated light 16 while it is receiving a high-level light emission control signal, and is in a state of not outputting irradiated light 16 while it is receiving a low-level light emission control signal. The relationship between the signal level of the light emission control signal and the on / off operation of the pulsed light source 12 can be set arbitrarily.

[0054] The gate signal PGATE is set to a predetermined time (delay time: t D ) to become high level. The period when the gate signal PGATE is at a high level corresponds to the period when the light receiving unit 30 is controlled to be in a state where light can be detected, and the period when the gate signal PGATE is at a low level corresponds to the period when the light receiving unit 30 is controlled to be in a stopped state where light cannot be detected. The gate signal PGATE is generated in the gate signal generating unit 40, and is generated by the control unit 60 at a timing synchronized with the light emission control signal so that it has a predetermined delay time with respect to the light emission control signal. The delay time of the gate signal PGATE with respect to the light emission control signal is set to a different time for each subframe F2. The relationship between the signal level of the gate signal PGATE and the operation of the light receiving unit 30 can be set arbitrarily.

[0055] Each pixel 32 constituting the light receiving unit 30 is in a state in which light can be detected (ON) while the gate signal PGATE is at a high level, and is in a stopped state in which light is not detected while the gate signal PGATE is at a low level. Each pixel 32 is configured to output a 1-bit signal indicating the data held by the counter 36 to the microframe acquisition unit 52 after the microframe period T3 has elapsed.

[0056] The relationship between the light emission control signal and the gate signal PGATE will be described in more detail with reference to Fig. 6. Here, as shown in Fig. 6, it is assumed that an area X having a distance L from the light source device 10 and a thickness LX in the depth direction is included in a measurement target area 80, which is an irradiation area of ​​the light (irradiation light 16) emitted from the light source device 10. In this case, the optical path length of the reflected light 18 (solid line in the figure) emitted from the light source device 10, reflected at the position of the surface of the area X on the side of the light source device 10 and the light receiving unit 30, and reaching the light receiving unit 30 is 2L. On the other hand, the optical path length of the reflected light 18 (broken line in the figure) emitted from the light source device 10, reflected at the position of the surface of the area X on the opposite side of the light source device 10 and the light receiving unit 30, and reaching the light receiving unit 30 is 2(L+LX). Due to this difference in optical path length, a time difference occurs between the timing at which light reflected at a position on the side of the light source device 10 and the light receiving unit 30 in region X reaches the light receiving unit 30 and the timing at which light reflected at a position on the opposite side of region X from the light source device 10 and the light receiving unit 30 reaches the light receiving unit 30. This time difference can be expressed as 2LX / c, where c is the speed of light.

[0057] By setting the light receiving unit 30 to a detection period only for a period corresponding to this time difference, it is possible to selectively obtain information on the measurement target located in region X of the measurement target region 80. That is, the time from when the light emission control signal becomes high level to when the gate signal PGATE becomes high level in Fig. 5 is set to a time corresponding to a distance of 2L, and the time width of the gate signal PGATE is set to a time corresponding to a distance of 2LX. By setting the detection period of the light receiving unit 30 in this manner, it is possible to obtain a microframe F3 including information on the measurement target located in region X.

[0058] Here, if the range from distance L to thickness LX set in the detection period of the light receiving unit 30 is called the measurement target distance range, the multiple subframes F2 that make up the distance measurement frame F1 have different measurement target distance ranges. The multiple microframes F3 that make up one subframe F2 have the same measurement target distance range. If the period during which the gate signal PGATE becomes high level corresponding to the measurement target distance range is called the gating period, the multiple subframes F2 that make up the distance measurement frame F1 have different gating periods. The multiple microframes F3 that make up one subframe F2 have the same gating period.

[0059] In this embodiment, a plurality of subframes F2 are acquired while sequentially shifting the measurement target distance range. That is, the detection period during which the light receiving unit 30 is allowed to detect the pulsed light is sequentially switched to detect the pulsed light corresponding to each of the plurality of measurement target distance ranges constituting the measurement target area in a time-division manner. With this configuration, it is possible to obtain a distribution of the signal value of the subframe F2 with respect to the measurement target distance. Since the measurement target distance range in which the signal value is maximum is estimated to be the area in which the object 110 reflecting the irradiation light 16 exists, it is possible to calculate the distance from the measurement target distance range in which the signal value is maximum to the object 110. In addition, a distance image can be generated by calculating the distance for each pixel and acquiring a two-dimensional distribution of the distance.

[0060] Next, a method for driving the distance information acquisition device according to this embodiment will be described with reference to Fig. 7. Fig. 7 shows an example of a driving method for acquiring ranging frames, subframes, and microframes as shown in Fig. 5. Fig. 7 shows a method for driving the distance information acquisition device in one ranging frame period T1.

[0061] In the flowchart shown in Fig. 7, a series of processes from "START" to "END" indicates processes performed in a ranging frame period T1 in which one ranging frame F1 is acquired in Fig. 5. One cycle of processes in the loop from step S102 to step S108 indicates processes performed in a sub-frame period T2 in which one sub-frame F2 is acquired in Fig. 5. One cycle of processes in the loop from step S103 to step S105 indicates processes performed in a micro-frame period T3 in which one micro-frame F3 is acquired in Fig. 5.

[0062] First, in step S101, the control unit 60 sets an initial value of the gating period in the gate signal generating unit 40. The initial value of the gating period is not particularly limited, and can be set to, for example, a gating period corresponding to a measurement target area range that is closest to the distance information acquisition device 100 among a plurality of measurement target distance ranges set in the measurement target area.

[0063] Next, in step S102, the control unit 60 initializes a flag variable i used to count the number of microframes F3 constituting one subframe F2 to 1. It is assumed that the number of microframes F3 constituting one subframe F2 is N (for example, 64).

[0064] Next, in step S103, a microframe is acquired. The control unit 60 controls the pulse light source 12 via the light source control unit 14 to emit pulse light to the measurement target area. The control unit 60 also controls the light receiving unit 30 in synchronization with this to start imaging by global gate driving. At this time, the gate signal generation unit 40 outputs a gate signal PGATE corresponding to the set gating period to the light receiving unit 30. The light receiving unit 30 acquires information on the measurement target distance range corresponding to the gating period. After a predetermined microframe period T3 has elapsed, the microframe acquisition unit 52 reads out a microframe consisting of a 1-bit signal held by the counter 36 from each pixel 32 of the light receiving unit 30. In this way, the microframe acquisition unit 52 functions as an acquisition unit that acquires a microframe consisting of a 1-bit signal based on the incident light to the photoelectric conversion element.

[0065] The microframes read from the light receiving unit 30 are stored in the memory of the microframe adder 54. This memory has a storage capacity capable of storing multiple bits of data for each pixel. Each time a microframe is read, the microframe adder 54 sequentially adds the value of the microframe to the value stored in the memory and stores the result. In this way, the microframe adder 54 functions as a synthesizer that synthesizes microframes acquired during different periods.

[0066] Next, in step S104, it is determined whether the number (i) of acquired microframes has reached a predetermined value N. If the result of the determination is that the number i of acquired microframes has not reached the predetermined value N ("NO" in step S104), i is incremented by 1 in step S105, and the process returns to step S103. If the result of the determination is that the number i of acquired microframes is the predetermined value N ("YES" in step S104), the process proceeds to step S106. At this time, data (subframes) obtained by accumulating the values ​​of N microframes is held in the memory of the microframe adder 54. For example, if N is 64, 6-bit gradation data can be output.

[0067] Next, in step S106, the subframe output unit 56 reads out from the memory a subframe generated by accumulating the values ​​of the N microframes. The subframe output unit 56 converts the signal read out from the memory in accordance with an appropriate output interface standard and outputs it to the subframe storage unit 72 by serial communication. The subframe storage unit 72 stores the subframe output from the subframe output unit 56. The subframe storage unit 72 is configured to be able to store multiple subframes used to generate one ranging frame individually for each subframe period.

[0068] Next, in step S107, it is determined whether all (M) subframes corresponding to each of the measurement target distances constituting one distance measurement frame have been acquired. If the result of the determination is that all subframes constituting one distance measurement frame have not been acquired ("NO" in step S107), the gating period is shifted to a gating period corresponding to another measurement target distance range in step S108, and the process returns to step S102. For example, the measurement target distance range can be shifted sequentially from the distance closest to the distance information acquisition device 100 to the farthest side. If the result of the determination is that all subframes constituting one distance measurement frame have been acquired ("YES" in step S107), the process proceeds to step S109. At this time, the subframe storage unit 72 holds M subframes constituting one distance measurement frame.

[0069] In step S109, the distance image generating unit 74 acquires a plurality of subframes in one ranging frame period from the subframe storage unit 72. The distance image generating unit 74 extracts the subframe with the largest signal value for each pixel, and calculates the measurement target distance range corresponding to the extracted subframe. That is, the distance image generating unit 74 determines the measurement target distance range or its class value thus calculated as the distance measurement result of the object at the pixel. In this manner, the distance image generating unit 74 generates a distance image showing a two-dimensional distribution of distances. The distance image generating unit 74 outputs the generated distance image to a device external to the arithmetic processing device 70. This distance image can be used, for example, to detect the surrounding environment of the vehicle. The distance image generating unit 74 may be configured to store the distance image in an internal memory of the distance information acquisition device 100.

[0070] A single distance measurement frame consisting of M subframes can be obtained by a series of operations from step S101 to step S109. To make the distance image into a video, the operations from step S101 to step S109 can be repeated to repeatedly obtain distance measurement frames.

[0071] In this embodiment, as described above, when acquiring a microframe, the photon detection pulse signal that passes through the gating circuit LC2 during the detection period of the light receiving unit 30 is counted by the 1-bit counter 36, which becomes 1 when a pulse is received a predetermined number of times or more. The reason why the counter 36 is configured in this manner in this embodiment will be explained below.

[0072] When an object is present in a measurement target distance range corresponding to a certain gating period, if the condition is such that a large amount of reflected light is returned in response to the irradiation of the pulsed light, the reflected light should be detected multiple times if the pulsed light is irradiated multiple times during one microframe period. On the other hand, when an object is not present in a measurement target distance range corresponding to a certain gating period, the reflected light should not be detected even if the pulsed light is irradiated multiple times during one microframe period. However, in reality, in addition to the reflected light from the object, randomly generated ambient light and noise due to the SPAD element may occur, and even if an object is not present in the measurement target distance range corresponding to the gating period, a false signal may be detected randomly. In such a case, if the subframes of a certain pixel are expressed as a frequency distribution with the measurement target distance range as a class (bin), for example, as shown in FIG. 8, a false signal due to noise may be detected in bins other than bin 10 corresponding to the measurement target distance range in which an object is present.

[0073] In this embodiment, the counter 36 is configured to output 1 when a photon detection pulse signal is received a predetermined number of times or more. Therefore, even if noise is detected less than the predetermined number of times when there is no object within the measurement target distance range, the output will be 0, making it difficult for the influence of spurious signals due to noise to appear in the output. This makes it possible to obtain an output histogram with reduced influence of noise, as shown in Fig. 9, for example, and improves the detection accuracy of distance information.

[0074] Thus, according to this embodiment, in a distance information acquisition device and distance information acquisition method that use light to measure the distance to an object, the influence of noise can be reduced and more accurate distance information can be acquired.

[0075] [Second embodiment] A distance information acquisition device and a distance information acquisition method according to a second embodiment of the present invention will be described with reference to Fig. 10. Components similar to those in the distance information acquisition device according to the first embodiment are given the same reference numerals, and descriptions thereof will be omitted or simplified. Fig. 10 is a diagram showing an example of the configuration of a ranging frame in the distance information acquisition method according to this embodiment.

[0076] The distance information acquisition device and distance information acquisition method according to this embodiment are similar to those according to the first embodiment except for the definition of the microframe. The distance information acquisition device and distance information acquisition method according to this embodiment will be described below, focusing on the differences from the distance information acquisition device and distance information acquisition method according to the first embodiment, and descriptions of commonalities will be omitted as appropriate.

[0077] The configurations of the ranging frames, subframes, and microframes used to generate a distance image in the distance information acquisition device 100 of this embodiment will be described with reference to Fig. 10. The upper part of Fig. 10 shows a schematic diagram of the acquisition period of the ranging frame corresponding to the distance image, the subframes used to generate the ranging frame, and the microframes used to generate the subframes, arranged in blocks horizontally. The horizontal direction in Fig. 10 indicates the passage of time, and one block indicates the acquisition period of one ranging frame, subframe, or microframe.

[0078] The hierarchical structure of the ranging frames, subframes, and microframes in this embodiment is the same as that in the first embodiment. That is, one ranging frame F1 is generated from multiple subframes F2. One ranging frame period T1 includes multiple subframe periods T2. Also, one subframe F2 is generated from multiple microframes F3. One subframe period T2 includes multiple microframe periods T3.

[0079] The present embodiment differs from the first embodiment in the operation of the distance information acquisition device 100 in the microframe F3. That is, in the first embodiment, pulsed light is irradiated multiple times during one microframe period T3, and multiple gating periods corresponding to each of these multiple irradiations of pulsed light are set. In contrast, in the present embodiment, pulsed light is irradiated once during one microframe period T3, and one gating period corresponding to this single irradiation of pulsed light is set.

[0080] The counter 36 of each pixel 32 is a 1-bit counter that outputs a 1-bit signal according to the number of photon detection pulses output from the gating circuit LC2. The counter 36 counts the number of pulses superimposed on the signal output from the gating circuit LC2 and has a function of a 1-bit memory that holds a 1-bit signal according to the counting result. Specifically, the counter 36 holds a value of 0 when a photon detection pulse corresponding to one irradiation of pulsed light is not input, and holds a value of 1 when a photon detection pulse corresponding to one irradiation of pulsed light is input. For example, referring to the circuit diagram of FIG. 4, the output signal of the counter 36 in this embodiment may be the output signal Q of the flip-flop FF1. The output node of the counter 36 is connected to the output line DOUT via the pixel output circuit 38.

[0081] The microframe adder 54 performs addition processing on the microframes read from the light receiving unit 30 by the microframe acquisition unit 52, and functions as a 1-bit memory that holds a 1-bit signal according to the addition result. Specifically, the microframe adder 54 holds a value of 0 when the number of microframes with a value of 1 is less than a predetermined value of 2 or more, and holds a value of 1 when the number of microframes with a value of 1 is equal to or greater than a predetermined value of 2 or more. The 1-bit data obtained by adding the values ​​of N microframes is the subframe in this embodiment.

[0082] In this embodiment, it is not necessarily required to shift the gating period at the end of each subframe, and multiple subframes may be executed for each gating period.

[0083] Thus, according to this embodiment, in a distance information acquisition device and distance information acquisition method that use light to measure the distance to an object, the influence of noise can be reduced and more accurate distance information can be acquired.

[0084] [Third embodiment] A moving body according to a third embodiment of the present invention will be described with reference to Fig. 11. Fig. 11 is a diagram showing an example of the configuration of a moving body according to this embodiment.

[0085] 11(a) shows a configuration example of a device mounted on a vehicle as an on-board camera. The device 300 has a distance measurement unit 303 that measures the distance to an object, and a collision determination unit 304 that determines whether or not there is a possibility of collision based on the distance measured by the distance measurement unit 303. The distance measurement unit 303 is configured by the distance information acquisition device 100 described in the first or second embodiment. Here, the distance measurement unit 303 is an example of a distance information acquisition means that acquires distance information to the object. In other words, the distance information is information related to the distance to the object, etc.

[0086] The device 300 is connected to a vehicle information acquisition device 310 and can acquire vehicle information such as vehicle speed, yaw rate, and steering angle. In addition, the device 300 is connected to a control ECU 320, which is a control device that outputs a control signal to generate a braking force for the vehicle based on the judgment result of the collision judgment unit 304. In addition, the device 300 is also connected to an alarm device 330 that issues an alarm to the driver based on the judgment result of the collision judgment unit 304. For example, when the judgment result of the collision judgment unit 304 indicates that there is a high possibility of a collision, the control ECU 320 performs vehicle control to avoid a collision and reduce damage by applying the brakes, releasing the accelerator, suppressing engine output, etc. The alarm device 330 warns the user by sounding an alarm such as a sound, displaying alarm information on the screen of a car navigation system, etc., and applying vibrations to a seat belt or steering wheel. These devices of the device 300 function as a mobile object control unit that controls the operation of controlling the vehicle as described above.

[0087] In this embodiment, the device 300 measures distances around the vehicle, for example, in front or behind. Fig. 11(b) shows the device when measuring distances in front of the vehicle (distance measurement range 350). A vehicle information acquisition device 310, which serves as a distance measurement control means, sends an instruction to the device 300 or the distance measurement unit 303 to perform a distance measurement operation. This configuration can further improve the accuracy of distance measurement.

[0088] Although an example of control to prevent collision with other vehicles has been described here, the present invention can also be applied to control of automatic driving by following other vehicles, control of automatic driving to prevent deviation from lanes, etc. Furthermore, the device is not limited to vehicles such as automobiles, but can be applied to moving bodies (moving devices) such as ships, aircraft, artificial satellites, industrial robots, and consumer robots. In addition, the present invention can be applied to devices that use object recognition or biometric recognition, such as intelligent transport systems (ITS) and surveillance systems, in addition to moving bodies.

[0089] [Modified embodiment] The present invention is not limited to the above-described embodiment, and various modifications are possible.

[0090] For example, an example in which part of the configuration of any of the embodiments is added to another embodiment, or an example in which part of the configuration of another embodiment is substituted therefor, is also an embodiment of the present invention.

[0091] In addition, the distance information acquisition device of the first and second embodiments is configured to determine a 1-bit signal indicating the presence of an object when a photon detection pulse is detected a predetermined number of times or more during the same gating period in the measurement target distance range. However, the configuration of the present invention can be applied to distance measurement devices other than distance measurement devices that perform gating. For example, it can also be applied to a distance measurement device that uses a TDC (Time to Digital Converter) that measures the time from the timing of irradiating pulsed light to the timing of detecting the pulsed light by a photoelectric conversion element. In this case, the time from the emission of pulsed light to the detection is measured, and the pulsed light is counted as the frequency of the distance range corresponding to this time.

[0092] The configuration of the present invention can also be applied to photoelectric conversion devices other than photoelectric conversion devices intended for distance measurement, such as two-dimensional imagers, X-ray detection sensors, etc. In this case, too, the effect of noise superimposed on the output of the photoelectric conversion element can be reduced by configuring the device to output a 1-bit signal as a photon detection output signal when photons are incident on the photoelectric conversion element a predetermined number of times (two or more) during the photon counting period.

[0093] Furthermore, when acquiring a binarized (black and white) image using an X-ray sensor or the like, image information is usually acquired in multiple bits and then processed using a separate system. By applying the present invention, it is also possible to perform this binarization process inside the sensor. In this case, it is sufficient to configure the sensor to output a 1-bit detection signal when photon counting is detected two or more times within the sensor (in this case, this number becomes the binarization threshold). With this configuration, it is possible to perform high-speed binarization process inside the sensor without using a separate system outside the sensor.

[0094] The present invention can also be realized by a process in which a program for implementing one or more of the functions of the above-described embodiments is supplied to a system or device via a network or a storage medium, and one or more processors in a computer of the system or device read and execute the program. The present invention can also be realized by a circuit (e.g., ASIC) that implements one or more of the functions.

[0095] It should be noted that the above-mentioned embodiments are merely examples of the implementation of the present invention, and the technical scope of the present invention should not be interpreted as being limited by these embodiments. In other words, the present invention can be implemented in various forms without departing from its technical concept or main features.

[0096] The disclosure of the above embodiment includes the following configurations and methods. (Configuration 1) a light receiving unit having a photoelectric conversion unit and configured to detect the pulsed light emitted from the light emitting unit and reflected by an object in the measurement target area; a signal processing unit that acquires information about a distance to the object based on information detected by the light receiving unit, the light receiving unit has a counting unit that counts the number of the pulsed lights reflected by the object and incident on the light receiving unit, The counting unit is configured to count the number of the pulsed lights in each of a plurality of distance ranges determined according to the time from when the pulsed lights are emitted from the light emitting unit to when they are detected by the light receiving unit, and to output a 1-bit signal indicating that the pulsed lights have been detected when the count value of the pulsed lights is equal to or greater than a predetermined value equal to or greater than 2. A distance information acquisition device comprising: (Configuration 2) The signal processing unit has a multi-bit memory and is configured to store in the memory each of the multi-bit signals obtained by accumulating the values ​​of the multiple 1-bit signals output from the counting unit for each distance range. 2. The distance information acquisition device according to configuration 1. (Configuration 3) The signal processing unit determines the distance range in which the value of the multi-bit signal is the largest as a distance measurement result of the object. 3. The distance information acquisition device according to configuration 2. (Configuration 4) The light receiving unit is configured to detect the pulsed light corresponding to each of the plurality of distance ranges in a time-division manner by switching a detection period during which detection of the pulsed light is permitted. 4. The distance information acquisition device according to any one of configurations 1 to 3. (Configuration 5) Each of the one-bit signals constitutes a microframe, A plurality of the microframes acquired for the same distance range constitute a subframe; The subframes, which are formed by the microframes acquired for different distance ranges, constitute a distance measurement frame used to generate one distance image. 5. The distance information acquisition device according to configuration 4. (Configuration 6) each of the signals input from the photoelectric conversion unit to the count unit during the detection period constitutes a microframe; the 1-bit signal obtained by processing a plurality of the microframes acquired for the same distance range in the counting unit constitutes a subframe; The subframes obtained from the microframes acquired for different distance ranges form a ranging frame used to generate a single distance image. 5. The distance information acquisition device according to configuration 4. (Configuration 7) A distance image generating unit generates a distance image indicating the distance to the object based on the distance measurement frame. 7. The distance information acquisition device according to configuration 5 or 6. (Configuration 8) The counting unit is configured as an N-ary counter, with the predetermined value being N. 8. The distance information acquisition device according to any one of configurations 1 to 7. (Configuration 9) The photoelectric conversion unit includes a SPAD, The counting unit counts the photon detection pulses output from the photoelectric conversion unit. 9. The distance information acquisition device according to any one of configurations 1 to 8. (Configuration 10) the light receiving unit has a plurality of pixels, each of which includes the photoelectric conversion unit and the counting unit; The signal processing unit acquires information regarding a distance to the object for each of the plurality of pixels. 10. The distance information acquisition device according to any one of configurations 1 to 9. (Configuration 11) a photoelectric conversion unit having a photoelectric conversion element and outputting a pulse signal in response to incidence of a photon; a counting unit that counts the number of the pulse signals output from the photoelectric conversion unit, The count unit is configured to output a 1-bit signal representing reception of the pulse signal when the count value of the pulse signal is equal to or greater than a predetermined value equal to or greater than 2. A photoelectric conversion device comprising: (Configuration 12) a plurality of pixels each including the photoelectric conversion unit and the counting unit; The 1-bit signal is output from each of the plurality of pixels. 12. The photoelectric conversion device according to claim 11, (Configuration 13) The counting unit further includes a signal processing unit that accumulates the values ​​of the plurality of 1-bit signals output from the counting unit to generate a multi-bit signal. 12. The photoelectric conversion device according to claim 11, (Configuration 14) a plurality of pixels each including the photoelectric conversion unit and the signal processing unit; The signal processing unit accumulates values ​​of the plurality of 1-bit signals output from each of the plurality of pixels. 14. The photoelectric conversion device according to configuration 13. (Configuration 15) The photoelectric conversion unit includes a SPAD, The counting unit counts the photon detection pulses output from the photoelectric conversion unit. 15. The photoelectric conversion device according to any one of configurations 11 to 14. (Configuration 16) A mobile object, A distance information acquisition device according to any one of configurations 1 to 10, a control means for controlling the moving object based on the distance information acquired by the distance information acquisition device; A moving object comprising: (Method 1) A distance information acquisition method for acquiring distance information about an object based on a timing at which light irradiated on the object is detected, comprising: Irradiating a measurement target area with pulsed light and detecting the pulsed light reflected by the object in the measurement target area; counting the number of pulsed lights in each of a plurality of distance ranges determined according to a time from when the pulsed lights are emitted to when they are detected; outputting a one-bit signal indicating that the pulsed light has been detected when the count value of the pulsed light is equal to or greater than a predetermined value that is equal to or greater than 2; A multi-bit signal is calculated by accumulating the values ​​of the multiple 1-bit signals for each corresponding distance range, and the distance range in which the value of the multi-bit signal is the largest is determined as the distance measurement result of the object. A distance information acquisition method comprising: [Explanation of symbols]

[0097] 10...Light source device 12...Pulse light source 14...Light source control unit 20...Photodetector 30...Light receiving section 40...Gate signal generating section 50...Signal processing unit 52…Microframe acquisition section 54...Microframe addition section 56...Subframe output section 60...Control unit 70... Processing unit 72...Subframe memory section 74...Distance image generating unit 100...Distance information acquisition device

Claims

1. a light receiving unit having a photoelectric conversion unit and detecting pulsed light emitted from the light emitting unit and reflected by an object in the measurement target area; a signal processing unit that acquires information about the distance to the target object based on information detected by the light receiving unit, the light receiving unit has a counting unit that counts the number of the pulsed lights that are reflected by the object and incident on the light receiving unit, the counting unit is configured to count the number of pulsed lights in each of a plurality of distance ranges determined according to the time from when the pulsed lights are emitted from the light emitting unit to when they are detected by the light receiving unit, and to output a one-bit signal indicating that the pulsed lights have been detected when the count value of the pulsed lights is equal to or greater than a predetermined value of 2, each of the one-bit signals constitutes a microframe; a plurality of the microframes acquired over the same distance range constitute a subframe; The plurality of sub-frames, which are configured by the plurality of micro-frames acquired for mutually different distance ranges, constitute a ranging frame used to generate one distance image. A distance information acquisition device characterized by:

2. The signal processing unit has a multi-bit memory and is configured to store each of the multi-bit signals obtained by accumulating the values ​​of the plurality of 1-bit signals output from the counting unit for each distance range in the memory.

2. The distance information acquisition device according to claim 1.

3. The signal processing unit determines the distance range in which the value of the multi-bit signal is the largest as the distance measurement result of the object.

3. The distance information acquisition device according to claim 2.

4. The light receiving unit is configured to detect the pulsed light corresponding to each of the plurality of distance ranges in a time-division manner by switching a detection period during which detection of the pulsed light is permitted.

4. The distance information acquisition device according to claim 1, wherein the distance information acquisition device is a distance information acquisition device.

5. a distance image generating unit that generates a distance image indicating the distance to the object based on the distance measurement frame; 4. The distance information acquisition device according to claim 1, wherein the distance information acquisition device is a distance information acquisition device.

6. The counting unit is configured as an N-ary counter, with the predetermined value being N.

4. The distance information acquisition device according to claim 1, wherein the distance information acquisition device is a distance information acquisition device.

7. the photoelectric conversion unit includes a SPAD, The counting unit counts photon detection pulses output from the photoelectric conversion unit.

4. The distance information acquisition device according to claim 1, wherein the distance information acquisition device is a distance information acquisition device.

8. the light receiving unit has a plurality of pixels, each including the photoelectric conversion unit and the counting unit; The signal processing unit acquires information about the distance to the object for each of the plurality of pixels.

4. The distance information acquisition device according to claim 1, wherein the distance information acquisition device is a distance information acquisition device.

9. A light receiving unit having a photoelectric conversion unit and detecting pulsed light emitted from the light emitting unit and reflected by an object in the measurement target area; a signal processing unit that acquires information about the distance to the target object based on information detected by the light receiving unit, the light receiving unit has a counting unit that counts the number of the pulsed lights that are reflected by the object and incident on the light receiving unit, the counting unit is configured to count the number of pulsed lights in each of a plurality of distance ranges determined according to the time from when the pulsed lights are emitted from the light emitting unit to when they are detected by the light receiving unit, and to output a one-bit signal indicating that the pulsed lights have been detected when the count value of the pulsed lights is equal to or greater than a predetermined value of 2, the light receiving unit is configured to detect the pulsed light corresponding to each of the plurality of distance ranges in a time-division manner by switching a detection period during which detection of the pulsed light is permitted, each of the signals input from the photoelectric conversion unit to the count unit during the detection period constitutes a microframe; the 1-bit signal obtained by processing the plurality of microframes acquired for the same distance range in the counting unit constitutes a subframe; The subframes obtained from the microframes acquired for different distance ranges form a distance measurement frame used to generate one distance image. A distance information acquisition device characterized by:

10. a photoelectric conversion unit having a photoelectric conversion element and outputting a pulse signal in response to incidence of a photon; a counting unit that counts the number of the pulse signals output from the photoelectric conversion unit, The counting unit is configured to output a 1-bit signal indicating that the pulse signal has been received when the count value of the pulse signal is equal to or greater than a predetermined value of 2 or greater. A photoelectric conversion device characterized by:

11. a plurality of pixels each including the photoelectric conversion unit and the counting unit; The 1-bit signal is output from each of the plurality of pixels.

11. The photoelectric conversion device according to claim 10.

12. The counter further includes a signal processing unit that accumulates the values ​​of the plurality of 1-bit signals output from the counter unit to generate a multi-bit signal.

11. The photoelectric conversion device according to claim 10.

13. a plurality of pixels each including the photoelectric conversion unit and the signal processing unit; The signal processing unit accumulates the values ​​of the plurality of 1-bit signals output from each of the plurality of pixels.

13. The photoelectric conversion device according to claim 12.

14. the photoelectric conversion unit includes a SPAD, The counting unit counts photon detection pulses output from the photoelectric conversion unit.

14. The photoelectric conversion device according to claim 10, wherein the first and second electrodes are electrically connected to each other.

15. A mobile object, A distance information acquisition device according to any one of claims 1 to 3; a control means for controlling the moving object based on the distance information acquired by the distance information acquisition device; A moving object characterized by having:

16. A distance information acquisition method for acquiring distance information about an object based on a timing at which light irradiated onto the object is detected, comprising: Irradiating a measurement target area with pulsed light and detecting the pulsed light reflected by the object in the measurement target area; counting the number of pulsed lights in each of a plurality of distance ranges determined according to the time from when the pulsed lights are emitted until when they are detected; outputting a one-bit signal indicating that the pulsed light has been detected when the count value of the pulsed light is equal to or greater than a predetermined value of 2; The values ​​of the plurality of 1-bit signals are accumulated for each corresponding distance range to calculate a multi-bit signal, and the distance range with the largest value of the multi-bit signal is determined as the distance measurement result of the object. A distance information acquisition method comprising:

Images