System and method for efficiently transferring receptacles from a receptacle storage area - Patents.com

Abstract

The sample receptacles are automatically transferred from the first and second storage areas of the storage module to the conveyor without passing any other sample receptacles stored in the storage module. The receptacle holding locations in the first and second storage areas are arranged in rows and columns, and the sample containers are transferred row-by-row or column-by-column, starting with the sample container held closest to the first side of the first or second storage area. Receptacles transferred from the first storage area are transferred across the first side to the conveyor. Receptacles transferred from the second storage area are transferred across the first side to a first receptacle transport path between the first and second storage areas, then across the first storage area to a second receptacle transport path, and then to the conveyor.

Description

[Technical field]

[0001] Field The present disclosure relates generally to automated analytical systems and methods for analyzing liquid samples, and more particularly to a mechanized, computer-controlled system and method for automatically and efficiently transferring receptacles containing liquid samples from a storage area that stores multiple receptacles in a manner that minimizes the size of the storage area and minimizes the risk of cross-contamination between different sample receptacles stored in the storage area. [Background technology]

[0002] background Automated analytical systems for handling and analyzing various types of fluid samples (also called fluid specimens) are widely used in clinical diagnostics and medical research. A fluid sample can be any type of sample or specimen type that exists naturally as a liquid or that has been liquefied. Fluid samples can include whole blood, serum, plasma, interstitial fluid, phlegm, urine, feces, semen, mucus, sputum, saliva, tears, pus, and nasopharyngeal or urogenital specimens. Fluid samples can be obtained from a variety of sources, including animal, food, environmental, and industrial sources. Several automated analytical systems are commercially available for performing assays on fluid samples to detect and / or quantify the presence or amount of antigens, antibodies, cellular abnormalities, disease states, and / or disease-related pathogens, such as parasites, fungi, bacteria, and viruses, that may be present in the sample. For diagnostic assays, antigens or antibodies are targeted in immunoassays and nucleic acids are targeted in molecular assays. There are also automated analytical systems for performing genetic tests on biological fluids to identify genes present in the sample, for example to detect disease-related mutations.

[0003] An automated analytical system may include various stations, including sample preparation or "prep" stations and analytical stations for preparing and analyzing samples contained in sample receptacles (e.g., test tubes, vials, etc.), storage stations for holding sample receptacles before and / or after they are transported to and processed within the automated analytical system, and / or transport mechanisms for transporting sample receptacles between stations of the automated analytical system. Transport mechanisms may include robots, conveyors, and other devices for moving sample receptacles and other materials between stations. Some stations may include associated sample receptacle handling mechanisms and / or fluid handling mechanisms for manipulating sample receptacles, samples, reagent vessels, and reagents, such as robots (e.g., pick-and-place robots) and fluid aspirating and dispensing devices (e.g., robotic pipetters). For example, a receptacle storage station, or a station having receptacle storage capacity, may include a robot (e.g., a pick-and-place robot) for transporting sample receptacles between a sample receptacle holding structure (e.g., a receptacle rack) within the station and a transport mechanism located outside the station.

[0004] The components and / or stations of the automated analytical system may be controlled by a controller, including one or more computerized controllers that control the operation of each of the components or stations to integrate and coordinate the components involved in performing one or more assays on multiple samples contained in sample receptacles.

[0005] To maximize storage capacity while minimizing the size of the associated station, a sample receptacle holding structure, such as a receptacle rack, may be configured such that the sample receptacles are held as closely together as possible, with spacing between adjacent sample receptacles less than the width or diameter of an individual sample receptacle supported by the sample receptacle holding structure, in some cases. Thus, to transport a sample receptacle from a sample receptacle holding structure (e.g., a receptacle rack) within a station to a transport mechanism (e.g., a conveyor) located outside the station, the transported sample receptacle may need to pass one or more other sample receptacles supported by a receptacle holding structure. Thus, the transported sample receptacle must be raised by the robot high enough relative to the surrounding sample receptacles so as not to contact the other sample receptacles during transport. This may require the station to have a relatively large vertical dimension. Additionally, any material that may fall from the first sample receptacle into the second sample receptacle to which it is being transferred may contaminate the contents of the second sample receptacle. Summary of the Invention [Means for solving the problem]

[0006] overview The following presents a simplified summary in order to provide a basic understanding of some aspects described herein. This summary is not an extensive overview of the claimed subject matter. It is not intended to identify key or critical elements of the claimed subject matter or to delineate the scope thereof. Its sole purpose is to present some concepts in a simplified form as a prelude to the more detailed description that is presented later.

[0007] The receptacle storage module has a first side and a second side. In an embodiment, the second side of the receptacle storage module is an input side where the receptacles are placed in the receptacle storage module, and the first side is an output side where the receptacles are removed from the receptacle storage module and transferred to a receptacle holder on a conveyor track. Sample receptacles, such as liquid receptacles, are stored in the receptacle storage module in at least a first storage area adjacent the first side of the module and a second storage area adjacent the second side of the module. Each of the first storage area and the second storage area has opposing first and second sides and opposing third and fourth sides oriented transversely to the first and second sides. The first storage area and the second storage area are positioned with the first side of the second storage area facing the second side of the first storage area.

[0008] The first storage area includes a plurality of receptacle holding locations arranged in a series of parallel rows extending from a third side to a fourth side of the first storage area and a series of parallel columns extending from a first side to a second side of the first storage area. The second storage area includes a plurality of receptacle holding locations arranged in a series of parallel rows extending from a third side to a fourth side of the second storage area and a series of parallel columns extending from a first side to a second side of the second storage area. Each receptacle holding location is configured to hold one sample receptacle in an upright orientation, with a top of the sample receptacle exposed for gripping by a mechanical gripper. Each receptacle holding location in the first storage area may be spatially separated from each adjacent receptacle holding location in the first storage area by a distance less than the width of a single receptacle holding location, and each receptacle holding location in the second storage area may be spatially separated from each adjacent receptacle holding location in the second storage area by a distance less than the width of a single receptacle holding location, such that a sample receptacle cannot pass through a gap between adjacent receptacle holding locations. The second side of the first storage area is separated from the first side of the second storage area by a distance at least as wide as the width of the widest receptacle holding location in the second storage area, thereby defining a first receptacle transport path located between the second side of the first storage area and the first side of the second storage area and through which the widest sample receptacle held in the second storage area can pass without contacting or passing through a receptacle holding location adjacent to the first receptacle transport path.

[0009] A sample receptacle handling system associated with the receptacle storage module may comprise a mechanized robot including a mechanical gripper configured to grip individual sample receptacles in the receptacle-holding locations and a gripper mover configured to move the gripper vertically and in an orthogonal horizontal direction. Each receptacle-holding location is configured to hold an associated sample receptacle in an orientation that allows the sample receptacle handling system to grip and remove the receptacle from the receptacle-holding location or, if the receptacle-holding location is empty, to accept a sample receptacle placed in the receptacle-holding location by a receptacle transport device.

[0010] A portion of the first storage area or the second storage area comprising a contiguous group of receptacle-holding locations, which may comprise one or more separate receptacle racks, is designated as a STAT section for holding STAT sample receptacles.

[0011] A portion of the first storage area that does not include any of the receptacle-holding locations in the STAT section of the first storage area and that includes a contiguous group of receptacle-holding locations, which may include one or more separate receptacle racks, is designated as the isolation section. The isolation section may be initially empty, i.e., devoid of sample receptacles.

[0012] A sample receptacle is omitted from at least one row of adjacent receptacle holding locations of the first storage area that is at least as wide as the widest receptacle holding location of the second storage area, thereby defining a second receptacle transport path that extends from a first side of the first storage area to a second side of the first storage area and intersects with the first receptacle transport path. In one example, the row of empty receptacle holding locations that extends from the first side of the first storage area to the second side of the first storage area and defines the second receptacle transport path is within an isolation section of the first storage area.

[0013] In addition to the first and second receptacle storage areas, the receptacle storage module may include receptacle storage areas, e.g., a third receptacle storage area, a fourth receptacle storage area, etc. Each receptacle storage area includes a plurality of receptacle holding positions arranged in parallel rows and columns. For each receptacle storage area, a receptacle transport path extending between a third side and a fourth side is provided between each receptacle storage area and a subsequent receptacle storage area, i.e., between the first receptacle storage area and the second receptacle storage area, between the second receptacle storage area and the third receptacle storage area, between the third receptacle storage area and the fourth receptacle storage area, etc. Further, each receptacle storage area, except for the last receptacle storage area that is furthest from the first side of the receptacle storage module, includes a receptacle storage path that extends in a direction from the first side of the receptacle storage area to the second side of the receptacle storage area (i.e., parallel to or encompassing the row of receptacle holding positions in the receptacle storage area).

[0014] In one embodiment, each receptacle storage area comprises two or more receptacle racks removably supported in receptacle storage modules on a rack support platform, each rack including a plurality of receptacle holding locations arranged in rows and columns.

[0015] Each rack in the first storage area has opposing first and second sides corresponding to the first and second sides, respectively, of the first storage area, and opposing third and fourth sides oriented transversely to the first and second sides. Each rack in the second storage area has opposing first and second sides corresponding to the first and second sides, respectively, of the second storage area, and opposing third and fourth sides oriented transversely to the first and second sides.

[0016] The receptacle racks in the first storage area are arranged side by side from the third side of the first storage area to the fourth side of the first storage area, i.e., the fourth side of each receptacle rack faces, abuts, or nearly abuts the third side of each adjacent rack. The receptacle racks in the second storage area are arranged side by side from the third side of the second storage area to the fourth side of the first storage area, i.e., the fourth side of each receptacle rack faces, abuts, or nearly abuts the third side of each adjacent rack.

[0017] The STAT section may correspond to one receptacle rack in the first storage area or the second storage area, and the isolation section may correspond to a different receptacle rack in the first storage area.

[0018] The controller controls the sample receptacle handling system to remove the sample receptacles from the receptacle storage module by removing the sample receptacles, one at a time, from the receptacle holding positions of the first and second storage areas and transporting the receptacles from the storage module and to a receptacle holder on a track of the conveyor adjacent the first side of the storage module. If the receptacle storage module includes a STAT section, the sample receptacle handling system is controlled by the controller to first remove all sample receptacles held in receptacle holding positions in the STAT section of the first or second storage area and then remove the sample receptacles held in the remaining receptacle holding positions in the first and second storage areas. In one embodiment, the controller is programmed to actuate (direct, command) a gripper mover of the sample receptacle handling system to position the mechanical gripper at a first receptacle-holding position of the STAT section (e.g., the first row and first column of the STAT section). The mechanical gripper is then actuated to attempt to grip a sample receptacle at the first receptacle-holding position, for example, by placing gripper segments of opposing gripper fingers in an open configuration adjacent opposing sides of a top of the sample receptacle that projects above the first receptacle-holding position, and then closing the opposing gripper fingers to grip the opposing sides of the sample receptacle. If no sample receptacle is present at that receptacle holding position, for example if an opposing gripper finger of the mechanical gripper is determined to be closer to a position where the gripper finger's gripper segments are spaced a distance shorter than the narrowest sample receptacle, the controller actuates the gripper mover to position the mechanical gripper at a second receptacle holding position of the STAT section (e.g., the first row and second column of the STAT section).The mechanical gripper is then actuated to attempt to pick up a sample receptacle at the second receptacle holding location, as described above, and if a sample receptacle is not located at the second receptacle holding location, the controller actuates the gripper mover to position the mechanical gripper at a third receptacle holding location of the STAT section (e.g., the first row and third column of the STAT section). This process of attempting to grip a sample receptacle at successive receptacle holding locations is repeated a prescribed number of times (e.g., 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, or more times), and if a sample receptacle is not detected at a predetermined number of successive receptacle holding locations, the controller is programmed to actuate the sample receptacle handling system to attempt to pick up a sample receptacle at a different receptacle storage area or a different receptacle rack. On the other hand, if a sample receptacle is gripped by the mechanical gripper, the gripped sample receptacle is removed from the respective receptacle holding position and transferred from the receptacle holding position to a receptacle holder on the conveyor track. After the sample receptacle is successfully transferred to the receptacle holder, the controller actuates the gripper mover to position the mechanical gripper to the next receptacle holding position (e.g., the same row, next column or next row, first column of the STAT section).

[0019] The controller is programmed to detect whether a sample receptacle has been or may have been added to the STAT section after the STAT section was previously emptied. For example, if the STAT section includes a separate removable receptacle rack, a switch may be provided to generate a signal detectable by the controller when a new rack is placed in the STAT section of the first (or second) storage area. When the controller detects that a sample receptacle has been or may have been added to the STAT section after the STAT section was previously emptied, the controller is programmed to determine whether there is a sample receptacle in the STAT section by activating the sample receptacle handling system to attempt to grab the sample receptacle from the STAT section, as described above.

[0020] The sample receptacles are transferred from the first receptacle storage area to the receptacle holders on the conveyor track by moving each sample receptacle having a sample receptacle holding position from its respective receptacle holding position in the first receptacle storage area, across a first side of the first receptacle storage area, to the receptacle holder on the conveyor track, and each of the sample receptacles is removed from the first receptacle storage area in a sequential manner across the first side of the first receptacle storage area such that the removed sample receptacle does not pass another sample receptacle held in a receptacle holding position in the first receptacle storage area. Thus, if there are one or more intervening receptacle holding positions between each receptacle holding position of the first receptacle storage area and the first side of the first receptacle storage area, a sample receptacle held in each receptacle holding position of the first receptacle storage area will not be removed until a sample receptacle is removed from each of the intervening receptacle holding positions.

[0021] The sample receptacles are transferred from the second receptacle storage area to a receptacle holder on the conveyor track by moving each sample receptacle with the sample receptacle handling system from its respective receptacle holding position in the second receptacle storage area, over a first side of the second receptacle storage area, and into the first receptacle transport path. Each of the sample receptacles is removed from the second receptacle storage area in sequence via a path over the first side of the second receptacle storage area and into the first receptacle transport path such that the removed sample receptacle does not pass another sample receptacle held in a receptacle holding position in the second receptacle storage area. Thus, if there are one or more intervening receptacle holding positions between the respective receptacle holding positions of the second receptacle storage area and the first receptacle transport path, a sample receptacle held in the respective receptacle holding position of the second receptacle storage area is not removed until the sample receptacle is removed from the intervening receptacle holding position. After the removed sample receptacle is transferred from the respective receptacle holding position of the second receptacle storage area to the first receptacle transport path, the controller is programmed to cause the sample receptacle handling system to move the removed sample receptacle a distance required to align the removed sample receptacle with the second receptacle transport path. The controller is then programmed to cause the sample receptacle handling system to move the removed sample receptacle along a second receptacle transport path across the first side of the first receptacle storage area from a second side of the first receptacle storage area to a receptacle holder on the conveyor track.

[0022] Aspects of the present disclosure include a system for storing a plurality of sample receptacles and transferring each sample receptacle from the system without passing through another sample receptacle stored in the system. The system may include a first receptacle storage area having opposing first and second sides and opposing third and fourth sides oriented transversely to the first and second sides and including a plurality of receptacle holding locations. Each receptacle holding location may be configured to hold a single sample receptacle and may be spaced from any immediately adjacent receptacle holding location by a distance less than the width of the narrowest receptacle holding location. The multiple receptacle holding locations are arranged in a series of parallel rows oriented in a first direction extending from a third side of the first receptacle storage area to a fourth side of the first receptacle storage area and in a series of parallel columns oriented in a second direction extending from the first side of the first receptacle storage area to a second side of the first receptacle storage area.

[0023] The system may include a second receptacle storage area having opposing first and second sides and opposing third and fourth sides oriented transversely to the first and second sides and including a plurality of receptacle holding locations, each receptacle holding location configured to hold a single sample receptacle and spaced from any immediately adjacent receptacle holding location by a distance less than a width of the narrowest receptacle holding location. The plurality of receptacle holding locations are arranged in a series of parallel rows oriented in a first direction extending from the third side of the second receptacle storage area to the fourth side of the second receptacle storage area and a series of parallel columns oriented in a second direction extending from the first side of the second receptacle storage area to the second side of the second receptacle storage area.

[0024] The first receptacle storage area and the second receptacle storage area are arranged such that a first side of the second receptacle storage area faces a second side of the first receptacle storage area, and the second side of the first receptacle storage area is spaced from the first side of the second receptacle storage area by a distance equal to or greater than the width of the widest receptacle holding position of the second receptacle storage area, thereby defining a first receptacle transport path between the first receptacle storage area and the second receptacle storage area.

[0025] The first receptacle storage area includes a second receptacle transport path extending from a first side of the first receptacle storage area to a second side of the first receptacle storage area, the second receptacle transport path having a width equal to or greater than a width of a widest receptacle holding location of the second receptacle storage area. The system may include a conveyor configured to transport the sample receptacles, a sample receptacle handling system configured to transfer sample receptacles held in the first receptacle storage area and the second receptacle storage area from their respective receptacle holding locations to the conveyor, and a controller in communication with the sample receptacle handling system. The controller can be programmed to transfer the sample receptacles from the first receptacle storage area to the conveyor by moving each sample receptacle having the sample receptacle handling system from its respective receptacle holding position in the first receptacle storage area, across a first side of the first receptacle storage area, to the conveyor without passing another sample receptacle held in a receptacle holding position within the first receptacle storage area. The controller can be programmed to transfer the sample receptacles from the second receptacle storage area to the conveyor by moving each sample receptacle having the sample receptacle handling system from its respective receptacle holding position in the second receptacle storage area, across a first side of the second receptacle storage area, and into a first receptacle transport path without passing another sample receptacle held in a receptacle holding position in the second receptacle storage area.After the removed sample receptacles are transferred from their respective receptacle holding positions in the second receptacle storage area into the first receptacle transport path, the controller is programmed to move the sample receptacles by the sample receptacle handling system a distance necessary to align the removed sample receptacle with the second receptacle transport path, and then move the removed sample receptacle by the sample receptacle handling system along the second receptacle transport path from the second side of the first receptacle storage area to the conveyor across the first side of the first receptacle storage area.

[0026] According to a further aspect of the present disclosure, the second receptacle transport path may include a row of empty receptacle holding locations in the first receptacle storage area.

[0027] According to a further aspect of the present disclosure, the controller is programmed to cause the sample receptacle handling system to move each sample receptacle from its respective receptacle holding position in the first receptacle storage area, across the first side of the first receptacle storage area, to the conveyor without passing another sample receptacle held in a receptacle holding position within the first receptacle storage area, by moving any sample receptacle from its respective receptacle holding position in the first receptacle storage area, across each of one or more intervening receptacle holding positions located between the respective receptacle holding position and the first side of the first receptacle storage area, other than a receptacle held in its respective receptacle holding position located in a row closest to the first side of the first receptacle storage area, where the sample receptacle has been previously removed from the one or more intervening receptacle holding positions.

[0028] According to a further aspect of the present disclosure, the controller is programmed to cause the sample receptacle handling system to move each sample receptacle from its respective receptacle holding position of the second receptacle storage area, across the first side of the second receptacle storage area, to the first receptacle transport path without passing another sample receptacle held in a receptacle holding position within the second receptacle storage area, by moving any sample receptacle from its respective receptacle holding position of the second receptacle storage area, across each of one or more intervening receptacle holding positions located between the respective receptacle holding position and the first side of the second receptacle storage area, other than a receptacle held in a respective receptacle holding position located in a row closest to the first side of the second receptacle storage area, where the sample receptacle has been previously removed from one or more intervening receptacle holding positions.

[0029] According to a further aspect of the present disclosure, a path by which each sample receptacle is moved by the sample receptacle handling system from its respective receptacle holding position in the first receptacle storage area across the first side of the first receptacle storage area is programmed into the controller for each receptacle holding position in the first receptacle storage area, and a path by which each sample receptacle is moved by the sample receptacle handling system from its respective receptacle holding position in the second receptacle storage area across the first side of the second receptacle storage area into the first receptacle transport path is programmed into the controller for each receptacle holding position in the second receptacle storage area.

[0030] According to further aspects of the present disclosure, a sample receptacle handling system may include a mechanized robot including a mechanical gripper configured to grip individual sample receptacles in receptacle holding locations and a gripper mover configured to move the gripper in a vertical direction and an orthogonal horizontal direction.

[0031] According to a further aspect of the present disclosure, the controller is programmed to cause the sample receptacle handling system to remove a sample receptacle from each receptacle holding position by attempting to grasp the sample receptacle at the respective receptacle holding position with a mechanical gripper, detect whether a sample receptacle is held at the respective receptacle holding position, and if a sample receptacle is not detected at the respective receptacle holding position, advance the mechanical gripper to a next receptacle holding position within the same row of receptacle holding positions, within the same column of receptacle holding positions, within the next row of receptacle holding positions, or within the next column of receptacle holding positions.

[0032] According to further aspects of the present disclosure, each of the first receptacle storage area and the second receptacle storage area may include two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding positions arranged in rows and columns. If a sample receptacle is not detected in a predetermined number of consecutive respective receptacle holding positions, the controller may be programmed to advance the mechanical gripper to a next receptacle holding position in a next rack of the first storage area or the second storage area.

[0033] According to a further aspect of the present disclosure, a portion of the first receptacle storage area including a contiguous group of receptacle holding locations is designated as a STAT section for holding STAT sample receptacles, and the controller is programmed to first transfer all of the sample receptacles held in their respective receptacle holding locations in the STAT section of the first receptacle storage area to a conveyor by the sample receptacle handling system before transferring the sample receptacles held in the remaining receptacle holding locations in the first receptacle storage area and before transferring the sample receptacles held in the receptacle holding locations in the second receptacle storage area.

[0034] According to further aspects of the present disclosure, the controller may further comprise: after all sample receptacles have been removed from the STAT section of the first receptacle storage area by the sample receptacle handling system, while sample receptacles are being removed from remaining receptacle holding positions of the first receptacle storage area by the sample receptacle handling system, or while sample receptacles are being removed from receptacle holding positions of the second receptacle storage area by the sample receptacle handling system, the controller may further comprise: is programmed to suspend removal of sample receptacles from the first receptacle storage area or the second receptacle storage area and remove additional sample receptacles placed in the STAT section by the sample receptacle handling system before removal of sample receptacles from the first receptacle storage area or the second receptacle storage area is resumed by the sample receptacle handling system when the sample receptacle is placed in a receptacle holding location in the STAT section.

[0035] According to a further aspect of the present disclosure, a portion of the second receptacle storage area including a contiguous group of receptacle holding positions is designated as a STAT section for holding STAT sample receptacles, and the controller is programmed to first transfer all of the sample receptacles held in their respective receptacle holding positions in the STAT section of the second receptacle storage area to the conveyor by the sample receptacle handling system before transferring the sample receptacles held in the remaining receptacle holding positions in the second receptacle storage area and before transferring the sample receptacles held in the receptacle holding positions in the first receptacle storage area.

[0036] According to further aspects of the present disclosure, the controller may further comprise: after all sample receptacles have been removed from the STAT section of the second receptacle storage area by the sample receptacle handling system, while sample receptacles are being removed from remaining receptacle holding positions of the second receptacle storage area by the sample receptacle handling system, or while sample receptacles are being removed from receptacle holding positions of the first receptacle storage area by the sample receptacle handling system, is programmed to suspend removal of sample receptacles from the second receptacle storage area or the first receptacle storage area and remove additional sample receptacles placed in the STAT section by the sample receptacle handling system before resuming removal of sample receptacles from the second receptacle storage area or the first receptacle storage area by the sample receptacle handling system.

[0037] According to a further aspect of the present disclosure, the controller is programmed to control the sample receptacle handling system to remove sample receptacles from at least a portion of each row of receptacle holding locations in the first receptacle storage area, one row at a time, starting with the row closest to the first side of the first receptacle storage area, and then removing sample receptacles from rows progressively farther from the first side of the first receptacle storage area.

[0038] According to a further aspect of the present disclosure, the controller is programmed to control the sample receptacle handling system to remove all sample receptacles from at least a portion of the rows of receptacle holding locations in the first receptacle storage area, one row at a time, starting with the sample receptacle in each row closest to the first side of the first receptacle storage area, and then remove each sample receptacle from that row progressively farther from the first side of the first receptacle storage area.

[0039] According to a further aspect of the present disclosure, the controller is programmed to control the sample receptacle handling system to remove sample receptacles from at least a portion of the rows of receptacle holding locations in the first receptacle storage area, one row at a time, starting with the row closest to the third side of the first receptacle storage area, and then removing sample receptacles from rows progressively further away from the third side of the first receptacle storage area.

[0040] According to a further aspect of the present disclosure, the controller is programmed to control the sample receptacle handling system to remove all sample receptacles from each row of receptacle holding locations in the second receptacle storage area, one row at a time, starting with the row closest to the first side of the second receptacle storage area, and then removing sample receptacles from rows progressively farther from the first side of the second receptacle storage area.

[0041] According to a further aspect of the present disclosure, the controller is programmed to control the sample receptacle handling system to remove all sample receptacles from each row of receptacle holding locations in the second receptacle storage area, one row at a time, starting with the sample receptacle in each row closest to the first side of the second receptacle storage area, and then removing each sample receptacle from that row progressively farther from the first side of the second receptacle storage area.

[0042] According to a further aspect of the present disclosure, the controller is programmed to control the sample receptacle handling system to remove sample receptacles from each row of receptacle holding positions in the second receptacle storage area, one row at a time, starting with the row closest to the third side of the second receptacle storage area, and then removing sample receptacles from rows progressively farther from the third side of the second receptacle storage area.

[0043] According to further aspects of the present disclosure, each of the first receptacle storage area and the second receptacle storage area includes two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding locations arranged in rows and columns.

[0044] According to a further aspect of the present disclosure, each of the first receptacle storage area and the second receptacle storage area comprises two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding positions arranged in rows and columns, and one rack of the first receptacle storage area is designated as a STAT rack for holding STAT sample receptacles. The controller is programmed to first transfer all of the sample receptacles from their respective receptacle holding positions in the STAT rack to a conveyor by the sample receptacle handling system before transferring sample receptacles from the remaining receptacle holding positions in the first receptacle storage area and before transferring sample receptacles from the receptacle holding positions in the second receptacle storage area.

[0045] According to a further aspect of the present disclosure, the controller is programmed such that after all sample receptacles have been removed from the STAT rack by the sample receptacle handling system, if additional sample receptacles are placed into one or more receptacle holding positions of the STAT rack before all sample receptacles are removed from racks other than the STAT rack in the first receptacle storage area and / or the second receptacle storage area, the sample receptacle handling system returns to the STAT rack to remove all sample receptacles held in the STAT rack before removing sample receptacles from racks other than the STAT rack in the first receptacle storage area and the second receptacle storage area.

[0046] According to further aspects of the present disclosure, the system may include a switch configured to generate a signal detected by the controller when the STAT rack is replaced, and the controller is programmed to transfer, by the sample receptacle handling system, all sample receptacles from their respective receptacle holding positions in the replaced STAT rack before transferring sample receptacles from the remaining receptacle holding positions in the first receptacle storage area and before transferring sample receptacles from the receptacle holding positions in the second receptacle storage area.

[0047] According to a further aspect of the present disclosure, the racks in the first receptacle storage area are separated from the racks in the second receptacle storage area by a gap that forms a first receptacle transport path.

[0048] According to further aspects of the present disclosure, the system may include a first drawer supporting at least one rack of the first receptacle storage area and at least one rack of the second receptacle storage area, and a second drawer supporting at least one rack of the first receptacle storage area and at least one rack of the second receptacle storage area.

[0049] According to further aspects of the disclosure, the first receptacle storage area may include four receptacle racks arranged side-by-side between a third side and a fourth side of the first receptacle storage area, the four receptacle racks of the first receptacle storage area having aligned first sides corresponding to the first side of the first receptacle storage area and aligned second sides corresponding to the second side of the first receptacle storage area. The second receptacle storage area may include four receptacle racks arranged side-by-side between a third side and a fourth side of the second receptacle storage area, the four receptacle racks of the second receptacle storage area having aligned first sides corresponding to the first side of the second receptacle storage area and aligned second sides corresponding to the second side of the second receptacle storage area.

[0050] According to a further aspect of the present disclosure, the second receptacle transport path includes a gap between two of the four receptacle racks of the first receptacle storage area, the gap having a width equal to or greater than the width of the widest receptacle holding position of the second receptacle storage area.

[0051] According to further aspects of the present disclosure, the system may include a first drawer supporting two receptacle racks in a first receptacle storage area and two receptacle racks in a second receptacle storage area, and a second drawer supporting two receptacle racks in the first receptacle storage area and two receptacle racks in the second receptacle storage area.

[0052] According to a further aspect of the present disclosure, a portion of the first receptacle storage area including a contiguous group of receptacle holding locations is designated as an isolation section configured to accept sample receptacles placed therein by the sample receptacle handling system, and the controller is programmed to transfer selected ones of the sample receptacles from receptacle holding locations of the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area, and then transfer the selected sample receptacle to a receptacle holding location of the isolation section.

[0053] According to a further aspect of the present disclosure, the controller is programmed to transport the selected sample receptacle to the isolation section upon an error occurring with respect to the selected sample receptacle.

[0054] According to further aspects of the present disclosure, the error related to the selected sample receptacle may include one or more of insufficient information stored regarding the selected sample receptacle, no open test order stored for the selected sample receptacle, an inability to read machine readable information associated with the selected sample receptacle, insufficient headspace within the selected sample receptacle, and insufficient sample material contained within the selected sample receptacle.

[0055] According to a further aspect of the present disclosure, a portion of the first receptacle storage area including a contiguous group of receptacle holding locations is designated as an isolation section configured to accept sample receptacles placed therein by the sample receptacle handling system, and the second receptacle transport path comprises a row of empty receptacle holding locations in the isolation section, and the controller is programmed to transport selected ones of the sample receptacles from receptacle holding locations of the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area, and then transport the selected sample receptacle to a receptacle holding location of the isolation section other than a receptacle holding location of the second receptacle transport path.

[0056] According to a further aspect of the present disclosure, each sample receptacle comprises a test tube.

[0057] According to further aspects of the present disclosure, the system may include a plurality of receptacle holders, each receptacle holder supported on the conveyor and configured to receive a sample receptacle and hold the sample receptacle in an upright orientation.

[0058] Aspects of the disclosure include a method of transferring each of a plurality of sample receptacles from a receptacle storage module to a conveyor located adjacent to the receptacle storage module. The receptacle storage module may include a first receptacle storage area and a second receptacle storage area, each of the first receptacle storage area and the second receptacle storage area having opposing third and fourth sides opposing first and second sides and oriented transversely relative to the first and second sides, and the first receptacle storage area and the second receptacle storage area are positioned such that the first side of the second receptacle storage area faces the second side of the first receptacle storage area. The first receptacle storage area may include a plurality of receptacle holding locations arranged in a series of parallel rows oriented in a first direction extending from a third side of the first receptacle storage area to a fourth side of the first receptacle storage area and in a series of parallel columns oriented in a second direction extending from the first side of the first receptacle storage area to a second side of the first receptacle storage area. Each receptacle holding location in the first receptacle storage area is configured to hold a single sample receptacle and is spaced from any immediately adjacent receptacle holding location by a distance less than the width of the narrowest receptacle holding location. The second receptacle storage area may include a plurality of receptacle holding locations arranged in a series of parallel rows oriented in a first direction extending from a third side of the second receptacle storage area to a fourth side of the second receptacle storage area and in a series of parallel columns oriented in a direction extending from the first side of the second receptacle storage area to a second side of the second receptacle storage area. Each receptacle holding location of the second receptacle storage area is configured to hold a single sample receptacle and is spaced from any immediately adjacent receptacle holding location by a distance less than the width of the narrowest receptacle holding location. The second side of the first receptacle storage area is spaced from the first side of the second receptacle storage area by a distance equal to or greater than the width of the widest receptacle holding position of the second receptacle storage area, thereby defining a first receptacle transport path between the second side of the first receptacle storage area and the first side of the second receptacle storage area.The first receptacle storage area may include a second receptacle transport path extending from a first side of the first receptacle storage area to a second side of the first receptacle storage area, the second receptacle transport path having a width greater than or equal to the width of the widest receptacle holding position of the second receptacle storage area. The method may include controlling the sample receptacle handling system to transfer the sample receptacles from the first receptacle storage area to the conveyor by causing the sample receptacle handling system to move each sample receptacle from a respective receptacle holding position in the first receptacle storage area to the conveyor across a first side of the first receptacle storage area, wherein each of the sample receptacles is removed from the first receptacle storage area via a path in sequence across the first side of the first receptacle storage area such that the removed sample receptacle does not pass another sample receptacle held in a receptacle holding position in the first receptacle storage area. The method may also include controlling the sample receptacle handling system to transfer the sample receptacles from the second receptacle storage area to the conveyor by causing the sample receptacle handling system to move each sample receptacle from a respective receptacle holding position in the second receptacle storage area, across a first side of the second receptacle storage area, and into the first receptacle transport path, and moving each of the sample receptacles in sequence from the second receptacle storage area, across the first side of the second receptacle storage area, and into the first receptacle transport path such that the removed sample receptacle does not pass another sample receptacle held in a receptacle holding position in the second receptacle storage area.After the removed sample receptacles are transferred from their respective receptacle holding positions in the second receptacle storage area to the first receptacle transport path, the sample receptacle handling system is controlled to move the sample receptacle a distance required to align the removed sample receptacle with the second receptacle transport path and then move the removed sample receptacle along the second receptacle transport path from the second side of the first receptacle storage area to the conveyor across the first side of the first receptacle storage area.

[0059] According to a further aspect of the present disclosure, the second receptacle transport path may include a row of empty receptacle holding locations in the first receptacle storage area.

[0060] According to further aspects of the present disclosure, transferring the receptacles from the first receptacle storage area to the conveyor may include moving any sample receptacles from their respective receptacle holding positions in the first receptacle storage area past each of one or more intervening receptacle holding positions located between the respective receptacle holding positions and the first side of the first receptacle storage area, other than the receptacles held in their respective receptacle holding positions located in the row closest to the first side of the first receptacle storage area, where the sample receptacle has previously been removed from the one or more intervening receptacle holding positions.

[0061] According to a further aspect of the present disclosure, moving each sample receptacle from its respective receptacle holding position in the second receptacle storage area and into the first receptacle transport path, beyond the first side of the second receptacle storage area, by the sample receptacle handling system may include moving any sample receptacle from its respective receptacle holding position in the second receptacle storage area, beyond each of one or more intervening receptacle holding positions located between the respective receptacle holding position and the first side of the second receptacle storage area, other than the receptacles held in the respective receptacle holding positions located in the row closest to the first side of the second receptacle storage area, where the sample receptacle has previously been removed from the one or more intervening receptacle holding positions.

[0062] According to a further aspect of the present disclosure, a path along which each sample receptacle is moved by the sample receptacle handling system from its respective receptacle holding location in the first receptacle storage area across a first side of the first receptacle storage area is predefined for each receptacle holding location in the first receptacle storage area, and a path along which each sample receptacle is moved by the sample receptacle handling system from its respective receptacle holding location in the second receptacle storage area across the first side of the second receptacle storage area into the first receptacle transport path is predefined for each receptacle holding location in the second receptacle storage area.

[0063] According to further aspects of the present disclosure, a sample receptacle handling system may include a mechanized robot including a mechanical gripper configured to grip individual sample receptacles in receptacle holding locations and a gripper mover configured to move the gripper in a vertical direction and an orthogonal horizontal direction.

[0064] According to a further aspect of the present disclosure, transferring a receptacle from the first receptacle storage area or transferring a receptacle from the second receptacle storage area may include controlling the sample receptacle handling system to remove the sample receptacle from each receptacle holding position of the first receptacle storage area or the second receptacle storage area by grasping the sample receptacle at the respective receptacle holding position with a mechanical gripper and attempting to detect whether a sample receptacle is held at the respective receptacle holding position, and if a sample receptacle is not detected at the respective receptacle holding position, to advance the mechanical gripper to a next receptacle holding position within the same row of receptacle holding positions, within the same column of receptacle holding positions, within the next row of receptacle holding positions, or within the next column of receptacle holding positions.

[0065] According to further aspects of the present disclosure, each of the first receptacle storage area and the second receptacle storage area may include two or more receptacle racks removably supported on a rack support platform, each receptacle rack may include a plurality of receptacle holding locations arranged in rows and columns, and the method may include advancing a mechanical gripper to a next receptacle holding location in a next rack of the first storage area or the second storage area if a sample receptacle is not detected in a predetermined number of successive respective receptacle holding locations. In one example, the predetermined number is five.

[0066] According to a further aspect of the present disclosure, a portion of the first receptacle storage area including a contiguous group of receptacle holding locations is designated as a STAT section for holding STAT sample receptacles. The method may include initially transferring, by the sample receptacle handling system, all of the sample receptacles held in their respective receptacle holding locations in the STAT section of the first receptacle storage area to a conveyor before transferring the sample receptacles held in the remaining receptacle holding locations in the first receptacle storage area and before transferring the sample receptacles held in the receptacle holding locations in the second receptacle storage area.

[0067] According to further aspects of the present disclosure, if additional sample receptacles are placed in receptacle holding positions of the STAT section after all sample receptacles have been removed from the STAT section of the first receptacle storage area by the sample receptacle handling system while sample receptacles are being removed from remaining receptacle holding positions of the first receptacle storage area or while sample receptacles are being removed from receptacle holding positions of the second receptacle storage area, the method may include interrupting removal of sample receptacles from the first receptacle storage area or the second receptacle storage area and removing the additional sample receptacle placed in the STAT section before resuming removal of sample receptacles from the first receptacle storage area or the second receptacle storage area.

[0068] According to a further aspect of the disclosure, a portion of the second receptacle storage area including a contiguous group of receptacle holding locations is designated as a STAT section for holding STAT sample receptacles. The method may include initially transferring, by the sample receptacle handling system, all of the sample receptacles held in their respective receptacle holding locations in the STAT section of the second receptacle storage area to a conveyor before transferring the sample receptacles held in the remaining receptacle holding locations in the second receptacle storage area and before transferring the sample receptacles held in the receptacle holding locations in the first receptacle storage area.

[0069] According to further aspects of the present disclosure, if additional sample receptacles are placed in receptacle holding positions of the STAT section after all sample receptacles have been removed from the STAT section of the second receptacle storage area by the sample receptacle handling system while sample receptacles are being removed from remaining receptacle holding positions of the second receptacle storage area or while sample receptacles are being removed from receptacle holding positions of the first receptacle storage area, the method may include interrupting removal of sample receptacles from the second receptacle storage area or the first receptacle storage area and removing the additional sample receptacles placed in the STAT section before resuming removal of sample receptacles from the second receptacle storage area or the first receptacle storage area.

[0070] According to further aspects of the present disclosure, transferring receptacles from the first receptacle storage area to the conveyor may include removing sample receptacles from at least a portion of each row of receptacle holding positions in the first receptacle storage area, one row at a time, starting with the row closest to the first side of the first receptacle storage area, and then removing sample receptacles from rows progressively farther from the first side of the first receptacle storage area.

[0071] According to a further aspect of the present disclosure, transferring the receptacles from the first receptacle storage area to the conveyor may include removing all of the sample receptacles from at least a portion of the rows of receptacle holding locations in the first receptacle storage area, one row at a time, starting with the sample receptacle in each row closest to a first side of the first receptacle storage area, and then removing each sample receptacle from that row progressively farther from the first side of the first receptacle storage area.

[0072] According to a further aspect of the present disclosure, sample receptacles are removed from each row of receptacle holding positions in the first receptacle storage area, one row at a time, starting with the row closest to the third side of the first receptacle storage area, then removing sample receptacles from rows progressively farther from the third side of the first receptacle storage area.

[0073] According to a further aspect of the present disclosure, moving each sample receptacle by the sample receptacle handling system from its respective receptacle holding location in the second receptacle storage area, across the first side of the second receptacle storage area and into the first receptacle transport path may include removing all sample receptacles from each row of receptacle holding locations in the second receptacle storage area, one row at a time, starting with the row closest to the first side of the second receptacle storage area, and then removing sample receptacles from rows progressively farther from the first side of the second receptacle storage area.

[0074] According to a further aspect of the present disclosure, moving each sample receptacle by the sample receptacle handling system from its respective receptacle holding position in the second receptacle storage area and into the first receptacle transport path, beyond the first side of the second receptacle storage area, may include removing all sample receptacles from each row of receptacle holding positions in the second receptacle storage area, one row at a time, starting with the sample receptacle in each row closest to the first side of the second receptacle storage area, and then removing each sample receptacle from that row progressively further from the first side of the second receptacle storage area.

[0075] According to a further aspect of the present disclosure, sample receptacles are removed from each row of receptacle holding positions in the second receptacle storage area, one row at a time, starting with the row closest to the third side of the second receptacle storage area, and then sample receptacles are removed from rows progressively farther from the third side of the second receptacle storage area.

[0076] According to further aspects of the present disclosure, each of the first receptacle storage area and the second receptacle storage area may include two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding locations arranged in rows and columns.

[0077] According to further aspects of the disclosure, each of the first receptacle storage area and the second receptacle storage area may include two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding locations arranged in rows and columns, and one rack of the first receptacle storage area is designated as a STAT rack for holding STAT sample receptacles. The method may include first transferring all of the sample receptacles from their respective receptacle holding locations in the STAT racks by the sample receptacle handling system before transferring sample receptacles from remaining receptacle holding locations in the first receptacle storage area and before transferring sample receptacles from receptacle holding locations in the second receptacle storage area.

[0078] According to further aspects of the disclosure, the method may include detecting when a STAT rack has been replaced and then transferring, by the sample receptacle handling system, all sample receptacles from their respective receptacle holding positions in the replaced STAT rack before transferring sample receptacles from remaining receptacle holding positions in the first receptacle storage area and before transferring sample receptacles from receptacle holding positions in the second receptacle storage area.

[0079] According to a further aspect of the present disclosure, the racks in the first receptacle storage area are spaced from the racks in the second receptacle storage area by a gap that forms a first receptacle transport path.

[0080] According to a further aspect of the present disclosure, at least one rack in the first receptacle storage area and at least one rack in the second receptacle storage area are supported in a first drawer, and at least one rack in the first receptacle storage area and at least one rack in the second receptacle storage area are supported in a second drawer.

[0081] According to a further aspect of the present disclosure, the first receptacle storage area may include four receptacle racks arranged side-by-side between a third side and a fourth side of the first receptacle storage area, the four receptacle racks of the first receptacle storage area having aligned first sides corresponding to the first side of the first receptacle storage area and aligned second sides corresponding to the second side of the first receptacle storage area. According to a further aspect of the present disclosure, the second receptacle storage area may include four receptacle racks arranged side-by-side between a third side and a fourth side of the second receptacle storage area, the four receptacle racks of the second receptacle storage area having aligned first sides corresponding to the first side of the second receptacle storage area and aligned second sides corresponding to the second side of the second receptacle storage area.

[0082] According to a further aspect of the disclosure, the second receptacle transport path may include a gap between two of the four receptacle racks of the first receptacle storage area, the gap having a width equal to or greater than the width of the widest receptacle holding position of the second receptacle storage area.

[0083] According to further aspects of the present disclosure, the rack support platform may include a first drawer and a second drawer, where the first drawer supports two receptacle racks in the first receptacle storage area and two receptacle racks in the second receptacle storage area, and the second drawer supports two receptacle racks in the first receptacle storage area and two receptacle racks in the second receptacle storage area.

[0084] According to a further aspect of the present disclosure, a portion of the first receptacle storage area including a contiguous group of receptacle holding locations is designated as an isolation section configured to accept sample receptacles placed therein by a sample receptacle handling system, and the method may include, as appropriate, transferring selected ones of the sample receptacles from receptacle holding locations of the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area, and then transferring the selected sample receptacle to a receptacle holding location of the isolation section.

[0085] According to a further aspect of the present disclosure, when an error occurs with respect to a selected sample receptacle, the selected sample receptacle is transferred to a segregation section.

[0086] According to further aspects of the present disclosure, the error related to the selected sample receptacle may include one or more of insufficient information stored regarding the selected sample receptacle, no open test order stored for the selected sample receptacle, an inability to read machine readable information associated with the selected sample receptacle, insufficient headspace within the selected sample receptacle, and insufficient sample material contained within the selected sample receptacle.

[0087] According to a further aspect of the disclosure, a portion of the first receptacle storage area including a contiguous group of receptacle holding locations is designated as an isolation section configured to receive sample receptacles placed therein by the sample receptacle handling system. The second receptacle transport path may include a row of empty receptacle holding locations in the isolation section. The method may include, as needed, transferring selected ones of the sample receptacles from receptacle holding locations in the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area, and then transferring the selected sample receptacle to a receptacle holding location in the isolation section other than the receptacle holding location of the second receptacle transport path.

[0088] According to a further aspect of the present disclosure, each sample receptacle may include a test tube.

[0089] Other features and characteristics of the subject matter of the present disclosure, as well as its method of operation, function of the combination of associated elements and parts of structure, and economy of manufacture, will become more apparent from consideration of the following description and appended claims, taken in conjunction with the accompanying drawings, all of which form a part of this specification, and in which like reference characters designate corresponding parts of the various views. [Brief description of the drawings]

[0090] The foregoing and other aspects of the embodiments will be described in further detail with reference to the accompanying drawings, in which like reference numerals refer to like elements and the description of like elements shall be applicable to all relevant described embodiments.

[0091] [Figure 1] FIG. 1 is a schematic diagram of an exemplary automated analytical system for processing a fluid sample contained in a sample receptacle.

[0092] [Figure 2A]FIG. 2A is a side view of an exemplary sample receptacle in the form of a sample tube and associated cap.

[0093] [Figure 2B] FIG. 2B is a cross-sectional view of the sample receptacle of FIG. 2A.

[0094] [Diagram 3] FIG. 3 is a perspective front view of an exemplary sample receptacle holder.

[0095] [Figure 4] FIG. 4 is a schematic diagram of an exemplary receptacle storage module in the form of an input station for an automated analysis system.

[0096] [Diagram 5] FIG. 5 is a schematic diagram of an exemplary input station and sample receptacle transport system of an automated analytical system.

[0097] [Figure 6] FIG. 6 is a perspective view of a track supporting multiple receptacle holders, one of which is loaded with a sample receptacle, and associated components adjacent to the input station.

[0098] [Figure 7] FIG. 7 is a schematic diagram of an exemplary input station showing a numbering scheme for the sample receptacle holding positions.

[0099] [Figure 8] FIG. 8 is a schematic diagram of an exemplary input station illustrating an exemplary path for transporting a sample receptacle from a sample receptacle holding position within the input station to a position outside the input station. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0100] Detailed Description Unless otherwise defined, all technical terms, notations and other scientific terms or terms used herein have the same meaning as commonly understood by those skilled in the art to which this disclosure belongs.All patents, applications, published applications and other publications mentioned herein are incorporated by reference in their entirety.If the definitions set forth in this disclosure are contrary to or otherwise inconsistent with the definitions in these references, the definitions set forth in this disclosure shall prevail over the definitions incorporated herein by reference.None of the references set forth or referenced herein are admitted to be prior art to this disclosure.

[0101] References in this specification to "one embodiment," "an embodiment," "further embodiment," "an exemplary embodiment," "some aspects," "a further aspect," "aspects," and the like indicate that the described embodiment may include a particular feature, structure, or characteristic, but all embodiments may not necessarily include the particular feature, structure, or characteristic. Moreover, such phrases do not necessarily refer to the same embodiment. Furthermore, when a particular feature, structure, or characteristic is described in connection with an embodiment, such feature, structure, or characteristic is also described in connection with other embodiments, whether or not explicitly described. As used herein, "a" or "an" means "at least one" or "one or more."

[0102] As used herein, the term "sample" refers to any material suspected of containing at least one analyte of interest. The analyte of interest may be, for example, a nucleic acid, a protein, a prion, a chemical, etc. The material may come from any source, including an animal, an industrial process, the environment, a water source, a food, or a solid surface (e.g., a surface in a medical facility). Materials obtained from animals may include, for example, blood or blood products, urine, mucus, sputum, saliva, semen, tears, pus, stool, nasopharyngeal or urogenital specimens obtained by swabs or other collection devices, and other bodily fluids or materials. The term "sample" is understood to mean a specimen in its native form or at any stage of processing.

[0103] As used herein, the term "receptacle" refers to any type of fluid container including, for example, a tube, a vial, a cuvette, a cartridge having one or more wells, a microtiter plate, etc., configured to contain a sample or another fluid (collectively referred to herein as fluids). Tubes may be cylindrical (i.e., circular in cross section) or non-cylindrical and may have a flat or rounded bottom. Non-limiting examples of illustrative receptacles include, for example, Aptima® urine specimen transport tubes, Aptima® specimen transfer tubes, BD Vacutainer®, etc.

[0104] As used herein, the term "gripper robot" refers to an electromechanical device, such as a pick-and-place device, configured to grip individual receptacles and translate the receptacles in the X, Y, and / or Z directions.

[0105] As used herein, the term "conveyor" refers to a mechanical device for transporting articles (e.g., receptacles) from one location to another along a predetermined path. Non-limiting examples of exemplary conveyors include one or more of a robot, a belt, a shuttle / carriage that moves on a track, rails or belts, a magnetic device, a gear system, a cable system, a vacuum system, a wheeled vehicle, and the like.

[0106] As used herein, the term "assay" refers to a procedure for detecting and / or quantifying an analyte in a sample. A sample containing or suspected of containing an analyte is contacted with one or more reagents and subjected to permissive conditions for producing a detectable signal that indicates whether the analyte is present or the amount (e.g., mass or concentration) of the analyte in the sample.

[0107] As used herein, the term "analyzer" refers to an automated instrument capable of performing one or more steps of an assay, including determining the presence or absence of one or more analytes suspected to be present in a fluid sample.

[0108] As used herein, the term "analyte" refers to a molecule or substance being detected or subjected to analysis in an assay. Exemplary analytes include nucleic acids, polypeptides, proteins, antigens, and prions.

[0109] As used herein, the term "molecular assay" refers to a procedure for specifically detecting and / or quantifying a target molecule, such as a specific nucleic acid. A sample containing or suspected of containing a target molecule is contacted with one or more reagents, including at least one reagent specific for the target molecule, and subjected to permissive conditions for generating a detectable signal that indicates whether the target molecule is present. For example, if the molecular assay includes an amplification reaction, such as a polymerase chain reaction (PCR), the reagents include primers that may be specific for the target nucleic acid, and the generation of the detectable signal can be achieved, at least in part, by providing a labeled probe that hybridizes to the amplicon produced by the primers in the presence of the target. Alternatively, the reagents can include an intercalating dye for detecting the formation of double-stranded nucleic acids.

[0110] As used herein, the term "reagent" refers to any substance or mixture that takes part in an assay, other than the sample materials and products of the assay. Exemplary reagents for use in molecular assays include nucleotides, enzymes, primers, probes and salts.

[0111] FIG. 1 shows a schematic diagram of an automated analysis system 100 for processing a fluid sample 102 (see FIG. 2) contained in a sample receptacle 104. An exemplary automated analysis system is described in International Application No. PCT / US2021 / 028719 and International Application No. PCT / US2021 / 028722. In this exemplary embodiment, the automated analysis system 100 is configured to process a plurality of sample receptacles 104. The automated analysis system 100 includes a plurality of stations 106, including an input station 106a, an output station 106b, a decapping station 106c, a sample preparation station 106d, one or more analyzer stations 106e (although two analyzer stations 106e are shown, any suitable number of analyzer stations 106e, including only one, may be used in the automated analysis system 100), a capping station 106g, and a storage station 106h. The automated analysis system 100 may have any different number and types of stations 106 suitable for the intended use of the system 100, including having multiple of each type of station 106. The automated analysis system 100 also includes an automated conveyor system 108 connecting each station 106 and configured to transport sample receptacles 104 between the stations 106. Exemplary conveyor systems include those described in U.S. Pat. Nos. 9,766,258 and 9,776,811 and U.S. Patent Application Publication No. 2017 / 0254827, and are embodied in commercially available systems from FlexLink, Inpeco (Flexlab, FlexLab-HT, etc.), Integrated Drive Systems (e.g., IDS-CLAS-Xl), Thermo Fisher Scientific, Hitachi, MagneMotion, GLP, etc.

[0112] In the illustrated embodiment, the automated analysis system 100 is configured to utilize a sample tube 104 (e.g., a test tube) as the sample receptacle 104. An exemplary sample tube 104 is shown in FIGS. 2A and 2B. The sample tube 104 is a cylindrical tube having a closed bottom 110 and a cylindrical receptacle wall 112 extending from the closed bottom 110 to a rim 114. The rim 114 defines an open top 116 of the sample tube 104. The sample tube 104 may have a threaded top 109 for mounting a cap 107 having a mating thread. The sample receptacle 104 may be any suitable fluid sample receptacle having a closed bottom and a rim defining an open top. For example, the sample receptacle 104 may be any other suitable fluid receptacle having a suitable shape and size. The sample tube 104 contains a fluid sample 102 having an upper surface 103 .

[0113] The automated analysis system 100 utilizes a sample receptacle holder 118 to hold and transport the sample receptacle 104 around the conveyor system 108 of the system 100. FIG. 3 illustrates an exemplary sample receptacle holder 118. The sample receptacle holder 118 is in the form of a generally cylindrical puck 120 having a cylindrical base 122. An exemplary puck is described in U.S. Patent Application Publication No. 2021 / 0061584. The base 122 of the puck 120 has a recess 125 that seats the closed bottom 110 of the sample receptacle 104. The base 122 may also have one or more grooves 123 configured to receive and slide along a pair of opposing rails of the conveyor track 119. The puck 120 also has a plurality of fingers 124 extending upwardly from the base 122 configured to vertically support the sample receptacle 104. The fingers 124 are arranged in a circular pattern to match the cylindrical shape of the sample receptacle 104. The fingers 124 extend to a point below the rim 114 of the sample receptacle 104 such that a top 126 of the sample receptacle 104, including the rim 114, is above the fingers 124 and exposed. Tops 128 of the fingers 124 taper inward from the top to provide a guide while inserting the sample receptacle 104 between the fingers 124 of the puck 120. The tapered top 128 also helps to bias the fingers 124 when the sample receptacle 104 is inserted into the sample receptacle holder 118.

[0114] To integrate and coordinate the components involved in processing the fluid sample 102 contained in the sample receptacle 104, the automated analysis system 100 has a computerized controller 105 (e.g., a programmable logic controller, or PLC) that controls the operation of each component, including, for example, determining the level of the fluid sample 102 in the sample receptacle 104, determining whether to quarantine the sample receptacle 104, and / or performing one or more analytical procedures on the fluid sample 102. The controller 105 may include a main controller 105i and one or more subsystem controllers. For example, each station 106 may have a corresponding subsystem controller 105 (e.g., a programmable logic controller or "PLC") for controlling the respective station 106 and coordinating with the main controller 105i and the other subsystem controllers 105. Thus, the input station 106a has an input station controller 105a, the output station 106b has an output station controller 105b, the decapping station 106c has a decapping station controller 105c, the sample preparation station 106d has a sample preparation station controller 105d, the first analyzer station 106e has a first analyzer station controller 105e1, the second analyzer station 106e has a second analyzer station controller 105e2, the capping station 106g has a capping station controller 105g, the storage station has a storage station controller 105h, and the conveyor system 108 has a conveyor controller 105j. The main controller 105i may be configured to address the routing logic for each sample 102. For example, it may indicate a path or workflow through the system 100, such as a path that includes station 106a, station 106c, at least one station 106e, station 106g, and station 106h.The conveyor controllers 105j may be configured to manage all of the details of how to physically route each fluid sample 102 (and the sample receptacles 104 that house each fluid sample 102) to all of the required stations 106, as directed by the main controller 105i. Individual controllers 105 within the stations 106 monitor and control all of the components of their respective stations, including sensors, motors, actuators, etc.

[0115] Stations 106 and conveyor system 108 are configured to handle and transport sample receptacle holders 118, and sample receptacles 104 received in sample receptacle holders 118 (collectively referred to as loaded sample receptacle holders 118), around the automated analysis system 100. Conveyor system 108 transports loaded sample receptacle holders 118 between stations 106 of the automated analysis system 100. In an embodiment, automated conveyor system 108 is controlled by a conveyor controller 105j, which runs software referred to as a line controller.

[0116] The conveyor system 108 may be any device for facilitating the transportation or otherwise of the loaded sample receptacle holders 118 between the stations 106 along a defined path. In the illustrated embodiment, the conveyor system 108 includes a conveyor track 119 and a conveyor controller 105j. The conveyor track 119 includes a main conveyor line 184 and a number of branch lines 182a, 182b, 182c, 182d, 182e, 182g, 182h associated with each station 106a, 106b, 106c, 106d, 106e, 106g, 106h, respectively, and one or more recirculation loops including return lines 184a, 184b.

[0117] The main conveyor line 184 serves as the main line for transporting the loaded sample receptacle holders 118 between the different stations 106 of the automated analysis system 100. In the illustrated embodiment, the main conveyor line 184 has a closed geometric shape (e.g., rectangular) that facilitates unidirectional movement (counterclockwise in the illustrated embodiment) of the loaded sample receptacle holders 118. In alternative embodiments, the main conveyor line 184 may be linear and / or bidirectional.

[0118] Each of the branch lines 182a, 182b, 182c, 182d, 182e, 182g, 182h can be used as a buffer queue to receive and queue one or more loaded sample receptacle holders 118 to be processed at a particular station 106a, 106b, 106c, 106d, 106e, 106g, 106h, respectively. The return lines 184a, 184b form a closed inner loop that allows the loaded sample receptacle holders 118 to circulate while waiting for access to one or more of the stations 106a, 106b, 106c, 106d, 106e, 106g, 106h. For example, if branch line 182 of a station 106 has a full queue of loaded sample receptacle holders 118, the loaded sample receptacle holders 118 waiting to be processed at such station 106 may be circulated in one of the inner loops including return line 184a or return line 184b until the queue of branch line 182 has available space.

[0119] The conveyor controller 105j is configured to control the functions of the conveyor system 108, such as transporting the loaded sample receptacle holder 118 between the stations 106 of the automated analysis system 100. The main controller 105i may communicate with the conveyor controller 105j to instruct the conveyor controller 105j on the path that each sample receptacle holder 118 should be routed. Thus, the conveyor controller 105j may control the stations 106 to which the loaded sample receptacle holder 118 is transported and the stations 106 that are bypassed by the loaded sample receptacle holder 118. The conveyor controller 105j may communicate directly with each of the individual station controllers 105 to manage the workflow path of each sample receptacle holder 118.

[0120] Each station 106 is configured to receive, handle, and move the sample receptacle holders 118 and / or sample receptacles 104 within the respective station 106. For example, at least some of the stations 106 may include a respective sample receptacle handling system 130 for moving and / or manipulating the sample receptacle holders 118 and / or sample receptacles 104 within the respective station 106. The receptacle handling system 130 may include a gripper robot, such as a pick-and-place device, or other type of transport apparatus.

[0121] Generally speaking, the input station 106a is a receptacle storage module that serves to receive and load sample receptacles 104 containing fluid samples 102 into the automated analysis system 100. As shown in FIG. 4, the input station 106a has a first side 200 adjacent the branch line 182a of the conveyor track 119 and a second side 202 opposite the first side 200. The input station 106a may include a first receptacle storage area 216 disposed adjacent the first side 200 of the input station 106a (i.e., closer to the first side 200 than to the second side 202) that includes a first side 204, a second side 206 opposite the first side 204, a third side 212, and a fourth side 214 opposite the third side 212, the third side 212 and the fourth side 214 extending transversely relative to the first side 204 and the second side 206. The first receptacle storage area 216 includes a plurality of receptacle holding locations 236 arranged in parallel columns 222 extending in a direction from the first side 204 to the second side 206 and in parallel rows 220 extending in a direction from the third side 212 to the fourth side 214. The input station 106a may include a second receptacle storage area 218 disposed adjacent to the second side 202 of the input station 106a (i.e., closer to the second side 202 than the first side 200), which includes a first side 208, a second side 210 opposite the first side 208, a third side 212 (coincident with the third side 212 of the first receptacle storage area 216), and a fourth side 214 opposite the third side 212 (coincident with the fourth side 214 of the first receptacle storage area 216), the third side 212 and the fourth side 214 extending laterally relative to the first side 208 and the second side 210. The second receptacle storage area 218 has a plurality of receptacle holding positions 236 arranged in parallel columns extending in a direction from the first side 208 to the second side 210 and in parallel rows extending in a direction from the third side 212 to the fourth side 214.

[0122] Although FIG. 4 includes reference numeral 106a corresponding to an input station, the first and second storage areas and the first and second receptacle paths shown in FIG. 4 may be implemented in any receptacle storage module in which the receptacle transfer algorithms and mechanisms described herein may be implemented, including storage station 106h and output station 106b.

[0123] Each receptacle-holding location 236 may include a slot or opening having a shape and width or diameter such that a sample receptacle 104 may be inserted and the receptacle's receptacle wall 112 is supported by a periphery of the opening (e.g., a circular opening for a cylindrical receptacle wall 112). Because the input station 106a may be configured to handle sample receptacles 104 of various sizes and shapes, the corresponding sizes and shapes of the receptacle-holding locations 236 may vary accordingly.

[0124] The first receptacle storage area 216 may include one or more receptacle racks 111a, 111b, 111c, 111d, each including a plurality of receptacle holding positions 236. The receptacle holding positions 236 of each receptacle rack 111a, 111b, 111c, 111d are configured to support a plurality of sample receptacles 104 that accommodate fluid samples 102, and the sample receptacles 104 may have the same or different configurations. Each receptacle rack 111a, 111b, 111c, 111d may be supported on a rack support platform. The second receptacle storage area 218 may include one or more receptacle racks 111e, 111f, 111g, 111h, each including a plurality of receptacle holding positions 236. The receptacle holding positions 236 of each receptacle rack 111e, 111f, 111g, 111h are configured to support a plurality of sample receptacles 104 containing fluid samples 102, which may have the same or different configurations. Each receptacle rack 111e, 111f, 111g, 111h may be supported on a rack support platform. As used herein, the term "rack" may refer to any structure or platform configured to hold a plurality of sample receptacles in generally fixed receptacle holding positions defined, for example, by a plurality of openings or slots, each configured to receive a single sample receptacle. The bottom 110 of each sample receptacle 104 seats within a receptacle holding position 236, and the top 126 of each sample receptacle 104 extends above the top of the receptacle holding position 236 so that the top 126 of each sample receptacle 104 can be grasped by a gripper mechanism of the sample receptacle handling system.

[0125] Each of the receptacle storage areas 216, 218 or receptacle racks 111a-111h may be configured to hold any suitable number of sample receptacles 104, such as 50-500, 10-100, 10-50, etc., per first receptacle storage area and / or per second receptacle storage area 216, 218 or per rack 111a-111h.

[0126] A "row" of receptacle holding locations may refer to a portion of a row of receptacle holding locations 236 in the first receptacle storage area 216 or the second receptacle storage area 218, such as row 220 in a single rack 111a shown in FIG. 4, or a "row" may refer to an entire line of receptacle holding locations extending from the third side 212 to the fourth side 214 of the first receptacle storage area 216 or the second receptacle storage area 218.

[0127] The second side 106 of the first receptacle storage area 216 is spaced from the first side 208 of the second receptacle storage area 218 to form a first receptacle transport path 224 that extends across the input station 106a between the third side 212 and the fourth side 214. The input station 106a may also include a second receptacle path 226 that extends between the first side 204 and the second side 206 of the first receptacle storage area 216. The second receptacle path 226 may include a row of empty receptacle holding stations 236, and the sample receptacle handling system 130a of the input station 106a is controlled not to place a sample receptacle 104 in any of the receptacle holding stations 236 in the second receptacle path 226. Alternatively, second receptacle path 226 may include a gap between two portions of first receptacle storage area 216, such as the gap between receptacle racks 111c and 111d.

[0128] The sample receptacle handling system 130a of the input station 106a is configured to remove sample receptacles 104 from the receptacle storage areas 216, 218 and transport each removed receptacle 104 to a respective sample receptacle holder 118 supported on the main conveyor line 184 or branch line 182a of the conveyor track 119.

[0129] In an embodiment, each analyzer station 106e may be configured to process a fluid sample 102 contained in a sample receptacle 104 by performing an analytical test on at least an aliquot of the sample. Such tests may include molecular assays (e.g., nucleic acid-based assays), sequencing assays, immunoassays, chemical analyses, and the like. Non-limiting examples of such analyzer stations 106e are described in U.S. Pat. Nos. 8,731,712 and 9,732,374, and WO 2019 / 014239, and embodied in the PANTHER® and PANTHER FUSION® systems available from Hologic, Inc. (Marlborough, Massachusetts). Each analyzer station 106e may include a sample receptacle handling system 130e configured to transfer a sample receptacle 104 from a sample receptacle holder 118 on a conveyor system 108 to the analyzer station 106e. The sample receptacle handling system 130e may also be configured to transfer sample receptacles 104 from the analyzer station 106e to sample receptacle holders 118 on the conveyor system 108 for further processing. In the illustrated embodiment, each analyzer station 106e may be configured to accept sample receptacles 104 by automatic loading (using the conveyor system 108) or manual loading via a sample bay (not shown). An example of automatic loading of sample receptacles is described in WO 2020 / 226969.

[0130] The analyzer station 106e may be specialized or redundant to allow for a higher throughput of analytical tasks on the fluid sample 102 contained in the sample receptacle 104. Typically, the analyzer station 106e extracts the liquid or liquefied fluid sample 102 from the sample receptacle 104 and combines the fluid sample 102 with reagents in a reactor, such as a cuvette, tube, vial, microtiter plate, etc., which may then be sealed, capped, or otherwise closed. After combining the sample with the reagents, the contents of the reactor are subjected to a set of test conditions.

[0131] The controller 105, which may operate in conjunction with the analyzer station controllers 105e1 and 105e2, may be programmed to schedule the processing of fluid samples 102 at the analyzer station 106e, including determining whether a particular sample receptacle 104 is diverted from the main conveyor line 184 to a branch line 182e associated with a particular analyzer 106e. Exemplary programming and methods for scheduling the processing of fluid samples at the analyzer stations are described in International Application No. PCT / US2021 / 028722.

[0132] The sample preparation station 106d is configured to prepare the fluid sample 102 contained in the sample receptacle 104 for testing at one or more of the analyzer stations 106e. For example, the sample preparation station 106d may be an aliquoting module configured to transfer a portion of the fluid sample 102 from one type of sample receptacle (e.g., a receptacle having a different shape or volume than the sample receptacle 104) to another type of sample receptacle (e.g., the sample receptacle 104) for use by at least one of the analyzer stations 106 to perform tests on the transferred fluid sample 102. An exemplary aliquoting module is described in U.S. Pat. No. 9,335,336. The sample preparation station 106 may also combine the fluid sample 102 (or a portion thereof) with a reagent from another receptacle (e.g., a bulk reagent receptacle) to prepare the fluid sample 102 for testing at at least one of the analyzer stations 106. Thus, the sample preparation station 106d may include one or more pipettors (not shown) that aspirate and dispense fluid samples 102 and / or reagents. A non-limiting example of a sample preparation station 106d is the TOMCAT® instrument sold by Hologic, Inc. of Marlborough, Massachusetts. The sample preparation station 106d may include a sample receptacle handling system 130d configured to transfer sample receptacles 104 from the sample preparation station 106d to sample receptacle holders 118 on the conveyor system 108 for further processing.

[0133] The storage station 106h, which may function as a receptacle storage module, is configured to automatically load, store, and unload sample receptacles 104, such as completed sample receptacles 104 (i.e., sample receptacles 104 housing fluid samples 102 for which a workflow has been completed) and / or sample receptacles 104 housing fluid samples 102 that are tested infrequently (sample receptacles requiring the same test are stored until a sufficient number of such fluid samples 102 are present for testing). The storage station 106h is configured to handle and store multiple receptacle racks 111 (or other receptacle racks configured to hold multiple sample receptacles 104). Some racks 111 may be filled to capacity with sample receptacles 104, and other racks may have openings to accept additional sample receptacles 104 stored in the storage station 106h. The sample receptacle handling system 130h of the storage station 106h is configured to transfer sample receptacles 104 from the sample receptacle holders 118 on the conveyor system 108 to receptacle racks 111 in the storage system 106h for storage of such sample receptacles 104. The sample receptacle handling system 130h may also be configured to transfer stored sample receptacles 104 from the receptacle racks 111 in the storage system 106h to the sample receptacle holders 118 to load such sample receptacles 104 onto the conveyor system 108 for further processing. Exemplary storage stations, as well as other features of an automated analytical system for processing fluid samples, are disclosed in International Application No. PCT / US2021 / 028721.

[0134] The decapping station 106c is configured to remove the caps 107 from the sample receptacles 104 (one example is shown in FIG. 2A ) prior to processing the fluid sample 102 contained therein. Examples of suitable decapping stations are described in U.S. Patent Nos. 6,321,619 and 7,152,504. In the illustrated embodiment, the decapping station 106c is disposed along the main conveyor line 184 before the sample preparation station 106d and the analyzer station 106e. The decapping station 106c may include a sample receptacle handling system 130c configured to transfer the sample receptacles 104 from the sample receptacle holders 118 on the conveyor system 108 to the decapping station 106c. The sample receptacle handling system 130c may also be configured to transfer the sample receptacles 104 from the decapping station 106c to the sample receptacle holders 118 on the conveyor system 108 for further processing. The decapping station 106c may be capable of removing different types of caps from the capped sample receptacles 104, and in some embodiments, the decapping station 106c may be capable of removing only a single type of cap 107 from the sample receptacle 104. In the latter case, multiple decapping stations 106c may be provided along the main conveyor line 184, each capable of removing a different type of cap 107 from the capped sample receptacle 104. Additionally, the sample receptacles 104 may have puncturable caps (not shown), and such sample receptacles 104 may bypass or pass through the decapping station 106c and be transported directly to the sample preparation station 106d and / or the analyzer station 106e for processing.

[0135] The capping station 106g is configured to place a cap 107 (e.g., a replacement cap or stopper) on the open-ended sample receptacle 104, for example, after extracting a fluid sample from the sample receptacle 104 of the analyzer station 106e. Examples of suitable capping stations are described in U.S. Patent Nos. 6,321,619 and 7,152,504. In the illustrated embodiment, the capping station 106g is disposed along the main conveyor line 184 and is disposed between the analyzer station 106e on one side and the storage station 106h and the output station 106b on the other side. The capping station 106g may include a sample receptacle handling system 130g configured to transfer the sample receptacle 104 from the sample receptacle holder 118 on the conveyor system 108 to the capping station 106g. The sample receptacle handling system 130g may also be configured to transfer the sample receptacles 104 from the capping station 106g to the sample receptacle holders 118 on the conveyor system 108 for further processing. The capping stations 106g may place different types of caps 107 on the open-ended sample receptacles 104, and in some embodiments, the capping station 106g may only couple a single type of cap 107 to the open-ended sample receptacle 104. In the latter case, multiple capping stations 106g may be provided along the main conveyor line 184, each of which may place a different type of cap 107 on the open-ended sample receptacle 104. The sample receptacles 104 may have puncturable caps (not shown), and such sample receptacles 104 may bypass or pass through the capping station 106g on their way to the storage station 106h or the output station 106b.

[0136] Output station 106b is configured to receive sample receptacles 104 and remove them from conveyor system 108, and may also function as a receptacle storage module. For example, sample receptacles 104 may be removed from track 119 (main conveyor line 184 or branch line 182b) and transferred to output station 106b after their fluid samples 102 have been processed on automated analysis system 100, or because the sample receptacles 104 have been rejected, or for some other reason. Output station 106b is configured to remove sample receptacles 104 from their respective sample receptacle holders 118 on conveyor system 108 using sample receptacle handling system 130b of output station 106b, and place the sample receptacles 104 in receptacle rack 111 (or other receptacle holders). Once the rack 111 is sufficiently filled with sample receptacles 104 , the rack 111 may be removed from the output station 106 , thereby removing the sample receptacles 104 from the automated analysis system 100 .

[0137] Input station 106a will now be described in more detail with reference to Figures 4-8.

[0138] The input station 106a is configured to load sample receptacles 104 containing fluid samples 102 into the automated analysis system 100. In one embodiment, the sample receptacles 104 containing the fluid samples 102 are loaded into the first receptacle storage area 216 and the second receptacle storage area 218, for example, by placing receptacle racks 111a-111h configured to hold a plurality of sample receptacles 104 in the input station 106a. In one embodiment, the input station 106a may include one or more drawers that may be opened, for example, from the second side 202, to provide access to the receptacle holding positions 236 of the first receptacle storage area 216 and the second receptacle storage area 218 or to allow receptacle racks to be placed in or removed from the input station 106a. In one embodiment, receptacle racks 111a, 111b of the first receptacle storage area 216 and receptacle racks 111e, 111f of the second receptacle storage area 218 are supported in a first drawer 232, and receptacle racks 111c, 111d of the first receptacle storage area 216 and receptacle racks 111g, 111h of the second receptacle storage area 218 are supported in a second drawer 234.

[0139] The input station 106a has an input station controller 105a that controls the operation of the input station 106a, and in particular the sample receptacle handling system 130a. After a sample receptacle 104 is removed from a respective receptacle holding position 236 in one of the first and second receptacle storage areas 216 and 218 in the input station 106a, or from a receptacle rack 111a-111h, the removed receptacle 104 is removed from the input station 106a (storage module) and transported to and inserted into a sample receptacle holder 118 on the main conveyor line 184 or on the branch line 182a.

[0140] In one example, a portion 228 of the receptacle holding locations 236 of a first receptacle storage area 216, such as receptacle rack 111a, may be designated to hold STAT sample receptacles requiring urgent processing. Alternatively or additionally, a portion of the receptacle holding locations 236 of a second receptacle storage area 218, such as receptacle rack 111e, may be designated to hold STAT sample receptacles requiring urgent processing.

[0141] In another example, a portion 230 of the receptacle holding locations 236 of the first receptacle storage area 216, such as receptacle rack 111d, may be designated as a "segregation" section. The receptacle holding locations 236 in the segregation section 230 are initially empty (e.g., rack 111d is loaded into an empty input station 106a), and sample receptacles that have been removed from an input station, but that for one or more reasons cannot be processed by the automated analysis system 100, are returned to the input station 106a by the sample receptacle handling system 130a and placed in a receptacle holding location 236 in the segregation section 230. In an embodiment, the second receptacle path 226 includes a row of receptacle holding positions 236 in the isolation section 230 (e.g., a row of receptacle holding positions 236 in the receptacle rack 111d), and the sample receptacle handling system 130a is controlled not to place the sample receptacle 104 at any of the receptacle holding stations 236 in the second receptacle path 226.

[0142] The input station 106a may include or be associated with systems and / or subsystems for characterizing the sample receptacle to determine sample receptacle properties of the sample receptacle 104 used to generate sample receptacle data. For example, such characterization systems and / or subsystems of the input station 106a may determine the sample receptacle height, diameter, bottom profile, fluid level / headspace (if the receptacle is not capped), tilt angle of the sample receptacle 104 relative to the receptacle holder 118, and barcode ID within the sample receptacle 104. An input station including such systems and subsystems, such as a fluid level measurement system and a sample receptacle detector system, is described in International Application No. PCT / US2021 / 028719. The sample receptacle data may be transmitted to the conveyor controller 105j, which may convey the sample receptacle data to the main controller 105i for instructions. In an embodiment, the main controller 105i running software calls the workflow management software may determine an open test order for the sample receptacle 104 and send routing instructions for the sample receptacle 104 to the conveyor controller 105j. The main controller 105i running the workflow management software instructs the conveyor controller 105j running the line controller software which station 106 the sample receptacle 104 should be routed to next in the workflow. The conveyor controller 105j running the line controller software then handles all the low level logic and communication with the conveyors and individual station controllers 105 (PLCs) to physically route the sample receptacle 104 to the correct station 106. When the sample receptacle 104 arrives at the correct station 106, the station controller 105 queries the conveyor controller 105j and the line controller software as to where to route the sample receptacle 104 next. The line controller software then queries the workflow management software.The workflow management software searches the stored metadata for the sample receptacle 104 to determine the next station 106 to which the sample receptacle 104 should then be routed, and the process continues.

[0143] The input station controller 105a is operably coupled to the components of the input station 106a to receive data signals of the components, process the data signals, and control operation of the input station 106a based on the data signals and programmed algorithms for moving sample receptacles into and out of the input station 106a in a space-time efficient manner while minimizing the possibility of contamination between the sample receptacles 104.

[0144] FIG. 5 is a top schematic view of input station 106a, and FIG. 6 is a perspective view of a conveyor track 119 supporting multiple receptacle holders 118, one of which is loaded with a sample receptacle 104 and associated components adjacent input station 106a (input station 106a is not visible in FIG. 6).

[0145] 5 and 6, the sample receptacle handling system 130a of the input station 106a may include a gripper robot including a mechanical gripper 131 configured to grip individual sample receptacles 104 in the receptacle holding locations, and a gripper mover 250 configured to move the gripper in a vertical direction and an orthogonal horizontal direction to move the sample receptacles 104 from the first receptacle storage area 216 or the second receptacle storage area 218 to respective sample receptacle holders 118 on the main conveyor line 184 or the branch line 182a of the conveyor track 119. The gripper robot may be any suitable robot for removing sample receptacles 104 from the receptacle holding locations 236 and inserting them into the sample receptacle holders 118, such as a pick-and-place robot including opposed translatable gripper fingers 131a, 131b, etc. Gripper fingers 131 a, 131 b may have gripper segments 132 a, 132 b at their respective distal ends, each of which may include a gripper face (only one gripper face 133 is visible in FIG. 6 ) that contacts an opposing wall 112 of receptacle 104 when a receptacle is gripped between gripper fingers 131 a, 131 b. The gripper robot may be configured to move mechanical gripper 131 and any receptacle 104 held thereby in a vertical or Z direction, e.g., to move receptacle 104 into and out of a receptacle holding position, and in horizontal X and Y directions, e.g., to move receptacles into and out of input station 106 a and into and out of receptacle holders 118 on main conveyor line 184 or branch line 182 a of conveyor track 119. In an exemplary embodiment, the gripper mover 250 may include a first gantry 252 configured to extend across the input station 106a in the X direction and move in the Y direction or back-and-forth direction, and a second gantry 254 configured to extend in the Y direction and move in the X direction or side-to-side direction.The mechanical gripper 131 is positioned below the first gantry 252 and the second gantry 254, and the gripper mover 250 includes a suitable mechanism such as a piston, lead screw, or belt for actuating the gripper in the vertical or Z direction.

[0146] An exemplary mechanical gripper 131 is described in US Provisional Application No. 63 / 104,401.

[0147] Generally, to transport sample receptacles 104 from input station 106a to receptacle holders 118 on main conveyor line 184 or branch line 182a of conveyor track 119, receptacle handling system 130a is configured and controlled by controller 105a to selectively:

[0148] (a) positioning a mechanical gripper 131 having a first gantry 252 and a second gantry 254 above a selected receptacle 104 held in a corresponding receptacle holding position 236;

[0149] (b) releasing the gripper fingers 131a, 131b such that the spacing between the gripper faces 133 of the gripper segments 132a, 132b is greater than the width of the selected receptacle 104 or associated cap 107;

[0150] (c) lowering the mechanical gripper 131 by the mover 250 to position the gripper segments 132a, 132b of the gripper fingers 131a, 131b adjacent the opposing walls 112 of the receptacle 104;

[0151] (d) closing the gripper fingers 131a, 131b to grip the selected receptacle 104 between the gripper segments 132a, 132b;

[0152] (e) raising the mechanical gripper 131 by the mover 250 to lift the receptacle 104 from the receptacle holding position 236;

[0153] (f) translating the mechanical gripper 131 and the receptacle 104 held thereby horizontally, together with one or both gantries 252, 254, past the first side 200 of the input station 106a to a position above the receptacle holder 118 on the conveyor track 119;

[0154] (g) lowering mechanical gripper 131 by mover 250 to insert receptacle 104 into receptacle holder 118;

[0155] (h) opening the gripper fingers 131 a, 131 b such that the spacing between the gripper faces 133 of the gripper segments 132 a, 132 b is greater than the width of the selected receptacle 104 or associated cap 107; and

[0156] (i) With the mover 250 away from the receptacle 104, the mechanical gripper 131 is raised.

[0157] 6, a sample receptacle detector system 134 including a detector 136 may be positioned and configured to detect physical characteristics of the sample receptacle 104 before the sample receptacle 104 is inserted into the sample receptacle holder 118 or after the sample receptacle 104 is inserted into the sample receptacle holder 118. For example, in the former case, the mechanical gripper 131 of the input station 106a may retrieve the sample receptacle 104 from within the input station 106a and move the sample receptacle 104 into a detection zone of the detector 136, which is actuated to detect one or more physical characteristics of the sample receptacle 104. In the latter case, the loaded sample receptacle 118 is moved on the main conveyor line 184 or branch line 182a of the conveyor track 119 to a detection zone of the detector 136, and the detector 136 is activated to detect one or more physical characteristics of the sample receptacle 104.

[0158] The detector 136 may include at least one high-resolution detector capable of sub-millimeter resolution. The at least one high-resolution detector 136 may be a wide laser measurement sensor also known as a "laser curtain" (e.g., ZX-GT Smart Sensor manufactured by OMRON® Corp.), a two-dimensional laser profiler, an imaging device (e.g., CCD sensor-based camera or CMOS sensor camera), or a single-point distance measurement sensor (e.g., confocal displacement sensor CL-3000 series manufactured by KEYENCE).

[0159] The detector 136 may include an array of optical sensors, such as optical sensors 140a, 140b, arranged in vertical alignment, and the sample receptacle 104 may be positioned in a detection zone of the array of optical sensors to detect the height of the sample receptacle 104. The optical sensors 140a and 140b may be reflective sensors with built-in emitters / receivers, reflective fiber optic sensors, or the like. The sample receptacle detector system 134 may determine the height of the sample receptacle 104 from among several different expected heights by determining whether the optical sensors 140a or 140b (or additional sensors) are interrupted by a portion of the sample receptacle 104 when the sample receptacle 104 is inserted into the detection zone of the array of optical sensors. If the receptacle detector system 134 includes a high-resolution detector 136, the high-resolution detector may be in addition to or instead of the array of optical sensors 140a, 140b. Unlike an array of optical sensors, the high resolution detector 136 may be used to detect the shape of the sample receptacle 104 or to determine the dimensions of the sample receptacle 104 .

[0160] By knowing the height of the sample receptacle 104, the corresponding volume capacity of the sample receptacle 104 can also be known.

[0161] The sample receptacle detector system 134 may include one or more cap detectors 135 (positioned to detect caps 107 associated with different sized sample receptacles 104) to determine the presence or absence of a cap by determining whether the sample tube 104 has a cap 107 secured to its open top 116. The cap detector 135 may be a reflective fiber optic sensor, an emitter / receiver pair sensor, or other suitable sensor. The sample receptacle detector system 134 may also be configured to send an output signal to the controller 105 representative of the cap status of the sample tube 104.

[0162] The fluid level measurement system 144 includes a distance sensor 146 configured to measure the distance from the sensor to a feature. The distance sensor 146, which may have a beam columnator 147, is directed vertically downward and measures the vertical distance from the distance sensor 146 to a surface, such as the rim 114 of the sample receptacle 104 (which is known or determined to not have a cap secured to the open end 116 of the sample receptacle 104), the top surface 103 of the fluid sample 102, or other desired surface. The fluid level measurement system 144 may also include one or more cap detectors 135 to determine the presence or absence of a cap by determining whether the sample tube 104 has a cap 107 secured to its open top 116 (the cap detectors 135 are positioned to detect caps 107 associated with different sized sample receptacles 104). An exemplary fluid level measurement system is described in International Application No. PCT / US2021 / 028719.

[0163] In an embodiment, the distance sensor 146 may be supported by a horizontal linear translator 150. The horizontal linear translator 150 may be a linear stage that controllably moves the distance sensor 146 relative to the fixed sample receptacle 104 and provides a horizontal stage position signal representative of the horizontal position of the stage 150. Thus, the horizontal position of the distance sensor 146 may be determined from the horizontal stage position signal. The horizontal linear translator 150 may be operably coupled to an input station controller 105a that controllably actuates the horizontal linear translator 150 and receives the horizontal stage position signal.

[0164] The distance sensor 146 may also be supported by a vertical linear translator stage 156 that is operated by a stage motor 155 and moves the distance sensor 146 vertically relative to the sample receptacle 104. The vertical linear translator 156 adjusts the position of the distance sensor 146 so that it is positioned within the ranging range of the distance sensor 146. The vertical linear translator 156 may also be a linear stage that controllably moves the distance sensor 146 vertically relative to the fixed sample receptacle 104 and provides a vertical stage position signal representative of the vertical position of the stage. Thus, the vertical position of the distance sensor 146 may be determined from the vertical stage position signal. The vertical linear translator 156 may be operably coupled to a controller 105a that controllably actuates the vertical linear translator 156.

[0165] To accurately position and orient the sample receptacle 104 to perform a measurement scan of the sample receptacle 104 and the fluid sample 102, the fluid level measurement system 144 may also include a receptacle clamp 152 configured to grip the sample receptacle 104 and center the sample receptacle 104 in a measurement position. The receptacle clamp 152 positions the center of the sample receptacle 104 on the scanning axis of the distance sensor 146 and the horizontal linear translator 150. This ensures that the distance sensor 146 consistently measures the sample receptacle 104 along the center of the sample receptacle 104. For example, in the case of sample tubes 104, the distance sensor 146 scans along the diameter of each sample tube 104, as shown in FIGS. 2A-2B. The receptacle clamp 152 is configured to orient the sample receptacle 104 vertically so that the central axis of the sample receptacle 104 is approximately vertical during a measurement scan. Nonetheless, if the receptacle clamp 152 improperly grips (or does not grip) the sample receptacle 104, it is possible that the sample receptacle 104 will be tilted at an angle to the vertical when received within the sample receptacle holder 118. Because of this possibility, a measurement scan may be performed using the distance sensor 146 to (i) determine the level of the fluid sample 102 relative to the rim 114 and / or (ii) determine the tilt angle of the sample receptacle 104, as described herein.

[0166] The sample receptacle detector system 134 may also include a reader (not shown) configured to read machine-readable indicia 139 (see FIG. 2B), such as a bar code, machine-readable text, etc., on the sample receptacle 104. The indicia may be oriented horizontally as shown, or the indicia may be rotated 90 degrees and oriented vertically. Alternatively or additionally, the reader 137 may be located on (or otherwise associated with) the fluid level measurement system 144 of the input station 106a, as shown in FIG.

[0167] It is important to avoid sample contamination due to sample material falling from one receptacle 104 into another receptacle 104 while the receptacles 104 are being transferred to or from the receptacle storage areas 216, 218 in the input station 106a by the sample receptacle handling system 130a.

[0168] Furthermore, to maximize the storage capacity of the input station 106a (or other receptacle storage module) while minimizing the footprint, the receptacle holding locations 236 are positioned as close as possible to each other, with the space between adjacent receptacle holding locations 236 preferably being smaller than the width (or diameter) of the narrowest sample receptacle held in the input station 106a. Thus, when a sample receptacle is transferred from the input station 106a to the main conveyor line 184 or the branch line 182a of the conveyor track 119, it is inevitable that at least a portion of the sample receptacle will pass through a receptacle holding location between the receptacle holding location from which the receptacle was removed and the conveyor track. Ideally, sample receptacles do not need to pass over other sample receptacles, thereby avoiding a potential source of contamination and reducing the height to which receptacles must rise during transfer to the conveyor track 119.

[0169] Thus, in an embodiment, the sample receptacle handling system 130a, controlled, for example, by the input station controller 105a, moves each sample receptacle 104 from its respective receptacle holding position 236 of each receptacle holding area 216, 218 or each receptacle rack such that the transferred receptacle does not pass any other sample receptacles, and preferably passes directly from its respective receptacle holding position 236 onto the first side 204 of the first receptacle storage area 216 or onto the first side 208 of the second receptacle storage area 218, without passing over the third side 212 or fourth side 214 of the first receptacle storage area 216 or the second receptacle storage area 218. If the sample receptacle 104 is moved onto the third side 212 or fourth side 214 of the storage areas 216 or 218 en route to the conveyor track 119, rather than directly onto the first side 204 of the first receptacle storage area 216 or the first side 208 of the second receptacle storage area 218, the input station 106a must be widened or space must be provided between the input station 106a and an adjacent station (e.g., output station 106b) to accommodate the movement of the receptacle along the third or fourth side.

[0170] 7 illustrates a receptacle holding position naming convention for describing a receptacle transfer algorithm that controls the transfer of sample receptacles 104 from each receptacle holding position 236 of the first receptacle storage area 216, or from each receptacle rack 111a, 111b, 111c, 111d of the first receptacle storage area 216, or from each receptacle holding position 236 of the second receptacle storage area 218, or from each receptacle rack 111e, 111f, 111g, 111h of the second receptacle storage area 218 to the receptacle holders 118 on the conveyor track 119. The individual receptacle holding positions of the first receptacle storage area 216 are designated by P i,jand is a receptacle-holding position 236 in row i (i=1-m) and column j (j=1-n). If a portion of the first receptacle storage area 216, such as rack 111d, is designated as the segregation section 230, then sample receptacles are not transferred from the segregation section 230 to the conveyor track 119. Each receptacle-holding position in the second receptacle storage area 218 is designated as P x,y and is a receptacle holding position 236 in row x (where x=1-o, where o may or may not be equal to m), column y (where y=1-p, where p may or may not be equal to n).

[0171] To ensure that each sample receptacle 104 is transferred from its respective receptacle holding position onto the first side 204 of the first receptacle storage area 216 or the first side 208 of the second receptacle storage area 218 without passing any sample receptacle 104 held in the receptacle holding position 236 between the respective receptacle holding position 236 and the first side 204 or first side 208, the sample receptacles 104 need to be removed from the receptacle storage areas 216, 218 in a defined order such that the sample receptacle 104 has previously been removed from any sample receptacle holding position 236 through which the transferred sample receptacle 104 must pass. That is, the sample receptacle handling system 130a is configured and controlled to transport the sample receptacles 104 from the receptacle holding positions 236 to the conveyor track 119 such that the order in which the sample receptacles 104 are removed and the path that each sample receptacle 104 traverses is such that each sample receptacle 104 passes only over receptacle holding positions 236 from which a sample receptacle 104 has previously been removed or which do not have a sample receptacle 104 loaded when the storage area is initially loaded (e.g., when a rack not fully loaded with sample receptacles is placed in the storage module).

[0172] The sample receptacle handling system 130a may not be configured to detect the presence or absence of a sample receptacle 104, except that it may detect whether a sample receptacle is disposed between opposing gripper segments 132a, 132b of the gripper fingers 131a, 131b of the gripper 131. Thus, the mechanical gripper 131 of the sample receptacle handling system 130a may be configured to move the sample receptacle 104 between each receptacle holding station P defined by the receptacle transfer algorithm. i,j and P x,y The object must be moved by the mover 250 according to a defined path.

[0173] In one example, the sample receptacles 104 are transferred row by row, starting with the row of the first receptacle storage area 216 closest to its first side 204, or starting with the row of the second receptacle storage area 218 closest to its first side 208, with each row of sample receptacle holding positions 236 being emptied before proceeding to transfer a sample receptacle 104 from the next row.

[0174] Using the above designations, sample receptacles 104 are transferred from the first receptacle storage area 216, or from each of the racks 111a, 111b, 111c, 111d (if rack 111d is not designated as an isolation rack) in the first receptacle storage area 216, in the following order: 1,1 , P 1,2 , P 1,3 , ..., P 1,n , P 2,1 , P 2,2 , P 2,3 , ..., P 2,n , ..., P m,1 , P m,2 , P m,3 , ..., P m,n Each sample receptacle 104 can be transported from its respective receptacle holding position 236 in the Y direction along the row in which the sample receptacle was stored. i,j Each sample receptacle 104 stored in the i,j2 to the first side 204 of the first storage area 216 along row j.

[0175] Similarly, sample receptacles 104 are transferred from the second receptacle storage area 218 or from each of the racks 111e, 111f, 111g, 111h in the second receptacle storage area 218 in the following order: 1,1 , P 1,2 , P 1,3 , ..., P 1,p , P 2,1 , P 2,2 , P 2,3 , ..., P 2,p , ..., P o,1 , P o,2 , P o,3 , ..., P o,p Each sample receptacle 104 can be transported from its respective receptacle holding position 236 in the Y direction along the row in which the sample receptacle was stored. x,y Each sample receptacle 104 stored in the x,y to the first side 208 of the second storage area 218 along row y.

[0176] In another example, the sample receptacles 104 are transferred row by row, starting with the sample receptacle holding position 236 in each row closest to the first side 204 of the first receptacle storage area 216 or closest to the first side 208 of the second receptacle storage area 218, with each row of sample receptacle holding positions 236 being emptied before proceeding to transfer a sample receptacle 104 from the next row. Using the designations above, the sample receptacles are transferred from the first receptacle storage area 216, or from each rack 111a, 111b, 111c, 111d in the first receptacle storage area 216 (if rack 111d is not designated as an isolation rack), in the following order: 1,1 , P 2,1 , P 3,1 , ..., P m,1 , P 1,2 , P 2,2 , P 3,2 , ..., P m,2 , ..., P 1,n, P 2,n , P 3,n , ..., P m,n Each sample receptacle 104 may be transported from its respective receptacle holding location 236 in the Y direction along the row in which the sample receptacle was stored. That is, each sample receptacle 104 stored in location Pi,j is transported from location Pi,j along row j to the first side 204 of the first storage area 216.

[0177] Similarly, sample receptacles 104 are transferred from the second receptacle storage area 218 or from each of the racks 111e, 111f, 111g, 111h in the second receptacle storage area 218 in the following order: 1,1 , P 2,1 , P 3,1 , ..., P o,1 , P 1,2 , P 2,2 , P 3,2 , ..., P o,2 , ..., P 1,p , P 2,p , P 3,p , ..., P o,p Each sample receptacle 104 can be transported from its respective receptacle holding position 236 in the Y direction along the row in which the sample receptacle was stored. x,y Each sample receptacle 104 stored in the x,y to the first side 208 of the second storage area 218 along row y.

[0178] FIG. 8 illustrates an exemplary path for transferring a sample receptacle from a first receptacle storage area 216 to a conveyor track 119 (main conveyor line 184 or branch line 182a) and transferring a sample receptacle from a second receptacle storage area 218 to the conveyor track 119. Although FIG. 8 includes reference number 106a corresponding to an input station, the path illustrated in FIG. 8 may be implemented in any receptacle storage module in which the receptacle transfer algorithms and mechanisms described herein may be implemented, including storage station 106h and output station 106b. A dashed arrow 260 indicates the third row, second column (P3,2 1 represents a path from receptacle holding locations in receptacle rack 111a of first row 204 through the first side 204 of first receptacle holding area 216. In the illustrated embodiment, first receptacle storage area 216 is emptied one row at a time, with each of the receptacle holding locations in the first two rows of rack 111a and the first receptacle holding location in the third row of rack 111a being empty, as indicated by the "X" across the circles representing each receptacle holding location, illustrating the process by which sample receptacles 104 in each rack are transferred row by row, beginning with the row closest to the first side 204, and beginning with the column within each row closest to the third side 212. A sample receptacle moving from its respective receptacle holding location on the first side 204 of the first receptacle storage area 216 onto the track 119 other than the first row of receptacle holding locations of the first receptacle storage area (i.e., row i=1 closest to the first side 204 of the first receptacle storage area) must pass over one or more other receptacle holders, referred to herein as intervening receptacle holders. To avoid having to pass over another sample receptacle, a sample receptacle in each intervening receptacle holding location between the respective receptacle holding location and the first side of the first receptacle storage area must be removed before another sample receptacle passes over the receptacle holding location.

[0179] The dashed arrow 262 indicates the second row, third column (P 2,31 represents a path from receptacle holding locations in receptacle rack 111e of the first row through the front surface 208 of the second receptacle holding area 218. In the illustrated embodiment, the second receptacle storage area 218 is emptied one row at a time, with each of the receptacle holding locations in the first row of rack 111e and the first two receptacle holding locations in the second row of rack 111e being empty, as indicated by the "X"s across the circles representing each receptacle holding location, illustrating the process by which the sample receptacles 104 in each rack are transferred row by row, beginning with the row closest to the front surface 208 and, within each row, beginning with the column closest to the third side 212. A sample receptacle moving from its respective receptacle holding location on the first side 208 of the second receptacle storage area 218 to the first receptacle transport path 224 other than the receptacle holding locations in the first row of the second receptacle storage area (i.e., the row x=1 closest to the first side 208 of the second receptacle storage area) must pass over one or more other receptacle holders, referred to herein as intervening receptacle holders, between its respective receptacle holding location and the first side of the second receptacle storage area. To avoid having to pass over another sample receptacle, the sample receptacle at each intervening receptacle holding location must be removed before another sample receptacle passes over the receptacle holding location.

[0180] As represented by dashed arrow 264 in FIG. 8, the sample receptacle 104 is inserted into a receptacle holding station 236 in the second receptacle storage area 218, such as receptacle holding station P 2,3After being moved from the first receptacle storage area 216, the sample receptacle is moved by the sample receptacle handling system 130a along the first receptacle transport path 224 until the sample receptacle is aligned with the second receptacle transport path 226. If the sample receptacle is being transferred from a receptacle holding station in a row of the second receptacle storage area 218 that is already aligned with the second receptacle transport path 226, the movement represented by arrow 264 is not necessary. As represented by dashed arrow 266 in FIG. 8, the sample receptacle is moved by the sample receptacle handling system 130a along the second receptacle transport path 226 from the second side 206 of the first receptacle storage area 216 past the first side 204 of the first receptacle storage area 216 to the conveyor track 119. Because the sample receptacle 104 moves over the first receptacle storage area 216 via the second receptacle transport path 226, it is not necessary for the sample receptacle 104 to be removed from the first receptacle storage area 216 before the sample receptacle is removed from the second receptacle storage area 218. Thus, it is immaterial whether the first receptacle storage area 216 or the second receptacle storage area 218 is emptied first.

[0181] If the input station 106a includes a STAT section, e.g., a section of the first receptacle storage area 216, such as receptacle rack 111a, the sample receptacle handling system 130a may be controlled to remove all sample receptacles 104 from the STAT section (i.e., non-STAT sample receptacles) before removing sample receptacles 104 from any other section or rack of the input station 106a. Thus, all sample receptacles 104 are transferred from the input station 106a before any other non-STAT sample receptacles 104 are transferred from the remainder of the first receptacle storage area 216 out of the input station 106a or before any additional non-STAT sample receptacles are transferred from the second receptacle storage area 218 out of the input station 106a.

[0182] Input station 106a may be configured such that sample receptacles 104 may be added to a portion of first receptacle storage area 216 or second receptacle storage area 218 while the sample receptacle is being transferred out of input station 106a from another portion of the receptacle storage area by sample receptacle handling system 130a. For example, as described above, racks 111a and 111b of first receptacle storage area 216 and racks 111e and 111f of second receptacle storage area 218 may be supported in first drawer 232, and receptacle racks 111c and 111d of first receptacle storage area 216 and receptacle racks 111g and 111h of second receptacle storage area 218 may be supported in second drawer 234, as shown in FIG. The first drawer 232 can be opened and one or more of its receptacle racks can be replaced with receptacle racks holding new sample receptacles 104 while the sample receptacles 104 in the second drawer 234 are being transferred from the input station 106a by the sample receptacle handling system 130a. Additionally, the second drawer 234 can be opened and one or more of its receptacle racks can be replaced with receptacle racks holding new sample receptacles 104 while the sample receptacles 104 in the first receptacle storage area 216 in the first drawer 232 are being transferred from the input station 106a by the sample receptacle handling system 130a.

[0183] Thus, after all sample receptacles 104 in the STAT section 228 (e.g., rack 111a) have been transferred from the input station 106a, it is possible that additional sample receptacles may be added to the STAT section 228 before all sample receptacles have been transferred out of the input station 106a from other non-STAT sections of the second receptacle storage area 218 while non-STAT sample receptacles 104 from another section of the second receptacle storage area 218 are being transferred from the input station 106a by the sample receptacle handling system 130a. If a new sample receptacle 104 is added to the STAT section of the input station 106a while a sample receptacle is being transferred from a non-STAT section of the input station 106a, the sample receptacle handling system 130a can be controlled to transfer the newly added sample receptacle to the STAT section out of the input station 106a before resuming the transfer of sample receptacles from other non-STAT sections of the input station 106a. For example, assume that the sample receptacle rack 111a is a STAT receptacle rack. After the rack 111a is initially emptied by the sample receptacle handling system 130a, the drawer 232 can be opened and new sample receptacles can be added to the rack 111a, or the rack 111a can be replaced with a rack containing additional sample receptacles 104, and the sample receptacle 104 is transferred out of the input station 106a from one of the receptacle racks in the drawer 234. In this case, after drawer 232 is closed, sample receptacle handling system 130a can be controlled to transfer the sample receptacle from receptacle rack 111a out of input station 106a before transferring any other non-STAT sample receptacles from input station 106a.

[0184] In an embodiment, the input station 106a may include a switch (e.g., mechanical, optical, magnetic) or other means that is actuated when a STAT sample rack 111a is removed and replaced with a new rack, thereby providing a signal to a controller, e.g., controller 105a, to stop the transfer of sample receptacles from the different sections of the input station 106a and to first transfer sample receptacles out of the input station 106a from the STAT rack 111a that was just replaced. In an embodiment, the controller remembers where it stopped and returns to that different section after transferring the sample receptacles newly added to the STAT rack 111a.

[0185] As mentioned above, the sample receptacle handling system 130a may not be able to detect the presence of a sample receptacle in the receptacle holding station 236, other than being able to detect whether the sample receptacle 104 is disposed between the gripper segments 132a, 132b of the gripper fingers 131a, 131b of the mechanical gripper 131. Thus, in one embodiment, the controller 105a actuates the gripper mover 250 of the sample receptacle handling system 130a to move the mechanical gripper 131 to a first receptacle holding position of the STAT section (e.g., STAT section 228). 1,1The mechanical gripper 131 is then programmed to position the sample receptacle 104 in the first receptacle-holding position (first row and first column of the first receptacle-holding position), for example, by positioning the gripper fingers 131 a, 131 b in an open configuration with the gripper segments 132 a, 132 b disposed adjacent opposing sides of the top of the sample receptacle that projects above the first receptacle-holding position, and then closing the opposing gripper fingers to grip opposing sides of the sample receptacle between the gripper segments 132 a, 132 b. The controller 105a may be programmed to determine that there is no sample receptacle at that receptacle holding position if the opposing gripper fingers 131a, 131b of the mechanical gripper 131 are close to a position where the gripper faces 133 of the gripper segments 132a, 132b are spaced apart a distance less than the width of the narrowest sample receptacle held at the input station 106a. If the controller determines that there is no sample receptacle 104 at that sample receptacle position, the controller 105a actuates the gripper mover 250 to move the mechanical gripper 131 to a second receptacle holding position of the STAT section (e.g., STAT section P). 1,2 The mechanical gripper 131 is then actuated to attempt to pick up a sample receptacle at the second receptacle holding position, as described above, and if the sample receptacle is not located at the second receptacle holding position, the controller 105a actuates the gripper mover 250 to move the mechanical gripper 131 to a third receptacle holding position of the STAT section (e.g., the first row and second column of the STAT section). 1,3This process of attempting to grasp a sample receptacle at successive receptacle holding locations is repeated a prescribed number of times (e.g., 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, or more times), and if a sample receptacle is not detected at a predetermined number of successive receptacle holding locations, the controller is programmed to operate the sample receptacle handling system to attempt to pick up a sample receptacle at a different receptacle storage area or a different receptacle rack.

[0186] On the other hand, if a sample receptacle 104 has been gripped by the mechanical gripper 131, the gripped sample receptacle is removed from its respective receptacle holding position and transferred from the receptacle holding position 236 to a receptacle holder 118 on the main conveyor line 184 or branch line 182a of the conveyor track 119. After the sample receptacle is successfully transferred from the input station 106a, the controller 105a actuates the gripper mover 250 to position the mechanical gripper 131 to the next receptacle holding position (e.g., the same row, next column or next row, same column of the STAT section).

[0187] Using the fluid level measurement system 144, the input station controller 105a is further configured to determine whether the relative fluid level in the sample receptacle 104 is outside of a predetermined range or exceeds a predetermined set level. The term "above" in this context means that the level of fluid in the sample receptacle 104 is higher than a predetermined, programmed, or otherwise set level. Furthermore, the input station controller 105a, the input station 106a, and / or the automated analysis system 100 may be configured to quarantine the sample receptacle 104 if the relative fluid level in the sample receptacle 104 is determined to be outside of a predetermined range or exceeds a predetermined level. As described above, the input station 106a may include a portion of the first receptacle storage area 216 that includes a contiguous group of receptacle holding locations 236 designated as an isolation section 230, such as isolation rack 111d, into which the sample receptacle handling system 130a of the input station 106a places sample receptacles 104 that need to be isolated. For example, a predetermined maximum level of relative fluid level may be set (i.e., a minimum head space) to reduce the risk of spilling or splashing of fluid sample 102 from sample receptacle 104, which could contaminate other sample receptacles 104 or components of system 100 if the sample receptacle 104 is not capped. If the input station controller 105a determines, via the fluid level measurement system 144, that the fluid level in the sample receptacle 104 is above the maximum level and there is not enough headspace in the sample receptacle 104, the sample receptacle handling system 130a removes the sample receptacle 104 from the receptacle holder 118 on the conveyor track 119 (main conveyor line 184 or branch line 182a) and places the sample receptacle 104 in a receptacle holding position 236 in the isolation section 230 of the input station 106a.In an embodiment, the sample receptacle handling system 130a is configured to operate at a slower than normal speed when transporting a sample receptacle whose fluid level has been determined to exceed a maximum to reduce the possibility of spillage while the sample receptacle is transported to the isolation section. Similarly, a predetermined minimum level of fluid level may be set, for example, to ensure that there is enough fluid sample 102 in the sample receptacle 104 to be processed by an automated analysis system (e.g., to perform one or more tests on one or more of the analyzer stations 106e). If the input station controller 105a determines that the fluid level of the sample receptacle 104 is below a minimum level such that there is insufficient sample material contained in the selected sample receptacle, the sample receptacle 104 can be moved to the isolation section 230 in the same manner as a sample receptacle 104 having a fluid level that exceeds a maximum level. An initially empty isolation section 230 (eg, rack 111d) can be positioned for manual removal from the isolation area of ​​input station 106a, for example, when second drawer 234 is open.

[0188] If the second receptacle transport path 226 extends across the isolation section 230, the input station controller 105a is programmed not to place any isolated sample receptacles in any receptacle holding stations encompassed by the second receptacle transport path 226.

[0189] The input station controller 105a may also be configured to release the sample receptacle 104 for processing on the automated analysis system 100 if the relative fluid level is determined to be within a predetermined range or below a predetermined level. For example, the input station controller 105a may be configured to release the sample receptacle if the relative fluid level is determined to be below a predetermined maximum level of the relative fluid level.

[0190] The input station controller 105a may also be configured to isolate the sample receptacle if the tilt angle is determined to be outside of a predetermined tilt angle range or to exceed a predetermined tilt angle. For example, the input station controller 105a may be programmed to isolate the sample receptacle if the tilt angle is determined to be greater than 2°, greater than 5°, or greater than 10° relative to the central axis of the sample receptacle. Exemplary methods for determining the tilt angle are described in International Application No. PCT / US2021 / 028719.

[0191] The input station controller 105a may also be configured to release the sample receptacle if the tilt angle is determined to be within a predetermined range of tilt angles. For example, the input station controller 105a may be programmed to release the sample receptacle 104 if the tilt angle is determined to be less than 2°, less than 5°, or less than 10° (or less than some other predetermined maximum tilt) relative to the central axis of the sample receptacle.

[0192] Other reasons why a sample receptacle 104 may be transferred from a receptacle holder 118 on the conveyor track 119 to an isolation area of ​​the input station 106a include insufficient information stored in the system database for the selected sample receptacle 104 or an inability to read the machine-readable information on the selected sample receptacle 104. The input station controller 105a may also be configured to isolate a sample receptacle if there is a liquid level detection error while attempting to read the liquid level in the fluid level measurement system 144, if there is a read error while attempting to read the machine-readable label on the receptacle by the reader 137 (e.g., a missing label or an unreadable barcode due to a torn or crumpled label), if patient information corresponding to the receptacle label is not found, if there is no open test order for the identified patient, if the receptacle 104 is not properly seated in the carrier 118, or if the receptacle cannot be processed by any of the analyzer stations 106e for any reason.

[0193] When a sample receptacle is automatically transferred from track 119 to a rack or other receptacle storage area of ​​output module 106b by sample receptacle handling system 130b of output station 106b, the sample tube is also transferred so that the tube is not transferred onto another tube already stored in output module 106b. Using the convention shown in Figure 4 for input station 106a, the side of output station 106b closest to track 119 (main conveyor line 184 or branch line 182b) is the rear of output station 106b, and the side of output station 106b furthest from track 119 is the front of output station 106b. To avoid sample receptacles passing over other sample receptacles, the sample receptacle handling system 130b is controlled by the output station controller 105b to first fill the sample receptacle holding positions closest to the front of the output station 106b, followed by sample receptacle holding positions located progressively farther from the front of the output station 106b.

[0194] The systems and algorithms described herein improve the operation and efficiency of receptacle storage modules, such as input station 106a, from which receptacles are automatically transferred to an automated conveyor system of an automated analysis system by limiting the vertical and horizontal footprint of the storage module, thereby saving space while reducing the risk of cross-contamination between receptacles and allowing greater flexibility in the order in which sample receptacles are transferred from different areas of the receptacle storage module. To save space horizontally, while maximizing storage capacity, receptacle holding locations are placed close together, with spacing between locations less than the width or diameter of an individual receptacle, and receptacles are transferred from the receptacle storage module to the automated conveyor system by a receptacle handling system that passes over the side of the receptacle storage module closest to the automated conveyor system, rather than passing laterally or transversely through the receptacle storage module. To conserve vertical space and reduce the risk of cross-contamination, the sample receptacles are transferred from the receptacle storage module to the automated conveyor system by the receptacle handling system without passing other receptacles held in the receptacle storage structure. This reduces the risk that sample material may spill from one sample receptacle to another, since the sample receptacle being transferred does not pass other sample receptacles. This also limits the height that the transferred receptacle must be lifted while being transferred, since it does not have to be lifted over other receptacles. By providing a first receptacle transport path between the first storage area and the second storage area and a second receptacle transport path through the first receptacle storage area, sample receptacles can be transported to the automated conveyor system from either the first storage area or the second storage area, and it is not important whether the sample receptacle is initially transported from the first receptacle storage area or the second receptacle storage area.

[0195] Exemplary embodiments

[0196] Embodiment 1. A system for storing a plurality of sample receptacles and transferring each sample receptacle from the system without passing through another sample receptacle stored in the system, the system comprising: a first receptacle storage area having opposing first and second sides and opposing third and fourth sides oriented transversely to the first and second sides, the first receptacle storage area including a plurality of receptacle holding locations, each receptacle holding location configured to hold a single sample receptacle, the narrowest receptacle being the narrowest receptacle. a first receptacle storage area, the first receptacle storage area being spaced from any immediately adjacent receptacle holding location by a distance less than a width of the receptacle holding location, the plurality of receptacle holding locations being arranged in a series of parallel rows oriented in a first direction extending from a third side of the first receptacle storage area to a fourth side of the first receptacle storage area and a series of parallel columns oriented in a second direction extending from a first side of the first receptacle storage area to a second side of the first receptacle storage area, has opposing first and second sides and opposing third and fourth sides oriented transversely to the first and second sides, includes a plurality of receptacle holding locations, each receptacle holding location configured to hold a single sample receptacle, and is spaced from any immediately adjacent receptacle holding location by a distance less than a width of the narrowest receptacle holding location, and the plurality of receptacle holding locations are oriented in a first direction extending from the third side of the second receptacle storage area to the fourth side of the second receptacle storage area. arranged in a series of parallel rows and a series of parallel columns oriented in a second direction extending from a first side of the second receptacle storage area to a second side of the second receptacle storage area, the first receptacle storage area and the second receptacle storage area being arranged such that the first side of the second receptacle storage area faces the second side of the first receptacle storage area, and the second side of the first receptacle storage area is spaced from the first side of the second receptacle storage area by a distance equal to or greater than the width of the widest receptacle holding position of the second receptacle storage area;a second receptacle storage area, a conveyor configured to convey sample receptacles; a second receptacle storage area, a conveyor configured to convey sample receptacles; and a second receptacle storage area, a conveyor configured to convey sample receptacles; a conveyor configured to convey sample receptacles; a conveyor configured to convey sample receptacles; and a conveyor configured to convey sample receptacles; a conveyor configured to convey sample receptacles; a conveyor configured to convey sample receptacles; a conveyor configured to convey sample receptacles; a conveyor configured to convey sample receptacles; a conveyor configured to convey sample receptacles; a conveyor configured to convey sample receptacles; a sample receptacle handling system configured to transport the sample receptacles held in the receptacle storage areas from their respective receptacle holding positions to a conveyor; and a controller in communication with the sample receptacle handling system, wherein the sample receptacle handling system transports each sample receptacle from its respective receptacle holding position in the first receptacle storage area across a first side of the first receptacle storage area through another sample receptacle held in a receptacle holding position within the first receptacle storage area. a sample receptacle handling system for moving each sample receptacle from a respective receptacle holding position in the second receptacle storage area, across a first side of the second receptacle storage area, and into a first receptacle transport path without passing another sample receptacle held in a receptacle holding position in the second receptacle storage area; by moving the sample receptacles by the sample receptacle handling system after they have been transferred from their respective receptacle holding locations in the receptacle storage area and into the first receptacle transport path a distance required to align the removed sample receptacle with the second receptacle transport path, and then moving the removed sample receptacle by the sample receptacle handling system along the second receptacle transport path from the second side of the first receptacle storage area across the first side of the first receptacle storage area to a conveyor.a controller programmed to transfer the sample receptacle from the second receptacle storage area to the conveyor.

[0197] Embodiment 2. A system as described in embodiment 1, wherein the second receptacle transport path comprises a row of empty receptacle holding positions in the first receptacle storage area.

[0198] Embodiment 3. The system of embodiment 1 or 2, wherein the controller is programmed to cause the sample receptacle handling system to move each sample receptacle from its respective receptacle holding position in the first receptacle storage area, across the first side of the first receptacle storage area, to the conveyor by the sample receptacle handling system, without passing another sample receptacle held in a receptacle holding position within the first receptacle storage area, by moving any sample receptacle from its respective receptacle holding position in the first receptacle storage area across each of one or more intervening receptacle holding positions located between the respective receptacle holding position and the first side of the first receptacle storage area, other than the receptacle held in the respective receptacle holding position located in the row closest to the first side of the first receptacle storage area, and the sample receptacle has previously been removed from the one or more intervening receptacle holding positions.

[0199] Embodiment 4. The controller moves any sample receptacles from their respective receptacle holding positions in the second receptacle storage area beyond each of one or more intervening receptacle holding positions located between the respective receptacle holding positions and the first side of the second receptacle storage area, other than the receptacles held in their respective receptacle holding positions located in the row closest to the first side of the second receptacle storage area. A system as described in any one of embodiments 1 to 3, programmed to move each sample receptacle from its respective receptacle holding position in the second receptacle storage area, across a first side of the second receptacle storage area, to the first receptacle transport path by the sample receptacle handling system without passing another sample receptacle held in the receptacle holding position, the sample receptacle having been previously removed from one or more intervening receptacle holding positions.

[0200] Embodiment 5. A system described in any one of embodiments 1 to 4, wherein a path by which each sample receptacle is moved by the sample receptacle handling system from its respective receptacle holding position in the first receptacle storage area across a first side of the first receptacle storage area is programmed into the controller for each receptacle holding position in the first receptacle storage area, and a path by which each sample receptacle is moved by the sample receptacle handling system from its respective receptacle holding position in the second receptacle storage area across the first side of the second receptacle storage area into the first receptacle transport path is programmed into the controller for each receptacle holding position in the second receptacle storage area.

[0201] Embodiment 6. A system described in any one of embodiments 1 to 5, wherein the sample receptacle handling system comprises a mechanized robot including a mechanical gripper configured to grip individual sample receptacles in the receptacle holding position, and a gripper mover configured to move the gripper in a vertical direction and an orthogonal horizontal direction.

[0202] Embodiment 7. The system described in embodiment 6, wherein the controller is programmed to cause the sample receptacle handling system to remove a sample receptacle from each receptacle holding position by attempting to grasp the sample receptacle at each receptacle holding position with a mechanical gripper, detect whether a sample receptacle is held at each receptacle holding position, and if a sample receptacle is not detected at each receptacle holding position, advance the mechanical gripper to a next receptacle holding position within the same row of receptacle holding positions, within the same column of receptacle holding positions, within the next row of receptacle holding positions, or within the next column of receptacle holding positions.

[0203] Embodiment 8. The system of embodiment 7, wherein each of the first receptacle storage area and the second receptacle storage area comprises two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding positions arranged in rows and columns, and the controller is programmed to advance the mechanical gripper to a next receptacle holding position in a next rack of the first storage area or the second storage area if a sample receptacle is not detected in a predetermined number of consecutive respective receptacle holding positions.

[0204] Embodiment 9. A system as described in any one of embodiments 1 to 8, wherein a portion of the first receptacle storage area including a contiguous group of receptacle holding positions is designated as a STAT section for holding STAT sample receptacles, and the controller is programmed to first transfer all sample receptacles held in their respective receptacle holding positions in the STAT section of the first receptacle storage area to the conveyor by the sample receptacle handling system before transferring sample receptacles held in the remaining receptacle holding positions in the first receptacle storage area and before transferring sample receptacles held in receptacle holding positions in the second receptacle storage area.

[0205] Embodiment 10. The controller controls the sample receptacle handling system to detect whether an additional sample receptacle is in the S state after all sample receptacles have been removed from the STAT section of the first receptacle storage area by the sample receptacle handling system, while a sample receptacle is being removed from the remaining receptacle holding positions of the first receptacle storage area by the sample receptacle handling system, or while a sample receptacle is being removed from the receptacle holding positions of the second receptacle storage area by the sample receptacle handling system. The system of embodiment 9, wherein when placed in a receptacle holding position in the TAT section, the removal of sample receptacles from the first receptacle storage area or the second receptacle storage area is suspended and additional sample receptacles placed in the STAT section are removed by the sample receptacle handling system before the sample receptacle handling system resumes removing sample receptacles from the first receptacle storage area or the second receptacle storage area.

[0206] Embodiment 11. A system as described in any one of embodiments 1 to 6, wherein a portion of the second receptacle storage area including a contiguous group of receptacle holding positions is designated as a STAT section for holding STAT sample receptacles, and the controller is programmed to first transfer all sample receptacles held in their respective receptacle holding positions in the STAT section of the second receptacle storage area to the conveyor by the sample receptacle handling system before transferring sample receptacles held in the remaining receptacle holding positions in the second receptacle storage area and before transferring sample receptacles held in the receptacle holding positions in the first receptacle storage area.

[0207] Embodiment 12. The controller controls the sample receptacle handling system to detect whether an additional sample receptacle is in the S state after all sample receptacles have been removed from the STAT section of the second receptacle storage area by the sample receptacle handling system, while a sample receptacle is being removed from the remaining receptacle holding positions of the second receptacle storage area by the sample receptacle handling system, or while a sample receptacle is being removed from the receptacle holding positions of the first receptacle storage area by the sample receptacle handling system. The system of embodiment 11, wherein when placed in a receptacle holding position in the TAT section, the sample receptacle handling system is programmed to suspend removal of sample receptacles from the second receptacle storage area or the first receptacle storage area and to remove additional sample receptacles placed in the STAT section before the sample receptacle handling system resumes removal of sample receptacles from the second receptacle storage area or the first receptacle storage area.

[0208] Embodiment 13. A system described in any one of embodiments 1 to 12, wherein the controller is programmed to control the sample receptacle handling system to remove sample receptacles from at least a portion of each row of receptacle holding positions in the first receptacle storage area, one row at a time, starting with the row closest to the first side of the first receptacle storage area, and then removing sample receptacles from rows progressively further away from the first side of the first receptacle storage area.

[0209] Embodiment 14. A system as described in any one of embodiments 1 to 12, wherein the controller is programmed to control the sample receptacle handling system to remove all sample receptacles from at least a portion of the rows of receptacle holding positions in the first receptacle storage area, one row at a time, starting with the sample receptacle in each row closest to the first side of the first receptacle storage area, and then remove each sample receptacle from that row progressively further from the first side of the first receptacle storage area.

[0210] Embodiment 15. A system as described in embodiment 14, wherein the controller is programmed to control the sample receptacle handling system to remove sample receptacles from at least a portion of the rows of receptacle holding positions in the first receptacle storage area, one row at a time, starting with the row closest to the third side of the first receptacle storage area, and then removing sample receptacles from rows progressively further away from the third side of the first receptacle storage area.

[0211] Embodiment 16. A system described in any one of embodiments 1 to 15, wherein the controller is programmed to control the sample receptacle handling system to remove all sample receptacles from each row of receptacle holding positions in the second receptacle storage area, one row at a time, starting with the row closest to the first side of the second receptacle storage area, and then remove sample receptacles from rows progressively further away from the first side of the second receptacle storage area.

[0212] Embodiment 17. A system described in any one of embodiments 1 to 15, wherein the controller is programmed to control the sample receptacle handling system to remove all sample receptacles from each row of receptacle holding positions in the second receptacle storage area, one row at a time, starting with the sample receptacle in each row closest to the first side of the second receptacle storage area, and then remove each sample receptacle from that row progressively further from the first side of the second receptacle storage area.

[0213] Embodiment 18. A system as described in embodiment 17, wherein the controller is programmed to control the sample receptacle handling system to remove sample receptacles from each row of receptacle holding positions in the second receptacle storage area, one row at a time, starting with the row closest to the third side of the second receptacle storage area, and then removing sample receptacles from rows progressively further away from the third side of the second receptacle storage area.

[0214] Embodiment 19. A system described in any one of embodiments 1 to 7, wherein each of the first receptacle storage area and the second receptacle storage area comprises two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding positions arranged in rows and columns.

[0215] Embodiment 20. A system as described in any one of embodiments 1 to 6, wherein each of the first receptacle storage area and the second receptacle storage area comprises two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding positions arranged in rows and columns, one rack in the first receptacle storage area is designated as a STAT rack for holding STAT sample receptacles, and the controller is programmed to cause the sample receptacle handling system to first transfer all of the sample receptacles from their respective receptacle holding positions in the STAT rack to a conveyor before transferring sample receptacles from remaining receptacle holding positions in the first receptacle storage area and before transferring sample receptacles from receptacle holding positions in the second receptacle storage area.

[0216] Embodiment 21. The system of embodiment 20, wherein the controller is programmed such that if additional sample receptacles are placed in one or more receptacle holding positions of the STAT rack after all sample receptacles have been removed from the STAT rack by the sample receptacle handling system and before all sample receptacles have been removed from racks other than the STAT rack in the first receptacle storage area and / or the second receptacle storage area, the sample receptacle handling system is returned to the STAT rack to remove all sample receptacles held in the STAT rack before removing sample receptacles from racks other than the STAT rack in the first receptacle storage area and the second receptacle storage area.

[0217] Embodiment 22. A system as described in embodiment 20 or 21, further comprising a switch configured to generate a signal that is detected by the controller when the STAT rack is replaced, and the controller is programmed to transfer all sample receptacles from their respective receptacle holding positions in the replaced STAT rack by the sample receptacle handling system before transferring sample receptacles from the remaining receptacle holding positions in the first receptacle storage area and before transferring sample receptacles from the receptacle holding positions in the second receptacle storage area.

[0218] Embodiment 23. A system described in any one of embodiments 19 to 22, wherein the racks in the first receptacle storage area are separated from the racks in the second receptacle storage area by a gap forming a first receptacle transport path.

[0219] Embodiment 24. A system described in any one of embodiments 19 to 23, further comprising a first drawer supporting at least one rack in the first receptacle storage area and at least one rack in the second receptacle storage area, and a second drawer supporting at least one rack in the first receptacle storage area and at least one rack in the second receptacle storage area.

[0220] Embodiment 25. A system described in any one of embodiments 19 to 23, wherein the first receptacle storage area has four receptacle racks arranged side by side between a third side and a fourth side of the first receptacle storage area, the four receptacle racks of the first receptacle storage area having an aligned first side corresponding to the first side of the first receptacle storage area and an aligned second side corresponding to the second side of the first receptacle storage area, and the second receptacle storage area has four receptacle racks arranged side by side between the third side and a fourth side of the second receptacle storage area, the four receptacle racks of the second receptacle storage area having an aligned first side corresponding to the first side of the second receptacle storage area and an aligned second side corresponding to the second side of the second receptacle storage area.

[0221] Embodiment 26. A system as described in embodiment 25, wherein the second receptacle transport path includes a gap between two of the four receptacle racks in the first receptacle storage area, the gap having a width equal to or greater than the width of the widest receptacle holding position in the second receptacle storage area.

[0222] Embodiment 27. A system as described in embodiment 25 or 26, further comprising a first drawer supporting two receptacle racks in the first receptacle storage area and two receptacle racks in the second receptacle storage area, and a second drawer supporting two receptacle racks in the first receptacle storage area and two receptacle racks in the second receptacle storage area.

[0223] Embodiment 28. A system as described in any one of embodiments 1 to 27, wherein a portion of a first receptacle storage area including a contiguous group of receptacle holding positions is designated as an isolation section configured to accept sample receptacles placed therein by a sample receptacle handling system, and the controller is programmed to, as necessary, transfer selected ones of the sample receptacles from receptacle holding positions of the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area, and then transfer the selected sample receptacle to a receptacle holding position of the isolation section.

[0224] Embodiment 29. The system of embodiment 28, wherein the controller is programmed to transport the selected sample receptacle to the isolation section upon an error occurring with respect to the selected sample receptacle.

[0225] Embodiment 30. The system of embodiment 29, wherein the error relating to the selected sample receptacle includes one or more of insufficient information stored for the selected sample receptacle, no open test order for the selected sample receptacle being stored, an inability to read machine-readable information associated with the selected sample receptacle, insufficient headspace in the selected sample receptacle, and insufficient sample material contained in the selected sample receptacle.

[0226] Embodiment 31. A system as described in any one of embodiments 1 to 24, wherein a portion of the first receptacle storage area including a contiguous group of receptacle holding positions is designated as an isolation section configured to accept sample receptacles placed therein by the sample receptacle handling system, the second receptacle transport path comprises a row of empty receptacle holding positions in the isolation section, and the controller is programmed to transport selected ones of the sample receptacles from receptacle holding positions in the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area, as necessary, and then transport the selected sample receptacle to a receptacle holding position in the isolation section other than a receptacle holding position of the second receptacle transport path.

[0227] Embodiment 32. A system as described in embodiment 31, wherein the controller is programmed to transport a selected sample receptacle to the isolation section upon an error occurring with respect to the selected sample receptacle.

[0228] Embodiment 33. The system of embodiment 32, wherein the error relating to the selected sample receptacle includes one or more of insufficient information stored for the selected sample receptacle, no open test order for the selected sample receptacle being stored, an inability to read machine-readable information associated with the selected sample receptacle, insufficient headspace in the selected sample receptacle, and insufficient sample material contained in the selected sample receptacle.

[0229] Embodiment 34. A system according to any one of embodiments 1 to 33, wherein each sample receptacle comprises a test tube.

[0230] Embodiment 35. A system described in any one of embodiments 1 to 34, further comprising a plurality of receptacle holders, each receptacle holder supported on the conveyor and configured to receive a sample receptacle and hold the sample receptacle in an upright orientation.

[0231] Embodiment 36. A method of transferring each of a plurality of sample receptacles from a receptacle storage module to a conveyor located adjacent to the receptacle storage module, the receptacle storage module including a first receptacle storage area and a second receptacle storage area, each of the first receptacle storage area and the second receptacle storage area having opposing first and second sides and opposing third and fourth sides oriented transversely to the first and second sides, the second receptacle storage area is arranged such that a first side of the second receptacle storage area faces a second side of the first receptacle storage area, the first receptacle storage area includes a plurality of receptacle holding locations arranged in a series of parallel rows oriented in a first direction extending from a third side of the first receptacle storage area to a fourth side of the first receptacle storage area and a series of parallel columns oriented in a second direction extending from the first side of the first receptacle storage area to a second side of the first receptacle storage area, each receptacle holding location of the first receptacle storage area holding a single test the second receptacle storage area includes a plurality of receptacle holding locations arranged in a series of parallel rows oriented in a first direction extending from a third side of the second receptacle storage area to a fourth side of the second receptacle storage area and in a series of parallel columns oriented in a direction extending from the first side of the second receptacle storage area to a second side of the second receptacle storage area, each of the second receptacle storage areas including a plurality of receptacle holding locations arranged in a series of parallel rows oriented in a first direction extending from a third side of the second receptacle storage area to a fourth side of the second receptacle storage area and in a series of parallel columns oriented in a direction extending from a first side of the second receptacle storage area to a second side of the second receptacle storage area, The receptacle holding locations are configured to hold a single sample receptacle and are spaced from any immediately adjacent receptacle holding locations by a distance less than a width of the narrowest receptacle holding location, and a second side of the first receptacle storage area is spaced from a first side of the second receptacle storage area by a distance equal to or greater than a width of the widest receptacle holding location of the second receptacle storage area, thereby defining a first receptacle transport path between the second side of the first receptacle storage area and the first side of the second receptacle storage area, and the first receptacle storage area isand a second receptacle transport path extending from a first side of the first receptacle storage area to a second side of the first receptacle storage area, the second receptacle transport path having a width equal to or greater than a width of a widest receptacle holding location in the second receptacle storage area, and the method includes controlling a sample receptacle handling system to: (1) move each sample receptacle from its respective receptacle holding location in the first receptacle storage area to a conveyor across the first side of the first receptacle storage area; (2)(a) transfer the sample receptacles from the first receptacle storage area to the conveyor, each of the sample receptacles being removed from the first receptacle storage area via a path in sequence across a first side of the first receptacle storage area such that the removed sample receptacle does not pass another sample receptacle held in a receptacle holding position in the first receptacle storage area, and (2)(b) transfer the sample receptacles from their respective receptacle holding positions in the second receptacle storage area across the first side of the second receptacle storage area via a path in sequence across a first receptacle transport path. (b) moving each sample receptacle by the sample receptacle handling system so that each of the sample receptacles is sequentially removed from the second receptacle storage area over a first side of the second receptacle storage area and into the first receptacle transport path such that the removed sample receptacle does not pass another sample receptacle held in a receptacle holding position in the second receptacle storage area; and (c) routing the removed sample receptacles from their respective receptacle holding positions in the second receptacle storage area along the first receptacle transport path. after being transferred into the path, moving the removed sample receptacle by the sample receptacle handling system a distance necessary to align the removed sample receptacle with the second receptacle transport path; and (c) then transferring the sample receptacle from the second receptacle storage area to the conveyor by moving the removed sample receptacle by the sample receptacle handling system along the second receptacle transport path from the second side of the first receptacle storage area past the first side of the first receptacle storage area to the conveyor.controlling a sample receptacle handling system;

[0232] Embodiment 37. The method of embodiment 36, wherein the second receptacle transport path comprises a row of empty receptacle holding positions in the first receptacle storage area.

[0233] Embodiment 38. The method of embodiment 36 or 37, wherein step (1) includes moving any sample receptacle from each receptacle holding position of the first receptacle storage area beyond each of one or more intervening receptacle holding positions located between the respective receptacle holding positions and the first side of the first receptacle storage area, other than the receptacle held in the respective receptacle holding position located in the row closest to the first side of the first receptacle storage area, and the sample receptacle has previously been removed from the one or more intervening receptacle holding positions.

[0234] Embodiment 39. The method of any one of embodiments 36 to 38, wherein step (2)(a) includes moving any sample receptacle from each receptacle holding position of the second receptacle storage area beyond each of one or more intervening receptacle holding positions located between the respective receptacle holding positions and the first side of the second receptacle storage area, other than the receptacle held in the respective receptacle holding position located in the row closest to the first side of the second receptacle storage area, and the sample receptacle has previously been removed from the one or more intervening receptacle holding positions.

[0235] Embodiment 40. A method according to any one of embodiments 36 to 39, wherein a path along which each sample receptacle is moved by the sample receptacle handling system from its respective receptacle holding position in the first receptacle storage area across the first side of the first receptacle storage area is predefined for each receptacle holding position in the first receptacle storage area, and a path along which each sample receptacle is moved by the sample receptacle handling system from its respective receptacle holding position in the second receptacle storage area across the first side of the second receptacle storage area into the first receptacle transport path is predefined for each receptacle holding position in the second receptacle storage area.

[0236] Embodiment 41. The method of any one of embodiments 36 to 40, wherein the sample receptacle handling system comprises a mechanized robot including a mechanical gripper configured to grip individual sample receptacles in the receptacle holding position and a gripper mover configured to move the gripper in a vertical direction and an orthogonal horizontal direction.

[0237] Embodiment 42. The method of embodiment 41, wherein transferring a receptacle from the first receptacle storage area or transferring a receptacle from the second receptacle storage area includes controlling the sample receptacle handling system to remove the sample receptacle from each receptacle holding position of the first receptacle storage area or the second receptacle storage area by gripping the sample receptacle at the respective receptacle holding position with a mechanical gripper and attempting to detect whether a sample receptacle is held at the respective receptacle holding position, and if a sample receptacle is not detected at the respective receptacle holding position, to advance the mechanical gripper to a next receptacle holding position within the same row of receptacle holding positions, within the same column of receptacle holding positions, within the next row of receptacle holding positions, or within the next column of receptacle holding positions.

[0238] Embodiment 43. The method of embodiment 42, wherein each of the first receptacle storage area and the second receptacle storage area comprises two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding positions arranged in rows and columns, and the method further comprises advancing the mechanical gripper to a next receptacle holding position in a next rack of the first storage area or the second storage area if a sample receptacle is not detected in a predetermined number of consecutive respective receptacle holding positions.

[0239] Embodiment 44. The method of any one of embodiments 36 to 43, wherein a portion of the first receptacle storage area including a contiguous group of receptacle holding positions is designated as a STAT section for holding STAT sample receptacles, and the method includes first transferring all sample receptacles held in their respective receptacle holding positions in the STAT section of the first receptacle storage area to a conveyor by the sample receptacle handling system before transferring sample receptacles held in the remaining receptacle holding positions in the first receptacle storage area and before transferring sample receptacles held in receptacle holding positions in the second receptacle storage area.

[0240] Embodiment 45. The method of embodiment 44, further comprising, if additional sample receptacles are placed in receptacle holding positions of the STAT section after all sample receptacles have been removed from the STAT section of the first receptacle storage area by the sample receptacle handling system while sample receptacles are being removed from remaining receptacle holding positions of the first receptacle storage area or while sample receptacles are being removed from receptacle holding positions of the second receptacle storage area, interrupting removal of sample receptacles from the first receptacle storage area or the second receptacle storage area, and removing the additional sample receptacles placed in the STAT section before resuming removal of sample receptacles from the first receptacle storage area or the second receptacle storage area.

[0241] Embodiment 46. The method of any one of embodiments 36 to 43, wherein a portion of the second receptacle storage area including a contiguous group of receptacle holding positions is designated as a STAT section for holding STAT sample receptacles, and the method includes first transferring all sample receptacles held in their respective receptacle holding positions in the STAT section of the second receptacle storage area to a conveyor by the sample receptacle handling system before transferring the sample receptacles held in the remaining receptacle holding positions in the second receptacle storage area and before transferring the sample receptacles held in the receptacle holding positions in the first receptacle storage area.

[0242] Embodiment 47. The method of embodiment 46, further comprising, if additional sample receptacles are placed in receptacle holding positions of the STAT section after all sample receptacles have been removed from the STAT section of the second receptacle storage area by the sample receptacle handling system while sample receptacles are being removed from remaining receptacle holding positions of the second receptacle storage area or while sample receptacles are being removed from receptacle holding positions of the first receptacle storage area, interrupting removal of sample receptacles from the second receptacle storage area or the first receptacle storage area, and removing the additional sample receptacles placed in the STAT section before resuming removal of sample receptacles from the second receptacle storage area or the first receptacle storage area.

[0243] Embodiment 48. A method according to any one of embodiments 36 to 47, wherein step (1) includes removing sample receptacles from at least a portion of each row of receptacle holding positions in the first receptacle storage area, one row at a time, starting with the row closest to the first side of the first receptacle storage area, and then removing sample receptacles from rows progressively further away from the first side of the first receptacle storage area.

[0244] Embodiment 49. A method according to any one of embodiments 36 to 47, wherein step (1) includes removing all sample receptacles from at least a portion of the rows of receptacle holding positions in the first receptacle storage area, one row at a time, starting with the sample receptacle in each row closest to the first side of the first receptacle storage area, and then removing each sample receptacle from that row progressively further from the first side of the first receptacle storage area.

[0245] Embodiment 50. The method of embodiment 49, wherein sample receptacles are removed from each row of receptacle holding positions in the first receptacle storage area, one row at a time, starting with the row closest to the third side of the first receptacle storage area, and then removing sample receptacles from rows progressively further from the third side of the first receptacle storage area.

[0246] Embodiment 51. The method of any one of embodiments 36 to 50, wherein step (2) includes removing sample receptacles from each row of receptacle holding positions in the second receptacle storage area, one row at a time, starting with the row closest to the first side of the second receptacle storage area, and then removing sample receptacles from rows progressively farther from the first side of the second receptacle storage area.

[0247] Embodiment 52. The method of any one of embodiments 36 to 50, wherein step (2) includes removing all sample receptacles from each row of receptacle holding positions in the second receptacle storage area, one row at a time, starting with the sample receptacle in each row closest to the first side of the second receptacle storage area, and then removing each sample receptacle from that row progressively further from the first side of the second receptacle storage area.

[0248] Embodiment 53. The method of embodiment 52, wherein sample receptacles are removed from each row of receptacle holding positions in the second receptacle storage area, one row at a time, starting with the row closest to the third side of the second receptacle storage area, and then removing sample receptacles from rows progressively further away from the third side of the second receptacle storage area.

[0249] Embodiment 54. The method of any one of embodiments 36 to 42, wherein each of the first receptacle storage area and the second receptacle storage area comprises two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding positions arranged in rows and columns.

[0250] Embodiment 55. The method of any one of embodiments 36 to 43, wherein each of the first receptacle storage area and the second receptacle storage area comprises two or more receptacle racks removably supported on a rack support platform, each receptacle rack including a plurality of receptacle holding positions arranged in rows and columns, one rack in the first receptacle storage area is designated as a STAT rack for holding STAT sample receptacles, and the method includes first transferring all sample receptacles from their respective receptacle holding positions in the STAT rack by the sample receptacle handling system before transferring sample receptacles from remaining receptacle holding positions in the first receptacle storage area and before transferring sample receptacles from receptacle holding positions in the second receptacle storage area.

[0251] Embodiment 56. The method of embodiment 55, further comprising detecting when a STAT rack has been replaced and then transferring all sample receptacles from their respective receptacle holding positions in the replaced STAT rack by the sample receptacle handling system before transferring sample receptacles from the remaining receptacle holding positions in the first receptacle storage area and before transferring sample receptacles from the receptacle holding positions in the second receptacle storage area.

[0252] Embodiment 57. A method according to any one of embodiments 54 to 56, wherein the racks in the first receptacle storage area are separated from the racks in the second receptacle storage area by a gap forming a first receptacle transport path.

[0253] Embodiment 58. A method according to any one of embodiments 54 to 57, wherein at least one rack in the first receptacle storage area and at least one rack in the second receptacle storage area are supported in a first drawer, and at least one rack in the first receptacle storage area and at least one rack in the second receptacle storage area are supported in a second drawer.

[0254] Embodiment 59. The method of any one of embodiments 54 to 57, wherein the first receptacle storage area comprises four receptacle racks arranged side by side between a third side and a fourth side of the first receptacle storage area, the four receptacle racks of the first receptacle storage area having an aligned first side corresponding to the first side of the first receptacle storage area and an aligned second side corresponding to the second side of the first receptacle storage area, and the second receptacle storage area comprises four receptacle racks arranged side by side between the third side and a fourth side of the second receptacle storage area, the four receptacle racks of the second receptacle storage area having an aligned first side corresponding to the first side of the second receptacle storage area and an aligned second side corresponding to the second side of the second receptacle storage area.

[0255] Embodiment 60. The method of embodiment 59, wherein the second receptacle transport path includes a gap between two of the four receptacle racks in the first receptacle storage area, the gap having a width equal to or greater than the width of the widest receptacle holding position in the second receptacle storage area.

[0256] Embodiment 61. The method of embodiment 59 or 60, wherein the rack support platform includes a first drawer and a second drawer, the first drawer supporting two receptacle racks in the first receptacle storage area and two receptacle racks in the second receptacle storage area, and the second drawer supporting two receptacle racks in the first receptacle storage area and two receptacle racks in the second receptacle storage area.

[0257] Embodiment 62. A method according to any one of embodiments 36 to 61, wherein a portion of a first receptacle storage area including a contiguous group of receptacle holding positions is designated as an isolation section configured to accept sample receptacles placed therein by a sample receptacle handling system, and the method further comprises, as necessary, a step of transferring selected ones of the sample receptacles from receptacle holding positions of the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area, and then a step of transferring the selected sample receptacle to a receptacle holding position of the isolation section.

[0258] Embodiment 63. The method of embodiment 62, wherein if an error occurs with respect to the selected sample receptacle, the selected sample receptacle is transported to a segregation section.

[0259] Embodiment 64. The method of embodiment 63, wherein the error relating to the selected sample receptacle includes one or more of insufficient information stored for the selected sample receptacle, no open test order for the selected sample receptacle being stored, an inability to read machine-readable information associated with the selected sample receptacle, insufficient headspace in the selected sample receptacle, and insufficient sample material contained in the selected sample receptacle.

[0260] Embodiment 65. A method according to any one of embodiments 36 to 58, wherein a portion of the first receptacle storage area including a contiguous group of receptacle holding positions is designated as an isolation section configured to accept sample receptacles placed therein by the sample receptacle handling system, and the second receptacle transport path comprises a row of empty receptacle holding positions in the isolation section, and the method further comprises, as necessary, a step of transporting selected ones of the sample receptacles from receptacle holding positions of the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area, and then a step of transporting the selected sample receptacle to a receptacle holding position of the isolation section other than a receptacle holding position of the second receptacle transport path.

[0261] Embodiment 66. The method of embodiment 65, wherein if an error occurs with respect to the selected sample receptacle, the selected sample receptacle is transported to a segregation section.

[0262] Embodiment 67. The method of embodiment 66, wherein the error relating to the selected sample receptacle includes one or more of insufficient information stored for the selected sample receptacle, no open test order for the selected sample receptacle being stored, an inability to read machine-readable information associated with the selected sample receptacle, insufficient headspace in the selected sample receptacle, and insufficient sample material contained in the selected sample receptacle.

[0263] Embodiment 68 The method of any one of embodiments 36 to 67, wherein each sample receptacle comprises a test tube.

[0264] Although certain embodiments have been shown and described, the above description is not intended to limit the scope of these embodiments. Although embodiments and variations of many aspects of the present disclosure have been disclosed and described herein, such disclosure is provided for the purpose of illustration and example only. Thus, various modifications and changes may be made without departing from the scope of the claims. For example, not all of the components described in the embodiments are necessary, and the disclosure may include any suitable combination of the components described, and the general shape and relative size of the components of the disclosure may be changed. Thus, the embodiments are intended to illustrate alternatives, modifications, and equivalents that may be included within the scope of the claims. Thus, the present disclosure should not be limited, except to the following claims and their equivalents.

Claims

Claim 1 A system for storing a plurality of sample receptacles and transferring each sample receptacle out of the system without passing through another sample receptacle stored in the system, the system comprising: A first receptacle storage area having opposing first and second sides and opposing third and fourth sides oriented laterally with respect to the first and second sides, the first receptacle storage area including a plurality of receptacle holding positions, each receptacle holding position configured to hold a single sample receptacle and spaced from any directly adjacent receptacle holding position by a distance less than the width of the narrowest receptacle holding position, the plurality of receptacle holding positions being arranged in a series of parallel rows oriented in a first direction extending from the third side of the first receptacle storage area to the fourth side of the first receptacle storage area and a series of parallel columns oriented in a second direction extending from the first side of the first receptacle storage area to the second side of the first receptacle storage area, a first receptacle storage area; A second receptacle storage area having opposing first and second sides and opposing third and fourth sides oriented laterally with respect to the first and second sides, the second receptacle storage area including a plurality of receptacle holding positions, each receptacle holding position configured to hold a single sample receptacle and spaced from any directly adjacent receptacle holding position by a distance less than the width of the narrowest receptacle holding position, the plurality of receptacle holding positions being arranged in a series of parallel rows oriented in a first direction extending from the third side of the second receptacle storage area to the fourth side of the second receptacle storage area and a series of parallel columns oriented in a second direction extending from the first side of the second receptacle storage area to the second side of the second receptacle storage area; The first receptacle storage area and the second receptacle storage area are arranged such that the first side of the second receptacle storage area faces the second side of the first receptacle storage area. The second side of the first receptacle storage area is spaced apart from the first side of the second receptacle storage area by a distance greater than or equal to the width of the widest receptacle holding position of the second receptacle storage area, thereby defining a first receptacle transfer path between the first receptacle storage area and the second receptacle storage area. The first receptacle storage area includes a second receptacle transfer path extending from the first side to the second side of the first receptacle storage area. The second receptacle transfer path has a width greater than or equal to the width of the widest receptacle holding position of the second receptacle storage area, and the second receptacle storage area. A conveyor configured to convey the sample receptacle. A sample receptacle handling system configured to transfer the sample receptacles held in the first receptacle storage area and the second receptacle storage area from their respective receptacle holding positions to the conveyor. A controller communicating with the sample receptacle handling system, the controller Using the sample receptacle handling system to move each sample receptacle from its respective receptacle holding position in the first receptacle storage area, over the first side of the first receptacle storage area, and without passing through another sample receptacle held in a receptacle holding position within the first receptacle storage area, to transfer the sample receptacle from the first receptacle storage area to a receptacle holder supported on the conveyor. Transferring a sample receptacle from the second receptacle storage area to the conveyor. Using the sample receptacle handling system, each sample receptacle is moved from each receptacle holding position in the second receptacle storage area across the first side of the second receptacle storage area and into the first receptacle transport path without passing through another sample receptacle held at a receptacle holding position in the second receptacle storage area. After the removed sample receptacle is transferred from each receptacle holding position in the second receptacle storage area into the first receptacle transport path, the sample receptacle is moved using the sample receptacle handling system by a distance necessary to align the removed sample receptacle with the second receptacle transport path. Then, the removed sample receptacle is moved from the second side of the first receptacle storage area across the first side of the first receptacle storage area to the conveyor along the second receptacle transport path using the sample receptacle handling system. Thereby, transferring a sample receptacle from the second receptacle storage area to the conveyor. A controller programmed to perform the above. A system comprising the above. **Claim 2** A method of transferring each of a plurality of sample receptacles from a receptacle storage module to a conveyor located adjacent to the receptacle storage module, the receptacle storage module including a first receptacle storage area and a second receptacle storage area, each of the first receptacle storage area and the second receptacle storage area having opposing first and second sides and opposing third and fourth sides oriented laterally with respect to the first and second sides, the first receptacle storage area and the second receptacle storage area being arranged such that the first side of the second receptacle storage area faces the second side of the first receptacle storage area. The first receptacle storage area includes a plurality of receptacle holding positions arranged in a series of parallel rows oriented in a first direction extending from the third side of the first receptacle storage area to the fourth side of the first receptacle storage area and a series of parallel columns oriented in a second direction extending from the first side of the first receptacle storage area to the second side of the first receptacle storage area. Each receptacle holding position in the first receptacle storage area is configured to hold a single sample receptacle and is spaced from any directly adjacent receptacle holding position by a distance less than the width of the narrowest receptacle holding position. The second receptacle storage area includes a plurality of receptacle holding positions arranged in a series of parallel rows oriented in a first direction extending from the third side of the second receptacle storage area to the fourth side of the second receptacle storage area and a series of parallel columns oriented in a direction extending from the first side of the second receptacle storage area to the second side of the second receptacle storage area. Each receptacle holding position in the second receptacle storage area is configured to hold a single sample receptacle and is spaced from any directly adjacent receptacle holding position by a distance less than the width of the narrowest receptacle holding position. The second side of the first receptacle storage area is spaced from the first side of the second receptacle storage area by a distance greater than or equal to the width of the widest receptacle holding position in the second receptacle storage area, thereby defining a first receptacle transport path between the second side of the first receptacle storage area and the first side of the second receptacle storage area. The first receptacle storage area includes a second receptacle transport path extending from the first side of the first receptacle storage area to the second side of the first receptacle storage area. The second receptacle transport path has a width greater than or equal to the width of the widest receptacle holding position in the second receptacle storage area. The method is to control a sample receptacle handling system. (1) Transferring the sample receptacles from the first receptacle storage area to the conveyor by moving each sample receptacle from its respective receptacle holding position in the first receptacle storage area beyond the first side of the first receptacle storage area to the conveyor using the sample receptacle handling system, such that each of the sample receptacles is removed from the first receptacle storage area in sequence via a path beyond the first side of the first receptacle storage area without passing over another sample receptacle held in a receptacle holding position within the first receptacle storage area. (2) Transferring the sample receptacles from the second receptacle storage area to the conveyor, (a) Moving each sample receptacle from its respective receptacle holding position in the second receptacle storage area beyond the first side of the second receptacle storage area into the first receptacle conveyance path using the sample receptacle handling system, such that each of the sample receptacles is removed from the second receptacle storage area in sequence via a path beyond the first side of the second receptacle storage area into the first receptacle conveyance path without passing over another sample receptacle held in a receptacle holding position within the second receptacle storage area. (b) After the removed sample receptacle has been transferred from its respective receptacle holding position in the second receptacle storage area into the first receptacle conveyance path, moving the sample receptacle using the sample receptacle handling system by a distance necessary to align the removed sample receptacle with the second receptacle conveyance path. (c) Then, moving the removed sample receptacle along the second receptacle conveyance path from the second side of the first receptacle storage area beyond the first side of the first receptacle storage area to the conveyor using the sample receptacle handling system. By which, the sample receptacles are transferred from the second receptacle storage area to the conveyor. Controlling the sample receptacle handling system to perform the same A method comprising the same.

3. The system according to claim 1, wherein the second receptacle transport path comprises a row of empty receptacle holding positions in the first receptacle storage area.

4. The controller moves each sample receptacle from each receptacle holding position in the first receptacle storage area, beyond each of one or more intervening receptacle holding positions located between each receptacle holding position and the first side of the first receptacle storage area, without passing through another sample receptacle held at a receptacle holding position in the first receptacle storage area, other than the receptacles held at the receptacle holding positions in the row closest to the first side of the first receptacle storage area, so as to move the sample receptacle from each receptacle holding position in the first receptacle storage area, beyond the first side of the first receptacle storage area, to the conveyor, and the sample receptacle has been previously removed from the one or more intervening receptacle holding positions. The system according to claim 1, which is programmed to do so. **Claim 5**: The controller, in addition to the receptacles held at each receptacle holding position located in the row closest to the first side of the second receptacle storage area, moves any sample receptacle from each receptacle holding position in the second receptacle storage area, beyond each of one or more intervening receptacle holding positions located between each receptacle holding position and the first side of the second receptacle storage area, so as to move each sample receptacle from each receptacle holding position in the second receptacle storage area, beyond the first side of the second receptacle storage area, into the first receptacle conveyance path, without passing another sample receptacle held at a receptacle holding position in the second receptacle storage area, using the sample receptacle handling system, wherein the sample receptacle has been previously removed from the one or more intervening receptacle holding positions. The system according to claim 1. **Claim 6**: The path along which each sample receptacle is moved using the sample receptacle handling system from each receptacle holding position in the first receptacle storage area, beyond the first side of the first receptacle storage area, is programmed in the controller for each receptacle holding position in the first receptacle storage area, and the path along which each sample receptacle is moved using the sample receptacle handling system from each receptacle holding position in the second receptacle storage area, beyond the first side of the second receptacle storage area, into the first receptacle conveyance path is programmed in the controller for each receptacle holding position in the second receptacle storage area. The system according to claim 1. **Claim 7**: The sample receptacle handling system comprises a mechanized robot including a mechanical gripper configured to grip an individual sample receptacle within a receptacle holding position, and a gripper mover configured to move the gripper in a vertical direction and an orthogonal horizontal direction. The system according to claim 1. **Claim 8**: The controller In the sample receptacle handling system, by attempting to grip the sample receptacle at each receptacle holding position using the mechanical gripper, the sample receptacle is removed from each receptacle holding position, and it is detected whether the sample receptacle is held at each receptacle holding position, When the sample receptacle is not detected at each receptacle holding position, the mechanical gripper is advanced to the next receptacle holding position within the same row of the receptacle holding position, within the same column of the receptacle holding position, in the next row of the receptacle holding position, or in the next column of the receptacle holding position The system according to claim 7, which is programmed to perform. **Claim 9**: Each of the first receptacle storage area and the second receptacle storage area includes two or more receptacle racks removably supported on a rack support platform. Each receptacle rack includes a plurality of receptacle holding positions arranged in rows and columns. The controller is programmed to advance the mechanical gripper to the next receptacle holding position within the next rack in the first storage area or the second storage area when no sample receptacle is detected at a predetermined number of consecutive respective receptacle holding positions. The system according to claim 8. **Claim 10**: A part of the first receptacle storage area including a consecutive group of receptacle holding positions is designated as a STAT section for holding STAT sample receptacles. The controller is programmed to first transfer all the sample receptacles held at each receptacle holding position within the STAT section of the first receptacle storage area to the conveyor using the sample receptacle handling system before transferring the sample receptacles held at the remaining receptacle holding positions within the first receptacle storage area and before transferring the sample receptacles held at the receptacle holding positions within the second receptacle storage area. The system according to claim 1. **Claim 11**: The controller is programmed such that after all sample receptacles have been removed from the STAT section of the first receptacle storage area using the sample receptacle handling system, while a sample receptacle is being removed from the remaining receptacle holding positions in the first receptacle storage area using the sample receptacle handling system, or while a sample receptacle is being removed from the receptacle holding positions in the second receptacle storage area using the sample receptacle handling system, if an additional sample receptacle is placed in the receptacle holding position of the STAT section, before resuming the removal of the sample receptacle from the first receptacle storage area or the second receptacle storage area using the sample receptacle handling system, the removal of the sample receptacle from the first receptacle storage area or the second receptacle storage area is interrupted, and the additional sample receptacle placed in the STAT section is removed using the sample receptacle handling system. The system according to claim 10. **Claim 12**: A part of the second receptacle storage area including consecutive groups of receptacle holding positions is designated as a STAT section for holding STAT sample receptacles. The controller is programmed to first transfer, using the sample receptacle handling system, all sample receptacles held in each receptacle holding position within the STAT section of the second receptacle storage area to the conveyor before transferring the sample receptacles held in the remaining receptacle holding positions within the second receptacle storage area and before transferring the sample receptacles held in the receptacle holding positions within the first receptacle storage area. The system according to claim 1. **Claim 13**: The controller is configured such that, after all sample receptacles have been removed from the STAT section of the second receptacle storage area using the sample receptacle handling system, while a sample receptacle is being removed from the remaining receptacle holding positions in the second receptacle storage area using the sample receptacle handling system, or while a sample receptacle is being removed from the receptacle holding positions in the first receptacle storage area using the sample receptacle handling system, if an additional sample receptacle is placed in the receptacle holding position of the STAT section, before resuming the removal of the sample receptacle from the second receptacle storage area or the first receptacle storage area using the sample receptacle handling system, the removal of the sample receptacle from the second receptacle storage area or the first receptacle storage area is interrupted, and the additional sample receptacle placed in the STAT section is removed using the sample receptacle handling system. The system according to claim 12. **Claim 14**: The controller is programmed to control the sample receptacle handling system to remove sample receptacles one row at a time from at least a portion of each row of the receptacle holding positions in the first receptacle storage area, starting from the row closest to the first side of the first receptacle storage area, and then to remove sample receptacles from rows that are progressively farther from the first side of the first receptacle storage area. The system according to claim 1. **Claim 15**: The controller is programmed to control the sample receptacle handling system to remove all sample receptacles one column at a time from at least a portion of the columns of the receptacle holding positions in the first receptacle storage area, starting from the sample receptacles within each column closest to the first side of the first receptacle storage area, and then to remove each sample receptacle from columns that are progressively farther from the first side of the first receptacle storage area. The system according to claim 1.

16. The controller is programmed to control the sample receptacle handling system to remove the sample receptacles one column at a time from at least a part of the columns of the receptacle holding positions in the first receptacle storage area, starting from the column closest to the third side of the first receptacle storage area, and then to remove the sample receptacles from columns that gradually become farther from the third side of the first receptacle storage area. The system according to claim 15.

17. The controller is programmed to control the sample receptacle handling system to remove all the sample receptacles one row at a time from each row of the receptacle holding positions in the second receptacle storage area, starting from the row closest to the first side of the second receptacle storage area, and then to remove the sample receptacles from rows that gradually become farther from the first side of the second receptacle storage area. The system according to claim 1.

18. The controller is programmed to control the sample receptacle handling system to remove all the sample receptacles one column at a time from each column of the receptacle holding positions in the second receptacle storage area, starting from the sample receptacles in each column closest to the first side of the second receptacle storage area, and then to remove each sample receptacle from that column that gradually becomes farther from the first side of the second receptacle storage area. The system according to claim 1.

19. The controller is programmed to control the sample receptacle handling system to remove the sample receptacles one column at a time from each column of the receptacle holding positions in the second receptacle storage area, starting from the column closest to the third side of the second receptacle storage area, and then to remove the sample receptacles from columns that gradually become farther from the third side of the second receptacle storage area. The system according to claim 18. **Claim 20**: The system according to claim 1, wherein each of the first receptacle storage area and the second receptacle storage area comprises two or more receptacle racks removably supported on a rack support platform, and each receptacle rack includes a plurality of receptacle holding positions arranged in rows and columns. **Claim 21**: The system according to claim 1, wherein each of the first receptacle storage area and the second receptacle storage area comprises two or more receptacle racks removably supported on a rack support platform, and each receptacle rack includes a plurality of receptacle holding positions arranged in rows and columns. One rack of the first receptacle storage area is designated as a STAT rack for holding STAT sample receptacles. The controller is programmed to first transfer all sample receptacles from their respective receptacle holding positions in the STAT rack to the conveyor using a sample receptacle handling system before transferring the sample receptacle from the remaining receptacle holding positions in the first receptacle storage area and before transferring the sample receptacle from the receptacle holding positions in the second receptacle storage area. **Claim 22**: The system according to claim 21, wherein the controller is programmed such that if additional sample receptacles are placed in one or more receptacle holding positions of the STAT rack after all sample receptacles have been removed from the STAT rack using the sample receptacle handling system and before all sample receptacles are removed from racks other than the STAT rack in the first receptacle storage area and / or the second receptacle storage area, the sample receptacle handling system is returned to the STAT rack to remove all sample receptacles held in the STAT rack before removing sample receptacles from racks other than the STAT rack in the first receptacle storage area and the second receptacle storage area.

23. The system according to claim 21, further comprising a switch configured to generate a signal detected by the controller when the STAT rack is replaced, wherein the controller is configured to transfer all sample receptacles from their respective receptacle holding positions in the replaced STAT rack to the sample receptacle handling system before transferring the sample receptacle from the remaining receptacle holding positions in the first receptacle storage area and before transferring the sample receptacle from the receptacle holding positions in the second receptacle storage area.

24. The system according to claim 20, wherein the rack of the first receptacle storage area is separated from the rack of the second receptacle storage area by a gap forming the first receptacle transport path.

25. The system according to claim 20, further comprising: a first drawer supporting at least one rack of the first receptacle storage area and at least one rack of the second receptacle storage area; a second drawer supporting at least one rack of the first receptacle storage area and at least one rack of the second receptacle storage area.

26. The system according to claim 20, wherein the first receptacle storage area comprises four receptacle racks arranged side by side between the third side and the fourth side of the first receptacle storage area, the four receptacle racks of the first receptacle storage area having a first side aligned with the first side of the first receptacle storage area and a second side aligned with the second side of the first receptacle storage area, the second receptacle storage area comprising four receptacle racks arranged side by side between the third side and the fourth side of the second receptacle storage area, the four receptacle racks of the second receptacle storage area having a first side aligned with the first side of the second receptacle storage area and a second side aligned with the second side of the second receptacle storage area. ​ **Claim 27**: The system according to claim 26, wherein the second receptacle transport path has a gap between two of the four receptacle racks in the first receptacle storage area, and the gap has a width greater than or equal to the width of the widest receptacle holding position in the second receptacle storage area. **Claim 28**: The system according to claim 26, further comprising: a first drawer that supports two receptacle racks in the first receptacle storage area and two receptacle racks in the second receptacle storage area; a second drawer that supports two receptacle racks in the first receptacle storage area and two receptacle racks in the second receptacle storage area. **Claim 29**: A part of the first receptacle storage area including consecutive groups of receptacle holding positions is designated as an isolation section configured to receive sample receptacles placed therein by the sample receptacle handling system, and the controller is programmed to transfer, as needed, selected ones of the sample receptacles from receptacle holding positions in the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area, and then transfer the selected sample receptacles to receptacle holding positions in the isolation section. The system according to claim 1. **Claim 30**: The system according to claim 29, wherein the controller is programmed to transfer a selected sample receptacle to the isolation section when an error occurs with respect to the selected sample receptacle. **Claim 31**: The error with respect to the selected sample receptacle includes insufficient information being stored for the selected sample receptacle; an open test order for the selected sample receptacle not being stored; unreadable machine-readable information associated with the selected sample receptacle; insufficient headspace within the selected sample receptacle; and insufficient sample material contained within the selected sample receptacle. The system according to claim 30, including one or more of the above. ​ **Claim 32**: A part of the first receptacle storage area including consecutive groups of receptacle holding positions is designated as an isolation section configured to receive sample receptacles placed therein by the sample receptacle handling system, the second receptacle transport path comprises a row of empty receptacle holding positions in the isolation section, and the controller is programmed to transfer selected ones of the sample receptacles from receptacle holding positions in the first receptacle storage area or the second receptacle storage area that are not within the isolation section to outside the first receptacle storage area or the second receptacle storage area as needed, and then transfer the selected sample receptacles to receptacle holding positions in the isolation section other than the receptacle holding positions of the second receptacle transport path. The system according to claim 1. **Claim 33**: The system according to claim 32, wherein the controller is programmed to transfer the selected sample receptacle to the isolation section when an error occurs with respect to the selected sample receptacle. **Claim 34**: The error with respect to the selected sample receptacle is insufficient information being stored with respect to the selected sample receptacle, an open test order for the selected sample receptacle not being stored, unreadable machine-readable information associated with the selected sample receptacle, insufficient headspace within the selected sample receptacle, and insufficient sample material contained within the selected sample receptacle The system according to claim 33, including one or more of the foregoing. **Claim 35**: Each sample receptacle comprises a test tube. The system according to claim 1. **Claim 36**: The system according to claim 1, further comprising a plurality of receptacle holders, each receptacle holder being supported on the conveyor and configured to receive a sample receptacle and hold the sample receptacle in an upright orientation.

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