Measurement device

JP2025027336APending Publication Date: 2025-02-27KK TOSHIBA +1
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Patent Information

Application Number
JP2023132063
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2023-08-14
Publication Date
2025-02-27

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Abstract

To provide a measurement device capable of reducing the amount of data saved in a storage unit and performing appropriate data analysis.SOLUTION: A measurement device according to an embodiment measures a manufactured product moving on a manufacturing line. The measurement device includes: a detection unit that measures the manufactured product every predetermined measurement cycle; and a controller that is electrically connected to the detection unit and equipment provided outside of the measurement device. The controller saves data for the aforementioned every measurement cycle into a first folder, extracts data related to a first target from the data for the aforementioned every measurement cycle saved in the first folder, saves the extracted data related to the first target into a second folder having a longer saving period than that of the first folder, extracts data related to a second target from the data related to the first target saved in the second folder, and saves the extracted data related to the second target into a third folder having a longer saving period than that of the second folder.SELECTED DRAWING: Figure 2
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Description

[Technical field]

[0001] FIELD OF THE DISCLOSURE An embodiment of the present invention relates to a measurement apparatus. [Background technology]

[0002] There are measuring devices installed in production lines to measure products moving along the production line. For example, rolling lines for iron and non-ferrous metals that operate 24 hours a day are equipped with thickness gauges that measure the thickness of rolled plate materials and width gauges that measure the width of rolled plate materials. Data on the measured values ​​and data on any abnormalities that occur are stored in a storage unit such as a hard disk provided for each type of measuring device.

[0003] However, the measurement period of the measuring device is, for example, 5 ms to 10 ms. Therefore, the amount of data measured and stored in the storage unit is huge. In this case, if the data storage period is shortened, the amount of data stored in the storage unit can be reduced. However, if the data storage period is uniformly shortened, it may become impossible to analyze an abnormality that has occurred. Therefore, there has been a demand for the development of a measuring device that can reduce the amount of data stored in the memory unit and that enables appropriate data analysis. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] International Publication No. 2020 / 194534 Summary of the Invention [Problem to be solved by the invention]

[0005] An object of the present invention is to provide a measuring device that can reduce the amount of data stored in a storage unit and that enables appropriate data analysis. [Means for solving the problem]

[0006] The measuring device according to the embodiment is a measuring device that measures a product moving on a manufacturing line. The measuring device includes a detection unit that measures the product at a predetermined measurement cycle, and a controller electrically connected to the detection unit and an apparatus provided outside the measuring device. The controller stores data at each measurement cycle in a first folder, extracts data related to a first target from the data at each measurement cycle stored in the first folder, stores the extracted data related to the first target in a second folder having a longer storage period than the first folder, extracts data related to a second target from the data related to the first target stored in the second folder, and stores the extracted data related to the second target in a third folder having a longer storage period than the second folder. [Brief description of the drawings]

[0007] [Figure 1] 1 is a schematic perspective view illustrating a manufacturing line provided with a measuring device according to an embodiment of the present invention; [Diagram 2] FIG. 2 is a block diagram illustrating the configuration of a measurement device. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0008] Hereinafter, an embodiment will be described with reference to the drawings. In the drawings, the same components are denoted by the same reference numerals, and detailed description thereof will be omitted as appropriate.

[0009] FIG. 1 is a schematic perspective view illustrating a manufacturing line 100 provided with a measuring device 107 according to the present embodiment. The manufacturing line 100 illustrated in FIG. 1 is a hot rolling line provided with a plurality of types of measuring devices 107a to 107d.

[0010] As shown in FIG. 1, the hot rolling line 100 includes, for example, an edger 101, a roughing mill 102, a crop shear 103, a finishing mill 104, a down coiler 105, a detector 106, measuring devices 107a to 107d, and a control device 108.

[0011] The edger 101 rolls the slab 200 in the width direction. The roughing mill 102 rolls the slab 200 in the thickness direction. The crop shear 103 sends the slab 200 cut after rough rolling toward the finishing mill 104. The finishing mill 104 rolls the slab 200 in the thickness direction. The down coiler 105 winds up the rolled material 200a that has been finish-rolled by the finishing mill 104. The detector 106 detects the position of the slab 200. The detector 106 detects, for example, infrared rays emitted from the slab 200 to detect the presence or absence of the slab 200, the passage of the slab 200, the position of the slab 200, and the like. It should be noted that since known technology can be applied to the edger 101, the roughing mill 102, the crop shear 103, the finishing mill 104, the down coiler 105, and the detector 106, detailed description thereof will be omitted.

[0012] The measuring devices 107a to 107f measure the products (e.g., slabs 200 or rolled material 200a) moving on the hot rolling line 100. For example, the measuring device 107a can be a width gauge that measures the width dimension of the product. For example, the measuring device 107b can be a cesium thickness gauge that measures the thickness dimension of the product. For example, the measuring device 107c can be an X-ray thickness gauge that measures the thickness dimension of the product. For example, the measuring device 107d can be a surface inspection device that measures the surface condition of the product.

[0013] The control device 108 controls each element provided in the hot rolling line 100. The control device 108 can be, for example, a computer connected to a LAN (Local Area Network).

[0014] FIG. 2 is a block diagram illustrating the configuration of the measuring device 107. As shown in FIG. 2, the measurement device 107 includes, for example, a detection unit 1, an input unit 2, an output unit 3, and a controller 4. The detection unit 1 measures the product at every predetermined measurement period. When the measurement device 107 is a width gauge 107a, the detection unit 1 can be, for example, an optical sensor 1a such as a line sensor or a CCD camera. When the detection unit 1 is a CCD camera, the width dimension of the product can be measured by image processing. When the measurement device 107 is a cesium thickness gauge 107b, the detection unit 1 can be, for example, a transmission type cesium sensor 1b. When the measurement device 107 is an X-ray thickness gauge 107c, the detection unit 1 can be, for example, a transmission type X-ray sensor 1c. When the measurement device 107 is a surface inspection device 107d, the detection unit 1 can be, for example, a reflection type laser sensor 1d.

[0015] It should be noted that known techniques can be applied to the optical sensor 1a, the cesium sensor 1b, the X-ray sensor 1c, and the laser sensor 1d, and therefore detailed explanations thereof will be omitted. Furthermore, the detection unit 1 is not limited to the one exemplified above. The detection unit 1 can be appropriately changed depending on the purpose of the measurement. For example, the detection unit 1 may be any unit capable of converting the physical quantity or state of a product into an electrical signal.

[0016] The input unit 2 is electrically connected to the controller 4. An operator can input information such as a set value to the controller 4 via the input unit 2. The input unit 2 can also be electrically connected to the detection unit 1. An operator can input information such as a set value to a control unit of the detection unit 1 via the input unit 2.

[0017] The output unit 3 is electrically connected to the controller 4. The output unit 3 displays information output from the controller 4. The output unit 3 can be, for example, a flat panel display. The information displayed on the output unit 3 is, for example, the dimensions and surface condition of the product measured by the detection unit 1. The output unit 3 can also display information such as the operating status and occurrence of an abnormality of the measuring device 107 and the hot rolling line 100.

[0018] The controller 4 is electrically connected to the detection unit 1 and devices (eg, the detector 106 and the control device 108) provided outside the measurement device 107 via a LAN. The controller 4 includes, for example, a calculation unit 4a and a storage unit 4b. The calculation unit 4a can be, for example, a CPU (Central Processing Unit). The calculation unit 4a controls the operation of each element provided in the measuring device 107 based on software stored in the storage unit 4b. The calculation unit 4a also performs data collection, classification of the collected data, processing of the collected data, etc., which will be described later.

[0019] The storage unit 4b can be, for example, a NAS (Network Attached Storage), etc. The storage unit 4b can store, for example, software for controlling the detection unit 1, software for calculating a measurement value based on an electric signal from the detection unit 1, HMI (Human Machine Interface) software for the control device 108 to remotely operate the measuring device 107 and for the control device 108 to grasp the state and measurement data of the measuring device 107, and software for collecting data, classifying the collected data, processing the collected data, etc.

[0020] Known technologies can be applied to the software for controlling the detection unit 1, the software for calculating the measured values, and the HMI software. Therefore, detailed explanations of these software are omitted, and the following describes data collection, classification of collected data, and processing of collected data.

[0021] Here, in the hot rolling line 100, the measurement cycle of the measuring device 107 is, for example, 5 ms to 10 ms. Therefore, the amount of collected data is huge, and it is difficult to store all of the collected data in the storage unit 4b for a long period of time. In this case, if the collected data is uniformly thinned out, the data can be stored in the storage unit 4b for a certain period of time.

[0022] However, even if a change or abnormality occurs in the measuring device 107, if the measurement by the measuring device 107 can be continued, the data at the time of the change or abnormality may not be checked immediately. In such a case, data analysis of the event that occurred will be performed at a later date. Therefore, if the collected data is uniformly thinned out, all or part of the data at the time of the event occurrence may be erased, making it impossible to analyze the data.

[0023] Therefore, the controller 4 reduces the amount of data to the extent that appropriate data analysis can be performed. For example, the collected data may be as exemplified in (1) to (4) below. The contents to be stored and the storage period are changed according to the target of data analysis. The storage period may be, for example, short term (e.g., about one day), medium term (e.g., about two weeks), or long term (e.g., about six months). However, the contents of the data and the storage period are not limited to those exemplified, and may be changed as appropriate according to the type and configuration of the measuring device 107, the physical quantity and state of the product, etc.

[0024] (1) As described above, the controller 4 is electrically connected to the control device 108 of the hot rolling line 100. In addition, the controller 4 is electrically connected to the detector 106.

[0025] Therefore, the data may relate to, for example, interface signals between the control device 108 and the detector 106, and the controller 4. The data may be, for example, the ON / OFF state of a digital input / output signal (DIO signal) with a time stamp between the controller 4 and an apparatus (e.g., the detector 106 or the control device 108) provided outside the measuring device 107, or a measurement value of a product with a time stamp. The data with the time stamp may be stored in a short-term storage folder (corresponding to an example of the first folder). That is, the short-term storage folder stores raw data for each measurement cycle.

[0026] As described above, the measurement cycle of the measuring device 107 is 5 ms to 10 ms, so the amount of data stored in the short-term storage folder becomes enormous. Next, data that will be required for data analysis at a later date is extracted from the data stored in the short-term storage folder. In this case, if the timing at which the digital input / output signal changes is known, the general operating status of the hot rolling line 100 can be known. Therefore, the data to be extracted can be the timing at which the digital input / output signal changes. The timing at which the digital input / output signal changes is the timing at which the digital input / output signal changes from ON to OFF, or the timing at which the digital input / output signal changes from OFF to ON.

[0027] The extracted data can be stored in a medium-term storage folder (corresponding to an example of the second folder). In this way, the amount of data stored in the medium-term storage folder can be reduced. Furthermore, if data required for data analysis is stored in the medium-term storage folder, data analysis can be performed at a later date.

[0028] In addition, the data stored in the short-term storage folder is deleted from the short-term storage folder after the short-term storage storage period has elapsed. In this way, the amount of data stored in the short-term storage folder can be limited.

[0029] However, the amount of data stored in the medium-term storage folder increases over time. Therefore, next, data required for performing detailed data analysis at a later date is extracted from the data stored in the medium-term storage folder. In this case, if the number of times the digital input / output signal has changed is known, it can be known that an abnormality such as a change or failure has occurred in the measuring device 107. For example, if the number of times the digital input / output signal has changed is less than the number of times in a normal state, it can be determined that an abnormality such as a change or failure has occurred in the measuring device 107. Therefore, the data to be extracted can be the number of times the digital input / output signal has changed in a predetermined period. The number of times the digital input / output signal has changed is the number of times the digital input / output signal has changed from ON to OFF, or the number of times the digital input / output signal has changed from OFF to ON.

[0030] The extracted data can be stored in a long-term storage folder (corresponding to an example of the third folder). In this way, the amount of data stored in the long-term storage folder can be further reduced. In addition, if data required for detailed data analysis is stored in the long-term storage folder, detailed data analysis can be performed at a later date.

[0031] In addition, the data stored in the medium-term storage folder is deleted from the medium-term storage folder after the medium-term storage period has elapsed. In this way, the amount of data stored in the medium-term storage folder can be limited.

[0032] In addition, the data stored in the long-term storage folder is deleted from the long-term storage folder after the long-term storage period has elapsed. In this way, the amount of data stored in the long-term storage folder can be limited.

[0033] (2) The data may be a measurement value measured by the measuring device 107, a setting value used in the measuring device 107, or data such as temperature or speed related to the measurement by the measuring device 107. In this case, the data may include not only digital signal data but also analog signal data.

[0034] For example, in the case of the cesium thickness gauge 107b or the X-ray thickness gauge 107c, the data may be the measured plate thickness dimension, the radiation dose at the time of measurement, the tube voltage of the X-ray tube, the tube current of the X-ray tube, the temperature of the product, the temperature of the cesium sensor 1b or the X-ray sensor 1c, the moving speed of the product (line speed), etc.

[0035] For example, in the case of the width meter 107a, the data can be the measured width dimension, the amount of lift or lateral vibration of the product, the pulse width (exposure time) of the CCD camera, the maximum crest value or charge time of the pixel of the CCD camera, the temperature of the product, the temperature of the optical sensor 1a, the moving speed (line speed) of the product, etc. The data can also be image data captured by the CCD camera.

[0036] Then, the data for each measurement cycle can be stored in a short-term storage folder with a time stamp added thereto. That is, the raw data for each measurement cycle is stored in the short-term storage folder.

[0037] As in the above case, when storing such data, the amount of data stored in the short-term storage folder becomes enormous. Next, data required for data analysis at a later date is extracted from the data stored in the short-term storage folder. In this case, for example, if the statistical values ​​of the measurement values ​​in a predetermined period (corresponding to an example of the first period) are known, it is possible to know the occurrence of changes or abnormalities in the hot rolling line 100, or the occurrence of changes or abnormalities in the measuring device 107. The statistical values ​​of the measurement values ​​are, for example, the maximum value, minimum value, average value, median value, etc. of the measurement values. Therefore, the data to be extracted can be the statistical values ​​of the measurement values ​​in the predetermined period.

[0038] The extracted data can be stored in a medium-term storage folder. In this way, the amount of data stored in the medium-term storage folder can be reduced. Furthermore, if data required for data analysis is stored in the medium-term storage folder, data analysis can be performed at a later date.

[0039] In addition, the data stored in the short-term storage folder is deleted from the short-term storage folder after the short-term storage storage period has elapsed. In this way, the amount of data stored in the short-term storage folder can be limited.

[0040] However, as in the above case, the amount of data stored in the medium-term storage folder increases over time. Therefore, next, predetermined data is extracted from the data stored in the medium-term storage folder. For example, the period for extracting data when calculating statistical values ​​can be set to a period longer than that for medium-term storage (corresponding to an example of the second period). In this way, the amount of data stored in the long-term storage folder can be reduced. For example, if the period for extracting data is set to 10 times that for medium-term storage, the amount of data stored in the long-term storage folder can be reduced to 1 / 10. Furthermore, if data is stored in the long-term storage folder, data analysis at a later date is possible.

[0041] In addition, the data stored in the medium-term storage folder is deleted from the medium-term storage folder after the medium-term storage period has elapsed. In this way, the amount of data stored in the medium-term storage folder can be limited.

[0042] In addition, the data stored in the long-term storage folder is deleted from the long-term storage folder after the long-term storage period has elapsed. In this way, the amount of data stored in the long-term storage folder can be limited. (3) The data may also be data related to an event that has occurred in the measuring device 107. An event is an occurrence that has occurred accidentally or unplanned in the measuring device 107. The occurrence of an event may be determined, for example, from the interface signals between the control device 108 and the detector 106 and the controller 4, and the measurement values ​​measured by the measuring device 107, as described above. For example, if the measuring device 107 does not operate despite an interface signal for starting or ending measurement being input, or if the measurement value falls outside a predetermined range, it may be determined that an event has occurred.

[0043] The data in (1) and (2) is acquired at each measurement cycle, so the amount of data is huge, but events do not occur frequently, so the amount of data is small. Also, data related to events is likely to be needed to analyze changes or abnormalities. Therefore, data related to events can be stored in a medium-term storage folder rather than in a short-term storage folder.

[0044] The data stored in the medium-term storage folder may be, for example, data related to an event item and the date and time of the event. The event item may be, for example, an abnormal value such as a thickness dimension or a width dimension. If the event item and the date and time of the event are stored in the medium-term storage folder, data analysis at a later date becomes possible.

[0045] However, the amount of data stored in the medium-term storage folder increases over time, so next, predetermined data is extracted from the data stored in the medium-term storage folder.

[0046] In this case, if the number of times an event occurs within a given period of time is known, the degree of change or abnormality can be determined. As described above, the mid-term storage folder and the long-term storage folder store the timing at which the digital input / output signals changed, the number of times the digital input / output signals changed, statistical values ​​of the measured values, and so on.

[0047] Therefore, by referring to the timing at which the digital input / output signal changed during a period when the number of events occurring was high, the number of times the digital input / output signal changed, statistical values ​​of the measurement values, and the like, the cause of the event occurrence can be analyzed.

[0048] Therefore, the number of times an event occurred during a specified period is extracted from the data stored in the medium-term storage folder. The extracted data can be stored in the long-term storage folder. In this way, the amount of data stored in the long-term storage folder can be further reduced.

[0049] In addition, the data stored in the medium-term storage folder is deleted from the medium-term storage folder after the medium-term storage period has elapsed. In this way, the amount of data stored in the medium-term storage folder can be limited.

[0050] In addition, the data stored in the long-term storage folder is deleted from the long-term storage folder after the long-term storage period has elapsed. In this way, the amount of data stored in the long-term storage folder can be limited. (4) The controller 4 may also be provided with a self-diagnosis function. The self-diagnosis function is a function that judges whether or not a malfunction has occurred using, for example, interface signals between the control device 108 and the detector 106 and the controller 4, and measurement values ​​measured by the measuring device 107. For example, if there is no input or output of interface signals, if measurement does not start, or if measurement does not end, it can be judged that a malfunction has occurred in the measuring device 107. Note that the content of the self-diagnosis function differs depending on the type of the measuring device 107, and therefore the content of the malfunction judgment is not limited to the example given.

[0051] Therefore, the data can be data related to the self-diagnosis function (data related to a failure). Since failures of the measuring device 107 rarely occur, the amount of data is quite small. Furthermore, the data related to the self-diagnosis function is likely to be required for analyzing changes or abnormalities. Therefore, the data related to the self-diagnosis function can be stored in a long-term storage folder, rather than in a short-term storage folder or a medium-term storage folder.

[0052] The data stored in the long-term storage folder may be, for example, the item of the failure (for example, the part suspected to be broken), the date and time of the failure, and the date and time of recovery from the failure.

[0053] If the long-term storage folder stores the failure item, the date and time of failure occurrence, and the date and time of recovery from the failure, data analysis at a later date will be possible. As described above, the medium-term storage folder and the long-term storage folder store the timing at which the digital input / output signal changed, the number of times the digital input / output signal changed, the statistical values ​​of the measurement values, the event item, and the date and time at which the event occurred. Therefore, by referring to the timing at which the digital input / output signal changed, the number of times the digital input / output signal changed, the statistical values ​​of the measurement values, the event item, and the date and time at which the event occurred at the date and time at which the failure occurred, the cause of the failure can be analyzed.

[0054] The data stored in the long-term storage folder is deleted from the long-term storage folder after the long-term storage period has elapsed. In this way, the amount of data stored in the long-term storage folder can be limited.

[0055] Furthermore, when analyzing data related to the self-diagnosis function, data stored in the short-term storage folder (raw data for each measurement cycle) may be required. However, since data stored in the short-term storage folder is deleted in a short period of time, there is a risk that the data may be lost when analyzing the data related to the self-diagnosis function at a later date.

[0056] Therefore, when the controller 4 determines that a failure has occurred, it can store data for each measurement cycle for a predetermined period before and after the failure in a long-term storage folder together with the type of failure, the date and time of the failure, and the date and time of recovery from the failure. The data for each measurement cycle before and after the failure can be extracted from the data stored in the short-term storage folder. The time range for extracting data may be, for example, about one second before and after the failure. In this way, the accuracy of the data analysis performed at a later date can be improved, and the amount of data stored in the long-term storage folder can be prevented from increasing excessively.

[0057] Furthermore, chattering of digital input / output signals, timing delays, etc. can cause errors in the measurement values. For example, thickness and width measurements are performed in the following sequence: "Receive setting value → Setting change signal ON → Detect product → Start measurement → Passage of product (end of detection) → End of measurement → Calculate measurement value." In this case, the setting change signal is turned ON based on the interface signal from the control device 108. The detection of the product is performed based on the detection signal from the detector 106. Therefore, the order of the interface signal and the detection signal may be reversed. If the order of the interface signal and the detection signal is reversed, an abnormality occurs in the measurement value.

[0058] Therefore, when an abnormality occurs in the measurement value, the controller 4 can store the measurement value for each measurement cycle for a predetermined period before and after the abnormality occurs in a long-term storage folder together with the abnormality item of the measurement value and the date and time of the abnormality. The data for each measurement cycle before and after the abnormality occurs can be extracted from the data stored in the short-term storage folder. The time range for extracting the data can be changed as appropriate depending on the type and arrangement of the measuring device 107. For example, the time range for extracting the data is about 5 minutes to 1 hour.

[0059] In this way, it is possible to analyze whether the cause of an abnormality in the measurement value is due to an interface signal or a malfunction of the measuring device 107. In other words, the accuracy of data analysis performed at a later date can be improved. Also, it is possible to prevent the amount of data stored in the long-term storage folder from increasing excessively.

[0060] As described above, in the case of the width meter 107a, the detection unit 1 (optical sensor 1a: CCD camera) may capture an image of the product. The acquired image data can be used, for example, for analysis when an abnormality occurs in the measurement value. Therefore, the image data can be stored, for example, in a short-term storage folder as data. Although the image data is large in volume, the short-term storage folder is suitable for storing image data because it stores raw data for each measurement cycle, which is a large amount of data.

[0061] However, since data stored in a short-term storage folder is deleted after a short period of time, there is a risk that the image data will be lost when analyzing data relating to the occurrence of an abnormality in a measurement value at a later date.

[0062] Therefore, when an abnormality occurs in the measurement value, the controller 4 can store the image data for a predetermined period before and after the occurrence of the abnormality in a long-term storage folder together with the item of the abnormality in the measurement value, the measurement value data, the date and time of the occurrence of the abnormality, etc. Image data before and after the occurrence of the abnormality in the measurement value can be extracted from image data stored in the short-term storage folder. In this way, the accuracy of the data analysis performed at a later date can be improved, and the amount of data stored in the long-term storage folder can be prevented from increasing excessively.

[0063] As described above, with the measuring device 107 according to this embodiment, the amount of data stored in the storage unit 4b can be reduced, and appropriate data analysis becomes possible.

[0064] Although some embodiments of the present invention have been illustrated above, these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other forms, and various omissions, substitutions, modifications, etc. can be made without departing from the gist of the invention. These embodiments and their modifications are included in the scope and gist of the invention, and are included in the scope of the invention and its equivalents described in the claims. In addition, the above-mentioned embodiments can be implemented in combination with each other. [Explanation of symbols]

[0065] 1 detection unit, 2 input unit, 3 output unit, 4 controller, 4a calculation unit, 4b memory unit, 100 hot rolling line, 106 detector, 107 measuring device, 107a width gauge, 107b cesium thickness gauge, 107c X-ray thickness gauge, 107d surface inspection device, 108 control device

Claims

1. A measuring device for measuring a product moving on a production line, comprising: A detection unit that measures the product at each predetermined measurement period; A controller electrically connected to the detection unit and to a device provided outside the measurement device; Equipped with The controller: The data for each measurement period is stored in a first folder; extracting data related to a first object from the data for each measurement period stored in the first folder, and storing the extracted data related to the first object in a second folder having a longer storage period than the first folder; A measuring device that extracts data relating to a second subject from the data relating to the first subject stored in the second folder, and stores the extracted data relating to the second subject in a third folder having a longer storage period than the second folder.

2. The controller: further storing data relating to a third subject in said second folder; The measurement device according to claim 1 , further comprising: extracting data relating to a fourth object from the data relating to the third object stored in the second folder; and further storing the extracted data relating to the fourth object in the third folder.

3. the data is an ON / OFF state of a digital input / output signal between the controller and the device provided outside the measuring device and having a time stamp attached thereto, or a measurement value of the product and having a time stamp attached thereto; the first target is a timing at which the digital input / output signal changes ON / OFF or a statistical value of the measurement value during a first period; the second target is the number of times that the digital input / output signal changes ON / OFF during a predetermined period, or a statistical value of the measurement value during a second period that is longer than the first period; the third target is an event item that has occurred in the measurement device and a date and time of the event; 3. The measuring apparatus according to claim 2, wherein the fourth target is the number of occurrences of the event within a predetermined period.

4. The controller further has a self-diagnosis function for determining a failure, 3. The measuring device according to claim 1, wherein when the controller determines that a failure has occurred, the controller further stores in the third folder a date and time when the failure occurred and a date and time when the failure was restored.

5. 5. The measuring device according to claim 4, wherein the controller further stores in the third folder data for each measurement period for a predetermined period before and after the occurrence of the failure.

6. 4. The measuring device according to claim 3, wherein, when an abnormality occurs in the measurement values, the controller further stores in the third folder the measurement values ​​for each measurement cycle for a predetermined period before and after the occurrence of the abnormality, together with the date and time when the abnormality occurred.

7. The detection unit captures an image of the product, The measuring device according to claim 3 or 6, wherein, when an abnormality occurs in the measurement value, the controller further stores in the third folder the image data for a predetermined period before and after the occurrence of the abnormality, together with the date and time of the occurrence of the abnormality.

Citation Information

Patent Citations

  • Abnormality determination assistance device

    WO2020194534A1