An elastic modulus measuring device and a measuring method

Abstract

The present invention discloses an elastic modulus measuring device and a measuring method. Among them, the elastic modulus measuring device includes: a base; a first shielding member located on the base; a second shielding member vertically arranged on the base; the first shielding member and the second shielding member cover the surfaces on different sides of the sample to be measured and form a cavity for accommodating the sample to be measured; a test piece located on the first shielding member and the second shielding member and attached to the sample to be measured, the test piece is configured to obtain the deformation amount of each surface of the sample to be measured placed in the test environment; and a measuring unit configured to obtain the bulk elastic modulus of the sample to be measured based on the deformation amount. The measuring device of the embodiment of the present invention effectively improves the measurement accuracy and measurement efficiency, and has a wide application prospect.

Description

Technical Field

[0001] The present invention relates to the technical field of measuring parameters of buoyancy materials, and particularly to an elastic modulus measuring device and a measuring method. Background Art

[0002] In recent years, with the continuous progress of technology, when solid materials and devices are applied in high-pressure environments, their volume and size will change, such as shrinkage, expansion, etc. The dimensional changes of solid materials under high pressure will affect the assembly and functions between materials, between devices, and between materials and devices. For example, solid buoyancy materials work in high-water-pressure environments, but their bonding and assembly are carried out under the condition of a pressure of 0. When bonding and assembling solid buoyancy materials, it is necessary to consider their volume shrinkage at the application water depth so that the solid buoyancy materials can work properly at the application water depth. In addition, the volume shrinkage of solid buoyancy materials at the application water depth will cause a loss of their buoyancy, and this part of the content needs to be considered in the design stage of submersibles. Therefore, it is crucial to measure the volume change of solid materials under the application pressure.

[0003] The bulk modulus of elasticity of solid materials is a key index to measure their volume change under a certain pressure. Under high pressure, the bulk modulus of elasticity of solid materials will change with the change of pressure, which has a direct relationship with their assembly and functions under the application pressure. Therefore, accurately measuring the bulk modulus of elasticity of solid materials under the application pressure is of great significance to the stability of instrument and equipment working under pressure. There are problems of slow test efficiency and low test accuracy in the measurement of the bulk modulus of elasticity of solid buoyancy materials in the prior art. Summary of the Invention

[0004] In order to solve at least one of the above problems, the first embodiment of the present invention provides an elastic modulus measuring device, including:

[0005] A base;

[0006] A first shielding member located on the base;

[0007] A second shielding member vertically arranged on the base; the first shielding member and the second shielding member cover the surfaces on different sides of the sample to be tested and form a cavity for accommodating the sample to be tested;

[0008] A test member located on the first shielding member and the second shielding member and fitting to the sample to be tested, the test member is configured to obtain the deformation amount of each surface of the sample to be tested placed in the test environment; and

[0009] A measuring unit configured to obtain the bulk modulus of elasticity of the sample to be tested based on the deformation amount.

[0010] Further, the first shielding member includes:

[0011] The first connecting part located on the base

[0012] The first covering part connected to the first connecting part, the first covering part covering at least one surface of the sample to be measured; and

[0013] The second covering part located at one end of the first covering part away from the base, the surface of the second covering part covering the sample to be measured being different from the surface of the sample to be measured covered by the first covering part.

[0014] Furthermore, the first covering part and the second covering part are movably connected.

[0015] Furthermore, the second covering part covers at least two surfaces on different sides of the sample to be measured, and the second covering parts covering each different surface are configured to be movably connected.

[0016] Furthermore, the measuring device further includes a first adjusting structure arranged along a first direction, configured to drive the first shielding part to move along the first direction;

[0017] The first adjusting structure includes:

[0018] The first groove arranged along the first direction on the surface of the base; and

[0019] The first slide rail that cooperates with the first groove and moves along the first direction;

[0020] Wherein, the first connecting part is located on the first slide rail.

[0021] Furthermore, the second shielding part includes:

[0022] The second connecting part arranged along a second direction on the base;

[0023] The third covering part arranged vertically on the second connecting part.

[0024] Furthermore, the measuring device further includes a second adjusting structure arranged along the second direction, configured to drive the second shielding part to move along the second direction;

[0025] The second adjusting structure includes:

[0026] The second groove arranged along the second direction on the surface of the base; and

[0027] The second slide rail that cooperates with the second groove and moves along the second direction;

[0028] Wherein, the second connecting part is located on the second slide rail.

[0029] Further, the test piece is inserted from the outside of the first shielding member and the second shielding member and fits against the surface of the sample to be tested; the test piece is an extensometer.

[0030] Further, the measuring device further includes:

[0031] A support member that is inserted from the outside of the first shielding member or the second shielding member and abuts against the surface of the sample to be tested.

[0032] The second embodiment of the present invention provides a method for measuring the bulk modulus of elasticity of a sample to be tested by using the above-mentioned elastic modulus measuring device, including:

[0033] Cover the surfaces on different sides of the sample to be tested with the first shielding member and the second shielding member, and the first shielding member and the second shielding member form a cavity for accommodating the sample to be tested;

[0034] Fix the elastic modulus measuring device accommodating the sample to be tested in the test chamber;

[0035] The test pieces located on the first shielding member and the second shielding member obtain the deformation amounts of each surface of the sample to be tested placed in the test chamber;

[0036] Determine the bulk modulus of elasticity of the sample to be tested in the test environment according to the deformation amount of each surface.

[0037] The beneficial effects of the present invention are as follows:

[0038] In view of the existing problems at present, the present invention formulates an elastic modulus measuring device. By forming a cover for all surfaces of the sample to be tested with the first shielding member and the second shielding member, the sample to be tested can be fixed. The test pieces provided on the first shielding member and the second shielding member can accurately obtain the deformation amounts of each surface of the sample to be tested in the test environment. The accuracy of the bulk modulus of elasticity of the sample to be tested obtained according to the deformation amounts is relatively high, and the device realizes the in-situ measurement of the bulk modulus of elasticity of the sample to be tested without changing the test environment, effectively improving the measurement accuracy and measurement efficiency, and having a wide application prospect. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for description in the embodiments. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained according to these drawings.

[0040] Figure 1 A schematic structural diagram of the elastic modulus measuring device according to an embodiment of the present invention is shown;

[0041] Figure 2 Schematic structural diagram of the second shielding member according to an embodiment of the present invention;

[0042] Figure 3 Schematic structural diagram of the first shielding member according to an embodiment of the present invention;

[0043] Figure 4 Schematic structural diagram of the test piece according to an embodiment of the present invention;

[0044] Figure 5 Schematic diagram showing the curve change of the deformation amount and the bulk modulus of elasticity of the present invention;

[0045] Figure 6a and 6b Schematic structural diagram of the adjustment structure according to an embodiment of the present invention;

[0046] Figure 7a Specific schematic diagram showing the movable connection between the first shielding member and the second shielding member according to an embodiment of the present invention;

[0047] Figure 7b Another specific schematic diagram showing the movable connection between the first shielding member and the second shielding member according to an embodiment of the present invention;

[0048] Figure 8 Flowchart of the elastic modulus measurement method provided by another embodiment of the present invention. Detailed implementation manners

[0049] In order to more clearly illustrate the present invention, the present invention will be further described below in conjunction with preferred embodiments and the accompanying drawings. Similar components in the drawings are denoted by the same reference numerals. Those skilled in the art should understand that the content specifically described below is illustrative rather than restrictive, and should not be used to limit the protection scope of the present invention.

[0050] It should be noted that the expressions "on...", "formed on...", and "disposed on..." described in this article can mean that one layer is directly formed or disposed on another layer, or it can also mean that one layer is indirectly formed or disposed on another layer, that is, there are other layers between the two layers. Moreover, relational terms such as first and second in this article are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Also, the terms "comprising", "including", or any other variant thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the presence of additional identical elements in the process, method, article, or device comprising the element.

[0051] There are common defects in the measurement of the bulk modulus of elasticity of solid buoyancy materials in the prior art:

[0052] First, it is impossible to measure the bulk modulus of elasticity of solid materials in situ under high-pressure environments. The measurement process of the measurement device in the prior art is as follows: at a certain pressure, the volume difference of water injected into the high-pressure cylinders separately containing the standard sample and the solid material sample is obtained through the measurement device, and then the water absorption volume of the solid material is subtracted to calculate the bulk modulus of elasticity of the solid material. Among them, the water absorption volume of the solid material is calculated from the mass difference of the solid material before and after the test. However, the water absorption volume of the solid material is related to the pressure it is under. If the buoyancy material is taken out and weighed after the test, the water absorbed by it under high pressure will seep out as the pressure decreases, and it cannot fully represent the water absorption volume under the target test pressure. Therefore, the above device calculates the bulk modulus of elasticity of the material by measuring the volume difference of water, and it is impossible to achieve in-situ measurement of the bulk modulus of elasticity of the material under high pressure, resulting in low measurement accuracy.

[0053] Second, the measurement device in the prior art can only measure the bulk modulus of elasticity at the target pressure through one measurement, resulting in low test efficiency. Since the bulk modulus of elasticity of solid materials is different at different pressures, to predict the bulk modulus of elasticity of the same sample at different pressures, multiple measurements are required, resulting in low measurement efficiency.

[0054] To solve the above problems, the inventors proposed an elastic modulus measurement device and a measurement method after a large number of experiments and studies.

[0055] As Figure 1 and Figure 4 shown, an embodiment of the present invention provides an elastic modulus measurement device 1, including:

[0056] Base 13;

[0057] The first shielding member 11 located on the base 13;

[0058] The second shielding member 12 vertically arranged on the base 13; the first shielding member 11 and the second shielding member 12 cover the surfaces on different sides of the sample to be tested and form a cavity 114 for accommodating the sample to be tested;

[0059] The test piece 14 attached to the sample to be tested on the first shielding member 11 and the second shielding member 12, and the test piece is configured to obtain the deformation amount of each surface of the sample to be tested in the test environment;

[0060] A measurement unit (not shown in the figure), configured to obtain the bulk modulus of elasticity of the sample to be tested based on the deformation amount.

[0061] As Figure 1 shown, in this embodiment, the first shielding member 11 and the second shielding member 12 form a coverage of all surfaces of the sample to be tested, so that the sample to be tested can be fixed. On this basis, the test piece provided on the first shielding member 11 and the second shielding member 12 can accurately obtain the deformation amount of each surface of the sample to be tested in the test environment. The measurement unit obtains the bulk modulus of elasticity of the sample to be tested with higher accuracy according to the deformation amount, and the device realizes the in-situ measurement of the bulk modulus of elasticity of the sample to be tested without changing the test environment, effectively improving the measurement accuracy. Further, since the measurement device of this embodiment can be fixed in the test environment, the corresponding bulk modulus of elasticity when the measurement environment changes can be obtained, thereby improving the measurement efficiency.

[0062] In this embodiment, the measurement unit includes but is not limited to computer devices, mobile phone terminals, and software with information acquisition and calculation functions applied to the foregoing devices and terminals.

[0063] As Figure 1 shown, the sample to be tested is fixed in the cavity 114 formed by the first shielding member 11 and the second shielding member 12. With the cooperative arrangement of the first shielding member 11 and the second shielding member 12, each surface of the sample to be tested is covered, so that the test piece can obtain the deformation amount of all surfaces of the sample to be tested.

[0064] In an alternative embodiment, as Figure 1 and Figure 2 shown, the second shielding member 12 includes:

[0065] The second connecting portion 121 arranged along the second direction on the base 13;

[0066] The vertically arranged third covering part 122 located on the second connecting part 121.

[0067] The second direction of this embodiment is the X direction as shown in Figure 1 The second connecting part 121 arranged on the base 13 extends along the X direction. The vertical direction is Figure 1 the Z direction as shown in. The third covering part 122 arranged vertically with the second connecting part 121 can cover the surface of the sample to be measured in the vertical direction. In a specific example, when the sample to be measured is a cuboid, the third covering part 122 covers the surfaces on the opposite sides of the cuboid.

[0068] In an alternative embodiment, as shown in Figure 6a and Figure 6b The measuring device further includes a second adjusting structure arranged along the second direction, configured to drive the second shielding member to move along the second direction;

[0069] The second adjusting structure includes:

[0070] A second groove 131 arranged on the base surface along the second direction; and

[0071] A second slide rail 134 that moves along the second direction and cooperates with the second groove 131;

[0072] Wherein, the second connecting part 121 of the second shielding member 12 is located on the second slide rail 134.

[0073] Considering the diversity of the volumes and shapes of different samples to be measured, in this embodiment, the second adjusting structure is used to drive the second shielding member to move. As shown in Figure 6a and 6b On the base 13, a second groove 132 is formed along the X direction. The second groove 132 and the second slide rail 134 that cooperates with it form a second adjusting structure capable of moving. The second connecting part 121 arranged on the second slide rail 134 can move along the second direction X under the drive of the second adjusting member, so that the distance between the third covering parts 122 of the second shielding member can be adaptively adjusted according to the volume of the sample to be measured, thereby meeting the test requirements of various samples to be measured and having a wide application prospect.

[0074] It should be noted that the embodiment of the present invention does not limit the connection manner between the second slide rail 134 and the second connecting part 121, such as bolts, welding, pin connection, or integrally formed. Taking the second adjusting structure driving the second shielding member to move along the X direction as the design criterion, it will not be elaborated here.

[0075] In an alternative embodiment, as shown in Figure 1 and Figure 3As shown, the first shielding member 11 includes:

[0076] A first connecting portion 113 located on the base 13,

[0077] A first covering portion 111 connected to the first connecting portion 113, the first covering portion 111 covering at least one surface of the sample to be measured; and

[0078] A second covering portion 112 located at one end of the first covering portion 111 away from the base 13, the second covering portion 112 covering a surface of the sample to be measured different from the surface of the sample to be measured covered by the first covering portion 111.

[0079] To improve the measurement accuracy, the sample to be measured in this embodiment is placed obliquely. On the basis that the second shielding member 12 covers the vertical side surface of the sample to be measured, the measurement of the inclined surface of the sample to be measured when it is placed obliquely is further realized through the first covering portion 111 and the second covering portion 112 of the first shielding member 11, so as to realize the measurement of the deformation amount of all surfaces of the sample to be measured, and effectively improve the measurement accuracy.

[0080] In a specific example, as Figure 1 shown, the sample to be measured is a cube or a cuboid. The first connecting portion 113 is fixedly arranged on the base 13, and various connecting methods such as bolt connection, welding, and riveting can be adopted. The first covering portion 111 connected to the first connecting portion 113 covers the inclined surface of the sample to be measured close to the base 13, and the second covering portion 112 is arranged at one end of the first covering portion 111 away from the base 13, and it covers the other inclined surface. As Figure 1 shown, the number of the first shielding members 11 in this embodiment is set to two, and the four inclined surfaces of the sample to be measured are covered by using the two first shielding members 11, so that the test pieces arranged on each first shielding member 11 can measure the deformation amount of each inclined surface. In this example, the first covering portion 111 and the second covering portion 112 are fixedly connected, and an included angle of 90° is formed between the first covering portion 111 and the second covering portion 112, which can be used to accommodate the sample to be measured in the shape of a cuboid or a cube.

[0081] In a specific example, the side length range of the sample to be measured in the shape of a cube or a cuboid is between 50 mm and 300 mm.

[0082] In an alternative embodiment, as Figure 7a shown, the first covering portion 111 and the second covering portion 112 are movably connected.

[0083] Considering the volume diversity of the sample to be measured, in this embodiment, the first covering part 111 and the second covering part 112 are further set to be movably connected, such as hinged, or the angle change between the second covering part 112 and the first covering part 111 is realized by means of a transfer member, so that the second shielding member can cover the inclined sides at different angles, such as a rhombic surface, and can form different angles according to the different shapes of the sample to be measured, adapting to various types of samples to be measured, and having a wide application prospect.

[0084] In a specific example, the angle-variable first shielding member 11 of this embodiment is as Figure 1 shown, and the method of using two first shielding members 11 can still be adopted. The specific covering method of each first shielding member 11 covering the inclined surface of the sample to be measured is the same as that described above, and will not be elaborated here.

[0085] In an alternative embodiment, as Figure 7b shown, the second covering part 112 covers at least the surfaces on two different sides of the sample to be measured, and the second covering parts 112 covering each different surface are configured to be movably connected.

[0086] Considering the shape diversity of the sample to be measured, for example, when the test sample is a quadrangular prism, a pentagonal prism, a hexagonal prism, or a multi-prism, the second covering part of this embodiment is set to cover at least the surfaces on two different sides of the sample to be measured. Taking the sample to be measured as a pentagonal prism as an example, the sample to be measured is placed obliquely, the second shielding member covers the vertically opposite sides of the sample to be measured, the first covering part covers the inclined surface of the sample to be measured close to the base, and the second covering part covers the other inclined surfaces. Through the mutual cooperation of the second shielding member, the first covering part, and the second covering part, the complete covering of all the sides of the pentagonal prism is realized. On this basis, the testing piece can obtain the deformation amount of each surface of the sample to be measured. According to this deformation amount, the volume elastic modulus of the current sample to be measured is determined, which has high measurement accuracy and a wide application prospect.

[0087] Furthermore, when the second covering part covers different inclined surfaces, the second covering parts covering each different inclined surface are configured to be movably connected. This setting can facilitate the covering and installation of the second covering part and improve the application range of the test sample.

[0088] In an alternative embodiment, as Figure 6a shown, the measuring device further includes a first adjusting structure arranged along the first direction, configured to drive the first shielding member to move along the first direction;

[0089] The first adjusting structure includes:

[0090] a first groove 131 arranged on the surface of the base 13 along the first direction; and

[0091] A first slide rail (not shown in the figure) that moves in the first direction and cooperates with the first groove;

[0092] Wherein, the first connecting part is located on the first slide rail.

[0093] In this embodiment, the moving principle of the first adjustment structure is the same as that of the aforementioned second adjustment structure. The first direction is the Y direction. A first groove 131 is formed in the base along the Y direction. A first slide rail that cooperates with the first groove 131 is arranged on the first groove 131. The first slide rail and the first groove form a first adjustment structure capable of moving. The first shielding part arranged on the first slide rail can move along the first direction under the drive of the first adjustment part, so that relative movement can occur between the first shielding part and the second shielding part, improving the installation efficiency. Further, when the number of the first shielding parts in this embodiment is two arranged oppositely as shown in Figure 1 the figure, the first adjustment structure drives the first shielding part in this embodiment, so that the distance between the opposite first shielding parts can be changed, thereby adapting to various shapes of samples to be measured and facilitating the installation of the samples to be measured.

[0094] It should be noted that the embodiment of the present invention does not limit the connection manner between the second slide rail and the second shielding part, such as bolts, welding, pin connection, or integrally formed. The design criterion is that the first adjustment structure drives the first shielding part to move along the Y direction, which will not be elaborated here.

[0095] In an alternative embodiment, the test piece is inserted from the outside of the first shielding part 11 and the second shielding part 12 and fits on the surface of the sample to be measured; as Figure 4 shown in the figure, the test piece is an extensometer. The test piece located on the first shielding part 11 is configured to measure the deformation amount of the surface of the sample to be measured covered by the first shielding part 11; the test piece located on the second shielding part 12 is configured to measure the deformation amount of the surface of the sample to be measured covered by the second shielding part 12.

[0096] The extensometer can obtain the minute deformation of the sample to be measured in the test environment. After using the first shielding part 11 and the second shielding part 12 to cover the entire surface of the sample to be measured and fixing the sample to be measured in the formed cavity 114, the extensometer is inserted from the outside of the first shielding part 11 and the second shielding part 12 into the cavity 114, and each extensometer is made to fit each surface of the sample to be measured in the cavity, so as to obtain the deformation amount of each surface of the sample to be measured. In a specific example, the extensometers for measuring the deformation of each surface of the sample to be measured are arranged in pairs, as Figure 1As shown, the extensometer holes provided on the opposite first shielding member 11 and the opposite second shielding member 12 are distributed in the same manner, that is, the extensometers on the same axis on the opposite surfaces form a pair. For example, for a test sample in the shape of a cube or a cuboid, three opposite surfaces correspond to the X, Y, and Z directions, and the extensometers with coincident axes on the three opposite surfaces form a pair. According to the average value of the deformation amounts obtained from the opposite extensometers, the accuracy of the measurement result is further improved.

[0097] Those skilled in the art determine the number of extensometers for measuring the deformation amount of each surface according to actual needs. For example, 2 - 10 pairs of extensometers can be arranged on the opposite surfaces in the X, Y, and Z directions to obtain the deformation amounts of each surface in the three directions. The specific number is not limited in the present invention and will not be elaborated here.

[0098] In an optional embodiment, the measuring device further includes: a support member inserted from the outside of the first shielding member 11 or the second shielding member 12 and abutted against the surface of the test sample.

[0099] Considering that there is a gap between the formed cavity 114 and the test sample, when the test sample is located in the cavity 114, it will move downward under the influence of its own gravity, resulting in errors in the deformation amounts obtained by the test piece. In this embodiment, the test sample is further supported and fixed by the support member, so that the position of the test sample in the cavity 114 is fixed, thereby obtaining more accurate deformation amounts and effectively improving the measurement accuracy.

[0100] In an optional embodiment, the support member can be an adjusting bolt that can be screwed into the cavity 114 to adjust the position of the test sample in the cavity 114. In another optional embodiment, the support member can also be a push rod inserted into the cavity 114 to achieve good fixation of the test sample.

[0101] In an optional embodiment, as Figure 1 shown, the first shielding member 11 and the second shielding member 12 are provided with support member mounting holes 124 for mounting the support member, and test piece mounting holes 123 for mounting the test piece, such as threaded holes, through holes, etc., which can enable the support member and the test piece to enter the cavity 114 from the outside.

[0102] When the elastic modulus measuring device is fixed in the test chamber to measure the elastic modulus of the test sample in this embodiment, the elastic modulus measuring device has fixed the test sample, and in - situ measurement of the test sample can be achieved. By changing the measurement environment in the test chamber, the deformation amounts of the test sample after the test environment is changed at any time can be obtained through the test piece, as Figure 5As shown in the figure, the embodiment of the present invention can also obtain a curve change diagram of the bulk modulus of elasticity of the sample to be measured and the deformation amount under different test environments. Curve 9 represents the bulk modulus of elasticity of the sample to be measured varying with pressure under the fixation of the measurement device in this embodiment. Curve 10 represents the deformation amount of the sample to be measured in the X direction. Curve 11 represents the deformation amount of the sample to be measured in the Y direction. Curve 12 represents the deformation amount of the sample to be measured in the Z direction. The entire measurement process features fast measurement efficiency and high measurement accuracy.

[0103] Now, a specific example is used to illustrate the process of measuring the bulk modulus of elasticity of the sample to be measured using this device:

[0104] S1. Use the first shielding member and the second shielding member to cover the surfaces on different sides of the sample to be measured. The first shielding member and the second shielding member form a cavity for accommodating the sample to be measured.

[0105] In a specific example, the shape of the sample to be measured is a cube, and the measurement device is Figure 1 As shown in the figure, the first shielding member 11 and the second shielding member 12 form a cavity. The second shielding member 12 shields the four inclined surfaces of the sample to be measured, and the first shielding member 11 shields the vertical surfaces of the sample to be measured.

[0106] Furthermore, this step further includes:

[0107] Insert the support member into the cavity through the support member mounting hole 124 outside the first shielding member 11 and the second shielding member 12. Adjust the specific position of the sample to be measured in the cavity through the support member and fix it.

[0108] Insert the test piece into the cavity from the outside of the test piece mounting hole 123 of the first shielding member 11 and the second shielding member 12, and make the test piece fit against the sample to be measured to obtain the deformation amount of each surface of the sample to be measured. In a specific example, the test pieces on the opposite surfaces of the sample to be measured are distributed uniformly, and more accurate deformation amounts of the sample to be measured can be obtained.

[0109] S2. Fix the elastic modulus measurement device accommodating the sample to be measured in the test chamber.

[0110] After installing the bulk modulus of elasticity measurement device and the sample to be measured, fix the bulk modulus of elasticity measurement device in the test chamber. After the bulk modulus of elasticity measurement device is fixed, the sample to be measured inside it is also fixed. And under the support and fixation of the support member, the sample to be measured remains in the original position in the test chamber throughout the entire measurement process, thereby effectively improving the measurement accuracy.

[0111] S3. The test pieces located on the first shielding member and the second shielding member obtain the deformation amount of each surface of the sample to be measured placed in the test environment.

[0112] Since the position of the sample to be measured remains unchanged throughout the measurement process, therefore, by simply changing the test environment in the test chamber, the bulk modulus of elasticity of the sample to be measured under different test environments can be obtained. The entire measurement process is simple to operate and has high measurement efficiency.

[0113] In a specific example, the test chamber can be a high-water-pressure test chamber, and the bulk modulus of elasticity volume parameters of the sample to be measured under different water pressures can be obtained by changing the water pressure in the test chamber. The test chamber can also be a high-air-pressure test chamber, and the bulk modulus of elasticity volume parameters of the sample to be measured under different air pressures can be obtained by changing the pressure inside it.

[0114] Taking the test chamber as a high-water-pressure test chamber as an example, after fixing the bulk modulus of elasticity measuring device in the high-water-pressure test chamber, sealing the high-pressure test chamber and pressurizing it to the target pressure, the change curves of the average deformation measured by the extensometers in three directions with respect to the pressure can be obtained under a section of test pressures from zero to the target pressure.

[0115] S4. Determine the bulk modulus of elasticity of the sample to be measured placed in the test environment according to the deformation amount of each surface.

[0116] Furthermore, according to the deformation amounts obtained from the test piece, the measuring unit calculates the bulk modulus of elasticity of the sample to be measured under a series of pressures from zero to the target pressure, realizing the in-situ measurement of the bulk modulus of elasticity of the sample to be measured.

[0117] In a specific example, the process of obtaining the bulk modulus of elasticity of the sample to be measured from the deformation amount is as follows:

[0118] Obtain the volume change ΔV of the sample to be measured according to the deformation amount of each surface.

[0119] In a specific example, if the sample to be measured is a cube with a side length of 100 mm, then the volume change ΔV is:

[0120] ΔV = V1 - = (100 - X)×(100 - Y)×(100 - Z) - (100×100×100); V1 is the volume of the sample to be measured

[0121] at the target pressure P, V is the initial volume of the sample to be measured, and X, Y, and Z are the average values of the deformation amounts of the sample to be measured in the coordinate system directions.

[0122] Determine the compression ratio K of the solid buoyancy material to be measured according to the volume change ΔV and the initial volume V:

[0123]

[0124] Further obtain the bulk modulus of elasticity E of the sample to be measured according to the compression ratio K and the pressure difference ΔP:

[0125] In another specific example, the bulk modulus of elasticity E can also be directly obtained based on the volume change ΔV, the initial volume V, and the pressure difference ΔP, that is:

[0126]

[0127] wherein, ΔV is the volume change obtained based on the deformation; V is the initial volume of the sample to be measured; K is the compression ratio of the solid material to be measured; ΔP is the pressure difference, that is, the test pressure minus the initial pressure 0.

[0128] During the entire measurement process, the position of the sample to be measured remains unchanged under the fixation of the measurement device, realizing the in-situ measurement of the bulk modulus of elasticity of the sample to be measured. The deformation accuracy of each surface obtained by the test piece during this process is relatively high, effectively improving the accuracy of the bulk modulus of elasticity of the sample to be measured determined according to the deformation, and effectively improving the measurement accuracy. Further, since the measurement device of this embodiment can be fixed in the test chamber, the bulk modulus of elasticity corresponding to the change of the measurement environment in the test chamber as shown can be obtained, thereby improving the measurement efficiency. Figure 5 shown, thereby improving the measurement efficiency.

[0129] Corresponding to the above measurement device, another embodiment of the present invention provides a method for measuring the bulk modulus of elasticity of a sample to be measured by using the above elastic modulus measurement device, as shown in Figure 8 shown, including:

[0130] Cover the surfaces on different sides of the sample to be measured with the first shielding member and the second shielding member, and the first shielding member and the second shielding member form a cavity for accommodating the sample to be measured;

[0131] Fix the elastic modulus measurement device accommodating the sample to be measured in the test chamber;

[0132] The test pieces located on the first shielding member and the second shielding member obtain the deformation of each surface of the sample to be measured placed in the test chamber;

[0133] Determine the bulk modulus of elasticity of the sample to be measured placed in the test environment according to the deformation of each surface. Since the elastic modulus measurement method provided by the embodiment of the present invention corresponds to the elastic modulus measurement devices provided by the above several embodiments, the previous implementation manners are also applicable to the elastic modulus measurement method provided by this embodiment, and will not be described in detail in this embodiment.

[0134] During the process of obtaining the bulk modulus of elasticity of the sample to be measured by using this measurement device, the in-situ measurement of the bulk modulus of elasticity of the sample to be measured is realized. The deformation accuracy of each surface obtained by the test piece during this process is relatively high, effectively improving the accuracy of the bulk modulus of elasticity of the sample to be measured determined according to the deformation, effectively improving the measurement accuracy and the measurement efficiency.

[0135] It should be noted that the order of the steps of the method for manufacturing an organic light-emitting device provided in the embodiments of the present invention can be appropriately adjusted, and the steps can also be increased or decreased accordingly according to the situation. Any person skilled in the art within the technical scope disclosed by the present invention can easily implement the method of changing the degree, and all such methods should be covered within the protection scope of the present invention, so they will not be elaborated herein.

[0136] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, rather than limiting the implementation manners of the present invention. For those of ordinary skill in the art, other different forms of changes or variations can be made based on the above description. It is impossible to enumerate all the implementation manners here. Any obvious changes or variations derived from the technical solutions of the present invention still fall within the protection scope of the present invention.

Claims

1. An elastic modulus measuring device, characterized in that, Comprising: A base; A first shielding member located on the base, wherein the first shielding member includes a first connecting portion located on the base, a first covering portion connected to the first connecting portion, and a second covering portion located at one end of the first covering portion away from the base. The first covering portion covers at least one surface of the sample to be tested, and the second covering portion covers a surface of the sample to be tested different from the surface covered by the first covering portion; A vertically arranged second shielding member located on the base. The first shielding member and the second shielding member cover surfaces on different sides of the sample to be tested and form a cavity for receiving the sample to be tested. Wherein, the second shielding member includes a second connecting portion arranged along a second direction on the base and a vertically arranged third covering portion located on the second connecting portion; A testing member located on the first shielding member and the second shielding member and fitting to the sample to be tested. The testing member is inserted from the outside of the first shielding member and the second shielding member and fits to the surface of the sample to be tested. The testing member is configured to obtain the deformation amount of each surface of the sample to be tested placed in a test environment; and A measuring unit configured to obtain the volume elastic modulus of the sample to be tested based on the deformation amount.

2. The device according to claim 1, characterized in that, The first covering portion and the second covering portion are movably connected.

3. The device according to claim 1 or 2, characterized in that, The second covering portion covers at least two surfaces on different sides of the sample to be tested, and the second covering portions covering each different surface are configured to be movably connected.

4. The device according to claim 3, wherein The measuring device further includes a first adjusting structure arranged along a first direction, configured to drive the first shielding member to move along the first direction; The first adjusting structure includes: A first groove arranged along the first direction on the surface of the base; and A first sliding rail that cooperates with the first groove and moves along the first direction; Wherein, the first connecting portion is located on the first sliding rail.

5. The device according to claim 4, characterized in that The measuring device further includes a second adjusting structure arranged along a second direction, configured to drive the second shielding member to move along the second direction; The second adjusting structure includes: A second groove arranged along the second direction on the surface of the base; and A second sliding rail that cooperates with the second groove and moves along the second direction; Wherein, the second connecting portion is located on the second sliding rail.

6. The device according to claim 1, characterized in that, The testing member is an extensometer.

7. The device according to any one of claims 1 to 6, characterized in that, The measuring device further includes: A support member inserted from the outside of the first shielding member or the second shielding member and abutted against the surface of the sample to be tested.

8. A method for measuring the bulk modulus of a sample to be measured by using the elastic modulus measuring device according to any one of claims 1 to 7, characterized in that, Comprising: Covering surfaces on different sides of the sample to be tested by the first shielding member and the second shielding member, and the first shielding member and the second shielding member form a cavity for receiving the sample to be tested; Fixing the elastic modulus measuring device for receiving the sample to be tested in a test chamber; The testing member located on the first shielding member and the second shielding member obtains the deformation amount of each surface of the sample to be tested placed in the test chamber; Determining the volume elastic modulus of the sample to be tested placed in the test environment according to the deformation amount of each surface.

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