Test jig

Abstract

To provide a test jig that enables precise and stable electrical testing of a device to be tested while suppressing a load applied to electrode tabs of the device to be tested.SOLUTION: A test jig 10 includes: a first structure 20; a second structure 30 that is provided to get close to or be apart from the first structure 20; a lock mechanism 70 that locks the first structure 20 and the second structure 30 so as not to separate from each other in a state where an electrode tab 3 is sandwiched therebetween; and a connection terminal 40 for electrically connecting the electrode tab 3 and a test device 5. The connection terminal 40 includes: an electrode side connection portion 42a that is provided at a position overlapping the electrode tab 3 in the sandwiched state; and a test device side connection portion 42b that is provided so as to be connectable to the test device 5 on the outside of the first structure 20 and the second structure 30 in the sandwiched state.SELECTED DRAWING: Figure 1

Description

Technical Field

[0001] The present invention relates to a test jig used for an electrical test of a device under test provided with an electrode tab.

Background Art

[0002] Conventionally, electrical or electronic devices have been provided in which electrode tabs are formed so as to protrude outward, such as the lithium-ion secondary battery disclosed in Patent Document 1 below. Specifically, there are provided devices such as the pseudo bipolar type laminated battery and the bipolar battery disclosed in FIG. 14 of Patent Document 1.

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0004] When performing a test for characteristic evaluation or the like on a device (hereinafter, also referred to as a "device under test") in which an electrode tab is formed so as to protrude outward as described above, it is necessary to electrically connect a terminal provided in the test apparatus for the test (hereinafter, also referred to as a "test apparatus terminal") and an electrode tab provided in the device under test. In order to ensure the accuracy and stability of a performance evaluation test or the like, it is important to manage the contact pressure between the test apparatus terminal and the electrode tab of the device under test. From this viewpoint, the present inventors considered a method in which holes 104 and 106 are provided in the test apparatus terminal 100 and the electrode tab 102 of the device under test, respectively, as shown in FIG. 5(a), and a bolt 108 is inserted through the holes 104 and 106 and fastened with a nut 110 as shown in FIG. 5(b). In such a configuration, the contact pressure between the test apparatus terminal 100 and the electrode tab 102 can be easily managed based on the fastening torque of the bolt 108 and the nut 110.

[0005] However, when connecting the test device terminal 100 and the electrode tab 102 of the device under test as illustrated in FIG. 5, it is essential to process the electrode tab 102 of the device under test to provide holes 106 for bolt fastening. Further, in devices such as the lithium ion secondary battery disclosed in Patent Document 1 above, the electrode tab is formed of a thin plate. Therefore, in such devices, there is a desire to suppress the load acting on the electrode tab due to the load caused by providing holes for bolt fastening and the movement of the wiring on the test device side where the test device terminal is provided.

[0006] Therefore, an object of the present invention is to provide a test jig that can accurately and stably perform an electrical test on a device under test while suppressing the load acting on the electrode tab of the device under test.

Means for Solving the Problems

[0007] (1) The test jig of the present invention is used to connect a device under test having an electrode tab to a test device for testing, and includes a first component, a second component provided so as to be able to approach and separate from the first component, and a locking mechanism that locks the first component and the second component so that they cannot separate in a clamped state in which the electrode tab is sandwiched between the first component and the second component, and connection terminals for electrically connecting the electrode tab and the test device. The connection terminals have an electrode-side connection portion provided at a position overlapping the electrode tab in the clamped state, and a test device-side connection portion provided so as to be connectable to the test device outside the first component and the second component in the clamped state.

[0008] The test jig of the present invention can stably maintain the state in which the electrode-side connection portion of the connection terminal is overlapped with the electrode tab and electrically connected by locking it with a locking mechanism in a state where the electrode tab is sandwiched between the first component and the second component. Further, in the test jig of the present invention, the test device-side connection portion of the connection terminal is provided so as to be connectable to the test device outside the first component and the second component in the sandwiched state. Therefore, the test jig of the present invention can suppress the application of a load to the electrode tab for connection to the test device. Accordingly, according to the test jig of the present invention, it is possible to accurately and stably perform an electrical test on the test target device while suppressing the load acting on the electrode tab of the test target device.

[0009] (2) It is preferable that the test jig of the present invention is provided such that the test device-side connection portion protrudes in a first direction with respect to the first component and the second component, and the locking mechanism is provided in a second direction orthogonal to the first direction with respect to the first component and the second component.

[0010] By configuring the test jig of the present invention as in (2) above, it is possible to suppress interference between the electrode tab of the test target device connected to the test device-side connection portion and the locking mechanism. Thereby, the test jig of the present invention can more reliably suppress damage to the electrode tab.

[0011] (3) It is preferable that the test jig of the present invention is configured by a ratchet mechanism in which the locking mechanism allows relative movement of the first component and the second component in the direction of sandwiching the electrode tab and restricts movement in the reverse direction.

[0012] By configuring the test jig of the present invention as in (3) above, the connection between the electrode tab of the test target device and the connection terminal can be made more reliable.

[0013] (4) The test jig of the present invention has a lock mechanism including a first lock mechanism component provided on the first component side, a second lock mechanism component provided on the second component side, and a biasing portion. One of the first lock mechanism component and the second lock mechanism component has a serrated portion provided with serrations arranged at a predetermined pitch in the clamping direction of the electrode tab by the first component and the second component. The other of the first lock mechanism component and the second lock mechanism component is an engaging member provided with engaging teeth that engage with the serrated portion. In a state where the engaging teeth are engaged with the serrations, relative movement of the first component and the second component in the direction of clamping the electrode tab is allowed, and movement in the reverse direction is restricted. The biasing portion applies a biasing force to at least one of the first lock mechanism component and the second lock mechanism component in the direction in which the engaging teeth engage with the serrations.

[0014] By configuring the test jig of the present invention as described in (4) above, while engaging the engaging teeth provided on one of the first lock mechanism component and the second lock mechanism component constituting the lock mechanism with the serrations provided on the other, it is possible to suppress the release of the engagement between the serrations and the engaging teeth due to the biasing force of the biasing portion. Therefore, the test jig of the present invention can maintain the connection between the electrode tab and the connection terminal of the test target device sandwiched between the first component and the second component so as not to be unexpectedly released. Thereby, the test jig of the present invention can perform the electrical test related to the test target device more accurately and stably.

[0015] (5) The test jig of the present invention is provided such that the test device side connection portion projects in a first direction with respect to the first component and the second component, and the lock mechanism can be unlocked by relatively moving and separating the serrations and the engaging teeth in a second direction orthogonal to the first direction with respect to the first component and the second component.

[0016] By configuring the test jig of the present invention as described in (5) above, after performing an electrical test on a device under test or the like, the locking mechanism can be unlocked and the electrode tab can be easily removed from between the first and second components.

[0017] (6) It is preferable that the test jig of the present invention has a positioning portion that suppresses relative movement of the first and second components in a direction in which the contact area of the electrode-side connection portion with respect to the electrode tab varies in the clamped state.

[0018] By configuring the test jig of the present invention as described in (6) above, it is possible to suppress fluctuations in the contact area of the electrode-side connection portion with respect to the electrode tab in the clamped state, and to perform electrical tests on the device under test more stably and accurately.

[0019] (7) It is preferable that the test jig of the present invention includes a pressurizing mechanism that applies a pressing force between the first and second components by relatively moving the first and second components in a direction approaching each other.

[0020] By configuring the test jig of the present invention as described in (7) above, by applying a pressing force between the first and second components, it is possible to reliably bring into contact the electrode tab and the electrode-side connection portion arranged so as to overlap between the two. As a result, the test jig of the present invention can perform electrical tests on the device under test more accurately and stably.

Effect of the Invention

[0021] According to the present invention, it is possible to provide a test jig that solves the above-described problems.

Brief Description of the Drawings

[0022]

Figure 1

Figure 2

Figure 3

Figure 4

Figure 5

Embodiments for Carrying Out the Invention

[0023] Hereinafter, a test jig 10 according to an embodiment of the present invention will be described in detail with reference to the drawings. In the following description, first, the configuration of the test jig 10 will be described, and then the operation of the test jig 10 will be described. Note that each figure is schematically represented for easy understanding, and it should be noted that it may be different from the actual shape, size, and arrangement of components. Also, note that hatching may be omitted in the cross-section of each figure. In the following description, in a state where the test target device 1 including the electrode tab 3 is set in the test jig 10 as shown in FIG. 1, the protruding direction of the electrode tab 3 (the left-right direction in FIG. 1) is the first direction, the direction intersecting this (the vertical direction with respect to the paper surface in FIG. 1) is the second direction, and the up-down direction is the third direction.

[0024] ≪Configuration of Test Jig 10≫ As shown in FIG. 1, the test jig 10 is used to connect the test device 1 having the electrode tab 3 to the test apparatus 5 for performing a test. The test jig 10 of the present embodiment is used to electrically connect the electrode tab 3 of the lithium-ion battery, which is the test device 1, to the test apparatus 5, which is an evaluation test apparatus for evaluating battery characteristics. As shown in FIG. 1 and the like, the test jig 10 includes a first component 20, a second component 30, a connection terminal 40, a positioning portion 50 (see FIG. 3), a pressing mechanism 60, and a locking mechanism 70.

[0025] The first component 20 and the second component 30 are for sandwiching and holding the electrode tab 3 of the test device 1. The first component 20 and the second component 30 are provided in pairs. In the illustrated example, the first component 20 is provided above the second component 30 and is capable of approaching and separating from the second component 30. In the present embodiment, the first component 20 is slidably supported by a support 25. Thereby, the first component 20 is slidable in a direction of approaching and separating from the second component 30 while maintaining a posture facing the second component 30.

[0026] The first component 20 and the second component 30 are each formed in a block shape. The first component 20 has a first opposing surface 22 facing the second component 30. Further, the second component 30 has a second opposing surface 32 facing the first component 20. As shown in FIG. 2 and the like, the first component 20 and the second component 30 are capable of sandwiching the electrode tab 3 of the test device 1 between the first opposing surface 22 and the second opposing surface 32.

[0027] As shown in FIG. 2 and the like, the first component 20 has a first terminal installation portion 24 on the first opposing surface 22. Similarly, the second component 30 has a second terminal installation portion 34 on the second opposing surface 32. The first opposing surface 22 and the second opposing surface 32 are portions where connection terminals 40 (first connection terminal 42, second connection terminal 44), which will be described in detail later, are installed. The first terminal installation portion 24 and the second terminal installation portion 34 are in a corresponding (opposing) positional relationship. Therefore, in a state where the first component 20 and the second component 30 are brought close to each other until the first opposing surface 22 and the second opposing surface 32 are in surface contact, the first connection terminal 42 and the second connection terminal 44 provided on the first terminal installation portion 24 and the second terminal installation portion 34 can be brought into contact and electrically connected.

[0028] The connection terminal 40 is a terminal for electrically connecting the electrode tab 3 and the test device 5. The connection terminal 40 is composed of a metal plate having conductivity such as a copper plate. The connection terminal 40 can be configured as a single member, but in this embodiment, it is provided with a first connection terminal 42 and a second connection terminal 44. As shown in FIG. 2 and FIG. 3, the first connection terminal 42 is provided on the first terminal installation portion 24 of the first component 20. Similarly, the second connection terminal 44 is provided on the second terminal installation portion 34 of the second component 30.

[0029] One of the first connection terminal 42 and the second connection terminal 44 that form the connection terminal 40 (the first connection terminal 42 in this embodiment) is provided with an electrode-side connection portion 42a and a test device-side connection portion 42b. The other connection terminal 40 (the second connection terminal 44 in this embodiment) is provided with an electrode-side connection portion 44a.

[0030] The electrode-side connection portions 42a, 44a are connection portions provided at positions overlapping the electrode tab 3 in a state where the electrode tab 3 is sandwiched between the first component 20 and the second component 30. The electrode-side connection portions 42a, 44a are preferably formed to have a shape and surface state that enables efficient contact with the electrode tab 3. In this embodiment, the electrode-side connection portions 42a, 44a are each in the form of a flat plate with a smooth surface.

[0031] The test device side connection part 42b is a connection part provided so as to be connectable to the test device 5 outside the first component 20 and the second component 30 in the clamped state. The test device side connection part 42b is formed so as to protrude outward from the first component 20 and the second component 30. The test device side connection part 42b is provided so as to protrude in the first direction (the front direction in the example shown in FIG. 2) with respect to the first component 20 and the second component 30. A hole 42c for connecting a cable (not shown) that connects the test device 5 and the test jig 10 is provided in the test device side connection part 42b. Therefore, by inserting a bolt through the hole 42c and the hole provided in the terminal provided at the end of the cable and fixing it with a nut, the cable for connection to the test device 5 can be connected to the test device side connection part 42b.

[0032] As shown in FIG. 3, the first component 20 and the second component 30 are provided with a positioning part 50 for positioning the connection terminal 40 with respect to the electrode tab 3 in the clamped state. The positioning part 50 can have an appropriate configuration as long as it can position the connection terminal 40 with respect to the electrode tab 3. In the present embodiment, the first component 20 and the second component 30 are each provided with a first positioning part 52 and a second positioning part 54. Further, the first positioning part 52 and the second positioning part 54 are constituted by a convex part and a concave part so as to fit together. In the present embodiment, the first positioning part 52 is constituted by a convex part formed so as to protrude from the first opposing surface 22 to the second opposing surface 32. The second positioning part 54 is constituted by a concave part formed as a groove in the second opposing surface 32.

[0033] The first positioning portion 52 is provided at a position adjacent to the first connection terminal 42 on the first opposing surface 22 of the first component 20 described above. More specifically, in the present embodiment, the first positioning portion 52 is provided at positions adjacent to one side and the other side in the second direction (a direction intersecting the first direction) with respect to the first connection terminal 42. In other words, the first positioning portion 52 is provided so as to sandwich the first connection terminal 42 in the second direction. Further, the convex portion forming the first positioning portion 52 is provided so as to extend in the first direction along the first connection terminal 42.

[0034] Similarly, the second positioning portion 54 is provided at a position adjacent to the second connection terminal 44 on the second opposing surface 32 of the second component 30 described above. Also, the second positioning portion 54 is provided at positions adjacent to one side and the other side in the second direction with respect to the second connection terminal 44. In other words, the second positioning portion 54 is provided so as to sandwich the second connection terminal 44 in the second direction. Further, the concave portion forming the second positioning portion 54 is provided so as to extend in the first direction along the second connection terminal 44.

[0035] As described above, the first positioning portion 52 and the second positioning portion 54 are provided at positions corresponding (opposing) to each other on the first opposing surface 22 and the second opposing surface 32. Therefore, with the electrode tab 3 disposed at the positions where the first connection terminal 42 and the second connection terminal 44 are provided, the first component 20 and the second component 30 are brought close to each other. When the electrode tab 3 is sandwiched between the two, the first component 20 and the second component 30 overlap in a positioned state, and the electrode tab 3 is positioned and arranged between the pair of convex portions forming the first positioning portion 52 and the pair of concave portions forming the second positioning portion 54. Further, when the first component 20 and the second component 30 are positioned by the first positioning portion 52 and the second positioning portion 54 and the electrode tab 3 is sandwiched, even if an external force acts on the electrode tab 3 and the electrode tab 3 moves in the first direction, the electrode tab 3 cannot move in the second direction. Therefore, when the electrode tab 3 is positioned between the first component 20 and the second component 30 by the positioning portion 50 (the first positioning portion 52, the second positioning portion 54), it is possible to suppress fluctuations in the contact area between the electrode tab 3 and the connection terminal 40 in the state where the electrode tab 3 is clamped. Further, by providing the positioning portion 50 so as to form a pair with the connection terminal 40 interposed therebetween, compared with the case where the positioning portion 50 is provided only on one side with respect to the connection terminal 40, when the positioning portion 50 is fitted, the electrode tab 3 and the connection terminal 40 can be fixed in a state where the pressure applied by the pressing mechanism 60 is uniform.

[0036] In the state where the above-described first component 20 and second component 30 are relatively moved in the direction of approaching each other by the support 25, a pressing force can be applied between the two by the pressing mechanism 60. The pressing mechanism 60 can be, for example, a pressing mechanism utilizing a mechanical lever action or a pressing mechanism using an electric motor, etc., but in this embodiment, one using a hydraulic press is adopted.

[0037] The hydraulic press forming the pressing mechanism 60 can be configured to include, for example, a hydraulic cylinder and a piston. As shown in the example of FIG. 1, it can sandwich the first component 20 and the second component 30, and a pressing force can be applied between them along with the operation of the lever 62. By applying such a pressing force, the electrode tab 3 can be firmly sandwiched between the first connection terminal 42 provided on the first component 20 and the second connection terminal 44 provided on the second component 30, ensuring sufficient contact pressure and contact area. Also, when providing the pressing mechanism 60, as shown in FIG. 1, it is advisable to provide a pressure sensor 64 or the like so that the pressing force generated between the first component 20 and the second component 30 can be grasped.

[0038] In addition, the test jig 10 includes a locking mechanism 70 in addition to the above-described configuration. The locking mechanism 70 can be installed at an appropriate location in the test jig 10. From the viewpoints of operability and suppression of interference with other members, it is preferably provided in the second direction orthogonal to the first direction, which is the protruding direction of the test device side connection portion 42b of the connection terminal 40, in the first component 20 and the second component 30 as in the present embodiment.

[0039] As shown in FIG. 4 and the like, the locking mechanism 70 is a mechanism for locking the first component 20 and the second component 30 so that they cannot be separated from each other in the clamped state where the electrode tab 3 is sandwiched between the first component 20 and the second component 30. The locking mechanism 70 can be an appropriate one as long as it can exhibit such a function. In the present embodiment, it is provided with a ratchet mechanism 72.

[0040] The ratchet mechanism 72 is provided to allow relative movement of the first component 20 and the second component 30 in the direction of clamping the electrode tab 3 and to restrict movement in the reverse direction. The ratchet mechanism 72 includes a first locking mechanism component 74, a second locking mechanism component 76, and a biasing portion 78.

[0041] As shown in FIG. 2 and the like, the first lock mechanism component 74 is provided on the side of the first component 20. The first lock mechanism component 74 is an elongated member provided so as to extend in the third direction (the vertical direction in the illustrated example) from the first component 20 toward the second component 30. The first lock mechanism component 74 is fixed so as not to move relative to the first component 20. That is, the first lock mechanism component 74 is configured to move integrally with the first component 20 in the third direction. The first lock mechanism component 74 has an engaging member 74a having a plurality of engaging teeth 74b in its longitudinal direction. The engaging member 74a is provided with the engaging teeth 74b so as to be arranged at a predetermined pitch in the clamping direction (the third direction) of the electrode tab 3.

[0042] The second lock mechanism component 76 is provided on the side of the second component 30. The second lock mechanism component 76 is an elongated member provided so as to extend in the third direction (the vertical direction) from the second component 30 toward the first component 20. The second lock mechanism component 76 is fixed so as not to move relative to the second component 30. That is, the second lock mechanism component 76 moves integrally with the second component 30 in the third direction. The second lock mechanism component 76 has a serrated portion 76a having serrations 76b that engage with the engaging member 74a of the first lock mechanism component 74. The serrated portion 76a may be provided with one or a plurality of serrations 76b. In the present embodiment, the serrated portion 76a is provided with a plurality of serrations 76b in a serrated shape so as to be arranged at a predetermined pitch in the clamping direction (the third direction) of the electrode tab 3, similar to the engaging member 74a.

[0043] As shown in FIG. 1, FIG. 4, etc., the first lock mechanism component 74 and the second lock mechanism component 76 are arranged such that the meshing teeth 74b of the meshing member 74a and the saw teeth 76b of the saw-tooth-shaped part 76a mesh with each other. In the present embodiment, the second lock mechanism component 76 is attached to the side surface of the second body 30 in the second direction such that the saw teeth 76b protrude in the first direction. Further, the first lock mechanism component 74 is provided on the side surface of the first body 20 in the second direction such that the meshing teeth 74b protrude in the first direction and face the saw teeth 76b. Also, the first lock mechanism component 74 and the second lock mechanism component 76 are formed in a shape that allows relative movement of the meshing teeth 74b and the saw teeth 76b in the direction in which the first body 20 and the second body 30 approach each other, and restricts movement in the reverse direction.

[0044] The biasing part 78 applies a biasing force to at least one of the first lock mechanism component 74 and the second lock mechanism component 76 in the direction in which the meshing teeth 74b provided on the first lock mechanism component 74 and the saw teeth 76b provided on the second lock mechanism component 76 mesh with each other. In the present embodiment, the biasing part 78 is provided so as to apply a biasing force in the direction of approaching the second lock mechanism component 76 with respect to the first lock mechanism component 74 at the location where the meshing teeth 74b and the saw teeth 76b mesh.

[0045] In addition to the above-described configuration, the test jig 10 has an arrangement part 12 for arranging the test target device 1 to be tested. Specifically, the arrangement part 12 arranges a battery cell which is a part of the test target device 1. The arrangement part 12 is provided at a position adjacent to the above-described first body 20 and second body 30. In the present embodiment, the arrangement part 12 is provided at a position adjacent to the first body 20 and the second body 30 in the first direction, and at a part on the side opposite to the protruding direction of the test device side connection part 42b of the connection terminal 40. By arranging the test target device 1 on the arrangement part 12, the test jig 10 can be arranged on the electrode side connection part 44a provided on the second body 30 without bending the electrode tab 3 or the like.

[0046] ≪Operation of the test jig 10≫ Subsequently, the operation of the above-described test jig 10 will be described. When connecting the device under test 1 to the test apparatus 5 using the test jig 10 for testing, first, as shown in FIG. 2, with the first structure 20 separated upward from the second structure 30, the device under test 1 is placed on the placement portion 12. When the device under test 1 (battery cell) is placed on the placement portion 12, the electrode tab 3 is placed on the electrode-side connection portion 44a provided on the second structure 30. In this state, the first structure 20 is brought closer to the second structure 30 along the support 25, and a pressing force is applied between the first structure 20 and the second structure 30 by the pressing mechanism 60. As a result, the electrode tab 3 is sandwiched between the first connection terminal 42 provided on the first opposing surface 22 of the first structure 20 and the second connection terminal 44 provided on the second opposing surface 32 of the second structure 30. Further, by operating the pressing mechanism 60, the first structure 20 is pressed against the second structure 30 so that a predetermined pressing force acts on the electrode tab 3. As a result, the electrode tab 3 is brought into contact with the first connection terminal 42 and the second connection terminal 44 with a predetermined contact pressure. Further, when the first structure 20 and the second structure 30 are brought close to each other in this way, a plurality of meshing teeth 74b of the first locking mechanism component 74 forming the locking mechanism 70 mesh with a plurality of saw teeth 76b of the second locking mechanism component 76. As a result, the first structure 20 and the second structure 30 are locked.

[0047] Separate from sandwiching the electrode tab 3 between the first connection terminal 42 and the second connection terminal 44 as described above, the test apparatus 5 is electrically connected to the test apparatus side connection portion 42b of the first connection terminal 42 via a cable or the like. As a result, the electrode tab 3 of the device under test 1 is electrically connected to the test apparatus 5 via the connection terminals 40 (first connection terminal 42, second connection terminal 44) and the cable or the like connected thereto. When such a state is achieved, a test such as a charge / discharge test is performed by the test apparatus 5.

[0048] After the test of the device under test 1 by the test apparatus 5 is completed, the pressurization by the pressurizing mechanism 60 is released, and the locking of the first component 20 and the second component 30 by the locking mechanism 70 is released. In the present embodiment, while releasing the biasing force that has been acting on the first locking mechanism component 74 and the second locking mechanism component 76 by the biasing portion 78 provided in the locking mechanism 70, the first locking mechanism component 74 is separated from the second locking mechanism component 76, whereby the locking by the locking mechanism 70 can be released. After releasing the locking mechanism 70, by separating the first component 20 from the second component 30, the clamping force acting on the electrode tab 3 is released, and the device under test 1 can be removed from the test jig 10.

[0049] <<Function and Effect>> The test jig 10 according to the above-described embodiment has a characteristic configuration as shown in the following (a) to (g), and thereby the effects peculiar to the present invention can be obtained.

[0050] (a) The test jig 10 described above is used for connecting a device under test 1 provided with an electrode tab 3 to a test apparatus 5 for testing, and includes a first component 20, a second component 30 provided so as to be able to approach and separate from the first component 20, and a locking mechanism 70 that locks the first component 20 and the second component 30 so as not to separate in a clamped state where the electrode tab 3 is sandwiched between the first component 20 and the second component 30, and a connection terminal 40 for electrically connecting the electrode tab 3 and the test apparatus 5. The connection terminal 40 has an electrode-side connection portion 42a provided at a position overlapping the electrode tab 3 in the clamped state, and a test-apparatus-side connection portion 42b provided so as to be connectable to the test apparatus 5 outside the first component 20 and the second component 30 in the clamped state.

[0051] The above-described test jig 10 can stably maintain the state in which the electrode-side connection portion 42a of the connection terminal 40 is overlapped and electrically connected to the electrode tab 3 by being locked by the locking mechanism 70 in a state where the electrode tab 3 is sandwiched between the first component 20 and the second component 30. Further, in the above-described test jig 10, the test device-side connection portion 42b of the connection terminal 40 is provided so as to be connectable to the test device 5 outside the first component 20 and the second component 30 in the sandwiched state. Therefore, the above-described test jig 10 can suppress the application of a load to the electrode tab 3 for connection to the test device 5. Accordingly, according to the above-described test jig 10, it is possible to accurately and stably perform an electrical test related to the test target device 1 while suppressing the load acting on the electrode tab 3 of the test target device 1.

[0052] (b) In the above-described test jig 10, the test device-side connection portion 42b is provided so as to protrude in a first direction with respect to the first component 20 and the second component 30, and the locking mechanism 70 is provided in a second direction orthogonal to the first direction with respect to the first component 20 and the second component 30.

[0053] By configuring the above-described test jig 10 as in (b) above, it is possible to suppress interference between the electrode tab 3 of the test target device 1 connected to the test device-side connection portion 42b and the locking mechanism 70. Thereby, the above-described test jig 10 can more reliably suppress damage to the electrode tab 3.

[0054] (c) In the above-described test jig 10, the locking mechanism 70 is configured by a ratchet mechanism 72 that allows relative movement of the first component 20 and the second component 30 in the direction of sandwiching the electrode tab 3 and restricts movement in the reverse direction.

[0055] By configuring the above-described test jig 10 as in (c) above, the connection between the electrode tab 3 of the test target device 1 and the connection terminal 40 can be made more reliable.

[0056] (d) The above-described test jig 10 has a lock mechanism 70 including a first lock mechanism component 74 provided on the first component 20 side, a second lock mechanism component 76 provided on the second component 30 side, and a biasing portion 78. One of the first lock mechanism component 74 and the second lock mechanism component 76 has a serrated portion 76a having serrations 76b arranged at a predetermined pitch in the clamping direction of the electrode tab 3 by the first component 20 and the second component 30. The other of the first lock mechanism component 74 and the second lock mechanism component 76 is an engaging member 74a having engaging teeth 74b that engage with the serrated portion 76a. In a state where the engaging teeth 74b are engaged with the serrations 76b, relative movement of the first component 20 and the second component 30 in the direction of clamping the electrode tab 3 is allowed, and movement in the reverse direction is restricted. The biasing portion 78 applies a biasing force to at least one of the first lock mechanism component 74 and the second lock mechanism component 76 in the direction in which the engaging teeth 74b engage with the serrations 76b.

[0057] By configuring the above-described test jig 10 as in the above (d), it is possible to suppress the release of the engagement between the serrations 76b provided on one of the first lock mechanism component 74 and the second lock mechanism component 76 constituting the lock mechanism 70 and the engaging teeth 74b provided on the other by the biasing force of the biasing portion 78 while engaging the engaging teeth 74b with the serrations 76b. Therefore, the above-described test jig 10 can maintain the connection between the electrode tab 3 of the test target device 1 sandwiched between the first component 20 and the second component 30 and the connection terminal 40 so as not to be unexpectedly released. As a result, the above-described test jig 10 can perform the electrical test related to the test target device 1 more accurately and stably.

[0058] (e) The above-described test jig 10 is provided such that the test device side connection portion 42b protrudes in the first direction with respect to the first component 20 and the second component 30, and the lock mechanism 70 can be unlocked by relatively moving and separating the serrations 76b and the engaging teeth 74b in a second direction orthogonal to the first direction with respect to the first component 20 and the second component 30.

[0059] By configuring the above-described test jig 10 as described in (e) above, after performing an electrical test on the device under test 1, etc., the lock mechanism 70 can be unlocked and the electrode tab 3 can be easily removed from between the first component 20 and the second component 30.

[0060] (f) The above-described test jig 10 has a positioning portion 50 that suppresses relative movement of the first component 20 and the second component 30 in a direction in which the contact area of the electrode-side connection portion 42a with respect to the electrode tab 3 varies in the clamped state.

[0061] By configuring the above-described test jig 10 as described in (f) above, the variation in the contact area of the electrode-side connection portion 42a with respect to the electrode tab 3 in the clamped state is suppressed, and the electrical test on the device under test 1 can be performed more stably and accurately.

[0062] (g) The above-described test jig 10 is provided with a pressing mechanism 60 that applies a pressing force between the first component 20 and the second component 30 by relatively moving the first component 20 and the second component 30 in the approaching direction.

[0063] By configuring the above-described test jig 10 as described in (g) above, by applying a pressing force between the first component 20 and the second component 30, the electrode tab 3 and the electrode-side connection portion 42a arranged to overlap between the two can be surely brought into contact. As a result, the above-described test jig 10 can perform the electrical test on the device under test 1 more accurately and stably.

[0064] <<Modification Example>> The above-described test jig 10 merely shows one embodiment of the present invention, and modifications, omissions, additions, etc. can be appropriately made without departing from the spirit of the present invention. Specifically, as described in (b) above, the test jig 10 is provided with the test apparatus side connection portion 42b protruding in the first direction and the locking mechanism 70 provided in the second direction. However, the present invention is not limited to this, and it is also possible to provide both in the same direction.

[0065] In addition, as described in (c) above, the test jig 10 has been exemplified as having the locking mechanism 70 constituted by the ratchet mechanism 72. However, the present invention is not limited to this, and for example, the first component 20 and the second component 30 can be fixed by bolts, nuts, etc. to lock both of them.

[0066] As described in (d) above, the test jig 10 has been exemplified as having a locking mechanism 70 that locks by engaging the meshing teeth 74b and the saw teeth 76b while applying the biasing force by the biasing portion 78. However, the present invention is not limited to this. The test jig 10 may be configured without the biasing portion 78 for the locking mechanism 70.

[0067] As described in (e) above, the test jig 10 has been shown as an example in which the locking mechanism 70 can be unlocked by relatively moving and separating the saw teeth 76b and the meshing teeth 74b in the second direction. However, the present invention is not limited to this. For example, the test jig 10 can also be configured to be unlocked by relatively moving the saw teeth 76b and the meshing teeth 74b in the first direction, similar to the test apparatus side connection portion 42b.

[0068] The above-described test jig 10 is provided with the positioning portion 50 as described in (f) above, and an example is shown in which the relative movement of the first component 20 and the second component 30 in the direction in which the contact area of the electrode-side connection portion 42a with respect to the electrode tab 3 varies in the clamped state is suppressed. However, the present invention is not limited to this. The test jig 10 may be configured not to include the positioning portion 50, or may be provided with a positioning portion 50 having a form different from that described above.

[0069] The above-described test jig 10 is provided with the pressing mechanism 60 as described in (g) above, and an example is shown in which a pressing force can be applied between the first component 20 and the second component 30. However, the present invention is not limited to this. The test jig 10 may be configured not to include the pressing mechanism 60, or may be configured to apply a pressing force between the first component 20 and the second component 30 in a form different from that described above instead of or in addition to the pressing mechanism 60.

[0070] The present invention of the application is not limited to the configurations described in the above-described embodiments and the like, and design changes and the like can be appropriately made without departing from the scope of the technical idea of the present invention of the application. The constituent elements of the above-described embodiments and modification examples may be arbitrarily selected and combined. Also, any constituent element of each of the above-described embodiments and modification examples may be arbitrarily combined with any constituent element described in the means for solving the problems, the form for implementing the invention, etc., or any constituent element described in the means for solving the problems, the form for implementing the invention, etc., or a constituent element embodying any constituent element described in the means for solving the problems, the form for implementing the invention, etc. The applicant has the intention to obtain rights in the present application or a divisional application, a change application, etc. based on the present application.

Industrial Applicability

[0071] The present invention can be suitably used in general for test jigs used in electrical tests related to test target devices provided with electrode tabs.

Explanation of Reference Numerals

[0072] 1: Test target device 3: Electrode tab 5: Test device 10: Test jig 20: First component 30: Second component 40: Connection terminal 42a: Electrode-side connection part 42b: Test device-side connection part 44a: Electrode-side connection part 50: Positioning part 60: Pressing mechanism 70: Locking mechanism 72: Ratchet mechanism 74: First locking mechanism component 74a: Engaging member 74b: Engaging teeth 76: Second locking mechanism component 76a: Serrated part 76b: Saw teeth 78: Biasing part

Claims

1. A test jig used to connect a device under test having an electrode tab to a test apparatus for testing, comprising: a first component; a second component provided so as to be able to approach and separate from the first component; a locking mechanism that locks the first component and the second component so that they cannot separate in a clamped state in which the electrode tab is sandwiched between the first component and the second component; connection terminals for electrically connecting the electrode tab and the test apparatus; and having wherein the connection terminals include an electrode-side connection portion provided at a position overlapping the electrode tab in the clamped state; and a test-apparatus-side connection portion provided so as to be connectable to the test apparatus outside the first component and the second component in the clamped state. A test jig characterized by the above.

2. The test-apparatus-side connection portion is provided so as to protrude in a first direction with respect to the first component and the second component, and the locking mechanism is provided in a second direction orthogonal to the first direction with respect to the first component and the second component. The test jig according to claim 1, characterized by the above.

3. The locking mechanism includes a first locking-mechanism component provided on the first-component side; a second locking-mechanism component provided on the second-component side; and a biasing portion; and having wherein one of the first locking-mechanism component and the second locking-mechanism component has a serrated portion provided with serrations arranged at a predetermined pitch in the clamping direction of the electrode tab by the first component and the second component; the other of the first locking-mechanism component and the second locking-mechanism component is an engaging member provided with engaging teeth that engage with the serrated portion; in a state where the engaging teeth are engaged with the serrations, relative movement of the first component and the second component in the direction of clamping the electrode tab is allowed, and movement in the reverse direction is restricted; and the biasing portion applies a biasing force to at least one of the first locking-mechanism component and the second locking-mechanism component in a direction in which the engaging teeth engage with the serrations. The test jig according to claim 1 or 2, characterized by the above.

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