Electronic component test device

Abstract

To provide an electronic component test device.SOLUTION: An electronic component test device includes a main body 3, a mounting table, a test unit 8, and a control unit 9, the main body 3 having a work board with the mounting table installed thereon, the mounting table having a test plate 5 detachably mounted and rotatable, a feeding unit 7 provided at a peripheral edge of the mounting table, the test unit 8 installed on the work board, the control unit 9 controlling the test unit 8 or the feeding unit 7, the main body 3 having a detection device 6 capable of detecting presence of the test plate 5 on the mounting table, and the control unit 9 controlling operation of the test unit 8 or the feeding unit 7 on the basis of a detection result of the detection device 6.SELECTED DRAWING: Figure 3

Description

[Technical Field]

[0001] The present invention relates to a test apparatus, and more particularly to an electronic component test apparatus for testing electronic components. [Background technology]

[0002] Generally, after manufacturing of electronic components is completed, the physical characteristics of the components must be confirmed by electrical characteristic tests. For example, the electronic device testing device disclosed in Patent Document 1 includes a device main body, a loading plate attached to the device main body, a test plate mounted on the loading plate and driven to rotate by the device main body, and test units mounted on the device main body and positioned on opposite sides of the loading plate and the test plate. The test plate has a plurality of storage tanks formed therein for storing electronic devices waiting to be tested.

[0003] The test unit includes a lower terminal box installed below the loading board and an upper terminal box located above the test plate.

[0004] The plurality of lower terminals of the lower terminal box can be brought into contact with the downward electrodes of the electronic component to electrically connect thereto, and the upper terminal box can be driven to move downward toward the test plate, and the plurality of upper terminals of the upper terminal box can be brought into contact with the upward electrodes of the electronic component to electrically connect thereto, thereby performing an electrical characteristic test of the electronic component.

[0005] Before conducting an electrical characteristic test using such an electronic device test device, it is necessary to calibrate the downward movement distance of the upper terminal box.

[0006] The calibration method involves moving the upper terminal box downward from a reference position when the test board is not installed, and when the upper terminal comes into contact with the lower terminal so as to be electrically connected, stopping the downward movement of the upper terminal box to obtain the distance between the reference position and the lower terminal.

[0007] The downward movement of the upper terminal box continues until the upper terminals come into contact with the lower terminals and are electrically connected.

[0008] Thereafter, when testing the electrical characteristics of the electronic component, the distance the upper terminal box moves downward can be precisely controlled by adjusting the height of the electronic component. [Prior art documents] [Patent documents]

[0009] [Patent Document 1] Taiwan Patent No. I821945 Summary of the Invention [Problem to be solved by the invention]

[0010] However, during the calibration and electrical characteristic testing process, the test plate is repeatedly installed and removed, and calibration may be performed with the test plate installed. In this case, the test plate separates the upper terminal from the lower terminal, preventing the upper terminal from electrically connecting to the lower terminal. Instead, the test plate is pressed down by the continuous downward movement of the upper terminal box, resulting in damage to the test plate, the upper terminal, and other components. In view of the above, it is an object of the present invention to provide an electronic component testing apparatus that can alleviate at least one of the drawbacks of the prior art. [Means for solving the problem]

[0011] The present invention is provided with an apparatus main body, a loading board, a test unit, and a control unit, The device body is provided with a work table, The loading plate is installed on the work table, A test plate that can be driven and rotated is removably installed on the loading plate, and a feeding unit is installed on the periphery of the loading plate; the test unit is installed on the workbench, The control unit can control the test unit or the input unit; The electronic component testing device is characterized in that the device main body is provided with an inspection device that can detect the presence of the test plate on the loading table, and the control unit can control the operation of the test unit or the operation of the feed unit based on the inspection result of the inspection device. [Effects of the Invention]

[0012] The electronic component testing apparatus of the present invention can use a detection device to detect whether a test board is placed on the loading table, and the control unit determines how to control the operation of the test unit or the operation of the feed unit based on the detection result of the detection device, thereby preventing the control unit from causing the test unit or the feed unit to perform undesired operations. [Brief explanation of the drawings]

[0013] [Figure 1] 1 is a perspective view showing the structure of an embodiment of an electronic device testing device of the present invention; [Figure 2] FIG. 2 is a perspective view showing the structure of the embodiment, omitting the feeding unit and multiple test units. [Figure 3] FIG. 2 is a block diagram showing the functional structure of the embodiment. [Figure 4] FIG. 2 is an exploded perspective view showing a loading board and a test plate of the embodiment. [Figure 5] 10 is a partial cross-sectional view showing that the upper terminal set moves downward to electrically connect with the lower terminal set when the test unit of the above embodiment performs a calibration function; FIG. [Figure 6] 10 is a partial cross-sectional view showing that when the test unit of the above embodiment performs a test function, the upper terminal set moves downward to contact and electrically connect with the electronic components on the test board. FIG. [Figure 7]FIG. 10 is a partial cross-sectional view showing that when the test unit of the above embodiment performs a calibration function, the upper terminal set is adjusted and moved downward by one calibration distance and recorded. [Figure 8] FIG. 10 is a partial cross-sectional view showing that the test unit of the above embodiment controls the upper terminal set to move downward by one movement distance when performing a test function. DETAILED DESCRIPTION OF THE INVENTION

[0014] In order to more clearly describe the objectives, technical means, and advantages of the embodiments of the present invention, the following will clearly describe the technical means in the embodiments of the present invention in combination with the accompanying drawings of the embodiments of the present invention. It should be apparent that the described embodiments are only some embodiments of the present invention, and not all embodiments. Generally, the components of the embodiments of the present invention depicted and shown in the accompanying drawings can be arranged and designed in various different configurations. Therefore, the detailed description of the embodiments of the present invention provided below in the accompanying drawings does not constitute any limitation on the protection scope of the present invention, but merely represents selected embodiments of the present invention.

[0015] Before describing the present invention in more detail, it should be noted that, where considered appropriate, reference numerals or terminal portions of reference numerals have been repeated among the figures to indicate corresponding or analogous elements, which may optionally have similar characteristics.

[0016] In describing the present invention, terms indicating orientations or positional relationships such as "upper," "lower," "inner," "outer," "left," "right," "front," and "rear" are used based on the orientations and positional relationships shown in the drawings or the orientations and positional relationships customarily assumed when using the product of the present invention, for the purpose of easier and clearer explanation, and are not intended to teach or suggest that the corresponding apparatus or device has a specific orientation, structure, operation, etc. in a specific orientation, and are not intended to be a limitation on the present invention.

[0017] Also, in describing the present invention, terms such as "first", "second", etc. are used for distinction purposes only and do not teach or imply relative importance.

[0018] The present invention will be described in detail below. 1 to 3, one embodiment of an electronic device test apparatus 200 of the present invention is for conducting electrical characteristic tests on a plurality of electronic components 100 (shown in FIG. 6), which may include, but are not limited to, capacitors, inductors, etc. Each electronic component 100 has a first electrode 101 and a second electrode 102 at both ends, as shown in FIG.

[0019] The electronic component testing device 200 includes a main body 3, a loading board 4 installed on the main body 3, a test plate 5, an inspection device 6, an input unit 7, a plurality of test units 8, and a control unit 9 connected to the inspection device 6, the input unit 7, and each test unit 8 so as to transmit signals.

[0020] As shown in Figures 2 and 4, the device body 3 has a work table 30 that is installed obliquely facing upward, and the work table 30 has a recess 301 formed therein for fitting the inspection device 6.

[0021] As shown in Fig. 4, the loading plate 4 is installed on the work table 30 and has a plurality of fan-shaped blocks 41 of different sizes that can be independently and detachably combined with each other in a ring shape to form the loading plate 4. As shown in Fig. 4, the plurality of fan-shaped blocks 41 together define a perforated area 40 inside which the work table 30 can be exposed. A recessed groove 301 is located in the perforated area 40.

[0022] As shown in Figure 4, the test plate 5 is formed in the shape of a circular sheet, and is connected to a rotation drive mechanism 31 installed in the device main body 3. It is removably installed coaxially above the loading plate 4 so as to cover the watermark area 40, and can be driven by the rotation drive mechanism 31 to rotate relative to the loading plate 4.

[0023] The test plate 5 has a plurality of storage tanks 50 formed therein, which penetrate vertically through the test plate 5, and the storage tanks 50 are arranged in a plurality of rings with gaps between them in the radial direction, as shown in FIG. 4.

[0024] As shown in FIG. 8, each storage tank 50 can accommodate one electronic component 100, and each electronic component 100 is accommodated in each storage tank 50 with its first electrode 101 facing downward and its second electrode 102 facing upward.

[0025] As shown in Figures 3 and 4, the detection device 6 is fitted into the recess 301 and positioned within the openwork area 40, and is positioned below the test plate 5 when the test plate 5 is placed on the loading table 4, and is positioned in the area from the inner ring side of the storage tank 50 for the test plate 5 to the rotation center of the test plate 5, so as to detect the presence of the test plate 5.

[0026] The inspection device 6 has a light-emitting unit 61 that is provided on the inspection device 6 and can emit light to the bottom surface of the test plate 5, and a light-receiving unit 62 that is provided on the inspection device 6 and can receive light reflected from the bottom surface of the test plate 5. When the light-receiving unit 62 receives the reflected light, an inspection signal is generated.

[0027] 1, the feeding unit 7 is installed on the periphery of the loading plate 4. The feeding unit 7 can be controlled and driven by the control unit 9 to feed the electronic components 100 to be accommodated into the accommodation tanks 50 of the test plate 5 one by one.

[0028] The method by which the feeding unit 7 feeds the electronic components 100 into the receiving chamber 50 of the test plate 5 is a known technique and there are various methods, so a detailed description thereof will be omitted.

[0029] 1, 5, and 6, the test units 8 are installed on the work table 30 so as to be arranged along the periphery of the test plate 5, and can be controlled by the control unit 9 to perform electrical characteristic tests on the electronic components 100 placed in the containers 50 of the test plate 5. The following description assumes that the test plate 5 is placed on the loading table 4 unless otherwise specified.

[0030] Each test unit 8 is installed on the work table 30 and includes a lower terminal set 81 fitted into the loading board 4 so as to be exposed from the upper surface of the loading board 4, an adjustment and movement unit 82 installed on the work table 30, and an upper terminal set 83 installed on the adjustment and movement unit 82 and positioned above the test plate 5 so as to be spaced apart.

[0031] The lower terminal set 81 is located below the test plate 5 and includes a plurality of lower terminals 811 arranged along the radial direction of the test plate 5 .

[0032] The upper terminal set 83 is provided with a plurality of upper terminals 831 corresponding to each of the plurality of lower terminals 811, and since the length or width of the upper terminals 831 is larger than the diameter of the storage tank 50, the upper terminals 831 cannot pass through the storage tank 50 and contact the lower terminals 811 to electrically connect them.

[0033] The adjustment movement unit 82 is controlled by the control unit 9 to move the upper terminal 831 up and down relative to the loading board 4 or the tester 5 .

[0034] When the test plate 5 is not installed on the loading board 4, as shown in FIG. 5, the upper terminal set 83 is driven to move downward, and the upper terminal 831 contacts the lower terminal 811 of the lower terminal set 81 so as to be electrically connected.

[0035] A test plate 5 is installed on the loading plate 4, and when the test plate 5 is driven to rotate relative to the loading plate 4, as shown in Figure 6, the storage tanks 50 arranged radially pass through the test position one set at a time.

[0036] When an electronic component 100 is contained in the container 50, the lower terminal 811 contacts the first electrode 101 of the electronic component 100 in the container 50 at the test position to electrically connect to it, and the upper terminal 831, which is driven to move to the test plate 5, contacts the second electrode 102 of the electronic component 100 at the test position to electrically connect to it.

[0037] At this time, the test unit 8 performs an electrical characteristic test of the intended function on the electronic component 100 that is in contact with the upper terminal 831 and the lower terminal 811 so as to be electrically connected.

[0038] As shown in FIGS. 3, 7 and 8, the control unit 9 is equipped with a calibration function and a test function, and controls the operation of the test unit 8 to execute the calibration function and the test function.

[0039] When the control unit 9 activates the calibration function, if no detection signal is generated in the detection device 6 and the control unit 9 determines based on the detection result by the detection device 6 that the test plate 5 is not present on the loading board 4, it drives the adjustment movement unit 82 to drive the upper terminals 831 to move downward, and when the upper terminal set 83 contacts the lower terminal set 81 so as to be electrically connected, it stops the downward movement of the upper terminal set 83, and records the distance moved downward by the upper terminal set 83's movement, thereby obtaining the calibration distance d1.

[0040] In this case, unless the upper terminal set 83 comes into contact with the lower terminal set 81 so as to be electrically connected, the control unit 9 drives the adjustment movement unit 82 to continue moving the upper terminal set 83 downward in conjunction with the upper terminal set 83 until the upper terminal set 83 comes into contact with the lower terminal set 81 so as to be electrically connected.

[0041] In addition, when the control unit 9 activates the calibration function, it generates an inspection signal in the inspection device 6, and if the inspection result by the inspection device 6 determines that the test plate 5 is present on the loading board 4, it does not drive the moving unit 82 to move the upper terminal set 83 downward in conjunction with it, thereby preventing damage to parts due to the upper terminal set 83 continuing to move downward.

[0042] When the control unit 9 activates the test function, an inspection signal is generated in the inspection device 6, and if the inspection result by the inspection device 6 determines that the test plate 5 is present on the loading board 4, the control unit 9 controls the adjustment movement unit 82 to calculate the movement distance d3 when the upper terminal set 83 is brought into contact with the second electrode 102 of the electronic component 100 to electrically connect it, based on the planned height d2 of the electronic component 100 (the standard length of the electronic component 100) and the calibration distance d1 obtained when the calibration function is executed.

[0043] The movement distance d3 is obtained by subtracting the planned height d2 from the calibration distance d1 (d1-d2=d3). When actually performing the electrical characteristic test, the adjustment movement unit 82 can move the upper terminal set 83 downward by a distance slightly greater than the movement distance d3, so that the upper terminals 831 come into contact with the electronic component 100 to ensure electrical connection.

[0044] In addition, when the control unit 9 activates the test function, if it determines based on the inspection results by the inspection device 6 that the test plate 5 is present on the loading plate 4, it controls the rotation drive mechanism 31 to drive and rotate the test plate 5, and controls the feed unit 7 to feed the electronic component 100 into the storage tank 50 of the test plate 5.

[0045] At the same time, each time the test plate 5 rotates and moves a set of electronic components 100 to the test position, the control unit 9 controls the adjustment and movement unit 82 to move the upper terminal set 83 downward in conjunction with the set 83 by at least a movement distance d3, so that each upper terminal 831 of the upper terminal set 83 comes into contact with each electronic component 100 at the test position to electrically connect them, thereby allowing the test unit 8 to perform an electrical characteristic test on the electronic components 100 at the test position.

[0046] After the electrical characteristic test is completed, the control unit 9 controls the adjustment and movement unit 82 to move the upper terminal set 83 upward to its original position in conjunction with the upper terminal set 83, and controls the rotation drive mechanism 31 to drive and rotate the test plate 5, thereby moving the next set of electronic components 100 to the test position for the electrical characteristic test of the electronic components 100.

[0047] Conversely, when the control unit 9 activates the test function, if no inspection signal is generated in the inspection device 6 and the inspection result by the inspection device 6 determines that the test plate 5 is not present on the loading board 4, it will not drive the feed unit 7, for example, it will not drive the feed unit 7 to feed the electronic component 100 onto the test plate 5, and it will not control the adjustment moving unit 82 to move the upper terminal set 83 downward in conjunction with the feed unit 7.

[0048] According to the above configuration, the detection device 6 can detect whether the test plate 5 is placed on the loading plate 4, and the control unit 9 determines how to control the operation of the test unit 8 or the operation of the feed unit 7 based on the detection result of the detection device 6. Therefore, when the test plate 5 is placed on the loading plate 4, the calibration function is not performed, thereby preventing damage to the components of the present invention. Alternatively, when the test plate 5 is not placed on the loading plate 4, the test function is not performed, i.e., the feed unit 7 is not driven to feed the electronic components 100 onto the test plate 5, thereby preventing the electronic components 100 from scattering.

[0049] Therefore, the electronic component testing apparatus 200 of the present invention is a novel invention and can certainly achieve the objectives of the present invention.

[0050] The above-described embodiments are illustrative for explaining the principles and effects of the present invention, and are not intended to limit the present invention. Those skilled in the art may make slight changes or modifications to the above-described embodiments without departing from the spirit and scope of the present invention. Therefore, all changes and modifications made by those skilled in the art without departing from the gist of the present invention should be considered to fall within the scope of protection of the present invention.

[0051] The electronic device test apparatus of the present invention is suitable for testing electronic devices. [Explanation of symbols]

[0052] 100 Electronic Components 101 first electrode 102 second electrode 200 Electronic Component Test Equipment 3. Device body 30 Workbench 301 Concave tank 31 Rotation drive mechanism 4 Loading plate 40 Watermark Area 41 blocks 5 Test board 50 Containment Tank 6. Measuring Devices 61 Light projector 62 Light receiving part 7. Inlet unit 8 Test Unit 81 Lower terminal set 811 Bottom terminal 82 Preparation Transfer Unit 83 Upper terminal set 831 Upper terminal 9. Control Unit d1 Calibration distance d3 Distance traveled d2 Planned height

Claims

1. The apparatus includes a main body, a loading board, a test unit, and a control unit. The device body is provided with a work table, The loading plate is installed on the work table, A test plate that can be driven and rotated is removably installed on the loading plate, and a feeding unit is installed on the periphery of the loading plate; the test unit is installed on the workbench, The control unit can control the test unit or the input unit; An electronic component testing apparatus characterized in that the apparatus main body is provided with an inspection device that can detect the presence of the test plate on the loading table, and the control unit can control the operation of the test unit or the operation of the feed unit based on the inspection result of the inspection device.

2. 2. The electronic device test apparatus according to claim 1, wherein the inspection device is installed on the work table so as to be positioned below the test plate.

3. The loading plate has a plurality of sector-shaped blocks of different sizes, each of which can be independently and removably combined with another to form the loading plate; The plurality of sector-shaped blocks define a see-through area that can expose the work table; the test plate is placed so as to cover the watermark area; 2. The electronic component testing apparatus according to claim 1, wherein the inspection device is located within the watermark area.

4. 2. The electronic component test apparatus according to claim 1, wherein the inspection device comprises: a light-emitting unit provided in the inspection device and capable of emitting light to the test plate; and a light-receiving unit provided in the inspection device and capable of receiving reflected light from the test plate.

5. 5. The electronic device test device according to claim 4, wherein the light projecting unit emits light toward the bottom surface of the test plate, and the light receiving unit receives light reflected from the bottom surface of the test plate.

6. the test unit has an upper terminal set and a lower terminal set; 2. The electronic component testing apparatus according to claim 1, wherein the control unit drives the upper terminal set to contact the lower terminal set when the test result by the testing device indicates that the test board is not present.

7. the test unit has an upper terminal set and a lower terminal set; 2. The electronic component testing apparatus according to claim 1, wherein the control unit does not drive the upper terminal set to contact the lower terminal set when the test result by the testing device indicates that the test board is present.

8. 2. The electronic component testing apparatus according to claim 1, wherein the control unit drives the feeding unit to feed an electronic component onto the test board when the test result from the testing device indicates that the test board is present.

9. 2. The electronic component testing apparatus according to claim 1, wherein the control unit does not drive the feeding unit to feed an electronic component onto the test board when the test result by the testing device indicates that the test board does not exist.

10. The test plate has a plurality of reservoirs formed thereon, The containers are arranged in a plurality of rings spaced apart from each other in a radial direction, 2. The electronic component testing apparatus according to claim 1, wherein the inspection device is located in an area between the inner ring side of the container of the test plate and the rotation center of the test plate.

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