Accelerated current degradation test equipment for electronic devices

The test device addresses direct water heating risks by using steam generation outside the cabin and a partitioned heating system, enabling safe and efficient bias testing with improved reliability and reduced costs.

JP2025502923AActive Publication Date: 2025-01-30HAITUO INSTR (JIANGSU) CO LTD

Patent Information

Application Number
JP2024533123
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2021-12-20
Filing Date
2023-01-29
Publication Date
2025-01-30
Estimated Expiration
2043-01-29

AI Technical Summary

Technical Problem

Existing accelerated deterioration test machines for electronic devices face issues with water vapor generation methods that can lead to short circuits and damage due to direct heating, limiting the ability to perform bias tests and compromising test results.

Method used

A test device with a humidifier outside the test cabin generating steam, a partition box with rapid heating, and a controlled water supply system to prevent direct water heating, allowing for bias tests and reducing structural complexity and risk of damage.

Benefits of technology

Enables efficient and safe bias testing with improved test results and reduced costs by avoiding direct water heating, simplifying the structure, and preventing condensed water accumulation, thus enhancing reliability and efficiency.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure 2025502923000001_ABST
    Figure 2025502923000001_ABST
Patent Text Reader

Abstract

The present invention relates to an accelerated electrical degradation test device for electronic devices, comprising a box, a test cabin, and a humidification device. The surface of the box is provided with a connection terminal, and the test cabin is provided with a partition box and a first heating device. The partition box is provided to cover the upper part of the electronic device to be tested and is connected to the test cabin. The rear wall of the test cabin is provided with switch terminals that are electrically connected to the electronic device to be tested and the connection terminals. The humidifier includes a humidifying bucket, a second heating device, a temperature and humidity sensor, an intake pipe, and a recovery pipe. The intake pipe is connected to the middle and upper part of the test cabin, and the recovery pipe is connected to the bottom of the test cabin. The temperature and humidity sensor includes a dry-bulb sensor that is provided through the rear wall of the test cabin to extend to the inside of the test cabin, and a wet-bulb sensor that is provided inside the humidifying bucket at a position close to the intake pipe. The present invention can prevent condensed water from dripping onto the equipment and prevent short circuits, avoid the risk of danger caused by installing a water vapor generator outside and heating water inside the cabin, and reduce costs. Deterioration and bias tests can be performed simultaneously, improving efficiency and comprehensiveness.
Need to check novelty before this filing date? Find Prior Art

Description

[Technical field]

[0001] The present invention relates to a degradation test apparatus for electronic devices, and more particularly to an accelerated current degradation test apparatus for electronic devices. [Background technology]

[0002] In high-precision industries such as 5G communications, aerospace, and semiconductors, most electronic devices need to undergo reliability verification before shipment to ensure product quality. Reliability verification usually involves changing basic parameters such as temperature, humidity, and pressure around the product to detect chemical or physical changes that the product undergoes in a complex environment, or applying a bias power supply to the product to test the electrical variables of the product in a harsh environment.

[0003] Accelerated aging testers accelerate the aging process of products and shorten the test period by increasing the water vapor pressure to a predetermined level to increase environmental stress. Many existing accelerated aging testers generate water vapor by directly heating water in a cavity. For example, the equipment disclosed in the patent application with application number CN201710368553.6 heats the test cabin with a heating fan installed at the rear of the test cabin, injects a predetermined amount of water into the cavity with a pump motor, and heats the water with a heating pipe installed at the bottom of the cavity to generate water vapor, thereby forming a high temperature, high humidity, and high pressure test environment. However, since the heating fan installed in the cavity and the water at the bottom of the cavity prevent connection with the power supply, and especially, the water in the cavity is prone to short-circuiting the power supply during the test and causing damage, such equipment can only perform normal accelerated aging tests and cannot conduct bias tests by passing electricity through the product, so there are significant limitations to the test results. Summary of the Invention [Problem to be solved by the invention]

[0004] SUMMARY OF THE PRESENT EMBODIMENT In order to solve the above-mentioned conventional technical problems, the present invention provides an accelerated current degradation test device for electronic devices. [Means for solving the problem]

[0005] The accelerated electrical degradation test apparatus for electronic devices according to the present invention comprises a box, a test cabin provided inside the box, a humidification device provided inside the box for supplying water vapor to the test cabin, and a control means for controlling the operation of the test apparatus.

[0006] A shelf is provided within the test cabin, and a partition box is provided on the shelf for accommodating the electronic device to be tested, and the partition box is provided so as to cover the electronic device to be tested from above.

[0007] A first heating device for heating the internal space of the test cabin is provided within the test cabin, the partition box is connected to the test cabin, a switch terminal for supplying power to the electronic device under test is provided on the rear wall of the test cabin, and a connection terminal for connecting to a power source is provided on the surface of the box, and the switch terminal is electrically connected to the electronic device under test and the connection terminal, respectively. By performing an accelerated aging test and a bias test on the electronic device under test, the operating state of the electronic device under test under harsh conditions can be detected, thereby achieving comprehensive verification results. The above-mentioned arrangement of the partition box and the first heating device improves the performance and reliability, and since the walls of the partition box are heated rapidly and faster than the inner walls of the test cabin, water vapor can be prevented from being liquefied inside the partition box and condensation water can be prevented from dripping from the inner walls of the test cabin, and abnormal damage to the electronic device being tested and the circuit in contact with the switch terminal can be prevented so that the bias test can be performed normally. The first heating device is connected to the output end of the control means, and the heating or stopping of the first heating device can be controlled by the control means.

[0008] The humidifying device includes a humidifying bucket, a second heating device disposed inside the humidifying bucket for generating water vapor in the humidifying bucket, a temperature and humidity sensor for measuring the temperature and humidity in the test cabin, an intake pipe for introducing the water vapor in the humidifying bucket into the test cabin, and a recovery pipe for recovering the condensed water generated in the test cabin into the humidifying bucket. By generating water vapor in the humidifying bucket and introducing it into the test cabin, the risk of short circuit caused by directly heating water in the test cabin during bias testing can be avoided, and the equipment to be tested can be prevented from falling into water due to carelessness when transporting the equipment to be tested and being damaged. Furthermore, the heat emitted by the first heating device can be driven by the flow of water vapor to achieve a rapid temperature rise, replacing the fan heating in the existing technology, simplifying the structure of the test cabin, realizing connection to a power source in the test cabin, and avoiding cost increases due to deterioration of parts over time. One end of the intake pipe is connected to the middle and upper parts of the test cabin, and the other end of the intake pipe is connected to the middle and upper parts of the test cabin. The connection to the top promotes the smooth passage of water vapor into the test cabin and prevents condensed water from accumulating and burying the air intake; one end of the recovery pipe is connected to the bottom of the test cabin to facilitate the recovery of condensed water; the temperature and humidity sensor includes a dry-bulb sensor and a wet-bulb sensor; the dry-bulb sensor is provided penetrating the rear wall of the test cabin to extend to the inside of the test cabin, and can obtain humidity values ​​and measure temperature values; the wet-bulb sensor is provided inside the humidifying tub at a position close to the air intake pipe; the high humidity steam at the air intake ensures the accuracy of the humidity value obtained by the wet-bulb sensor; there is no need to provide gauze and a water tank for the wet-bulb sensor, which not only simplifies the device structure but also avoids the problem that the humidity detection shows 100% when there is a shortage of water in the water tank; the second heating device is connected to the output end of the control means; the temperature and humidity sensor is connected to the input end of the control means; and the control means can control the heating or pressurized humidification of the test apparatus based on the temperature and humidity values ​​input from the temperature and humidity sensor.

[0009] Specifically, the test equipment has two operation modes: unsaturated accelerated aging test and saturated high pressure accelerated aging test. When the temperature in the test cabin is adjusted by the first heating device and the humidity and pressure in the test cabin are adjusted by the humidifying device, the test equipment can perform unsaturated accelerated aging test, and when the temperature, humidity, and pressure in the test cabin are adjusted only by the humidifying device, the test equipment can perform saturated high pressure accelerated aging test.

[0010] The humidifying device further includes a water level sensor for measuring the water level, a water supply device for supplying water to the humidifying bucket, and a water tank connected to the water supply device, the water level sensor is connected to an input end of the control means, the water supply device is connected to an output end of the control means, the water level sensor is provided at an upper portion of the humidifying bucket so as to extend into the humidifying bucket, and when the water level sensor detects that the amount of water in the humidifying bucket is lower than a set lower limit, the control means controls the water supply device to supply water to the humidifying bucket. When the water level sensor detects that the amount of water in the humidifying bucket is higher than a set upper limit, the control means controls the water supply device to stop supplying water, ensuring that there is sufficient water in the humidifying bucket and preventing damage to the test device due to a lack of water.

[0011] In addition, the second heating device is provided with an overheat protection device for detecting the temperature of the second heating device, and when the overheat protection device detects that the temperature of the second heating device is higher than the upper limit value, it cuts off the power supply to the second heating device, thereby preventing the second heating device from running dry due to a lack of water in the humidifying bucket, and improving the safety of using the test equipment.

[0012] In addition, the first heating device is provided between the shelf and the bottom surface of the partition box, which not only enables the interior of the partition box to be quickly heated and raised in temperature, but also enables the power cord of the first heating device to be wired rationally, thereby improving space utilization in the test cabin.

[0013] In addition, the top surface of the partition box is formed in an arc shape, curving from bottom to top from both sides toward the center, so that condensed water does not flow to both sides along the walls of the partition box and drip onto the equipment being tested; if condensed water from the top of the test cabin drips onto the top surface of the partition box, the condensed water will flow to the bottom of the test cabin, making it easy to collect.

[0014] In addition, in order to prevent water or air leakage from the connection and ensure the airtightness of the test cabin, the switch terminal and the rear wall of the test cabin are hermetically fixed with a sealant.

[0015] In addition, a balance valve is provided on the rear wall of the test cabin to communicate with the test cabin and balance the air pressure inside the test cabin, and the balance valve is connected to the output end of the control means so as to facilitate constant adjustment and control of the temperature, humidity and pressure inside the test cabin.

[0016] In addition, a safety valve is provided on the rear wall of the test cabin, communicating with the test cabin and for detecting the air pressure inside the test cabin. When the safety valve detects that the air pressure inside the test cabin is higher than a set upper limit, the safety valve opens. When the safety valve detects that the air pressure inside the test cabin is lower than a set lower limit, the safety valve closes, thereby preventing an explosion due to excessive pressure inside the test cabin.

[0017] In addition, a condenser is further provided inside the box to cool the water vapor inside the test cabin, so that after the test is completed, the water vapor inside the test cabin can be rapidly cooled and liquefied, thereby improving the efficiency of condensed water recovery.

[0018] In addition, the surface of the box is provided with a control panel for controlling the operation of the test equipment and a pressure gauge for displaying the air pressure inside the test cabin, and the control panel is communicatively connected to the control means to improve the convenience of operating the test equipment, and the pressure gauge displays the air pressure inside the test cabin in real time, making it easier for the operator to observe. Effect of the Invention

[0019] According to the above technical configuration, the present invention has the following advantages over the prior art. The accelerated current degradation test device for electronic devices of the present invention not only avoids the risk of heating water in the test cabin by generating water vapor outside the test cabin and introducing it into the test cabin, but also eliminates the need to install a heating fan in the test cabin by forming an air flow using water vapor, simplifying the structure in the test cabin, allowing power connection to the product in the test cabin, and allowing bias testing to be performed together with degradation testing, thereby improving the efficiency and comprehensiveness of testing results, as well as reducing testing costs. In addition, a partition box is provided in the test cabin, which not only prevents condensation water from condensing on the inner wall of the test cabin, but also prevents condensation water from dripping from the inner wall of the test cabin, thereby avoiding abnormal damage to the equipment and circuits caused by condensation water dripping onto the equipment under test and the circuits that contact the switch terminals. [Brief description of the drawings]

[0020] Some specific embodiments of the present invention will now be described in detail, by way of non-limiting example, with reference to the drawings, in which like reference numerals represent the same or similar components or parts, and those skilled in the art should understand that the drawings are not necessarily drawn to scale. [Figure 1] FIG. 2 is a structural schematic diagram of an embodiment of the present invention; [Diagram 2] FIG. 2 is a side cross-sectional view of the embodiment shown in FIG. [Diagram 3] FIG. 2 is a schematic structural diagram of a test cabin in the embodiment shown in FIG. 1. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0021] The technical configuration of the present invention will be described clearly and completely below with reference to the drawings. The described embodiments are only a part of the embodiments of the present invention, and are not all of the embodiments. All other embodiments obtained by those skilled in the art without creative labor contribution based on the embodiments of the present invention belong to the protection scope of the present invention.

[0022] In the description of the present invention, the terms "first" and "second" etc. are for the purpose of description and correspond to the order of appearance in the present specification, and do not represent or imply any relative importance or positional relationship. In addition, the technical features according to different embodiments of the present invention described below can be combined with each other as long as they are not inconsistent with each other.

[0023] 1 to 3, the accelerated electrical degradation test apparatus for electronic devices according to this embodiment includes a box 1, a test cabin 2 provided inside the box 1, a humidifier 3 provided inside the box 1 for supplying water vapor to the test cabin 2, and a control means for controlling the operation of the test apparatus.

[0024] The surface of the box 1 is provided with a control panel 13 for controlling the operation of the test equipment and a pressure gauge 14 for displaying the air pressure inside the test cabin 2. The control panel 13 is communicatively connected to a control means to improve the convenience of operating the test equipment, and the pressure gauge 14 displays the air pressure inside the test cabin 2 in real time, making it easier for the operator to observe.

[0025] A shelf 21 is provided at the bottom of the test cabin 2, and a partition box 22 is provided on the shelf 21 for accommodating the electronic device to be tested. The partition box 22 is provided to cover the upper part of the electronic device to be tested. A first heating device 23 for heating the internal space of the test cabin 2 is provided inside the test cabin 2. The partition box 22 is in communication with the test cabin 2. The first heating device 23 is connected to an output terminal of a control means. The control means controls the heating or stopping of the first heating device 23. A rear wall of the test cabin 2 is provided with a A switch terminal 24 is provided for supplying power to the electronic device under test. In order to prevent water or air leakage from the connection and ensure the airtightness of the test cabin 2, the switch terminal 24 is sealed and fixed between the rear wall of the test cabin 2 and the rear wall of the test cabin 2 with a sealant. A connection terminal 11 for connecting to a power source is provided on the surface of the box 1. The switch terminal 24 is electrically connected to the electronic device under test and the connection terminal 11, respectively. By performing an accelerated aging test and a bias test on the electronic device under test, it is possible to perform a test under harsh conditions. The operating state of the electronic device under test can be detected, thereby improving the comprehensiveness and reliability of the verification results; the above-mentioned arrangement of the partition box 22 and the first heating device 23 allows the wall of the partition box 22 to be heated quickly, and the wall of the partition box 22 is heated faster than the inner wall of the test cabin 2, so that water vapor can be avoided from being liquefied inside the test cabin 2, and condensation water can be prevented from dripping from the inner wall of the test cabin 2, and abnormal damage to the electronic device under test and the circuit contacted with the switch terminal 24 can be prevented, so that the bias test can be performed normally; the rear wall of the test cabin 2 is provided with a balance valve 25 communicating with the test cabin 2 to balance the air pressure in the test cabin 2, and a safety valve 26 communicating with the test cabin 2 to detect the air pressure in the test cabin 2; the balance valve 25 is connected to the output end of the control means, so as to facilitate constant adjustment and control of the temperature, humidity and pressure in the test cabin 2; when the safety valve 26 detects that the air pressure in the test cabin 2 is higher than the set upper limit value, the safety valve 26 is opened;When the safety valve 26 detects that the air pressure inside the test cabin 2 is lower than the set lower limit, the safety valve 26 closes, thereby preventing an explosion due to excessive pressure inside the test cabin 2.

[0026] The humidifying device 3 includes a humidifying tub 31, a second heating device 32 provided inside the humidifying tub 31 for generating water vapor in the humidifying tub 31, a temperature and humidity sensor for measuring the temperature and humidity in the test cabin 2, an intake pipe 33 for introducing the water vapor in the humidifying tub 31 into the test cabin 2, and a recovery pipe 34 for recovering the condensed water generated in the test cabin 2 into the humidifying tub 31. By generating water vapor in the humidifying tub 31 and introducing it into the test cabin 2, it is possible to prevent a short circuit caused by directly heating water in the test cabin 2 during the bias test. The first heating device 23 is connected to the upper middle part of the test cabin 2, and the other end of the intake pipe 33 is connected to the upper middle part of the test cabin 2. The second heating device 23 is connected to the upper middle part of the test cabin 2, and the other end of the intake pipe 33 is connected to the upper middle part of the test cabin 2. The second heating device 23 is connected to the upper middle part of the test cabin 2. The second heating device 23 is connected to the upper middle part of the test cabin 2. The other end of the intake pipe 3 ... By being connected to the top of the humidifying tub 31, it promotes the smooth passage of water vapor into the test cabin 2 and prevents condensed water from accumulating and burying the intake port. One end of the recovery pipe 34 is connected to the bottom of the test cabin 2 to facilitate the recovery of condensed water. The temperature and humidity sensor includes a dry-bulb sensor 35 and a wet-bulb sensor 36. The dry-bulb sensor 35 is installed in the rear wall of the test cabin 2 and extends to the inside of the test cabin 2, and can obtain a humidity value and measure a temperature value. The wet-bulb sensor 36 is used to measure the intake air inside the humidifying tub 31. The second heating device 32 is connected to the output terminal of the control means, and the temperature and humidity sensor is connected to the input terminal of the control means, and the control means can control the heating or pressurized humidification of the test device based on the temperature and humidity values ​​input from the temperature and humidity sensor. Since there is no need to provide gauze and a water tank for the wet-bulb sensor 36, the structure of the device is simplified and the problem of the humidity detection indicating 100% when there is a shortage of water in the water tank is avoided. The second heating device 32 is connected to the output terminal of the control means, and the temperature and humidity sensor is connected to the input terminal of the control means. Based on the temperature and humidity values ​​input from the temperature and humidity sensor, the control means can control the heating or pressurized humidification of the test device.

[0027] Specifically, the test apparatus has two operation modes: an unsaturated accelerated aging test and a saturated high-pressure accelerated aging test. When the temperature in the test cabin 2 is adjusted by the first heating device 23 and the humidity and pressure in the test cabin 2 are adjusted by the humidifier 3, the test apparatus can perform an unsaturated accelerated aging test, and when the temperature, humidity, and pressure in the test cabin 2 are adjusted only by the humidifier 3, the test apparatus can perform a saturated high-pressure accelerated aging test.

[0028] In a more preferred embodiment, the humidifying device 3 further comprises a water level sensor 37 for measuring the water level, a water supply device 38 for supplying water to the humidifying bucket 31, and a water tank 39 communicating with the water supply device 38, the water level sensor 37 being connected to the input end of the control means and the water supply device 38 being connected to the output end of the control means, the water level sensor 37 being disposed at the top of the humidifying bucket 31 so as to extend into the inside of the humidifying bucket 31, and the water control means, when the level sensor 37 detects that the amount of water in the humidifying bucket 31 is lower than a set lower limit, controls the water supply device 38 to supply water to the humidifying bucket 31, and when the water level sensor 37 detects that the amount of water in the humidifying bucket 31 is higher than a set upper limit, controls the water supply device 38 to stop supplying water, thereby ensuring that there is sufficient water in the humidifying bucket 31 and avoiding damage to the test equipment due to lack of water.

[0029] In a more preferred embodiment, the second heating device 32 is provided with an overheat protection device 321 for detecting the temperature of the second heating device 32. When the overheat protection device 321 detects that the temperature of the second heating device 32 is higher than the upper limit value, the overheat protection device 321 cuts off the power supply to the second heating device 32, thereby preventing the second heating device 32 from running dry due to a lack of water in the humidifying bucket 31, and improving the safety of using the test equipment.

[0030] In a more preferred embodiment, the first heating device 23 is provided between the shelf 21 and the bottom surface of the partition box 22, which not only enables the interior of the partition box 22 to be quickly heated and raised in temperature, but also enables the power cord of the first heating device 23 to be wired rationally, thereby improving space utilization in the test cabin.

[0031] In a more preferred embodiment, the upper surface of the partition box 22 is formed in an arc shape, curving from bottom to top from both sides toward the center, so that condensed water does not flow along the walls of the partition box 22 to both sides and drip onto the equipment being tested, and if condensed water from the top of the test cabin 2 drips onto the upper surface of the partition box 22, the condensed water will flow to the bottom of the test cabin 2, making it easier to collect.

[0032] In a more preferred embodiment, a condenser 12 is further provided inside the box 1 for cooling the water vapor in the test cabin 2, so that after the test is completed, the water vapor in the test cabin 2 can be rapidly cooled and liquefied, thereby improving the efficiency of condensed water recovery.

[0033] According to the above technical configuration, the present invention has the following advantages over the prior art. The accelerated current degradation test device for electronic devices of the present invention not only avoids the risk of heating water in the test cabin by generating water vapor outside the test cabin and introducing it into the test cabin, but also eliminates the need to install a heating fan in the test cabin by forming an air flow using water vapor, simplifying the structure in the test cabin, allowing power connection to the product in the test cabin, and allowing bias testing to be performed along with degradation testing, thereby improving the efficiency and comprehensiveness of testing results, as well as reducing testing costs. In addition, a partition box is provided in the test cabin, which not only prevents condensation water from condensing on the inner wall of the test cabin, but also prevents condensation water from dripping from the inner wall of the test cabin 2, thereby avoiding abnormal damage to the equipment and circuits caused by condensation water dripping onto the equipment under test and the circuits that contact the switch terminals.

[0034] The above examples are merely intended to explain the technical ideas and features of the present invention, and are intended to enable those skilled in the art to understand and implement the contents of the present invention, and do not limit the protection scope of the present invention. All equivalent changes and modifications made based on the spirit and essence of the present invention are intended to be included in the protection scope of the present invention. [Explanation of symbols]

[0035] 1 Box 11 Connection terminal 12 Condenser 13. Control Panel 14 Pressure gauge 2 Test Cabin 21 Shelf 22 Divided Box 23 First heating device 24 Switch terminal 25 Balance valve 26 Safety valve 3 Humidifier 31 Humidification tub 32 Second heating device 321 Overheat protection device 33 Intake pipe 34 Recovery tube 35 Dry bulb sensor 36 Wet bulb sensor 37 Water level sensor 38 Water supply device 39 Water Tank

Claims

1. Box (1), a test cabin (2) provided inside a box (1), the test cabin (2) having a switch terminal (24) provided on a rear wall thereof for supplying power to an electronic device to be tested, the switch terminal (24) being electrically connected to a connection terminal (11) provided in the box (1); a partition box (22) provided within the test cabin (2) and communicating with the test cabin (2) for accommodating an electronic device to be tested; a first heating device (23) provided in the test cabin (2) for heating an interior space of the test cabin (2); a humidification device (3) provided inside the box (1) for supplying water vapor to the test cabin (2); The humidifier (3) comprises: A humidifying bucket (31), a second heating device (32) provided inside the humidifying tub (31) for generating water vapor within the humidifying tub (31); an intake pipe (33) for introducing water vapor in the humidifying tub (31) into the test cabin (2), the intake pipe (33) having one end connected to the upper middle part of the test cabin (2) and the other end connected to the upper part of the humidifying tub (31); a temperature and humidity sensor for measuring the temperature and humidity inside the test cabin (2), the temperature and humidity sensor including a dry-bulb sensor (35) provided through a wall of the test cabin (2) so as to extend into the interior of the test cabin (2), and a wet-bulb sensor (36) provided inside the humidifying tub (31) at a position close to the intake pipe (33); a recovery pipe (34) for recovering condensed water generated in the test cabin (2) into the humidifying tub (31), the recovery pipe (34) having one end connected to a bottom of the test cabin (2).

2. The humidifying device (3) further includes a water level sensor (37) for measuring a water level, a water supply device (38) for supplying water to the humidifying bucket (31), and a water tank (39) communicating with the water supply device (38); The water level sensor (37) is provided on the upper part of the humidifying tub (31) so as to extend into the interior of the humidifying tub (31); 2. The accelerated electrical degradation test apparatus for electronic devices as described in claim 1, wherein the water supply device (38) supplies water to the humidifying bucket (31) when the water level sensor (37) detects that the amount of water in the humidifying bucket (31) is lower than a set lower threshold, and stops the supply of water when the water level sensor (37) detects that the amount of water in the humidifying bucket (31) is higher than a set upper threshold.

3. The accelerated electrical degradation test apparatus for electronic devices according to claim 1, characterized in that the second heating device (32) is provided with an overheat protection device (321), and the overheat protection device (321) cuts off power to the second heating device (32) when it is detected that the temperature of the second heating device (32) is higher than a set upper limit value.

4. A shelf (21) is provided at the bottom of the test cabin (2), The shelf (21) is provided with a partition box (22), 2. The accelerated electrical degradation test apparatus for electronic devices according to claim 1, wherein the first heating device (23) is provided between the shelf (21) and a bottom surface of the partition box (22).

5. 2. The accelerated electrical degradation test device for electronic devices according to claim 1, wherein the upper surface of the partition box (22) is curved upward in the center and curved downward on both sides to form an arc shape.

6. 2. The accelerated electrical degradation test device for electronic devices according to claim 1, wherein a sealant is used to hermetically fix the switch terminal (24) to a rear wall of the test cabin (2).

7. 2. The accelerated electrical degradation test apparatus for electronic devices according to claim 1, further comprising a balance valve (25) provided on a rear wall of the test cabin (2) for communicating with the test cabin (2) and balancing the air pressure inside the test cabin (2).

8. 2. The accelerated electrical degradation test device for electronic devices according to claim 1, wherein a safety valve (26) is provided on a rear wall of the test cabin (2) in communication with the test cabin (2) for detecting air pressure inside the test cabin (2), and when the safety valve (26) detects that the air pressure inside the test cabin (2) is higher than a set air pressure upper limit threshold, the safety valve (26) opens, and when the safety valve (26) detects that the air pressure inside the test cabin (2) is lower than a set air pressure lower limit threshold, the safety valve (26) closes.

9. 2. The accelerated electrical degradation test apparatus for electronic devices according to claim 1, further comprising a condenser (12) provided in the box (1) for cooling water vapor in the test cabin (2).

10. 2. The accelerated electrical degradation test device for electronic devices according to claim 1, wherein a control panel (13) for controlling the operation of the test device is provided on a surface of the box (1).

Citation Information

Patent Citations

  • Hygrostat constant pressure testing device

    JP1983093857U

  • Testing apparatus of exposure for steam

    JP1983198745A

  • JP1991109047U

  • JP1992001435U

  • Temperature / Humidity adjusting device and method for environmental test

    JP2003065943A

Cited By

  • Chip Deterioration Testing Equipment

    JP2025500168A