Pusher for use in automatic test equipment, test mechanism including pusher, and method for mechanically pushing a device under test having a single linearly polarized antenna into a device under test socket - Patents.com

Abstract

An embodiment of the present invention includes a pusher (140) for use in automatic test equipment (ATE) to mechanically push a device under test (DUT) (110) having an antenna (120) or antenna array into a DUT socket (130). The pusher (140) has a structure (150) having alternating parallel layers (150) of relatively high dielectric constant layers (160a) and relatively low dielectric constant layers (160b). The high dielectric constant (160a) and low dielectric constant (160b) layers (150) extend in a first direction (170) that is within ±45° of the pushing direction (170).

Description

[Technical Field]

[0001] Embodiments according to the present invention relate to a pusher configured to push a device under test (DUT) into a device under test socket. Embodiments according to the present invention relate to a pusher configured to push a device under test having single linearly polarized antenna(s) into a device under test socket. Further embodiments relate to a test mechanism including a device under test that is pushed into a device under test socket (DUT socket) by a pusher. Further embodiments according to the present invention relate to the concept and / or design of a highly transparent pusher for a planar antenna module. Embodiments according to the present invention relate to a highly transparent pusher for a wireless test socket. [Background technology]

[0002] Background of the Invention Millimeter-wave transceiver modules often include electronics and planar antennas mounted in small form-factor devices. The size of the module is often determined by the antenna aperture area or antenna array aperture area. It is usually preferable (and sometimes required) for such modules to be tested over-the-air (OTA) with automated test equipment (ATE) in a production environment. Handling and / or testing of the module may require mechanically pushing the module into a DUT socket using a pushing mechanism or pusher on the side of the antenna or antenna array aperture.

[0003] The DUT antenna or antenna array is designed to have air and / or a (very) thin layer of dielectric material above it so that it does not obstruct the DUT antenna or antenna array. To test the DUT with an ATE or for ATE testing, these conditions are partly mimicked or simulated by a pusher. The pusher may be part of the OTA socket or part of the handler arm of the ATE or ATE test cell, but it can be a critical component in OTA testing because it contacts the antenna or antenna array of or within the DUT when pushing the DUT into the DUT socket.

[0004] The key issue in designing a pusher for an OTA test socket is the pusher material. The pusher material preferably has a (very) low dielectric constant close to that of air. More broadly, the pusher material's electrical properties should be close to those of air. The pusher material also preferably has the mechanical strength to withstand multiple cycles of mechanical stress when pushing the DUT into the DUT socket. In other words, the pusher must be mechanically robust while also being electromagnetically transparent or nearly transparent so as not to interfere with the DUT's single linearly polarized antenna(s). Unfortunately, for physical reasons, no material possesses both of these properties.

[0005] Dielectric materials with (very) low relative permittivity are known to meet the need for electromagnetic transparency, but at the same time, these materials are mechanically soft. Conversely, mechanically stiff pushers made of high permittivity materials can cause mistuning of the antenna feed impedance or alter the antenna radiation pattern.

[0006] Thus, there is a need for a pusher that has optimal performance not only in terms of mechanical stiffness but also in terms of electromagnetic transparency. Summary of the Invention

[0007] One embodiment of the present invention comprises a pusher for use in automatic test equipment (ATE) for mechanically pushing a device under test (DUT) having an antenna or antenna array into a DUT socket. The pusher has a structure in which there are alternating parallel layers of relatively high and relatively low dielectric constants. The high and low dielectric constant layers extend in a first direction within ±45° of the pushing direction.

[0008] To address the challenge of having a mechanically stiff yet electromagnetically transparent or nearly transparent pusher, embodiments of the pusher or pusher structure have a hybrid design constructed and / or blended of mechanically soft materials with low dielectric constants and mechanically strong materials with high dielectric constants, which hybrid design pushers are applicable for pushing DUTs with single polarized antennas.

[0009] In other words, the design and dimensions of the pusher's high-permittivity dielectric layer and / or low-permittivity dielectric layer may be important or critical to the pusher to avoid affecting (or excessively affecting) the electromagnetic waves received or transmitted by the DUT antenna or DUT antenna array, with the high-permittivity layer improving the mechanical rigidity of the pusher while the low-permittivity layer improving the electromagnetic transparency of the pusher.

[0010] In addition, the high dielectric constant layer extending in a parallel direction within ±45° to the pushing direction, or the surface of the parallel layer extending in a perpendicular direction within ±45° to the pushing direction, also improves the stability, durability, and mechanical rigidity of the pusher.

[0011] According to a preferred embodiment, the ratio of the thickness of the high dielectric constant layer to the thickness of the low dielectric constant layer is 1:10 to 2:1.

[0012] The primary requirements for the pusher are mechanical rigidity and electromagnetic transparency. The thicknesses of the high- and low-dielectric layers are selected so that the pusher remains transparent, or nearly transparent, to the electromagnetic waves transmitted or received by the DUT's antenna or antenna array, while maintaining the mechanical rigidity used to push the DUT into the DUT socket. Based on previously conducted experiments, a ratio of 1:10 to 2:1 meets this requirement.

[0013] According to an embodiment, the structure having alternating layers of high and low dielectric constants comprises a dielectric region with a relatively high dielectric constant of 9 to 66.6 vol.% or 20 to 60 vol.% and a dielectric region with a relatively low dielectric constant of 33.3 to 91 vol.% or 40 to 80 vol.%. Preferably, the structure comprises a dielectric region with a relatively high dielectric constant of 30 to 50 vol.% and a dielectric region with a relatively low dielectric constant of 70 to 50 vol.%.

[0014] A well-chosen ratio between the regions or layers of dielectric with a relatively high dielectric constant and the regions or layers of dielectric with a relatively low dielectric constant results in a pusher that maintains the mechanical rigidity used to press the DUT into the DUT socket while remaining transparent or nearly transparent to the electromagnetic waves transmitted or received by the DUT's antenna or antenna array.

[0015] In a preferred embodiment, the surface of the pusher configured to contact the device under test is shaped, configured, or machined to avoid the pusher contacting or coming into close proximity (e.g., within 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the DUT's antenna) with the conductive edge of the DUT's antenna, which may be a metal edge of the antenna structure that contributes strongly to radiation.

[0016] Contact or proximity of the pusher to the DUT-antenna will adversely affect the performance of the DUT's antenna. Dielectric loading of the radiating edge of the DUT antenna or its proximity will affect its resonance. Changing the resonance will change the feed impedance and the antenna's radiation behavior. Furthermore, if the pusher has a dielectric constant that is large compared to the wavelength but not small, it is preferable to avoid any resonance occurring within the pusher itself, which will lead to changes (sometimes disastrous changes) in the radiation and feed characteristics.

[0017] In a preferred embodiment, the pusher includes a spacer configured to be between the structure of alternating parallel layers and the DUT, the spacer being perpendicular to the alternating parallel layers within a tolerance of ±15° and / or the spacer being parallel to the surface of the DUT being pushed into by the pusher within a tolerance of ±15°.

[0018] The advantage of the spacer is that it is replaceable, so you don't have to replace the whole pusher in any case, just the spacer, and if the pusher needs to be adapted to a new DUT or is damaged, you can save money and materials by replacing only the spacer.

[0019] In a preferred embodiment, the spacer is a structured spacer (hereinafter also referred to as "structured spacer"), i.e., the spacer is further formed or configured or processed to contact the device under test so as to avoid contacting or approaching the conductive edges of the antenna of the DUT, for example, within a distance of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna of the DUT. The conductive edges may be metal edges of the antenna structure that strongly contribute to radiation.

[0020] The spacers are interchangeable, so each type of antenna design can have its own dedicated spacer that avoids contact with or proximity to the conductive edges of the DUT's antenna or antenna array, meaning the same pusher can be used with different spacers for different DUTs, making the pusher and therefore the ATE more flexible.

[0021] In a preferred embodiment, the spacer has a relative dielectric constant of 1.5 or less.

[0022] The spacer, which is configured to be in intimate contact with the DUT-antenna without contacting or approaching the conductive edge of the antenna, is made of a dielectric material with a low dielectric constant so that it is transparent or nearly transparent to the electromagnetic waves received or transmitted by the antenna of the DUT.

[0023] In a preferred embodiment, the spacer has a thickness of 50 μm to 500 μm.

[0024] The spacer is configured to cover the entire surface area of ​​the DUT's antenna. A thickness of 50-500 μm helps achieve this, even if the antenna surface area is uneven. It also achieves good mechanical stability without excessively reducing the antenna's performance.

[0025] In a preferred embodiment, the spacer has a thickness of 100 μm to 200 μm.

[0026] If the antenna area of ​​the DUT is somewhat (or sufficiently) uniform, a thickness of 100 μm to 200 μm may also be sufficient to cover the entire surface area of ​​the DUT's antenna.

[0027] In one preferred embodiment, the pusher comprises a dielectric slab (e.g., a dielectric slab made of a mechanically rigid material having a relatively high dielectric constant) that is oriented transversely or perpendicularly to the pushing direction within a tolerance of ±15°. The dielectric slab is configured to mechanically support and / or stabilize at least the high dielectric constant layer.

[0028] A mechanically strong dielectric slab is attached to the high-permittivity layer, transverse to the pushing direction, which prevents independent movement of the single high-permittivity layer of the pusher, for example, if the DUT has an uneven surface, thereby improving the durability, stiffness, and stability of the pusher.

[0029] In a preferred embodiment, the dielectric slab has a thickness equal to an integer multiple of half wavelengths of the electromagnetic wave in the dielectric material of the dielectric slab, e.g., within a tolerance of 1 / 10 of the wavelength of the electromagnetic wave at the center frequency of the DUT's operating frequency band, which is equal to the free-space wavelength divided by the square root of the dielectric constant of the dielectric material at the center frequency of the DUT's operating frequency band, which is transmitted or received by the DUT's antenna. The distance between the dielectric slab and the antenna surface of the device under test is at least one wavelength of the electromagnetic wave at the center frequency of the DUT's operating frequency band, e.g., within a tolerance of 1 / 10 of the wavelength of the electromagnetic wave.

[0030] The dielectric slab is made of a mechanically strong material and has a relatively high dielectric constant. Preferably, the dielectric slab is as electromagnetically transparent as possible. Therefore, the thickness of the slab and / or the distance between the DUT-antenna and the slab are selected to minimize the adverse effect of the slab on the electromagnetic waves transmitted or received by the DUT's antenna, e.g., to minimize losses of the electromagnetic waves transmitted or received by the DUT's antenna.

[0031] In a preferred embodiment, the length of the alternating parallel layers in the pushing direction is 0.5 to 2 times the free space wavelength of the electromagnetic wave transmitted or received by the antenna of the DUT, for example at the center frequency of the operating frequency band of the DUT.

[0032] The length of the alternating parallel layers, i.e., the length in the pushing direction of the pusher structure (e.g., the direction of the main lobe of the electromagnetic wave transmitted or received by the DUT-antenna), determines the amount of electromagnetic wave absorbed by the pusher. A limited length of the pusher or a limited length of the alternating parallel layers limits the amount of electromagnetic wave absorbed from the electromagnetic wave transmitted or received by the DUT's antenna. By limiting the length of the alternating parallel layers in this way, the pusher remains as transparent as possible to the electromagnetic wave transmitted or received by the DUT's antenna while maintaining mechanical rigidity.

[0033] In one preferred embodiment, the relatively high dielectric constant layer has a relative dielectric constant greater than 2, or preferably between 2.5 and 4.

[0034] Mechanically strong materials have a high dielectric constant. Materials used to provide mechanical stability and strength to the pusher have been found to have a dielectric constant of at least 2. A dielectric constant of 2.5 to 4 provides a good balance between mechanical strength and electromagnetic transparency.

[0035] In one preferred embodiment, the relatively high dielectric constant layer is made of a polymer or polycarbonate or quartz or Teflon or PEEK material.

[0036] In one preferred embodiment, the relatively low dielectric constant layer has a relative dielectric constant of 1.5 or less.

[0037] A relatively low dielectric constant material, having a relative permittivity of 1.5, is transparent or nearly transparent to the electromagnetic waves transmitted or received by the antenna of the DUT.

[0038] In one preferred embodiment, the relatively low dielectric constant layer is comprised of air.

[0039] Air has a low dielectric constant, so in a simple pusher design, only the relatively high dielectric constant layers are constructed, and the relatively low dielectric constant layers are left void, e.g., filled with air, such that the air around and / or between the relatively high dielectric constant layers becomes part of the pusher structure.

[0040] In a preferred embodiment, the shoving direction is parallel to the far-field direction of the electric field of the main lobe of the DUT's antenna within a tolerance of ±15°. Alternatively, the shoving direction is perpendicular to the major surface of the DUT within a tolerance of ±15°. In a further alternative, the shoving direction is perpendicular to the major surface of the DUT socket within a tolerance of ±15°.

[0041] To improve the transparency of the pusher to the electromagnetic waves transmitted or received by the DUT-antenna, the effective area of ​​the pusher's structures, especially the effective area of ​​the pusher's high-permittivity layers, is minimized. The effective area of ​​the structure is minimized when the structure's orientation (e.g., the extension of the layer) is parallel to the main lobe of the received or transmitted electromagnetic waves, which in most cases is also perpendicular to the main surface of the DUT or DUT socket within a tolerance of ±15°.

[0042] A further embodiment includes a test mechanism for testing a device under test, the test mechanism including a device under test having an antenna or an antenna array, the pusher described above, and a device under test socket, the device under test having an antenna or an antenna array of the test mechanism configured to be pushed into the device under test socket by the pusher described above, and the antenna of the DUT is a single linearly polarized antenna.

[0043] Another embodiment of the present invention creates a method for mechanically pushing a device under test having an antenna or antenna array into a device under test socket of an automatic test equipment, the method comprising mechanically pushing the device under test into the device under test socket with the pusher described above, wherein the antenna of the DUT is a single linearly polarized antenna.

[0044] It should be noted that the method and the corresponding device are based on the same considerations. Furthermore, the method can be supplemented by any of the features or functions and details described herein with respect to the device, individually or in combination. [Brief explanation of the drawings]

[0045] Next, embodiments according to the present application will be described with reference to the accompanying drawings. [Figure 1] FIG. 1 is a schematic diagram of one embodiment of a test setup including a DUT socket, a DUT with an antenna, and one embodiment of a pusher. [Figure 2] FIG. 2 is a schematic diagram illustrating one embodiment of a pusher configured to repeatedly push a DUT into a DUT socket. [Figure 3] FIG. 3 shows a photograph of one embodiment of a test setup with a pusher and DUT socket without a DUT, along with a test antenna. [Figure 4] FIG. 4 is a relative dielectric constant-strength diagram in which the horizontal axis represents the value of the relative dielectric constant and the vertical axis represents the value of the bending strength. [Figure 5] Figure 5(A) shows an initial DUT patch antenna without a pusher. Figure 5(B) shows a DUT patch antenna with a conventional pusher. Figure 5(C) shows a DUT patch antenna with a high-permittivity dielectric slab. Figure 5(D) shows a DUT patch antenna with a pusher structure comprising alternating parallel layers of relatively high and relatively low permittivity. Figure 5(E) shows a DUT patch antenna with a low-permittivity dielectric spacer. [Figure 6A] FIG. 6A shows a 3D simulation of a DUT with a dual-polarized patch antenna. [Figure 6B] FIG. 6B shows the results of the simulated input reflection coefficient measurements in a diagram and a Smith chart. [Figure 7A] FIG. 7A shows a 3D simulation of a setup with a patch antenna and a conventional pusher. [Figure 7B]Figure 7B shows the results of simulated input reflection coefficient measurements in a diagram and Smith chart for the case where the pusher dielectric constant is 1.0, showing the radiation patterns at two typical perpendicular cut planes for one selected polarization of the dual-polarized antenna. [Figure 7C] Figure 7C shows the results of simulated input reflection coefficient measurements in a diagram and Smith chart for a pusher dielectric constant of 1.2, showing the radiation patterns at two typical vertical cut planes for one selected polarization of the dual-polarized antenna. [Figure 7D] Figure 7D shows the results of simulated input reflection coefficient measurements in a diagram and Smith chart for a pusher dielectric constant of 3.6, showing the radiation patterns at two typical vertical cut planes for one selected polarization of the dual-polarized antenna. [Figure 8A] FIG. 8A shows a 3D simulation of the setup with the patch antenna and spacer layer. [Figure 8B] FIG. 8B shows the results of simulated input reflection coefficient measurements in a diagram and Smith chart for the case where the relative dielectric constant of the spacer is 1.3. [Figure 9A] FIG. 9A shows 3D simulations of three different test setups. [Figure 9B] FIG. 9B shows the results of simulated input reflection coefficient measurements performed on the first 3D simulation test setup without the pusher of FIG. 9A. [Figure 9C] FIG. 9C shows the results of simulated input reflection coefficient measurements performed on the second 3D simulation test setup of FIG. 9A, where the pusher is a simplified brick with a relative dielectric constant of 1.1. [Figure 9D] FIG. 9D shows the results of simulated input reflection coefficient measurements performed on the second 3D simulation test setup of FIG. 9A, where the pusher is a simplified brick with a relative dielectric constant of 1.2. [Figure 9E]FIG. 9E shows the results of simulated input reflection coefficient measurements performed on the second 3D simulation test setup of FIG. 9A, where the pusher is a simplified brick with a relative dielectric constant of 1.3. [Figure 9F] FIG. 9F shows the results of simulated input reflection coefficient measurements performed on the third 3D simulation test setup of FIG. 9A, where the pusher is a 39-slat laminar pusher with a dielectric constant of 1.3. [Figure 9G] FIG. 9G shows the results of simulated input reflection coefficient measurements performed on the third 3D simulation test setup of FIG. 9A, where the pusher is a 39-slat layered pusher with a relative dielectric constant of 2.5. [Figure 10A] FIG. 10A shows a 3D simulation of the test setup. [Figure 10B] FIG. 10B shows the simulated test setup of FIG. 10A built up layer by layer across three views. [Figure 10C] FIG. 10C shows the results of simulated input reflection coefficient measurements performed on the test setup of FIG. 10A, which includes a pusher with 39 slats and a structured spacer layer with dielectric constants of 2.5 and 1.3, respectively. [Figure 10D] FIG. 10D shows the results of simulated input reflection coefficient measurements performed on the test setup of FIG. 10A, which includes a pusher with 39 slats and a structured spacer layer with dielectric constants of 3.1 and 1.3, respectively. [Figure 10E] FIG. 10E shows the results of simulated input reflection coefficient measurements performed on the test setup of FIG. 10A, which includes a pusher with 39 slats and a structured spacer layer with dielectric constants of 3.6 and 1.3, respectively. [Figure 11A] FIG. 11A shows two views of the same 3D simulation test setup with a DUT having a pusher and an antenna. [Figure 11B]FIG. 11B shows the results of simulated input reflection coefficient measurements performed on the test setup of FIG. 11A, where the pusher has 15 slats with structured spacer layers made with dielectric constants of 3.6 and 1.3, respectively. [Figure 12A] FIG. 12A shows a simulation test setup that is the simulation test setup of FIG. 11A, with a pusher that includes an additional dielectric slab. [Figure 12B] FIG. 12B shows the results of simulated input reflection coefficient measurements performed on the test setup of FIG. 12A with a layered pusher having 15 slats and a structured spacer layer. [Figure 13] FIG. 13 shows a comparison table for the change in input reflection coefficient. DETAILED DESCRIPTION OF THE INVENTION

[0046] Detailed Description of the Embodiments In the following, different inventive embodiments and aspects are described. Further embodiments are defined by the appended claims. It should be noted that any embodiment defined by a claim may be optionally supplemented by any of the details, features and functionality described herein. Also, the embodiments described herein may be used individually or may be optionally supplemented by any of the details, features and functionality included in the claims.

[0047] It should also be noted that the individual aspects described herein may be used individually or in combination. Thus, details can be added to each of the individual aspects without adding details to another one of the aspects. It should also be noted that the present disclosure explicitly or implicitly describes features that can be used in automated test equipment, in a test mechanism, or in a pusher. Thus, any of the features described herein may be used in the context of automated test equipment, in the context of a test mechanism, or in the context of a pusher.

[0048] Furthermore, features and functionality disclosed herein with respect to a method can also be used in an apparatus configured to perform such functionality. Furthermore, features and functionality disclosed herein with respect to an apparatus can also be used in the corresponding method. In other words, the method disclosed herein may be supplemented by any of the features and functionality described with respect to the apparatus.

[0049] The present invention will be more fully understood from the following detailed description and the accompanying drawings of embodiments of the invention, which should not be taken to limit the invention to the particular embodiments described, but are for purposes of illustration and understanding only.

[0050] Embodiment according to FIG. 1 1 shows a schematic diagram of an embodiment of a test setup 100 for testing a device under test (DUT) 110 having one or more antennas 120 and / or antenna arrays 120. The test setup 100 includes a DUT socket 130, a DUT 110 having an antenna 120, and an embodiment of a pusher 140.

[0051] The test mechanism 100 is configured to test the DUT 110, and in particular the antenna 120 of the DUT 110. The DUT 110 is configured to be pushed into the device under test socket 130 in a pushing direction 170 by a pusher 140.

[0052] Pusher 140 is a schematic diagram of an embodiment having structures 150 including alternating parallel layers of relatively high dielectric constants 160a and relatively low dielectric constants 160b, where "relatively" means that the dielectric constant of a given dielectric region is higher or lower relative to other dielectric regions of pusher 140. Structures 150 and / or alternating parallel layers of relatively high dielectric constants 160a and relatively low dielectric constants 160b extend in directions within ±45° of pushing direction 170.

[0053] The pusher 140 is configured to mechanically press a device under test 110 having an antenna 120 or antenna array 120 into a device under test socket 130 of automatic test equipment. The structure 150 of the pusher 140, having alternating parallel layers of relatively high dielectric constant 160a and relatively low dielectric constant 160b, significantly improves the transparency of the pusher 140 to electromagnetic waves transmitted or received by the antenna 120 of the DUT 110 compared to conventional pushers, while maintaining sufficient mechanical rigidity to repeatedly press the DUT 110 into the DUT socket 130 in a production environment.

[0054] The structure 150 includes a dielectric region 160a having a high dielectric constant of 9 vol.% to 66.6 vol.% or 20 vol.% to 60 vol.% and a dielectric region 160b having a low dielectric constant of 33.3 vol.% to 91 vol.% or 40 vol.% to 80 vol.%. Preferably, the structure includes a dielectric region 160a having a high dielectric constant of 30 to 50 vol.% and a dielectric region 160b having a low dielectric constant of 50 to 70%.

[0055] The relatively high dielectric constant layer 160a has a dielectric constant greater than 2, preferably between 2.5 and 4, such as a polymer, polycarbonate, quartz, Teflon, or PEEK material. The relatively low dielectric constant layer 160b has a dielectric constant of, for example, 1.5 or less. As shown in Figure 2, the low dielectric constant dielectric region may be composed of air.

[0056] Embodiment according to FIG. 2 Figure 2 is a schematic diagram of an embodiment of a pusher 240 similar to pusher 140 of Figure 1, with a DUT antenna 220. The pusher has a spacer 290, a structure 250 in which there are alternating parallel layers of relatively high dielectric constant 260a and relatively low dielectric constant 260b, and a dielectric slab 280.

[0057] The pusher 240 is configured to repeatedly push a DUT 220, similar to the DUT 110 of Figure 1, into the DUT socket. The DUT includes at least an antenna 220 or antenna array that transmits or receives electromagnetic waves 210. The antenna is a single linearly polarized antenna.

[0058] The pusher spacer 290 is attached to the pusher structure 250 and configured to be between the structure 250 and the DUT or the DUT's antenna 220. The spacer is perpendicular to the surfaces of the alternating parallel layers 260a, 260b of the pusher 240 within a tolerance of ±15°. The spacer is made of a mechanically soft, low-permittivity dielectric material, having a relative permittivity of less than 1.5. The spacer is configured or fabricated to avoid contact with or proximity to the conductive edges of the DUT's antenna within a distance of 1 / 10 wavelength of the electromagnetic waves transmitted or received by the antenna 220. The conductive edges may be metal edges of the antenna structure that strongly contribute to radiation.

[0059] The dielectric slab 280 is attached to the high permittivity dielectric pillar 260 a and is oriented laterally or perpendicularly to the indentation direction 270 within a tolerance of ±15°.

[0060] The dielectric slab 280 of the pusher 240 is configured to mechanically support at least the relatively high dielectric constant layer 260a of the structure 250. To remain transparent or nearly transparent to the electromagnetic wave 210 transmitted or received by the antenna 220, the dielectric slab 280 has a thickness equal to an integer multiple of half the wavelength of the electromagnetic wave 210 in the dielectric material of the dielectric slab 280, which corresponds to the free-space wavelength divided by the square root of the dielectric constant of the dielectric. The thickness tolerance is 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the antenna 220 (e.g., the center frequency of the operating frequency band of the DUT).

[0061] Pusher structure 250 is similar to pusher structure 150 in FIG. 1, and the length of alternating parallel layers 260a, 260b in the pushing direction is 0.5 to 2 times the free space wavelength of the electromagnetic wave transmitted or received by antenna 220 of the DUT.

[0062] The pusher 240 can also be used in a test mechanism similar to the test mechanism 100 of Figure 1. A photograph of the test mechanism with the pusher is shown in Figure 3.

[0063] Embodiment according to FIG. 3 Figure 3 is a photograph of an embodiment of a test mechanism 300 similar to test mechanism 100 of Figure 1. Test mechanism 300 includes a pusher 340, similar to pusher 140 of Figure 1 or pusher 240 of Figure 2, and a DUT socket 330. While the DUT of test mechanism 300 is not shown, Figure 3 also shows an automatic test equipment (ATE) test antenna 350 configured to perform over-the-air (OTA) tests or measurements on the DUT.

[0064] Dielectric constant-strength diagram according to Figure 4 4 shows a dielectric constant-strength diagram 400, where the horizontal axis represents the dielectric constant value and the vertical axis represents the flexural strength value. Various materials are represented on the diagram, including ceramic 450, polymer 452, polymer foam 454, and sandwich 456. Existing pusher (or socket) materials 410, ideal pusher materials 430, and available pusher materials 440 are also marked on the diagram.

[0065] Existing pusher (or socket) materials 410 are shown to have sufficient flexural strength, but their dielectric constants are higher than ideal. A satisfactory dielectric constant would be to the left of line 420, i.e., 1.5 or less. While the location of ideal material 430 is shown in the diagram, no known material meets these requirements. Existing materials with dielectric constants below 1.5 are a type of polymer foam, and their flexural strength is 1 / 100th that of existing or conventional pusher material 410. Available materials 440 with low dielectric constants, shown in the diagram, do not have desirable flexural strength.

[0066] Since an ideal material that meets the characteristics of a low dielectric constant (e.g., lower than 1.5) and a bending strength higher than 30 MPa is not yet known, an improved design concept is needed. The design concept applied to the pusher 240 in FIG. 2 is a combination of all the new ideas or design concepts in FIG.

[0067] Design concept related to Figure 5 5(A) to 5(E) are schematic diagrams of the design concepts of existing and new pushers.

[0068] Figure 5(A) shows the patch antenna 500 in its initial state, e.g., without a pusher. The patch antenna 500 serves as a characteristic example of a planar antenna. This antenna features two opposing radiating edges 503, 506, which have an electric field 509 that is primarily perpendicular to these edges. The operating frequency and feeding impedance are determined by the resonance of the electromagnetic field 509 between the ground and the patch and between the two radiating edges 503, 506.

[0069] 5a shows the initial placement of a single patch antenna 500 without a pusher. The antenna radiates or transmits electromagnetic waves 510 that are preferably unaffected by the pusher in an ideal test setup.

[0070] FIG. 5b illustrates the patch antenna 500 of FIG. 5(A) with a conventional pusher 520, a conventional design concept that includes a whole or solid block of pusher 520 configured to push the DUT-antenna 500 into the DUT socket. The conventional pusher 520 is made of the material that is the existing pusher material 410 of FIG. 4. In this conventional design, a dielectric load at or near the radiating edge affects the resonance of the DUT-antenna 500. The dielectric pusher 520 alters the resonance of the DUT-antenna 500, thereby changing the feed impedance and radiation behavior of the DUT-antenna 500. If the pusher has a dielectric constant that is large and not low compared to the wavelength, it is preferable to avoid any resonance within the pusher itself, which could ultimately lead to significant or sometimes disastrous changes in the radiation and feed characteristics.

[0071] In order to have a pusher that avoids changing the resonance of the DUT-antenna 500 and thereby changing the feed impedance and radiation behavior, three dielectric structural features of the pusher and their specific electromagnetic characteristics are introduced in the following three Figures 5(C)-(E).

[0072] 5(C) shows a dielectric slab 580 of a strong, mechanically strong, high permittivity dielectric material positioned parallel to the antenna aperture of DUT-antenna 500. The thickness of slab 580 is equal to an integer multiple of half wavelengths of the electromagnetic waves in the dielectric material of dielectric slab 580, within a tolerance of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by DUT-antenna 500.

[0073] The distance between the DUT-antenna 500 and the dielectric slab 580 is at least one wavelength of the electromagnetic wave transmitted or received by the DUT-antenna 500. The rigid, mechanically strong, high-permittivity dielectric material required for mechanical stability is not intended to contact the metal or conductive edges of the radiating slot or antenna aperture, as this would lead to detuning of the feed impedance. The conductive edges may be metal edges of the antenna structure that strongly contribute to the radiation.

[0074] 5(D) shows patch antenna 500 with a pusher structure 550 of alternating parallel layers of relatively high dielectric constant and air or relatively low dielectric constant. This structure 550 is, for example, a layered stack of thin sheets of high dielectric constant dielectric material separated by spacer layers of air or low dielectric constant, providing a low effective permittivity for electric fields perpendicular to the plane of the sheets compared to a high effective permittivity for electric fields parallel to the plane of the sheets.

[0075] If the direction of the electric field is known, a layered stack of properly oriented structures 550 or thin sheets of high permittivity dielectric material 560a will not significantly affect the performance of the DUT-antenna 500.

[0076] 5(E) shows a DUT patch antenna 500 having a low dielectric constant dielectric spacer 590. The DUT with the patch antenna 500 is configured to be pressed into a DUT socket by the spacer 590 or spacer layer 590.

[0077] The surface of a planar antenna includes, for example, a dielectric surface area, a metal edge, and a metal surface area. In terms of contacting the surface with a dielectric pusher, the metal surface is rather unimportant, since the most sensitive areas are the metal edges and the nearby dielectric areas, which may form radiating edges or slots.

[0078] A structured dielectric spacer or spacer layer or sheet provides mechanical contact between the planar antenna surface and the pusher only at the metallic and non-critical dielectric portions of the antenna surface. Preferably, the radiating edges or slots are spaced away from direct contact and a small air spacer volume is provided above these edges or slots.

[0079] While the conceptual ideas of Figures 5(C) and 5(E) are somewhat obvious and easily implemented, the idea of ​​Figure 5(D) further quantifies the trade-off between effort and benefit. The design concepts of Figures 5(A)-(E) are simulated in the following figures:

[0080] Antenna simulation according to Figure 6 Figure 6A shows a 3D simulation of a DUT using a dual-polarized patch antenna, which is an example of patch antenna 500 from Figure 5. The example antenna 600 from Figure 6 is used to quantify performance in simulations using electromagnetic simulation software. The example antenna 600 is a dual-linearly polarized microstrip patch antenna. Its operation and issues are common to all patch and slot antennas, making it representative of the majority of planar antennas.

[0081] The simulation used a center frequency of operation of 28 GHz. The two feed lines are terminated at the ports with a characteristic line impedance of approximately 35 ohms.

[0082] 6B shows the results of a simulated input reflection coefficient measurement in a frequency-reflection diagram 630 and a Smith chart 660. The chart shows the input reflection coefficient. The marker corresponds to approximately (40.9+j1.0) Ω at 28 GHz.

[0083] Simulation of a conventional pusher according to FIG. FIG. 7A shows a 3D simulation of an arrangement comprising a DUT patch antenna 710 similar to patch antenna 600 of FIG. 6 and a conventional solid dielectric pusher 720 configured to mechanically press the main surface of the DUT or DUT-antenna into the DUT-socket, as also shown in the design concept of FIG. 5(B).

[0084] Figures 7B-D show the results of simulated input reflection coefficient measurements performed on the setup of Figure 7A using different pushers (e.g., pushers with different dielectric constants). A center frequency of operation of 28 GHz was used in the simulation. The two feed lines were terminated at the ports with a characteristic line impedance of approximately 35 ohms.

[0085] FIG. 7B shows the results of a simulated input reflection coefficient measurement performed in the first case of FIG. 7A, where the pusher is made of a material with a dielectric constant of 1.0, such as air or vacuum. This is equivalent to having no pusher present. Note that for accurate comparison, the size of the calculation domain in FIG. 7B is equal to or equal within all simulations that include the pusher, so the results shown in FIG. 6B (e.g., for an antenna of an aerial device under test) are slightly different. That is, to make the measurements in FIGS. 7B-D comparable, the calculation domain includes the pusher, whereas the results shown in FIG. 6B do not.

[0086] 7B shows the results of a simulated input reflection coefficient measurement where pusher 720 is made of a material with a dielectric constant of 1, which is equivalent to having no pusher. Because this simulation takes into account the dimensions of the pusher, the simulated measurement results differ slightly from the simulated measurement results shown in diagram 630 and Smith chart 660 of FIG. 6.

[0087] The results of the simulated input reflection coefficient measurement are shown in diagram 732 and Smith chart 734. The marker is located approximately at (42.3+j1.2)Ω (0.0615exp(+j13.7°)) at -24.2 dB and 28 GHz.

[0088] The radiation patterns in two typical vertical sections for a selected polarization of a dual polarized antenna are shown in Figures 736 and 738.

[0089] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 7.12dBi, Main lobe direction: 3.0 deg. Angle width (3dB): 86.1deg., Sidelobe level: -17.8dB.

[0090] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 7.11dBi, Main lobe direction: 1.0 deg. Angle width (3dB): 78.4deg., Sidelobe level: -17.7dB.

[0091] 7C shows the results of a simulated input reflection coefficient measurement performed on the second case of FIG. 7A, where pusher 720 is made of a material with a relative permittivity of 1.2, such as a foamed dielectric material. As with the first case, the results of the simulated reflection coefficient measurement are shown in diagram 742 and Smith chart 744. The marker is located approximately at (35.4-j8.5) Ω (0.120exp(+j262.6°)) at -18.4 dB and 28 GHz.

[0092] The radiation patterns in two typical vertical sections for a selected polarization of a dual polarized antenna are shown in Figures 746 and 748.

[0093] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 7.42dBi, Main lobe direction: 3.0 deg. Angle width (3dB): 84deg. Sidelobe level: -16.4dB.

[0094] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 7.41dBi, Main lobe direction: 1.0 deg. Angle width (3dB): 77.2deg., Sidelobe level: -16.5dB.

[0095] 7D shows the results of a simulated input reflection coefficient measurement performed on the third case of FIG. 7A, where pusher 720 is made of a material having a relative dielectric constant of 3.6, which may be a Polyetheretherketone (PEEK) material. The results of the simulated reflection coefficient measurement are shown in diagram 752 and Smith chart 754. The marker is located approximately at (16.55-j3.9) Ω (0.394exp(+j194.6°)) at -8.1 dB and 28 GHz.

[0096] The radiation patterns in two typical vertical sections for one selected polarization of a dual polarized antenna are shown in Figures 756 and 758.

[0097] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 6.8dBi, Main lobe direction: 28.0 deg. Angle width (3dB): 104.4deg., Sidelobe level: -8dB.

[0098] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 6.08dBi, Main lobe direction: 6.0 deg. Angle width (3dB): 81.6deg., Sidelobe level: -10.2dB.

[0099] To summarize the design concepts used by conventional pusher 720, the simulated measurement results of FIG. 7B are compared with the simulated measurement results of FIGS. 7C and 7D.

[0100] Comparing the first and second cases, or the simulated and measured results of Figures 7B and 7C, we see that the feed reflection coefficient changes by 0.153 in the complex plane, the gain increases from 7.1 dBi to 7.4 dBi, and the beamwidth decreases from 86° to 84° (E-plane) and from 78° to 77° (H-plane). These changes, i.e., the pusher effect, are clearly within the acceptable range. However, a material with a relative permittivity of 1.2 does not have sufficient mechanical rigidity.

[0101] Comparing the first and third cases, i.e., the simulated measurement results in Figure 7B and the simulated measurement results in Figure 7D, the feed reflection coefficient shifted by 0.455 in the complex plane, the gain increased from 7.1 dBi to 6.8 dBi, and the beamwidth changed from 86° to 104° (E-plane) and from 78° to 82° (H-plane), respectively. Such changes, i.e., the impact of such a pusher, are too large and, for example, unacceptable.

[0102] The simulated measurement results of the conventional pusher shown in FIG. 7A, as shown in FIGS. 7B-D, indicate that additional design concepts or combinations thereof are required.

[0103] Simulation of the spacer according to FIG. 8 FIG. 8 shows a 3D simulation of a patch antenna 810, similar to patch antenna 600 of FIG. 6, with a spacer 830 configured to press the DUT into the DUT socket. The simulated spacer 830 is a low-dielectric spacer with a relative permittivity of 1.3 and an overall thickness of 300 μm. The spacer is considered to be in contact with the antenna surface. Additionally, the spacer provides an (air filter) trench or cutout, e.g., 150 μm deep, along the radiating edge or slot, with a trench width of e.g., 300 μm.

[0104] The results of the simulated reflection coefficient measurement are shown in diagram 840 and Smith chart 850. The marker is located approximately at (38.47-j5.8) Ω (0.0077 exp(+j283.5°)) at -22.2 dB and 28 GHz.

[0105] Structural design simulation according to Figure 9 Figure 9A shows 3D simulations of three different test setups. The first 3D simulation in test setup 910 is an initial example antenna 940 similar to example antenna 600 of Figure 6, which is a possible implementation of patch antenna 500 of Figure 5. Initial example antenna 940 is a dual linearly polarized antenna or patch antenna. This example antenna 940 is used in the second and third 3D simulation test setups below to quantify performance in simulations using electromagnetic field simulation software.

[0106] The second 3D simulation test setup 920 includes an initial antenna example 940 with a homogenous dielectric pusher 950. The pusher 950 can be viewed as a single block, or simply a simplified brick.

[0107] The third 3D simulation test setup 930 includes an initial antenna example 940 having a pusher 960 with a structure of alternating layers, or a layered pusher 960 made of dielectric slats. In this example, the pusher has 39 slats, each 50 μm thick, with a 100 μm gap between adjacent slats.

[0108] Figure 9B shows the results of a simulated input reflection coefficient measurement performed on the first 3D simulated test fixture 910 of Figure 9A without a pusher present. This is equivalent to the second test fixture 920 of Figure 9A with a pusher 950 made of a simplified brick, a material with a dielectric constant of 1.0. The results of the simulated reflection coefficient measurement are shown in diagram 912 and Smith chart 914. The marker is located approximately at (40.9-j1.05) Ω (0.045exp(+j343°)) at -24.2 dB and 28 GHz.

[0109] Figure 9C shows the results of a simulated input reflection coefficient measurement performed on the second 3D simulation test setup 920 of Figure 9A, where the pusher 950 is a simplified brick made of a material with a relative dielectric constant of 1.1. The results of the simulated reflection coefficient measurement are shown in diagram 922 and Smith chart 924. The marker is located approximately at (36.0-j5.92) Ω (0.083exp(+j260°)) at -21.6 dB and 28 GHz.

[0110] Figure 9D shows the results of a simulated input reflection coefficient measurement performed on the second 3D simulation test setup 920 of Figure 9A, where the pusher 950 is a simplified brick made of a material with a relative dielectric constant of 1.2. The results of the simulated reflection coefficient measurement are shown in diagram 926 and Smith chart 928. The marker is located approximately at (31.22-j8.11) Ω (0.149 exp(+j239°)) at -16.55 dB and 28 GHz.

[0111] Similar to Figure 9D, Figure 9E shows the results of a simulated input reflection coefficient measurement performed on the second 3D simulation test setup 920 of Figure 9A, where the pusher 950 is a simplified brick made of a material with a relative dielectric constant of 1.3. The results of the simulated reflection coefficient measurement are shown in diagram 942 and Smith chart 944. The marker is located approximately at (27.24-j8.67) Ω (0.206exp(+j228°)) at -13.72 dB and 28 GHz.

[0112] Figures 9F and 9G show the results of simulated input reflection coefficient measurements performed on the third 3D simulation test setup 930 of Figure 9A, where pusher 950 is a layered pusher of 39 slats made of materials having dielectric constants of 1.3 and 2.5, respectively. Each slat is 50 μm thick, and the distance between adjacent slats is 100 μm. The results of the simulated reflection coefficient measurements are shown in diagrams 962 and 966 and Smith charts 964 and 968, respectively.

[0113] Note that while the simulated measurements in Figures 9B-E, e.g., measurements performed with a test setup without a pusher or a simplified brick pusher, do not show differences between the different polarizations of the example antenna, the measurements in Figures 9F-G show that the layered pusher affects the two perpendicular polarizations differently, e.g., the field parallel to the slats (first polarization or port 1 feed) is less disturbed by the layered pusher than the field perpendicular to the slats. That is, the curve and / or markers for port 1 are different from the curve and / or markers for port 2.

[0114] The port 1 marker in Figure 9F is approximately at (36.84-j5.32) Ω (0.072 exp(+j266°)) at -22.9 dB and 28 GHz. The port 2 marker in Figure 9F is approximately at (36.14-j6.08) Ω (0.085 exp(+j261°)) at -21.5 dB and 28 GHz.

[0115] The port 1 marker in Figure 9G is approximately at (27.66-j8.88) Ω (0.202 exp(+j320°)) at -13.9 dB and 28 GHz. The port 2 marker in Figure 9G is approximately at (22.18-j8.16) Ω (0.289 exp(+j216°)) at -10.8 dB and 28 GHz.

[0116] Structural design simulation according to Figure 10 10A shows a 3D simulation test setup 1000 comprising a pusher 1010 and a DUT 1020 with an antenna. The pusher is a layered pusher, comprising a low-dielectric-constant structured spacer layer 1013 made of a material with a relative permittivity of 1.3 combined with a structure of alternating layers 1016. In this example, the structure 1016 has 39 dielectric slats, each 50 μm thick, with a distance or gap between two adjacent slats of 100 μm. In this simulation, the slat material has a variable permittivity, e.g., to simulate measurements performed on different pushers made of different slat materials.

[0117] For better visibility, the test setup 1000 is shown layer by layer, or stacked, in Figure 10B. The first figure shows the DUT 1020 with an antenna, which is a dual-polarized patch antenna similar to antenna 600 in Figure 6A. The second figure shows the DUT 1020 with the low-dielectric spacer layer 1013 of the pusher 1010. The third figure shows the 3D simulation test setup 1000, including the DUT 1020 and the pusher 1010 with the structured spacer layer 1013 and alternating layers 1016.

[0118] 10C shows the results of a simulated input reflection coefficient measurement performed on the 3D simulation test setup 1000 of FIG. 10A, where pusher 1010 is a 39-slat layered pusher with a structured spacer layer 1013. The structured spacer layer 1013 and the slats are made of materials with relative dielectric constants of 1.3 and 2.5, respectively. The results of the simulated reflection coefficient measurement are shown in diagram 1033 and Smith chart 1036.

[0119] The port 1 marker in Figure 10C is approximately at (30.4-j4.9) Ω (0.127 exp(+j218.6°)) at -17.9 dB and 28 GHz. The port 2 marker in Figure 10C is approximately at (25.5-j4.1) Ω (0.201 exp(+j202.5°)) at -13.9 dB and 28 GHz.

[0120] Figure 10D shows the results of a simulated input reflection coefficient measurement performed on the 3D simulation test setup 1000 of Figure 10A, where pusher 1010 is a 39-slat layered pusher with a structured spacer layer 1013. The structured spacer layer 1013 and the slats are made of materials with relative dielectric constants of 1.3 and 3.1, respectively. The results of the simulated reflection coefficient measurement are shown in diagram 1043 and Smith chart 1046.

[0121] The port 1 marker in Figure 10D is approximately at (29.6-j4.2) Ω (0.133 exp(+j211.2°)) at -17.5 dB and 28 GHz. The port 2 marker in Figure 10D is approximately at (23.1-j2.2) Ω (0.242 exp(+j190.9°)) at -12.3 dB and 28 GHz.

[0122] Figure 10E shows the results of a simulated input reflection coefficient measurement performed on the 3D simulation test setup 1000 of Figure 10A, where pusher 1010 is a 39-slat layered pusher with a structured spacer layer 1013. The structured spacer layer 1013 and the slats are made of materials with relative dielectric constants of 1.3 and 3.6, respectively. The results of the simulated reflection coefficient measurement are shown in diagram 1053 and Smith chart 1056.

[0123] The port 1 marker in Figure 10E is approximately at (29.6-j3.5) Ω (0.134 exp(+j206°)) at -17.5 dB and 28 GHz. The port 2 marker in Figure 10E is approximately at (21.7-j0.7) Ω (0.267 exp(+j183°)) at -11.5 dB and 28 GHz.

[0124] Simulated measurements show that the laminar pusher 1010 does not affect the two perpendicular polarizations differently; for example, the field parallel to the slats (first polarization or port 1 feed) is not disturbed by the laminar pusher as much as the field perpendicular to the slats.

[0125] Structural design simulation according to Figure 11 FIG. 11A shows two views of the same 3D simulated test setup 1100, including a pusher 1110 and a DUT 1150 with an antenna. The first view focuses on the test setup 1100, and the second view focuses on the slats 1140 of the pusher 1110. The pusher 1110 is a layered pusher 1110, with a low-dielectric-constant structured spacer layer 1130 made of a material with a dielectric constant of 1.3 combined with a structure of alternating layers 1120 or slats 1140 separated by air gaps. In this simulation model or example, the structure 1120 has 15 dielectric slats 1140, each 100 μm thick, with adjacent slats 1140 separated by a 300 μm air gap. The slats 1140 are made of a material with a dielectric constant of 3.6.

[0126] Although the material of the low-k spacer 1130 or spacer layer 1130 is somewhat soft, the spacer layer 1130 helps distribute the pressure. Therefore, the density of the layers or slats 1140 of the layered pusher 1110 can be reduced (somewhat), which reduces the disturbance of the feed reflection coefficient. This can be seen by comparing the simulated and measured results of Figures 10 and 11.

[0127] Figure 11B shows the results of a simulated input reflection coefficient measurement performed on the 3D simulation test setup 1100 of Figure 11A, where pusher 1110 is a layered pusher of 15 slats 1140 with a structured spacer layer 1130. The structured spacer layer 1130 and slats 1140 are made of materials with relative dielectric constants of 1.3 and 3.6, respectively. The results of the simulated reflection coefficient measurement are shown in diagram 1163 and Smith chart 1166.

[0128] The laminar pusher 1110 affects the two perpendicular polarizations differently, for example, the field parallel to the slats 1140 (first polarization or port 1 feed) is less impeded by the laminar pusher 1110 than the field perpendicular to the slats 1140.

[0129] The port 1 marker in Figure 11B is approximately at (31.1-j4.0) Ω (0.110 exp(+j215.6°)) at -19.2 dB and 28 GHz. The port 2 marker in Figure 11B is approximately at (23.7-j2.5) Ω (0.231 exp(+j192.6°)) at -12.7 dB and 28 GHz.

[0130] Structural design simulation according to Figure 12 FIG. 12A shows a simulation test setup 1200 similar to the simulation test setup 1100 of FIG. 11, except that the pusher 1210 includes an additional dielectric slab 1260. Specifically, the simulation test setup 1200 includes the pusher 1210 and a DUT 1250 with an antenna. The pusher 1210 is a layered pusher 1210, which includes a low-dielectric-constant structured spacer layer 1230 made of a material with a dielectric constant of 1.3, a structure of alternating layers 1220, and a dielectric slab 1260 attached to the structure of alternating layers 1220. In this simulation model or example, the structure 1220 includes 15 dielectric slats, each 100 μm thick, with adjacent slats separated by a 300 μm air gap. The slats 1140 are made of a material with a dielectric constant of 3.6. A dielectric slab 1260 or plate 1260 approximately half wavelength thick (eg, 2.82 mm for a relative dielectric constant of 3.6) is added to provide a mechanically realistic and stable pusher structure.

[0131] Figure 12B shows the results of simulated input reflection coefficient measurements performed on the 3D simulation test setup of Figure 12A, where pusher 1210 is a 15-slat layered pusher with structured spacer layer 1230. Structured spacer layer 1230, slats, and dielectric slab 1260 are made of materials with relative dielectric constants of 1.3, 3.6, and 3.6, respectively. The results of the simulated reflection coefficient measurements are shown in diagram 1273 and Smith chart 1276.

[0132] The port 1 marker in Figure 12B is approximately at (36.9-j5.5) Ω (0.074 exp(+j267.5°)) at -22.6 dB and 28 GHz. The port 2 marker in Figure 12B is approximately at (26.7-j4.6) Ω (0.183 exp(+j207.4°)) at -14.7 dB and 28 GHz.

[0133] The radiation patterns in two typical vertical sections for one selected polarization of a dual polarized antenna are shown in Figures 1283 and 1286.

[0134] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.79dBi, Main lobe direction 3.0 deg. Angle width (3dB): 61.6deg., Sidelobe level: -13.7dB.

[0135] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.74dBi, Main lobe direction: 0.0 deg. Angle width (3dB): 50.9deg., Sidelobe level: -11.8dB.

[0136] Figure 13 shows a comparison table 1300 of the change in feed reflection coefficient. That is, the feed reflection coefficient at 28 GHz and the change in feed reflection coefficient are shown in the table for different cases described in the "Description" column. Comments related to the cases indicated by letters in the last column of the table are listed below.

[0137] A The slight differences between the simulations of the "antenna only" structure (i.e., the structure without the pusher) are due to differences in the size of the "air volume" in the computational domain and differences in the mesh.

[0138] B Relative permittivity ε rel Measurements using a pusher made of a homogeneous foam dielectric with .DELTA.=1.2 indicate that such a change in feed reflection is acceptable, but it is unclear to what extent a (somewhat) larger change would be acceptable.

[0139] C relative permittivity ε relIf a material with a .DELTA.=3.6 (e.g., PEEK) is used for the homogeneous pusher, the interference with the antenna is completely unacceptable.

[0140] D This is an example showing that antenna interference can be significantly reduced using a layered sheet pusher if the respective orientations of the electric field and pusher layer are appropriate. The orthogonal polarization (feeding the other port of the patch antenna) is |Γ 9,port2 This results in a change in the reflection coefficient of |-Γ| = 0.318, much larger than the 0.224 reported for the "correct" polarization. This difference increases with the dielectric constant of the layer, e.g., in case #13, ε rel = 3.6, resulting in a change of 0.310 vs. 0.170 depending on the layer and field orientation.

[0141] E The thin structured spacer layer is made of polystyrene foam (ε rel =1.3), which is soft but sufficiently rigid with a small thickness (0.3 mm). This spacer layer is specially processed according to the layout of the antenna (array) aperture.

[0142] Comparing F case #9 with case #11, it is clear that the introduction of a thin structured spacer layer results in a (very) small change in the feed reflection coefficient.

[0143] G thin structured spacer layer (ε rel =1.3) and layered sheet pusher (made of PEEK, ε rel = 3.6), the change in the feed reflection coefficient is sufficiently small. It can be further reduced by design features such as increasing the period of the layered sheets, reducing the percentage of dielectric in the layered sheet components, or adding half-wave plates. Note that the performance of such structures only holds for single linearly polarized antennas and arrays.

[0144] Regarding the radiation pattern, the dielectric pusher induces a focusing effect, i.e., a highly directional and narrow beam perpendicular to the antenna surface. As long as this effect is small, it does not have a significant negative impact on the test application. With the exception of exemplary case No. 3, i.e., a completely homogeneous PEEK pusher, all other pushers induce only small pattern changes.

[0145] In conclusion, the proposed concept allows the realization of an "electromagnetically transparent" pusher made primarily of high permittivity materials for single-polarized antennas.

[0146] Implementation Choices Although some aspects have been described in the context of an apparatus, it will be apparent that these aspects also represent a description of a corresponding method, where a block or apparatus corresponds to a method step or feature of a method step. Similarly, aspects described in the context of a method step also represent a description of a corresponding block or item or feature of a corresponding apparatus. Some or all of the method steps may be performed by (or using) a hardware apparatus. In some embodiments, one or more of the most important method steps may be performed by such an apparatus.

[0147] The above-described embodiments are merely illustrative of the principles of the present invention. It is understood that modifications and variations of the arrangements and details described herein will be apparent to those skilled in the art. It is therefore intended to be limited only by the scope of the following claims, and not by the specific details presented in the description and explanation of the embodiments herein.

Claims

1. 1. A pusher for use in automatic test equipment to mechanically push a device under test into a device under test socket, comprising: the pusher has a structure in which there are alternating layers of high dielectric constant and low dielectric constant layers; the layer extends in a first direction that is within ±45° of the indentation direction; Pusher.

2. the ratio of the thickness of the high dielectric constant layer to the thickness of the low dielectric constant layer is 1:10 to 2:1; The pusher of claim 1 .

3. The alternating layers include regions of high dielectric constant of 9 vol. % to 66.6 vol. % or 20 vol. % to 66.6 vol. % and regions of low dielectric constant of 33.3 vol. % to 91 vol. % or 40 vol. % to 80 vol. %; A pusher according to claim 1 or 2.

4. a surface of the pusher configured to contact the device under test that is shaped to prevent the pusher from contacting or approaching within one-tenth of a wavelength of an electromagnetic wave transmitted or received by the antenna of the device under test with a conductive edge of the antenna of the device under test; A pusher according to any one of claims 1 to 3.

5. the pusher includes a spacer configured to be between the alternating parallel layers and the device under test; the spacers are perpendicular to the alternating layers within a tolerance of ±15°, and / or the spacers are parallel to the surface of the device under test that is pushed by the pusher within a tolerance of ±15°; A pusher according to any one of claims 1 to 3.

6. the spacer is configured to contact the device under test such that the spacer avoids contacting or approaching within a distance of 1 / 10 of the wavelength of electromagnetic waves transmitted or received by the antenna of the device under test with a conductive edge of the antenna of the device under test; The pusher of claim 5 .

7. the spacer has a relative dielectric constant of 1.5 or less; 7. A pusher according to claim 5 or 6.

8. The spacer has a thickness of 50 μm to 500 μm. A pusher according to any one of claims 5 to 7.

9. The spacer has a thickness of 100 μm to 200 μm.

9. The pusher of claim 8.

10. the pusher comprises a dielectric slab oriented laterally or perpendicularly to the pushing direction within a tolerance of ±15°; the dielectric slab is configured to provide mechanical support for the high dielectric constant layer; A pusher according to any one of claims 1 to 9.

11. the dielectric slab has a thickness equal to an integer multiple of half wavelengths of the electromagnetic waves in the dielectric material of the dielectric slab transmitted or received by the antenna of the device under test, within a tolerance of one-tenth of the wavelength of the electromagnetic waves transmitted or received by the antenna of the device under test; the distance between the dielectric slab and the surface of the antenna of the device under test is at least one wavelength of the electromagnetic wave transmitted or received by the antenna of the device under test; The pusher of claim 10.

12. a length of the alternating parallel layers in the pushing direction is 0.5 to 2 times the free space wavelength of an electromagnetic wave transmitted or received by an antenna of the device under test; A pusher according to claim 10 or 11.

13. the high dielectric constant layer has a relative dielectric constant greater than 2; A pusher according to any one of claims 1 to 12.

14. The high dielectric constant layer is made of polymer or polycarbonate or quartz or Teflon or PEEK material. A pusher according to any one of claims 1 to 13.

15. The low dielectric constant layer has a relative dielectric constant of 1.5 or less. A pusher according to any one of claims 1 to 14.

16. The low dielectric constant layer is composed of air. A pusher according to any one of claims 1 to 15.

17. the pushing direction is perpendicular to the far-field direction of the electric field of the main lobe of the antenna of the device under test within a tolerance of ±15°; or the indentation direction is perpendicular to the major surface of the device under test within a tolerance of ±15°; or The pushing direction is perpendicular to the main surface of the device under test socket within a tolerance of ±15°. A pusher according to any one of claims 1 to 16.

18. A test mechanism for testing a device under test, comprising: a device under test having an antenna that is pushed into a device under test socket by a pusher according to any one of claims 1 to 17 in order to test the device under test; Testing organization.

19. The pusher is a pusher according to claim 10, the dielectric slab of the pusher has a thickness equal to an integer multiple of half wavelengths of the electromagnetic waves in the dielectric material of the dielectric slab transmitted or received by the antenna of the device under test, within a tolerance of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna of the device under test; a distance between the dielectric slab of the pusher and a surface of the antenna of the device under test that is at least one wavelength of the electromagnetic wave transmitted or received by the antenna of the device under test; 20. The testing mechanism of claim 18.

20. a length of the alternating parallel layers of the pusher in the pushing direction is 0.5 to 2 times the free space wavelength of an electromagnetic wave transmitted or received by the antenna of the device under test; 20. A testing arrangement according to claim 18 or 19.

21. 1. A method for mechanically pressing a device under test into a device under test socket on an automatic test equipment, comprising: the method includes mechanically pushing the device under test into the device under test socket with a pusher; the pusher has a structure in which there are alternating layers of high dielectric constant and low dielectric constant layers; the layer extends in a first direction that is within ±45° of the indentation direction; method.

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