Pusher for use in automatic test equipment, test mechanism including pusher, and method for mechanically pushing a device under test having an antenna into a device under test socket

Abstract

An embodiment of the present invention includes a pusher for use in automatic test equipment (ATE) to mechanically push a device under test (DUT) having an antenna or antenna array into a DUT socket. The pusher has a dielectric region of a relatively high dielectric constant and a dielectric region of a relatively low dielectric constant. The dielectric regions of the relatively high dielectric constant and the relatively low dielectric constant form a structure of primarily parallel dielectric pillars, e.g., rods or pillars, of high dielectric constant, with a dielectric region of low dielectric constant between the pillars. Alternatively, the dielectric regions of the relatively high dielectric constant and the relatively low dielectric constant form a structure of a dielectric block of high dielectric constant with primarily parallel filled or unfilled dielectric holes of low dielectric constant. The high dielectric constant dielectric pillars or holes extend in a first direction within ±45° of the pushing direction.

Description

[Technical Field]

[0001] Embodiments of the present invention relate to a pusher configured to push a device under test (DUT) into a device under test socket. Further embodiments relate to a test mechanism including a device under test that is pushed into a device under test socket (DUT socket) by a pusher. Further embodiments of the present invention relate to concepts and / or designs of highly transparent pushers for planar antenna modules. Embodiments of the present invention relate to highly transparent pushers for wireless test sockets. [Background technology]

[0002] Background of the Invention Millimeter-wave transceiver modules often include electronics and planar antennas mounted in small form-factor devices. The size of the module is often determined by the antenna aperture area or antenna array aperture area. It is usually preferable (and sometimes required) for such modules to be tested over-the-air (OTA) with automated test equipment (ATE) in a production environment. Handling and / or testing of the module may require mechanically pushing the module into a DUT socket using a pushing mechanism or pusher on the side of the antenna or antenna array aperture.

[0003] The device under test (DUT) antenna or antenna array is designed to have air and / or a (very) thin layer of dielectric material above it so that it does not obstruct the DUT antenna or antenna array. To test the DUT with an ATE or for ATE testing, these conditions are partly mimicked or simulated by a pusher. The pusher may be part of the OTA socket or part of the handler arm of the ATE or ATE test cell, but it can be a critical component in OTA testing because it contacts the antenna or antenna array of or within the DUT when pushing the DUT into the DUT socket.

[0004] The key issue in designing a pusher for an OTA test socket is the pusher material. The pusher material preferably has a (very) low dielectric constant close to that of air. More broadly, the pusher material's electrical properties should be close to those of air. The pusher material also preferably has the mechanical strength to withstand multiple cycles of mechanical stress when pushing the DUT into the DUT socket. In other words, the pusher must be mechanically robust while also being electromagnetically transparent or nearly transparent so as not to interfere with the DUT's antenna(s). Unfortunately, for physical reasons, no material possesses both of these properties.

[0005] Dielectric materials with (very) low relative permittivity are known to meet the need for electromagnetic transparency, but at the same time, these materials are mechanically soft. Conversely, mechanically stiff pushers made of high permittivity materials can cause mistuning of the antenna feed impedance or alter the antenna radiation pattern.

[0006] Thus, there is a need for a pusher that has optimal performance not only in terms of mechanical stiffness but also in terms of electromagnetic transparency. Summary of the Invention

[0007] An embodiment of the present invention includes a pusher for use in automatic test equipment (ATE) for mechanically pushing a device under test (DUT) having an antenna or antenna array into a DUT socket. The pusher has a dielectric region of relatively high dielectric constant and a dielectric region of relatively low dielectric constant. The relatively high dielectric constant and relatively low dielectric constant dielectric regions form a structure of primarily parallel dielectric pillars (e.g., rods or pillars) of high dielectric constant with a dielectric region of low dielectric constant between the pillars. Alternatively, the relatively high dielectric constant and relatively low dielectric constant dielectric regions form a structure of a high dielectric constant dielectric block with primarily parallel filled or unfilled dielectric holes of low dielectric constant. The high dielectric constant dielectric pillars or low dielectric constant dielectric holes extend in a first direction within ±45° of the pushing direction.

[0008] To address the challenge of having a mechanically stiff yet electromagnetically transparent or nearly transparent pusher, embodiments of the pusher or pusher structure have a hybrid design comprised of or blended with mechanically soft materials having low dielectric constants and mechanically strong materials having high dielectric constants, and this hybrid design pusher is applicable to pushing DUTs with single and dual polarized antennas.

[0009] In other words, the design of the pusher and the dimensions of the high-permittivity and / or low-permittivity dielectric regions of the pusher may be important or critical to the pusher to avoid affecting (or undue affecting) the electromagnetic waves received or transmitted by the DUT antenna or DUT antenna array, with the high-permittivity dielectric regions improving the mechanical stiffness of the pusher and the low-permittivity dielectric regions improving the electromagnetic transparency of the pusher.

[0010] In addition, the high dielectric constant dielectric pillars or high dielectric constant dielectric material surrounding the low dielectric constant dielectric holes extend in a direction parallel to the pushing direction within ±45°, which also improves the stability, durability, and mechanical rigidity of the pusher.

[0011] In a preferred embodiment, the high dielectric constant dielectric pillars or low dielectric constant dielectric holes are circular, square, triangular or cross-shaped.

[0012] The shape of the high-permittivity dielectric pillars or low-permittivity dielectric holes can be selected from a basic set of geometric shapes to satisfy a variety of potential goals, such as maximizing the electromagnetic transparency or mechanical stiffness of the pusher, maintaining a constant ratio of high-permittivity to low-permittivity dielectric material, achieving a pusher structure that matches the profile of the DUT, or improving the mechanical stability of the pusher.

[0013] In a preferred embodiment, the structure includes 5 to 50, preferably 10 to 30, high-permittivity dielectric pillars or low-permittivity dielectric holes per free-space wavelength of the electromagnetic wave transmitted or received by the DUT's antenna or antenna array, e.g., at the center frequency of the operating frequency band of the device under test.

[0014] The primary requirements for a pusher are mechanical rigidity and electromagnetic transparency. The number of high-permittivity dielectric pillars or low-permittivity dielectric holes is selected so that the pusher remains transparent or nearly transparent to the electromagnetic waves transmitted or received by the DUT's antenna or antenna array, while maintaining mechanical rigidity for use in pushing the DUT into the DUT socket. Experiments conducted to date have shown that 5 to 50 high-permittivity dielectric pillars or low-permittivity dielectric holes per free-space wavelength, preferably 10 to 30, meet this requirement.

[0015] The minimum number of posts (e.g., 5 or preferably 10) is one at which the pusher remains mechanically stable and rigid, and the maximum number of posts (e.g., 50 or preferably 30) is one at which the pusher remains electromagnetically transparent or nearly transparent, at least to the electromagnetic waves transmitted or received by the DUT's antenna or antenna array.

[0016] The maximum number of holes (e.g., 50 or preferably 30) is one at which the pusher remains mechanically stable and rigid, and the minimum number of holes (e.g., 5 or preferably 10) is one at which the pusher remains electromagnetically transparent or nearly transparent, at least to the electromagnetic waves transmitted or received by the DUT's antenna or antenna array.

[0017] In a preferred embodiment, the structure comprises a matrix or regular lattice of high-dielectric-constant dielectric pillars or low-dielectric-constant holes (e.g., a rectangular or triangular lattice of high-dielectric-constant dielectric pillars or low-dielectric-constant holes).

[0018] Instead of locally adapting the structure of every pusher to the radiating slots or edges of the dual-polarized antenna surface of the DUT, a periodic structure of high-permittivity dielectric pillars or low-permittivity dielectric holes may be used, and thus the same pusher may be used for different DUTs or different antennas of the same DUT.

[0019] Pusher structures with a regular lattice of high-permittivity dielectric pillars or low-permittivity dielectric holes are semi-isotropic in the xy plane, since they operate with both orthogonal polarizations. Possible xy-plane covering structures (or options) include, for example: i) a square lattice with air-filled cylinders of square cross-section; ii) a triangular lattice with air-filled cylinders of circular cross-section; and iii) a triangular lattice with air-filled cylinders of triangular cross-section.

[0020] According to an embodiment, the structure, e.g., the region of high dielectric constant and the region of low dielectric constant including the pillar or hole, comprises 9 to 66.6 vol.%, or 20 to 60 vol.%, of the dielectric region of relatively high dielectric constant, and 33.3 to 91 vol.%, or 40 to 80 vol.%, of the dielectric region of relatively low dielectric constant. Preferably, the structure comprises 30 to 50 vol.%, of the dielectric region of relatively high dielectric constant, and 50 to 70 vol.%, of the dielectric region of relatively low dielectric constant.

[0021] A well-chosen ratio between the relatively high dielectric constant and relatively low dielectric constant dielectric regions results in a pusher that maintains mechanical rigidity for use in pushing a DUT into a DUT socket while remaining transparent or nearly transparent to electromagnetic waves transmitted or received by the DUT's antenna or antenna array.

[0022] In a preferred embodiment, the surface of the pusher configured to contact the device under test is shaped, configured, or machined to avoid the pusher contacting or coming into close proximity (e.g., within 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the DUT's antenna) with the conductive edge of the DUT's antenna, which may be a metal edge of the antenna structure that contributes strongly to radiation.

[0023] Touching or proximity of the pusher to the DUT-antenna adversely affects the performance of the DUT's antenna. Dielectric loading of or proximity to the radiating edge of the DUT antenna affects its resonance. Changing the resonance changes the feed impedance and the antenna's radiation behavior. Furthermore, if the pusher has a dielectric constant that is large compared to the wavelength but not small, it is preferable to avoid any resonance occurring within the pusher itself, which would lead to changes (sometimes disastrous changes) in the radiation and feed characteristics.

[0024] In a preferred embodiment, the pusher has a spacer configured to be between the structure and the DUT, the spacer being perpendicular to the posts or holes within a tolerance of ±15° and / or the spacer being parallel to the surface of the DUT being pushed into by the pusher within a tolerance of ±15°.

[0025] The advantage of the spacer is that it is replaceable, so you don't have to replace the whole pusher in any case, just the spacer, and if the pusher needs to be adapted to a new DUT or is damaged, you can save money and materials by replacing only the spacer.

[0026] In a preferred embodiment, the spacer is a structured spacer, i.e., further formed or configured or machined to contact the device under test such that the spacer avoids contacting or coming into close proximity (e.g., within a distance of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the DUT's antenna) with the conductive edges of the DUT's antenna. The conductive edges may be metal edges of the antenna structure that strongly contribute to radiation.

[0027] The spacers are interchangeable, so each type of antenna design can have its own dedicated spacer that avoids contact with or proximity to the conductive edges of the DUT's antenna or antenna array, meaning the same pusher can be used with different spacers for different DUTs, making the pusher and therefore the ATE more flexible.

[0028] In a preferred embodiment, the spacer has a relative dielectric constant of 1.5 or less.

[0029] The spacer, which is configured to be in intimate contact with the DUT-antenna without contacting or approaching the conductive edge of the antenna, is made of a dielectric material with a low dielectric constant so that it is transparent or nearly transparent to the electromagnetic waves received or transmitted by the antenna of the DUT.

[0030] In a preferred embodiment, the spacer has a thickness of 50 μm to 500 μm.

[0031] The spacer is configured to cover the entire surface area of ​​the DUT's antenna. A thickness of 50 μm to 500 μm helps achieve this, even if the antenna surface area is non-uniform. It also achieves good mechanical stability without excessively reducing the antenna's performance.

[0032] In a preferred embodiment, the spacer has a thickness of 100 μm to 200 μm.

[0033] If the antenna area of ​​the DUT is slightly (or sufficiently) uniform, a thickness of 100 μm to 200 μm may also be sufficient to cover the entire surface area of ​​the antenna of the DUT.

[0034] In a preferred embodiment, the pusher includes a dielectric slab (e.g., a dielectric slab made of a mechanically rigid material having a relatively high dielectric constant) that is oriented laterally or perpendicularly to the pushing direction within a tolerance of ±15°, and that is configured to mechanically support and / or stabilize at least a high dielectric constant dielectric pillar or at least a high dielectric constant dielectric block around a low dielectric constant dielectric hole.

[0035] A mechanically strong dielectric slab is attached to the high-permittivity dielectric pillar or high-permittivity dielectric block, transverse to the pushing direction, which increases the durability, rigidity, and stability of the pusher and prevents independent movement of the single high-permittivity dielectric pillar of the pusher, for example, if the DUT surface is uneven.

[0036] In a preferred embodiment, the dielectric slab has a thickness equal to an integer multiple of half wavelengths of the electromagnetic waves in the dielectric material of the dielectric slab at the center frequency of the operating frequency band of the DUT, e.g., within a tolerance of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna of the DUT. This corresponds to the free-space wavelength divided by the square root of the dielectric constant of the dielectric material transmitted or received by the antenna of the DUT, e.g., at the center frequency of the operating frequency band of the DUT. The distance between the dielectric slab and the antenna surface of the device under test is at least one wavelength of the electromagnetic waves transmitted or received by the antenna of the DUT, e.g., at the center frequency of the operating frequency band of the DUT.

[0037] The dielectric slab is made of a material with high mechanical strength and a relatively high dielectric constant. Preferably, the dielectric slab is as electromagnetically transparent as possible. Therefore, the thickness of the slab and / or the distance between the DUT-antenna and the slab are selected to minimize the adverse effect of the slab on the electromagnetic waves transmitted or received by the DUT's antenna, e.g., to minimize losses in the electromagnetic waves transmitted or received by the DUT's antenna.

[0038] In a preferred embodiment, the length of the high dielectric constant dielectric pillar or low dielectric constant dielectric hole in the pushing direction is 0.5 to 2 times the free space wavelength of the electromagnetic wave transmitted or received by the DUT's antenna, for example, at the center frequency of the DUT's operating frequency band.

[0039] The length of the high-permittivity dielectric pillars or low-permittivity dielectric holes in the pushing direction (e.g., the direction of the main lobe of the electromagnetic waves transmitted or received by the DUT antenna), i.e., the length of the pusher structure, determines the amount of electromagnetic waves absorbed by the pusher. A length-limited pusher, or a length-limited high-permittivity dielectric pillar or low-permittivity dielectric hole, limits the amount of electromagnetic waves absorbed from the electromagnetic waves transmitted or received by the DUT antenna. Therefore, by limiting the length of the alternating parallel layers, the pusher remains as transparent as possible to the electromagnetic waves transmitted or received by the DUT antenna while maintaining mechanical rigidity.

[0040] In one preferred embodiment, the relatively high dielectric constant dielectric region has a relative permittivity greater than 2, preferably between 2.5 and 4.

[0041] Materials with high mechanical strength have a high dielectric constant. Materials used to provide mechanical stability and strength to the pusher have been found to have a dielectric constant of at least 2. A dielectric constant of 2.5 to 4 provides a good balance between mechanical strength and electromagnetic transparency.

[0042] In a preferred embodiment, the relatively high dielectric constant dielectric region is made of a polymer, polycarbonate, quartz, Teflon, or PEEK material.

[0043] In one preferred embodiment, the relatively low dielectric constant dielectric region has a relative dielectric constant of 1.5 or less.

[0044] A relatively low dielectric constant material, having a relative permittivity of 1.5, is transparent or nearly transparent to the electromagnetic waves transmitted or received by the antenna of the DUT.

[0045] In one preferred embodiment, the relatively low dielectric constant dielectric region consists of air.

[0046] Air has a low dielectric constant, so in a simple pusher design, only the dielectric regions with a relatively high dielectric constant are constructed, and the dielectric regions with a relatively low dielectric constant are left as voids, e.g., filled with air. In this case, the air around and / or between the dielectric pillars with a relatively high dielectric constant or in the holes is part of the pusher structure.

[0047] In a preferred embodiment, the shoving direction is parallel to the far-field direction of the electric field of the main lobe of the DUT's antenna within a tolerance of ±15°. Alternatively, the shoving direction is perpendicular to the major surface of the DUT within a tolerance of ±15°. As a further option, the shoving direction is perpendicular to the major surface of the DUT socket within a tolerance of ±15°.

[0048] To improve the transparency of the pusher to the electromagnetic waves transmitted or received by the DUT-antenna, the effective area of ​​the pusher's structure, particularly the effective area of ​​the pusher's high-permittivity dielectric region, is minimized. The effective area of ​​the structure is smallest when the structure is oriented parallel to the main lobe of the received or transmitted electromagnetic waves, and in most cases is also perpendicular to the major surface of the DUT or DUT socket within a tolerance of ±15°.

[0049] A further embodiment comprises a test mechanism for testing a device under test, the test mechanism comprising a device under test having an antenna or an antenna array, the pusher described above, and a device under test socket, the device under test having an antenna or an antenna array of the test mechanism being configured to be pushed into the device under test socket by the pusher described above.

[0050] Another embodiment of the present invention creates a method for mechanically pushing a device under test having an antenna or antenna array into a device under test socket of an automatic test equipment, the method comprising mechanically pushing the device under test into the device under test socket using the pusher described above.

[0051] It should be noted that the method and the corresponding device are based on the same considerations. Furthermore, the method may be supplemented by any of the features or functions and details described herein with respect to the device, individually or in combination. [Brief explanation of the drawings]

[0052] Next, an embodiment of the present invention will be described with reference to the accompanying drawings. [Figure 1] FIG. 1 is a schematic diagram of one embodiment of a test setup including a DUT socket, a DUT with an antenna, and one embodiment of a pusher. [Figure 2] FIG. 2 is a schematic diagram illustrating one embodiment of a pusher configured to repeatedly push a DUT into a DUT socket. [Figure 3] FIG. 3 shows a photograph of one embodiment of a test setup with a pusher and DUT socket without a DUT, along with a test antenna. [Figure 4] FIG. 4 is a relative dielectric constant-strength diagram in which the horizontal axis represents the value of the relative dielectric constant and the vertical axis represents the value of the bending strength. [Figure 5]Figure 5(A) shows an initial DUT patch antenna without a pusher. Figure 5(B) shows a DUT patch antenna with a conventional pusher. Figure 5(C) shows a DUT patch antenna with a high-permittivity dielectric slab. Figure 5(D) shows a DUT patch antenna with a pusher structure, where regions of relatively high-permittivity dielectric material are separated by air or a low-permittivity dielectric material. Figure 5(E) shows a DUT patch antenna with a low-permittivity dielectric spacer. [Figure 6A] FIG. 6A shows a 3D simulation of a DUT with a dual-polarized patch antenna. [Figure 6B] FIG. 6B shows the results of the simulated input reflection coefficient measurements in a diagram and a Smith chart. [Figure 7A] FIG. 7A shows a 3D simulation of a setup with a patch antenna and a conventional pusher. [Figure 7B] Figure 7B shows the results of simulated input reflection coefficient measurements in a diagram and Smith chart for the case where the pusher relative permittivity is 1.0, and shows radiation pattern simulations at two typical vertical cut planes for one selected polarization. [Figure 7C] Figure 7C shows the results of simulated input reflection coefficient measurements in a diagram and Smith chart for a pusher with a relative dielectric constant of 1.2, and radiation pattern simulations at two typical vertical cut planes for one selected polarization. [Figure 7D] Figure 7D shows the results of simulated input reflection coefficient measurements in a diagram and Smith chart for a pusher dielectric constant of 3.6, and radiation pattern simulations at two typical vertical cut planes for one selected polarization. [Figure 8A] FIG. 8A shows a 3D simulation of the setup with the patch antenna and spacer layer. [Figure 8B] FIG. 8B shows the results of simulated input reflection coefficient measurements in a diagram and Smith chart for the case where the relative dielectric constant of the spacer is 1.3. [Figure 9] FIG. 9 shows a table comparing the properties of three different possible configurations of the pusher. [Figure 10A] FIG. 10A shows the four simulated pusher structures that were measured. [Figure 10B] FIG. 10B shows the results of simulated input reflection coefficient measurements on a diagram and a Smith chart and radiation pattern simulations at two typical vertical cut planes for one selected polarization when the pusher has a spacer, the first structure of FIG. 10A (44% square lattice) and a λ / 2 slab with εrel=1.3 / 3.6 / 3.6. [Figure 10C] FIG. 10C shows the results of simulated input reflection coefficient measurements on a diagram and a Smith chart and radiation pattern simulations at two typical vertical cut planes for one selected polarization when the pusher has a spacer, the second structure of FIG. 10A (44% triangular hole lattice) and a λ / 2 slab with εrel=1.3 / 3.6 / 3.6. [Figure 10D] FIG. 10D shows the results of simulated input reflection coefficient measurements on a diagram and a Smith chart and radiation pattern simulations at two typical vertical cut planes for one selected polarization when the pusher has a spacer, the first structure of FIG. 10A (36% square lattice) and a λ / 2 slab with εrel=1.3 / 3.6 / 3.6. [Figure 10E] FIG. 10E shows the results of simulated input reflection coefficient measurements on a diagram and a Smith chart and radiation pattern simulations at two typical vertical cut planes for one selected polarization when the pusher has a spacer, the fourth structure of FIG. 10A (36% triangular hole lattice) and a λ / 2 slab with εrel=1.3 / 3.6 / 3.6. [Figure 11] Figure 11 is a comparison table of the changes in the feed reflection coefficient. DETAILED DESCRIPTION OF THE INVENTION

[0053] Detailed Description of the Embodiments In the following, different inventive embodiments and aspects are described. Further embodiments are defined by the appended claims. It should be noted that any embodiment defined by a claim may be optionally supplemented by any of the details, features and functionality described herein. Also, the embodiments described herein may be used individually or may be optionally supplemented by any of the details, features and functionality included in the claims.

[0054] It should also be noted that the individual aspects described herein may be used individually or in combination. Thus, details can be added to each of the individual aspects without adding details to another one of the aspects. It should also be noted that the present disclosure explicitly or implicitly describes features that can be used in automated test equipment, in a test mechanism, or in a pusher. Thus, any of the features described herein may be used in the context of automated test equipment, in the context of a test mechanism, or in the context of a pusher.

[0055] Furthermore, features and functionality disclosed herein with respect to a method can also be used in an apparatus configured to perform such functionality. Furthermore, features and functionality disclosed herein with respect to an apparatus can also be used in the corresponding method. In other words, the method disclosed herein may be supplemented by any of the features and functionality described with respect to the apparatus.

[0056] The present invention will be more fully understood from the following detailed description and the accompanying drawings of embodiments of the invention, which should not be taken to limit the invention to the particular embodiments described, but are for purposes of illustration and understanding only.

[0057] Embodiment according to FIG. 1 1 shows a schematic diagram of an embodiment of a test setup 100 for testing a device under test (DUT) 110 having one or more antennas 120 and / or antenna arrays 120. The test setup 100 includes a DUT socket 130, a DUT 110 having an antenna 120, and an embodiment of a pusher 140.

[0058] The test mechanism 100 is configured to test the DUT 110, and in particular the antenna 120 of the DUT 110. The DUT 110 is configured to be pushed into the device under test socket 130 in a pushing direction 170 by a pusher 140.

[0059] The pusher 140 is a schematic diagram of an embodiment having a structure 150 including a dielectric region 160a of a relatively high dielectric constant and a dielectric region 160b of a relatively low dielectric constant, where "relatively" means that the dielectric constant of a given dielectric region is relatively high or low relative to other dielectric regions of the pusher 140. The structure 150 may include parallel high-dielectric-constant dielectric pillars 160a (e.g., rods or pillars) or low-dielectric-constant dielectric regions 160b between the pillars 160a. Alternatively, the structure may include a high-dielectric-constant dielectric block 160a and primarily parallel holes 160b of a low-dielectric-constant dielectric, filled or unfilled, within the high-dielectric-constant block 160a. In either case, the high-dielectric-constant pillars 160a or low-dielectric-constant holes 160b extend in a direction within ±45° of the pushing direction 170.

[0060] The pusher 140 is configured to mechanically press a device under test 110 including an antenna 120 or antenna array 120 into a device under test socket 130 of automatic test equipment. The structure 150 of the pusher 140, which includes a dielectric region 160a with a relatively high dielectric constant and a dielectric region 160b with a relatively low dielectric constant, significantly improves the transparency of the pusher 140 to electromagnetic waves transmitted or received by the antenna 120 of the DUT 110 compared to conventional pushers, while maintaining sufficient mechanical rigidity to repeatedly press the DUT 110 into the DUT socket 130 in a production environment.

[0061] The structure 150 includes a dielectric region 160a with a high dielectric constant of 9 vol.% to 66.6 vol.%, or 20 to 60 vol.%, and a dielectric region 160b with a low dielectric constant of 33.3 vol.% to 91 vol.%, or 40 to 80 vol.%. Preferably, the structure includes a dielectric region 160a with a high dielectric constant of 30 to 50 vol.%, and a dielectric region 160b with a low dielectric constant of 50 to 70 vol.%. For example, the high dielectric constant dielectric regions 160a are pillars or rods, with low dielectric constant dielectric regions 160b between the pillars. The high dielectric constant dielectric pillars 160a extend within a range of ±45° from the indentation direction 170.

[0062] The high-permittivity dielectric region 160a is made of, for example, a polymer, polycarbonate, quartz, Teflon, or PEEK material, and has a relative permittivity of greater than 2, preferably 2.5 to 4. The low-permittivity dielectric region 160b has a relative permittivity of, for example, 1.5 or less. As shown in FIG. 2, the low-permittivity dielectric region may be composed of air.

[0063] Embodiment according to FIG. 2 Figure 2 shows a schematic diagram of an embodiment of a pusher 240 similar to pusher 140 of Figure 1, along with an antenna 220 of a DUT. The pusher has a spacer 290, a structure 250 of high-permittivity dielectric regions 260a and low-permittivity dielectric regions 260b, and a dielectric slab 280.

[0064] The pusher 240 is configured to repeatedly push a DUT 220, similar to the DUT 110 of Figure 1, into the DUT socket. The DUT includes at least an antenna 220 or antenna array that transmits or receives electromagnetic waves 210.

[0065] The pusher spacer 290 is attached to the pusher structure 250 and configured to be between the structure 250 and the DUT or the DUT's antenna 220. The spacer is perpendicular to the high-permittivity pillars 260a or low-permittivity holes 260b of the pusher 240 within a ±15° tolerance. The spacer is made of a mechanically soft, low-permittivity dielectric material with a relative permittivity of less than 1.5. The spacer is configured or fabricated to avoid contact with or proximity to the conductive edge of the DUT's antenna within the vicinity or one-tenth of a wavelength of the electromagnetic waves transmitted or received by the antenna 220. The conductive edge may be a metal edge of the antenna structure that strongly contributes to radiation.

[0066] The dielectric slab 280 is attached to the high permittivity dielectric pillar 260 a and is oriented laterally or perpendicularly to the indentation direction 270 within a tolerance of ±15°.

[0067] The dielectric slab 280 of the pusher 240 is configured to mechanically support at least the high-dielectric-constant dielectric posts 260a of the structure 250. To remain transparent or nearly transparent to the electromagnetic waves 210 transmitted or received by the antenna 220, the dielectric slab 280 has a thickness equal to an integer multiple of half the wavelength of the electromagnetic waves 210 in the dielectric material of the dielectric slab 280, which corresponds to the free-space wavelength divided by the square root of the dielectric constant of the dielectric. The thickness tolerance is 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna 220 (e.g., the center frequency of the operating frequency band of the DUT).

[0068] The pusher structure 250 is similar to the pusher structure 150 of FIG. 1, and the length of the high-dielectric-constant dielectric pillar 260a or the low-dielectric-constant dielectric hole 260b in the pushing direction is 0.5 to 2 times the free-space wavelength of the electromagnetic wave transmitted or received by the DUT antenna 220.

[0069] The pusher 240 can also be used in a test mechanism similar to the test mechanism 100 of Figure 1. A photograph of the test mechanism with the pusher is shown in Figure 3.

[0070] Embodiment according to FIG. 3 Figure 3 is a photograph of an embodiment of a test mechanism 300 similar to test mechanism 100 of Figure 1. Test mechanism 300 includes a pusher 340, similar to pusher 140 of Figure 1 or pusher 240 of Figure 2, and a DUT socket 330. While the DUT of test mechanism 300 is not shown, Figure 3 also shows an automatic test equipment (ATE) test antenna 350 configured to perform over-the-air (OTA) tests or measurements on the DUT.

[0071] Dielectric constant-strength diagram according to Figure 4 4 shows a dielectric constant-strength diagram 400, where the horizontal axis represents the dielectric constant value and the vertical axis represents the flexural strength value. Various materials are represented on the diagram, including ceramic 450, polymer 452, polymer foam 454, and sandwich 456. Existing pusher (or socket) materials 410, ideal pusher materials 430, and available pusher materials 440 are also marked on the diagram.

[0072] Existing pusher (or socket) materials 410 are shown to have sufficient flexural strength, but their dielectric constants are higher than ideal. A satisfactory dielectric constant would be to the left of line 420, i.e., 1.5 or less. While the location of ideal material 430 is shown in the diagram, no known material meets these requirements. Existing materials with dielectric constants below 1.5 are a type of polymer foam, and their flexural strength is 1 / 100th that of existing or conventional pusher material 410. Available materials 440 with low dielectric constants, shown in the diagram, do not have desirable flexural strength.

[0073] Since an ideal material that meets the characteristics of a low dielectric constant (e.g., lower than 1.5) and a bending strength higher than 30 MPa is not yet known, an improved design concept is needed. The design concept applied to the pusher 240 in Figure 2 is a combination of all the new ideas or design concepts in Figure 5.

[0074] Design concept related to Figure 5 5(A) to 5(E) are schematic diagrams of the design concepts of existing and new pushers.

[0075] Figure 5(A) shows the patch antenna 500 in its initial state, e.g., without a pusher. The patch antenna 500 serves as a characteristic example of a planar antenna. This antenna features two opposing radiating edges 503, 506, which have an electric field 509 that is primarily perpendicular to these edges. The operating frequency and feed impedance are determined by the resonance of the electromagnetic field 509 between the ground and the patch and between the two radiating edges 503, 506.

[0076] 5A shows the initial placement of a single patch antenna 500 without a pusher. The antenna radiates or transmits electromagnetic waves 510 that are preferably unaffected by the pusher in an ideal test setup.

[0077] FIG. 5B illustrates the patch antenna 500 of FIG. 5A with a conventional pusher 520, a conventional design concept that includes a whole or solid block of pusher 520 configured to push the DUT-antenna 500 into the DUT socket. The conventional pusher 520 is made of the same material as the existing pusher material 410 of FIG. 4. In this conventional design, a dielectric load at or near the radiating edge affects the resonance of the DUT-antenna 500. The dielectric pusher 520 alters the resonance of the DUT-antenna 500, thereby changing the feed impedance and radiation behavior of the DUT-antenna 500. If the pusher has a dielectric constant that is large and not low compared to the wavelength, it is preferable to avoid any resonance within the pusher itself, which could ultimately lead to significant or sometimes disastrous changes in the radiation and feed characteristics.

[0078] In order to have a pusher that avoids changing the resonance of the DUT-antenna 500 and thereby changing the feed impedance and radiation behavior, three dielectric structural features of the pusher and their specific electromagnetic characteristics are introduced in the following three Figures 5(C)-(E).

[0079] 5(C) shows a dielectric slab 580 of a strong, mechanically strong, high permittivity dielectric material positioned parallel to the antenna aperture of DUT-antenna 500. The thickness of slab 580 is equal to an integer multiple of half wavelengths of the electromagnetic waves in the dielectric material of dielectric slab 580, within a tolerance of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by DUT-antenna 500.

[0080] The distance between the DUT-antenna 500 and the dielectric slab 580 is at least one wavelength of the electromagnetic wave transmitted or received by the DUT-antenna 500. The rigid, mechanically strong, high-permittivity dielectric material required for mechanical stability is not intended to contact the metal or conductive edges of the radiating slot or antenna aperture, as this would lead to detuning of the feed impedance. The conductive edges may be metal edges of the antenna structure that strongly contribute to the radiation.

[0081] 5(D) shows a patch antenna 500 having a pusher structure 550 in which regions of high-permittivity dielectric material 560a are separated by regions of air or low-permittivity dielectric material 560b. This structure 550 exhibits a high effective permittivity for electric fields perpendicular to the extension of the high-permittivity dielectric pillars 560a, compared to a low effective permittivity for electric fields parallel to the extension of the high-permittivity dielectric pillars 560a.

[0082] If the direction of the electric field is known, a properly oriented structure 550 of high permittivity dielectric material pillars 560a can have little effect on the performance of the DUT-antenna 500. This applies, for example, to the electric field configuration shown in antenna 500.

[0083] 5(E) shows a DUT patch antenna 500 having a low dielectric constant dielectric spacer 590. The DUT with the patch antenna 500 is configured to be pressed into a DUT socket by the spacer 590 or spacer layer 590.

[0084] The surface of a planar antenna includes, for example, a dielectric surface area, a metal edge, and a metal surface area. In terms of contacting the surface with a dielectric pusher, the metal surface is rather unimportant, since the most sensitive areas are the metal edges and the nearby dielectric areas, which may form radiating edges or slots.

[0085] A structured dielectric spacer or spacer layer or sheet provides mechanical contact between the planar antenna surface and the pusher only at the metallic and non-critical dielectric portions of the antenna surface. Preferably, the radiating edges or slots are spaced away from direct contact and a small air spacer volume is provided above these edges or slots.

[0086] While the conceptual ideas of Figures 5(C) and 5(E) are somewhat obvious and easily implemented, the idea of ​​Figure 5(D) further quantifies the trade-off between effort and benefit. The design concepts of Figures 5(A)-(E) are simulated in the following figures:

[0087] Antenna simulation according to Figure 6 Figure 6A shows a 3D simulation of a DUT using a dual-polarized patch antenna, which is an example of patch antenna 500 from Figure 5. The example antenna 600 from Figure 6 is used to quantify performance in simulations using electromagnetic simulation software. The example antenna 600 is a dual-linearly polarized microstrip patch antenna. Its operation and issues are common to all patch and slot antennas, making it representative of the majority of planar antennas.

[0088] The simulation used a center frequency of operation of 28 GHz. The two feed lines are terminated at the ports with a characteristic line impedance of approximately 35 ohms.

[0089] 6B shows the results of a simulated input reflection coefficient measurement in a frequency-reflection diagram 630 and a Smith chart 660. The chart shows the input reflection coefficient. The marker corresponds to approximately (40.9+j1.0) Ω at 28 GHz.

[0090] Simulation of a conventional pusher according to FIG. FIG. 7A shows a 3D simulation of an arrangement comprising a DUT patch antenna 710 similar to patch antenna 600 of FIG. 6 and a conventional solid dielectric pusher 720 configured to mechanically press the main surface of the DUT or DUT-antenna into the DUT-socket, as also shown in the design concept of FIG. 5(B).

[0091] Figures 7B-D show the results of simulated input reflection coefficient measurements performed on the setup of Figure 7A using different pushers (e.g., pushers with different dielectric constants). A center frequency of operation of 28 GHz was used in the simulation. The two feed lines were terminated at the ports with a characteristic line impedance of approximately 35 ohms.

[0092] FIG. 7B shows the results of a simulated input reflection coefficient measurement performed in the first case of FIG. 7A, where the pusher is made of a material with a dielectric constant of 1.0, such as air or vacuum. This is equivalent to having no pusher present. Note that for accurate comparison, the size of the calculation domain in FIG. 7B is equal to or equal within all simulations that include the pusher, so the results shown in FIG. 6B (e.g., for an antenna of an aerial device under test) are slightly different. That is, to make the measurements in FIGS. 7B-D comparable, the calculation domain includes the pusher, whereas the results shown in FIG. 6B do not.

[0093] 7B shows the results of a simulated input reflection coefficient measurement where pusher 720 is made of a material with a dielectric constant of 1, which is equivalent to having no pusher. Because this simulation takes into account the dimensions of the pusher, the simulated measurement results differ slightly from the simulated measurement results shown in diagram 630 and Smith chart 660 of FIG. 6.

[0094] The results of the simulated input reflection coefficient measurement are shown in diagram 732 and Smith chart 734. The marker is located approximately at (42.3+j1.2)Ω (0.0615exp(+j13.7°)) at -24.2 dB and 28 GHz.

[0095] The radiation patterns in two typical vertical sections for a selected polarization of a dual polarized antenna are shown in Figures 736 and 738.

[0096] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 7.12dBi, Main lobe direction: 3.0 deg. Angle width (3dB): 86.1deg., Sidelobe level: -17.8dB.

[0097] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 7.11dBi, Main lobe direction: 1.0 deg. Angle width (3dB): 78.4deg., Sidelobe level: -17.7dB.

[0098] 7C shows the results of a simulated input reflection coefficient measurement performed on the second case of FIG. 7A, where pusher 720 is made of a material with a relative permittivity of 1.2, such as a foamed dielectric material. As with the first case, the results of the simulated reflection coefficient measurement are shown in diagram 742 and Smith chart 744. The marker is located approximately at (35.4-j8.5) Ω (0.120exp(+j262.6°)) at -18.4 dB and 28 GHz.

[0099] The radiation patterns in two typical vertical sections for a selected polarization of a dual polarized antenna are shown in Figures 746 and 748.

[0100] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 7.42dBi, Main lobe direction: 3.0 deg. Angle width (3dB): 84deg. Sidelobe level: -16.4dB.

[0101] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 7.41dBi, Main lobe direction: 1.0 deg. Angle width (3dB): 77.2deg. Sidelobe level: -16.5dB.

[0102] 7D shows the results for a third case, where the pusher 720 is made of a material with a dielectric constant of 3.6, which may be a Polyetheretherketone (PEEK) material. The results of the simulated reflection coefficient measurement are shown in diagram 752 and Smith chart 754. The marker is located approximately at (16.55-j3.9) Ω (0.394 exp(+j194.6°)) at -8.1 dB and 28 GHz.

[0103] The radiation patterns in two typical vertical sections for one selected polarization of a dual polarized antenna are shown in Figures 756 and 758.

[0104] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 6.8dBi, Main lobe direction: 28.0 deg. Angle width (3dB): 104.4deg., Sidelobe level: -8dB.

[0105] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 6.08dBi, Main lobe direction: 6.0 deg. Angle width (3dB): 81.6deg., Sidelobe level: -10.2dB.

[0106] To summarize the design concepts used by conventional pusher 720, the simulated measurement results of FIG. 7B are compared with the simulated measurement results of FIGS. 7C and 7D.

[0107] Comparing the first and second cases, or the simulated and measured results of Figures 7B and 7C, we see that the feed reflection coefficient changes by 0.153 in the complex plane, the gain increases from 7.1 dBi to 7.4 dBi, and the beamwidth decreases from 86° to 84° (E-plane) and from 78° to 77° (H-plane). These changes, i.e., the pusher effect, are clearly within the acceptable range. However, a material with a relative permittivity of 1.2 does not have sufficient mechanical rigidity.

[0108] Comparing the first and third cases, i.e., the simulated measurement results in Figure 7B and the simulated measurement results in Figure 7D, the feed reflection coefficient shifted by 0.455 in the complex plane, the gain increased from 7.1 dBi to 6.8 dBi, and the beamwidth changed from 86° to 104° (E-plane) and from 78° to 82° (H-plane), respectively. Such changes, i.e., the impact of such a pusher, are too large and, for example, unacceptable.

[0109] The simulated measurement results of the conventional pusher shown in FIG. 7A, as shown in FIGS. 7B-D, indicate that additional design concepts or combinations thereof are required.

[0110] Simulation of the spacer according to FIG. 8 FIG. 8 shows a 3D simulation of a patch antenna 810, similar to patch antenna 600 of FIG. 6, and a spacer 830 configured to press the DUT into the DUT socket. The simulated spacer 830 is a low-dielectric spacer with a relative permittivity of 1.3 and an overall thickness of 300 μm. The spacer is considered to be in contact with the antenna surface. Additionally, the spacer provides an (air-filled) trench or cutout, e.g., 150 μm deep, along the radiating edge or slot, with a trench width of e.g., 300 μm.

[0111] The results of the simulated reflection coefficient measurement are shown in diagram 840 and Smith chart 850. The marker is located approximately at (38.47-j5.8) Ω (0.0077 exp(+j283.5°)) at -22.2 dB and 28 GHz.

[0112] Structural design simulation according to Figure 9 FIG. 9 is a table 900 comparing the properties of three different possible pusher structures. The three pusher structures are structured dielectrics known to be semi-isotropic in the xy plane for operation with both orthogonal polarizations. The three different structural options or design concepts are a) a square lattice 910 with air-filled cylinders of square cross section, b) a triangular lattice 920 with air-filled cylinders of circular cross section, and c) a triangular lattice 930 with air-filled cylinders of triangular cross section. These three options 910, 920, and 930 are compared in table 900 of FIG. 9.

[0113] To provide a fair comparison, in table 900, the air to dielectric volume fractions were chosen to be equal for all three options 910, 920, and 930, and the unit cell volumes were also chosen to be approximately equal for all options 910, 920, and 930. Each design concept option 910, 920, and 930 was tested with two different dielectric volume fractions: 43.75% and 36%.

[0114] In particular, option 910, for example, a square lattice with air-filled cylinders of square cross section, is 400x400 μm 2 It has a square unit cell of 160,000 μm 2 The inner square creates a unit cell area of ​​300x300μm 2 In this case, option 910 has a dielectric volume fraction of 43.75%, or an inner square of 320x320μm 2 In the case of , option 910 has a dielectric volume fraction of 36%. In both cases, the grating is rotated by 45° z, e.g., rotated in the z direction.

[0115] In the first case, for example, for a dielectric volume fraction of 43.75%, values ​​of -13.0 dB and -13.0 dB are measured, resulting in a feed reflection coefficient of Γ = 0.224 e j194° and Γ=0.222e j194° and the changes in feed reflection are |Γ-Γ1|=0.286 and |Γ-Γ1|=0.284.

[0116] In the second case, for example with a dielectric volume fraction of 36%, values ​​of -14.3 dB and -14.3 dB are measured, resulting in a feed reflection coefficient of Γ = 0.193 e j205° and Γ=0.192e j204° and the changes in feed reflection are |Γ-Γ1|=0.254 and |Γ-Γ1|=0.253.

[0117] In particular, option 920, e.g., a triangular lattice having air-filled cylinders of circular cross section, has a triangular unit cell with a side length of 608 μm, and a triangular unit cell with a side length of 160,069 μm. 2 This produces a unit cell area of ​​0.01 mm. If the circle radius is 239.4 μm, option 920 has a dielectric volume fraction of 43.75%, or if the circle radius is 255.4 μm, the dielectric volume fraction is 36%. In either case, the lattice is rotated 15° z, e.g., in the z direction.

[0118] In the first case, for example, for a dielectric volume fraction of 43.75%, values ​​of -13.3 dB and -13.2 dB are measured, resulting in a feed reflection coefficient of Γ = 0.217 e j192.2° and Γ=0.218e j192.5° and the changes in feed reflection are |Γ-Γ1|=0.279 and |Γ-Γ1|=0.280.

[0119] In the second case, for example, for a dielectric volume fraction of 36%, values ​​of -14.8 dB and -14.8 dB are measured, resulting in a feed reflection coefficient of Γ = 0.181 e j201.5° and Γ=0.182e j201.8° and the change in feed reflection is |Γ-Γ1|=0.243 and |Γ-Γ1|=0.243.

[0120] In particular, option 930, e.g., a triangular lattice having air-filled cylinders of triangular cross section, has a triangular unit cell with a side length of 608 μm, and a triangular unit cell with a side length of 160,069 μm. 2This produces a unit cell area of ​​0.015 mm. If the inner triangle side length is 456 μm, then option 930 has a dielectric volume fraction of 43.75%, or if the inner triangle side length is 486.4 μm, then the dielectric volume fraction is 36%. In either case, the lattice is rotated 15° z, e.g., in the z direction.

[0121] In the first case, for example, for a dielectric volume fraction of 43.75%, values ​​of -12.9 dB and -13.4 dB are measured, resulting in a feed reflection coefficient of Γ = 0.226 e j195° and Γ=0.214e j197.5° and the changes in feed reflection are |Γ-Γ1|=0.288 and |Γ-Γ1|=0.276.

[0122] In the second case, for example with a dielectric volume fraction of 36%, values ​​of -14.1 dB and -14.5 dB are measured, resulting in a feed reflection coefficient of Γ = 0.198 e j205° and Γ=0.188e j208° and the changes in feed reflection are |Γ-Γ1|=0.259 and |Γ-Γ1|=0.248.

[0123] After examining this table, it can be concluded that a smaller volume fraction of high-k dielectric material is more beneficial than a larger volume fraction of high-k dielectric material. Additionally, the triangular lattice with cylindrical holes is superior to the other variations in table 900 of FIG. 9 , e.g., more transparent. Furthermore, compared to other simulation cases described below, the smaller unit cell is slightly superior, i.e., the smaller unit cell structure results in a slightly more transparent structure.

[0124] Simulation of different design concept combinations according to Fig. 10 10A shows simulations of pushers with four different structures: a) a square lattice 1010 with a dielectric volume fraction of 43.75%, b) an isosceles triangular lattice 1020 with a dielectric volume fraction of 43.75%, c) a square lattice 1030 with a dielectric volume fraction of 36%, and d) an isosceles triangular lattice 1040 with a dielectric volume fraction of 36%.

[0125] Figures 10B-10E show simulated input reflection coefficient measurements for pushers with different structures 1010, 1020, 1030, and 1040. Each simulated pusher includes a spacer and a λ / 2 thick dielectric slab or λ / 2 plate. In all simulations, the spacer has a dielectric constant of 1.3, and the high-permittivity material of the structures and dielectric slab has a dielectric constant of 3.6.

[0126] The results of the simulated input reflection coefficient measurements of the pusher are shown in the diagrams and Smith charts in Figures 10B-E below. Also, the radiation patterns in two typical perpendicular cut planes for one selected polarization of the dual polarized antenna are shown in Figures 10B-E.

[0127] The results of a simulated input reflection coefficient measurement for a pusher with a square lattice structure with a dielectric volume fraction of 43.75% are shown in Figure 10B. Diagram 1052 and Smith chart 1054 include markers for ports 1 and 2 at approximately -12.9 dB and (24.0-j3.1) Ω (0.225 exp(+j195.6°)) at 28 GHz. The radiation patterns at two typical perpendicular cuts for one selected polarization of the dual-polarized antenna are shown in charts 1056 and 1058.

[0128] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.88dBi, Main lobe direction: 4.0 deg. Angle width (3dB): 57.7deg. Side lobe level: -13.0dB.

[0129] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.83dBi, Main lobe direction: 0.0 deg. Angle width (3dB): 52.3deg., Sidelobe level: -12.3dB.

[0130] The results of simulated input reflection coefficient measurements for a pusher with an isosceles triangular lattice having a dielectric volume fraction of 43.75% are shown in Figure 10C. Diagram 1062 and Smith chart 1064 include markers for ports 1 and 2 located approximately at (24.4-j1.9) Ω (0.215exp(+j190°)) at -13.35 dB and 28 GHz. The radiation patterns at two typical perpendicular cuts for one selected polarization of the dual-polarized antenna are shown in charts 1066 and 1068.

[0131] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.9dBi, Main lobe direction: 4.0 deg. Angle width (3dB): 57.9deg. Side lobe level: -13.0dB.

[0132] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.82dBi, Main lobe direction: 0.0 deg. Angle width (3dB): 52.0deg., Sidelobe level: -12.6dB.

[0133] The results of simulated input reflection coefficient measurements for a pusher with a square lattice structure having a dielectric volume fraction of 36.0% are shown in Figure 10D. Diagram 1072 and Smith chart 1074 include markers for ports 1 and 2 located approximately at (26.1-j4.45) Ω (0.193exp(+j205°)) at -14.3 dB and 28 GHz. The radiation patterns at two typical perpendicular cuts for one selected polarization of the dual-polarized antenna are shown in charts 1076 and 1078.

[0134] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.95dBi, Main lobe direction: 3.0 deg. Angle width (3dB): 57.8deg., Sidelobe level: -13.3dB.

[0135] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.91dBi, Main lobe direction: 1.0 deg. Angle width (3dB): 51.7deg. Sidelobe level: -12.3dB.

[0136] The results of simulated input reflection coefficient measurements for a pusher with an isosceles triangular lattice having a dielectric volume fraction of 36.0% are shown in Figure 10E. Diagram 1082 and Smith chart 1084 include markers for ports 1 and 2 located at approximately (26.5-j3.02) Ω (0.178exp(+j198°)) at -15.0 dB and 28 GHz. The radiation patterns at two typical perpendicular cuts for one selected polarization of the dual-polarized antenna are shown in charts 1086 and 1088.

[0137] The resulting radiation pattern for the first cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.93dBi, Main lobe direction: 4.0 deg. Angle width (3dB): 58.3deg. Sidelobe level: -13.4dB.

[0138] The resulting radiation pattern for the second cut plane is as follows: Frequency: 28GHz, Main lobe size: 9.87dBi, Main lobe direction: 0.0 deg. Angle width (3dB): 51.6deg. Sidelobe level: -12.5dB.

[0139] Further measurement results are shown in Table 1100 of Figure 11, comparing the change in feed reflection coefficient.

[0140] Measurement results related to Figure 11 Figure 11 shows a comparison table 1100 of the change in feed reflection coefficient. That is, the feed reflection coefficient at 28 GHz and the change in feed reflection coefficient are shown in the table for different cases described in the "Description" column. Comments related to the cases indicated by letters in the last column of the table are listed below.

[0141] A The slight differences between the simulations of the "antenna only" structure (i.e., the structure without the pusher) are due to differences in the size of the "air volume" in the computational domain and differences in the mesh.

[0142] B Relative permittivity ε rel Measurements using a pusher made of homogeneous foam dielectric with ρ = 1.2 indicate that such a change in feed reflection is acceptable (however, it is unclear to what extent somewhat larger changes would be acceptable).

[0143] C relative permittivity ε relIf a material with a .DELTA.=3.6 (e.g., PEEK) is used for the homogeneous pusher, the interference with the antenna is completely unacceptable.

[0144] E The thin structured spacer layer is made of polystyrene foam (ε rel =1.3), which is soft but sufficiently stiff with a small thickness (0.3 mm). This spacer layer is specially fabricated according to the layout of the antenna (array) aperture.

[0145] H In the dual-polarization structure, the previously one-dimensionally periodic layered sheet pusher becomes two-dimensionally periodic. This eliminates an important electromagnetic feature: avoiding the tangential E-field at the dielectric-air boundary. Unlike Case #16, Case #17 uses a triangular lattice instead of a square lattice, which weakens the "E-field parallelism problem" and results in better performance for the same volume fraction. Cylindrical holes are assumed (from a manufacturability perspective), but holes with triangular cross sections would be even better, but are not feasible.

[0146] I For dual polarization structures, as for all structures, reducing the volume fraction of the dielectric, e.g., increasing the volume fraction of air, is effective in reducing the level of change in the reflection coefficient due to the pusher.

[0147] Regarding the radiation pattern, the dielectric pusher induces a focusing effect, i.e., a highly directional and narrow beam perpendicular to the antenna surface. As long as this effect is small, it does not have a significant negative impact on the test application. With the exception of exemplary case No. 3, i.e., a completely homogeneous PEEK pusher, all other pushers induce only small pattern changes.

[0148] In conclusion, the proposed electromagnetic characteristics are beneficial in dual linearly polarized antennas. The pusher is not completely transparent, some antenna interference can be tolerated, and a reduced volume fraction of the dielectric can be realized in the structure or structured part of the pusher. The more the volume of the dielectric is reduced, the more manufacturability becomes an issue.

[0149] Implementation Choices Although some aspects have been described in the context of an apparatus, it will be apparent that these aspects also represent a description of a corresponding method, where a block or apparatus corresponds to a method step or feature of a method step. Similarly, aspects described in the context of a method step also represent a description of a corresponding block or item or feature of a corresponding apparatus. Some or all of the method steps may be performed by (or using) a hardware apparatus. In some embodiments, one or more of the most important method steps may be performed by such an apparatus.

[0150] The above-described embodiments are merely illustrative of the principles of the present invention. It is understood that modifications and variations of the arrangements and details described herein will be apparent to those skilled in the art. It is therefore intended to be limited only by the scope of the following claims, and not by the specific details presented in the description and explanation of the embodiments herein.

Claims

1. 1. A pusher for use in automatic test equipment to mechanically push a device under test into a device under test socket, comprising: the pusher comprises a high dielectric constant dielectric region and a low dielectric constant dielectric region forming a structure having a plurality of high dielectric constant dielectric pillars with a low dielectric constant dielectric region therebetween, or a structure of a high dielectric constant dielectric block with a low dielectric constant dielectric hole; The high-dielectric-constant dielectric pillar or the hole extends in a first direction within ±45° from the pushing direction. Pusher.

2. The high dielectric constant dielectric pillars or the holes are circular, square, triangular or cross-shaped. The pusher of claim 1 .

3. the structure includes 5 to 50 high-permittivity dielectric pillars or holes per free-space wavelength of electromagnetic waves transmitted or received by the antenna of the device under test; 3. A pusher according to claim 1 or 2.

4. the structure comprises a matrix of high-dielectric-constant dielectric pillars or holes, or a regular lattice of high-dielectric-constant dielectric pillars or holes; A pusher according to any one of claims 1 to 3.

5. The structure includes a dielectric region having a high dielectric constant of 9 vol. % to 66.6 vol. % or 20 to 60 vol. % and a dielectric region having a low dielectric constant of 33.3 vol. % to 91 vol. % or 40 to 80 vol. %. A pusher according to any one of claims 1 to 4.

6. a surface of the pusher configured to contact the device under test that is shaped to avoid the pusher contacting or approaching within 1 / 10 of a wavelength of an electromagnetic wave transmitted or received by the antenna of the device under test with a conductive edge of the antenna of the device under test; A pusher according to any one of claims 1 to 5.

7. the pusher includes a spacer configured to be between the structure and the device under test; the spacer is perpendicular to the post or hole within a tolerance of ±15°, and / or the spacer is parallel to the surface of the device under test that is pushed by the pusher within a tolerance of ±15°; A pusher according to any one of claims 1 to 5.

8. the spacer is further configured to contact the device under test in a manner that avoids the spacer contacting or approaching within a distance of 1 / 10 of a wavelength of an electromagnetic wave transmitted or received by the antenna of the device under test with a conductive edge of the antenna of the device under test.

8. The pusher of claim 7.

9. the spacer has a relative dielectric constant of 1.5 or less; 9. A pusher according to claim 7 or 8.

10. The spacer has a thickness of 50 μm to 500 μm. A pusher according to any one of claims 7 to 9.

11. The spacer has a thickness of 100 μm to 350 μm. The pusher of claim 10.

12. the pusher has a dielectric slab oriented laterally or perpendicularly within a tolerance of ±15° relative to the pushing direction; the dielectric slab is configured to mechanically support the high-dielectric-constant dielectric pillars or the high-dielectric-constant dielectric block; A pusher according to any one of claims 1 to 11.

13. the dielectric slab has a thickness equal to an integer multiple of half wavelengths of electromagnetic waves in the dielectric material of the dielectric slab transmitted or received by the antenna of the device under test, within a tolerance of one-tenth of the wavelength of the electromagnetic waves transmitted or received by the antenna of the device under test; and the distance between the dielectric slab and the surface of the antenna of the device under test is at least one wavelength of the electromagnetic wave transmitted or received by the antenna of the device under test; 13. The pusher of claim 12.

14. a length of the high dielectric constant dielectric pillar or the hole in the pushing direction is 0.5 to 2 times the free space wavelength of an electromagnetic wave transmitted or received by the antenna of the device under test; A pusher according to claim 12 or 13.

15. the high dielectric constant dielectric region has a relative permittivity greater than 2; A pusher according to any one of claims 1 to 14.

16. The high dielectric constant dielectric region is made of a polymer, polycarbonate, quartz, Teflon, or PEEK material. A pusher according to any one of claims 1 to 15.

17. The low dielectric constant dielectric region has a relative dielectric constant of 1.5 or less. A pusher according to any one of claims 1 to 16.

18. The low dielectric constant dielectric region is composed of air. A pusher according to any one of claims 1 to 17.

19. the pushing direction is perpendicular to the far-field direction of the electric field of the main lobe of the antenna of the device under test within a tolerance of ±15°; or the indentation direction is perpendicular to the major surface of the device under test within a tolerance of ±15°; or the pushing direction is perpendicular to the main surface of the device under test socket within a tolerance of ±15°; A pusher according to any one of claims 1 to 18.

20. 1. A test mechanism for testing a device under test, comprising: a device under test having an antenna, the device being pushed into a device under test socket by a pusher according to any one of claims 1 to 19 in order to test the device under test; Testing organization.

21. The pusher is a pusher according to claim 12, the dielectric slab of the pusher has a thickness equal to an integer multiple of half wavelengths of the electromagnetic waves in the dielectric material of the dielectric slab transmitted or received by the antenna of the device under test, within a tolerance of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna of the device under test; and a distance between the dielectric slab and a surface of the antenna of the device under test that is at least one wavelength of the electromagnetic wave transmitted or received by the antenna of the device under test; 21. The testing mechanism of claim 20.

22. a length of the high dielectric constant dielectric pillar or the hole of the pusher in the pushing direction is 0.5 to 2 times the free space wavelength of an electromagnetic wave transmitted or received by the antenna of the device under test; 22. A testing arrangement according to claim 20 or 21.

23. 1. A method for mechanically pressing a device under test into a device under test socket in automatic test equipment, comprising: the method includes mechanically pushing the device under test into the device under test socket using a pusher; the pusher comprises a structure having a plurality of high-dielectric-constant dielectric pillars with low-dielectric-constant dielectric regions therebetween, or a structure having a high-dielectric-constant dielectric block with a low-dielectric-constant dielectric hole; the high-dielectric-constant dielectric pillar or the low-dielectric-constant dielectric hole extends in a first direction within ±45° from the pushing direction; method.

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