Spectrometry system and method for analyzing components of solution

Abstract

To easily analyze a solution and to properly analyze a solvent containing a radioactive substance.SOLUTION: A spectrometry system 1 includes a storage container in which a solution containing a radioactive substance is stored, a light source unit that irradiates the solution with laser light, a measurement probe that irradiates the solution with the laser light and receives scattered light from the solution, and an adjustment mechanism that changes a probe distance that is a distance between the storage container and the measurement probe, in which the measurement probe is disposed outside the storage container.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a spectroscopic analysis system and a method for analyzing components of a solution. [Background technology]

[0002] There are cases where spectroscopic analysis is used to analyze radioactive substances in a solution. In this case, the concentration of the radioactive substance is calculated from an absorbance spectrum that shows the absorbance of light at each wavelength by the solution. For example, Patent Document 1 describes that a solution containing a radioactive substance is irradiated with light in at least one wavelength band of ultraviolet light or visible light, and the concentration of the radioactive substance in the solution is measured by spectroscopic analysis. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Patent Publication No. 2021-1733

[0004] In Patent Document 1, in order to analyze a solution containing a radioactive substance, it is necessary to immerse a measurement probe in the solution containing the radioactive substance. In addition, when the measurement is completed and the container to be measured is changed, the measurement probe must be cleaned. Therefore, there is a need for a spectroscopic analysis system with a structure that allows for easy solution analysis without immersing the measurement probe in the solution.

[0005] The present invention has been made to solve the above-mentioned problems, and has an object to provide a spectroscopic analysis system that can easily analyze a solution, and a method for analyzing the components of a solution. Summary of the Invention [Means for solving the problem]

[0006] In order to solve the above-mentioned problems and achieve the objectives, the spectroscopic analysis system of the present disclosure comprises a storage container in which a solution containing a radioactive substance is stored, a light source unit that irradiates laser light, a measurement probe that irradiates the laser light onto the solution and receives scattered light from the solution, and an adjustment mechanism that changes the probe distance, which is the distance between the storage container and the measurement probe, and the measurement probe is arranged outside the storage container.

[0007] In order to solve the above-mentioned problems and achieve the objectives, the method for analyzing the components of a solution according to the present disclosure is a method for analyzing the components of the solution using the spectroscopic analysis system described above, and includes the steps of determining the probe distance based on the focal length of the measurement probe, adjusting the adjustment mechanism to achieve the determined probe distance, irradiating the solution with the laser light and acquiring the scattered light, and analyzing the components of the solution based on the acquired scattered light. [Effects of the Invention]

[0008] According to the present invention, it is possible to provide a spectroscopic analysis system that can easily analyze a solution, and a method for analyzing the components of a solution. [Brief explanation of the drawings]

[0009] [Figure 1] FIG. 1 is a schematic diagram of a spectroscopic analysis system according to the first embodiment. [Figure 2] FIG. 2 is a schematic block diagram of a calculation unit according to the first embodiment. [Figure 3] FIG. 3 is a schematic diagram for explaining a metal pipe. [Figure 4] FIG. 4 is a schematic diagram showing an example of the measuring jig according to the first embodiment. [Figure 5] FIG. 5 is a diagram showing an example of experimental data showing the correlation between probe distance and spectral intensity. [Figure 6] FIG. 6 is a flowchart illustrating the process flow of the method for analyzing components of a solution using the spectroscopic analysis system according to the first embodiment. [Figure 7] FIG. 7 is a schematic diagram showing an example of a measuring jig according to the second embodiment. [Figure 8] FIG. 8 is a cross-sectional view taken along line AA in FIG. [Figure 9] FIG. 9 is a flowchart illustrating the process flow of a method for calibrating a measurement device using a spectroscopic analysis system according to the second embodiment. [Figure 10] FIG. 10 is a schematic diagram of a spectroscopic analysis system according to the third embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0010] Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Note that the present invention is not limited to these embodiments, and when there are multiple embodiments, the present invention also includes configurations in which the respective embodiments are combined.

[0011] (First embodiment) FIG. 1 is a schematic diagram of a spectroscopic analysis system according to this embodiment. As shown in FIG. 1, the spectroscopic analysis system 1 according to this embodiment is a system for analyzing a solution X. The spectroscopic analysis system 1 analyzes a solution X stored in a storage container 14 (described later). The solution X is a solution containing a radioactive substance. Examples of the solution X analyzed by the spectroscopic analysis system 1 include a solution in which a radioactive substance is dissolved in an acidic solvent such as nitric acid, and a solution in which a radioactive substance is dissolved in an organic solvent. The spectroscopic analysis system 1 performs spectroscopic analysis of the solution X to measure the concentration of the radioactive substance and the concentration of the organic solvent contained in the solution X. In this embodiment, examples of the radioactive substance contained in the solution X include uranium and plutonium. In addition, in this embodiment, examples of the organic solvent contained in the solution X include an organic solvent obtained by diluting TBP (tributylphosphate) with n-dodecane. Examples of the organic solvent contained in the solution X other than TBP and n-dodecane include dibutyl phosphate (DBP), butanol, dodecanone, dodecanol, butyric acid, and propionic acid (a degradation product of TBP).

[0012] The spectroscopic analysis system 1 includes a spectroscopic analyzer 10, a measuring tool 20, and a storage container 14.

[0013] (spectroscopic analyzer) The spectroscopic analysis device 10 includes a light source unit 30, a measurement probe 32, a detection unit 34, a calculation unit 36, and an optical fiber 38. The spectroscopic analysis device 10 irradiates measurement light L1 from the light source unit 30 via the measurement probe 32 into a storage container 14 in which a solution X is stored. The spectroscopic analysis device 10 receives scattered light L2 scattered by the solution X at the detection unit 34 via the measurement probe 32. The spectroscopic analysis device 10 analyzes the solution X based on the scattered light L2 received by the detection unit 34 using the calculation unit 36. The optical fiber 38 connects the light source unit 30 and the measurement probe 32, and connects the measurement probe 32 and the detection unit 34.

[0014] (Light source part) The light source unit 30 is a laser light source that emits measurement light L1 and is connected to the measurement probe 32 via an optical fiber 38. The light source unit 30 transmits the measurement light L1 toward the measurement probe 32 via the optical fiber 38. In this embodiment, the measurement light L1 may be light in a wavelength band ranging from visible light to near-infrared light, or light in a wavelength band ranging from near-infrared light to infrared light. For example, the measurement light L1 is preferably laser light having a wavelength of 532, 633, 785, 1064 nm, or the like.

[0015] The light source unit 30 sets the wavelength of the measurement light L1 under the control of the calculation unit 36. Specifically, the calculation unit 36 ​​sets the wavelength of the measurement light L1 irradiated by the light source unit 30 according to the properties of the solution X. For example, if the solution X and the storage container 14 have the property of emitting high-energy fluorescence when irradiated with the measurement light L1 from the light source unit 30, it is preferable that the calculation unit 36 ​​sets the wavelength of the measurement light L1 irradiated by the light source unit 30 to a long, low-energy wavelength. Similarly, if the solution X and the storage container 14 have the property of emitting low-energy fluorescence when irradiated with the measurement light L1 from the light source unit 30, it is preferable that the calculation unit 36 ​​sets the wavelength of the measurement light L1 irradiated by the light source unit 30 to a short, high-energy wavelength. In this embodiment, the light source unit 30 includes multiple light sources according to the wavelength of the irradiated measurement light L1. Examples of light sources include solid-state lasers and semiconductor lasers.

[0016] (measuring probe) The measurement probe 32 is disposed outside the storage container 14 in which the solution X is stored. In this embodiment, the measurement probe 32 is provided inside the measurement jig 20, and its position relative to the measurement jig 20 is fixed. The measurement probe 32 is connected to the light source unit 30 and the detection unit 34 via an optical fiber 38. The measurement probe 32 receives measurement light L1 transmitted from the light source unit 30 and irradiates the received measurement light L1 toward the solution X inside the storage container 14. The measurement probe 32 also receives scattered light L2 scattered by the solution X via the optical fiber 38 and transmits the scattered light toward the detection unit 34. Specifically, the measurement probe 32 has a convex lens (not shown) therein, and uses the convex lens to focus the measurement light L1 transmitted from the light source unit 30 via a first optical fiber 38A at the focal position of the convex lens. In this embodiment, the position of the storage container 14 is set by the adjustment mechanism AM of the measurement jig 20 described later so that the focal position of the convex lens in the measurement probe 32 overlaps with the solution X inside the storage container 14.

[0017] Furthermore, the measurement probe 32 irradiates the solution X at the focal position with the measurement light L1, and then collects the scattered light L2 scattered by the solution X. Then, the collected scattered light L2 is sent to the detection unit 34 via the second optical fiber 38B.

[0018] (Detection unit) 1 includes a spectrometer that separates scattered light L2, transmitted from measurement probe 32 via second optical fiber 38B, into desired wavelengths, and a light-receiving element that receives the separated light. More specifically, the light-receiving element detects the intensity of light separated by the diffraction grating of the spectrometer, out of the scattered light L2 transmitted to the spectrometer. The light-receiving element may be any device, and the light-receiving element in this embodiment is a CCD (Charge-Coupled Device).

[0019] (calculation section) FIG. 2 is a schematic block diagram of a calculation unit according to this embodiment. In this embodiment, the calculation unit 36 ​​is a computer that controls the spectroscopic analysis system 1 and analyzes the solution X. As shown in FIG. 2, the calculation unit 36 ​​includes an input unit 36A, an output unit 36B, a storage unit 36C, and a control unit 36D. The input unit 36A is a device that receives input from an operator, such as a mouse, keyboard, or touch panel. The output unit 36B is a device that outputs information, such as a display device that displays the control details of the control unit 36D and the component analysis results of the solution X. The storage unit 36C is a memory that stores the calculation details and program information of the control unit 36D, and includes at least one of a random access memory (RAM), a main storage device such as a read-only memory (ROM), and an external storage device such as a hard disk drive (HDD) or a solid state drive (SSD). The program for the control unit 36D stored in the storage unit 36C may be stored in a recording medium readable by the calculation unit 36.

[0020] The control unit 36D is an arithmetic device, i.e., a CPU (Central Processing Unit). The control unit 36D executes various processes by reading out software (programs) stored in the storage unit 36C. For example, as described above, the control unit 36D causes the light source unit 30 to irradiate the measurement light L1. The control unit 36D also analyzes the components of the solution X based on the intensity of the scattered light L2 detected by the detection unit 34. For example, when information indicating that the concentration of a radioactive substance in the solution X is to be analyzed is input to the input unit 36A, the control unit 36D calculates the concentration of the radioactive substance contained in the solution X based on the intensity of the scattered light L2 detected by the detection unit 34. For example, when information indicating that the concentration of an organic solvent in the solution X is to be analyzed is input to the input unit 36A, the control unit 36D calculates the concentration of the organic solvent contained in the solution X based on the intensity of the scattered light L2 detected by the detection unit 34.

[0021] Note that the control unit 36D may use any method for analyzing the solution X. For example, the control unit 36D according to this embodiment disperses the scattered light L2, which is Raman scattered light, and performs component analysis of the solution X by Raman spectroscopy. To explain in more detail, the control unit 36D disperses the scattered light L2, which is Raman scattered light, based on the intensity of the scattered light L2 detected by the detection unit 34, calculates a Raman spectrum that indicates the intensity distribution of the Raman scattered light, and inputs the calculated Raman spectrum into a learning model M, which will be described later, thereby performing component analysis of the solution X.

[0022] (Learning model) The learning model M is a model (program) created by analyzing the correspondence between input data and events using statistical analysis or machine learning. Here, input data refers to parameters (variables) that affect the events. Furthermore, events refer to events that occur in response to the input data. In this embodiment, the events may be of any content, but are preferably the concentration of radioactive substances contained in solution X or the concentration of organic solvents contained in solution X. Furthermore, the input data may be any parameter that affects the events, but the input data in this embodiment is preferably a Raman spectrum calculated by the control unit 36D. In other words, the learning model M in this embodiment is a model (program) that predicts and outputs the component analysis results of solution X (the concentration of radioactive substances contained in solution X or the concentration of organic solvents contained in solution X) when a Raman spectrum is input.

[0023] The control unit 36D according to this embodiment disperses the scattered light L2, which is Raman scattered light, and calculates a Raman spectrum that indicates the intensity distribution of the Raman scattered light. The control unit 36D then reads out the learning model M stored in the memory unit 36C and inputs the calculated Raman spectrum into the learning model M, thereby performing a component analysis of the solution X.

[0024] (optical fiber) The optical fiber 38 includes a first optical fiber 38A and a second optical fiber 38B. The first optical fiber 38A transmits the measurement light L1 from the light source unit 30 to the measurement probe 32, and the second optical fiber 38B transmits the scattered light L2 from the measurement probe 32 to the detection unit 34.

[0025] The optical fiber 38 may be any type of optical fiber, but the optical fiber 38 according to this embodiment is a low-OH type optical fiber. A low-OH type optical fiber is an optical fiber made of SiO2 with few OH groups. For example, the optical fiber 38 according to this embodiment is configured with such few OH groups that the transmission loss of light with a wavelength of 1383 nm is 0.35 dB / km or less. In other words, when the optical fiber 38 transmits light with a wavelength of 1383 nm, the average attenuation of light per kilometer of the optical fiber 38 is 0.35 dB or less. Furthermore, to improve resistance to radiation, the optical fiber 38 is preferably a hydrogen-filled fiber, a fluorine-doped fiber, or a pure silica fiber.

[0026] The optical fiber 38 configured as described above is coated with a metal tube or resin, and is preferably coated with a metal tube. FIG. 3 is a schematic diagram illustrating a metal tube. The optical fiber 38 according to this embodiment is protected from radiation by being coated with a metal tube 40. The radiation in this case is, for example, beta rays. The metal tube 40 is a metal member. Examples of materials for the metal tube 40 include stainless steel such as SUS304 and SUS316, and Hastelloy (registered trademark). The metal tube 40 is preferably configured to be expandable and contractible in the axial direction. For example, the metal tube 40 may be configured in an accordion shape or a shape with metal fibers woven therein, thereby making it expandable and contractible in the axial direction. The thickness La of the metal tube 40 is preferably 1.5 mm or more and 20 mm or less. A thickness La of 1.5 mm or more enables appropriate shielding from beta rays, and a thickness La of 20 mm or less allows the optical fiber 38 to be easily moved. The thickness La indicates the length between the inner circumferential surface 40A and the outer circumferential surface 40B of the metal pipe 40, as shown in FIG.

[0027] (Storage container) Next, the storage container 14 will be described. The storage container 14 is a container that stores a solution X containing a radioactive substance. In the spectroscopic analysis system 1 according to this embodiment, measurement light L1 is irradiated onto the solution X inside the storage container 14 from a measurement probe 32 disposed outside the storage container 14, and scattered light L2 scattered by the solution X is received by the measurement probe 32 and used for spectroscopic analysis. Therefore, the storage container 14 is preferably made of a material that has high transmittance and little absorption in the wavelength range of the laser light, which is the measurement light L1. The storage container 14 according to this embodiment is cylindrical and made of glass or resin with an opening at one end. Furthermore, the storage container 14 may have a lid member that closes the opening after storing the solution X introduced through the opening. Furthermore, the shape of the storage container 14 is not limited to a cylindrical shape. It may be a rectangular cross-sectioned rectangular tube, or a double-walled container.

[0028] (measuring jig) Next, the measuring jig 20 will be described. FIG. 4 is a schematic diagram showing an example of the measuring jig according to this embodiment. The measuring jig 20 houses a measuring probe 32 and a storage container 14 therein. The measuring jig 20 according to this embodiment has two spaces arranged vertically and separated by a partition wall BL. More specifically, the measuring jig 20 according to this embodiment has a probe storage section 20A that houses the measuring probe 32 and a container storage section 20B that houses the storage container 14. Hereinafter, the traveling direction of the measuring light L1 irradiated from the measuring probe 32 (the direction from the measuring probe 32 toward the storage container 14) is referred to as the Z1 direction, and the direction opposite to the Z1 direction is referred to as the Z2 direction. It is preferable that the measuring jig 20 be made of a material that blocks the laser light oscillated by the measuring probe 32 housed therein. The measuring jig according to this embodiment is made of stainless steel such as SUS304 or SUS316. Furthermore, the measuring jig 20 is not an essential component, and the measuring probe 32 and the storage container 14 do not have to be housed in the measuring jig 20.

[0029] (Probe storage section) The probe storage section 20A stores the measurement probe 32 and is a space located in the Z2 direction from the container storage section 20B (described later). More specifically, the container storage section 20B according to this embodiment is a cylindrical space whose diameter is larger than the outer diameter of the measurement probe 32. The measurement probe 32 is fixed to the end face B2 in the Z2 direction. An opening H1 that communicates with the container storage section 20B is formed in the end face U2 in the Z1 direction. Although the opening H1 according to this embodiment has a cylindrical cross section, the cross-sectional shape of the opening H1 may be any shape. Furthermore, it is preferable that the central axis of the cross section of the opening H1 coincides with the axis Ax1, which is the central axis of the measurement probe 32. The measurement light L1 transmitted to the measurement probe 32 is irradiated onto the solution X through the opening H1, and the scattered light L2 scattered by the solution X is also collected on the measurement probe 32 through the opening H1. Furthermore, in order to prevent the laser light oscillated by the measurement probe 32 from leaking to the outside from any place other than the opening H1, it is preferable that the probe storage section 20A has no openings other than a through-hole for the optical fiber 38 (not shown). The shape of the probe storage section 20A is not limited to a cylindrical shape. It may also be a rectangular parallelepiped shape with a rectangular cross section.

[0030] (Container storage section) The container storage section 20B is a space located in the Z1 direction from the probe storage section 20A and accommodates the storage container 14. Specifically, the container storage section 20B is a cylindrical space with an open end face U1 in the Z1 direction. More specifically, the container storage section 20B according to this embodiment has an end face in the Z2 direction that is the Z1-direction end face B1 of the partition wall BL, and is a cylindrical space with an open end face U1 in the Z1 direction. The container storage section 20B has a base 22 at the end face B1 to which the storage container 14 accommodated therein is fixed. Therefore, the diameter of the container storage section 20B is set to be larger than the outer diameter of the base 22. The shape of the container storage section 20B is not limited to a cylindrical shape. It may also be a rectangular parallelepiped shape with a rectangular cross section. Before describing the base 22 in detail, the adjustment mechanism AM of the measuring jig 20 will be described first.

[0031] (adjustment mechanism) The measuring jig 20 has an adjustment mechanism AM that changes the distance between the measuring probe 32 housed therein and the storage container 14. In other words, the measuring jig 20 is equipped with an adjustment mechanism AM that changes the probe distance Lb, which is the distance between the storage container 14 and the measuring probe 32. To explain in more detail, as shown in FIG. 4 , the adjustment mechanism AM according to this embodiment is a mechanism that changes the probe distance Lb, which is the distance from the end face of the measuring probe 32 in the Z1 direction to the end face of the storage container 14 in the Z2 direction. The adjustment mechanism AM has a base 22 and a container fixing holder 24. Note that in this embodiment, the adjustment mechanism AM is provided within the measuring jig 20; however, as described above, the measuring jig 20 is not an essential component, and the adjustment mechanism AM does not have to be provided within the measuring jig 20.

[0032] (base) The base 22 is a member fixed to the measurement jig 20. In addition, the base 22 according to this embodiment holds the container fixing holder 24 movably in the Z direction relative to the base 22. In other words, the base 22 is configured so that the position of the container fixing holder 24 in the Z direction relative to the base 22 is variable and the container fixing holder 24 can be held at a set position. More specifically, the base 22 is a cylindrical member with open end faces in the Z1 and Z2 directions, and the Z2 end face is fixed in contact with the end face B1 of the container storage section 20B. In this case, it is preferable that the cross-sectional central axis of the inner peripheral surface of the base 22 coincides with the axis Ax1, which is the central axis of the measurement probe 32. Furthermore, since the base 22 houses and fixes the storage container 14 therein, its inner diameter is larger than the outer diameter of the container fixing holder 24, which will be described later. The base 22 may have any structure that holds the container fixing holder 24 movably in the Z direction, but the base 22 according to this embodiment has a screw receiving area SH formed on its inner circumferential surface.

[0033] (Container fixing holder) The container fixing holder 24 is a member that holds the storage container 14. Any structural method may be used to attach the container fixing holder 24 to the storage container 14, but the container fixing holder 24 according to this embodiment has a cylindrical shape whose inner diameter is set to form a loose fit with the outer diameter of the storage container 14. The container fixing holder 24 also has a cylindrical shape with a closed end face in the Z2 direction and an open end face in the Z1 direction. Therefore, the storage container 14 is attached to the storage container 14 by inserting the storage container 14 into the open end face in the Z1 direction of the container fixing holder 24.

[0034] Furthermore, the container fixing holder 24 is held by the base 22 so as to be movable in the Z direction relative to the base 22. The adjustment mechanism AM allows the container fixing holder 24, which fixes the storage container 14, to move relative to the base 22 (the base 22 whose position relative to the measurement probe 32 is fixed), which is fixed to the measurement jig 20, thereby making it possible to change the probe distance Lb, which is the distance between the storage container 14 and the measurement probe 32. The container fixing holder 24 may have any structure that is movable in the Z direction relative to the base 22, but in this embodiment, an external thread region MS is formed on the outer peripheral surface of the container fixing holder 24, with an outer diameter that matches the screw receiving region SH of the base 22 described above. Therefore, the external thread region MS of the container fixing holder 24, into which the storage container 14 has been inserted, is screwed into the screw receiving region SH of the base 22, and the container fixing holder 24, into which the storage container 14 has been inserted, is fixed to the base 22. In other words, the probe distance Lb can be changed by changing the amount of screwing of the male thread region MS of the container fixing holder 24 into the screw receiving region SH of the base 22. With the above structure, the storage container 14 inserted into the container fixing holder 24 is fixed to the base 22 so that the probe distance Lb can be changed.

[0035] Furthermore, an opening H2 penetrating the container fixing holder 24 is formed on the end face in the Z2 direction of the inner circumferential surface of the container fixing holder 24. In this case, it is preferable that the cross-sectional central axis of the opening H2, the central axis of the inner circumferential surface of the container fixing holder 24, and the central axis of the inner circumferential surface of the base 22 are aligned. By forming the opening H2 in the container fixing holder 24, it becomes possible to irradiate the solution X in the storage container 14 inserted into the container fixing holder 24 with measurement light L1 and to collect scattered light L2 scattered by the solution X with the measurement probe 32. Note that although the opening H2 in this embodiment has a cylindrical cross section, the cross-sectional shape of the opening H2 may be any shape.

[0036] In the above description, the Z1 direction in which the measurement light L1 is irradiated faces vertically upward, and the measurement jig 20 is configured such that the probe storage unit 20A and the container storage unit 20B face vertically upward. In this case, the bottom surface of the storage container 14 provided in the container storage unit 20B faces vertically downward (Z2 direction), so that the measurement light L1 enters the storage container 14 from the bottom surface. However, this is not limited to this. For example, the Z1 direction in which the measurement light L1 is irradiated may face a horizontal direction that intersects with the vertical direction, and the measurement jig 20 may be configured such that the probe storage unit 20A and the container storage unit 20B are aligned in this horizontal direction. In this case, the probe distance is also the horizontal distance of the measurement jig 20, and the adjustment mechanism AM may adjust the horizontal probe distance between the measurement probe 32 and the storage container 14.

[0037] The structure of the adjustment mechanism AM is not limited to the above description, and may be any structure that can change the probe distance Lb.

[0038] (optimal probe distance) In the spectroscopic analysis system 1 according to this embodiment, measurement light L1 is irradiated onto the solution X inside the storage container 14 from a measurement probe 32 disposed outside the storage container 14, and scattered light L2 scattered by the solution X is received by the measurement probe 32 and used for spectroscopic analysis. Specifically, as shown in FIG. 4 , the measurement light L1 is focused by the measurement probe 32 at the position of the focal point FP of the measurement probe 32. Then, scattered light L2 scattered by the solution X at the position of the focal point FP passes through the inside of the solution X and is received by the measurement probe 32 disposed in the Z2 direction of the storage container 14. FIG. 5 shows an example of experimental data illustrating the correlation between probe distance and spectral intensity. The horizontal axis of the graph shown in FIG. 5 represents the probe distance Lb, which is the distance from the end face of the measurement probe 32 in the Z1 direction to the end face of the storage container 14 in the Z2 direction, and the vertical axis represents the spectral intensity acquired by the detection unit 34. As shown in FIG. 5 , as the probe distance Lb varies from 0 mm to a predetermined value I max In other words, when the probe distance Lb is in the range of I max When the probe distance Lb is 0 mm, the distance that the scattered light L2 scattered by the solution X at the position of the focal point FP travels in the Z2 direction through the inside of the solution X to reach the measurement probe 32 is I max In other words, the probe distance Lb is shorter than I max It can be seen that the shorter the path in the Z2 direction that the scattered light L2 takes to pass through the inside of the solution X and reach the measurement probe 32, the higher the spectral intensity that can be acquired by the detection unit .

[0039] Also, as shown in Figure 5, when the probe distance Lb is I maxIt can be seen that in the range from FL mm to FL mm, which indicates the focal length of the measurement probe 32, the obtainable spectral intensity decreases as the probe distance Lb increases. This is thought to be because the position of the focal point FP where the measurement light L1 is focused approaches the bottom of the storage container 14, increasing disturbances from the storage container 14, thereby reducing the obtainable spectral intensity. When the probe distance Lb is in the range significantly exceeding FL mm, the position of the focal point FP where the measurement light L1 is focused is in the Z2 direction from the solution X; in other words, the measurement light L1 is not irradiated onto the solution X, making it difficult to obtain accurate Raman scattered light.

[0040] Here, the value of probe distance Lb at which the acquired spectrum intensity is maximum is I max is a specific value determined by the focal length FL of the measurement probe 32 used in the measurement and the thickness and material of the storage container 14. Prior to the component analysis of the solution X, I max Calculate the probe distance Lb when analyzing the components of solution X. max By setting the spectroscopic analysis to

[0041] In the spectroscopic analysis system 1 according to this embodiment, the probe distance Lb can be changed by the adjustment mechanism AM of the measurement jig 20. Therefore, when performing spectroscopic analysis, the probe distance Lb can be adjusted, for example, by adjusting the probe distance Lb to I max This allows for setting the wavelength close to the target wavelength, enabling highly accurate spectroscopic analysis.

[0042] (Component analysis method) The flow of the method for analyzing the components of a solution X using the spectroscopic analysis system 1 described above will now be described. FIG. 6 is a flowchart illustrating the process flow of the method for analyzing the components of a solution using the spectroscopic analysis system according to this embodiment. Steps S10 to S16 are processing flows performed by an operator. First, the operator determines the value of the probe distance Lb (I) at which the intensity of the acquired Raman spectrum is maximized, based on the container information, which is information about the thickness and material of the storage container 14 used in the component analysis, and the probe information, which is information about the focal length FL of the measurement probe 32. maxObtain it (step S10). Note that I max The acquisition method of can be any method. In this embodiment, the correlation between the container information and the probe information and I max is calculated by a preliminary experiment, and I max is determined based on the result. Next, the operator puts the solution X containing the sample to be analyzed into the storage container 14 and attaches the container fixing holder 24 to the storage container 14. Then, the measurement jig 20 is adjusted so that the probe distance Lb is I max , and the container fixing holder 24 is attached to the base 22 (step S12). Specifically, the male screw region MS of the container fixing holder 24 is screwed into the screw receiving region SH of the base 22, and the screwing amount is adjusted so that the probe distance Lb is I max . Here, let the distance in the Z1 direction from the end face in the Z2 direction of the storage container 14 shown in FIG. 4 to the liquid surface of the solution X be Lc. Also, as described above, the probe distance, which is the distance in the Z1 direction from the end face of the measurement probe 32 to the end face in the Z2 direction of the storage container 14, is Lb, and the focal length of the measurement probe 32 is FL. When Lc + Lb < FL (step S14; No), since the measurement light L1 condensed by the measurement probe 32 is not irradiated onto the solution X in the storage container 14, the probe distance Lb is readjusted (step S16). The following steps S18 to S24 are the processing flow in the arithmetic unit 36 of the spectroscopic analyzer 10. When Lc + Lb ≥ FL (step S14; Yes), the solution X is irradiated with the laser light, which is the measurement light L1, using the light source unit 30 (step S18). Then, Raman scattered light is obtained using the measurement probe 32 (step S20). Based on the obtained Raman scattered light, a Raman spectrum is calculated, and by inputting the Raman spectrum into the learning model M, the component analysis of the solution X is performed (step S22). The component analysis result of the solution X is output via the output unit 36B (step S24), and this process ends.

[0043] (Effect) As described above, the spectroscopic analysis system 1 according to this embodiment includes a storage container 14 for storing a solution X containing a radioactive substance, a light source unit 30 for irradiating a laser beam, a measurement probe 32 for irradiating the solution X with the laser beam and receiving scattered light L2 from the solution X, and an adjustment mechanism AM for changing the probe distance Lb, which is the distance between the storage container 14 and the measurement probe 32, and the measurement probe 32 is disposed outside the storage container 14. According to the present disclosure, component analysis of the solution X can be easily performed.

[0044] Furthermore, according to the present disclosure, since the measurement probe 32 is disposed outside the storage container 14, spectroscopic analysis can be performed without removing the sample from the container. Furthermore, since the measurement probe 32 does not come into contact with the solution X, the labor required to clean the measurement probe 32 when performing successive analytical tasks can be reduced. Furthermore, since there is no need to open the storage container 14 in which the solution X containing the radioactive substance is stored when changing the analysis target, the risk of radioactivity leakage can be reduced.

[0045] Furthermore, according to the present disclosure, the provision of an adjustment mechanism AM that changes the probe distance Lb, which is the distance between the storage container 14 and the measurement probe 32, makes it possible to set the probe distance Lb to a distance at which the intensity of the Raman spectrum acquired by the calculation unit 36 ​​is maximized. Furthermore, even if the water surface position of the solution X in the storage container 14 fluctuates after the probe distance Lb has been determined, the probe distance Lb can be changed in accordance with the fluctuation. This allows for highly accurate spectroscopic analysis.

[0046] (Second embodiment) Next, a second embodiment will be described. A spectroscopic analysis system 1A according to the second embodiment differs from the first embodiment in that it further includes a sample storage container 13 that stores a solution Y containing a standard sample used to calibrate the measurement probe 32, and a container changing mechanism CM that changes the position of the storage container 14 relative to the measurement probe 32 and the position of the sample storage container 13 relative to the measurement probe 32. Note that a description of the configuration of the second embodiment that is common to the first embodiment will be omitted.

[0047] The measuring jig 200 according to this embodiment has a probe storage section 200A that stores the measurement probe 32, and a container storage section 200B that stores the storage container 14 and the sample storage container 13. The probe storage section 200A and the container storage section 200B are connected via a container changing mechanism CM.

[0048] (Sample storage container) First, the sample storage container 13 will be described. The sample storage container 13 is a container that stores a solution Y containing a standard sample used to calibrate the measurement probe 32. The standard sample contained in the solution Y preferably has a high intensity and sharp peak characteristics in the calculated Raman spectrum. Examples of suitable standard samples include organic substances such as cyclohexane, hexane, and benzene, and inorganic substances such as aqueous nitric acid solution and sulfur. The sample storage container 13 may have any shape and material, but is preferably the same shape and material as the storage container 14 described above. Since the sample storage container 13 according to this embodiment has the same shape and material as the storage container 14, a container fixing holder 24 of the same shape as the container fixing holder 24 attached to the storage container 14 can be attached to the sample storage container 13. In other words, the sample storage container 13 according to this embodiment can be fixed to the base 22 that fixes the storage container 14. A method for calibrating a measurement device including the measurement probe 32 will be described later.

[0049] (Container change mechanism) Next, the container changing mechanism CM will be described. The container changing mechanism CM is a mechanism that connects the probe storage unit 200A and the container storage unit 200B. FIG. 7 is a schematic diagram showing an example of the measuring jig 200 according to this embodiment. The container changing mechanism CM may have any structure, but the container changing mechanism CM according to this embodiment is structured as shown in FIG. 7 in such a way that a cylindrical rotating shaft SF provided on the container storage unit 200B side is inserted into a bearing portion BL provided on the probe storage unit 200A side. This container changing mechanism CM is structured so that the container storage unit 200B rotates around the central axis Ax2 of the rotating shaft SF, thereby making it possible to change the position of the storage container 14 relative to the measurement probe 32 and the position of the sample storage container 13 relative to the measurement probe 32.

[0050] Next, the probe storage unit 200A will be described. As shown in FIG. 7, the probe storage unit 200A according to this embodiment is a component having a space 32A formed therein for storing the measurement probe 32. The space 32A according to this embodiment is a cylindrical space, the diameter of which is larger than the outer diameter of the measurement probe 32. The measurement probe 32 is fixed to an end face B3 in the Z2 direction. An opening H3 that connects the external space to the space 32A is formed on an end face U3 in the Z1 direction of the probe storage unit 200A. Although the opening H3 according to this embodiment has a cylindrical cross section, the cross-sectional shape of the opening H3 may be any shape. In this case, it is preferable that the central axis of the cross section of the opening H3 coincides with the axis Ax1, which is the central axis of the measurement probe 32. The measurement light L1 transmitted to the measurement probe 32 is irradiated onto the solution X through the opening H3, and the scattered light L2 scattered by the solution X is also collected on the measurement probe 32 through the opening H3. Furthermore, in order to prevent the laser light oscillated by the measurement probe 32 from leaking to the outside from any place other than the opening H3, it is preferable that no openings other than a through-hole for the optical fiber 38 (not shown) are provided in the space 32A. The shape of the space 32A is not limited to a cylindrical shape. It may also be a rectangular parallelepiped shape with a rectangular cross section.

[0051] Furthermore, a bearing portion BL into which the rotating shaft SF is inserted is formed at a position different from the opening H3 on the end face U3 in the Z1 direction of the probe storage unit 200A according to this embodiment. The bearing portion BL may have any structure, but the bearing portion BL according to this embodiment is a ball bearing whose inner diameter is set to match the outer diameter of the rotating shaft SF.

[0052] Next, the container storage unit 200B will be described. As shown in FIG. 7, the container storage unit 200B according to this embodiment is a member that stores a storage container 14 and a sample storage container 13 therein. Specifically, the container storage unit 200B is a cylindrical member with an open end face U4 in the Z1 direction. The container storage unit 200B also has a rotating shaft SF that extends in the Z2 direction from an end face B4 in the Z2 direction. The rotating shaft SF may be positioned at any position, but the container storage unit 200B according to this embodiment has the rotating shaft SF at a position where the central axis Ax2 of the rotating shaft SF coincides with the central axis of the cross section of the container storage unit 200B.

[0053] The container holder 200B also has multiple bases 22 on its inner circumferential surface in the Z2 direction. The number and positions of the bases 22 may be arbitrary, but the container holder 200B according to this embodiment has six bases 22 arranged at an equal angle α° around the central axis Ax2. An opening H4 with a cylindrical cross section that is conductive to the external space is formed at the axial center position of the inner circumferential surface of each base 22 on the end face of the inner circumferential surface in the Z2 direction of the container holder 200B. Although the opening H4 according to this embodiment has a cylindrical cross section, the cross-sectional shape of the opening H4 may be any shape. The measurement light L1 transmitted to the measurement probe 32 is irradiated onto the solution X through the openings H3 and H4, and the scattered light L2 scattered by the solution X is also collected on the measurement probe 32 through the openings H4 and H3. In the spectroscopic analysis system 1A of this embodiment, spectroscopic analysis is performed on the storage container 14 or the sample storage container 13 stored in the base 22 at a position where the axial center position of the opening H3 of the probe storage section 200A coincides with the axial center of the opening H4, among the multiple bases 22.

[0054] Fig. 8 is a cross-sectional view taken along the line AA in Fig. 7. As shown in Fig. 8, the container storage unit 200B according to this embodiment stores a plurality of storage containers 14A to 14C and a plurality of sample storage containers 13A to 13C alternately in six bases 22 arranged equiangularly around the central axis Ax2. By rotating the container storage unit 200B, the operator can align the axial center position of opening H4 in any of the container storage units 200B with the axial center position of opening H3 in the probe storage unit 200A (the central axis of the measurement probe 32, the position of the axis Ax1), and perform spectroscopic analysis of the sample storage container 13 or storage container 14 corresponding to the aligned opening H4.

[0055] (Method of calibrating measuring equipment) The flow of a method for calibrating a measurement device using the spectroscopic analysis system 1A described above will now be described. FIG. 9 is a flowchart illustrating the process flow of a method for calibrating a measurement device using the spectroscopic analysis system according to this embodiment. First, the operator determines the measurement conditions for solution Y containing a standard sample to be used for calibration and the threshold value for the intensity of the calculated Raman spectrum (step S30). The measurement conditions may be determined arbitrarily, but are preferably conditions related to the wavelength of the measurement light L1, the focal length FL of the measurement probe 32, and the probe distance Lb, which is determined by the thickness and material of the sample storage container 13. The threshold value may also be determined arbitrarily, but in this embodiment, the threshold value is determined based on the peak value of the Raman spectrum intensity calculated under the measurement conditions for solution Y, the wavenumber shift value at the calculated peak value of the Raman spectrum intensity, and the intensity difference from the normalized spectrum. The intensity difference from the normalized spectrum here refers to the following: the overall shape (intensity distribution) of a reference Raman spectrum (referred to as the normalized spectrum) is scored using any method; the difference between the overall shape of the calculated Raman spectrum and the overall shape of the normalized spectrum is calculated; and the difference is scored using the same method as for the normalized spectrum, resulting in the intensity difference from the normalized spectrum. These thresholds can be determined by any method; in this embodiment, the correlation between the standard sample and measurement conditions used for calibration and the acquired Raman spectrum is calculated through a preliminary experiment, and the thresholds are determined based on the results. Next, based on the determined measurement conditions, the sample storage container 13 and the storage container 14 are placed in the measurement jig (step S32). The operator then rotates the container storage section 200B to align the axial center position of the opening H4 of the container storage section 200B containing the sample storage container 13 with the axial center position of the opening H3 of the probe storage section 200A (the central axis of the measurement probe 32, the position of the axis Ax1), and uses the spectroscopic analysis device 10 to irradiate the solution Y containing the standard sample with measurement light L1, which is laser light, and obtain scattered light L2, which is Raman scattered light (step S34).Based on the acquired scattered light L2, the spectroscopic analyzer 10 calculates a Raman spectrum, and the peak value of the calculated Raman spectrum has an intensity decrease of more than 50% from the determined threshold value (step S36; No), or the wavenumber shift amount at the calculated peak value is compared with the wavenumber shift amount determined as the threshold value and the difference is ±2 cm. -1 If the calculated Raman spectrum is not within this range (step S38; No), or if the difference in intensity between the calculated Raman spectrum and the normalized spectrum is greater than 5% (step S40; No), the operator determines that there is a problem with the measurement device including the measurement probe 32, and inspects or replaces the device system (step S44). After that, the procedure returns to step S34 and calibration is performed again. Also, if the peak value of the intensity of the calculated Raman spectrum is found to be smaller than 50% of the intensity decrement from the determined threshold value (step S36; Yes), and the wavenumber shift amount at the calculated peak value is found to be within ±2 cm compared to the wavenumber shift amount determined as the threshold value, the difference is ±2 cm. -1 If the calculated Raman spectrum is within the range of 0.5% (step S38; Yes), and the intensity difference between the calculated Raman spectrum and the normalized spectrum is greater than 5% (step S40; Yes), the operator determines that there is no problem with the measurement device including the measurement probe 32, rotates the container storage unit 200B, aligns the axial center position of the opening H4 of the container storage unit 200B in which the storage container 14 is stored with the axial center position of the opening H3 of the probe storage unit 200A (the central axis of the measurement probe 32, the position of the axis Ax1), starts measurement of the solution X containing the measurement sample using the spectroscopic analyzer 10 (step S42), and ends this process. Note that if the criteria shown in steps S36, S38, and S40 (intensity reduction of 50% or less, difference from the threshold value of the wavenumber shift of ±2 cm) are met, -1 The above conditions (conditions such as the strength difference being less than 5% and the like) are examples and not essential conditions, and the criteria for judgment may be set arbitrarily.

[0056] (effect) As described above, the spectroscopic analysis system 1A according to this embodiment is equipped with the container changing mechanism CM, which makes it possible to change the positions of the sample storage container 13 storing the solution Y used to calibrate the measuring device and the storage container 14 storing the solution X relative to the measurement probe 32. According to the present disclosure, the component analysis of the solution X is performed after the soundness of the measuring device is confirmed by calibration, so that the spectroscopic analysis of the solution X can be performed with high accuracy.

[0057] Furthermore, according to the present disclosure, the measurement device can be easily calibrated, so that it is possible to obtain an indication of when to perform maintenance to maintain the health of the measurement device without disrupting the configuration of the measurement device once it has been installed.

[0058] (Third embodiment) Next, a third embodiment will be described. A spectroscopic analysis system 1B according to the third embodiment includes a housing 12 that houses a storage container 14, a measurement probe 32, and an adjustment mechanism AM, and differs from the first and second embodiments in that the housing 12 is provided in a high-dose area, and the light source unit 30, the detection unit 34, and the calculation unit 36 ​​are provided in a low-dose area where the air dose rate is lower than that of the high-dose area. Note that a description of the configuration of the third embodiment that is common to the first and second embodiments will be omitted.

[0059] The spectroscopic analysis system 1B according to this embodiment is installed in a nuclear facility such as a nuclear fuel reprocessing plant. The nuclear facility is provided with, for example, a wall W, which divides the facility into a high-dose area AR1 and a low-dose area AR2, the air dose rate of which is lower than that of the high-dose area AR1.

[0060] 10 is a schematic diagram of a spectroscopic analysis system according to this embodiment. As shown in FIG. 10, the spectroscopic analysis system 1B according to this embodiment includes a spectroscopic analyzer 10, a housing 12, a storage container 14, and an operation unit 18.

[0061] (Housing) The housing 12 is provided in the high-dose area AR1. The housing 12 has an internal space 12A that is closed off, and the space 12A is isolated from the outside air. For example, at least a portion of the walls of the housing 12 are formed of a transparent material, and the space 12A can be accessed from the outside via the operation unit 18.

[0062] (Operation unit) The operation unit 18 is a mechanism used by an operator to access the space 12A from outside the housing 12. At least a portion of the operation unit 18 is provided in the space 12A of the housing 12. In this embodiment, the operation unit 18 is a manipulator. The operation unit 18 includes a controller 18A, which is a mechanism operated by an operator, and an arm 18B that moves when operated by the operator. The controller 18A is provided outside the housing 12, and the arm 18B is provided in the space 12A of the housing 12. The arm 18B of the operation unit 18 moves when an operator outside the housing 12 operates the controller 18A. Note that although two operation units 18 are provided in FIG. 10 , the number of operation units 18 is arbitrary. Furthermore, the operation unit 18 is not limited to a manipulator and may be, for example, a glove that an operator can insert his or her hand into from the outside to access the internal space 12A. In this case, the housing 12 can be considered a glove box equipped with gloves.

[0063] In the spectroscopic analysis device 10 according to this embodiment, the measurement probe 32 is disposed in the high-dose area AR1, and the light source unit 30, the detection unit 34, and the calculation unit 36 ​​are disposed in the low-dose area AR2. The optical fiber 38 is provided across the range from the high-dose area AR1 to the low-dose area AR2.

[0064] (effect) As described above, the spectroscopic analysis system 1B according to this embodiment includes the housing 12 that houses the storage container 14, the measurement probe 32, and the adjustment mechanism AM. According to the present disclosure, the components of the solution X can be analyzed even in the high-dose area AR1.

[0065] According to the present disclosure, the system further includes an operation unit 18, which is a mechanism used by an operator to access the space 12A from outside the housing 12. This allows the operator to properly and safely analyze the solution X stored in the storage container 14 in the high-dose area AR1.

[0066] (Effects of the present disclosure) A spectroscopic analysis system 1 according to a first aspect of the present disclosure includes a storage container 14 for storing a solution X containing a radioactive substance, a light source unit 30 for emitting laser light, a measurement probe 32 for irradiating the solution X with the laser light and receiving scattered light L2 from the solution X, and an adjustment mechanism AM for adjusting a probe distance Lb between the storage container 14 and the measurement probe 32, where the measurement probe 32 is disposed outside the storage container 14. According to the present disclosure, component analysis of the solution X can be easily performed. Furthermore, since the measurement probe 32 is disposed outside the storage container 14, spectroscopic analysis can be performed without removing the sample from the container. Furthermore, since the measurement probe 32 does not come into contact with the solution X, the labor required to clean the measurement probe 32 during consecutive analysis tasks can be reduced. Furthermore, since there is no need to open the storage container 14 in which the solution X containing the radioactive substance is stored when changing the analysis target, the risk of radioactivity leakage can be reduced. Furthermore, by providing an adjustment mechanism AM that changes the probe distance Lb, the probe distance Lb can be set to a distance at which the intensity of the Raman spectrum acquired by the calculation unit 36 ​​is maximized. Furthermore, even if the water surface position of the solution X in the storage container 14 fluctuates after the probe distance Lb is determined, the probe distance Lb can be changed in accordance with the fluctuation. This allows spectroscopic analysis to be performed with high accuracy.

[0067] The spectroscopic analysis system 1 according to a second aspect of the present disclosure is the spectroscopic analysis system 1 according to the first aspect, and further includes a measurement jig that houses therein the storage container 14, the measurement probe 32, and the adjustment mechanism AM. According to the present disclosure, laser light other than the laser light irradiated onto the solution X is blocked, and scattering of the laser light outside the measurement jig 20 is suppressed, enabling safe component analysis.

[0068] A spectroscopic analysis system 1 according to a third aspect of the present disclosure is the spectroscopic analysis system 1 according to the second aspect, in which the adjustment mechanism AM has a base 22 fixed to the measurement jig 20 and a container fixing holder 24 that is movably provided relative to the base 22 and fixes the storage container 14. According to the present disclosure, the adjustment mechanism AM can fix the storage container 14 to the measurement jig 20 in a state in which the distance from the measurement probe 32 is changeable.

[0069] A spectroscopic analysis system 1A according to a fourth aspect of the present disclosure is the spectroscopic analysis system 1A according to any one of the first to third aspects, and includes a sample storage container 13 that stores a solution Y containing a standard sample used to calibrate a measurement probe 32, and a container changing mechanism CM that changes the position of the storage container 14 relative to the measurement probe 32 and the position of the sample storage container 13 relative to the measurement probe 32. According to the present disclosure, component analysis of solution X is performed after the soundness of the measurement device is confirmed by calibration, so that spectroscopic analysis of solution X can be performed with high accuracy. Furthermore, because the measurement device can be easily calibrated, it is possible to obtain an indication of the timing of maintenance to maintain the soundness of the measurement device without disrupting the configuration of the measurement device once it has been installed.

[0070] A spectroscopic analysis system 1B according to a fifth aspect of the present disclosure is the spectroscopic analysis system 1B according to any one of the first to third aspects, further comprising a housing 12 that houses a storage container 14, a measurement probe 32, and an adjustment mechanism AM, the housing 12 being provided in a high-dose area AR1, and the light source unit 30 being provided in a low-dose area AR2 where the air dose rate is lower than that of the high-dose area AR1. According to the present disclosure, component analysis of the solution X can be performed even in the high-dose area AR1. Furthermore, because the light source unit 30 is provided in the low-dose area AR2, deterioration of the device due to radioactivity from the light source unit 30 can be suppressed.

[0071] A spectroscopic analysis system 1 according to a sixth aspect of the present disclosure is the spectroscopic analysis system 1 according to any one of the first to third aspects, and further includes a calculation unit 36 ​​that disperses the Raman scattered light, which is the scattered light L2, and analyzes the components of the solution X by Raman spectroscopy. According to the present disclosure, the components of the solution X can be easily analyzed. Furthermore, by using Raman spectroscopy, it is possible to detect smaller particles in the solution X than with infrared spectroscopy, and in addition, it is possible to distinguish substances with high chemical specificity.

[0072] A spectroscopic analysis system 1 according to a seventh aspect of the present disclosure is the spectroscopic analysis system 1 according to the sixth aspect, in which a calculation unit 36 ​​calculates a Raman spectrum from the acquired Raman scattered light, and acquires an analysis result of the components of solution X by inputting the calculated Raman spectrum into a learning model M that has been machine-learned to determine the correspondence between the Raman spectrum and the components of solution X. According to the present disclosure, the components of solution X can be analyzed with high accuracy.

[0073] A component analysis method for solution X according to an eighth aspect of the present disclosure is a component analysis method for solution X using the spectroscopic analysis system 1 described in the first or second aspect, and includes the steps of determining a probe distance Lb based on the focal length FL of the measurement probe 32, adjusting the adjustment mechanism AM so that the distance between the storage container 14 and the measurement probe 32 becomes the determined probe distance Lb, irradiating the solution X with laser light to acquire scattered light L2, and analyzing the components of the solution X based on the acquired scattered light L2. According to the present disclosure, component analysis of solution X can be easily performed.

[0074] Although the embodiments of the present invention have been described above, the embodiments are not limited to the contents of these embodiments. Furthermore, the above-described components include those that can be easily imagined by a person skilled in the art, those that are substantially the same, and those that are within the scope of what is called equivalents. Furthermore, the above-described components can be combined as appropriate. Furthermore, various omissions, substitutions, or modifications of the components can be made without departing from the spirit of the above-described embodiments. [Explanation of symbols]

[0075] 1. Spectroscopic analysis system 10 Spectrometer 12. Case 14 Storage container 18 Control section 30 Light source section 32 Measuring probe 34 Detector 36 Arithmetic section 38 Optical Fiber AR1 High-dose area AR2 low dose area L1 measurement light L2 scattered light

Claims

1. a storage container for storing a solution containing a radioactive substance; a light source unit that irradiates laser light; a measurement probe that irradiates the solution with the laser light and receives light scattered by the solution; an adjustment mechanism for changing a probe distance, which is the distance between the storage container and the measurement probe; The measurement probe is disposed outside the storage container. Spectroscopic analysis system.

2. a measuring jig that houses the reservoir, the measurement probe, and the adjustment mechanism therein; The spectroscopic analysis system of claim 1 .

3. the adjustment mechanism includes a base portion fixed to the measurement jig, and a container fixing holder provided movably with respect to the base portion and fixing the storage container. The spectroscopic analysis system of claim 2 .

4. a sample storage container that stores a solution containing a standard sample used to calibrate the measurement probe; a container changing mechanism that changes the position of the storage container relative to the measurement probe and the position of the sample storage container relative to the measurement probe, The spectroscopic analysis system according to any one of claims 1 to 3.

5. a housing that houses the reservoir, the measurement probe, and the adjustment mechanism therein; The housing is provided in a high-dose area, and the light source unit is provided in a low-dose area where the spatial dose rate is lower than that of the high-dose area. The spectroscopic analysis system according to any one of claims 1 to 3.

6. The apparatus further includes a calculation unit that separates the Raman scattered light, which is the scattered light, and analyzes the components of the solution by Raman spectroscopy. The spectroscopic analysis system according to any one of claims 1 to 3.

7. the calculation unit calculates a Raman spectrum from the acquired Raman scattered light, and inputs the calculated Raman spectrum into a learning model that has undergone machine learning to determine a correspondence between the Raman spectrum and the components of the solution, thereby acquiring an analysis result of the components of the solution. The spectroscopic analysis system of claim 6 .

8. 3. A method for analyzing components of a solution using the spectroscopic analysis system according to claim 1 or 2, comprising: determining the probe distance based on a focal length of the measurement probe; adjusting the adjustment mechanism so that the distance between the reservoir and the measurement probe is the determined probe distance; irradiating the solution with the laser light and acquiring the scattered light; analyzing components of the solution based on the acquired scattered light; Including, Methods for analyzing the components of a solution.

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