Apparatus for detecting target analytes in a sample applied to a diffraction sensor

Abstract

The diffraction sensor detects at least one target analyte in the sample being analyzed, which is placed on the sensor. [Solution] The solution comprises a housing 101 defining a darkroom 102 inside; a support device 105 suitable for supporting and integrally holding the diffraction sensor 1, which is movable between the inside and outside of the darkroom 102; a laser source 103 suitable for emitting laser light having wavelengths in the visible spectrum within the darkroom 102; a screen 107 placed inside the darkroom 102; a visual system 111 configured to capture images on the screen 107; and a control unit operably connected to the laser source 103, the support device 105, and the visual system 111.

Description

Technical Field

[0001] The present invention relates to the field of detecting target analytes in a sample applied to a diffraction sensor, and more particularly to an apparatus for analyzing a diffraction image generated by such a diffraction sensor and then determining the presence or absence of a required target analyte.

[0002] The term "target analyte" means any chemical species whose presence in a sample is to be determined.

[0003] The present invention is particularly applicable to the detection of target analytes such as viruses or bacteria, or their components (e.g., nucleic acids, protein components, etc.), but can also be applied to the detection of other types of target analytes, and thus, as will be described in more detail below, not only in the medical, veterinary, and diagnostic fields, but also, for example, in the biosafety field or the chemical field, particularly for the detection of trace amounts of contaminants.

Background Art

[0004] Diffraction sensors are known that can change the diffraction image generated when placed in contact with a sample containing a specific target analyte.

[0005] For example, referring to FIG. 1, which is hereby incorporated by reference in its entirety, European Patent Application No. 24164097.8 filed by the applicant describes a diffraction sensor 1 for detecting a general target analyte or a plurality of target analytes. The sensor 1 preferably includes a diffraction layer 3 having a diffraction grating 30 with a nanostructured, i.e., a diffraction structure having a depth on the order of tens to hundreds of nanometers, on a transparent or translucent support layer 2. The diffraction layer 3 includes a plurality of equal surface areas, i.e., the diffraction grating 30 has the same structure, and the diffraction grating 30 has grooves forming a pattern with a random pattern that is equally repeated in each surface area. A protective layer 4 may be provided to protect the diffraction grating 30.

[0006] The diffraction grating 30 of the diffraction layer 3 allows a monochromatic polarized beam (laser) to pass through the sensor 1, and such a light beam is diffracted into a diffraction pattern visible to the naked eye, as shown in Figure 2, for example. Such a diffraction pattern consists of multiple dots whose distribution is repeated within the surface region, depending on the structure of the diffraction grating 30.

[0007] The diffraction sensor 1 also includes a receptor layer 5 superimposed on the diffraction layer 3. The receptor layer 5 can selectively bind to the target analyte to be detected and cannot bind to substances of different properties. The target analyte may be contained in a sample, such as a clinical specimen such as a biological solution (e.g., a saliva, blood, or urine sample), and may be deposited on the receptor layer 5, for example, coated or rubbed onto it. The target analyte may be insoluble in the sample rather than in the solution.

[0008] In this way, if the target analyte is not present in the sample, the receptor layer 5 remains unchanged, and the diffraction sensor 1 generates a first reference diffraction pattern on the screen that can be seen with the naked eye when exposed to the laser beam. On the other hand, if the target analyte is present in the sample, the target analyte binds to the receptor layer 5, and as a result, the diffraction sensor 1 generates a verification diffraction pattern that is different from the reference diffraction pattern always visible to the naked eye, but is comparable to it. Figure 3 shows a comparison of the diffraction patterns generated when the target analyte is absent (Figure 3a)) and when the target analyte is present and bound to the receptor layer 5 (Figure 3b)). As can be seen from the figure, the number and / or distribution and / or light intensity of the dots visible in the diffraction patterns of the first and second cases are different. Therefore, by comparing the two diffraction patterns, it is possible to determine whether the target analyte is present in the sample and whether it has bound to the receptor layer 5 of the diffraction sensor 1.

[0009] Generally, when the target analyte is an antigen, the receptor layer 5 may contain an antibody that is specific to that antigen and cannot bind to any antigen other than the target antigen intended to be detected by the diffraction sensor 1. This antibody is firmly bound to the diffraction layer 3.

[0010] The receptor layer 5 is configured to selectively bind to multiple different target analytes in different regions of the receptor layer 5, and the resulting diffraction pattern differs depending on the bound target analyte and, possibly, the amount thereof. For example, the receptor layer 5 may contain different antibodies positioned to selectively bind to different target antigens. [Overview of the project]

[0011] Therefore, an object of the present invention is to provide an apparatus for detecting a target analyte in a sample placed on a diffraction sensor, not limited to but for example of the type described in European Patent Application No. 24164097.8 above, which enables such detection to be performed automatically or semi-automatically in a simple, fast, and reliable manner.

[0012] This and other objectives are achieved by an apparatus for detecting at least one target analyte in a sample applied to the diffraction sensor described in claim 1.

[0013] The dependent claims define possible and advantageous embodiments of the present invention. [Brief explanation of the drawing]

[0014] To better understand the present invention and its advantages, several non-limiting exemplary embodiments of the invention are described below with reference to the accompanying drawings. [Figure 1] This is a schematic diagram of a diffraction sensor of the type described in European Patent Application No. 24164097.8. [Figure 2] The possible diffraction patterns generated by the diffraction sensor shown in Figure 1 are illustrated. [Figure 3a)] Figure 1 shows two possible diffraction patterns generated by the diffraction sensor, one in the absence of the target analyte in the sample to which the diffraction sensor itself was applied, and the other in the presence of the target analyte. [Figure 3b)]Figure 1 shows two possible diffraction patterns generated by the diffraction sensor, one in the absence of the target analyte in the sample to which the diffraction sensor itself was applied, and the other in the presence of the target analyte. [Figure 4] This is a schematic diagram of an apparatus for detecting a target analyte in a sample applied to a diffraction sensor, according to one possible embodiment of the present invention. [Figure 5] This is a perspective view of an apparatus for detecting a target analyte in a sample, applied to a diffraction sensor according to a possible structural embodiment of the present invention. [Figure 6] Figure 5 is a perspective view of the apparatus partially disassembled. [Modes for carrying out the invention]

[0015] Referring to the attached Figure 4, the diffraction sensor 1, for example, the device for detecting a target analyte in a sample applied to the diffraction sensor in Figure 1, is collectively referred to as reference number 100.

[0016] The apparatus 100 comprises a housing 101 that is sized to fit as a box suitable for placement on a flat surface, such as a table. The housing 101 defines a darkroom 102 inside.

[0017] The apparatus 100 includes a laser source 103, which may be positioned at least partially within the darkroom 102 so that it can emit a beam of laser light within the darkroom 102. For example, the laser light emitted by the laser source 103 may have a wavelength λ equal to 532 nm (green light), but more generally, the laser source 103 can emit laser light having any wavelength in the visible spectrum (typically 390 nm to 700 nm). The laser source 103 may optionally be equipped with a shutter 104 so that the size of the laser light beam can be changed.

[0018] The apparatus 100 further comprises a support device 105 suitable for supporting the diffraction sensor 1. Advantageously, the support device 105 is adapted so that the diffraction sensor 1 can be reversibly fixed and held, for example, stapled, so that the support device 105 and the diffraction sensor 1 are solidly movable. For example, the support device 105 may include a slit 125 into which the diffraction sensor 1 can be inserted, which can be cantilevered. The support device 105 is translationally (horizontally and / or vertically) movable within the dark chamber 102, between the inside of the dark chamber 102 and its outside, i.e., outside the housing 101. The support device 105 is also vertically movable so that the position of the diffraction sensor 1 relative to the laser source 103 inside the dark chamber 102 can be changed. According to one embodiment, the support device 105 is also rotatably movable, or comprises a rotatably movable portion 115, to change the spatial orientation of the diffraction sensor 1 integrated with it. For example, the movable portion 115 may comprise a slit 125.

[0019] The laser source 103 and support device 105 are preferably spatially oriented so that the laser beam strikes the diffraction sensor at a 90° angle, but different beam angles are also possible. Referring to the example in Figure 1, the laser beam strikes the outer surface of the receiving layer 5 to which the sample is applied, preferably at a 90° angle.

[0020] To allow the support device 105 to enter and exit the darkroom 102, the housing 101 is advantageously provided with an opening 106 that can be automatically closed in some cases.

[0021] The device 100 further includes a screen 107 within the darkroom 102 onto which the diffraction image of the diffraction sensor 1 is projected when hit by the laser light beam emitted by the laser source 103. The screen 107 is preferably arranged such that the surface onto which the diffraction image is projected is oriented at 90° with respect to the laser light beam. The screen 107 may be, for example, opaque and may include, for example, a polyester layer preferably having a thickness of less than 500 μm, more preferably less than 300 μm, for example, a thickness equal to about 270 μm. Optionally, the screen 107 may comprise optical means for optical amplification, such as one or more layers of photonic crystals, in order to amplify the brightness of the diffraction image generated by the diffraction sensor. Advantageously, the distance of the screen 107 from the support device 105 is adjustable either manually or automatically so as to optimize the focus of the diffraction image generated on the screen 107 by the diffraction sensor 1.

[0022] Preferably, referring to the normal operating conditions of the device 100, the laser source 103, the support device 105, and the screen 107 are arranged in this order from top to bottom within the darkroom 102 as shown in FIG. 4. Alternatively, different spatial orientations may be provided as will be apparent to those skilled in the art.

[0023] The device 100 further includes a vision system capable of capturing the diffraction image generated by the diffraction sensor 1. For example, the vision system may include a video camera 111 directed towards the screen 107. Alternatively, the vision system may be incorporated into the screen 107 and may then acquire the diffraction image itself without the aid of a camera. Optionally, the vision system may be capable of directly focusing the image onto the sensor.

[0024] According to one possible embodiment, the device 100 includes a temperature control system 112 configured to maintain the temperature within the darkroom 102 in the vicinity of the support device 105 within a predetermined temperature range, for example, 4°C to 40°C, particularly 25°C to 35°C. Such a temperature control system 112 may include, for example, a temperature sensor and heating means and / or cooling means.

[0025] According to one embodiment, the apparatus 1 comprises a device 108 for cleaning the diffraction sensor 1, preferably arranged outside the darkroom 102. The cleaning of the diffraction sensor 1 is carried out for the purpose of removing substances or molecules or contaminants other than the target analyte from the receiving layer 5 after the application of the sample for which the target analyte is sought to the diffraction sensor 1, and these, even if only as background noise, can interfere with the generated diffraction image. The cleaning can be carried out, for example, by the use of a buffer solution, an ionic or non-ionic surfactant, or a mild surfactant. If the receiving layer 5 contains an antibody or other protein, the cleaning can be carried out, for example, by the use of PBS (phosphate buffered saline), optionally with the addition of a mild surfactant such as a non-ionic surfactant, by immersion, and optionally by subsequent centrifugation of the sensor. For this purpose, the cleaning device 108 may further comprise a suitable hydraulic circuit 118 for the supply and delivery of the cleaning fluid, and in addition, a collection tank for the residual cleaning fluid 128 (see FIGS. 5 and 6 in this regard).

[0026] According to one possible embodiment, the apparatus 100 further comprises a device 109 for drying the diffraction sensor 1 following the aforementioned cleaning. The drying device 109 can be separate from the cleaning device 108 or, preferably, can be integrated with the cleaning device outside the darkroom 102. The drying device 109 may comprise, for example, a compressed air dispenser that is optionally heated.

[0027] According to one embodiment, the apparatus 100 includes a reader 110 configured to detect a code (e.g., a numeric or alphanumeric code, or a barcode, or a QR code) placed on the diffraction sensor or its container, the code having characteristics that provide necessary information relating to an analysis that can be performed, such as the type and quantity of a target analyte that can be detected, thereby enabling the apparatus 100 to move its part to perform a search for a desired target analyte and acquire a diffraction pattern in an appropriate manner, as will be described in more detail below.

[0028] The apparatus 100 comprises a control unit operably connected to at least a laser source 103, a support device 105 (and optionally a movable part thereof 115), and a vision system, as well as at least one of optionally a shutter 104, a closable opening 106, a screen 107, a cleaning device 108, a drying device 109, a reader 110, and a temperature control system 112. The control unit is configured to manage the automatic or semi-automatic operation of the apparatus 100. The control unit may be implemented by a hardware device (such as a control unit), by software, or by a combination of hardware and software. It may be integrated into the apparatus 100 and connected to an external computer 200, or may be part of the external computer 200. The control unit and / or the computer 200 equipped with or connected to the control unit may be operablely connected to a portable device 300, such as a mobile phone or smartphone, via a data network, for example, and this portable device may be loaded with applications for, for example, remote control of the apparatus 100 and / or for making available sample analysis performed by the apparatus 100 itself. The computer 200 and / or portable device 300 can also function as an interface between the apparatus 100 and the operator.

[0029] The control unit starts with the support device 105 outside the darkroom 102 and the diffraction sensor 1 placed on it without the sample to be analyzed being applied, - It is configured to receive information regarding the diffraction sensor 1. This information can be manually entered by an operator, for example, via a computer 200 and / or via a portable device 300, or it can be automatically detected by a reader 110, if present, by detecting a code marked on the diffraction sensor 1 or its container and then determining information regarding the diffraction sensor. -The support device 105 having a diffraction sensor, which lacks the sample to be analyzed inside the darkroom 102, can be moved and positioned relative to the laser source 103 and screen 107, for example, determined based on previously received information. At this stage, the control unit can also command the opening 106 of the housing 101 to move from a closed position to an open position and then return to the closed position after the support device 105 having the diffraction sensor 1 has passed through. -The laser source 103 can be commanded to strike the diffraction sensor 1 on the support device 105 with a laser beam having defined characteristics (for example, having a specific wavelength and amplitude which can be set by commanding the shutter 104), and the visual system can be commanded to detect a reference diffraction pattern projected by the diffraction sensor 1 when no sample is present on the screen 107. While detecting the reference diffraction pattern, the control unit can further move the support device 105 and / or the screen 107 to change their relative distance, and thus precisely focus the reference diffraction pattern on the screen 107. - The support device 105, which has a diffraction sensor 1 without the sample to be analyzed, can be moved outside the darkroom 102 so that the sample to be analyzed is applied to it. At this stage, the control unit can command the opening 106 of the housing 101 to move from the closed position to the open position to allow the support device 105 with the diffraction sensor 1 to pass through, and then to return to the closed position after its passage. -The cleaning device 108 can be controlled to clean the diffraction sensor 1 to remove any substances, molecules, or contaminants present on the diffraction sensor other than the target analyte fixed to the receiving layer 5 of the diffraction sensor in Figure 1, if present. Optionally, the control unit can be configured to rotate the support device 105 or a portion thereof 115 so that the diffraction sensor is tilted, for example, 90° during cleaning (so that the surface of the receiving layer 5 is vertically positioned), thereby facilitating the flow of cleaning residue and detergent solution. Depending on the positioning of the cleaning device 108, the control unit can further command the support device 105 to position itself relative to the cleaning device 108. -If present, the drying device 109 can be instructed to dry the diffraction sensor 1 after cleaning. Depending on the positioning of the support device 105, the control unit can further instruct the drying device 109 to position itself relative to the support device. Optionally, the control unit may rotate the support device after drying to return it to its pre-cleaning orientation (for example, with the surface of the receiving layer 5 horizontal). -The support device 105 having the diffraction sensor 1 to which the sample to be analyzed is applied is moved inside the darkroom 102 and positioned in the same default position relative to the laser source 103 and the screen 107. At this stage, the control unit can also command the opening 106 of the housing 101 to move from the closed position to the open position, and then return to the closed position after the support device 105 having the diffraction sensor 1 has passed through. -The laser source 103 can be instructed to strike the diffraction sensor 1 with a beam of laser light having the same defined characteristics as used to detect the reference diffraction pattern, and the visual system can be instructed to detect the verification diffraction pattern generated by the diffraction sensor 1 with the sample applied. During the detection of the verification diffraction pattern, the control unit can further move the support device 105 and / or screen 107 to change their relative distance, and thus precisely focus the verification diffraction pattern on the screen 107. - The verification diffraction pattern can be compared with the reference diffraction pattern. This comparison can be performed, for example, by analyzing the dots in each diffraction pattern and comparing their number and / or distribution and / or light intensity. - If the verification diffraction pattern differs from the reference diffraction pattern, the presence of the target analyte in the sample can be determined.

[0030] If the diffraction sensor 1 can selectively couple to multiple target analytes (as described above, i.e., information from the diffraction sensor which can be manually provided to the control unit via the computer 200 and / or portable device 300, or automatically via the reader 110), then the diffraction patterns generated in the presence of each of these detectable target analytes will be different from each other and also different from the reference diffraction pattern. In such a case, the control unit may be configured to compare the verification diffraction pattern generated by the diffraction sensor with a sample to which multiple stored diffraction patterns (each corresponding to a specific target analyte and / or optionally one or more of its defined quantities: i.e., for the same target analyte, a series of diffraction patterns are stored, each representing an amount or range of the target analyte in the sample) have been applied, and to determine the presence of a particular target analyte among the multiple target analytes detectable by the diffraction sensor if the verification diffraction pattern generated by the diffraction sensor matches the stored diffraction pattern and optionally that specific quantity for that particular target analyte.

[0031] Preferably, the control unit is configured to move the support device 105 having the diffraction sensor 1 again, along with the sample outside the darkroom 102, for removal from the support device 105 at the end of the analysis. In this way, new analyses of additional samples can be performed in the same manner as described above.

[0032] Figures 5 and 6 show possible structural embodiments of the apparatus 100. The numerical references of the elements shown in these figures correspond to those shown in the schematic diagram of the apparatus in Figure 4.

[0033] The apparatus according to the present invention can find applications in a variety of fields, and some non-limiting examples are shown below. - Diagnosis in the medical or veterinary fields: ○ Diagnosis of bacteria (Lyme disease, brucellosis, syphilis, etc.), viruses (HIV, hepatitis A, B, C, etc.), fungi (or the presence of pathogenic fungi such as Candida and Aspergillus), and parasitic infectious agents (filariasis, leptospirosis, rehismannia, giardiasis, trypanosoma) by demonstrating the pathogen or its components; ○ Detection of viruses (coronavirus, HIV, hepatitis, Ebola, norovirus, influenza, West Nile virus, Zika virus, poxvirus, dengue virus, etc.); ○ Diagnosis of autoimmune diseases caused by the abnormal production of autoantibodies or antibodies by the immune system associated with specific diseases, through the demonstration of specific clinically validated markers (e.g., autoantibodies that destroy insulin-producing cells in the pancreas in type 1 diabetes); ○ Detection and quantification of hormones (e.g., human chorionic gonadotropin (hCG), follicle-stimulating hormone (FSH), testosterone); ○ (For example, screening for blood donation to detect viral drugs such as HIV,) ○ Detection of drugs (e.g., amphetamines, cocaine); ○ Detection of tumor markers (e.g., prostate-specific antigen (PSA) for the diagnosis of prostate cancer); ○ Diagnosis in the field of veterinary medicine (e.g., detection of pathogens that cause African swine fever virus, avian influenza, bovine parvovirus, canine adenovirus, coronavirus, equine infectious anemia, feline leukemia, etc.). -DNA research; - Non-diagnostic use: ○ Biosecurity: ■ Monitoring for infectious diseases; ■ Inspection of biological weapons / bioterrorism; ■ Testing of cosmetics (e.g., testing for metal contamination); ○Detection of contaminants: ■Detection and screening of contaminants in food (e.g., Salmonella, Escherichia coli, Campylobacter, Staphylococcus aureus); ■ Detection and screening of environmental pollutants (e.g., detection of heavy metals in water or soil); ■Detection of pesticides; ■ Detection of explosives (for example, detection of nitrates using specific enzymes such as nitrate reductase).

[0034] With respect to the above-described apparatus for detecting a target analyte in a sample applied on a diffraction sensor, a person skilled in the art can add, modify, or replace a number of elements having functionally equivalent elements without departing from the scope of the appended claims to satisfy certain incidental needs.

Claims

1. A device (100) for detecting at least one target analyte in a sample to be analyzed, which is applied to a diffraction sensor (1), - A housing (101) that defines a darkroom (102) inside, - A support device (105) suitable for supporting and integrally holding the diffraction sensor (1), wherein the support device (105) is movable between the inside and outside of the dark chamber (102) within the dark chamber (102), - A laser source (103) suitable for emitting laser light having wavelengths in the visible spectrum within the darkroom (102), - The screen (107) placed inside the darkroom (102), - A visual system (111) configured to capture an image on the screen (107), - A control unit operably connected to the laser source (103), the support device (105), and the vision system (111), - Starting from a state in which the support device (105) is positioned outside the dark chamber (102) and the diffraction sensor (1) lacking the sample to be analyzed is positioned on the support device (105), the support device (105) is moved inside the dark chamber (102) to position it in a predetermined position relative to the laser source (103) and the screen (107), - The laser source (103) is instructed to strike the diffraction sensor (1), which lacks the sample to be analyzed, with a laser beam having defined characteristics, such that the diffraction sensor (1), which lacks the sample to be analyzed, is struck by a laser beam, and the diffraction sensor (1), which lacks the sample to be analyzed, projects a reference diffraction pattern onto the screen (107), wherein the reference diffraction pattern is visible to the naked eye and includes a plurality of dots. - Commanding the visual system (111) to detect the reference diffraction pattern, - To apply the sample to be analyzed to the diffraction sensor (1), the support device (105) is moved outside the darkroom (102), - The support device (105) having the diffraction sensor (1) to which the sample to be analyzed is applied is moved inside the dark chamber (102) and repositioned to the predetermined position relative to the laser source (103) and the screen (107), - The diffraction sensor (1) having the applied sample to be analyzed, to which a laser beam strikes, is commanded to the laser source (103) to strike the diffraction sensor (1) having the applied sample to be analyzed with the same defined characteristics, so as to project a verification diffraction pattern onto the screen (107), wherein the verification diffraction pattern is visible to the naked eye and includes a plurality of dots. - The verification diffraction pattern is compared with the reference diffraction pattern by comparing the number and / or distribution and / or light intensity of the plurality of dots in the verification diffraction pattern and the reference diffraction pattern, Apparatus (100) comprising: a control unit configured to determine the presence of at least one target analyte in the sample being analyzed if the verification diffraction pattern differs from the reference diffraction pattern.

2. The apparatus (100) according to claim 1, wherein the laser source (103) comprises a shutter (104) configured to change the size of the laser beam, and the control unit is configured to control the shutter (104).

3. The apparatus (100) according to claim 1 or 2, wherein the control unit is configured to move the support device (105) within the dark chamber (102) so as to adjust the distance of the diffraction sensor (1) to the laser source (103).

4. The apparatus (100) according to any one of claims 1 to 3, wherein the housing (101) has a closable opening (106) for allowing the support device (105) to pass between the inside and outside of the dark chamber (102), and the control unit is configured to control the opening (106) of the housing (101) to move from a closed position to an open position while the support device (105) passes between the inside and outside of the dark chamber (102).

5. The apparatus (100) according to any one of claims 1 to 4, wherein the visual system comprises a camera (111) directed toward the screen (107) or is integrated into the screen (107).

6. The apparatus (100) according to any one of claims 1 to 5, further comprising a temperature control system (112) operably connected to the control unit and controlling the temperature inside the dark chamber (102) near the support device (105) to be maintained within a predetermined temperature range.

7. The apparatus (100) according to any one of claims 1 to 6, further comprising a reader (110) configured to detect the diffraction sensor (1) or a code disposed on its package and to identify the characteristics and information of the diffraction sensor (1), wherein the control unit is operably connected to the reader (110) to receive the characteristics and information of the diffraction sensor (1).

8. The apparatus (100) according to any one of claims 1 to 6, wherein the control unit is operably connected to a computer (200) and / or a mobile device (300) and configured to receive manually input diffraction sensor characteristics and information from them.

9. The apparatus (100) according to claim 7 or 8, wherein the control unit is configured to determine the predetermined position of the support device (105) relative to the laser source (103) and the screen (107) based on the characteristics and information of the diffraction sensor.

10. The apparatus (100) according to any one of claims 1 to 9, wherein the diffraction sensor (1) is configured to selectively bind to the at least one target analyte, and the apparatus (100) further comprises a diffraction sensor cleaning device (108) operably connected to the control unit, the control unit is further configured to control the cleaning device (108) to perform cleaning on the diffraction sensor (1) to remove substances, molecules, or contaminants other than the target analyte after applying the sample to be analyzed onto the diffraction sensor (1) and before acquiring the verification diffraction pattern.

11. The apparatus (100) according to any one of claims 1 to 10, wherein the support device (105) is further rotatably movable or comprises a rotatably movable portion (115), and the control unit is further configured to rotate the support device (105) or the rotatably movable portion (115) of the support device (105) to tilt the diffraction sensor (1) before and / or during cleaning.

12. The apparatus (100) according to claim 10 or 11, further comprising a device (109) for drying the diffraction sensor (1) operably connected to the control unit, wherein the control unit is further configured to control the drying device (109) to perform drying of the diffraction sensor (1) with the applied sample to be analyzed, following the washing.

13. The apparatus (100) according to any one of claims 1 to 12, wherein the control unit is further configured to move the support device (105) and / or the screen (107) to change their relative distance and to perform focusing of the reference diffraction pattern and / or the verification diffraction pattern on the screen (107) while it is being acquired by the visual system.

14. The diffraction sensor (1) is configured to selectively bind to a plurality of target analytes, and the control unit is - The verification diffraction pattern, which is different from the reference diffraction pattern, is compared with multiple stored diffraction patterns, each corresponding to a specific target analyte among the multiple target analytes. The apparatus (100) according to any one of claims 1 to 13, further configured to determine the presence of a particular target analyte among the plurality of target analytes if the verification diffraction pattern matches the stored diffraction pattern for the particular target analyte.

15. The control unit is - The verification diffraction pattern, which is different from the reference diffraction pattern, is compared with multiple stored diffraction patterns, each corresponding to a specific range of the target analyte quantity. The apparatus (100) according to any one of claims 1 to 14, further configured to estimate the target analytes of a plurality of target analytes if the verification diffraction pattern matches the stored diffraction pattern for the target analytes in a specific range.

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