Method and apparatus for inspecting and repairing dents in a calender roller on the spot.

Abstract

While the calendar roller is incorporated into the calendar roller system, systems and methods for mapping and / or repairing the surface of the calendar roller are described. [Solution] A method for mapping and repairing the surface of a calender roller may include providing a calender roll system equipped with a calender roller, mapping the surface profile of the calender roller, identifying recessed areas on the surface of the calender roller based at least partially on the surface profile, and depositing material in the recessed areas. A system for mapping and repairing the surface of a calender roller is also described.

Description

[Technical Field]

[0001] [Cross-reference of related applications] This application claims priority to U.S. Patent Application No. 18 / 830,482, filed on September 10, 2024, entitled “METHOD AND DEVICE FOR IN PLACE CALENDAR ROLLER DENT INSPECTION AND REPAIR,” the technical disclosure of which is incorporated herein by reference in its entirety for all purposes.

[0002] This disclosure relates in general to a calendar roll system, and more particularly to a method and process for mapping and repairing calendar rollers in a calendar roll system. [Background technology]

[0003] Calender rollers are used to form films, such as electrode films in energy storage devices. The materials used to form these films may include hard materials, such as electrode active materials for batteries. Calendering such hard materials can result in defects (e.g., scratches, dents) on the surface of the calender roller. These surface defects can lead to variations in film thickness across the film's width or other imperfections. Conventional methods for identifying and repairing surface defects in calender rollers require removing the calender rollers from the calender roller system, which is time-consuming. Therefore, improved inspection and repair methods are needed. [Overview of the project]

[0004] For the purpose of summarizing the advantages achieved beyond this disclosure and the prior art, specific purposes and advantages of this disclosure are described herein. Not all such purposes or advantages are necessarily achieved in any particular embodiment. Accordingly, it will be understood by those skilled in the art that, for example, the present invention may be embodied or implemented to achieve or optimize one advantage or set of advantages as taught herein without necessarily achieving other purposes or advantages that may be taught or suggested herein.

[0005] All of these embodiments are intended to fall within the scope of the invention disclosed herein. These embodiments and other embodiments will be readily apparent to those skilled in the art from the following detailed description of preferred embodiments with reference to the accompanying drawings, and the invention is not limited to any particular preferred embodiment disclosed.

[0006] In a first embodiment, a process for repairing the surface of a calender roller is disclosed. The process includes preparing a calender roll system comprising a calender roller, mapping the surface profile of the calender roller, identifying recessed areas on the surface of the calender roller based at least partially on the surface profile, and depositing material in the recessed areas.

[0007] In some embodiments, mapping the surface profile of a calender roller includes rotating the calender roller, measuring a first circumferential surface profile of the calender roller at a first longitudinal position, measuring a second circumferential surface profile of the calender roller at a second longitudinal position, and combining the first and second circumferential surface profiles to form a surface profile of the calender roller, where the first and second longitudinal positions are along the length of the calender roller.

[0008] In some embodiments, mapping the surface profile of the calendar roller includes measuring a first longitudinal surface profile at a first circumferential position, measuring a second longitudinal surface profile at a second circumferential position, and combining the first longitudinal surface profile and the second longitudinal surface profile to form the surface profile of the calendar roller, wherein the first and second circumferential positions are along the circumference of the calendar roller.

[0009] In some embodiments, the process further includes polishing the deposited material to conform to the surface of the calendar roller. In some embodiments, the process further includes mapping a second surface profile of the calendar roller after depositing the material. In some embodiments, rotating the calendar roller includes rotating the calendar roller at a peripheral speed within the range of 0.1 m / min to 50 m / min. In some embodiments, combining includes aligning the first and second circumferential surface profiles. In some embodiments, the recessed region includes a deepest point having a depth greater than about 10 μm. In some embodiments, the recessed region has an area greater than about 10 mm In some embodiments, depositing the material includes electroplating the recessed region with a metal or an alloy. In some embodiments, depositing the material includes contacting the recessed region with a metal-containing solution. In some embodiments, the metal-containing solution includes Co, Ni, Fe, Mn, Mg, Ti, Al, Ca, Ti, Cr, Cu, Si, V, Zn, Au, Ag, W, or combinations thereof. In some embodiments, depositing the material includes depositing a metal in the metal-containing solution on the recessed region. In some embodiments, the process further includes depositing a coating layer over the deposited material. In some embodiments, the coating layer includes nickel tungsten.

[0010] In a second aspect, a system for mapping a calendar roller is disclosed. The system for mapping a calendar roller includes a calendar roller system having a calendar roller with a roller surface and a shaft, a surface mapping device including a surface shape measuring device disposed on a rail parallel to the shaft of the calendar roller, attachment means configured to removably attach the surface mapping device to the calendar roller system, and a detection element configured to coordinate the rotation of the calendar roller and the position of the surface shape measuring device.

[0011] In some embodiments, the detection element includes an incremental encoder. In some embodiments, the detection element includes a calendar roller encoder. In some embodiments, the detection element includes a rotation recording element and a reference disposed on the roller surface. In some embodiments, the surface shape measuring device includes a color sensor, a step sensor, or a combination thereof. In some embodiments, the mapping device further includes a defect position identifying unit. In some embodiments, the defect position identifying unit includes a laser. In some embodiments, the calendar roller system includes a film calendared on the roller surface.

[0012] In a third embodiment, a process for repairing and using a calender roller is disclosed. The process for repairing and using a calender roller includes preparing a calender roll system comprising a calender roller, mapping the surface profile of the calender roller, identifying recessed areas on the surface of the calender roller based at least partially on the surface profile, depositing a metal-containing repair material into the recessed areas, and calendering an electrode film material comprising a metal-containing electrode active material to form an electrode film, wherein the metal is selected from the group consisting of Co, Ni, Fe, Mn, Mg, Ti, Al, Ca, Ti, Cr, Cu, Si, V, Zn, Au, Ag, W, and combinations thereof. In some embodiments, the metal is selected from the group consisting of Co, Ni, and combinations thereof. In some embodiments, the electrode active material is a cathode active material. [Brief explanation of the drawing]

[0013] [Figure 1] This is a perspective view of a calendar roll system 100 according to several embodiments.

[0014] [Figure 2] This is a schematic flowchart of process 200 for mapping and repairing the surface of a calendar roller according to several embodiments.

[0015] [Figure 3] This is a schematic flowchart of process 300 for mapping the surface of a calendar roller according to several embodiments.

[0016] [Figure 4] This is a schematic flowchart of process 400 for mapping the surface of a calendar roller according to several embodiments.

[0017] [Figure 5]This is a schematic flowchart of process 500 for mapping the surface of a calendar roller according to several embodiments.

[0018] [Figure 6] This is a schematic flowchart of process 600 for combining multiple cross-sectional profiles of a calendar roller according to several embodiments.

[0019] [Figure 7] This is a schematic flowchart of process 700 for repairing the surface of a calendar roller according to several embodiments.

[0020] [Figure 8] This is a schematic flowchart of process 800 for repairing the surface of a calendar roller according to several embodiments.

[0021] [Figure 9] This is a schematic flowchart of process 900 for repairing the surface of a calender roller according to several embodiments.

[0022] [Figure 10A] This is a schematic perspective view of system 1000 for mapping the surface of a calendar roller according to several embodiments.

[0023] [Figure 10B] This is a schematic side view of system 1000 for mapping the surface of a calendar roller according to several embodiments.

[0024] [Figure 11] This is a schematic top view of the relative positions of the roller and the measuring unit 1102 before mapping begins, according to several embodiments.

[0025] [Figure 12] This is a schematic perspective view of system 1200 for mapping the surface of a calendar roller according to several embodiments.

[0026] [Figure 13] This is a schematic diagram of an electroplating unit 1300 for an electroplating process according to several embodiments.

[0027] [Figure 14A] These are images of recessed areas on the surface of a calender roller according to several embodiments.

[0028] [Figure 14B] These are images of films formed using a calender roller having a recess according to several embodiments.

[0029] [Figure 15] This is a plot combining circumferential surface profiles from several embodiments along the length of the calender roller.

[0030] [Figure 16] This is a surface profile plot after combining the circumferential surface profiles of several embodiments shown in Figure 15.

[0031] [Figure 17] This is a plot of the surface profile of a calender roller according to several embodiments.

[0032] [Figure 18A] These are images of recessed areas on the surface of a calender roller according to several embodiments.

[0033] [Figure 18B] These are images of the dented area after repair according to several embodiments.

[0034] [Figure 18C] This is a plot of the surface profile of a calendar roller before repair according to several embodiments.

[0035] [Figure 18D] This is a plot of the surface profiles of the same calender roller after repair according to several embodiments.

[0036] [Figure 19A] This is a plot of the surface profile of a different calender roller before repair according to several embodiments.

[0037] [Figure 19B] This is a plot of the surface profile of a calender roller after electroplating according to several embodiments.

[0038] [Figure 20A] This is a plot of the surface profile of a different calender roller before repair according to several embodiments.

[0039] [Figure 20B] This is a plot of the surface profile of a calender roller after electroplating according to several embodiments.

[0040] [Figure 21A] This is a plot of the surface profile of a calendar roller with an encoder mounted on the main frame, according to several embodiments.

[0041] [Figure 21B] This is a plot of the surface profile of a calendar roller in which an encoder, according to several embodiments, is mounted on a frame separated from the main frame. [Modes for carrying out the invention]

[0042] The following detailed descriptions of specific embodiments present various descriptions of specific embodiments. However, the technological innovations described herein can be embodied in numerous different ways, for example, as defined and encompassed by the claims. In this description, drawings are referenced, but similar reference numbers and / or terms may indicate identical or functionally similar elements. It will be understood that the elements shown in the drawings are not necessarily drawn to scale. Furthermore, it will be understood that a particular embodiment may include more elements and / or subsets of elements shown in the drawings than those shown. Furthermore, some embodiments may incorporate any suitable combination of features from two or more drawings. Headings are provided for convenience only and do not affect the technical scope or meaning of the claims.

[0043] A system and method for mapping and / or repairing the surface of a calender roller while it remains incorporated into the calender roll system is described. Since the surface of the calender roller is mapped and / or localized defects are repaired without removal from the roll system, the calender roller can be repaired without time-consuming and expensive methods that may require removal of the calender roller and repair of the entire or substantially entire surface. Such systems and methods may be particularly useful in calendering electrode film materials (e.g., electrode active materials) that are particularly hard and can frequently cause damage to the roller surface. Such substantially defect-free calender rollers may be useful in the manufacturing process of dry electrode films where defects on the calender roll surface can impart to the dry electrode film, leading to a decrease in the performance of the electrode film when used in energy storage devices.

[0044] ·Definition A "self-supporting" electrode film is an electrode film that incorporates a binder matrix structure sufficient to support the film or layer and maintain its shape so that the electrode film or layer can stand on its own. When incorporated into an energy storage device, a self-supporting electrode film or active layer is a film or layer that incorporates such a binder matrix structure. Generally, depending on the method of use, such an electrode film has sufficient strength to be used in the manufacturing process of an energy storage device without requiring external support elements such as current collectors or other films. For example, a "self-supporting" electrode film may have sufficient strength to be rolled, handled, and unrolled again in the electrode manufacturing process without requiring other support elements. Dry electrode films, such as cathode electrode films or anode electrode films, may be self-supporting.

[0045] A "solvent-free" electrode film is an electrode film that does not contain any detectable processing solvent, processing solvent residue, or processing solvent impurities. Dry electrode films, such as cathode electrode films or anode electrode films, may be solvent-free.

[0046] A "wet" electrode, a "wet process" electrode, or a slurry electrode is an electrode created by at least one step involving a slurry of an active material, a binder, and optionally, additives. A wet electrode may contain a processing solvent, processing solvent residue, and / or processing solvent impurities.

[0047] Generally speaking, one or more aspects of this disclosure relate to systems and processes for mapping and repairing a calender roller in a calender roll system. A process for repairing a calender roller surface includes mapping the surface of the calender roller, identifying surface defects, and depositing material onto the surface defects. In some embodiments, the process further includes mapping the calender roller surface after depositing material onto the identified surface defects. In some embodiments, the repair of the calender roller surface is completed when the depth of the repaired surface defects is below a threshold.

[0048] • Calender roll system for forming electrode films Figure 1 is a perspective view of a calendar roll system 100 including adjacent calendar rollers 180A and 180B according to several embodiments. Calendar roller 180A is supported at both ends by a first bearing block assembly 100A and a second bearing block assembly 100C. Calendar roller 180B is supported at both ends by a third bearing block assembly 100B and a fourth bearing block assembly 100D. The first bearing block assembly 100A supports a first journal 182A located at the first end of the first calendar roller 180A. The second bearing block assembly 100C supports a second journal 182C located at the second end of the first calendar roller 180A. The third bearing block assembly 100B supports a first journal 182B located at the first end of the second calendar roller 180B. The fourth bearing block assembly 100D supports a second journal 182D located at the second end of the second calendar roller 180B. The calendar rollers 180A and 180B are arranged adjacent to each other. In some embodiments, the calendar rollers include a shaft located at the center of the roller, which supports and drives the roller to rotate. In some embodiments, the rollers have a length of (about, at least, at least about, at most about) 0.5m, 1m, 1.1m, 1.2m, 1.3m, 1.4m, 1.5m, 1.6m, 1.7m, 1.8m, 1.9m, 2m, 2.1m, 2.2m, 2.3m, 2.4m, 2.5m, 3m, 4m, 5m, 6m, 7m, 8m, 9m, or 10m, or any range of values ​​in between. In some embodiments, the rollers have diameters ranging from approximately, at least, at least, approximately, and at most, approximately 0.1m, 0.2m, 0.3m, 0.4m, 0.5m, 0.6m, 0.7m, 0.8m, 0.9m, 1m, 1.1m, 1.2m, 1.3m, 1.4m, 1.5m, 2m, or 3m, or any range of values ​​in between. As shown in Figure 1, considering the size of the rollers, it takes time to remove the rollers from the bearing block assembly, repair the roller surfaces, and then reassemble the rollers into the roll system.Therefore, on-site inspection and repair methods are required for the roller system. In some embodiments, the “on-site” inspection and / or repair method refers to a method that does not require, or does not require, the removal of the calender rollers from the calender roll system for inspection and / or repair.

[0049] • Process for mapping and repairing the surface of a calender roller Figure 2 schematically illustrates a process 200 for mapping and repairing the surface of a calender roller according to several embodiments. As shown in Figure 2, the process 200 includes mapping the surface profile of the calender roller in step 202. The process 200 further includes a step 204 for identifying surface defects. The process 200 further includes depositing material onto the surface defects in step 206. After depositing material onto the surface defects in step 206, the calender roller surface can be mapped again by returning to the mapping step 202 in step 210. In some embodiments, additional surface defects may be identified in step 204 and material may be deposited onto the surface defects in step 206. In some embodiments, no further surface defects are identified in step 204 and the repair is completed in step 208.

[0050] • Process for mapping the surface of a calender roller Figure 3 schematically illustrates a process 300 for mapping the surface of a calender roller according to several embodiments. As shown in Figure 3, the process 300 includes measuring multiple cross-sectional profiles of the calender roller at multiple locations in step 302 and combining the multiple cross-sectional profiles to form a surface profile of the calender roller in step 304. The process 300 further includes identifying surface defects in step 306. In some embodiments, combining the multiple cross-sectional profiles includes aligning the multiple cross-sectional profiles with information at multiple locations. In some embodiments, the calender roller is mapped with a calendered film on the surface of the calender roller. In some embodiments, identifying surface defects includes marking the surface defects.

[0051] In some embodiments, the cross-sectional profile includes a circumferential surface profile, a longitudinal surface profile, or a combination thereof. In some embodiments, the circumferential surface profile of the calender roller at a particular location is the surface characteristics along the circumference of the roller at the corresponding location. In some embodiments, the longitudinal surface profile of the calender roller at a particular location is the surface characteristics along the length of the roller at the particular location. In some embodiments, the surface characteristics include surface contour, texture, variation, roughness, and combinations thereof. In some embodiments, the multiple locations include multiple longitudinal locations along the length of the calender roller, multiple circumferential locations along the circumference of the calender roller, or a combination thereof.

[0052] In some embodiments, the surface defect includes scratches, dents, cracks, pits, corrosion, cavities, stains, blisters, or combinations thereof. In some embodiments, the surface defect is a dent. In some embodiments, the surface defect is identified when one or more parameters of the surface defect exceed a threshold value. In some embodiments, the parameters of the surface defect may include average depth or height, maximum depth or height, surface area, volume, and combinations thereof. In some embodiments, the surface defect is identified when the maximum depth of the recessed area is (about, at least, at least about) 1 μm, 2 μm, 3 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 11 μm, 12 μm, 13 μm, 14 μm, 15 μm, 16 μm, 17 μm, 18 μm, 19 μm, 20 μm, 25 μm, 30 μm, 40 μm, 50 μm, or 100 μm, or any range of values therebetween. In some embodiments, the surface defect is when the area of the recessed area is (about, at least, at least about) 1 mm 2 , 2 mm 2 , 3 mm 2 , 4 mm 2 , 5 mm 2 , 6 mm 2 , 7 mm 2 , 8 mm 2 , 9 mm 2 ,​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​​A surface defect is identified when the average depth of the depression is (about, at least, at least about) 1 μm, 2 μm, 3 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 11 μm, 12 μm, 13 μm, 14 μm, 15 μm, 16 μm, 17 μm, 18 μm, 19 μm, 20 μm, 25 μm, 30 μm, 40 μm, 50 μm, or 100 μm, or any value in between. In some embodiments, a surface defect area is identified when the depression has a maximum depth of about 10 μm and about 10 mm 2 It is identified when it has an area exceeding a certain value. In some embodiments, the threshold for surface defects is determined by the precision requirements of the thin film formed by the calender roller.

[0053] Figure 4 schematically illustrates a process 400 for mapping the surface of a calender roller by measuring multiple circumferential surface profiles according to several embodiments. As shown in Figure 4, the process 400 includes rotating the calender roller 402. The process 400 further includes measuring a first circumferential surface profile at a first longitudinal position in step 404 and measuring a second circumferential surface profile at a second longitudinal position in step 406. In some embodiments, measuring the first and / or second circumferential surface profiles includes recording information about the first and / or second longitudinal positions. The process 400 includes combining the first and second circumferential surface profiles to form a surface profile of the calender roller in step 408 and identifying surface defects in step 410. In some embodiments, combining the first and second circumferential surface profiles includes aligning the first and second circumferential surface profiles with the recorded information about the first and second longitudinal positions.

[0054] In some embodiments, the calendar roller rotates continuously throughout the mapping process. In some embodiments, the calendar roller rotates when measuring the circumferential surface profile. In some embodiments, measuring the circumferential surface profile of the calendar roller at a particular position involves measuring the circumferential surface profile of the calendar roller while the calendar roller completes at least one full rotation, such as one, two, three, four, five, ten, or any number of rotations in between. In some embodiments, the number of rotations of the calendar roller is set as needed. In some embodiments, completion of the rotation of the calendar roller at a first position triggers the movement of the measuring instrument to a second position. In some embodiments, the calendar roller rotates at a peripheral speed of approximately 0.1 m / min, 1 m / min, 2 m / min, 5 m / min, 10 m / min, 15 m / min, 20 m / min, 25 m / min, 30 m / min, 35 m / min, 36 m / min, 37 m / min, 38 m / min, 39 m / min, 40 m / min, 41 m / min, 42 m / min, 43 m / min, 44 m / min, 45 m / min, 46 m / min, 47 m / min, 48 m / min, 49 m / min, 50 m / min, 55 m / min, 60 m / min, 70 m / min, 80 m / min, 90 m / min, or 100 m / min, or any value in between.

[0055] In some embodiments, the information for the first and / or second longitudinal position includes the relative distance of the first and / or second longitudinal position from the starting position. In some embodiments, the first and second circumferential positions are along the length of the calendar roller. In some embodiments, the first and second circumferential positions are along a line parallel to the shaft of the calendar roller. In some embodiments, the first and second circumferential positions are neighboring positions. In some embodiments, the distance between the two neighboring positions is less than or equal to the field of view of the measuring instrument. In some embodiments, the distance between the first circumferential position and the second circumferential position is (about, at most, at least) 1 mm, 2 mm, 3 mm, 4 mm, 5 mm, 6 mm, 7 mm, 8 mm, 9 mm, 10 mm, 11 mm, 12 mm, 13 mm, 14 mm, 15 mm, 16 mm, 17 mm, 18 mm, 19 mm, 20 mm, 25 mm, 30 mm, 40 mm, or 50 mm, or any value in between.

[0056] Figure 5 schematically illustrates a process 500 for mapping a calender roller surface by measuring multiple longitudinal surface profiles according to several embodiments. As shown in Figure 5, the process 500 includes measuring a first longitudinal surface profile at a first circumferential position in step 502 and measuring a second longitudinal surface profile at a second circumferential position in step 504. In some embodiments, measuring the first and / or second longitudinal surface profiles includes recording information about the first and / or second circumferential positions. In some embodiments, the recorded information about the first and / or second circumferential positions includes the relative distance from the starting position. In some embodiments, the calender roller rotates while the measuring unit is fixed when the measurement is from the first circumferential position to the second circumferential position. In some embodiments, the calender roller does not rotate while the measuring unit moves from the first circumferential position to the second circumferential position. Process 500 includes combining first and second longitudinal surface profiles in step 506 to form a surface profile for a calender roller, and identifying surface defects in step 508. In some embodiments, combining the first and second longitudinal surface profiles includes aligning the first and second longitudinal surface profiles with recorded first and second circumferential position information.

[0057] Figure 6 schematically illustrates a process 600 for combining multiple cross-sectional profiles of a calendar roller according to several embodiments. As shown in Figure 6, the process 600 includes collecting raw data in step 602. In some embodiments, the raw data includes cross-sectional profiles, measurement position information, calendar roller rotation speed, or a combination thereof. The process 600 further includes detreating the collected raw data in step 604. In some embodiments, detreating the collected raw data includes identifying the trend of the cross-sectional profiles, fitting a trend line to the cross-sectional profiles, and subtracting the trend line from the cross-sectional profiles. In some embodiments, the trend line includes a best-fit line. In some embodiments, detreating the collected raw data further includes correcting for errors in the combined cross-sectional profiles before identifying the trend of the cross-sectional profiles. The process 600 further includes a step 606 for filtering the detreated data. In some embodiments, filtering the detreated data includes removing data below a threshold from the cross-sectional profiles. In some embodiments, the threshold is a range of values ​​(about, at least, at least about, at most, at most about) 0.1 μm, 0.2 μm, 0.3 μm, 0.4 μm, 0.5 μm, 0.6 μm, 0.7 μm, 0.8 μm, 0.9 μm, 1 μm, 1.1 μm, 1.2 μm, 1.3 μm, 1.4 μm, 1.5 μm, 1.6 μm, 1.7 μm, 1.8 μm, 1.9 μm, 2 μm, 2.1 μm, 2.2 μm, 2.3 μm, 2.4 μm, 2.5 μm, 2.6 μm, 2.7 μm, 2.8 μm, 2.9 μm, 3 μm, 4 μm, or 5 μm, or any value in between. Process 600 further forms the surface profile of the calender roller in step 608. In some embodiments, forming the surface profile of the calender roller involves combining filtered data. In some embodiments, combining filtered data involves aligning the cross-sectional profile with positional information.In some embodiments, aligning the cross-sectional profile involves combining the circumferential surface profile as a function of the roller's circumference and its position along the calender roller's length. In some embodiments, aligning the cross-sectional profile involves combining the longitudinal surface profile as a function of the roller's length and its position along the calender roller's circumference. In some embodiments, the surface profile is a surface roughness map as a function of the calender roller's circumference and its length. In some embodiments, areas of surface defects can be identified and located on the calender roller's surface profile. In some embodiments, given surface defect parameters and thresholds, surface defects can be identified and marked.

[0058] • Process for repairing the surface of a calender roller In some embodiments, surface defects can be repaired after they have been identified and marked. In some embodiments, the repair is performed manually or by an automated method. Figure 7 schematically shows a process 700 for repairing the surface of a calender roller according to some embodiments. As shown in Figure 7, the process 700 includes contacting the surface defect area with a metal-containing solution in step 702, depositing the material on the surface defect area in step 704, and polishing the surface of the deposited material in step 706.

[0059] Figure 8 schematically illustrates a detailed process 800 for repairing the surface of a calender roller according to several embodiments. As shown in Figure 8, process 800 includes cleaning a surface defect area to form a cleaned recessed area. In some embodiments, the surface defect area may be identified in a mapping process disclosed herein or by a different method. Process 800 further includes masking the cleaned defect area in step 804. In some embodiments, masking includes covering the surface of the calender roller surrounding the defect area. In some embodiments, masking includes covering the surrounding surface with masking tape. In some embodiments, the masking tape includes aluminum tape, vinyl tape, or a combination thereof. Process 800 includes, in step 806, bringing the defect area into contact with a metal-containing solution, and in step 808, depositing a filler material to at least partially fill the cleaned defect area. In some embodiments, an electrolyte is continuously supplied throughout the electroplating process. In some embodiments, the electrolyte includes an organometallic liquid. Process 800 further includes, in step 810, forming a coating layer over the deposited filler material, and in step 812, polishing the repaired area. In some embodiments, step 810, which involves forming a coating layer over the deposited filler material, is an optional step.

[0060] In some embodiments, cleaning a defect area includes electrocleaning the defect area (i.e., electrochemical cleaning or electrolytic cleaning). In some embodiments, electrocleaning a defect area removes oil, grease, oxides, and other impurities from the defect area. In some embodiments, electrocleaning a defect area includes using NaOH for electrocleaning. In some embodiments, cleaning a defect area includes etching the defect area. In some embodiments, etching a defect area includes physical etching, chemical etching, or a combination thereof. In some embodiments, chemical etching includes etching with hydrochloric acid having a concentration of (about, at least, at least about, at most, at most about) 1 wt%, 5 wt%, 6.5 wt%, 7 wt%, 8 wt%, 9 wt%, 10 wt%, 11 wt%, 12 wt%, 13 wt%, 14 wt%, or 15 wt%, or any range of values ​​in between. In some embodiments, etching includes etching a defect area to enlarge the defect area. In some embodiments, etching includes etching a defect area to increase the depth of the defect area. In some embodiments, etching includes etching a defective region to increase the width-to-depth ratio of the defective region.

[0061] In some embodiments, the metal in the metal-containing solution includes Co, Ni, Fe, Mn, Mg, Ti, Al, Ca, Ti, Cr, Cu, Si, V, Zn, Au, Ag, W, or a combination thereof. In some embodiments, the metal in the metal-containing solution includes Co, Ni, Fe, Mn, Mg, Ti, Al, Ti, Cr, Cu, Si, or a combination thereof. In some embodiments, the metal in the metal-containing solution includes tungsten. In some embodiments, the metal in the metal-containing solution includes cobalt, nickel, tungsten, chromium, copper, or a combination thereof. In some embodiments, the metal-containing solution includes a sulfate of the metal. In some embodiments, the metal-containing solution includes nickel sulfate, cobalt sulfate, or a combination thereof. In some embodiments, the metal in the metal-containing solution includes a metal contained in an electrode film mixture that is calendered by a calender roller. In some embodiments, the metal in the metal-containing solution is one or more elements contained in the active material of an electrode film mixture that is calendered by a calender roller. In some embodiments, the metals in the active material of the electrode film mixture include Co, Ni, Fe, Mn, Mg, Ti, Al, Ti, Cr, Cu, Si, or combinations thereof. For example, if the calender roller is for calendering an electrode film mixture containing a lithium nickel manganese cobalt ("NMC") film, the metals in the metal-containing solution may include nickel, cobalt, manganese, or combinations thereof. In some embodiments, since the metals in the metal-containing solution are one or more elements contained in the active material of the electrode film mixture, even if a small amount of the deposited material peels off from the roller surface, it is considered that there will be no effect or contamination on the film being calendered. In some embodiments, the metals in the metal-containing solution can improve the properties of the deposited material, such as improving hardness, Young's modulus, toughness, wear resistance, etc. In some embodiments, the metal-containing solution contains elements that help improve the adhesion of the deposited material to the roller surface, etc.In some embodiments, the elemental form of the metal in the metal-containing solution has a Young's modulus of (about, at least, at least about) 100 Gpa, 110 Gpa, 120 Gpa, 130 Gpa, 140 Gpa, 150 Gpa, 160 Gpa, 170 Gpa, 180 Gpa, 190 Gpa, 200 Gpa, 210 Gpa, 220 Gpa, 230 Gpa, 240 Gpa, 250 Gpa, or 300 Gpa, or any range of values ​​between these. In some embodiments, the material deposited in the defect region includes the metal in the metal-containing solution. In some embodiments, the material deposited in the defect region includes metal or alloy. In some embodiments, the material deposited in the defect region includes Co, Ni, Fe, Mn, Mg, Ti, Al, Ca, Ti, Cr, Cu, Si, V, Zn, Au, Ag, W, or combinations thereof. In some embodiments, the metal deposited in the defect region includes cobalt, nickel, tungsten, or a combination thereof. In some embodiments, the deposited material includes metallic elements contained in an electrode film mixture that is calendered by a calender roller. In some embodiments, the deposited material includes elements that can improve hardness, Young's modulus, toughness, wear resistance, etc. In some embodiments, the deposited material includes elements that can improve adhesion to the roller surface.

[0062] In some embodiments, depositing material onto a defect area and / or forming a coating layer includes electroplating. In some embodiments, electroplating includes contacting the defect area with a pre-plating solution before contacting the defect area with a metal-containing solution. In some embodiments, the pre-plating solution contains an acid of the metal to be deposited, such as nickelic acid or cobaltic acid. In some embodiments, electroplating includes depositing the metal in the metal-containing solution using an electric current. In some embodiments, electroplating is performed at temperatures of (about, at least, at least about, at most about) 15°C, 20°C, 25°C, 26°C, 27°C, 28°C, 29°C, 30°C, 31, 32°C, 33°C, 34°C, 35°C, 36°C, 37°C, 38°C, 39°C, 40°C, 41°C, 42°C, 43°C, or 45°C, 45°C, 50°C, 55°C, or 60°C, or any range of values ​​between these, for example, 15°C to 60°C, 15°C to 50°C, 35°C to 50°C, or 35°C to 40°C. In some embodiments, electroplating is performed at current densities of (about, at least, at least about, at most, at most about) 0.5, 0.6, 0.7, 0.9, 0.9, 1, 1.1, 1.2, 1.3, 1.4, 1.5, 1.6, 1.7, 1.8, 1.9, 2, 2.1, 2.2, 2.3, 2.4, 2.5, 3, 4, or 5, or any range of values ​​between these. In some embodiments, high current densities for electroplating may result in porous plating material and / or burnt spots. In some embodiments, low current densities for electroplating may result in longer plating times. In some embodiments, electroplating is performed at stable or substantially stable current densities, and / or stable or substantially stable temperatures. In some embodiments, electroplating includes activating the surface of the defect area before supplying power.In some embodiments, surface activation involves contacting the surface of a defect area with sulfuric acid having a concentration of (about, at least, at least about, at most about, at most about) 1% by weight, 5% by weight, 10% by weight, 11% by weight, 12% by weight, 13% by weight, 14% by weight, 15% by weight, 16% by weight, 17% by weight, 18% by weight, 19% by weight, 20% by weight, 30% by weight, or any value in between.

[0063] In some embodiments, forming a coating layer over a deposited material includes depositing the coating layer. In some embodiments, forming a coating layer over a deposited metal includes electroplating with a solution containing the material to be deposited. In some embodiments, the coating layer includes a material harder than the material deposited in the defect area. In some embodiments, the coating layer includes a material having higher wear resistance than the deposited metal. In some embodiments, the coating layer includes a material having a hardness of (about, at least, at least about, at most, at most about) 45Rc, 48Rc, 49Rc, 50Rc, 51Rc, 52Rc, 53Rc, 54Rc, 55Rc, 56Rc, 57Rc, 58Rc, 59Rc, 60Rc, 65Rc, or 70Rc, or any range of values ​​in between. In some embodiments, the coating layer prevents wear of the deposited metal. In some embodiments, the coating layer includes nickel tungsten. In some embodiments, the coating layer has a thickness of (about, at least, at least about, at most, at most about) 0.1 μm, 0.5 μm, 1 μm, 1.5 μm, 2 μm, 2.5 μm, 3 μm, 3.5 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 15 μm, or 20 μm, or any range of values ​​in between, e.g., 0.1–20 μm, 0.1–10 μm, 1–10 μm, or 1–5 μm. In some embodiments, the surface of the coating layer is higher than the surface surrounding the defect area. In some embodiments, the surface of the coating layer is higher than the surface of the region surrounding the defect area by (approximately, at least, at least about, at most, at most about) 1 μm, 2 μm, 3 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 11 μm, 12 μm, 13 μm, 14 μm, 15 μm, 16 μm, 17 μm, 18 μm, 19 μm, or 20 μm, or any value in between. In some embodiments, the coating layer is further polished to match the surface surrounding the defect area.

[0064] In some embodiments, polishing includes sanding the repaired area. In some embodiments, sanding includes using a sanding belt, a sanding block, or a combination thereof. In some embodiments, the sanding block has a curved surface that matches the surface of a flat or roller surface. In some embodiments, polishing includes polishing with a high-grit compound. In some embodiments, the high-grit compound has a range of values ​​(about, at least about, at most about) 100 grit, 500 grit, 1000 grit, 1500 grit, 1600 grit, 2000 grit, 2400 grit, 2500 grit, 3000 grit, 5000 grit, or 10000, or any value in between. In some embodiments, the high-grit compound has sizes ranging from (about, at least, at least about, at most, at most about) 0.1 μm, 0.2 μm, 0.3 μm, 0.4 μm, 0.5 μm, 0.6 μm, 0.7 μm, 0.8 μm, 0.9 μm, 1 μm, 1.5 μm, 2 μm, 2.5 μm, 0.3 μm, 4 μm, 5 μm, or 10 μm, or any range of values ​​in between. In some embodiments, the polishing does not change the roughness of the unrepaired roller surface surrounding the defect area. In some embodiments, the polished surface has an average roughness (Ra) of approximately, at most, 0.01 μm, 0.02 μm, 0.03 μm, 0.04 μm, 0.05 μm, 0.06 μm, 0.07 μm, 0.08 μm, 0.09 μm, 0.1 μm, 0.2 μm, 0.3 μm, 0.4 μm, 0.5 μm, 0.6 μm, 0.8 μm, or 1 μm, or any range of values ​​in between. In some embodiments, the polished area has gloss and roughness that match the surrounding surface. In some embodiments, the roughness of the polished surface may be at a level required by manufacturing requirements in a subsequent calendering process.

[0065] In some embodiments, the depth of the defect area after repair and polishing is reduced to a range of values ​​of 0.1 μm, 0.5 μm, 1 μm, 1.5 μm, 2 μm, 2.5 μm, 3 μm, 3.5 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 15 μm, or 20 μm, or any value in between, or reduced to approximately these, less than these, or nearly less than these. In some embodiments, the depth of the defect area after repair and polishing is reduced to a range of values ​​of 90%, 80%, 70%, 60%, 50%, 40%, 35%, 30%, 25%, 20%, 15%, 10%, 5%, or 0% of the depth of the defect area before repair, or reduced to approximately these, less than these, or nearly less than these. In some embodiments, the defect area after repair and polishing has a surface that is higher than the surrounding surface.

[0066] In some embodiments, the surface area of ​​the defective region after repair and polishing is 0.1 mm 2 , 0.5mm 2 , 1mm 2 , 1.5mm 2 , 2mm 2 , 2.5mm 2 , 3mm 2 , 3.5mm 2 , 4mm 2 , 5mm 2 , 6mm 2 , 7mm 2 , 8mm 2 9mm 2 , 10mm 2 , 15mm 2 , 20mm 2 , 25mm 2 , 30mm 2 , 35mm 2 , 40mm 2 , 45mm 2 , or 50mm 2, or reduced to any range of values ​​between these, or reduced to approximately these, less than these, or nearly less than these. In some embodiments, the surface area of ​​the defective area after repair and polishing is reduced to 90%, 80%, 70%, 60%, 50%, 40%, 35%, 30%, 25%, 20%, 15%, 10%, 5%, or 0% of the surface area of ​​the defective area before repair, or reduced to approximately these, less than these, or nearly less than these.

[0067] In some embodiments, material deposition, polishing, and / or repair are limited to the defective area. In some embodiments, only the identified defective area and surrounding area are repaired. In some embodiments, the repaired area is 10%, 5%, 1%, 0.1%, 0.05%, 0.01%, 0.005%, 0.001%, or 0.0001% of the calender roller's surface area, or any value in between, or approximately these, less than these, or approximately less than these.

[0068] In some embodiments, the defect area has a width-to-depth aspect ratio (at most, approximately) of 1 / 5, 1 / 6, 1 / 7, 1 / 8, 1 / 9, or 1 / 10, or any value in between. In some embodiments, the defect area has a large width-to-depth aspect ratio so that repeated electroplating and polishing processes are useful. In some embodiments, a large width-to-depth aspect ratio means that the aspect ratio is (approximately, at least, approximately) of 1 / 5, 1 / 4, 1 / 3, 1 / 2, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 15, or 20, or any value in between. Figure 9 schematically shows a process 900 for repairing a defect area with a large aspect ratio according to some embodiments. As shown in Figure 9, process 900 includes coating the defect area with a metal-containing solution in step 902, depositing material to partially fill the defect area in step 904, and polishing the partially filled defect area in step 906. In some embodiments, partially filling the defect area includes filling a range of values ​​(about, at least, at least about, at most, at most about) 5%, 10%, 20%, 30%, 40%, 50%, 60%, 70%, 80%, 90%, or 95% of the depth of the defect area, or any value in between. In some embodiments, polishing the partially filled defect area includes polishing the defect area to a known surface. Process 900 further includes coating the partially filled defect area with a metal-containing solution 908, depositing material to completely fill the defect area in step 910, and polishing the completely filled defect area in step 912. In some embodiments, the partial filling / polishing step is repeated 2, 3, 4, 5, 6, 7, 8, 9, or 10 times, or any range of values ​​in between.

[0069] • System for mapping the surface of a calender roller Some embodiments of the present disclosure relate to a system for mapping the surface of a calender roller. In some embodiments, the system comprises a calender roll system and a surface mapping device. In some embodiments, the calender roll system comprises a calender roller having a roller surface and a shaft. In some embodiments, the surface mapping device comprises a measuring unit positioned on a rail. In some embodiments, the system comprises a motor configured to move the measuring unit along the rail. In some embodiments, the rail is parallel to the shaft. In some embodiments, the system comprises mounting means configured to detachably attach the surface mapping device to the calender roll system. In some embodiments, the surface mapping device further comprises a detection element configured to coordinate the rotation of the calender roller with the position of the measuring unit. In some embodiments, the detection element comprises a sensor and an incremental encoder. In some embodiments, the detection element comprises a calender roller encoder, either alone or in addition to an external encoder. In some embodiments, the calender roller encoder is an incremental encoder or an absolute encoder from the calender roller.

[0070] In some embodiments, the detection element comprises a sensor and an incremental encoder. Figure 10A is a schematic perspective view of system 1000 for mapping the surface of a calendar roller according to some embodiments. As shown in Figure 10A, system 1000 comprises a calendar roller 1004 having a roller surface and a shaft (not shown). System 1000 further comprises a mapping device 1002. The mapping device 1002 comprises a measuring unit 1006, a sensor 1008, an incremental encoder 1010, a main frame 1018, a motor 1012, and a rail 1014. The motor 1012 and the measuring unit 1006 are mounted on the main frame 1018. In some embodiments, the incremental encoder 1010 is not directly mounted on the main frame 1018. After the roller 1004 begins to rotate, the sensor 1008 detects the start of the roller rotation and the completion of one rotation. After the roller 1004 begins to rotate, the incremental encoder 1010 causes the measuring unit 1006 to measure the circumferential surface profile of the roller at the starting position. After the measurement of the circumferential surface profile of the roller at the starting position is complete, the incremental encoder 1010 causes the motor 1012 to start moving one step along the rail 1014 in the direction 1020. In some embodiments, the completion of rotation at a particular position is detected by the sensor 1008. The motor 1012 drives the measuring unit 1006 to move one step along the rail 1014 in the direction 1016 and measures the circumferential surface profile of the roller at that position. The measuring unit 1006 moves to the next position until the rail ends and measures the circumferential surface profile of the roller at that position.

[0071] In some embodiments, the sensor 1008 can detect the completion of one rotation of the calender roller by detecting a reference on the roller surface. Figure 10B is a schematic side view of system 1000 for mapping the calender roller surface according to some embodiments. As shown in Figure 10B, a reference 1020 may be mounted on the surface of the calender roller 1004. The sensor 1008 can recognize the reference 1020 and use the reference 1020 as the start and end of one rotation. In some embodiments, the reference 1020 can be used as a zero reference position for aligning circumferential surface profiles measured at different positions. In some embodiments, the sensor comprises a color sensor or a step sensor. In some embodiments, the reference has a color different from the color of the roller surface. In some embodiments, the color of the reference is easily recognizable by the rotation recording element. In some embodiments, the reference has a thickness that allows it to be recognized by the rotation recording element.

[0072] Figure 11 is a schematic top view of the relative positions of the roller and the measuring unit 1102 before mapping begins according to several embodiments. As shown in Figure 11, the roller 1106 has a first edge 1104 and a second edge 1108. The starting position of the measuring unit 1102 is close to the first edge 1104 of the roller 1106 at a distance of L3. The measuring range of the measuring unit 1102 is L2, which is shorter than the length of the roller L1. After mapping begins, the roller rotates, and the measuring unit 1102 measures the circumferential surface profile at the starting position until the roller 1106 has completed at least one rotation. The measuring unit 1102 then moves from the starting position to a second position along the length of the roller 1206, and measures the circumferential surface profile at the second position. Next, the measuring unit 1102 moves along the length of the roller 1206 from the second position to the next position until it reaches the end of the measuring range L2 that is close to the second edge 1108, and measures the circumferential surface profile at the next position.

[0073] In some embodiments, the detection element can link the position of the measuring unit with the rotation of the calendar roller without relying on an external sensor or external encoder. In some embodiments, the detection element includes a calendar roller encoder for detecting the completion of one rotation. In some embodiments, after the calendar roller encoder detects that the calendar roller has completed one rotation, it activates a motor to move the measuring unit to the next position.

[0074] In some embodiments, a system for mapping a calender roller surface includes a mapping device for measuring a longitudinal surface profile. Figure 12 schematically shows a system 1200 for mapping a calender roller surface by measuring a longitudinal surface profile according to some embodiments. As shown in Figure 12, the system 1200 includes a calender roller 1202 having a roller surface and a shaft (not shown). The system 1200 further includes a mapping device comprising a measuring unit 1204. In some embodiments, the measuring unit 1204 can rotate in the direction 1206 while the calender roller is fixed. In some embodiments, the measuring unit is fixed while the calender roller 1202 rotates in the direction 1206. In some embodiments, the measuring unit 1204 is configured to measure a longitudinal surface profile at a specific circumferential position.

[0075] In some embodiments, the system includes a defect location unit. In some embodiments, once a surface defect is detected and its location is determined, the defect location unit can mark the identified defect for further repair. In some embodiments, the defect location unit includes a laser or other suitable marker. In some embodiments, the defect location unit is configured to locate a surface defect given parameters and thresholds for the surface defect (e.g., average or maximum depth, surface area).

[0076] In some embodiments, the measurement unit comprises a surface profile measuring device, a capacitance sensor, a digital microscope, a camera, or any other sensor capable of collecting surface profile data, or a combination thereof. In some embodiments, the surface profile measuring device comprises a contact surface profile measuring device or a non-contact surface profile measuring device. In some embodiments, the surface profile measuring device comprises a laser surface profile measuring device. In some embodiments, the measurement unit has a field of view (FOV) within a specific range. In some embodiments, the measurement unit has a field of view (FOV) in the range of (about, at least, at least about, at most, at most about) 1 mm, 2 mm, 3 mm, 4 mm, 5 mm, 6 mm, 7 mm, 8 mm, 9 mm, 10 mm, 11 mm, 12 mm, 13 mm, 14 mm, 15 mm, 20 mm, 25 mm, 30 mm, 35 mm, 40 mm, or 50 mm, or any value in between. In some embodiments, the measuring unit has a resolution of (about, at least, at least about, at most, at most about) 0.01 μm, 0.05 μm, 0.1 μm, 0.15 μm, 0.2 μm, 0.25 μm, 0.3 μm, 0.35 μm, 0.4 μm, 0.5 μm, 0.6 μm, 0.7 μm, 0.8 μm, 0.9 μm, 1 μm, 1.5 μm, 2 μm, 5 μm, or 10 μm, or any range of values ​​in between.

[0077] In some embodiments, the system for mapping the surface of a calender roller comprises one, two, three, four, five, or ten mapping devices. In some embodiments, the system comprises one mapping device located above the calender roller and another mapping device located below the calender roller.

[0078] In some embodiments, a system for mapping the surface of a calender roller is configured to measure the surface profile of the calender roller while the roller surface has a calendered film on it.

[0079] • System for repairing the surface of a calender roller Some embodiments of the present disclosure relate to systems for repairing the surface of a calender roller. In some embodiments, the repair system comprises a calender roll system and a surface repair device. In some embodiments, the calender roll system comprises a calender roller having a roller surface and a shaft. In some embodiments, the surface repair device comprises an electroplating unit. In some embodiments, the surface repair device further comprises a polishing unit.

[0080] Figure 13 is a schematic diagram of an electroplating unit 1300 for an electroplating process according to several embodiments. As shown in Figure 13, prior to electroplating, the defect area is surrounded by masking tape 1310 and a metal-containing solution 1304 is applied to the surface of the defect area. An anode 1308 is wrapped in an anode wrap 1306 and placed on the solution 1304. The anode 1308 is connected to the positive terminal of the power supply, and the calender roller surface is grounded or connected to the negative terminal of the power supply. When the power supply is turned on, metal 1302 is deposited from the metal-containing solution 1304 onto the defect area. In some embodiments, the current path between the anode and cathode is shortest where the gap between the anode and cathode is smallest, so the metal is deposited first on shallower parts of the defect area, such as the edges or corners of the defect area. In some embodiments, electroplating includes using brush plating. In some embodiments, the anode comprises a graphite anode or a platinum anode.

[0081] In some embodiments, a system for repairing the calender roller surface includes an automated electroplating unit and a polishing unit above the calender roller surface. In some embodiments, the automated electroplating unit and / or polishing unit include microactuators configured to provide microactuators. In some embodiments, after the surface defects have been repaired and polished, the roller rotates to the next position. In some embodiments, the roller rotates during the repair and polishing process. In some embodiments, the electroplating solvent is continuously supplied throughout the electroplating process.

[0082] • Electrode film mixture, electrode film, and energy storage device In some embodiments, the powder and / or film used in the described system and method may be a dry electrode material / mixture. In some embodiments, the powder and / or film used in the described system and method may be a wet electrode material / mixture. In some embodiments, the dry electrode material is used to form an electrode film, such as a cathode electrode film or an anode electrode film. In some embodiments, the electrode is formed from an electrode film and a current collector. In some embodiments, the electrode film includes an active material. In some embodiments, the electrode film further includes at least one binder. In some embodiments, the electrode film contains an active material in an amount of (about, at least, at least about) 70% by weight, 75% by weight, 80% by weight, 81% by weight, 82% by weight, 83% by weight, 84% by weight, 85% by weight, 86% by weight, 87% by weight, 88% by weight, 89% by weight, 90% by weight, 91% by weight, 92% by weight, 93% by weight, 94% by weight, 95% by weight, 96% by weight, 97% by weight, 98% by weight, 99% by weight, or 100% by weight, or any range of values ​​in between. The electrode film can be used to form an energy storage device.

[0083] In some embodiments, the electrode and / or current collector comprises an adhesive layer. A dry electrode film adheres to the adhesive layer. In some embodiments, the adhesive layer comprises a carbon coating. In some embodiments, the carbon coating comprises a conductive carbon coating or layer. In some embodiments, the electrode and / or current collector comprises an electrode foil and an insulator (e.g., a carbon coating) arranged to cover all, substantially all, or part of the current collector. In some embodiments, the current collector comprises a single adhesive layer. In some embodiments, the adhesive layer is a patterned adhesive layer. In some embodiments, the adhesive layer comprises a plurality of adhesive elements separated from each other. In some embodiments, the adhesive layer is size-on-size with the electrode film arranged to cover the adhesive layer. In some embodiments, the adhesive layer is larger than the electrode film arranged to cover the adhesive layer. In some embodiments, the adhesive layer is arranged to cover the current collector to form a coated current collector, and the electrode film is arranged to cover the coated current collector to form an electrode.

[0084] In some embodiments, the electrode film material and / or electrode film comprises a cathode active material. The cathode active material can form the dry electrode material (e.g., powder) discussed herein. In some embodiments, the cathode active material may include, for example, a metal oxide, a metal sulfide, or a lithium metal oxide. Lithium metal oxides may be, for example, lithium nickel manganese cobalt oxide (NMC), lithium manganese oxide (LMO), lithium iron phosphate (LFP), lithium cobalt oxide (LCO), lithium titanate (LTO), and / or lithium nickel cobalt aluminum oxide (NCA). In some embodiments, the cathode active material may be, for example, a layered transition metal oxide (e.g., LiCoO2(LCO), Li(NiMnCo)O2(NMC), and / or LiNi 0.8 Co 0.15 Al 0.05O2(NCA)), spinel-type manganese oxide (LiMn2O4(LMO) and / or LiMn 1.5 Ni 0.5 O4 (LMNO, etc.), olivine (LiFePO4, etc.), silicon, silicon dioxide (SiO₂) x ), aluminum, tin, tin oxide (SnOx), manganese oxide (MnOx), molybdenum oxide (MoO2), molybdenum disulfide (MoS2), nickel oxide (NiO2) x ), or copper oxide (CuO x ) may include. The cathode active material may include sulfur, or a sulfur-containing material such as lithium sulfide (Li2S), or other sulfur-based materials, or mixtures thereof.

[0085] In some embodiments, the electrode film material and / or anode electrode film comprises an anode active material. The anode active material can form the dry electrode material (e.g., powder) discussed herein. In some embodiments, the anode active material may include, for example, insert materials (such as carbon, graphite, and / or graphene), alloying / dealloying materials (e.g., silicon, silicon oxide, tin, and / or tin oxide), metal alloys or compounds (e.g., Si-Al and / or Si-Sn), and / or conversion materials (e.g., manganese oxide, molybdenum oxide, nickel oxide, and / or copper oxide). Anode active materials can be used alone or mixed with each other to form multiphase materials (Si-C, Sn-C, SiOx-C, SnOx-C, Si-Sn, Si-SiOx, Sn-SnOx, Si-SiOx-C, Sn-SnOx-C, Si-Sn-C, SiOx-SnOx-C, Si-SiOx-Sn, or Sn-SiOx-SnOx, etc.). Anode active materials include common natural graphite, synthetic or artificial graphite, surface-modified graphite, spherical graphite, flake graphite, and blends or combinations of these types of graphite, metal elements and their compounds, as well as metal-C composite materials for anodes.

[0086] In some embodiments, the electrode film material and / or electrode film comprises a carbon material configured to allow reversible insertion of lithium ions. The carbon material can form a portion of the dry electrode material (e.g., powder) discussed herein. In some embodiments, the electrode film contains the carbon material in a total amount ranging from (about, at most, about) 20% by weight, 15% by weight, 10% by weight, 9% by weight, 8% by weight, 7% by weight, 6% by weight, 5% by weight, 4% by weight, 3% by weight, 2% by weight, 1% by weight, or any value in between. In some embodiments, the lithium-inserted carbon is selected from graphitic carbon, graphite, hard carbon, soft carbon, and combinations thereof. For example, the electrode film of an electrode may include a binder material and one or more of graphitic carbon, graphite, graphene-containing carbon, hard carbon, and soft carbon, and a conductivity-enhancing material. In some embodiments, the electrode is mixed with lithium metal and / or lithium ions.

[0087] In some embodiments, the electrode film material and / or electrode film comprises a conductive additive. The conductive additive can form part of the dry electrode material (e.g., powder) discussed herein. In some embodiments, the conductive additive may include a conductive carbon additive. In some embodiments, the conductive carbon additive comprises carbon black, carbon nanotubes, e.g., single-walled carbon nanotubes (SWCNTs) and multi-walled carbon nanotubes (MWCNTs). In some embodiments, the electrode film comprises the conductive additive in a total amount ranging from (about, at most, or at most about) 10% by weight, 9% by weight, 8% by weight, 7% by weight, 6% by weight, 5% by weight, 4% by weight, 3% by weight, 2% by weight, 1% by weight, 0.5% by weight, 0.25% by weight, 0.1% by weight, or any value in between. In some embodiments, each of the conductive additives is in an amount of (about, at most, about) 10% by weight, 9% by weight, 8% by weight, 7% by weight, 6% by weight, 5% by weight, 4% by weight, 3% by weight, 2% by weight, 1% by weight, 0.5% by weight, 0.25% by weight, 0.1% by weight, or any value in between these ranges of the electrode film. In some embodiments, the conductive additive is carbon black.

[0088] In some embodiments, the electrode film material and / or electrode film comprises a binder. The binder can form a portion of the dry electrode material (e.g., powder) discussed herein. In some embodiments, the binder may include polytetrafluoroethylene (PTFE), polyolefins, polyalkylenes, polyethers, styrene-butadiene, polysiloxane copolymers and polysiloxanes, branched polyethers, polyvinyl ethers, carboxymethylcellulose (CMC), copolymers thereof, and / or combinations thereof. In some embodiments, the polyolefin may include polyethylene (PE), polypropylene (PP), polyvinylidene fluoride (PVDF), copolymers thereof, and / or combinations thereof. For example, the binder may include polyvinyl chloride, poly(phenylene oxide) (PPO), polyethylene-block-poly(ethylene glycol), poly(ethylene oxide) (PEO), poly(phenylene oxide) (PPO), polyethylene-block-poly(ethylene glycol), polydimethylsiloxane (PDMS), polydimethylsiloxane-coalkylmethylsiloxane, copolymers thereof, and / or combinations thereof. In some embodiments, the binder may include a thermoplastic material. In some embodiments, the binder includes a fibrillable and / or fibrillated polymer. In certain embodiments, the binder includes a single fibrillable and / or fibrillated binder such as PTFE, and consists essentially of a single fibrillable and / or fibrillated binder such as PTFE, or consists of a single fibrillable and / or fibrillated binder such as PTFE. In some embodiments, the binder includes a binder such as PVDF, and consists essentially of PVDF, or consists of PVDF.In some embodiments, the electrode film contains a binder in an amount ranging from (about, at most, or at most about) 20% by weight, 19% by weight, 18% by weight, 17% by weight, 16% by weight, 15% by weight, 14% by weight, 13% by weight, 12% by weight, 11% by weight, 10% by weight, 9% by weight, 8% by weight, 7% by weight, 6% by weight, 5% by weight, 4% by weight, 3% by weight, 2% by weight, 1% by weight, 0.5% by weight, 0.25% by weight, 0.1% by weight, or any range of values ​​in between.

[0089] In some embodiments, the electrode film is produced by a dry electrode manufacturing process. As used herein, a dry electrode manufacturing process can refer to a process for forming a dry electrode film without the use of a solvent, or substantially without the use of a solvent. For example, the components of the active layer or electrode film, including a carbon material and a binder, may include, consist of, or be essentially composed of dry particles. Combining dry particles to form an active layer or electrode film can yield a dry particle active layer mixture. In some embodiments, the active layer or electrode film may be formed from a dry particle active layer mixture such that the weight percentage of the components of the active layer or electrode film is substantially the same as the weight percentage of the components of the dry particle active layer mixture. In some embodiments, the active layer or electrode film formed from a dry particle active layer mixture using a dry manufacturing process may not contain, or substantially contain, any processing additives such as solvents and the resulting solvent residues. In some embodiments, the resulting active layer or electrode film is a self-supporting film formed from a dry particle mixture using a dry process. In some embodiments, the resulting active layer or electrode film is a self-supporting film formed from a dry particle mixture using a dry process. The process for forming the active layer or electrode film may include fibrillating a fibrillable binder component such that the film contains a fibrillating binder. In a further embodiment, the self-supporting active layer or electrode film may be formed in the absence of a current collector. In yet another embodiment, the active layer or electrode film may include a fibrillated polymer matrix such that the film is self-supporting. It is conceivable that a matrix, grid, or web of fibrils can be formed to provide a mechanical structure to the electrode film.

[0090] In some embodiments, electrode film mixtures can be calendered in a calendering apparatus such as those disclosed herein to form self-supporting fibrillated electrode films. In some embodiments, the calendered mixture forms a self-supporting, dry particle film that is free from or substantially free from liquids, solvents, and the resulting residues. In some embodiments, calendering of the electrode film mixture may damage the calender roller surface, particularly if the electrode film mixture contains hard materials such as cathode active material. In some embodiments, the electrode film is an anode electrode film. In some embodiments, the electrode film is a cathode electrode film. In some embodiments, the process for producing the electrode film is a dry process, no liquids or solvents are used, the listed raw materials are dry (e.g., one or more are dry powders), and the resulting electrode film is free from or substantially free from any liquids, solvents, and the resulting residues.

[0091] In some embodiments, the energy storage device comprises a separator, an anode electrode, a cathode electrode, an electrolyte, and a housing, wherein the electrolyte, separator, anode electrode, and cathode electrode are arranged within the housing, and the separator is positioned between the anode electrode and the cathode electrode. In some embodiments, the cathode comprises a mixed cathode active material as described herein. In some embodiments, the energy storage device is formed by arranging the electrolyte, separator, anode electrode, and cathode electrode within the housing, with the separator positioned between the anode electrode and the cathode electrode. In some embodiments, the energy storage device is a battery. In some embodiments, the energy storage device is a lithium-ion battery. In some embodiments, the energy storage device comprises an anode electrode positioned between two cathode electrodes. [Examples]

[0092] Exemplary embodiments of the present disclosure, including processes, materials, and / or products obtained, are described in the following examples.

[0093] • Example 1 - Indentation on the surface of a calender roller Figure 14A is an image of a recessed area on the surface of a calender roller. Figure 14B is an image of a film formed using a calender roller with recesses. As shown in Figure 14B, the formed film has film bubbles that degrade the quality of the film.

[0094] • Example 2 - Generating a surface profile of a calender roller

[0095] Figure 15 is a plot of the circumferential surface profiles combined along the length of the calender roller. Figure 16 is a plot of the surface profiles after combining the circumferential surface profiles from Figure 15.

[0096] • Example 3 - Examination of the reproducibility of generating surface profiles of calender rollers Figure 17 is a plot of the surface profile of the calender roller, combining the results of 12 measurements. As shown in Figure 17, the process of mapping the calender roller exhibits good repeatability. The calculated radial position repeatability and combined repeatability are 99% from the 12 measurements.

[0097] • Example 4 - Surface profile of the calender roller before and after repair Figure 18A is an image of a recessed area on the surface of a calender roller. Figure 18B is an image of the recessed area of ​​Figure 18A after repair. As shown in Figure 18B, the recess in Figure 18A is filled and polished. Figure 18C is a plot of the surface profile of the calender roller of Figure 18A before repair. Figure 18D is a plot of the surface profile of the same calender roller after repair. As shown in Figures 18C and 18D, the blue area has shrunk in Figure 18C and is much brighter in Figure 18D, indicating that the recess has been filled and repaired.

[0098] Figure 19A is a plot of the surface profile of another calender roller before repair. Figure 19B is a plot of the surface profile of the same calender roller from Figure 19A after electroplating. As shown in Figure 19A, the recessed area (shown in blue) has a depth of 16 μm before repair. After repair, as shown in Figure 19B, the recess has a depth of 0–3 μm after electroplating. In addition, the surface surrounding the recessed area is shown in red, indicating that the surrounding surface is higher than the normal surface of the roller. Furthermore, the area surrounding the recess has a gradient from a depth of approximately 6 μm to a height of 10 μm or 6 μm. Surface roughness after electroplating can be corrected by polishing and / or replating.

[0099] Figure 20A is a plot of the surface profile of another calender roller before repair. Figure 20B is a plot of the surface profile of the same calender roller from Figure 20A after electroplating. As shown in Figure 20A, the recessed area (shown in blue) has a depth of 13.9 μm before repair. After repair, as shown in Figure 20B, the recess has a depth of 3 μm after electroplating. In addition, the surface surrounding the recessed area, shown in red, indicates that the surrounding surface is higher than the normal surface of the roller, having a height of less than approximately 7 μm relative to the normal surface. Surface roughness after electroplating can be corrected by polishing and / or replating.

[0100] • Example 5 - Examination of polishing the surface of a repaired calender roller The sample surface was repaired by electroplating nickel tungsten to a thickness of 5 μm. Sanding and polishing were performed for 25 minutes. Table 1 summarizes the sanding and polishing processes, and Table 2 summarizes the roughness at each process. As shown in Table 2, the average roughness (Ra) and the total height of the roughness profile (Rt) were significantly reduced to match the original roughness before electroplating. [Table 1] [Table 2]

[0101] • Example 6 - Examination of encoder position Figure 21A is a plot of the surface profile of the calender roller with the encoder mounted on the main frame. Figure 21B is a plot of the surface profile of the calender roller with the encoder mounted on a frame separated from the main frame. As shown in Figures 21A and 21B, the oblique artifacts seen in Figure 21A are absent in Figure 21B.

[0102] While specific embodiments of the present invention have been described, these embodiments are presented as examples only and are not intended to limit the scope of this disclosure. In fact, the novel methods and systems described herein may be embodied in various other forms. Furthermore, various omissions, substitutions, and modifications can be made to the systems and methods described herein without departing from the spirit of this disclosure. The appended claims and their equivalents are intended to encompass such forms or modifications that are considered to fall within the scope and spirit of this disclosure. Accordingly, the scope of the present invention is defined solely by reference to the appended claims.

[0103] Any features, materials, properties, or groups described in relation to a particular aspect, embodiment, or example should be understood to be applicable to any other aspect, embodiment, or example described in this section or elsewhere in this specification, insofar as they do not conflict with such descriptions. All features disclosed herein (including the appended claims, abstract, and drawings), and / or all steps of any method or process so as to be disclosed, can be combined in any combination, except for any combination in which at least some of such features and / or steps are mutually exclusive. The protection is not limited to the details of any of the aforementioned embodiments. The protection extends to any novel one or any novel combination of features disclosed herein (including the appended claims, abstract, and drawings), or any novel one or any novel combination of any step of any method or process so as to be disclosed.

[0104] Furthermore, certain features described in this disclosure in the context of separate embodiments may be implemented in combination in a single embodiment. Conversely, various features described in the context of a single embodiment may be implemented separately in multiple embodiments or in any suitable partial combination. Furthermore, although features may be described above as acting in a particular combination, one or more features from a claimed combination may be removed from the combination in some cases, and the combination may be claimed as a partial combination or a variation of a partial combination.

[0105] Furthermore, while actions may be shown in the drawings or described herein in a specific order, such actions do not need to be performed in the specific order shown, nor in a sequential order, nor do not all actions need to be performed in order to achieve the desired result. Other actions not shown or described can be incorporated into exemplary methods and processes. For example, one or more additional actions can be performed before, after, simultaneously with, or between any of the described actions. Furthermore, actions may be rearranged or changed in order in other embodiments. Those skilled in the art will understand that in some embodiments, the actual steps taken in the illustrated and / or disclosed processes may differ from those shown in the drawings. Depending on the embodiment, certain steps among the steps described above may be omitted, or other steps may be added. Furthermore, it is possible to combine the features and attributes of the particular embodiments disclosed above in different ways to form further embodiments, all of which are encompassed within the scope of this disclosure. Furthermore, the separation of various system components in the embodiments described above should not be understood as necessary in all embodiments, and it should be understood that the components and systems described may generally be integrated into a single product or packaged into multiple products. For example, any of the components of the energy storage system described herein may be provided separately or may be integrated with one another to form an energy storage system (e.g., packaged together or attached to one another).

[0106] For the purposes of this disclosure, certain aspects, advantages, and novel features are described herein. Not all of such advantages are necessarily achieved according to any particular embodiment. Therefore, a person skilled in the art will understand that, for example, this disclosure can be embodied or implemented to achieve one advantage or set of advantages as taught herein without necessarily achieving other advantages that may be taught or suggested herein.

[0107] For the purposes of this disclosure, in some embodiments, primary particles may be the smallest distinct entities that form larger structures, clusters, or aggregates. Conditional statements such as “can,” “could,” “might,” or “may” are generally intended to convey that certain features, elements, and / or steps are included in certain embodiments but not in other embodiments, unless otherwise specified or understood in the context in which they are used. Thus, such conditional statements generally do not mean that features, elements, and / or steps are required in any way in one or more embodiments, or that one or more embodiments necessarily include logic for determining whether these features, elements, and / or steps are included in any particular embodiment or performed in any particular embodiment, with or without user input or prompting.

[0108] Conjunctions such as the phrase "at least one of X, Y, and Z" are generally understood to have other meanings in contexts where they are used to indicate that an item, term, etc., may be any of X, Y, or Z, unless otherwise specified. Therefore, such conjunctions are not generally intended to mean that a particular embodiment requires the presence of at least one of X, at least one of Y, and at least one of Z.

[0109] As used herein, terms expressing degree, such as “approximately,” “about,” “generally,” and “substantially,” refer to a value, quantity, or characteristic that is close to the stated value, quantity, or characteristic, and still performs the desired function or achieves the desired result. For example, the terms “approximately,” “about,” “generally,” and “substantially” may refer to quantities within the range of less than 10%, less than 5%, less than 1%, less than 0.1%, and less than 0.01% of the stated quantity, depending on the desired function or desired result.

[0110] The scope of this disclosure is not intended to be limited by specific disclosures of preferred embodiments in this section or elsewhere in this specification, but may be defined by the claims, as presented or hereafter presented in this section or elsewhere in this specification. The language of the claims should be interpreted broadly on the basis of the language used in the claims, and not limited to the examples described herein or explained during the examination of the application, such examples should be interpreted as non-exclusive.

Claims

1. A process for repairing the surface of a calender roller, The steps include: preparing a calendar roll system equipped with calendar rollers, The steps include mapping the surface profile of the calender roller, A step of identifying a recessed area on the surface of the calender roller based at least partially on the surface profile, The steps include depositing material in the recessed region, A process that includes this.

2. The step of mapping the surface profile of the calender roller is: Rotating the aforementioned calendar roller, Measuring the first circumferential surface profile of the calendar roller at a first longitudinal position, Measuring the second circumferential surface profile of the calendar roller at a second longitudinal position, This includes combining the first circumferential surface profile and the second circumferential surface profile to form the surface profile of the calendar roller, The process according to claim 1, wherein the first and second longitudinal positions are along the length of the calender roller.

3. The process according to claim 2, wherein rotating the calendar roller includes rotating the calendar roller at a peripheral speed in the range of 0.1 m / min to 50 m / min.

4. The process according to claim 2, wherein the combining includes aligning the first and second circumferential surface profiles.

5. The step of mapping the surface profile of the calender roller is: Measuring the first longitudinal surface profile at the first circumferential position, Measuring the second longitudinal surface profile at the second circumferential position, This includes combining the first longitudinal surface profile and the second longitudinal surface profile to form the surface profile of the calender roller, The process according to claim 1, wherein the first and second circumferential positions are along the circumference of the calendar roller.

6. The process according to claim 1, further comprising the step of polishing the deposited material to match the surface of the calender roller.

7. The process according to claim 1, further comprising the step of mapping a second surface profile of the calender roller after depositing the material.

8. The process according to claim 1, wherein the recessed region includes a deepest point having a depth greater than approximately 10 μm.

9. The aforementioned recessed area is approximately 10 mm ２ The process according to claim 1, having a larger area than the above.

10. The process according to claim 1, wherein the step of depositing the material includes electroplating a metal or alloy onto the recessed area.

11. The process according to claim 1, wherein the step of depositing the material includes bringing the recessed area into contact with a metal-containing solution.

12. The process according to claim 11, wherein the metal-containing solution comprises Co, Ni, Fe, Mn, Mg, Ti, Al, Ca, Ti, Cr, Cu, Si, V, Zn, Au, Ag, W, or a combination thereof.

13. The process according to claim 11, wherein the step of depositing the material includes depositing the metal in the metal-containing solution into the recessed area.

14. The process according to claim 1, further comprising the step of covering the deposited material and depositing a coating layer.

15. The process according to claim 14, wherein the coating layer comprises nickel tungsten.

16. A system for mapping calendar rollers, A calendar roll system comprising a calendar roller, wherein the calendar roller comprises a roller surface and a shaft, A surface mapping device comprising a surface shape measuring device arranged on a rail parallel to the shaft of the calendar roller, Mounting means configured to detachably attach the surface mapping device to the calendar roll system, A detection element configured to coordinate the rotation of the calendar roller with the position of the surface shape measuring device, A system equipped with these features.

17. The system according to claim 16, wherein the detection element comprises an incremental encoder.

18. The system according to claim 16, wherein the detection element comprises a calendar roller encoder.

19. The system according to claim 16, wherein the detection element comprises a rotation recording element and a reference disposed on the roller surface.

20. The system according to claim 16, wherein the surface shape measuring device comprises a color sensor, a step sensor, or a combination thereof.

21. The system according to claim 16, further comprising a defect location identification unit for the mapping device.

22. The system according to claim 21, wherein the defect location unit comprises a laser.

23. The calender roll system according to claim 16, wherein the calender roll system comprises a calendered film on the surface of the roller.

24. This is a process for repairing and reusing a calendar roller. The steps include: preparing a calendar roll system equipped with calendar rollers, The steps include mapping the surface profile of the calender roller, A step of identifying a recessed area on the surface of the calender roller based at least partially on the surface profile, The steps include depositing a repair material containing metal into the recessed area, The steps include: calendering an electrode film material containing the aforementioned metal-containing electrode active material to form an electrode film; Includes, The process wherein the metal is selected from the group consisting of Co, Ni, Fe, Mn, Mg, Ti, Al, Ca, Ti, Cr, Cu, Si, V, Zn, Au, Ag, W, and combinations thereof.

25. The process according to claim 24, wherein the metal is selected from the group consisting of Co, Ni, and combinations thereof.

26. The process according to claim 24, wherein the electrode active material is a cathode active material.

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