High-frequency test contact device with impedance matching
The support unit with a hole pattern in insulating walls addresses signal transmission and contact issues in high-frequency test devices, ensuring reliable and efficient signal transfer and alignment.
JP2026085906APending Publication Date: 2026-05-25INGUN PRUFMITTELBAU GMBH
Patent Information
- Application Number
- JP2025192255
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-11-13
- Filing Date
- 2025-11-12
- Publication Date
- 2026-05-25
AI Technical Summary
Technical Problem
High-frequency test contact devices experience wear and signal loss due to inappropriate contact, leading to inaccurate measurements and reflections, necessitating improved signal transmission and contact quality.
Method used
A support unit with insulating walls featuring a hole pattern to match impedance and guide test contact elements, allowing for optimized signal transmission and stable contact, while reducing pitch distance and enhancing mechanical stability.
Benefits of technology
The solution enables reliable high-frequency signal transmission with reduced signal loss and improved contact quality, facilitating precise alignment and tolerance compensation for compact design and accurate measurements.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure 2026085906000001_ABST
Abstract
The present invention provides an improved support unit for a test contact device, and a test contact device equipped with this support unit that enables optimized transmission of high-frequency signals while simultaneously ensuring reliable contact with the object being tested. [Solution] The present invention relates to a support unit (19) for a test contact device (20) for reversibly contacting and testing a contact object (30), particularly a board-to-board plug connector, using a high-frequency signal, wherein the support unit (19) comprises an insulating body having a plurality of parallel recesses (19a), particularly slot-shaped recesses, disposed inside, each configured to house and guide a test contact element (10) that transmits a high-frequency signal, each of which is formed between two opposing insulating walls (41) that insulate the test contact element (10).
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Citation Information
Patent Citations
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WO2021151524A1