Information processing device

Abstract

This invention provides an information processing device that streamlines the verification process for defects in printed materials. [Solution] The information processing device 100 includes an acquisition unit 121 that acquires defect information including the location of defects detected from a printed document and master defect information including the location of master defects pre-set for the printed document, and a display unit 122 that displays defect response information corresponding to defects at the locations included in the defect information, and also displays master defect response information corresponding to master defects at the locations included in the master defect information, on an image corresponding to the printed document.

Description

Technical Field

[0001] This disclosure relates to an information processing apparatus.

Background Art

[0002] As described in Patent Document 1, in order to determine a defect in a printed matter, an image of the printed matter is superimposed and compared with a master image prepared in advance.

Prior Art Document

Patent Document

[0003]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0004] However, as described in Patent Document 1, simply superimposing and comparing an image of a printed matter with a master image cannot analyze and determine the validity and tendency of defects that may occur in the printed matter. As a result, there is a problem that the efficiency of the verification work for defects in the printed matter cannot be improved.

[0005] Therefore, one of the objects of this disclosure is to solve the above-described problem that the efficiency of the verification work for defects in the printed matter cannot be improved.

Means for Solving the Problems

[0006] An information processing apparatus according to one embodiment of this disclosure is an acquisition unit that acquires defect information including the position of a defect detected from a printed matter and master defect information including the position of a master defect preset for the printed matter; A display unit that displays defect response information corresponding to the defect at the location included in the defect information on an image corresponding to a printed material, and also displays master defect response information corresponding to the master defect at the location included in the master defect information, Equipped with, This is the structure it takes. Furthermore, the information processing method, which is one form of this disclosure, Information processing device, Defect information, including the location of defects detected in the printed material, and master defect information, including the location of master defects pre-set for the printed material, are obtained. On the image corresponding to the printed material, defect response information corresponding to the defect is displayed at the location included in the defect information, and master defect response information corresponding to the master defect is displayed at the location included in the master defect information. This is the structure it takes. Furthermore, one form of this disclosure is a program, In an information processing device, Defect information, including the location of defects detected in the printed material, and master defect information, including the location of master defects pre-set for the printed material, are obtained. On the image corresponding to the printed material, defect response information corresponding to the defect is displayed at the location included in the defect information, and master defect response information corresponding to the master defect is displayed at the location included in the master defect information. To execute the process This is the structure it takes. [Effects of the Invention]

[0007] This disclosure, configured as described above, can improve the efficiency of the verification process for defects in printed materials. [Brief explanation of the drawing]

[0008] [Figure 1] This block diagram shows an example of the configuration of the information processing system related to this disclosure. [Figure 2] This flowchart shows an example of the processing operation performed by the information processing system related to this disclosure. [Figure 3] It is a flowchart showing an example of the processing operation by the information processing system according to the present disclosure. [Figure 4] It is a diagram showing an example of the processing by the information processing system according to the present disclosure. [Figure 5] It is a diagram showing an example of the processing by the information processing system according to the present disclosure. [Figure 6] It is a diagram showing an example of the processing by the information processing system according to the present disclosure. [Figure 7] It is a diagram showing an example of the processing by the information processing system according to the present disclosure. [Figure 8] It is a diagram showing an example of the processing by the information processing system according to the present disclosure. [Figure 9] It is a diagram showing an example of the processing by the information processing system according to the present disclosure. [Figure 10] It is a flowchart showing an example of the processing operation by the information processing system according to the present disclosure. [Figure 11] It is a diagram showing an example of the processing by the information processing system according to the present disclosure. [Figure 12] It is a block diagram showing an example of the hardware configuration of the information processing apparatus according to the present disclosure. [Figure 13] It is a block diagram showing an example of the configuration of the information processing apparatus according to the present disclosure. [Figure 14] It is a flowchart showing an example of the processing operation by the information processing apparatus according to the present disclosure.

Mode for Carrying Out the Invention

[0009] <First Embodiment> The first embodiment of the present disclosure will be described with reference to the drawings. Note that the drawings may be relevant to any of the embodiments.

[0010] The information processing system of the present disclosure is used, for example, to verify defects in printed matter. In particular, in the present embodiment, it is assumed that the printed matter is a banknote, and a case where defects occurring in the printed banknote are compared with master defects registered in advance to verify the defects is exemplified. However, the printed matter is not limited to being a banknote, and may be a negotiable instrument such as a check or a gift certificate, or any printed matter.

[0011] Hereinafter, an example of the configuration and operation of the information processing system in the present embodiment will be described. As shown in FIG. 1, the information processing system includes an image input device 10, a defect detection device 20, a defect classification device 30, a classification result display device 40, and a storage device 50. Each of the devices 10, 20, 30, 40 is configured by one or a plurality of information processing devices each including an arithmetic device and a storage device. The image input device 10 includes an imaging unit 11 and an image output unit 12. The defect detection device 20 includes a defect detection unit 21, a determination unit 22, and a defect detection score output unit 23. The defect classification device 30 includes a defect type score calculation unit 31, a defect type determination unit 32, and a defect type output unit 33. The classification result display device 40 includes a master editing unit 41, a classification result aggregation unit 42, and a classification result display unit 43. The functions of the above-mentioned respective units can be realized by the arithmetic device provided in each device executing a program for realizing each function stored in the storage device.

[0012] The imaging unit 11 of the image input device 10 photographs a banknote which is the printed matter. At this time, the banknotes are printed in a state where the same banknotes are arranged in a plurality of rows and columns. For example, the same banknotes are printed in a large-size unit where they are arranged in 5 rows and 4 columns. Therefore, the imaging unit 11 photographs the banknotes in a large-size unit. However, the imaging unit 11 may photograph in units of a single banknote. Then, the image output unit 12 of the image input device 10 outputs the photographed image of the banknote to the defect detection device 20. At this time, the image output unit 12 may output a photographed image of a large-size unit in which banknotes are arranged in a matrix, or may output a photographed image for each banknote.

[0013] The defect detection unit 21 of the defect detection device 20 acquires a photographed image of the banknote (step S1 in Figure 2), performs image processing on the photographed image, and detects defects on the banknote (step S2 in Figure 2). For example, the defect detection unit 21 detects the shape of the defect and the center coordinates representing its location using a pre-set defect detection processing method (defect detection algorithm). At this time, the defect detection unit 21 detects defects based on predetermined feature quantities in the photographed image, for example. The defects detected from the photographed image of the banknote will be referred to as "query defects" below. The determination unit 22 of the defect detection device 20 then determines whether the detected query defect is a defect or not (step S3 in Figure 2). For example, the determination unit 22 calculates a confidence score, which represents the likelihood that the defect is a defect. The higher the numerical value of the detection score, the higher the probability that the detected defect is a defect. Subsequently, the defect detection score output unit 23 of the defect detection device 20 outputs the query defect detection result to the defect classification device 30. Specifically, the defect detection score output unit 23 associates the shape of the defect location and its center coordinates of the detected query defect with the detection score of the query defect, and outputs it to the defect classification device 30 as query defect information.

[0014] The defect type score calculation unit 31 of the defect classification device 30 calculates a score for the type (category) of the detected query defect on the banknote based on the captured image of the query defect location and the query defect information (step S4 in Figure 3). Specifically, the defect type score calculation unit 31 calculates a defect type score, which is a score for each type of query defect, based on the shape of the defect location and its center coordinates included in the query defect information, the detection score of the query defect, and predetermined feature quantities at the defect location on the captured image. Note that the feature quantities may have multiple dimensions for the captured image. The defect type score calculation unit 31 then calculates a score corresponding to the probability that the detected query defect belongs to each of the pre-set defect types. For example, if four types of defect types such as defect types A, B, C, and D are set, the unit calculates a score corresponding to the probability that each defect type belongs to, such as "score for defect type A: 0.5, score for defect type B: 0.3, score for defect type C: 0.99, score for defect type D: 0.8". The defect types include, for example, scratches and stains, but any type of defect is acceptable. Furthermore, the defect type score is calculated so that a higher probability of a defect occurring corresponds to a higher value.

[0015] The defect type determination unit 32 of the defect classification device 30 determines the defect type of the query defect based on the defect type score. For example, the defect type determination unit 32 determines the type of the query defect to be the type of the defect with the highest defect type score. The defect type output unit 33 of the defect classification device 30 then associates the shape of the defect location of the query defect and its center coordinates, the determined query defect type and defect type score, and predetermined feature quantities in the captured image of the query defect used for type determination, and outputs this as query defect information to the classification result display device 40. At the same time, the defect type output unit 33 stores the query defect information in the storage device 50. In this case, the query defect information may include the image portion of the query defect itself or the entire captured image in the captured image of the banknote.

[0016] The classification result aggregation unit 42 (acquisition unit) of the classification result display device 40 acquires query defect information, which is information about query defects detected from the photographed image of the banknote, which is a printed material, as described above, from the defect classification device 30 or the storage device 50 (steps S11 and S12 in Figure 3). At this time, the query defect information includes the shape of the defect location of the query defect and its center coordinates (position), the type of query defect and defect type score determined, and predetermined feature quantities of the photographed image of the query defect. The classification result aggregation unit 42 also acquires master defect information stored in the storage device 50 (step S13 in Figure 3). At this time, the master defect information includes the shape of the defect location and its center coordinates (position) of the master defect that has been set in advance for the printed material, which is the banknote, the type of master defect and defect type score, and predetermined feature quantities of the photographed image of the master defect. Master defects are defined as defects previously detected from banknote images or hypothetical defects that are expected to be detected from banknotes, while master defect information refers to information on actually detected master defects or information on expected master defects. The storage device 50 stores master defect information corresponding to multiple types of master defects, and further stores multiple master defect information for each type. The master defect information may include the image portion of the master defect itself or the entire image of the banknote photograph.

[0017] The classification result display unit 43 (display unit) of the classification result display device 40 displays query defects and master defects on the display screen. An example of the display screen 60 displayed by the classification result display unit 43 is shown in Figure 4. As shown in Figure 4, the display screen 60 includes a defect location display area 61, a master defect operation button display area 62, a legend display area 63, a query classification result display area 64, a display setting area 65, and a display switching button display area 66.

[0018] Specifically, the classification result display unit 43 first displays an image corresponding to the printed material, a banknote, in the defect location display area 61. In the example in Figure 4, a rectangular image with the shape and size corresponding to one banknote is displayed. Then, the classification result display unit 43 displays a query defect shape (defect response information) corresponding to the query defect at a position on the rectangular image in the defect location display area 61 that corresponds to the center coordinates of the query defect. In the example in Figure 4, the query defect shape is a star shape and is displayed at a position on the rectangular image corresponding to the center coordinates of the query defect. In addition, the classification result display unit 43 displays a master defect shape (master defect response information) corresponding to the type of master defect at a position on the rectangular image in the defect location display area 61 that corresponds to the center coordinates of the master defect. In the example in Figure 4, master defect shapes corresponding to multiple types of master defects, such as defect types A to D, are displayed as different shapes for each type at a position on the rectangular image corresponding to the center coordinates of the master defect. The types of each master defect shape are as shown in the shapes in the legend display area 63 of Figure 4. In this way, the classification result display unit 43 superimposes query defect shapes at the locations corresponding to query defects and master defect shapes at the locations corresponding to master defects onto the rectangular image corresponding to the banknote in the defect location display area 61 (step S14 in Figure 3).

[0019] The classification result display unit 43 may also display the image portion of the query defect itself in the photographed image of the banknote on the rectangular image corresponding to the banknote displayed in the defect location display area 61. For example, the query defect portion of the actual photographed image may be displayed in the area indicated by the symbol T in Figure 5. In this case, the query defect figure may or may not be displayed.

[0020] Furthermore, the classification result display unit 43 displays the master defect shape in association with the query defect shape in the defect location display area 61. Specifically, the classification result display unit 43 first searches for master defects similar to the query defect (step S15 in Figure 3). At this time, the classification result display unit 43 compares the feature quantities of the captured image corresponding to the query defect contained in the query defect information of the query defect with the feature quantities of the captured image corresponding to the master defect contained in the master defect information of the master defect, and searches for master defects by ranking them in descending order of similarity, which is the degree to which the feature quantities are similar to the query defect. At this time, the classification result display unit 43 also searches for the master defect whose feature quantities are most similar to the query defect for each defect type. Then, the classification result display unit 43 connects each master defect found that meets the predetermined criteria with the query defect using a line (step S16 in Figure 3), and identifies and displays the master defect associated with the query defect (step S17 in Figure 3).

[0021] In Figure 6, the master defects determined to have the highest similarity to the query defect shape marked with a star are linked together. In particular, since the similarity rank of a given master defect of defect type C is 1, the information of such master defect is displayed as shown in Figure 6. In this example, the classification result display unit 43 displays the information of the master defect associated with the query defect, with similarity rank: 1, defect type score: 0.99, and defect type: defect C, associated with the corresponding master defect shape. Furthermore, as shown in Figure 7, the classification result display unit 43 may also display the defect type score for all defect types of the master defect that has the highest similarity to the query defect.

[0022] Furthermore, as shown in Figures 4 to 7, the classification result display unit 43 displays the type of query defect in the query classification result display area 64. In the example in Figures 4 to 7, "Defect Type C" is displayed as the type of query defect. At this time, the classification result display unit 43 can receive a command from the user to change the type of query defect in the query classification result display area 64. For example, the classification result display unit 43 can display a list of types in a pull-down menu in the query classification result display area 64 and receive a command to select one of the types. The classification result display unit 43 then changes the defect type included in the query defect information of the query defect to the defect type for which the change command was received and stores it in the storage device 50. As a result, the user can change the type of query defect according to the positional relationship between the displayed query defect figure and the master defect figure, and the associated master defect information, as shown in Figures 4 to 7.

[0023] Furthermore, the classification result display unit 43 receives a command to change query defects to master defects when the user selects the "Save query defects to master" button displayed in the display switching button display area 66 shown in Figures 4 to 7. The classification result display unit 43 then works in cooperation with the master editing unit 41 to change the query defect information of the query defects themselves to the master defect information of the master defects and store it in the storage device 50. As a result, query defects will later be displayed as master defects.

[0024] Furthermore, as shown in Figures 4 to 7, the classification result display unit 43 receives an operation command for a selected master defect when a master defect shape displayed in the defect location display area 61 is selected by the user and a button displayed in the master defect operation button display area 62 is operated. The classification result display unit 43 then works in cooperation with the master editing unit 41 to process the operation command. For example, when a master defect shape is selected and the "Delete" button in the master defect operation button display area 62 is operated, the classification result display unit 43 deletes the corresponding master defect information from the storage device 50 as a process to delete the selected master defect. Also, for example, when a master defect shape is selected and the "Disable" button in the master defect operation button display area 62 is operated, the classification result display unit 43 temporarily removes the display of the corresponding master defect shape from the defect location display area 61 as a process to disable the selected master defect. Furthermore, for example, when a master defect shape is selected and the "Change Classification" button in the master defect operation button display area 62 is operated, the classification result display unit 43 displays a screen for inputting the new type of the master defect as a process to change the classification of the selected master defect, accepts the input of the new type from the user, changes the type in the corresponding master defect information, and stores it in the storage device 50. Also, for example, when a master defect shape is selected and the "Display Image" button in the master defect operation button display area 62 is operated, the classification result display unit 43 displays a photograph of an actual banknote corresponding to the master defect in a pop-up window.

[0025] Furthermore, when the "Display in Large Format Position" button displayed in the display switching button display area 66 shown in Figures 4 to 7 is selected, the classification result display unit 43 displays an image corresponding to the large format unit of the captured image. Specifically, as shown in Figure 8, the classification result display unit 43 displays a large format defect position display area 71 and a legend display area 72 on the display screen 60. Then, as an example, the classification result display unit 43 displays an image corresponding to the large format unit of the captured image, in which multiple banknotes are arranged in multiple rows and columns, in the large format defect position display area 71, and displays query defect shapes and master defect shapes on this image.

[0026] Furthermore, when the "Display with Feature Map" button displayed in the display switching button display area 66 shown in Figures 4 to 7 is selected, the classification result display unit 43 displays the features of the captured image corresponding to the query defect and the features of the captured image corresponding to the master defect. Specifically, as shown in Figure 9, the classification result display unit 43 displays a feature map display area 81 and a legend display area (not shown) on the display screen 60. Then, as an example, the classification result display unit 43 displays the distribution of features between the query defect and each master defect in the feature map display area 81. Note that in the example in Figure 9, the case where the features are two-dimensional is illustrated, but the distribution of features with any number of dimensions may be displayed.

[0027] As described above, this disclosure displays query defects and master defects on an image corresponding to a printed banknote, allowing for easy comparison of the positional relationship between query defects and master defects, and enabling analysis and identification of the validity and trends of defects that may occur in the printed material. Furthermore, by identifying and displaying master defects that are similar to or associated with the query defects, the characteristics of query defects and master defects can be examined in more detail. In addition, the types of query defects and master defects can be changed based on the results of the examination. As a result, the efficiency of the examination work for defects in printed materials can be improved.

[0028] <Second Embodiment> Next, a second embodiment of the present disclosure will be described with reference to the drawings. The drawings may be relevant to either embodiment.

[0029] The information processing system in this embodiment has the same configuration as Embodiment 1 described above. In addition, the information processing system has the following configuration. The following will mainly describe the configuration that differs from the above.

[0030] The classification result display device 40, which constitutes the information processing system in this embodiment, further has a function to prompt the user to delete or change the type of master defects. An example of such a function is described below.

[0031] First, as shown in Figure 11, suppose the user has modified the type of query defect displayed in the query classification result display area 64 from "Defect Type C" to "Defect Type D" (Yes in step S21 of Figure 10). Then, the classification result display unit 43 searches for the master defect that is most similar to the query defect among the master results of Defect Type D, which is the modified query defect type (step S22 of Figure 10). In addition, the classification result display unit 43 searches for master defects that have a higher similarity to the query defect than the master defects of Defect Type D that were found, and highlights such master defects (step S23 of Figure 10), and further displays a deletion suggestion for the highlighted master defect (step S24 of Figure 10). In Figure 11, an example is shown where a master defect of Defect Type C located near the query defect (star) is relevant, highlighted with a dotted frame, and the text "[Delete] Suggestion" is displayed as shown by reference numeral 67.

[0032] Then, if the user agrees to delete the master defect (Yes in step S25 of Figure 10) and performs the deletion operation as described above, the classification result display unit 43 works in cooperation with the master editing unit 41 to delete the master defect (step S26 of Figure 10). On the other hand, if the user does not agree to delete the master defect (No in step S25 of Figure 10), the classification result display unit 43 highlights the master defect with the highest similarity to the query defect (step S27 of Figure 10) and prompts the user to change the defect type of that master defect (step S28 of Figure 10). For example, in the screen of Figure 11, the master defect of defect type C located near the query defect (star) that has been changed to defect type D is highlighted with a dotted frame, and the text "[Suggest changing to defect type D]" is displayed. Then, if the user performs the operation to change the type of the master defect as described above, the classification result display unit 43 works in cooperation with the master editing unit 41 to change the type of the master defect.

[0033] In the above, the system outputs a prompt to delete or change the type of a master defect when the type of a query defect changes, but such a prompt may be made at any time. For example, the classification result display unit 43 may prompt the user to delete or change the type of master defects that are different in type from the query defects, depending on the similarity between the query defects and the master defects.

[0034] As described above, by prompting users to delete or change the type of master defects, it becomes easier for users to decide whether to delete or change the type of master defects, thereby improving the efficiency of defect verification work.

[0035] <Third Embodiment> Next, a third embodiment of this disclosure will be described with reference to the drawings. This embodiment shows an outline of the information processing system described in the embodiments described above. Note that the drawings may be relevant to any of the embodiments.

[0036] First, the hardware configuration of the information processing device 100 in this disclosure will be described. The information processing device 100 is composed of a general information processing device, and as an example, it is equipped with the following hardware configuration as shown in Figure 12. ·CPU(Central Processing Unit)101(Arithmetic unit) ROM (Read Only Memory) 102 (Storage Device) • RAM (Random Access Memory) 103 (Storage Device) • Program group 104 loaded into RAM 103 • Storage device 105 for storing the program group 104 • Drive device 106 for reading and writing to external storage medium 110 of the information processing device. • Communication interface 107 connecting to a communication network 111 outside the information processing device. • Input / output interface 108 for data input and output. • Bus 109 connecting each component

[0037] Figure 12 shows an example of the hardware configuration of the information processing device 100, and the hardware configuration of the information processing device is not limited to the case described above. For example, the information processing device may consist of only a part of the configuration described above, such as not having a drive device 106. In addition, the information processing device may use a GPU (Graphic Processing Unit), DSP (Digital Signal Processor), MPU (Micro Processing Unit), FPU (Floating point number Processing Unit), PPU (Physics Processing Unit), TPU (Tensor Processing Unit), quantum processor, microcontroller, or a combination thereof instead of the CPU described above.

[0038] The information processing device 100 can be equipped with the acquisition unit 121 and display unit 122 shown in Figure 13 by having the CPU 101 acquire the program group 104 and execute it. The program group 104 is, for example, stored in advance in a storage device 105 or ROM 102, and the CPU 101 loads it into RAM 103 and executes it as needed. The program group 104 may also be supplied to the CPU 101 via a communication network 111, or it may be stored in advance in a storage medium 110, and the drive device 106 reads the program and supplies it to the CPU 101. However, the acquisition unit 121 and display unit 122 described above may be constructed with dedicated electronic circuits to realize such means.

[0039] The acquisition unit 121 acquires defect information including the location of defects detected from the printed material, and master defect information including the location of master defects pre-set for the printed material (step S101 in Figure 14). The display unit 122 displays defect response information corresponding to defects at the locations included in the defect information, and also displays master defect response information corresponding to master defects at the locations included in the master defect information (step S102 in Figure 14).

[0040] In the above configuration, the information processing device 100 acquires information on query defects, which are defects detected from the printed material, and information on pre-configured master defects. At this time, the information on query defects and master defects includes information on the location of the defects. The information processing device 100 then displays an image of the shape corresponding to the printed material and displays the query defects and master defects on this image, respectively. As a result, the user can recognize the positional relationship between the query defects and master defects on the printed material and analyze and determine the validity and trends of defects that may occur in the printed material. Consequently, the efficiency of the verification work for defects in printed materials can be improved.

[0041] Furthermore, at least one of the functions of the data acquisition unit 121 and the display unit 122 described above may be performed on an information processing device installed and connected to any location on the network, that is, it may be performed using so-called cloud computing.

[0042] Furthermore, the aforementioned programs can be stored and supplied to a computer using various types of non-transitory computer-readable media. Non-transitory computer-readable media include various types of tangible storage media. Examples of non-transitory computer-readable media include magnetic recording media (e.g., flexible disks, magnetic tapes, hard disk drives), magneto-optical recording media (e.g., magneto-optical disks), CD-ROMs (Read Only Memory), CD-Rs, CD-R / Ws, and semiconductor memory (e.g., mask ROMs, PROMs (Programmable ROMs), EPROMs (Erasable PROMs), flash ROMs, and RAMs (Random Access Memory)). Programs may also be supplied to a computer using various types of transient computer-readable media. Examples of transient computer-readable media include electrical signals, optical signals, and electromagnetic waves. Transitory computer-readable media can be supplied to a computer via wired communication channels such as electric wires and optical fibers, or via wireless communication channels.

[0043] Although the present disclosure has been described above with reference to embodiments, the present disclosure is not limited to the embodiments described above. Various modifications to the structure and details of the present disclosure are possible, as can be understood by those skilled in the art within the scope of the present disclosure. Furthermore, each of the embodiments described above can be combined with other embodiments as appropriate.

[0044] <Note> Some or all of the above embodiments may also be described as follows. The general configuration of the information processing apparatus, information processing method, and program in this disclosure is described below. However, this disclosure is not limited to the configurations described below. Furthermore, some or all of the configurations and functions described in Appendices 2 to 8.3, which are dependent on Appendice 1 below, may also be dependent on other Appendices 9 and 10 in the same way as in Appendices 2 to 8.3. Moreover, not limited to Appendices 1, 9, and 10, some or all of the configurations and functions described as appendices may also be dependent on similar hardware, software, various recording means for recording software, or systems, without departing from the embodiments described above. (Note 1) An acquisition unit that acquires defect information including the location of defects detected from the printed material, and master defect information including the location of master defects pre-set for the printed material. A display unit that displays defect response information corresponding to the defect at the location included in the defect information on an image corresponding to a printed material, and also displays master defect response information corresponding to the master defect at the location included in the master defect information, Equipped with an information processing device. (Note 2) The information processing device described in Appendix 1, The display unit identifies and displays the master defect correspondence information corresponding to the master defect associated with the defect according to a predetermined criterion on the image. Information processing device. (Note 3) The information processing device described in Appendix 2, The display unit displays, on the image, the defect response information corresponding to the defect and the master defect response information corresponding to the master defect associated with the defect according to a predetermined criterion, in association with each other. Information processing device. (Note 4) The information processing device described in Appendix 1, The acquisition unit acquires the master defect information, including the type of master defect, The display unit displays the master defect correspondence information corresponding to the master defect, by identifying the type included in the master defect information, on the image. Information processing device. (Note 5) The information processing device described in Appendix 4, The acquisition unit acquires the defect information, including the type of defect, The display unit displays information that identifies the type of defect included in the defect information, and changes the type of defect when it receives a command to change the type of defect. Information processing device. (Note 6) The information processing device described in Appendix 1, The display unit changes the defect to the master defect when it receives a command to change the defect to the master defect. Information processing device. (Note 7) The information processing device described in Appendix 1, When the display unit receives a command to delete the master defect or change the type of the master defect, it will delete the master defect or change the type of the master defect. Information processing device. (Note 8) The information processing device described in Appendix 7, The display unit provides a prompt to delete or change the type of master defect associated with the defect according to a predetermined criterion. Information processing device. (Note 8.1) The information processing device described in Appendix 8, The display unit provides a prompt to delete or change the type of master defect for master defects that are of a different type from the aforementioned defect. Information processing device. (Appendix 8.2) The information processing device described in Appendix 1, The display unit displays the image portion of the defect itself detected from the printed material on the image. Information processing device. (Appendix 8.3) The information processing device described in Appendix 1, The display unit displays the defect response information and the master defect response information on the image corresponding to a part of the printed material and on the overall image corresponding to the entire printed material, respectively. Information processing device. (Note 9) Information processing device, Defect information, including the location of defects detected in the printed material, and master defect information, including the location of master defects pre-set for the printed material, are obtained. On the image corresponding to the printed material, defect response information corresponding to the defect is displayed at the location included in the defect information, and master defect response information corresponding to the master defect is displayed at the location included in the master defect information. Information processing methods. (Note 10) In an information processing device, Defect information, including the location of defects detected in the printed material, and master defect information, including the location of master defects pre-set for the printed material, are obtained. On the image corresponding to the printed material, defect response information corresponding to the defect is displayed at the location included in the defect information, and master defect response information corresponding to the master defect is displayed at the location included in the master defect information. A program that executes a process. [Explanation of symbols]

[0045] 10 Image input device 11 Imaging Unit 12 Image output section 20 Defect detection device 21 Defect detection unit 22 Judgment section 23 Defect detection score output unit 30 Defect Classification Device 31 Defect Type Score Calculation Unit 32 Defect type determination unit 33. Defect type output section 40 Classification result display device 41 Master Editorial Department 42 Classification Results Aggregation Department 43 Classification result display section 50 Storage device 60 display screen 100 Information Processing Devices 101 CPU 102 ROM 103 RAM 104 Program Groups 105 Storage device 106 Drive unit 107 Communication Interface 108 Input / Output Interfaces 109 Bus 110 Storage medium 111 Communication Network 121 Acquisition Department 122 Display section

Claims

1. An acquisition unit that acquires defect information including the location of defects detected from the printed material, and master defect information including the location of master defects pre-set for the printed material. A display unit that displays defect response information corresponding to the defect at the location included in the defect information on an image corresponding to a printed material, and also displays master defect response information corresponding to the master defect at the location included in the master defect information, Equipped with an information processing device.

2. An information processing apparatus according to claim 1, The display unit identifies and displays the master defect correspondence information corresponding to the master defect associated with the defect according to a predetermined criterion on the image. Information processing device.

3. An information processing apparatus according to claim 2, The display unit displays, on the image, the defect response information corresponding to the defect and the master defect response information corresponding to the master defect associated with the defect according to a predetermined criterion, in association with each other. Information processing device.

4. An information processing apparatus according to claim 1, The acquisition unit acquires the master defect information, including the type of master defect, The display unit identifies the type of master defect included in the master defect information and displays the master defect corresponding information on the image. Information processing device.

5. An information processing apparatus according to claim 4, The acquisition unit acquires the defect information, including the type of defect, The display unit displays information that identifies the type of defect included in the defect information, and changes the type of defect when it receives a command to change the type of defect. Information processing device.

6. An information processing apparatus according to claim 1, The display unit changes the defect to the master defect when it receives a command to change the defect to the master defect. Information processing device.

7. An information processing apparatus according to claim 1, When the display unit receives a command to delete the master defect or change the type of the master defect, it will delete the master defect or change the type of the master defect. Information processing device.

8. An information processing apparatus according to claim 7, The display unit provides a prompt to delete or change the type of master defect associated with the defect according to a predetermined criterion. Information processing device.

9. Information processing device, Defect information, including the location of defects detected in the printed material, and master defect information, including the location of master defects pre-set for the printed material, are obtained. On the image corresponding to the printed material, defect response information corresponding to the defect is displayed at the location included in the defect information, and master defect response information corresponding to the master defect is displayed at the location included in the master defect information. Information processing methods.

10. In an information processing device, Defect information, including the location of defects detected in the printed material, and master defect information, including the location of master defects pre-set for the printed material, are obtained. On the image corresponding to the printed material, defect response information corresponding to the defect is displayed at the location included in the defect information, and master defect response information corresponding to the master defect is displayed at the location included in the master defect information. A program that executes a process.

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