Defect inspection device and defect inspection method

Abstract

The present invention relates to a defect inspection device and a defect inspection method, wherein the defect inspection device according to the present invention includes a laminated section in which a plurality of unit cells, each including at least one electrode and at least one separator, are stacked to form a laminate, a tilt measuring means for measuring the tilt of the uppermost surface of the laminate stacked in the laminated section, and a discrimination unit for determining defects in the unit cells based on the tilt measurement value obtained by the tilt measuring means.

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