Thin film deposition apparatus cluster
The substrate processing apparatus uses laminar flow and substrate rotation to address non-uniform precursor distribution, achieving uniform deposition and reducing resource consumption by ensuring consistent processing conditions across multiple substrates.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- PICOSUN OY
- Filing Date
- 2024-06-13
- Publication Date
- 2026-06-25
AI Technical Summary
Existing substrate processing apparatuses face challenges in achieving uniform deposition of precursors across multiple substrates in a batch processing environment, leading to non-uniform processing conditions and increased resource consumption.
The apparatus employs a laminar flow reaction chamber with a fluid distributor and a vertically adjustable substrate rotation system to ensure uniform precursor distribution and substrate processing, utilizing a substrate holder that accommodates multiple substrates in a stack with gaps for laminar fluid flow and rotating the substrates during processing to mitigate non-uniformity.
This approach achieves homogeneous deposition on all substrates by ensuring uniform precursor concentration and flow, reducing processing time and resource usage while enhancing processing quality.
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