Apparatus and method for inspecting the optical properties of a surface

Abstract

An apparatus (1) for inspecting the optical properties of a surface, comprising: a first radiation device (2) suitable and intended for emitting radiation onto a surface to be inspected in a first irradiation direction (R1) characterized by a first irradiation angle (a1); a first radiation detection device (12) suitable and intended for detecting radiation emitted from a surface to be inspected (10) in response to the irradiated radiation at a first radiation angle (b1); and a second radiation detection device (14) suitable and intended for detecting radiation emitted from a surface to be inspected (10) in response to the irradiated radiation at a second radiation angle (b2), The apparatus (1) is suitable for irradiating a surface to be inspected with radiation in a second irradiation direction (R2) characterized by a second irradiation angle (b2) in response to the irradiated radiation, and comprises a second radiation device (4) intended to do so, wherein the first irradiation angle (a1) and the second irradiation angle (a2) are substantially opposite to each other with respect to the direction perpendicular to the surface to be inspected (10).

Claims

1. An apparatus (1) for inspecting the optical properties of a surface, comprising: a first radiation device (2) suitable and intended for irradiating the surface to be inspected with radiation in a first irradiation direction (R1) characterized by a first irradiation angle (a1); a first radiation detection device (12) suitable and intended for detecting radiation emitted from the surface to be inspected in response to the irradiated radiation at a first radiation angle (b1); and a second radiation detection device (14) suitable and intended for detecting radiation emitted from the surface to be inspected (10) in response to the irradiated radiation at a second radiation angle (b2), The apparatus (1) is suitable for detecting radiation emitted by the surface to be inspected (10) in response to the irradiated radiation, and in particular reflected radiation, under a further radiation angle (R1'), and has a further radiation detection device (15) intended to do so, wherein the irradiation direction (R1) and the emission direction (R1') are substantially opposite to each other, and / or The apparatus (1) is suitable for irradiating the surface to be inspected with radiation in a second irradiation direction (R2) characterized by a second irradiation angle (a2), and has a second radiation device (4) intended to do so, wherein the first irradiation angle (a1) and the second irradiation angle (a2) are substantially opposite to each other with respect to a direction perpendicular to the surface to be inspected. Device (1).

2. The apparatus (1) includes a control device that directs the radiation emitted by the first radiation device onto the surface and, in response to this incident radiation, directs the radiation emitted by the surface onto the further radiation detection device. The apparatus (1) according to claim 1, characterized in that

3. The second radiation device is positioned such that the radiation emitted by the second radiation device (4) is reflected by the surface to be inspected in a direction opposite to the first irradiation direction (R1). The apparatus (1) according to claim 1 or 2, characterized in that

4. The apparatus is suitable for detecting radiation emitted by the second radiation device (4) and reflected by the surface, and has a further detection device (22) intended for such purposes. The apparatus (1) according to at least one of claims 1 to 3, characterized in that

5. The apparatus comprises a housing (20) in which the first radiation device (2), the first radiation detection device (12), the second radiation detection device (14), and the further radiation detection device are arranged, the housing having an opening for the first radiation device to illuminate the surface to be inspected (10). The apparatus (1) according to at least one of claims 1 to 4, characterized in that

6. The first radiator is suitable for and intended to emit radiation of different colors, and the first radiator preferably comprises a light source and a plurality of color filter devices that can selectively move within a beam path between the light source and the surface to be inspected, and the radiator preferably comprises a filter wheel that can rotate about a predetermined axis of rotation and on which the color filter devices are arranged. The apparatus (1) according to at least one of claims 1 to 5, characterized in that

7. The apparatus (1) has a radiation deflection device (40) which is designed and arranged such that radiation emitted from the first radiation device is directed toward the surface (10) by the radiation deflection device (40), and on the other hand, radiation reflected from the surface is directed toward the further detector device or the further radiation detection device by the radiation deflection device, the radiation deflection device preferably comprises a radiation splitter. The apparatus (1) according to at least one of claims 1 to 6, characterized in that

8. The first angle (a1) is 40° to 50°, preferably 42° to 48°, preferably 43° to 47°, particularly preferably 44° to 46°, and particularly preferably 45°, with respect to the direction perpendicular to the surface. The apparatus (1) according to at least one of claims 1 to 7, characterized in that

9. The apparatus is suitable for detecting radiation emitted from the surface to be inspected (10) in response to the irradiated radiation at a third radiation angle (b3) and has a third radiation detection device (16) intended for such purpose, and in particular the apparatus is suitable for detecting radiation emitted from the surface to be inspected (10) in response to the irradiated radiation, and especially scattered radiation, at a fourth radiation angle (b4) and has a fourth radiation detection device (16) intended for such purpose. The apparatus (1) according to at least one of claims 1 to 8, characterized in that

10. The apparatus (1) is suitable for spatially resolving the detection of emitted radiation, particularly the radiation scattered by the surface (10), and has an image recording device intended for this purpose, wherein the image recording device is preferably positioned vertically above the surface to be inspected. The apparatus (1) according to at least one of claims 1 to 9, characterized by the above.

11. The apparatus (1) is suitable for detecting radiation emitted from the surface in the emission direction (R1') and preferably emits at least one signal characterizing the radiation, and has further radiation detector devices (..) intended to do so. The apparatus (1) according to at least one of claims 1 to 10, characterized in that

12. A radiation deflection device (40) having a housing (42), a radiation inlet (44) through which radiation can enter the housing in a first irradiation direction (R1), and a first radiation outlet (46) through which the radiation entering through the radiation inlet (44) can exit the housing in the irradiation direction, A radiation splitter device (48) is located within the housing (42), and the radiation splitter device (48) is suitable and intended to deflect the radiation passing through the radiation outlet (46) in the direction opposite to the irradiation direction (R1') in a deflection direction (Q) that deviates from both the irradiation direction (R1) and the direction opposite to the irradiation direction, particularly perpendicular to the irradiation direction, and the housing (42) further has a second radiation outlet (52) into which the radiation deflected by the radiation splitter device can exit the housing (42). A radiation deflection device (40) characterized by the following features.

13. A method (1) for inspecting the optical properties of a surface, wherein a first radiation device (2) irradiates the surface to be inspected with radiation in a first irradiation direction (R1) characterized by a first irradiation angle (a1), a first radiation detection device (12) detects the radiation emitted from the surface to be inspected, particularly scattered, in response to the irradiated radiation, at a first radiation angle (b1) (10), and a second radiation detection device (14) detects the radiation emitted from the surface to be inspected (10), particularly scattered, at a second radiation angle (b2). The apparatus (1) has a further radiation detection device that detects radiation emitted by the surface to be inspected (10) in response to the irradiated radiation, and in particular reflected radiation, under a further radiation angle (R1'), wherein the irradiation direction (R1) and the emission direction (R1') are substantially opposite to each other, and / or The second radiation device (4) of the apparatus irradiates the surface to be inspected (10) with radiation in a second irradiation direction (R2) characterized by a second irradiation angle (a2), wherein the first irradiation angle (a1) and the second irradiation angle (a2) are substantially opposite to each other with respect to a direction perpendicular to the surface to be inspected. A method (1) characterized by the following.

14. The first radiating device continuously illuminates the surface with light of particularly different wavelengths. The method according to any one of claims 1 to 13, characterized in that

15. Use of the apparatus according to at least one of claims 1 to 11 and / or the method according to at least one of claims 13 to 14 for inspecting the optical surface properties of a retroreflective surface.

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