Electrical parameter sensor probe and method for detecting an electrical parameter in an insulated conductor - Patents.com

Abstract

To provide a system and method for measuring electrical parameters in an insulated conductor without requiring a galvanic connection.SOLUTION: A non-contact, electrical parameter sensor probe may be operative to measure both current and voltage in an insulated conductor. The sensor probe 104 includes: a body; a Rogowski coil 140 coupled to the body; and a non-contact voltage sensor coupled to the body or the Rogowski coil. The size of a loop of the Rogowski coil is selectively adjustable, such that the loop may be tightened around the conductor under test until the conductor is positioned adjacent to a portion of the body or Rogowski coil that includes the non-contact voltage sensor 146. Measured electrical parameters may be provided to a user, e.g., via a display, or may be transmitted to one or more external systems via a suitable wired or wireless connection.SELECTED DRAWING: Figure 2

Description

[Technical field]

[0001] The present disclosure relates generally to electrical parameter measuring devices, and more particularly to sensor probes for electrical parameter measuring devices. [Background technology]

[0002] A voltmeter is an instrument used to measure voltage in an electrical circuit. Instruments that measure more than one electrical property are called multimeters or digital multimeters (DMMs) and operate to measure several parameters commonly required for service, troubleshooting, and maintenance applications. Such parameters typically include alternating current (AC) voltage and current, direct current (DC) voltage and current, and resistance or continuity. Other parameters, such as power quality, frequency, capacitance, and temperature, can also be measured to meet the requirements of a particular application.

[0003] When using a conventional voltmeter or multimeter to measure AC voltage, it is necessary to make galvanic contact of at least two measurement electrodes or probes with a conductor, and in many cases it is necessary to cut off the insulation of an insulated wire or to provide a terminal for measurement in advance. Besides requiring an exposed conductor or terminal for galvanic contact, the process of applying a voltmeter probe to a stripped conductor or terminal can be relatively dangerous due to the risk of shock or electrocution. Non-contact voltage measurement devices are sometimes used to detect the presence of alternating current (AC) voltage without requiring galvanic contact with a circuit. When a voltage is detected, the user is alerted by an indication such as a light, a buzzer, or a vibration motor. However, such non-contact voltage detectors only indicate the presence or absence of AC voltage, but do not indicate the actual magnitude (e.g., RMS value) of the AC voltage.

[0004] General purpose multimeters employing internal current shunts may generally be limited to a maximum of 10 amps, for example, due to the capacity of the multimeter test leads and the circuitry to pass the current. Additionally, multimeters generally must be protected by an internal fuse to prevent excessive current levels from passing through the multimeter. This is both for safety reasons and to prevent damage to the multimeter. The difficulty of removing a blown fuse, combined with the time and expense required to obtain a replacement fuse, makes it desirable to have a non-contact current measurement instrument that does not require an internal fuse.

[0005] Clamp-on multimeters improve the ability to measure current with general-purpose multimeters by employing an integrated current clamp that senses the current in a current-carrying conductor without the need to disconnect the current-carrying conductor or interrupt a circuit that includes the current-carrying conductor. The current clamp is typically provided in the same housing as the multimeter that measures other parameters such as voltage and resistance in a conventional manner using separate test probes. The current clamp is closed around the current-carrying conductor, which may include, for example, copper wire or busbar, to sense the magnetic field created by the current flow. The current clamp provides a voltage signal for measurement by the multimeter that calculates and displays the measured current level. Because no current is shunted from the current-carrying conductor through the clamp-on multimeter, constraints on the maximum current that can be measured are largely eliminated. Similarly, internal fuses are eliminated in clamp-on multimeters.

[0006] To obtain a valid current measurement, the magnetic core within the current clamp must encircle a current carrying conductor so that the current clamp closes. The current clamp must be mechanically actuated to open the jaws, the current carrying conductor is inserted, and then the jaws must close around the current carrying conductor. In tight physical spaces, such as electrical cabinets, it can be inconvenient and difficult to insert a clamp-on multimeter and take a current measurement using this technique. Furthermore, the jaws must be aligned to complete the magnetic core in order to obtain a valid current measurement. Thus, clamp-on multimeters are difficult to use in confined spaces and require a large physical space to open the jaws of the current clamp. Clamp-on multimeters also tend to be physically heavy due to the significant amount of iron used in the magnetic core. Furthermore, high levels of current can saturate the magnetic core. Thus, the current measurement capacity of a clamp-on multimeter is limited to current levels that do not saturate the magnetic core.

[0007] A Rogowski coil can sense alternating current flowing through a conductor surrounded by the Rogowski coil. There are many differences between a Rogowski coil and a clamp. For example, a Rogowski coil is more flexible and has a smaller cross-section than the substantially rigid clamp of a multimeter. Thus, a Rogowski coil can be used in confined spaces that are too tight and / or too small for a clamp-type multimeter. Furthermore, the loops of a Rogowski coil can be reformed to surround conductors with cross-sections that a clamp cannot surround. Another difference is the greater current measurement capability of a Rogowski coil compared to a clamp. Specifically, the air core of a Rogowski does not saturate at current levels that would saturate the magnetic material in the center of the clamp. [Prior art documents] [Patent documents]

[0008] [Patent Document 1] U.S. Patent No. 8,330,449 [Patent Document 2] U.S. Patent No. 5,473,244 Summary of the Invention [Means for solving the problem]

[0009] An electrical parameter sensor probe operative to detect an electrical parameter in an insulated conductor without requiring galvanic contact with the insulated conductor includes a body including a Rogowski coil and a first channel and a second channel, the first and second channels having respective first and second open ends, the respective first ends of the first and second channels being spaced apart from one another and the respective second ends of the first and second channels being adjacent one another, each of the first and second channels being arranged such that a loop of the Rogowski coil is formed between the respective first open ends of the first and second channels. The insulated conductor may be summarized as including a body sized and dimensioned to slidably receive a respective length of the Rogowski coil therein, the size of the loop being selectively adjustable within at least one of the first and second channels by movement of the Rogowski coil, and a non-contact sensor coupled to the body and positioned between a first end of each of the first and second channels, the non-contact sensor operative to sense at least one electrical parameter within the insulated conductor when the insulated conductor is within the loop formed by the Rogowski coil. The second channel of the body may include a lateral opening extending between the first and second open ends, the lateral opening sized and dimensioned to allow the length of the Rogowski coil to be selectively inserted and removed from the second channel. The lateral opening may have a width less than a diameter of the Rogowski coil, and at least a portion of the second channel adjacent the lateral opening may be formed from a flexible material that elastically deforms to allow a length of the Rogowski coil to be selectively inserted into and removed from the second channel. The second channel of the body may include a fastener that operates to allow a length of the Rogowski coil to be selectively inserted into and removed from the second channel. The Rogowski coil may not be removable from the first channel during normal use of the electrical parameter sensor probe. The non-contact sensor may include at least one of a non-contact voltage sensor or a non-contact current sensor.

[0010] The electrical parameter sensor probe may further include a non-contact voltage sensor coupled to the Rogowski coil, the non-contact voltage sensor operative to sense a voltage in the insulated conductor when the insulated conductor is within the loop formed by the Rogowski coil.

[0011] The electrical parameter sensor probe may further include an interface connector operably coupled to the non-contact sensor and the Rogowski coil, the interface connector being removably matable to a corresponding interface connector on the main body of the non-contact electrical parameter measurement device. The non-contact sensor may include at least one of a non-contact voltage sensor, a Hall effect sensor, a fluxgate sensor, an anisotropic magnetoresistance (AMR) sensor, or a giant magnetoresistance (GMR) sensor.

[0012] An apparatus for measuring an electrical parameter in an insulated conductor includes an electrical parameter sensor probe including a Rogowski coil; and a body including a first channel and a second channel, the first and second channels having respective first and second open ends, the respective first ends of the first and second channels being spaced apart from one another and the respective second ends of the first and second channels being adjacent one another, each of the first and second channels being sized and dimensioned to slidably receive a respective length of the Rogowski coil therein such that a loop of the Rogowski coil is formed between the respective first open ends of the first and second channels, the loop being sized to accommodate a Rogowski coil within at least one of the first and second channels. The insulated conductor may be summarized as including: a body, the insulated conductor being selectively adjustable by movement of the coil; a non-contact sensor coupled to the body and positioned between each of the first ends of the first and second channels, the non-contact sensor operative to sense at least one electrical parameter in the insulated conductor when the insulated conductor is within the loop formed by the Rogowski coil; and a control circuit communicatively coupled to the non-contact sensor and the Rogowski coil, the control circuit receiving sensor data indicative of a signal detected in at least one of the non-contact sensor or the Rogowski coil, and processing the received sensor data to determine the at least one electrical parameter of the insulated conductor.

[0013] The device may further include a main body including a control circuit. The main body may include at least one interface connector, and the electrical parameter sensor probe may be removably connectable to the at least one interface connector of the main body. The device may further include a main body including the electrical parameter sensor probe and a control circuit. The control circuit, during operation, may process received sensor data to determine a voltage in the insulated conductor. The control circuit, during operation, may process received sensor data to determine a voltage and a current in the insulated conductor.

[0014] The apparatus may further include a wireless communication subsystem operably coupled to the control circuitry, wherein during operation the wireless communication subsystem wirelessly transmits the determined electrical parameters to an external system.

[0015] The device may further include a display that visually presents the determined electrical parameter to a user of the device during operation. The non-contact sensor may include at least one of a non-contact voltage sensor, a Hall effect sensor, a fluxgate sensor, an anisotropic magnetoresistance (AMR) sensor, or a giant magnetoresistance (GMR) sensor.

[0016] An electrical parameter sensor probe operative to detect electrical parameters in an insulated conductor without requiring galvanic contact with the insulated conductor may be summarized as including a Rogowski coil having a first end and a second end, a body permanently coupled to the second end of the Rogowski coil, the body including a fastener that selectively couples with the first end of the Rogowski coil, the body being sized and dimensioned to allow a size of the Rogowski coil to be selectively adjusted via movement of the Rogowski coil relative to the body, and a non-contact sensor coupled to the body, the non-contact sensor operative to sense at least one electrical parameter in the insulated conductor when the insulated conductor is within a loop formed by the Rogowski coil.

[0017] An electrical parameter sensor probe that operates to detect electrical parameters in an insulated conductor without requiring galvanic contact with the insulated conductor can be summarized as including a Rogowski coil that receives the insulated conductor therein, at least one non-contact voltage sensor coupled to the Rogowski coil, and a clamp operatively coupled to the Rogowski coil, the clamp operative to deform the Rogowski coil such that the at least one non-contact voltage sensor is positioned adjacent to the insulated conductor under test. [Brief description of the drawings]

[0018] In the drawings, similar elements or functions are identified by the same reference numbers. The dimensions and relative positions of elements in the drawings are not necessarily drawn to scale. For example, the shapes of the various elements and angles are not necessarily drawn to scale, and some of these elements may be arbitrarily enlarged and positioned to improve the clarity of the drawings. It is noted that the particular shapes of the elements as shown are not necessarily intended to convey any information regarding the actual shape of the particular elements, but may simply be selected for ease of recognition in the drawings.

[0019] [Figure 1] FIG. 1 is a schematic circuit diagram of an electrical parameter measurement device including an electrical parameter sensor probe including a Rogowski coil and a non-contact voltage sensor according to one non-limiting exemplary embodiment, where the Rogowski coil can be formed into a loop having an adjustable size shown with the loop open so that an insulated conductor can be received for measurement. [Diagram 2] FIG. 2 is a schematic circuit diagram of the electrical parameter measurement device of FIG. 1 shown with the loop of the Rogowski coil closed and clamped around the insulated conductor under test to position the conductor adjacent to a non-contact voltage sensor, according to one non-limiting exemplary embodiment. [Diagram 3] FIG. 3 is a pictorial circuit diagram of an electrical parameter sensor probe shown with a loop of the Rogowski coil relaxed around an insulated conductor under test, according to one non-limiting exemplary embodiment. [Figure 4] FIG. 4 is a pictorial circuit diagram of an electrical parameter sensor probe shown with a loop of a Rogowski coil clamped around an insulated conductor under test, the insulated conductor being positioned adjacent to a non-contact voltage sensor, according to one non-limiting exemplary embodiment. [Diagram 5]FIG. 5 is a pictorial circuit diagram of the body of an electrical parameter sensor probe showing a lateral opening in a channel of the body that allows a length of Rogowski coil to be removably coupled to the body such that a conductor under test can be positioned inside the loop of the Rogowski coil, according to one non-limiting exemplary embodiment. [Figure 6A] FIG. 6A is a pictorial circuit diagram of an electrical parameter sensor probe shown with a Rogowski coil including first and second ends that abut one another, according to one non-limiting exemplary embodiment. [Figure 6B] FIG. 6B is a pictorial circuit diagram of the electrical parameter sensor probe of FIG. 6A showing the coils of the Rogowski coil at the first and second ends according to one non-limiting exemplary embodiment. [Figure 7A] FIG. 7A is a pictorial circuit diagram of an electrical parameter clamp probe including a Rogowski coil according to one non-limiting exemplary embodiment, the clamp probe shown in an unclamped state. [Figure 7B] FIG. 7B is a pictorial circuit diagram of the electrical parameter sensor clamp probe of FIG. 7A according to one non-limiting exemplary embodiment, where the clamp probe is shown in a clamped state with the Rogowski coil deformed around the insulated conductor under test and at least one non-contact sensor positioned on the Rogowski coil positioned adjacent the insulated conductor to obtain an electrical parameter measurement. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0020] One or more embodiments of the present disclosure are directed to systems and methods for measuring electrical parameters (e.g., voltage, current, power) in insulated or raw non-insulated conductors (e.g., insulated wires) without requiring a galvanic connection between the conductor and an electrical parameter sensor probe. Generally, a non-galvanic contact (or "non-contact") electrical parameter measurement system or device is provided that measures one or more electrical parameters in an insulated conductor. Such systems that do not require a galvanic connection are referred to herein as "non-contact." As used herein, "electrically coupled" includes both direct and indirect electrical coupling unless otherwise specified.

[0021] In at least some embodiments, a non-contact electrical parameter sensor probe is provided that operates to accurately measure both current and voltage in an insulated conductor under test. The sensor probe includes a body, a Rogowski coil coupled to the body, and a non-contact voltage sensor coupled to at least one of the body or the Rogowski coil. The size of the loop of the Rogowski coil is selectively adjustable so that the loop can be tightened around the insulated conductor under test until the conductor is positioned adjacent to a portion of the body or the Rogowski coil that includes the non-contact voltage sensor. Thus, as the loop is tightened to maintain the position of the insulated conductor, the non-contact voltage sensor adjacent the conductor can obtain an accurate voltage measurement, while the Rogowski coil obtains an accurate current measurement. One or more electrical parameters, such as power or phase angle, may be derived using the obtained voltage and current measurements. The measured electrical parameters may be provided to a user, for example, via a display, or may be transmitted to one or more external systems via a suitable wired or wireless connection.

[0022] In the following description, certain specific details are set forth to provide a thorough understanding of various disclosed embodiments. However, those skilled in the art will appreciate that the embodiments may be practiced without one or more of these specific details, or with other methods, components, materials, etc. In other instances, well-known structures related to computer systems, server computers, and / or communication networks have not been shown or described in detail to avoid unnecessarily obscuring the description of the embodiments.

[0023] Unless the context requires otherwise, throughout the following specification and claims, the term "comprising" is synonymous with the term "including" and is inclusive and therefore non-exclusive (i.e., does not exclude additional, unrecited elements or method acts).

[0024] References throughout this specification to "one implementation" or "an implementation" mean that a particular feature, structure, or characteristic described in connection with an embodiment is included in at least one embodiment. Thus, the appearances of the phrases "in one implementation" or "in an implementation" in various places throughout this specification are not necessarily all referring to the same embodiment. However, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0025] As used in this specification and the appended claims, the singular forms "a," "an," and "the" include plural referents unless the content clearly dictates otherwise. It should also be noted that the term "or" is used generally in its sense to include "and / or" unless the context clearly dictates otherwise.

[0026] The headings and abstracts provided herein are for convenience only and do not interpret the scope or meaning of the embodiments.

[0027] 1 is a pictorial circuit diagram of an electrical parameter measurement device 100 according to one non-limiting example embodiment. The electrical parameter measurement device 100 includes a main body or housing 102 and an electrical parameter sensor probe 104. The sensor probe 104 comprises a body 134 coupled to an interface connector 108 via a cable 110. The main body 102 includes an interface connector 106 that detachably mates with a corresponding interface connector 108 of the sensor probe 104.

[0028] The main body 102 further includes a display 112 for presenting measurement results and other information, and an input user interface 114 for inputting information, such as measurement commands or other information. The display 112 may be any suitable type of display, such as a liquid crystal display (LCD), a light-emitting diode (LED) display, an organic LED display, a plasma display, or an electronic ink display. The main body 102 may include one or more audio or tactile outputs (not shown), such as one or more speakers, buzzers, vibrating devices, etc. In the illustrated embodiment, the input user interface 114 includes a number of buttons, although in other embodiments the user interface may additionally or alternatively include one or more other types of input devices, such as a touch pad, a touch screen, a wheel, a knob, a dial, a microphone, etc.

[0029] The main body 102 may also include a power supply, such as a battery or battery pack, for powering various components of the main body and the sensor probe 104. The main body 102 also includes a control circuit 116 that controls various operations of the electrical parameter measurement device 100, such as receiving signals from the sensor probe 104, determining one or more electrical parameters of the insulated conductor 115 being measured, and outputting the measurement data (e.g., to the display 112). The control circuit 116 may include one or more processors (e.g., microcontrollers, DSPs, ASICs, FPGAs), one or more types of memory (e.g., ROM, RAM, flash memory, other non-transitory storage media), and / or one or more other types of processing or control related components.

[0030] In at least some embodiments, the main body 102 can include a wireless communication subsystem 118, which can include one or more of a Bluetooth module, a Wi-Fi module, a ZIGBEE module, a near field communication (NFC) module, etc. The main body 102 can be operable to wirelessly communicate with an external receiving system, such as a computer, a smart phone, a tablet, a personal digital assistant, etc., via the wireless communication subsystem 118 to transmit measurement results to the external system or to receive command signals or input information from the external system. The main body 102 may additionally or alternatively include a wired communication subsystem, such as a USB interface.

[0031] Although only one sensor probe 104 is shown for illustrative purposes, in at least some embodiments, multiple different sensor probes may be removably coupleable to the main body 102 of the electrical parameter measurement device 100. The multiple sensor probes may differ in at least one of shape, structure, or function, for example, to provide different functionality for the electrical parameter measurement device 100.

[0032] The sensor probe 104 includes a flexible Rogowski coil 140 having a length extending between a first end 142 and a second end 144. Similar to a conventional Rogowski coil, the Rogowski coil 140 may include a toroidal coil having a central wire helically wound around a flexible non-magnetic core and surrounded by the same wire sheathed within a flexible sheath. As a result, one end of the coil is taken through the coil itself and pulled out from the other side such that both ends of the coil are on the same side (e.g., first end 142, second end 144). The ends of the coil may be electrically connected to a signal cable 110 such that signals from the Rogowski coil 140 are sent to the main body 102 for processing. The non-magnetic core may include, for example, air. The sheath of the Rogowski coil 140 may be sufficiently rigid to protect the toroidal coil's form, yet may be sufficiently flexible to allow the Rogowski coil to be formed into a loop that is adjustable in size and shape, as discussed further below.

[0033] The body 134 of the sensor probe 104 includes one or more non-contact sensors 146 (e.g., non-contact voltage sensors) coupled thereto that operate to sense one or more electrical parameters within the insulated conductor 115 under test. Additionally or alternatively, the one or more non-contact sensors 146 may be coupled to a Rogowski coil instead of the body 134 of the sensor probe 104. The non-contact sensors 146 may be electrically connected to the signal cable 110 such that signals from the sensors are sent to the main body 102 for processing. The non-contact sensors may include non-contact voltage sensors, Hall effect elements, current transformers, fluxgate sensors, anisotropic magnetoresistance (AMR) sensors, giant magnetoresistance (GMR) sensors, or other types of sensors that operate to sense electrical parameters of the conductor 115 without requiring galvanic contact. Various non-limiting examples of non-contact sensors are disclosed in U.S. Provisional Patent Application No. 62 / 421,124 (filed November 11, 2016), U.S. Patent Application No. 15 / 345,256 (filed November 7, 2016), U.S. Patent Application No. 15 / 413,025 (filed January 23, 2017), U.S. Patent Application No. 15 / 412,891 (filed January 23, 2017), U.S. Patent Application No. 15 / 604,320 (filed May 24, 2017), and U.S. Patent Application No. 15 / 625,745 (filed June 16, 2017), the entireties of which are incorporated by reference herein.

[0034] The sensor probe 104 may also include a processing or control circuit 120 operatively coupled to the one or more sensors 146 that operates to process sensor signals received from the one or more sensors 146 or Rogowski coil 140, and that operates to send sensor data indicative of such sensor signals to the control circuit 116 of the main body 102 for processing. The control circuit 120 may additionally or alternatively include conditioning or conversion circuitry that operates to condition or convert the signals into a form receivable by the main body 102, such as an analog form (e.g., 0-1V) or a digital form (e.g., 8-bit, 16-bit, 64-bit).

[0035] To obtain measurements using the non-contact voltage sensor 146, it may be beneficial for the sensor to be as close as possible to the conductor 115 under test. In at least some embodiments, it may be beneficial for the conductor 115 to be positioned in a particular orientation (e.g., perpendicular) relative to the non-contact sensor 146. In a conventional Rogowski coil having a relatively large, non-adjustable loop (e.g., 10 inches, 18 inches), the Rogowski coil is suspended from the inductor under test at a point spaced apart from the body 134 of the sensor probe 104. From this position, it may be difficult or impossible for the non-contact voltage sensor to obtain accurate voltage measurements in the conductor under test. As discussed further below, in one or more embodiments of the present disclosure, the loop of the Rogowski coil 140 is selectively adjustable so that the loop can be tightened around the conductor 115 to position the conductor adjacent to the non-contact sensor 146, as shown in FIGS. 2 and 4, so that accurate measurements can be obtained.

[0036] 3, the body 134 of the sensor probe 104 includes a first channel 148 and a second channel 150, each of which slidably receives a portion of the Rogowski coil 140. The first channel 148 and the second channel 150 each have a respective open first end 148a and 150a and a respective open second end 148b and 150b. The first ends 148a and 150a of the first channel 148 and the second channel 150, respectively, are spaced apart from one another, and the second ends 148a and 150b of the first and second channels, respectively, are adjacent to one another. Each of the first channel 148 and the second channel 150 is sized and dimensioned to slidably receive a respective length of the Rogowski coil 140 therein such that a loop of the Rogowski coil is formed between the first open ends 148a and 150a of the first channel 148 and the second channel 150, respectively, the size of the loop being selectively adjustable by movement of the Rogowski coil within at least one of the first and second channels. Additionally, the two channels 148 and 150 converge at the second 148b and 150b adjacent one another, which provides the Rogowski coil 140 with an overall shape that provides accurate measurements.

[0037] 1, the first end 142 of the Rogowski coil 140 may be maintained (e.g., permanently) within the first channel 148, and the second end 144 may be selectively removable from the second channel 150 via a lateral opening 152 (see FIG. 5) extending between the first and second ends 150a, 150b. As an example, a portion of the first end 142 of the Rogowski coil 140 may be larger than the opening at the second end 148b of the first channel 148 to prevent the Rogowski coil from being removed from the first channel.

[0038] 1, when the second end 144 of the Rogowski coil 140 is separated from the body 134, the conductor 115 may then be positioned within a loop opening 160 (FIG. 3) adjacent the body 134 of the sensor probe 104. The second end 144 may then be coupled to the body 134 via the lateral opening 152 to secure the conductor 115 within the loop opening 160. The lateral opening 152 may be sized and dimensioned to allow a length of the Rogowski coil 140 to be selectively inserted into and removed from the second channel 150. In at least some embodiments, the lateral opening 152 has a width (W) (FIG. 5) that is slightly less than a diameter of the Rogowski coil 140. In such an embodiment, at least a portion 154 (FIG. 5) of the second channel 150 adjacent the lateral opening 152 may be formed from a flexible material (e.g., an elastomer) that elastically deforms to allow the length of the Rogowski coil 140 to be selectively inserted into and removed from the second channel (e.g., "snapped" into and out of the channel).

[0039] Once the conductor 115 is positioned inside the loop opening 160, as shown in FIG. 3, the user can grasp the first end 142 and the second end 144 of the Rogowski coil 140 and pull them downward (as shown) relative to the body 134 of the sensor probe 104, thereby reducing the size of the loop so that the loop tightens around the conductor, as shown in FIG. 4. Once the loop of the Rogowski coil 140 is tightened, as shown in FIG. 4, the conductor 115 is firmly positioned adjacent to the location 155 of the body 134 that includes the non-contact voltage sensor 146. The sensor probe 104 can then be used to detect the voltage in the conductor 115 using the non-contact voltage sensor 146 and the current in the conductor using the Rogowski coil 140 positioned around the conductor. In at least some embodiments, the user may be instructed to keep the first end 142 and the second end 144 aligned with one another, as shown in FIGS. 3 and 4. In other embodiments, a coupler may be provided to couple the first end 142 and the second end 144 together and maintain the ends in an aligned relationship.

[0040] To remove the conductor 115 from the loop opening 160, a user can grasp the Rogowski coil 140 over the conductor 115 (as shown) and pull the coil upward to loosen the loop of the Rogowski coil. The second end 144 of the Rogowski coil 140 may then be disconnected from the body 134 via the lateral opening 152 in the second channel 150, as described above. Once the second end 144 of the Rogowski coil 140 is disconnected from the body 134, as shown in FIG. 1, the conductor 115 may be separated from the sensor probe 104.

[0041] It should be understood that the lateral opening 152 in the second channel 150 provides merely one example of a fastener that allows the second end 144 of the Rogowski coil 140 to be selectively coupled to the body 134. In other embodiments, different types of fasteners may be used that allow for selective coupling of at least a portion of the Rogowski coil while allowing for adjustment of the size of the loops of the Rogowski coil.

[0042] In at least some embodiments, during operation, the control circuit 120 of the sensor probe 104 transmits measurement data from the sensor(s) 146 or Rogowski coil 140 to the main body 102 of the electrical parameter measurement device 100, and the control circuit 116 determines one or more electrical parameters in the conductors 115 based on the received measurement data. For example, the control circuit 116 may determine the one or more electrical parameters utilizing one or more mathematical formulas, lookup tables, calibration coefficients, etc. Additionally, some electrical parameters, such as power or phase angle, may be derived from other determined electrical parameters, such as current and voltage.

[0043] As discussed above, the interface connections 108 may be removably coupled with corresponding interface connectors 106 on the main body 102 of the electrical parameter measurement device 100, for example, so that different sensor probes may be coupled to the main body 102. In at least some embodiments, the interface connector 108 of the sensor probe 104 may be configured as one of a plug and a socket, and the interface connector 106 of the main body 102 may be configured as the other of a plug and a socket. In other embodiments, the interface connectors 106 and 108 may be configured as different types of connectors that are operable to be removably coupled to one another.

[0044] Additionally, in some embodiments, the sensor probe 104 may be fixedly connected to the main body 102 by the cable 110. In other embodiments, the sensor probe 104 and the main body 102 may be formed together within a single housing such that the cable 110 is not required.

[0045] FIG 6A is a schematic circuit diagram of a modified version of the electrical parameter sensor probe 104 also shown in FIG 3. FIG 6B shows the first end 143 and second end 145 of a conductive coil wound inside the sheath of a Rogowski coil 140. In this embodiment, the first end 142 of the Rogowski coil 140 is bent in a U-shape so that the first end 142 and the second end 144 abut one another. This confirmation may further improve accuracy since the ends 143 and 145 of the coil windings abut one another for better coupling. This feature improves accuracy by minimizing air gaps and thus suppressing the effects of nearby external wires.

[0046] 7A and 7B show another embodiment of an electrical parameter measurement device 200 according to one non-limiting exemplary embodiment. Many of the features and components of the electrical parameter measurement device 200 may be similar or identical to the above-described electrical parameter measurement device 100. Thus, the above discussion regarding the electrical parameter measurement device 100 may also apply to the electrical parameter measurement device 200.

[0047] The electrical parameter measuring device 200 includes a body portion 202, a clamp portion 204, and a gripping portion 206. The clamp portion 204 may include two clamp arms 208a and 208b that are movable relative to each other between an unclamped or open position shown in FIG. 7A and a clamped or closed position shown in FIG. 7B. The gripping portion 206 may include two gripping arms 210a and 210b that are movable relative to each other to actuate the clamp portion from an unclamped position to a clamped position. As an example, the body portion 202 may include a biasing element 218 (e.g., a spring, a pin) that biases the clamp arms 208a and 208b in the unclamped position shown in FIG. 7A. In operation, a user may squeeze the gripping arms 210a and 210b together to move the clamp arms 208a and 208b to the clamped position against the force of the biasing element 218.

[0048] The electrical parameter measurement device 200 includes a Rogowski coil 212 positioned between clamp arms 208a and 208b. One or more non-contact voltage sensors 214 (two are shown) are coupled to the Rogowski coil 212. As an example, the Rogowski coil 212 may include a connector 216 in which a loop of the Rogowski coil is selectively opened to position the insulated conductor under test 115 within the coil and then reconnected to close the loop.

[0049] Once the insulated conductor 115 is positioned within the loop of the Rogowski coil 212, the user can squeeze the gripping arms 210a and 210b of the gripping portion 206 to deform the Rogowski coil 212 to the clamping arms 208a and 208b such that the non-contact sensor 214 is positioned adjacent to the insulated conductor 115 under test. The electrical parameter measurement device 200 can then be used to detect the voltage in the conductor 115 using the non-contact voltage sensor 214 and the current in the conductor using the Rogowski coil 212 positioned around the conductor. As discussed above, the measured electrical parameters may be provided to a user, for example, via a display, or may be transmitted to one or more external systems via a suitable wired or wireless connection.

[0050] In the foregoing detailed description, various embodiments of the devices and / or processes have been described using block diagrams, schematic diagrams, and examples. To the extent that such block diagrams, schematic diagrams, and examples include one or more functions and / or operations, it will be appreciated by those skilled in the art that each function and / or operation within such block diagrams, flow diagrams, or examples can be individually and / or collectively implemented by a wide range of hardware, software, firmware, or substantially any combination thereof. In one embodiment, the subject matter of the present invention may be implemented via an application specific integrated circuit (ASIC). However, those skilled in the art will recognize that the embodiments disclosed herein can be equivalently implemented, in whole or in part, as one or more computer programs running on one or more computers (e.g., as one or more programs running on one or more computer systems), as one or more programs running on one or more controllers (e.g., microcontrollers), as one or more programs running on one or more processors (e.g., microprocessors), as firmware, or substantially any combination thereof, within a standard integrated circuit, and that the circuit design and / or code writing for the software and / or firmware is well within the knowledge of one of ordinary skill in the art in light of the present disclosure.

[0051] Those skilled in the art will appreciate that many of the methods or algorithms described herein may employ additional acts, may omit certain acts, and / or may perform acts in an order other than that specified.

[0052] Moreover, those skilled in the art will recognize that the mechanisms taught herein can be distributed as a program product in a variety of forms, and the exemplary embodiments apply equally regardless of the particular type of signal-bearing medium used to actually effect the distribution, including, but not limited to, the following: floppy disks, hard disk drives, CD-ROMs, digital tape, and recordable forms of media such as computer memory.

[0053] The various embodiments described above may be combined to provide further embodiments. To the extent not inconsistent with the specific teachings and definitions herein, U.S. Provisional Patent Application No. 62 / 421,124 (filed November 11, 2016), U.S. Patent Application No. 15 / 345,256 (filed November 7, 2016), U.S. Patent Application No. 15 / 413,025 (filed January 23, 2017), U.S. Patent Application No. 15 / 412,891 (filed January 23, 2017), U.S. Patent Application No. 15 / 604,320 (filed May 24, 2017), and U.S. Patent Application No. 15 / 625,745 (filed June 16, 2017) are disclosed and incorporated herein by reference in their entirety. Aspects of the embodiments may be modified as necessary to provide still further embodiments using systems, circuits, and concepts from various patents, applications, and publications.

[0054] These and other modifications to the embodiments can be made in light of the above description. Generally, the terms used in the following claims should not be construed to limit the claims to the specific embodiments disclosed in the specification and claims, but should be construed to include all possible embodiments along with the full scope of equivalents to which such claims are entitled. Thus, the claims are not limited by the disclosure.

Claims

1. 1. An electrical parameter sensor probe operative to sense an electrical parameter in an insulated conductor without requiring galvanic contact with the conductor, comprising: a Rogowski coil receiving the insulated conductor therein; at least one non-contact voltage sensor coupled to the Rogowski coil; and a clamp operatively coupled to the Rogowski coil, the clamp operative when actuated to deform the Rogowski coil such that the at least one non-contact voltage sensor is positioned adjacent to the insulated conductor.

2. The electrical parameter sensor probe of claim 1 , further comprising a gripping portion that a user can grip to operate the clamp.

3. 3. The electrical parameter sensor probe of claim 2, wherein the gripping portion includes first and second gripping arms movable relative to one another, and the clamp is actuated to deform the Rogowski coil such that the at least one non-contact voltage sensor of the Rogowski coil is positioned adjacent to the insulated conductor.

4. 4. The electrical parameter sensor probe of claim 1, wherein the clamp includes first and second clamp arms movable relative to one another between an unclamped position in which the Rogowski coil is spaced apart from the insulated conductor under test and a clamped position in which the Rogowski coil is deformed such that the at least one non-contact voltage sensor of the Rogowski coil is positioned adjacent to the insulated conductor.

5. The electrical parameter sensor probe of claim 4 , further comprising a biasing element biasing the first clamp arm and the second clamp arm in the unclamped position.

6. The electrical parameter sensor probe of claim 1 , wherein the at least one non-contact voltage sensor is two or more non-contact voltage sensors.

7. 7. The electrical parameter sensor probe of claim 1, further comprising an interface connector operably coupled to the at least one non-contact voltage sensor and the Rogowski coil, the interface connector being removably coupleable to a corresponding interface connector on a main body of a non-contact electrical parameter measurement device.

8. and a control circuit communicatively coupleable to the at least one non-contact voltage sensor and the Rogowski coil, the control circuit comprising: receiving sensor data from at least one of the at least one non-contact voltage sensor or the Rogowski coil; The electrical parameter sensor probe of claim 1 configured to process the sensor data to determine at least one electrical parameter of the insulated conductor.

9. The electrical parameter sensor probe of claim 8 , wherein the control circuitry processes the sensor data to determine a voltage or a current in the insulated conductor.

10. 10. The electrical parameter sensor probe of claim 8 or 9, further comprising a wireless communication subsystem operably coupled to the control circuit, the wireless communication subsystem configured to wirelessly transmit the at least one electrical parameter to an external system.

11. The electrical parameter sensor probe of claim 8 , further comprising a display configured to visually present the electrical parameter to a user.

12. 1. A method for sensing an electrical parameter in an insulated conductor without requiring galvanic contact with the insulated conductor, comprising: receiving the insulated conductor within a Rogowski coil of an electrical parameter sensor probe; deforming the Rogowski coil to position a non-contact voltage sensor of the electrical parameter sensor probe adjacent to the insulated conductor; receiving, by a circuit, sensor data from at least one of the non-contact voltage sensor or the Rogowski coil; determining the electrical parameter in the insulated conductor based on sensor data received from at least one of the non-contact voltage sensor or the Rogowski coil.

13. 13. The method of claim 12, wherein the electrical parameter sensor probe comprises a clamp operably coupled to the Rogowski coil, and deforming the Rogowski coil comprises operating the clamp.

14. 14. The method of claim 13, further comprising biasing the clamp in an unclamped position in which the Rogowski coil is spaced apart from an insulated conductor under test via a biasing element of the electrical parameter sensor probe.

15. the electrical parameter sensor probe includes two or more non-contact voltage sensors; 15. The method of claim 12, wherein deforming the Rogowski coil comprises deforming the Rogowski coil to position at least one of the two or more non-contact voltage sensors of the electrical parameter sensor probe adjacent to the insulated conductor.

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